EP1141762A1 - Procede pour rechercher de maniere differenciee differentes structures de preference dans des preparations biologiques - Google Patents
Procede pour rechercher de maniere differenciee differentes structures de preference dans des preparations biologiquesInfo
- Publication number
- EP1141762A1 EP1141762A1 EP99964415A EP99964415A EP1141762A1 EP 1141762 A1 EP1141762 A1 EP 1141762A1 EP 99964415 A EP99964415 A EP 99964415A EP 99964415 A EP99964415 A EP 99964415A EP 1141762 A1 EP1141762 A1 EP 1141762A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- particles
- light
- microscope
- wavelength
- structures
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
- G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0068—Optical details of the image generation arrangements using polarisation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
Definitions
- the invention relates to a method for the differentiated examination of different structures in preferably biological preparations, in particular by means of confocal laser scanning microscopy
- this is a detection / marking method, in particular a method that is used in the context of conventional fluorescence microscopy in the biomedical field.
- the fluorescence microscopy used up to now is extremely problematic in practice, especially since the fluorescent dyes used there fade over time , namely have a swelling characteristic that excludes the reproduction of examinations.
- the fluorescence intensities change during the course of microscopy, especially when the fluorescent dye is continuously irradiated with excitation light.This not only makes reproduction of the examination impossible, but also complicates any examination after irradiation of the biological / medical preparation or makes such an examination - with regard to a reliable evaluation - almost impossible
- the present invention is therefore based on the object of designing a generic method for the differentiated examination of different structures in preferably biological specimens, in particular by means of confocal laser scanning microscopy, in such a way that the reproduction of the marking or of the examination result is ensured even after prolonged exposure to radiation which is the case with fluorescence microscopy or in Problems associated with fluorescent dye binding should be avoided
- the above object is achieved by the features of claim 1.
- the generic method for the differentiated investigation of different structures in preferably biological preparations is characterized in that the structures are assigned particles with a specific diameter and specific properties and that the detection of the structures by detection of the or particles specifically bound to the preparations
- the detection of the particles can also be carried out by detection of the plasmon signal of the particles
- Fluorescent dyes arrive, play the optical properties of the Particles do not matter at first Rather, what matters here is the diameter and the material properties of the particles
- the particles are assigned to the respective structures or areas of the preparations by means of suitable binders, whereby the particles can be provided with binders which can form a chemical bond or a bond due to adhesion with certain structures.
- suitable binders which can form a chemical bond or a bond due to adhesion with certain structures.
- a purely mechanical bond is also conceivable
- the structure or structures are detected by detecting the particles bound in or on the specimens and thus on the respective structures.
- the structures or different areas in the specimens can be identified differentiate in that the wavelength of suitable light is selected as a function of the diameter and the specific properties of the particles such that the particles can be detected on the basis of the Mie scattering occurring on the particles
- Mie scattering a physical phenomenon is used in the manner according to the invention, which is referred to in the specialist literature as “Mie scattering”.
- G Mie Ann Physik 3, 377 (1908) referenced P Torok et al "Pola ⁇ sed Light Microscopy” SPIE Vol 3261, 22 ff (1998)
- the phenomenon designated by the physicist G Mie - Mie scattering or Mie reflex - means a scattering of light on particles, with increasing Diameter of the particles the scattering intensity increases more strongly in the forward direction than in the backward direction.
- the Mie scattering depends both on the material properties (electromagnetic constant, electrical conductivity) and on the diameter of the scattering particles.
- the detection of the particles can also be carried out by detection of the plasmon signal.
- Plasmons have been known from the literature for some time. It is a phenomenon from the field of solid state physics, in which the electrons in the conduction band of a solid state cause vibrations that can be induced by light of a suitable wavelength, for example. So far, this has mainly been used in connection with measuring devices that are based on the surface plasmon resonance effect.
- US Pat. No. 5,351,127 in which a corresponding arrangement is described. For light microscopy in the classic sense, however, the generation and detection of surface plasmons according to the previously mentioned document is not useful.
- surface or volume plasmon resonances of the particles which are specifically bound to the structure to be detected are excited with suitable light in a conventional or confocal laser scanning microscope.
- the surface or volume plasmon resonances thus excited are then detected using suitable means.
- suitable means Depending on the property of the light used and the property of the particles used, is a specific detection of different particles possible
- only a limited number of surface plasmons are available in spherical particles, which depend on the diameter, the electron density and the dielectric property of the particles
- linearly polarized light of a predeterminable wavelength is used to illuminate the particles, in order to be able to use or detect the Mie effect or the Mie scattering occurring on the particles particularly well. This applies in particular if the wavelength of the light is large or in is approximately equal to the diameter of the particles
- the wavelength of the light could be in the range between 300 nm and 1,500 nm.
- the size of the particles could be below the optical resolving power.
