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EP2720253A4 - Ensemble optique d'éclairage, dispositif d'exposition et procédé de fabrication du dispositif - Google Patents

Ensemble optique d'éclairage, dispositif d'exposition et procédé de fabrication du dispositif

Info

Publication number
EP2720253A4
EP2720253A4 EP11867928.1A EP11867928A EP2720253A4 EP 2720253 A4 EP2720253 A4 EP 2720253A4 EP 11867928 A EP11867928 A EP 11867928A EP 2720253 A4 EP2720253 A4 EP 2720253A4
Authority
EP
European Patent Office
Prior art keywords
manufacture method
illumination optical
optical assembly
exposure device
exposure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP11867928.1A
Other languages
German (de)
English (en)
Other versions
EP2720253A1 (fr
EP2720253B1 (fr
Inventor
Norio Miyake
Kinya Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to EP19163401.3A priority Critical patent/EP3553604B1/fr
Publication of EP2720253A1 publication Critical patent/EP2720253A1/fr
Publication of EP2720253A4 publication Critical patent/EP2720253A4/fr
Application granted granted Critical
Publication of EP2720253B1 publication Critical patent/EP2720253B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H01L21/0274—Photolithographic processes
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/7015—Details of optical elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0927—Systems for changing the beam intensity distribution, e.g. Gaussian to top-hat
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/286—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3083—Birefringent or phase retarding elements
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G03F7/70116—Off-axis setting using a programmable means, e.g. liquid crystal display [LCD], digital micromirror device [DMD] or pupil facets
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
    • G03F7/70566—Polarisation control

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Polarising Elements (AREA)
  • Microscoopes, Condenser (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Lenses (AREA)
EP11867928.1A 2011-06-13 2011-11-25 Système optique d'éclairage, dispositif d'exposition et procédé de fabrication d'un dispositif Active EP2720253B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP19163401.3A EP3553604B1 (fr) 2011-06-13 2011-11-25 Ensemble optique d'éclairage, appareil d'exposition et procédé de fabrication d'un dispositif

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161496234P 2011-06-13 2011-06-13
PCT/JP2011/077199 WO2012172705A1 (fr) 2011-06-13 2011-11-25 Ensemble optique d'éclairage, dispositif d'exposition et procédé de fabrication du dispositif

Related Child Applications (2)

Application Number Title Priority Date Filing Date
EP19163401.3A Division EP3553604B1 (fr) 2011-06-13 2011-11-25 Ensemble optique d'éclairage, appareil d'exposition et procédé de fabrication d'un dispositif
EP19163401.3A Division-Into EP3553604B1 (fr) 2011-06-13 2011-11-25 Ensemble optique d'éclairage, appareil d'exposition et procédé de fabrication d'un dispositif

Publications (3)

Publication Number Publication Date
EP2720253A1 EP2720253A1 (fr) 2014-04-16
EP2720253A4 true EP2720253A4 (fr) 2015-02-25
EP2720253B1 EP2720253B1 (fr) 2019-05-08

Family

ID=47356730

Family Applications (2)

Application Number Title Priority Date Filing Date
EP11867928.1A Active EP2720253B1 (fr) 2011-06-13 2011-11-25 Système optique d'éclairage, dispositif d'exposition et procédé de fabrication d'un dispositif
EP19163401.3A Active EP3553604B1 (fr) 2011-06-13 2011-11-25 Ensemble optique d'éclairage, appareil d'exposition et procédé de fabrication d'un dispositif

Family Applications After (1)

Application Number Title Priority Date Filing Date
EP19163401.3A Active EP3553604B1 (fr) 2011-06-13 2011-11-25 Ensemble optique d'éclairage, appareil d'exposition et procédé de fabrication d'un dispositif

Country Status (6)

Country Link
US (3) US9523918B2 (fr)
EP (2) EP2720253B1 (fr)
JP (4) JP5910890B2 (fr)
KR (2) KR101939862B1 (fr)
TW (6) TWI661224B (fr)
WO (1) WO2012172705A1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6020834B2 (ja) 2011-06-07 2016-11-02 株式会社ニコン 照明光学系、露光装置、およびデバイス製造方法
US9638906B2 (en) 2013-11-22 2017-05-02 Nikon Corporation Catadioptric imaging systems for digital scanner
US9703085B2 (en) 2013-11-22 2017-07-11 Nikon Corporation Catadioptric imaging systems for digital scanner
US20180326664A1 (en) * 2017-05-11 2018-11-15 Seurat Technologies, Inc. Solid State Routing Of Patterned Light For Additive Manufacturing Optimization
US11014302B2 (en) 2017-05-11 2021-05-25 Seurat Technologies, Inc. Switchyard beam routing of patterned light for additive manufacturing
US10712546B1 (en) 2017-10-16 2020-07-14 Keysight Technologies, Inc. Illumination source for structured illumination microscopy
JP7210249B2 (ja) * 2018-11-30 2023-01-23 キヤノン株式会社 光源装置、照明装置、露光装置及び物品の製造方法
DE102019201280A1 (de) * 2019-01-31 2020-08-06 Trumpf Laser Gmbh Anordnung und Verfahren zum Formen eines Laserstrahls

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100165318A1 (en) * 2007-09-14 2010-07-01 Carl Zeiss Smt Ag Illumination system of a microlithographic projection exposure apparatus
US20130148359A1 (en) * 2011-10-28 2013-06-13 Nikon Corporation Illumination Device for optimizing polarization in an illumination pupil

