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EP1616175A2 - Device and method for measuring the concentration of a pollutant in gaseous effluents - Google Patents

Device and method for measuring the concentration of a pollutant in gaseous effluents

Info

Publication number
EP1616175A2
EP1616175A2 EP04742469A EP04742469A EP1616175A2 EP 1616175 A2 EP1616175 A2 EP 1616175A2 EP 04742469 A EP04742469 A EP 04742469A EP 04742469 A EP04742469 A EP 04742469A EP 1616175 A2 EP1616175 A2 EP 1616175A2
Authority
EP
European Patent Office
Prior art keywords
concentration
measuring
sample
gaseous effluent
gaseous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP04742469A
Other languages
German (de)
French (fr)
Inventor
Joël BRULEFER
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renault SAS
Original Assignee
Renault SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR0304949A external-priority patent/FR2854241B1/en
Priority claimed from FR0304950A external-priority patent/FR2854242B1/en
Application filed by Renault SAS filed Critical Renault SAS
Publication of EP1616175A2 publication Critical patent/EP1616175A2/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
    • G01N33/0059—Avoiding interference of a gas with the gas to be measured
    • G01N33/006—Avoiding interference of water vapour with the gas to be measured
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0011—Sample conditioning
    • G01N33/0016—Sample conditioning by regulating a physical variable, e.g. pressure or temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0011—Sample conditioning
    • G01N33/0018—Sample conditioning by diluting a gas

Definitions

  • the present invention relates to a device for detecting a concentration of polluting compounds in a gaseous effluent, comprising a measurement indicator.
  • FID Fluorescence Detector
  • PID Photo-Ionization Detector
  • FID resources use hydrogen as an oxidizer, which requires the use of a specific room.
  • PID means do not use hydrogen, but can only be used on effluents at room temperature.
  • the object of the invention is, in view of the above, to propose a solution which makes it possible to continuously measure a concentration of pollutant in a sample of gaseous effluent with a low maintenance cost.
  • the object of the invention is, in view of the foregoing, to propose a solution which makes it possible to continuously measure a concentration of pollutant in the gaseous effluents of a complete industrial installation, while maintaining the measurement performance over time.
  • the object of the invention is also to make more precise, to facilitate and to make faster the measurement of such a concentration of pollutant.
  • the invention also relates to an easy and quick maintenance measuring device, of robust structure and adaptable to any type of gaseous effluent, whatever its temperature and its humidity.
  • the measuring device makes it possible to measure a concentration of polluting compounds in a gaseous effluent.
  • the device comprises a measurement indicator, as well as a semiconductor detector capable of continuously analyzing a measurement sample of the gaseous effluent.
  • the device comprises means for maintaining the temperature of the measurement sample above the dew point.
  • the means for maintaining the temperature of the measurement sample above the dew point include a temperature regulation probe, a heating resistor, a temperature regulator, and a thermally insulated enclosure.
  • the device comprises means for filtering the measurement sample to remove solid particles present in the gas sample.
  • the semiconductor detector device comprises a dilution air circuit, treated with activated carbon, and capillaries, maintained in depression by an air pump and placed upstream of the semiconductor detector.
  • the device is part of a device for measuring a concentration of pollutant in gaseous effluents flowing in a plurality of conduits circulation, comprising measuring means and a plurality of nozzles, connected to the conduits and associated with a vacuum means, each nozzle being connected to the semiconductor detector device by a common extraction conduit and comprises a metal filter cartridge frit.
  • the vacuum means comprises a vacuum pump capable of maintaining a constant vacuum and a regulated sonic flow rate on each nozzle, the vacuum pump being connected to the common extraction duct.
  • each nozzle is connected to a circulation pipe for one of the gaseous effluents by means of a water spillway.
  • the vacuum pump is equipped with a heated stainless steel body.
  • the method for measuring a concentration of polluting compounds in a gaseous effluent consists in that a gaseous effluent is continuously measured and that a semiconductor detector device is used.
  • the concentration of polluting compounds measured is representative of the concentration of volatile organic compounds in the gas sample.
  • a plurality of individual gas samples are continuously sampled, and a gaseous effluent representative of all the samples taken by a semiconductor detector device is continuously analyzed.
  • the flow rate of each individual sample is kept constant, and each of these flow rates is kept proportional to the fraction of the flow rate of the gaseous effluent from which the sample in question comes in relation to the total flow of all of the gaseous effluents, so that the gas stream analyzed is representative of all of the gaseous effluent flows.
  • the volatile organic compounds of the gas sample come from an industrial painting installation.
  • FIG. 1 is a block diagram of a measuring device according to the invention.
  • FIG. 2 is a diagram of a sampling nozzle and its base or water spout.
  • FIG. 3 is a block diagram of a semiconductor detector device which can be used in a device according to the invention.
  • FIG. 1 there is shown the general architecture of a multi-point sampling device, here nine in number, for the continuous measurement of a rate of particles in effluents gas from an industrial installation, for example a painting installation.
  • different conduits 1 can be placed along the painting installation by following the movement of the treated objects.
  • a nozzle 3, preferably a sonic nozzle, with a sintered metal filter cartridge, is mounted on each gaseous effluent pipe 2, by means of a water evacuator 4.
  • sintered metal use may in particular be made of PINOX 316L or a non-oxidizable metal, under normal conditions of use.
  • FIG. 1 shows a nozzle 3 of the sampling device which comprises a water evacuator 4 or base, mounted on a conduit 1 in which the gaseous effluent flows 2.
  • the water evacuator 4 is fixed on this conduit 1 by means of its base 10 which includes an opening 11 common with the conduit 1.
  • the water spillway 4 comprises a flat surface 12 making an angle between 45 ° and 60 ° with the axis of the conduit 1, and a circular opening 13 in the surface plane 14, on which the nozzle 3 is fixed.
  • the nozzle 3 is fixed to the plane surface 14 by means of a base 15, several screws 16, and a seal 17, its axis 18 making an angle about 10 ° to 15 ° with the axis of the duct 1.
  • a cylindrical envelope 19 surrounds the c filter cartridge 20 of sintered metal, which has a passage 20a and a cylindrical wall of sintered metal 20b on the inner cylindrical periphery.
  • the envelope 19 is connected to a cylindrical envelope 21 by a junction 22.
  • the cylindrical envelope 21 surrounds a junction stage 23.
  • a divergent nozzle 24 connects the junction stage 23 to an individual conduit 5.
  • the semiconductor detector device 8, visible in FIG. 1 is shown in more detail in FIG. 3, and comprises a detector 25, for example a semiconductor detector, for example of the NAP-11AS type.
  • This device comprises an inlet 26 for the sample, connected to the outlet 9 for the pump 7 (FIG. 1), a filter 27 for sample air, a capillary 28 placed upstream from the detector 25 connecting the outlet for the filter 27 at the inlet of the detector 25, and a capillary 29 placed upstream of the detector 25 connecting the outlet of a dilution air filter 30 to the inlet of the detector 25. It also includes dilution circuit 31, and an activated carbon filter 32.
  • the semiconductor detector device 8 further comprises an air pump 33 connected to the detector 25 as well as to a pressure regulator 34.
  • the detector device 8 also comprises a temperature regulation probe 37 and a heating resistor 36 connected to a temperature regulator 37 by connections not shown, as well as an electrical protection 38, an indicator 39 for measuring the level of particles of the sample, and a power supply stabilized 40.
  • the detector device 8 is mounted inside a heat-insulated enclosure 41.
  • the system composed of a sonic nozzle 3 with a sintered metal filter cartridge and a water drainer 4, makes it possible to continuously extract a sample from this gaseous effluent 2.
  • a small part of the gas stream 2 enters the water evacuator 4 through the opening 11 of the base 10, then into the filter cartridge 20 through the opening 13.
  • the water evacuator 4 makes it possible to have a gas extract as least humid as possible.
  • the water droplets indeed condense on contact with the inclined wall 12.
  • the gas flow then passes through the passage 20a of the filter cartridge 20, the layer 20b of sintered metal capturing the particles with which the effluent is charged.
  • the gas flow then crosses the divergent nozzle 24 before exiting through the individual conduit 5.
  • the nozzle 24 and the depression created downstream of the nozzle by the pump 7 are chosen so as to maintain a sonic flow in the nozzle 3.
  • the filter cartridge 20 makes it possible to filter the particles contained in the gas stream and unlike the known filters which clog in a duration of the order of an hour, this can operate without clogging for much longer periods, from around 1 to 10 months. It is thus possible to carry out a continuous measurement.
  • the flows extracted from each nozzle 3 arrive in their respective individual conduit 5, and meet in the common extraction conduit 6.
  • the circulation of the gaseous samples which mix is ensured by the vacuum pump 7.
  • the pump 7 has a stainless steel body, so as not to be attacked by corrosive elements.
  • the pump body is advantageously heated to limit condensation.
  • the sample representative of all the rejects from the industrial installation is analyzed by the semiconductor detector device 8.
  • the objective of our embodiment is to continuously measure concentrations of pollutants, significantly different upstream and downstream of the industrial facility.
  • the analysis sample enters the measuring device 8 through the inlet 26, and passes through the filter 27 in order to remove the particles present in the gas sample.
  • the outlet of the filter 27 is calibrated and makes it possible to regulate the flow rate in the capillary 28.
  • the activated carbon filter 32 makes it possible to filter the air in the dilution circuit 31, in particular retaining any traces of compound to be analyzed, so as not to deteriorate the analysis sample.
  • the particles possibly present in the dilution air are eliminated by the filter 30.
  • the outlet of the filter 30 is calibrated and makes it possible to regulate the flow rate in the capillary 29.
  • the surface of the semiconductor detector 25 is covered with a very thin layer of metal oxides on a ceramic substrate.
  • the electrical resistance of the detector 25 varies as a function of the quantity of molecules of organic compounds in contact with the detector 25 and as a function of the type of metal oxides used.
  • the air pump 33 and the pressure regulator 34 make it possible to maintain the depression of the chamber of the semiconductor detector 25.
  • the depression produced in the chamber of the detector 25 makes it possible to decontaminate the detector 25 during the drop in concentration of the compounds organic, and thus allows an increased operating time.
  • the assembly formed by the temperature regulation probe 35, the heating resistor 36, the temperature regulator 37, and the heat-insulated enclosure 41, makes it possible to maintain the device at a temperature above the dew point of the sample, in order to avoid partial or total condensation of the gas sample to be analyzed.
  • the semiconductor detector device 8 is electrically powered by the stabilized power supply 40, and electrically protected by the electrical protection 38.
  • the analysis result is displayed on the analysis indicator 39.
  • the invention makes it possible to carry out a continuous analysis of a concentration of pollutant in gaseous effluents, in particular from an industrial installation, on a final sample representative of all the discharges from the production area.
  • the invention also makes it possible to reduce the number of measuring devices, since a single representative final sample is measured, and therefore to significantly reduce the measurement costs.
  • the invention also makes it possible to obtain an easy and rapid maintenance device, robust, and adaptable to any type of gaseous effluent, whatever its temperature and its humidity level.
  • the results of the concentration of a mixture of organic compounds obtained by a measurement device comprising a semiconductor detector follow, on a time scale, the same evolution as the results obtained with another type of more precise analyzer, but more expensive, such as a flame ionization detection analyzer.
  • the measuring device according to the invention makes it possible to obtain a variation of organic compounds while keeping a low maintenance cost.
  • the invention makes it possible to continuously measure a concentration of a mixture of compounds in a gaseous sample, while maintaining this above the dew point.
  • the invention also makes it possible to obtain high measurement accuracy, by filtering the particles of the gas sample and of the air of the dilution circuit, as well as by eliminating any traces of the compound to be measured from the air of dilution, while keeping the maintenance cost low.

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Combustion & Propulsion (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

A device (8) for detecting the concentration of pollutant compounds in a gaseous effluent, comprising a measurement indicator (39), characterized in that it comprises a semi-conductor detector (25) which is used to continuously analyze a measurement sample of the gaseous effluent.

Description

Dispositif et procédé de mesure d'une concentration de polluant dans des effluents gazeux Device and method for measuring a concentration of pollutant in gaseous effluents
La présente invention concerne un dispositif détecteur d'une concentration de composés polluants dans un effluent gazeux, comprenant un indicateur de mesure.The present invention relates to a device for detecting a concentration of polluting compounds in a gaseous effluent, comprising a measurement indicator.
Pour des mesures de rejet de polluants tels que des composés organiques volatils (COV) dans, des installations de peinture, par exemple, on utilise des moyens de contrôle FID (Flame Ionization Detector) ou PID (Photo-Ionization Detector). Les moyens FID utilisent de l'hydrogène comme comburant, ce qui nécessite l'emploi d'un local spécifique. Les moyens PID sont sans utilisation d'hydrogène, mais ne peuvent être utilisés que sur des effluents à température ambiante. Ces méthodes fournissent un indice équivalent d'une molécule mesurable par ces moyens de contrôle mais ne permettent pas d'obtenir directement une concentration massique réelle des émissions gazeuses de composés organiques volatils. Ces méthodes ne permettent donc pas d'effectuer des mesures continues, ni d'obtenir directement une concentration massique réelle de composés dans un effluent gazeux ou du taux de particules dans les effluents gazeux.For measurements of discharge of pollutants such as volatile organic compounds (VOCs) in painting installations, for example, means of control FID (Flame Ionization Detector) or PID (Photo-Ionization Detector) are used. FID resources use hydrogen as an oxidizer, which requires the use of a specific room. PID means do not use hydrogen, but can only be used on effluents at room temperature. These methods provide an equivalent index of a molecule that can be measured by these control means, but do not allow a real mass concentration of gaseous emissions of volatile organic compounds to be obtained directly. These methods therefore do not make it possible to carry out continuous measurements, nor to directly obtain an actual mass concentration of compounds in a gaseous effluent or in the rate of particles in the gaseous effluents.
L'invention a pour objet, au vu de ce qui précède, de proposer une solution qui permette de mesurer en continu une concentration de polluant dans un échantillon d' effluent gazeux avec un faible coût de maintenance.The object of the invention is, in view of the above, to propose a solution which makes it possible to continuously measure a concentration of pollutant in a sample of gaseous effluent with a low maintenance cost.
L'invention a pour objet, au vu de ce qui précède, de proposer une solution qui permette de mesurer en continu une concentration de polluant dans les effluents gazeux d'une installation industrielle complète, en maintenant les performances de mesure dans le temps. L'invention a également pour objet de rendre plus précise, de faciliter et de rendre plus rapide la mesure d'une telle concentration de polluant.The object of the invention is, in view of the foregoing, to propose a solution which makes it possible to continuously measure a concentration of pollutant in the gaseous effluents of a complete industrial installation, while maintaining the measurement performance over time. The object of the invention is also to make more precise, to facilitate and to make faster the measurement of such a concentration of pollutant.
L'invention a encore pour objet un dispositif de mesure d'entretien facile et rapide, de structure robuste et adaptable à tout type d'effluent gazeux, quels que soient sa température et son taux d'humidité.The invention also relates to an easy and quick maintenance measuring device, of robust structure and adaptable to any type of gaseous effluent, whatever its temperature and its humidity.
Le dispositif de mesure selon l'invention permet de mesurer une concentration de composés polluants dans un effluent gazeux. Le dispositif comprend un indicateur de mesure, ainsi qu'un détecteur à semi-conducteur apte à analyser en continu un échantillon de mesure de l' effluent gazeux.The measuring device according to the invention makes it possible to measure a concentration of polluting compounds in a gaseous effluent. The device comprises a measurement indicator, as well as a semiconductor detector capable of continuously analyzing a measurement sample of the gaseous effluent.
Selon unie autre caractéristique, le dispositif comprend des moyens pour maintenir la température de l'échantillon de mesure au-dessus du point de rosée.According to another characteristic, the device comprises means for maintaining the temperature of the measurement sample above the dew point.
Selon une autre caractéristique, les moyens pour maintenir la température de l'échantillon de mesure au-dessus du point de rosée comprennent une sonde de régulation de température, une résistance chauffante, un régulateur de température, et une enceinte calorifugée.According to another characteristic, the means for maintaining the temperature of the measurement sample above the dew point include a temperature regulation probe, a heating resistor, a temperature regulator, and a thermally insulated enclosure.
Selon une autre caractéristique, le dispositif comprend des moyens de filtration de l'échantillon de mesure pour éliminer des particules solides présentes dans l'échantillon gazeux.According to another characteristic, the device comprises means for filtering the measurement sample to remove solid particles present in the gas sample.
Selon une autre caractéristique, le dispositif détecteur à semi-conducteur comprend un circuit d'air de dilution, traité par du charbon actif, et des capillaires, maintenus en dépression par une trompe à air et placés en amont du détecteur à semi-conducteur .According to another characteristic, the semiconductor detector device comprises a dilution air circuit, treated with activated carbon, and capillaries, maintained in depression by an air pump and placed upstream of the semiconductor detector.
Selon une autre caractéristique, le dispositif fait partie d'un dispositif de mesure d'une concentration de polluant dans des effluents gazeux s 'écoulant dans une pluralité de conduits de circulation, comprenant des moyens de mesure et une pluralité de tuyères, raccordées aux conduits et associées à un moyen de dépression, chaque tuyère étant raccordée au dispositif détecteur à semi-conducteur par un conduit d'extraction commun et comporte une cartouche filtrante en métal fritte.According to another characteristic, the device is part of a device for measuring a concentration of pollutant in gaseous effluents flowing in a plurality of conduits circulation, comprising measuring means and a plurality of nozzles, connected to the conduits and associated with a vacuum means, each nozzle being connected to the semiconductor detector device by a common extraction conduit and comprises a metal filter cartridge frit.
Selon une autre caractéristique, le moyen de dépression comporte une pompe à vide capable de maintenir un vide constant et un débit régulé sonique sur chaque tuyère, la pompe à vide étant reliée au conduit d'extraction commun.According to another characteristic, the vacuum means comprises a vacuum pump capable of maintaining a constant vacuum and a regulated sonic flow rate on each nozzle, the vacuum pump being connected to the common extraction duct.
Selon une autre caractéristique, chaque tuyère est raccordée sur un conduit de circulation de l'un des effluents gazeux par l'intermédiaire d'un évacuateur d'eau.According to another characteristic, each nozzle is connected to a circulation pipe for one of the gaseous effluents by means of a water spillway.
Selon une autre caractéristique, la pompe à vide est équipée d'un corps en acier inoxydable chauffé.According to another characteristic, the vacuum pump is equipped with a heated stainless steel body.
Selon une autre caractéristique, le procédé de mesure d'une concentration de composés polluants dans un effluent gazeux consiste en ce que l'on mesure en continu un effluent gazeux et que l'on utilise un dispositif détecteur à semi- conducteur.According to another characteristic, the method for measuring a concentration of polluting compounds in a gaseous effluent consists in that a gaseous effluent is continuously measured and that a semiconductor detector device is used.
Selon une autre caractéristique, la concentration en composés polluants mesurée est représentative de la concentration en composés organiques volatils dans l'échantillon gazeux. Selon une autre caractéristique, on prélève en continu une pluralité d'échantillons gazeux individuels, et on analyse en continu un effluent gazeux représentatif de l'ensemble des échantillons prélevés par un dispositif détecteur à semiconducteur. Selon une autre caractéristique, on maintient constant le débit de chaque prélèvement individuel, et on maintient chacun de ces débits proportionnel à la fraction du débit de l' effluent gazeux duquel provient l'échantillon considéré par rapport au débit total de l'ensemble des effluents gazeux, pour que le courant gazeux analysé soit représentatif de l'ensemble des débits des effluents gazeux.According to another characteristic, the concentration of polluting compounds measured is representative of the concentration of volatile organic compounds in the gas sample. According to another characteristic, a plurality of individual gas samples are continuously sampled, and a gaseous effluent representative of all the samples taken by a semiconductor detector device is continuously analyzed. According to another characteristic, the flow rate of each individual sample is kept constant, and each of these flow rates is kept proportional to the fraction of the flow rate of the gaseous effluent from which the sample in question comes in relation to the total flow of all of the gaseous effluents, so that the gas stream analyzed is representative of all of the gaseous effluent flows.
Selon une autre caractéristique, les composés organiques volatils de l'échantillon gazeux proviennent d'une installation industrielle de peinture.According to another characteristic, the volatile organic compounds of the gas sample come from an industrial painting installation.
D'autres buts, caractéristiques et avantages de l'invention apparaîtront à la lecture de la description suivante, donnée uniquement à titre d'exemple nullement limitatif, et faite en référence aux dessins annexés sur lesquels:Other objects, characteristics and advantages of the invention will appear on reading the following description, given solely by way of non-limiting example, and made with reference to the appended drawings in which:
- la figure 1 est un schéma synoptique d'un dispositif de mesure selon l'invention.- Figure 1 is a block diagram of a measuring device according to the invention.
- la figure 2 est un schéma d'une tuyère de prélèvement et de son embase ou évacuateur d'eau. - et la figure 3 est un schéma synoptique d'un dispositif détecteur à semi-conducteur pouvant être utilisé dans un dispositif selon l'invention.- Figure 2 is a diagram of a sampling nozzle and its base or water spout. - And Figure 3 is a block diagram of a semiconductor detector device which can be used in a device according to the invention.
Selon un mode de réalisation de l'invention, sur la figure 1 , on a représenté l'architecture générale d'un dispositif de prélèvement multipoints, ici au nombre de neuf, pour la mesure en continu d'un taux de particules dans des effluents gazeux d'une installation industrielle, par exemple une installation de peinture. Avantageusement, différents conduits 1 peuvent être placés le long de l'installation de peinture en suivant le déplacement des objets traités. Sur chaque conduit 1 d'effluent gazeux 2 est montée une tuyère 3, de préférence une tuyère sonique, à cartouche filtrante en métal fritte, au moyen d'un évacuateur d'eau 4.According to one embodiment of the invention, in Figure 1, there is shown the general architecture of a multi-point sampling device, here nine in number, for the continuous measurement of a rate of particles in effluents gas from an industrial installation, for example a painting installation. Advantageously, different conduits 1 can be placed along the painting installation by following the movement of the treated objects. A nozzle 3, preferably a sonic nozzle, with a sintered metal filter cartridge, is mounted on each gaseous effluent pipe 2, by means of a water evacuator 4.
A titre de métal fritte, on peut utiliser en particulier de PINOX 316L ou un métal non oxydable, dans les conditions normales d'utilisation.As sintered metal, use may in particular be made of PINOX 316L or a non-oxidizable metal, under normal conditions of use.
Chaque tuyère 3 est reliée par un conduit individuel 5 de faible perte de charge à un conduit d'extraction commun 6 de faible perte de charge, relié à une pompe à vide 7. Le refoulement de la pompe 7 est relié directement à un unique dispositif détecteur, par exemple un dispositif détecteur 8 à semi-conducteur par une sortie 9. La figure 2 représente une tuyère 3 du dispositif de prélèvement qui comprend un évacuateur d'eau 4 ou embase, montée sur un conduit 1 dans lequel s'écoule l' effluent gazeux 2. L' évacuateur d'eau 4 est fixé sur ce conduit 1 au moyen de son socle 10 qui comprend une ouverture 11 commune avec le conduit 1. L'évacuateur d'eau 4 comprend une surface plane 12 faisant un angle compris entre 45° et 60° avec l'axe du conduit 1 , et une ouverture circulaire 13 dans la surface plane 14, sur laquelle est fixée la tuyère 3. La tuyère 3 est fixée sur la surface plane 14 au moyen d'un socle 15, de plusieurs vis 16, et d'un joint d'étanchéité 17, son axe 18 faisant un angle d'environ 10° à 15° avec l'axe du conduit 1. Une enveloppe cylindrique 19 entoure la cartouche filtrante 20 en métal fritte, qui comporte un passage 20a et une paroi cylindrique en métal fritte 20b sur le pourtour cylindrique intérieur. L'enveloppe 19 est reliée à une enveloppe cylindrique 21 par une jonction 22. L'enveloppe cylindrique 21 entoure un étage de jonction 23. Une buse divergente 24 relie l'étage de jonction 23 à un conduit individuel 5.Each nozzle 3 is connected by an individual conduit 5 of low pressure drop to a common extraction conduit 6 low pressure drop, connected to a vacuum pump 7. The discharge of the pump 7 is directly connected to a single detector device, for example a detector device 8 semiconductor by an outlet 9. Figure 2 shows a nozzle 3 of the sampling device which comprises a water evacuator 4 or base, mounted on a conduit 1 in which the gaseous effluent flows 2. The water evacuator 4 is fixed on this conduit 1 by means of its base 10 which includes an opening 11 common with the conduit 1. The water spillway 4 comprises a flat surface 12 making an angle between 45 ° and 60 ° with the axis of the conduit 1, and a circular opening 13 in the surface plane 14, on which the nozzle 3 is fixed. The nozzle 3 is fixed to the plane surface 14 by means of a base 15, several screws 16, and a seal 17, its axis 18 making an angle about 10 ° to 15 ° with the axis of the duct 1. A cylindrical envelope 19 surrounds the c filter cartridge 20 of sintered metal, which has a passage 20a and a cylindrical wall of sintered metal 20b on the inner cylindrical periphery. The envelope 19 is connected to a cylindrical envelope 21 by a junction 22. The cylindrical envelope 21 surrounds a junction stage 23. A divergent nozzle 24 connects the junction stage 23 to an individual conduit 5.
Le dispositif détecteur 8 à semi-conducteur, visible sur la figure 1 est représenté plus en détail sur la figure 3, et comprend un détecteur 25, par exemple un détecteur à semiconducteur, par exemple du type NAP-11AS. Ce dispositif comprend une entrée 26 de l'échantillon, connectée à la sortie 9 de la pompe 7 (figure 1), un filtre 27 d'air d'échantillon, un capillaire 28 placé en amont du détecteur 25 reliant la sortie du filtre 27 à l'entrée du détecteur 25, et un capillaire 29 placé en amont du détecteur 25 reliant la sortie d'un filtre 30 d'air de dilution à l'entrée du détecteur 25. Il comprend également un circuit de dilution 31 , et un filtre à charbon actif 32. Le dispositif détecteur 8 à semi-conducteur comprend en outre, une trompe à air 33 reliée au détecteur 25 ainsi qu'à un régulateur de pression 34. Le dispositif détecteur 8 comprend également une sonde de régulation de température 37 et une résistance chauffante 36 reliées à un régulateur de température 37 par des connexions non représentées, ainsi qu'une protection électrique 38, un indicateur de mesure 39 du taux de particules de l'échantillon, et une alimentation stabilisée 40. Le dispositif détecteur 8 est monté à l'intérieur d'une enceinte calorifugée 41.The semiconductor detector device 8, visible in FIG. 1 is shown in more detail in FIG. 3, and comprises a detector 25, for example a semiconductor detector, for example of the NAP-11AS type. This device comprises an inlet 26 for the sample, connected to the outlet 9 for the pump 7 (FIG. 1), a filter 27 for sample air, a capillary 28 placed upstream from the detector 25 connecting the outlet for the filter 27 at the inlet of the detector 25, and a capillary 29 placed upstream of the detector 25 connecting the outlet of a dilution air filter 30 to the inlet of the detector 25. It also includes dilution circuit 31, and an activated carbon filter 32. The semiconductor detector device 8 further comprises an air pump 33 connected to the detector 25 as well as to a pressure regulator 34. The detector device 8 also comprises a temperature regulation probe 37 and a heating resistor 36 connected to a temperature regulator 37 by connections not shown, as well as an electrical protection 38, an indicator 39 for measuring the level of particles of the sample, and a power supply stabilized 40. The detector device 8 is mounted inside a heat-insulated enclosure 41.
En régime établi, sur chaque conduit 1 d'effluent gazeux 2, le système, composé d'une tuyère 3 sonique à cartouche filtrante en métal fritte et d'un évacuateur d'eau 4, permet d'extraire en continu un échantillon de cet effluent gazeux 2.In steady state, on each gaseous effluent pipe 1 2, the system, composed of a sonic nozzle 3 with a sintered metal filter cartridge and a water drainer 4, makes it possible to continuously extract a sample from this gaseous effluent 2.
Une faible partie du courant gazeux 2 entre dans l'évacuateur d'eau 4 par l'ouverture 11 du socle 10, puis dans la cartouche filtrante 20 par l'ouverture 13. L'évacuateur d'eau 4 permet d'avoir un gaz extrait le moins humide possible. Les gouttelettes d'eau se condensent en effet au contact de la paroi inclinée 12. Le flux gazeux traverse ensuite le passage 20a de la cartouche filtrante 20, la couche 20b de métal fritte captant les particules dont l' effluent est chargé. Le flux gazeux traverse ensuite la buse divergente 24 avant de sortir par le conduit individuel 5. La buse 24 et la dépression créée en aval de la buse par la pompe 7 sont choisies de façon à maintenir un écoulement sonique dans la tuyère 3.A small part of the gas stream 2 enters the water evacuator 4 through the opening 11 of the base 10, then into the filter cartridge 20 through the opening 13. The water evacuator 4 makes it possible to have a gas extract as least humid as possible. The water droplets indeed condense on contact with the inclined wall 12. The gas flow then passes through the passage 20a of the filter cartridge 20, the layer 20b of sintered metal capturing the particles with which the effluent is charged. The gas flow then crosses the divergent nozzle 24 before exiting through the individual conduit 5. The nozzle 24 and the depression created downstream of the nozzle by the pump 7 are chosen so as to maintain a sonic flow in the nozzle 3.
La cartouche filtrante 20 permet de filtrer les particules contenues dans le courant gazeux et contrairement aux filtres connus qui se colmatent en une durée de l'ordre de l'heure, celle-ci peut fonctionner sans se colmater durant des périodes bien plus longues, de l'ordre de 1 à 10 mois. Il est ainsi possible d'effectuer une mesure en continu. Les flux extraits de chaque tuyère 3 arrivent dans leur conduit individuel 5 respectif, et se rejoignent dans le conduit d'extraction commun 6. La circulation des échantillons gazeux qui se mélangent est assurée par la pompe à vide 7. De préférence, la pompe 7 comporte un corps en acier inoxydable, de façon à ne pas être attaquée par des éléments corrosifs éventuels. Le corps de pompe est avantageusement chauffé pour limiter la condensation. En sortie 9 de la pompe à vide, l'échantillon représentatif de l'ensemble des rejets de l'installation industrielle est analysé par le dispositif 8 détecteur à semi-conducteur.The filter cartridge 20 makes it possible to filter the particles contained in the gas stream and unlike the known filters which clog in a duration of the order of an hour, this can operate without clogging for much longer periods, from around 1 to 10 months. It is thus possible to carry out a continuous measurement. The flows extracted from each nozzle 3 arrive in their respective individual conduit 5, and meet in the common extraction conduit 6. The circulation of the gaseous samples which mix is ensured by the vacuum pump 7. Preferably, the pump 7 has a stainless steel body, so as not to be attacked by corrosive elements. The pump body is advantageously heated to limit condensation. At output 9 of the vacuum pump, the sample representative of all the rejects from the industrial installation is analyzed by the semiconductor detector device 8.
L'objectif de notre mode de réalisation est de mesurer en continu des concentrations de polluants, sensiblement différentes en amont et en aval de l'installation industrielle. L'échantillon d'analyse pénètre dans le dispositif de mesure 8 par l'entrée 26, et traverse le filtre 27 afin d'éliminer les particules présentes dans l'échantillon gazeux. La sortie du filtre 27 est calibrée et permet de réguler le débit dans le capillaire 28. Le filtre à charbon actif 32 permet de filtrer l'air du circuit de dilution 31 en retenant notamment les traces éventuelles de composé à analyser, afin de ne pas détériorer l'échantillon d'analyse. Les particules éventuellement présentes dans l'air de dilution sont éliminées par le filtre 30. La sortie du filtre 30 est calibrée et permet de réguler le débit dans le capillaire 29. Ces régulations de débits permettent de contrôler l'échantillon gazeux à analyser en maintenant un niveau de concentration prévu dans la gamme d'utilisation du détecteur à semi-conducteur 25.The objective of our embodiment is to continuously measure concentrations of pollutants, significantly different upstream and downstream of the industrial facility. The analysis sample enters the measuring device 8 through the inlet 26, and passes through the filter 27 in order to remove the particles present in the gas sample. The outlet of the filter 27 is calibrated and makes it possible to regulate the flow rate in the capillary 28. The activated carbon filter 32 makes it possible to filter the air in the dilution circuit 31, in particular retaining any traces of compound to be analyzed, so as not to deteriorate the analysis sample. The particles possibly present in the dilution air are eliminated by the filter 30. The outlet of the filter 30 is calibrated and makes it possible to regulate the flow rate in the capillary 29. These flow rate regulations make it possible to control the gas sample to be analyzed while maintaining a level of concentration provided for in the range of use of the semiconductor detector 25.
La surface du détecteur à semi-conducteur 25 est recouverte d'une très fine couche d'oxydes métalliques sur un substrat de céramique. Lorsque l'échantillon arrive au contact de cette surface, il se produit une oxydation des gaz de l'échantillon qui dépend de la porosité et de la surface d'échange du semi-conducteur. La résistance électrique du détecteur 25 varie en fonction de la quantité de molécules de composés organiques en contact avec le détecteur 25 et en fonction du type d'oxydes métalliques utilisés. La trompe à air 33 et le régulateur de pression 34 permettent de maintenir la dépression de la chambre du détecteur à semi-conducteur 25. La dépression réalisée dans la chambre du détecteur 25 permet de décontaminer le détecteur 25 lors de la baisse de concentration des composés organiques, et permet ainsi une durée de fonctionnement accrue. L'ensemble formé par la sonde de régulation de température 35, la résistance chauffante 36, le régulateur de température 37, et l'enceinte calorifugée 41 , permet de maintenir le dispositif à une température supérieure au point de rosée de l'échantillon, afin d'éviter une condensation partielle ou totale de l'échantillon gazeux à analyser.The surface of the semiconductor detector 25 is covered with a very thin layer of metal oxides on a ceramic substrate. When the sample comes into contact with this surface, there is an oxidation of the gases in the sample which depends on the porosity and the surface semiconductor exchange. The electrical resistance of the detector 25 varies as a function of the quantity of molecules of organic compounds in contact with the detector 25 and as a function of the type of metal oxides used. The air pump 33 and the pressure regulator 34 make it possible to maintain the depression of the chamber of the semiconductor detector 25. The depression produced in the chamber of the detector 25 makes it possible to decontaminate the detector 25 during the drop in concentration of the compounds organic, and thus allows an increased operating time. The assembly formed by the temperature regulation probe 35, the heating resistor 36, the temperature regulator 37, and the heat-insulated enclosure 41, makes it possible to maintain the device at a temperature above the dew point of the sample, in order to avoid partial or total condensation of the gas sample to be analyzed.
Le dispositif 8 détecteur à semi-conducteur est alimenté électriquement par l'alimentation stabilisée 40, et protégée électriquement par la protection électrique 38. L'affichage du résultat d'analyse se fait sur l'indicateur d'analyse 39.The semiconductor detector device 8 is electrically powered by the stabilized power supply 40, and electrically protected by the electrical protection 38. The analysis result is displayed on the analysis indicator 39.
L'invention permet d'effectuer une analyse en continu d'une concentration de polluant dans des effluents gazeux, notamment d'une installation industrielle, sur un échantillon final représentatif de l'ensemble des rejets de la zone de production.The invention makes it possible to carry out a continuous analysis of a concentration of pollutant in gaseous effluents, in particular from an industrial installation, on a final sample representative of all the discharges from the production area.
L'invention permet en outre de diminuer le nombre d'appareils de mesure, puisqu'on mesure un unique échantillon final représentatif, et donc de nettement diminuer les coûts de mesure. L'invention permet également d'obtenir un dispositif d'entretien facile et rapide, robuste, et adaptable à tout type d'effluent gazeux, quels que soient sa température et son taux d'humidité. Les résultats de la concentration d'un mélange de composés organiques obtenus par un dispositif de mesure comprenant un détecteur à semi-conducteur suivent, sur une échelle de temps, la même évolution que les résultats obtenus avec un autre type d'analyseur plus précis, mais plus coûteux, tel qu'un analyseur par détection à ionisation de flamme. Le dispositif de mesure selon l'invention permet d'obtenir une variation de composés organiques tout en gardant un coût de maintenance faible. L'invention permet de mesurer en continu une concentration d'un mélange de composés dans un échantillon gazeux, en maintenant celui-ci au-dessus du point de rosée.The invention also makes it possible to reduce the number of measuring devices, since a single representative final sample is measured, and therefore to significantly reduce the measurement costs. The invention also makes it possible to obtain an easy and rapid maintenance device, robust, and adaptable to any type of gaseous effluent, whatever its temperature and its humidity level. The results of the concentration of a mixture of organic compounds obtained by a measurement device comprising a semiconductor detector follow, on a time scale, the same evolution as the results obtained with another type of more precise analyzer, but more expensive, such as a flame ionization detection analyzer. The measuring device according to the invention makes it possible to obtain a variation of organic compounds while keeping a low maintenance cost. The invention makes it possible to continuously measure a concentration of a mixture of compounds in a gaseous sample, while maintaining this above the dew point.
L'invention permet également d'obtenir une grande précision de mesure, en filtrant les particules de l'échantillon gazeux et de l'air du circuit de dilution, ainsi qu'en éliminant les éventuelles traces du composé à mesurer de l'air de dilution, tout en gardant un coût de maintenance faible.The invention also makes it possible to obtain high measurement accuracy, by filtering the particles of the gas sample and of the air of the dilution circuit, as well as by eliminating any traces of the compound to be measured from the air of dilution, while keeping the maintenance cost low.
On notera que le dispositif détecteur à semi-conducteur décrit pourrait être utilisé en association avec d'autres moyens d'extraction d'échantillons gazeux. It will be noted that the semiconductor detector device described could be used in combination with other means for extracting gas samples.

Claims

REVENDICATIONS
1. Dispositif détecteur (8) d'une concentration de composés polluants dans un effluent gazeux, comprenant un indicateur de mesure (39), caractérisé en ce que le dispositif (8) comprend un détecteur à semi-conducteur (25) apte à analyser en continu un échantillon de mesure de Peffluent gazeux.1. Detector device (8) for a concentration of polluting compounds in a gaseous effluent, comprising a measurement indicator (39), characterized in that the device (8) comprises a semiconductor detector (25) capable of analyzing continuously a measurement sample of the gaseous effluent.
2. Dispositif (8) selon la revendication 1 , caractérisé en ce que le dispositif (8) comprend des moyens pour maintenir la température de l'échantillon de mesure au-dessus du point de rosée.2. Device (8) according to claim 1, characterized in that the device (8) comprises means for maintaining the temperature of the measurement sample above the dew point.
3. Dispositif (8) selon la revendication 2, caractérisé en ce que les moyens pour maintenir la température de l'échantillon de mesure au-dessus du point de rosée comprennent une sonde de régulation de température (35), une résistance chauffante (13), un régulateur de température (37), et une enceinte calorifugée (41).3. Device (8) according to claim 2, characterized in that the means for maintaining the temperature of the measurement sample above the dew point comprise a temperature regulation probe (35), a heating resistor (13 ), a temperature regulator (37), and a thermally insulated enclosure (41).
4. Dispositif (8) selon l'une quelconque des revendications précédentes, caractérisé en ce que le dispositif (8) comprend des moyens de filtration de l'échantillon de mesure pour éliminer des particules solides présentes dans l'échantillon gazeux.4. Device (8) according to any one of the preceding claims, characterized in that the device (8) comprises means for filtering the measurement sample to remove solid particles present in the gas sample.
5. Dispositif (8) selon l'une des revendications précédentes, caractérisé en ce que le dispositif (8) détecteur à semiconducteur comprend un circuit d'air de dilution (31), traité par du charbon actif (32), et des capillaires (28,29), maintenus en dépression par une trompe à air (33) et placés en amont du détecteur à semi-conducteur (25). 5. Device (8) according to one of the preceding claims, characterized in that the device (8) semiconductor detector comprises a dilution air circuit (31), treated with activated carbon (32), and capillaries (28,29), maintained in depression by an air pump (33) and placed upstream of the semiconductor detector (25).
6. Dispositif (8) selon l'une des revendications précédentes, caractérisé en ce que le dispositif (8) fait partie d'un dispositif de mesure d'une concentration de polluant dans des effluents gazeux s 'écoulant dans une pluralité de conduits de circulation (1), comprenant des moyens de mesure et une pluralité de tuyères (3), raccordées aux conduits et associées à un moyen de dépression, chaque tuyère (3) étant raccordée au dispositif détecteur (8) à semi-conducteur par un conduit d'extraction commun (6) et comporte une cartouche filtrante (20) en métal fritte.6. Device (8) according to one of the preceding claims, characterized in that the device (8) is part of a device for measuring a concentration of pollutant in gaseous effluents flowing in a plurality of conduits circulation (1), comprising measuring means and a plurality of nozzles (3), connected to the conduits and associated with a vacuum means, each nozzle (3) being connected to the semiconductor detector device (8) by a conduit common extraction (6) and comprises a filter cartridge (20) made of sintered metal.
7. Dispositif (8) selon la revendication 6 , caractérisé en ce que le moyen de dépression comporte une pompe à vide (7) capable de maintenir un vide constant et un débit régulé sonique sur chaque tuyère (3), la pompe à vide (7) étant reliée au conduit d'extraction commun (6).7. Device (8) according to claim 6, characterized in that the vacuum means comprises a vacuum pump (7) capable of maintaining a constant vacuum and a regulated sonic flow rate on each nozzle (3), the vacuum pump ( 7) being connected to the common extraction duct (6).
8. Dispositif de mesure selon la revendication 6 ou 7, caractérisé en ce que chaque tuyère (3) est raccordée sur un conduit de circulation (1) de l'un des effluents gazeux par l'intermédiaire d'un évacuateur d'eau (4).8. Measuring device according to claim 6 or 7, characterized in that each nozzle (3) is connected to a circulation duct (1) of one of the gaseous effluents by means of a water evacuator ( 4).
9. Dispositif de mesure selon la revendication 7 ou 8, • caractérisé en ce que la pompe à vide (7) est équipée d'un corps en acier inoxydable chauffé.9. Measuring device according to claim 7 or 8, • characterized in that the vacuum pump (7) is equipped with a heated stainless steel body.
10. Procédé de mesure d'une concentration de composés polluants dans un effluent gazeux caractérisé en ce que l'on mesure en continu un effluent gazeux et que l'on utilise un dispositif détecteur (8) à semi-conducteur.10. A method of measuring a concentration of polluting compounds in a gaseous effluent characterized in that a gaseous effluent is continuously measured and that a semiconductor detector device (8) is used.
11. Procédé de mesure selon la revendication 10, caractérisé en ce que la concentration en composés polluants mesurée est représentative de la concentration en composés organiques volatils dans l'échantillon gazeux.11. Measuring method according to claim 10, characterized in that the concentration of polluting compounds measured is representative of the concentration of volatile organic compounds in the gas sample.
12. Procédé de mesure selon la revendication 10, caractérisé en ce que l'on prélève en continu une pluralité d'échantillons gazeux individuels, et on analyse en continu un effluent gazeux représentatif de l'ensemble des échantillons prélevés par le dispositif détecteur (8) à semi-conducteur.12. Measuring method according to claim 10, characterized in that a plurality of individual gas samples are continuously taken, and a gaseous effluent representative of all the samples taken by the detector device is continuously analyzed. ) semiconductor.
13. Procédé de mesure selon la revendication 12, caractérisé en ce que l'on maintient constant le débit de chaque prélèvement individuel, et que l'on maintient chacun de ces débits proportionnel à la fraction du débit de l' effluent gazeux duquel provient l'échantillon considéré par rapport au débit total de l'ensemble des effluents gazeux, pour que le courant gazeux analysé soit représentatif de l'ensemble des débits des effluents gazeux.13. Measuring method according to claim 12, characterized in that the flow rate of each individual sample is kept constant, and that each of these flow rates is kept proportional to the fraction of the flow rate of the gaseous effluent from which the 'sample considered in relation to the total flow rate of all the gaseous effluents, so that the gas stream analyzed is representative of all the flow rates of the gaseous effluents.
14. Procédé de mesure selon la revendication 11 ou 12, caractérisé en ce que les composés organiques volatils de l'échantillon gazeux proviennent d'une installation industrielle de peinture. 14. Measuring method according to claim 11 or 12, characterized in that the volatile organic compounds of the gas sample come from an industrial painting installation.
EP04742469A 2003-04-23 2004-04-09 Device and method for measuring the concentration of a pollutant in gaseous effluents Withdrawn EP1616175A2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0304949A FR2854241B1 (en) 2003-04-23 2003-04-23 DEVICE AND METHOD FOR MEASURING A CONCENTRATION OF POLLUTANT COMPOUNDS IN A GASEOUS EFFLUENT, COMPRISING A SEMICONDUCTOR DETECTOR
FR0304950A FR2854242B1 (en) 2003-04-23 2003-04-23 DEVICE AND METHOD FOR MEASURING POLLUTANT CONCENTRATION IN GASEOUS EFFLUENTS
PCT/FR2004/000883 WO2004097399A2 (en) 2003-04-23 2004-04-09 Device and method for measuring the concentration of a pollutant in gaseous effluents

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FR2937141A1 (en) * 2008-10-10 2010-04-16 Commissariat Energie Atomique METHOD FOR THE ANALYSIS OF MOLECULAR POLLUTION OF A FLUID, DEVICE FOR IMPLEMENTATION AND APPLICATION TO ANALYSIS OF POLLUTION IN A NATURAL ENVIRONMENT AND IN A CONTROLLED ENVIRONMENT
EP3844496A4 (en) * 2019-11-01 2022-04-13 Honeywell International Inc. Method and system for calibrating a gas detector

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WO1991004067A1 (en) * 1989-09-23 1991-04-04 The University Court Of The University Of Dundee A method of and apparatus for monitoring gas
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