- a particle diameter in the range between 10 nm and 1,000 nm is possible, to be precise To be able to optimally use Mie scattering to detect the particles
- the wavelength of the light - given the particle size and the specific properties of the particles - is selected such that a maximum Mie reflex can be demonstrated referenced the graphic there, which shows for certain particle diameters, namely for diameters of 20 nm, 40 nm, 60 nm, 80 nm and 100 nm, the reflections detectable due to the Mie scattering as a function of the wavelength of the illumination light.
- the particles used for marking are preferably metal particles because of their electrostatic constant and electrical conductivity.
- the particles can also be particles metallized on the surface.
- the particles are further preferably elhpsoidal or spherical in order to have a homogeneous shape - Get scattering on the particles
- the detection of the particles via the Mie scattering occurring there or via the Mie reflections occurring there can be carried out using a microscope, both in the transmission microscope mode and in the reflection microscope mode. If the detection is carried out in the transmission microscope mode, a conventional method could be used Polarization transmission microscope or a confocal polarization transmission microscope can be used. If the detection is done in the reflection microscope mode, a conventional polarization reflection microscope or a confocal polarization reflection microscope could be used to implement the detection method For example, a high-pressure steam lamp can be used as the light source, which should preferably have wavelength-selecting and polarizing means. These wavelength-selecting and polarizing means can also be - separately - connected downstream of a conventional high-pressure steam lamp
- a laser can be used as the light source, in particular when confocal laser scanning microscopy is to be used. It is advantageously a laser that emits polarized light of a wavelength.
- the use of a laser, the polarized light, is also conceivable several different wavelengths are emitted, with the laser being dependent on wavelength selection means - integral or separate - conventional lasers and conventional wavelength selection means can be used here
- image acquisition and subsequent image processing it is of further advantage if several image acquisitions are carried out under different lighting / detection angles. These image acquisitions can also be taken into account in the image evaluation in order, for example, to be able to eliminate the shadow effects or the like falsifying the result or the like digital image processing methods can be used here
- the light used for the detection of the particles and thus for the differentiated investigation of different structures can be provided via a single light source, for example via a laser light source according to the above description.
- a single light source for example via a laser light source according to the above description.
- several light sources can be used which emit light with suitable wavelengths simultaneously or at different times.
- a simultaneous or at different times detection of the particles assigned to the different structures is possible
- the particles can be metallic particles on the one hand and particles with a metallic surface on the other hand.
- the particles are further surface-coated and if the coating enables specific binding to correspondingly complementary structures of the preparation.
- the binding can be mechanical, adhesive or even chemical
- the method according to the invention has the enormous advantage over conventional fluorescence microscopy that the particles used for marking - in contrast to the fluorescent dyes - do not change over time and during the irradiation.
- Scattering or the Mie reflection serving sensors are not designed to be as sensitive as is the case with fluorescence microscopy - for the detection of fluorescence phenomena - once the preparations or their structures have been prepared with the particles used here, further examinations can also be carried out on the preparations Carry out reproducibly after considerable irradiation In any case, it is not the particles used for marking that are problematic, but rather only the shelf life of the preparation itself. Markings that change over time are no longer too important in the manner according to the invention ten
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Microscoopes, Condenser (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analysing Biological Materials (AREA)
Abstract
L'invention concerne un procédé pour rechercher de manière différenciée différentes structures, de préférence dans des préparations biologiques, notamment par microscopie confocale à balayage laser. Ce procédé est caractérisé en ce que des particules présentant un diamètre et des propriétés spécifiques sont associées auxdites structures et en ce que la mise en évidence des structures s'effectue par détection des particules qui sont liées de manière spécifique dans les préparations ou à ces dernières. De manière avantageuse, la détection s'effectue par marquage des structures avec des particules métalliques présentant un diamètre compris entre 10 et 1500 nm, et par détection d'une diffusion de Mie ou d'un signal plasmonique.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19858431 | 1998-12-17 | ||
DE19858431 | 1998-12-17 | ||
DE19950909 | 1999-10-22 | ||
DE19950909A DE19950909A1 (de) | 1998-12-17 | 1999-10-22 | Verfahren zur differenzierten Untersuchung unterschiedlicher Strukturen in vorzugsweise biologischen Präparaten |
PCT/DE1999/003946 WO2000036450A1 (fr) | 1998-12-17 | 1999-12-10 | Procede pour rechercher de maniere differenciee differentes structures de preference dans des preparations biologiques |
Publications (1)
Publication Number | Publication Date |
---|---|
EP1141762A1 true EP1141762A1 (fr) | 2001-10-10 |
Family
ID=26050832
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99964415A Withdrawn EP1141762A1 (fr) | 1998-12-17 | 1999-12-10 | Procede pour rechercher de maniere differenciee differentes structures de preference dans des preparations biologiques |
Country Status (4)
Country | Link |
---|---|
US (1) | US6934022B1 (fr) |
EP (1) | EP1141762A1 (fr) |
JP (1) | JP2002532728A (fr) |
WO (1) | WO2000036450A1 (fr) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU2002245537B2 (en) | 2001-02-23 | 2007-12-20 | Genicon Sciences Corporation | Methods for providing extended dynamic range in analyte assays |
US20050141843A1 (en) * | 2003-12-31 | 2005-06-30 | Invitrogen Corporation | Waveguide comprising scattered light detectable particles |
WO2006034129A2 (fr) * | 2004-09-17 | 2006-03-30 | Jmar Research, Inc. | Systemes et procedes de detection de lumiere diffusee par une particule par rayons incidents d'angle d'incidence |
EP1907820A4 (fr) * | 2005-05-02 | 2011-07-06 | Jmar Res Inc | Systemes et procedes destines a un instrument a angle de capture eleve et a diffusion de lumiere a angles multiples (mals) |
US7616311B2 (en) * | 2005-05-02 | 2009-11-10 | Jmar Llc | Systems and methods for a multiple angle light scattering (MALS) instrument having two-dimensional detector array |
US7518723B2 (en) * | 2005-09-19 | 2009-04-14 | Jmar Technologies, Inc. | Systems and methods for detecting radiation, biotoxin, chemical, and biological warfare agents using a multiple angle light scattering (MALS) instrument |
US7551279B2 (en) * | 2005-09-19 | 2009-06-23 | Jmar Technologies, Inc. | Systems and methods for detecting normal levels of bacteria in water using a multiple angle light scattering (MALS) instrument |
US7554661B2 (en) * | 2005-09-19 | 2009-06-30 | Jmar Technologies, Inc. | Systems and methods for detection and classification of waterborne particles using a multiple angle light scattering (MALS) instrument |
GB2464747B (en) * | 2008-10-10 | 2013-05-15 | Hai Kang Life Corp Ltd | Method for detection of analyte in microarray of samples and apparatus for performing such method |
CN110221422B (zh) * | 2019-07-01 | 2024-04-02 | 达科为(深圳)医疗设备有限公司 | 一种基于米氏散射的均匀光显微照明装置 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2606991A1 (de) * | 1976-02-20 | 1977-08-25 | Nils Dr Med Kaiser | Geraet zur bestimmung des gehaltes von stoffwechselprodukten im blut |
US4752567A (en) * | 1984-06-21 | 1988-06-21 | Janssen Pharmaceutica N.V. | Method of visualizing individual submicroscopic metal particles |
US4741043B1 (en) * | 1985-11-04 | 1994-08-09 | Cell Analysis Systems Inc | Method of and apparatus for image analyses of biological specimens |
US5017009A (en) * | 1986-06-26 | 1991-05-21 | Ortho Diagnostic Systems, Inc. | Scattered total internal reflectance immunoassay system |
JP2591750B2 (ja) * | 1986-06-26 | 1997-03-19 | オ−ソ・ダイアグノステイツク・システムズ・インコ−ポレ−テツド | 免疫分析システム |
DE4024476C1 (fr) | 1990-08-02 | 1992-02-27 | Boehringer Mannheim Gmbh, 6800 Mannheim, De | |
US5592571A (en) * | 1994-03-08 | 1997-01-07 | The University Of Connecticut | Digital pixel-accurate intensity processing method for image information enhancement |
US5599668A (en) * | 1994-09-22 | 1997-02-04 | Abbott Laboratories | Light scattering optical waveguide method for detecting specific binding events |
CA2253710A1 (fr) * | 1996-04-25 | 1997-10-30 | Spectrametrix Inc. | Detection d'analytes a l'aide de marqueurs particulaires |
DE19630538A1 (de) | 1996-07-29 | 1998-02-05 | Rossendorf Forschzent | Kompositmaterial zur Resonanzverstärkung optischer Signale und Verfahren zu dessen Herstellung |
DE69737598T2 (de) * | 1996-07-29 | 2007-12-27 | Nanosphere Inc., Skokie | Nanopartikel mit daran angehefteten oligonukleotiden sowie deren verwendungen |
US6242264B1 (en) * | 1996-09-04 | 2001-06-05 | The Penn State Research Foundation | Self-assembled metal colloid monolayers having size and density gradients |
DE69836734D1 (de) * | 1997-02-20 | 2007-02-08 | Univ California | Plasmon-schwingteilchen, methode und vorrichtung |
US6294327B1 (en) * | 1997-09-08 | 2001-09-25 | Affymetrix, Inc. | Apparatus and method for detecting samples labeled with material having strong light scattering properties, using reflection mode light and diffuse scattering |
-
1999
- 1999-12-10 EP EP99964415A patent/EP1141762A1/fr not_active Withdrawn
- 1999-12-10 WO PCT/DE1999/003946 patent/WO2000036450A1/fr not_active Application Discontinuation
- 1999-12-10 JP JP2000588633A patent/JP2002532728A/ja not_active Withdrawn
- 1999-12-10 US US09/857,960 patent/US6934022B1/en not_active Expired - Fee Related
Non-Patent Citations (1)
Title |
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See references of WO0036450A1 * |
Also Published As
Publication number | Publication date |
---|---|
JP2002532728A (ja) | 2002-10-02 |
WO2000036450A1 (fr) | 2000-06-22 |
US6934022B1 (en) | 2005-08-23 |
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