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DE69625033D1 - Optisches Abtastsystem - Google Patents

Optisches Abtastsystem

Info

Publication number
DE69625033D1
DE69625033D1 DE69625033T DE69625033T DE69625033D1 DE 69625033 D1 DE69625033 D1 DE 69625033D1 DE 69625033 T DE69625033 T DE 69625033T DE 69625033 T DE69625033 T DE 69625033T DE 69625033 D1 DE69625033 D1 DE 69625033D1
Authority
DE
Germany
Prior art keywords
optical scanning
scanning system
optical
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69625033T
Other languages
English (en)
Other versions
DE69625033T2 (de
Inventor
Joseph Krimermann
Igor Friedland
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ELOP Electro Optics Industries Ltd
Original Assignee
ELOP Electro Optics Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ELOP Electro Optics Industries Ltd filed Critical ELOP Electro Optics Industries Ltd
Application granted granted Critical
Publication of DE69625033D1 publication Critical patent/DE69625033D1/de
Publication of DE69625033T2 publication Critical patent/DE69625033T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/46—Indirect determination of position data
    • G01S17/48—Active triangulation systems, i.e. using the transmission and reflection of electromagnetic waves other than radio waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/487—Extracting wanted echo signals, e.g. pulse detection
    • G01S7/4876—Extracting wanted echo signals, e.g. pulse detection by removing unwanted signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/487—Extracting wanted echo signals, e.g. pulse detection

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE69625033T 1996-01-09 1996-12-31 Optisches Abtastsystem Expired - Fee Related DE69625033T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL11671796A IL116717A (en) 1996-01-09 1996-01-09 Optical tracing system

Publications (2)

Publication Number Publication Date
DE69625033D1 true DE69625033D1 (de) 2003-01-09
DE69625033T2 DE69625033T2 (de) 2003-04-17

Family

ID=11068426

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69625033T Expired - Fee Related DE69625033T2 (de) 1996-01-09 1996-12-31 Optisches Abtastsystem

Country Status (4)

Country Link
US (1) US5864145A (de)
EP (1) EP0784214B1 (de)
DE (1) DE69625033T2 (de)
IL (1) IL116717A (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19718122A1 (de) * 1997-04-29 1998-11-05 Giesecke & Devrient Gmbh Vorrichtung zur Detektion von eigenschaften eines Blattguts mit reflektiertem Licht
DE19849793C1 (de) * 1998-10-28 2000-03-16 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur berührungslosen Erfassung von Unebenheiten in einer gewölbten Oberfläche
JP2002101274A (ja) * 2000-09-26 2002-04-05 Fuji Photo Film Co Ltd 光源装置、画像読取装置及び画像読取方法
US6504605B1 (en) 2000-10-24 2003-01-07 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
US6369879B1 (en) 2000-10-24 2002-04-09 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
US7801333B2 (en) * 2005-06-02 2010-09-21 Institut National D'optique Vision system and a method for scanning a traveling surface to detect surface defects thereof
US7564544B2 (en) * 2006-03-22 2009-07-21 3i Systems Corporation Method and system for inspecting surfaces with improved light efficiency
DE102009060551B4 (de) * 2009-12-23 2011-09-01 Deutsche Post Ag Sensorsystem zur Erfassung von Oberflächenstrukturen mehrerer Stückgüter
US10545222B2 (en) * 2017-05-08 2020-01-28 Velodyne Lidar, Inc. LIDAR data acquisition and control
JP7135081B2 (ja) * 2017-09-28 2022-09-12 ソニーセミコンダクタソリューションズ株式会社 装置および方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3149705A1 (de) 1981-12-15 1983-07-21 Siemens AG, 1000 Berlin und 8000 München "rotierendes detektorsystem mit kuehlmittelvorrat"
GB2233182B (en) * 1985-08-30 1991-05-01 Philips Electronic Associated Rangefinder
US4796998A (en) * 1985-10-03 1989-01-10 Pasco Corporation Method for mobile survey of road surface
DE3631373A1 (de) 1986-09-15 1988-03-24 Morander Karl Erik Geraet zur bestimmung des realen oder virtuellen abstandes einer lichtquelle von einer messebene
US4878754A (en) * 1986-10-16 1989-11-07 Tokyo Keiki Co. Ltd. Method of and apparatus for measuring irregularities of road surface
GB2197146B (en) 1986-11-04 1991-05-29 Canon Kk An encoder for detecting the displacement of an object to be measured
US4774403A (en) 1987-03-30 1988-09-27 Harvey Industries, Inc. Triangulation-type position measuring device
KR900000249B1 (ko) 1987-11-30 1990-01-24 주식회사 금성사 리얼타임 거리센서
US4933853A (en) * 1988-09-28 1990-06-12 Raytheon Company Ultrasonic grade and auger control
DE4206499C2 (de) * 1992-03-02 1994-03-10 Haeusler Gerd Verfahren und Vorrichtung zur Abstandsmessung
US5275327A (en) * 1992-10-13 1994-01-04 Eg&G Idaho, Inc. Integrated optical sensor
DE4242189C1 (de) * 1992-12-15 1994-03-31 Leica Sensortechnik Gmbh Verfahren und Vorrichtung zum Aufnehmen eines Entfernungsbildes
JP3189500B2 (ja) * 1993-06-25 2001-07-16 松下電器産業株式会社 電子部品の外観検査装置および外観検査方法

Also Published As

Publication number Publication date
DE69625033T2 (de) 2003-04-17
EP0784214B1 (de) 2002-11-27
IL116717A (en) 1999-12-22
IL116717A0 (en) 1996-05-14
EP0784214A3 (de) 1998-05-13
EP0784214A2 (de) 1997-07-16
US5864145A (en) 1999-01-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee