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DK1131618T3 - Måleanordning og målemetode til parallel udlæsning af SPR-sensorer - Google Patents

Måleanordning og målemetode til parallel udlæsning af SPR-sensorer

Info

Publication number
DK1131618T3
DK1131618T3 DK99958102T DK99958102T DK1131618T3 DK 1131618 T3 DK1131618 T3 DK 1131618T3 DK 99958102 T DK99958102 T DK 99958102T DK 99958102 T DK99958102 T DK 99958102T DK 1131618 T3 DK1131618 T3 DK 1131618T3
Authority
DK
Denmark
Prior art keywords
light
wavelength
spr
readout
spr sensors
Prior art date
Application number
DK99958102T
Other languages
English (en)
Inventor
Kristina Schmidt
Stefan Dickopf
Dirk Vetter
Original Assignee
Graffinity Pharm Design Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Graffinity Pharm Design Gmbh filed Critical Graffinity Pharm Design Gmbh
Application granted granted Critical
Publication of DK1131618T3 publication Critical patent/DK1131618T3/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251Colorimeters; Construction thereof
    • G01N21/253Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • G01N21/553Attenuated total reflection and using surface plasmons

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Sorting Of Articles (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
DK99958102T 1998-11-20 1999-11-16 Måleanordning og målemetode til parallel udlæsning af SPR-sensorer DK1131618T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19854370 1998-11-20

Publications (1)

Publication Number Publication Date
DK1131618T3 true DK1131618T3 (da) 2006-02-20

Family

ID=7888969

Family Applications (1)

Application Number Title Priority Date Filing Date
DK99958102T DK1131618T3 (da) 1998-11-20 1999-11-16 Måleanordning og målemetode til parallel udlæsning af SPR-sensorer

Country Status (10)

Country Link
US (1) US6441906B2 (da)
EP (1) EP1131618B1 (da)
JP (1) JP2002530668A (da)
AT (1) ATE306658T1 (da)
AU (1) AU751246B2 (da)
CA (1) CA2351454A1 (da)
DE (2) DE19955556B4 (da)
DK (1) DK1131618T3 (da)
ES (1) ES2251244T3 (da)
WO (1) WO2000031515A1 (da)

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US6747737B2 (en) * 2000-06-29 2004-06-08 Carl Zeiss Jena Gmbh Method for optical detection of an illuminated specimen in a plurality of detection channels
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JP4109022B2 (ja) * 2002-06-13 2008-06-25 富士フイルム株式会社 測定装置および該測定装置の使用方法
US6804007B2 (en) * 2002-09-10 2004-10-12 Reichert, Inc. Apparatus for multiplexing two surface plasma resonance channels onto a single linear scanned array
JP4173746B2 (ja) * 2003-02-12 2008-10-29 富士フイルム株式会社 測定装置
US7057720B2 (en) 2003-06-24 2006-06-06 Corning Incorporated Optical interrogation system and method for using same
US7292333B2 (en) * 2003-06-24 2007-11-06 Corning Incorporated Optical interrogation system and method for 2-D sensor arrays
WO2005022131A1 (ja) * 2003-08-27 2005-03-10 Toyo Boseki Kabushiki Kaisha 表面プラズモン共鳴装置
EP1659395A4 (en) 2003-12-26 2009-10-21 Panasonic Corp METHOD FOR ANALYZING A LIGAND IN A SAMPLE AND APPARATUS FOR ANALYZING A LIGAND IN A SAMPLE
JP3890362B2 (ja) * 2004-06-17 2007-03-07 国立大学法人室蘭工業大学 表面プラズモン共鳴現象測定装置
US7659987B2 (en) * 2004-09-16 2010-02-09 Canon Kabushiki Kaisha Device and method for acquiring information on objective substance to be detected by detecting a change of wavelength characteristics on the optical transmittance
US7317519B2 (en) * 2004-10-29 2008-01-08 Agilent Technologies, Inc. Swept-angle SPR measurement system
CN100520394C (zh) * 2005-03-08 2009-07-29 中国科学院电子学研究所 一种单通道多参数表面等离子体谐振测试仪
DE102005023489B4 (de) * 2005-05-17 2014-01-30 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung zur Bestimmung der Position zweier entlang einer Messrichtung zueinander beweglicher Objekte und Verfahren zur Bildung eines Referenzimpulses für eine derartige Positionsmesseinrichtung
US7483127B1 (en) * 2005-08-08 2009-01-27 Sru Biosystems, Inc. Method and apparatus for generating an image of biomolecular sensor target area
JP2009543055A (ja) * 2006-06-30 2009-12-03 コーニング インコーポレイテッド フロースルーアッセイ用の流体取扱システム
US8743367B2 (en) * 2007-05-21 2014-06-03 Bio-Rad Laboratories Inc. Optical resonance analysis using a multi-angle source of illumination
KR100865755B1 (ko) * 2007-06-29 2008-10-28 삼성전기주식회사 표면 플라즈몬 공명을 이용한 다채널 바이오 센서
WO2010122547A1 (en) * 2009-04-20 2010-10-28 Bio-Rad Laboratories Inc. Non-scanning surface plasmon resonance ( spr) system
WO2014158248A1 (en) * 2013-03-12 2014-10-02 Integrated Plasmonics Corporation Optical detection system with tilted sensor
JP7205851B2 (ja) * 2018-05-30 2023-01-17 国立大学法人東京工業大学 屈折率測定装置、屈折率測定方法およびプログラム
CN112665618B (zh) * 2020-12-17 2022-05-17 安徽中元新材料技术有限公司 一种基于形态学的波长敏感模式提取装置及方法

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Also Published As

Publication number Publication date
WO2000031515A1 (de) 2000-06-02
EP1131618A1 (de) 2001-09-12
US6441906B2 (en) 2002-08-27
AU1555900A (en) 2000-06-13
ATE306658T1 (de) 2005-10-15
ES2251244T3 (es) 2006-04-16
EP1131618B1 (de) 2005-10-12
DE19955556A1 (de) 2000-06-08
JP2002530668A (ja) 2002-09-17
US20020001085A1 (en) 2002-01-03
DE19955556B4 (de) 2004-09-09
DE59912658D1 (de) 2005-11-17
AU751246B2 (en) 2002-08-08
CA2351454A1 (en) 2000-06-02

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