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EP0198170A2 - Circuit moniteur - Google Patents

Circuit moniteur Download PDF

Info

Publication number
EP0198170A2
EP0198170A2 EP86101917A EP86101917A EP0198170A2 EP 0198170 A2 EP0198170 A2 EP 0198170A2 EP 86101917 A EP86101917 A EP 86101917A EP 86101917 A EP86101917 A EP 86101917A EP 0198170 A2 EP0198170 A2 EP 0198170A2
Authority
EP
European Patent Office
Prior art keywords
data
input
output
circuit
bus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP86101917A
Other languages
German (de)
English (en)
Other versions
EP0198170B1 (fr
EP0198170A3 (en
Inventor
Yukio Omron Tateisi Electronics Co. Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OFFERTA DI LICENZA AL PUBBLICO;AL PUBBLICO
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Publication of EP0198170A2 publication Critical patent/EP0198170A2/fr
Publication of EP0198170A3 publication Critical patent/EP0198170A3/en
Application granted granted Critical
Publication of EP0198170B1 publication Critical patent/EP0198170B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0763—Error or fault detection not based on redundancy by bit configuration check, e.g. of formats or tags
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
    • G05B19/058—Safety, monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/10—Plc systems
    • G05B2219/11—Plc I-O input output
    • G05B2219/1194—Send dummy, check data to I-O to check correct I-O connection
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/10—Plc systems
    • G05B2219/11—Plc I-O input output
    • G05B2219/1199—Inserting or taking out of boards during power on, hot plug in
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Definitions

  • This invention relates to a monitor circuit, more particularly to a monitor circuit for use with an input/output bus of a data processing device such as a programmable controller.
  • a programmable controller (hereinafter referred to as PC) normally has a bus gate circuit connected between a data bus of a CPU and an input/output bus connected to input/output units.
  • PC programmable controller
  • the input/output units comprises a plurality of input units and output units.
  • Such signal sources as limit switches, photo-electric switches, and proximity switches are connected to the input units and such output devices as motors, electro-magnetic valves, and pomps are connected to the output units.
  • the input/output unit plays a role of an interface connecting the PC to the equipment to be controlled and cnstitutes the portion which is subject to the worst electric environment in each component of the PC. Accordingly, it is of very importance to design the PC in such a manner that neither the input/output unit nor input/output bus are protected against malfunction caused by external noises.
  • the input/output data may be adversely affected, thus causing malfunction to the PC.
  • a monitor circuit comprising means for transmitting a dummy data through a buffer circuit to an input/out bus connected to an inputioutput unit during the time when a bus-gate circuit connected between the input/output bus and a data bus is closed, and means for judging whether or not the dummy data is correctly transmitted to the input/output bus under the operation of the transferring means.
  • FIG. 1 there is shown a whole construction of a PC.
  • a CPU 10 is constituted by MOTOROLA 6809 to which a system memory 12 for storing a system program, user program memory 14, input/output (UO) memory 18, and program console 20 are connected respectively.
  • Each I/O unit 16 NO. 0 through N plays a role of either input unit or output unit.
  • a bus gate circuit 22 is connected between a data bus DBN connected to CPU 10 and I/O bus IODN connected to each I/O unit.
  • a monitor circuit 24 is connected between the output and input of bus gate circuit 22.
  • DBN, IODN, and bus gate circuit 22 are shown to handle only one bit for the purpose of the simplification of description, actually they will be provided corresponding to the number of the output terminal of each I/O unit.
  • a step 100 each part of the PC is initialized.
  • the next step is also initializing step which is described hereinafter.
  • a step 102 a user program stored in
  • memory 14 is executed down to its end command based on the data stored in I/0 memory 18 and rewrite the output data of I/O memory 18 according to the results of its execution.
  • the next step 103 is provided to display processing conditions at program console 20 or to receive various instructions therefrom. Then. an abnormal flag FLG of monitor circuit 24 is cleared by a signal FGC (step 104).
  • the next step 105 is provided for I/O refresh processing. That is, the output data of I/O memory 18 rewriten by the execution of the user program are transferred to the corresponding output unit 16 and the latest input data of the input unit 16 are taken into the I/0 memory 18 and stored therein.
  • step 106 After completing I/O refresh processing, it is inquired if the abnormal flag FLG is set or cleared - (step 106). If the FLG remains cleared, it implies that the I/O refresh processing has been correctly completed. In this case, a sequence returns to the step 102 which is, as previously described, an execution routine of the user program. If the FLG is set, it implies that the disturbance has been caused to the 1/0 bus IODn during the I/O refresh processing and that the transferred data has been probably changed. In this case, a sequence flows to the step 104 to 105, and the I/O refresh processing will be retried.
  • monitor circuit 24 comprises data memory 26 storing a given bit pattern of dummy data, buffer circuit 28 connected between the output of memory 26 and IODn, multiplexer 30 adapted to select either dummy data from memory 26 or the data on CPU data bus DBn, coincidence circuit 32 comparing the data on IODn with the selected data by multiplexer 30, flag circuit 34 establishing the abnormal flag FLG responsive to the non-coincidence output from coincidence circuit 32, and timing generator 36 adapted to generate timing signals G1,G2,G3, and G4 based on the system clocks EE and EQ, and control signals R/W and DLD transmitted from CPU 10.
  • the step 101 shown in Fig. 3 is a routine for setting dummy data (test data) into the data memory 26.
  • Fig. 5 there is shown a time chart illustrating the operation of CPU 10 accessing to I/0 units 16 and the opration of monitor circuit 24. Firstly described is an Access Mode (Write Mode) with respect to output units 16.
  • the non-coincidence output of coincidence circuit 32 is read into flag circuit 34 with the rise of signal IOEN.
  • Access Mode (Read Mode) with respect to input units 16.
  • CPU 10 will select by channel select signals IOCHi the input unit 16 to be accessed, and lower the levels of signals IOEN and ING in the latter-half portion of a CPU machine cycle.
  • the input data of the selected input unit 16 is output to IODn, taken into DBn through bus gate circuit 22 and writen into I/0 memory 18.
  • multiplexer 30 of monitor circuit 24 is switched to select the dummy data from data memory 26 and buffer circuit 28 is opened immediately before the levels of signals IOEN and ING are lowered. That is, the dummy data of data memory 26 is transmitted through buffer circuit 28 onto IODn immediately before the input gate of bus gate circuit 22 is opened to allow the Read Mode Access. And then, the data on IODn is compared with the data of data memory 26 in coincidence circuit 32. As previously described, unless the disturbance is caused to IODn, the both data are expected to coincide with each other, while in case such disturbance is caused there is a possibility of non-coincidence between the both data. The output of non-coincidence is read into flag circuit 34 in synchronization with the rise of clock EE.
  • the monitoring operation of IODn by the use of dummy data is also performed according to the same timing mentioned above when CPU 10 accesses memories 12,14 and 18 and program console 20.
  • IO Dn is monitored not only by the use of dummy data when bus gate circuit 22 is closed, but by the use of the output data transmitted from CPU through DBn by opening gate circuit 22. Accordingly, the frequency of moitoring can be greatly raised, thereby causing very little overlook of disturbance.
  • the PC of this embodiment has the following functions which will enable previously described attaching and detaching of I/O units during the operation of the PC.
  • the unit number of the unit Prior to the replacement of a failed I/O unit 16, the unit number of the unit is registered by the use of program console 20. This input data is accepted in the step 103 (Fig. 3) and stored in a table (not shown) of system memory 12. Then, replacement OK flag is set, and "Replacement OK" is displayed in the display of program console 20. The operator of the PC will detach the unit whose number has been registered, then attach new unit thereto. After then, the operator will input the completion of the replacement using program console 20. In response to the above operation, CPU 10 will clear the concerned data stored in the table together with the replacement OK flag after confirming the replacement has been normally completed. At the same time "Completion of Replacement" is displayed.
  • CPU 10 will perform the I/O refresh in a different manner in case "replacement of unit” has been registered (during the replacement OK flag is set). That is, referring to Fig. 4, there is shown a flow chart illustrating detailed steps of the step 105 shown in Fig. 3.
  • an inquiry step 201 it is inquired if the replacement OK flag is set. If no, a sequence flows to a step 202 in which a normal I/O refresh is performed. If yes, it is inquired if the number of the accessed unit is registered (step 203). If not registered, a sequence flows to the step 202 where a normal I/O refresh is performed as described above. If registered, it is inquired in an inquiry step 204 if the registered unit is an input unit. In case of an input unit. The performance of I/O refresh is prohibited to hold the corresponding input data of I/O memory 18, while in case of an output unit, all "0" data is given to the unit.
  • I/O refresh can be completely performed because the refresh processing is repeatedly performed as previously described in the event the disturbance is caused to the I/O bus lODn due to the replacement of the failed unit As a result, the malfanction of a PC is eliminable.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • Debugging And Monitoring (AREA)
  • Programmable Controllers (AREA)
EP19860101917 1985-02-16 1986-02-14 Circuit moniteur Expired - Lifetime EP0198170B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP60029034A JPS61188602A (ja) 1985-02-16 1985-02-16 入出力バスの監視回路
JP29034/85 1985-02-16

Publications (3)

Publication Number Publication Date
EP0198170A2 true EP0198170A2 (fr) 1986-10-22
EP0198170A3 EP0198170A3 (en) 1989-11-15
EP0198170B1 EP0198170B1 (fr) 1994-01-05

Family

ID=12265122

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19860101917 Expired - Lifetime EP0198170B1 (fr) 1985-02-16 1986-02-14 Circuit moniteur

Country Status (3)

Country Link
EP (1) EP0198170B1 (fr)
JP (1) JPS61188602A (fr)
DE (1) DE3689491T2 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0416512A2 (fr) * 1989-09-04 1991-03-13 Omron Corporation Méthode et système de gestion programmable
EP0547259A1 (fr) * 1991-12-17 1993-06-23 Siemens Aktiengesellschaft Circuit pour la sûreté de fonctionnement d'un appareil à commande par calculateur
US5263170A (en) * 1985-02-16 1993-11-16 Omron Tateisi Electronics, Co. Monitor circuit for detecting noise conditions through input output coincidence comparison

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0690645B2 (ja) * 1986-10-01 1994-11-14 三菱電機株式会社 シ−ケンスコントロ−ラ用の出力ユニツト
JP2575424B2 (ja) * 1987-11-20 1997-01-22 三菱電機株式会社 プログラマブルコントローラ
JPH03132846A (ja) * 1989-10-19 1991-06-06 Koufu Nippon Denki Kk バス競合検出回路
JP5069826B2 (ja) * 2001-02-01 2012-11-07 モトローラ ソリューションズ インコーポレイテッド システム通信バス上に一体化されたエネルギ・システムの通信プロトコル
JP6280359B2 (ja) * 2013-12-17 2018-02-14 株式会社東芝 プログラマブルコントローラ
CN110832558B (zh) * 2017-08-02 2022-04-26 欧姆龙株式会社 传感器管理单元、感测数据流通系统、感测数据评价方法和存储介质
US10887675B2 (en) 2017-08-02 2021-01-05 Omron Corporation Sensor management unit, sensing data distribution system, sensing data evaluation method, and sensing data evaluation program

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3497685A (en) * 1965-11-03 1970-02-24 Ibm Fault location system
US3710350A (en) * 1970-06-22 1973-01-09 Fujitsu Ltd System for diagnosing an input-output control unit
FR2332570A1 (fr) * 1975-11-19 1977-06-17 Siemens Ag Montage pour verifier une installation de sortie de donnees

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5851289B2 (ja) * 1976-10-07 1983-11-15 豊田工機株式会社 デ−タ転送装置
JPS5850380B2 (ja) * 1978-04-03 1983-11-10 タケダ理研工業株式会社 制御システムの試験装置
JPS5685107A (en) * 1979-12-14 1981-07-11 Toshiba Corp Computer control device
JPS5852702A (ja) * 1981-09-25 1983-03-29 Omron Tateisi Electronics Co プログラマブル・コントロ−ラ
JPS58203533A (ja) * 1982-05-24 1983-11-28 Meidensha Electric Mfg Co Ltd デ−タ処理装置
JPS59133603A (ja) * 1983-01-20 1984-08-01 Omron Tateisi Electronics Co プログラマブルコントロ−ラ

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3497685A (en) * 1965-11-03 1970-02-24 Ibm Fault location system
US3710350A (en) * 1970-06-22 1973-01-09 Fujitsu Ltd System for diagnosing an input-output control unit
FR2332570A1 (fr) * 1975-11-19 1977-06-17 Siemens Ag Montage pour verifier une installation de sortie de donnees

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5263170A (en) * 1985-02-16 1993-11-16 Omron Tateisi Electronics, Co. Monitor circuit for detecting noise conditions through input output coincidence comparison
EP0416512A2 (fr) * 1989-09-04 1991-03-13 Omron Corporation Méthode et système de gestion programmable
EP0416512A3 (en) * 1989-09-04 1991-11-27 Omron Corporation A programmable monitor system and method
US5426730A (en) * 1989-09-04 1995-06-20 Omron Corporation Method and apparatus for displaying sequential function chart elements
EP0547259A1 (fr) * 1991-12-17 1993-06-23 Siemens Aktiengesellschaft Circuit pour la sûreté de fonctionnement d'un appareil à commande par calculateur
US5454113A (en) * 1991-12-17 1995-09-26 Siemens Aktiengesellschaft Circuit configuration for protecting the operation of a computer-controlled apparatus

Also Published As

Publication number Publication date
EP0198170B1 (fr) 1994-01-05
DE3689491T2 (de) 1994-08-11
EP0198170A3 (en) 1989-11-15
DE3689491D1 (de) 1994-02-17
JPS61188602A (ja) 1986-08-22

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