Family Cites Families (58)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5312513A (en) 1992-04-03 1994-05-17 Texas Instruments Incorporated Methods of forming multiple phase light modulators
JP3246615B2 (ja) 1992-07-27 2002-01-15 株式会社ニコン 照明光学装置、露光装置、及び露光方法
JPH06124873A (ja) 1992-10-09 1994-05-06 Canon Inc 液浸式投影露光装置
RU2084941C1 (ru) 1996-05-06 1997-07-20 Йелстаун Корпорейшн Н.В. Адаптивный оптический модуль
JP3747566B2 (ja) 1997-04-23 2006-02-22 株式会社ニコン 液浸型露光装置
US5867302A (en) 1997-08-07 1999-02-02 Sandia Corporation Bistable microelectromechanical actuator
KR100819239B1 (ko) 1998-03-11 2008-04-03 가부시키가이샤 니콘 자외 레이저 장치, 레이저 장치, 노광 장치와 노광 방법, 디바이스 제조 방법, 자외광 조사 장치, 물체 패턴 검출 장치, 자외광 조사 방법 및 물체 패턴 검출 방법
AU2747999A (en) 1998-03-26 1999-10-18 Nikon Corporation Projection exposure method and system
WO2001035168A1 (fr) 1999-11-10 2001-05-17 Massachusetts Institute Of Technology Lithographie interferentielle utilisant des faisceaux de balayage a verrouillage de phase
SE0100336L (sv) 2001-02-05 2002-08-06 Micronic Laser Systems Ab Adresseringsmetod och apparat som använder densamma tekniskt område
US6480320B2 (en) 2001-02-07 2002-11-12 Transparent Optical, Inc. Microelectromechanical mirror and mirror array
US6611316B2 (en) 2001-02-27 2003-08-26 Asml Holding N.V. Method and system for dual reticle image exposure
US6600591B2 (en) 2001-06-12 2003-07-29 Network Photonics, Inc. Micromirror array having adjustable mirror angles
US6900915B2 (en) 2001-11-14 2005-05-31 Ricoh Company, Ltd. Light deflecting method and apparatus efficiently using a floating mirror
US20050095749A1 (en) 2002-04-29 2005-05-05 Mathias Krellmann Device for protecting a chip and method for operating a chip
JP4324957B2 (ja) 2002-05-27 2009-09-02 株式会社ニコン 照明光学装置、露光装置および露光方法
WO2004005998A1 (fr) 2002-07-04 2004-01-15 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Procede et appareil de commande d'actionneurs deformables
US6733144B2 (en) 2002-09-27 2004-05-11 Intel Corporation Shock protectors for micro-mechanical systems
EP1420298B1 (fr) 2002-11-12 2013-02-20 ASML Netherlands B.V. Appareil lithographique
KR100585476B1 (ko) 2002-11-12 2006-06-07 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치 및 디바이스 제조방법
CN100370533C (zh) 2002-12-13 2008-02-20 皇家飞利浦电子股份有限公司 用于照射层的方法和用于将辐射导向层的装置
US6891655B2 (en) 2003-01-02 2005-05-10 Micronic Laser Systems Ab High energy, low energy density, radiation-resistant optics used with micro-electromechanical devices
US7095546B2 (en) 2003-04-24 2006-08-22 Metconnex Canada Inc. Micro-electro-mechanical-system two dimensional mirror with articulated suspension structures for high fill factor arrays
US7295726B1 (en) 2003-12-02 2007-11-13 Adriatic Research Institute Gimbal-less micro-electro-mechanical-system tip-tilt and tip-tilt-piston actuators and a method for forming the same
JP4599936B2 (ja) 2004-08-17 2010-12-15 株式会社ニコン 照明光学装置、照明光学装置の調整方法、露光装置、および露光方法
JP4335114B2 (ja) 2004-10-18 2009-09-30 日本碍子株式会社 マイクロミラーデバイス
TWI423301B (zh) 2005-01-21 2014-01-11 尼康股份有限公司 照明光學裝置、曝光裝置、曝光方法以及元件製造方法
EP1843204A1 (fr) 2005-01-25 2007-10-10 Nikon Corporation Dispositif d'exposition, procede d'exposition et procede de fabrication de microdispositif
US7372617B2 (en) 2005-07-06 2008-05-13 Peter Enoksson Hidden hinge MEMS device
JP2007220767A (ja) 2006-02-15 2007-08-30 Canon Inc 露光装置及びデバイス製造方法
DE102008003916A1 (de) 2007-01-23 2008-07-24 Carl Zeiss Smt Ag Projektionsbelichtungsanlage für die Mikrolithographie mit Messvorrichtung sowie Verfahren zum Messen einer Bestrahlungsstärkeverteilung
JP5345132B2 (ja) * 2007-04-25 2013-11-20 カール・ツァイス・エスエムティー・ゲーエムベーハー マイクロリソグラフィ露光装置においてマスクを照明するための照明系
US7884920B2 (en) 2007-06-15 2011-02-08 Asml Netherlands B.V. Lithographic apparatus and pivotable structure assembly
TW200904131A (en) * 2007-07-06 2009-01-16 Chi Mei Comm Systems Inc Call rejecting mechanism and mathod of using the same
US20090091730A1 (en) * 2007-10-03 2009-04-09 Nikon Corporation Spatial light modulation unit, illumination apparatus, exposure apparatus, and device manufacturing method
JP5267029B2 (ja) 2007-10-12 2013-08-21 株式会社ニコン 照明光学装置、露光装置及びデバイスの製造方法
US8379187B2 (en) 2007-10-24 2013-02-19 Nikon Corporation Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
JP5286744B2 (ja) * 2007-10-31 2013-09-11 株式会社ニコン 空間光変調ユニット、照明光学系、露光装置及びデバイスの製造方法
EP2219206A4 (fr) * 2007-11-06 2011-04-27 Nikon Corp Dispositif de commande, procédé d'exposition et dispositif d'exposition
JP5582287B2 (ja) * 2007-11-06 2014-09-03 株式会社ニコン 照明光学装置及び露光装置
JP5326259B2 (ja) * 2007-11-08 2013-10-30 株式会社ニコン 照明光学装置、露光装置、およびデバイス製造方法
DE102008049556B4 (de) 2008-09-30 2011-07-07 Carl Zeiss SMT GmbH, 73447 Mikrolithographische Projektionsbelichtungsanlage
JP5365982B2 (ja) * 2008-10-02 2013-12-11 株式会社ニコン 照明光学系、露光装置、およびデバイス製造方法
DE102008050446B4 (de) 2008-10-08 2011-07-28 Carl Zeiss SMT GmbH, 73447 Verfahren und Vorrichtungen zur Ansteuerung von Mikrospiegeln
WO2010044307A1 (fr) * 2008-10-15 2010-04-22 株式会社ニコン Système optique d’éclairage, aligneur et processus permettant de fabriquer le dispositif
DE102008054844B4 (de) * 2008-12-17 2010-09-23 Carl Zeiss Smt Ag Beleuchtungseinrichtung einer mikrolithographischen Projektionsbelichtungsanlage, sowie mikrolithographisches Projektionsbelichtungsverfahren
JP2010272640A (ja) * 2009-05-20 2010-12-02 Nikon Corp 照明装置、露光装置、及びデバイス製造方法
JP5403244B2 (ja) * 2009-07-16 2014-01-29 株式会社ニコン 空間光変調ユニット、照明光学系、露光装置、およびデバイス製造方法
US20110037962A1 (en) * 2009-08-17 2011-02-17 Nikon Corporation Polarization converting unit, illumination optical system, exposure apparatus, and device manufacturing method
JP2011114041A (ja) * 2009-11-25 2011-06-09 Nikon Corp 光束分割装置、空間光変調ユニット、照明光学系、露光装置、およびデバイス製造方法
KR102046286B1 (ko) * 2010-02-03 2019-11-18 가부시키가이샤 니콘 조명 광학 장치, 조명 방법, 및 노광 방법 및 장치
EP2539444A4 (fr) * 2010-02-26 2013-09-18 Univ California Compositions et procédés pour la production de l-homoalanine
DE102010029339A1 (de) 2010-05-27 2011-12-01 Carl Zeiss Smt Gmbh Optisches System für eine mikrolithographische Projektionsbelichtungsanlage sowie mikrolithographisches Belichtungsverfahren
JP5880443B2 (ja) * 2010-12-13 2016-03-09 株式会社ニコン 露光方法、露光装置、及びデバイス製造方法
JP6020834B2 (ja) * 2011-06-07 2016-11-02 株式会社ニコン 照明光学系、露光装置、およびデバイス製造方法
KR20140069152A (ko) * 2011-09-16 2014-06-09 가부시키가이샤 니콘 조명 광학 장치, 광학계 유닛, 조명 방법, 및 노광 방법 및 장치
WO2013108560A1 (fr) * 2012-01-18 2013-07-25 株式会社ニコン Procédé de commande pour modulateur spatial de lumière, procédé de génération de motif pour exposition et procédé et dispositif d'exposition
WO2019194281A1 (fr) 2018-04-05 2019-10-10 株式会社トクヤマ Composition adhésive photochromique, corps stratifié photochromique et article optique utilisant ledit corps stratifié photochromique

