DE69432624D1 - Koppelungsstruktur zwischen einem Niedertemperatur- und einem Raumtemperatur-Schaltkreis - Google Patents
Koppelungsstruktur zwischen einem Niedertemperatur- und einem Raumtemperatur-SchaltkreisInfo
- Publication number
- DE69432624D1 DE69432624D1 DE69432624T DE69432624T DE69432624D1 DE 69432624 D1 DE69432624 D1 DE 69432624D1 DE 69432624 T DE69432624 T DE 69432624T DE 69432624 T DE69432624 T DE 69432624T DE 69432624 D1 DE69432624 D1 DE 69432624D1
- Authority
- DE
- Germany
- Prior art keywords
- coupling structure
- room temperature
- low temperature
- circuit
- temperature circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000008878 coupling Effects 0.000 title 1
- 238000010168 coupling process Methods 0.000 title 1
- 238000005859 coupling reaction Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/44—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements the complete device being wholly immersed in a fluid other than air
- H01L23/445—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements the complete device being wholly immersed in a fluid other than air the fluid being a liquefied gas, e.g. in a cryogenic vessel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05554—Shape in top view being square
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45147—Copper (Cu) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49175—Parallel arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00011—Not relevant to the scope of the group, the symbol of which is combined with the symbol of this group
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Containers, Films, And Cooling For Superconductive Devices (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28741893 | 1993-10-22 | ||
JP5287418A JP2953273B2 (ja) | 1993-10-22 | 1993-10-22 | 低温に冷却する素子の接続方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69432624D1 true DE69432624D1 (de) | 2003-06-12 |
DE69432624T2 DE69432624T2 (de) | 2004-01-22 |
Family
ID=17717078
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69432624T Expired - Lifetime DE69432624T2 (de) | 1993-10-22 | 1994-10-21 | Koppelungsstruktur zwischen einem Niedertemperatur- und einem Raumtemperatur-Schaltkreis |
Country Status (4)
Country | Link |
---|---|
US (1) | US5977479A (de) |
EP (1) | EP0650192B1 (de) |
JP (1) | JP2953273B2 (de) |
DE (1) | DE69432624T2 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2326029A (en) | 1997-06-03 | 1998-12-09 | Marconi Gec Ltd | Cryogenic electronic assembly with stripline connection and adjustment means |
US6586835B1 (en) * | 1998-08-31 | 2003-07-01 | Micron Technology, Inc. | Compact system module with built-in thermoelectric cooling |
JP4056348B2 (ja) * | 2002-10-07 | 2008-03-05 | 株式会社ルネサステクノロジ | 集積回路チップモジュールおよび携帯電話機 |
JP4278617B2 (ja) * | 2002-11-12 | 2009-06-17 | 富士通株式会社 | 実装構造及び電子装置 |
US20130258595A1 (en) * | 2012-03-27 | 2013-10-03 | Microsoft Corporation | Heat Transfer For Superconducting Integrated Circuits At Millikelvin Temperatures |
RU2650183C2 (ru) * | 2013-08-07 | 2018-04-11 | АББ С.п.А. | Охлаждающее устройство для электрического устройства и электрическое устройство, в частности автоматический выключатель, содержащий такое охлаждающее устройство |
US10509448B2 (en) * | 2015-09-24 | 2019-12-17 | Rambus Inc. | Thermal clamp for cyrogenic digital systems |
AU2017430443C1 (en) | 2017-09-07 | 2021-05-06 | Google Llc | Flexible wiring for low temperature applications |
US10891251B2 (en) * | 2018-11-09 | 2021-01-12 | International Business Machines Corporation | Signal connector for microwave circuits |
US11551125B2 (en) | 2019-02-21 | 2023-01-10 | International Business Machines Corporation | High density microwave hermetic interconnects for quantum applications |
JP7095136B2 (ja) * | 2021-03-09 | 2022-07-04 | グーグル エルエルシー | 低温用途のためのフレキシブル配線 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60229353A (ja) * | 1984-04-27 | 1985-11-14 | Hitachi Ltd | 熱伝達装置 |
US4739633A (en) * | 1985-11-12 | 1988-04-26 | Hypres, Inc. | Room temperature to cryogenic electrical interface |
EP0288022B1 (de) * | 1987-04-22 | 1995-11-15 | Sharp Kabushiki Kaisha | Supraleitfähiges Gerät |
US4805420A (en) * | 1987-06-22 | 1989-02-21 | Ncr Corporation | Cryogenic vessel for cooling electronic components |
US4950181A (en) * | 1988-07-28 | 1990-08-21 | Ncr Corporation | Refrigerated plug-in module |
JPH0242720A (ja) * | 1988-08-01 | 1990-02-13 | Matsushita Electric Ind Co Ltd | 冷却装置 |
JP2681288B2 (ja) * | 1988-11-02 | 1997-11-26 | 富士通株式会社 | 超伝導素子用パッケージ |
US5028988A (en) * | 1989-12-27 | 1991-07-02 | Ncr Corporation | Method and apparatus for low temperature integrated circuit chip testing and operation |
FR2661775B1 (fr) * | 1990-05-04 | 1994-03-04 | Telemecanique | Contacteur-disjoncteur. |
EP0464498A3 (en) * | 1990-06-22 | 1992-03-04 | Kabushiki Kaisha Toshiba | Current lead |
US5075555A (en) * | 1990-08-10 | 1991-12-24 | Kevex Instruments | Peltier cooled lithium-drifted silicon x-ray spectrometer |
-
1993
- 1993-10-22 JP JP5287418A patent/JP2953273B2/ja not_active Expired - Fee Related
-
1994
- 1994-10-21 EP EP94402380A patent/EP0650192B1/de not_active Expired - Lifetime
- 1994-10-21 DE DE69432624T patent/DE69432624T2/de not_active Expired - Lifetime
- 1994-10-24 US US08/327,868 patent/US5977479A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2953273B2 (ja) | 1999-09-27 |
EP0650192A3 (de) | 1996-11-13 |
EP0650192A2 (de) | 1995-04-26 |
DE69432624T2 (de) | 2004-01-22 |
JPH07122788A (ja) | 1995-05-12 |
EP0650192B1 (de) | 2003-05-07 |
US5977479A (en) | 1999-11-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |