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EP0192121A3 - Test circuit for a cross-coupled transistor storage cell - Google Patents

Test circuit for a cross-coupled transistor storage cell Download PDF

Info

Publication number
EP0192121A3
EP0192121A3 EP86101471A EP86101471A EP0192121A3 EP 0192121 A3 EP0192121 A3 EP 0192121A3 EP 86101471 A EP86101471 A EP 86101471A EP 86101471 A EP86101471 A EP 86101471A EP 0192121 A3 EP0192121 A3 EP 0192121A3
Authority
EP
European Patent Office
Prior art keywords
cross
test circuit
storage cell
coupled transistor
transistor storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP86101471A
Other versions
EP0192121A2 (en
EP0192121B1 (en
Inventor
Roy Childs Flaker
Russell James Houghton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of EP0192121A2 publication Critical patent/EP0192121A2/en
Publication of EP0192121A3 publication Critical patent/EP0192121A3/en
Application granted granted Critical
Publication of EP0192121B1 publication Critical patent/EP0192121B1/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50016—Marginal testing, e.g. race, voltage or current testing of retention
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/81—Threshold
EP86101471A 1985-02-19 1986-02-05 Test circuit for a cross-coupled transistor storage cell Expired EP0192121B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US703001 1985-02-19
US06/703,001 US4719418A (en) 1985-02-19 1985-02-19 Defect leakage screen system

Publications (3)

Publication Number Publication Date
EP0192121A2 EP0192121A2 (en) 1986-08-27
EP0192121A3 true EP0192121A3 (en) 1989-02-22
EP0192121B1 EP0192121B1 (en) 1992-04-29

Family

ID=24823537

Family Applications (1)

Application Number Title Priority Date Filing Date
EP86101471A Expired EP0192121B1 (en) 1985-02-19 1986-02-05 Test circuit for a cross-coupled transistor storage cell

Country Status (5)

Country Link
US (1) US4719418A (en)
EP (1) EP0192121B1 (en)
JP (1) JPH0833432B2 (en)
CA (1) CA1242246A (en)
DE (1) DE3685036D1 (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5208530A (en) * 1986-09-19 1993-05-04 Actel Corporation Testability architecture and techniques for programmable interconnect architecture
US5223792A (en) * 1986-09-19 1993-06-29 Actel Corporation Testability architecture and techniques for programmable interconnect architecture
US4779043A (en) * 1987-08-26 1988-10-18 Hewlett-Packard Company Reversed IC test device and method
NL8801835A (en) * 1988-07-20 1990-02-16 Philips Nv METHOD AND APPARATUS FOR TESTING MULTIPLE POWER CONNECTIONS OF AN INTEGRATED CIRCUIT ON A PRINT PANEL
JPH0268796A (en) * 1988-09-02 1990-03-08 Fujitsu Ltd Semiconductor memory device
JPH0346193A (en) * 1989-07-13 1991-02-27 Mitsubishi Electric Corp Static semiconductor storage device
US5059897A (en) * 1989-12-07 1991-10-22 Texas Instruments Incorporated Method and apparatus for testing passive substrates for integrated circuit mounting
KR920007535B1 (en) * 1990-05-23 1992-09-05 삼성전자 주식회사 Semconductor integrated circuit having a test circuit
US5072175A (en) * 1990-09-10 1991-12-10 Compaq Computer Corporation Integrated circuit having improved continuity testability and a system incorporating the same
US5325054A (en) * 1992-07-07 1994-06-28 Texas Instruments Incorporated Method and system for screening reliability of semiconductor circuits
GB9806951D0 (en) * 1998-03-31 1998-06-03 Sgs Thomson Microelectronics Weak bit testing
US6590818B1 (en) 2002-06-17 2003-07-08 Motorola, Inc. Method and apparatus for soft defect detection in a memory
JP2006292638A (en) * 2005-04-13 2006-10-26 Denso Corp Method of inspecting circuit mounted on board
JP2006322786A (en) * 2005-05-18 2006-11-30 Denso Corp Bear chip mounting circuit device and its high power supply voltage impression test method
US20070141305A1 (en) * 2005-12-21 2007-06-21 Toshihiro Kasai Superhydrophobic coating

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0076124A2 (en) * 1981-09-26 1983-04-06 Fujitsu Limited Method of testing IC memories

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3795859A (en) * 1972-07-03 1974-03-05 Ibm Method and apparatus for determining the electrical characteristics of a memory cell having field effect transistors
DE2309616C2 (en) * 1973-02-27 1982-11-11 Ibm Deutschland Gmbh, 7000 Stuttgart Semiconductor memory circuit
US3995215A (en) * 1974-06-26 1976-11-30 International Business Machines Corporation Test technique for semiconductor memory array
US4004222A (en) * 1974-11-20 1977-01-18 Semi Test system for semiconductor memory cell
JPS5279738A (en) * 1975-12-26 1977-07-05 Hitachi Ltd Semiconductor memory unit
US4015203A (en) * 1975-12-31 1977-03-29 International Business Machines Corporation Contactless LSI junction leakage testing method
JPS564070A (en) * 1979-06-25 1981-01-16 Nippon Telegr & Teleph Corp <Ntt> Testing method of integrated circuit
JPS5720991A (en) * 1980-07-15 1982-02-03 Nec Corp Margin measuring method
JPS6010400B2 (en) * 1980-10-09 1985-03-16 富士通株式会社 Semiconductor integrated circuit device
JPS57107637A (en) * 1980-12-25 1982-07-05 Fujitsu Ltd Ecl integrated circuit
US4418403A (en) * 1981-02-02 1983-11-29 Mostek Corporation Semiconductor memory cell margin test circuit
JPS57164499A (en) * 1981-04-03 1982-10-09 Hitachi Ltd Testing method of ic memory

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0076124A2 (en) * 1981-09-26 1983-04-06 Fujitsu Limited Method of testing IC memories

Also Published As

Publication number Publication date
US4719418A (en) 1988-01-12
JPS61189473A (en) 1986-08-23
JPH0833432B2 (en) 1996-03-29
EP0192121A2 (en) 1986-08-27
DE3685036D1 (en) 1992-06-04
EP0192121B1 (en) 1992-04-29
CA1242246A (en) 1988-09-20

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