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100165318A1 (en) * 2007-09-14 2010-07-01 Carl Zeiss Smt Ag Illumination system of a microlithographic projection exposure apparatus
US20130148359A1 (en) * 2011-10-28 2013-06-13 Nikon Corporation Illumination Device for optimizing polarization in an illumination pupil

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2012172705A1 *

Also Published As

Publication number Publication date
TW201921027A (zh) 2019-06-01
US20170090297A1 (en) 2017-03-30
JPWO2012172705A1 (ja) 2015-02-23
TWI684788B (zh) 2020-02-11
TWI652508B (zh) 2019-03-01
JP5910890B2 (ja) 2016-04-27
EP2720253A1 (fr) 2014-04-16
TWI661224B (zh) 2019-06-01
KR20140051226A (ko) 2014-04-30
TW201612582A (en) 2016-04-01
JP6583741B2 (ja) 2019-10-02
TW201701020A (zh) 2017-01-01
JP2017199018A (ja) 2017-11-02
JP2016153904A (ja) 2016-08-25
WO2012172705A1 (fr) 2012-12-20
TWI557432B (zh) 2016-11-11
EP3553604B1 (fr) 2021-06-30
KR101939862B1 (ko) 2019-04-11
JP6742604B2 (ja) 2020-08-19
KR20190007101A (ko) 2019-01-21
US20140211174A1 (en) 2014-07-31
US10353294B2 (en) 2019-07-16
EP2720253B1 (fr) 2019-05-08
TW201725419A (zh) 2017-07-16
EP3553604A1 (fr) 2019-10-16
TW201925849A (zh) 2019-07-01
TW201250290A (en) 2012-12-16
TWI519816B (zh) 2016-02-01
KR102066825B1 (ko) 2020-01-15
JP2019185052A (ja) 2019-10-24
TWI587002B (zh) 2017-06-11
JP6168187B2 (ja) 2017-07-26
US9523918B2 (en) 2016-12-20
US20190163068A1 (en) 2019-05-30
US10564550B2 (en) 2020-02-18

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