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DE69413304D1 - Strahlungsuntersuchungsgerät - Google Patents

Strahlungsuntersuchungsgerät

Info

Publication number
DE69413304D1
DE69413304D1 DE69413304T DE69413304T DE69413304D1 DE 69413304 D1 DE69413304 D1 DE 69413304D1 DE 69413304 T DE69413304 T DE 69413304T DE 69413304 T DE69413304 T DE 69413304T DE 69413304 D1 DE69413304 D1 DE 69413304D1
Authority
DE
Germany
Prior art keywords
examination device
radiation examination
radiation
examination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69413304T
Other languages
English (en)
Other versions
DE69413304T2 (de
Inventor
Hendrik Johannes Jan Bolk
Georges Charles P Zieltjens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Malvern Panalytical BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of DE69413304D1 publication Critical patent/DE69413304D1/de
Application granted granted Critical
Publication of DE69413304T2 publication Critical patent/DE69413304T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Analogue/Digital Conversion (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69413304T 1993-03-24 1994-03-16 Strahlungsuntersuchungsgerät Expired - Lifetime DE69413304T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP93200850 1993-03-24

Publications (2)

Publication Number Publication Date
DE69413304D1 true DE69413304D1 (de) 1998-10-22
DE69413304T2 DE69413304T2 (de) 1999-05-12

Family

ID=8213720

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69413304T Expired - Lifetime DE69413304T2 (de) 1993-03-24 1994-03-16 Strahlungsuntersuchungsgerät

Country Status (3)

Country Link
US (1) US5545900A (de)
JP (1) JP3552744B2 (de)
DE (1) DE69413304T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6327549B1 (en) * 1999-10-25 2001-12-04 Perkinelmer, Inc. Differential correction method and apparatus
JP5646147B2 (ja) * 2008-03-28 2014-12-24 公立大学法人大阪市立大学 二次元分布を測定する方法及び装置
JP5392437B2 (ja) 2011-11-15 2014-01-22 富士電機株式会社 パルス処理装置および放射線分析装置
EP2653891A1 (de) * 2012-04-19 2013-10-23 Fei Company Verfahren zur Analyse eines EDS-Signals
US10393682B2 (en) * 2015-09-18 2019-08-27 U.S.A. As Represented By The Administrator Of The National Aeronautics And Space Administration Multiplexing x-ray fluorescence system and method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4352160A (en) * 1980-01-21 1982-09-28 The United States Of America As Represented By The Secretary Of The Air Force Statistical method of measuring the differential linearity of an analog/digital converter using a pseudo-random triangle wave stimulus
US4903023A (en) * 1985-11-06 1990-02-20 Westinghouse Electric Corp. Subranging analog-to-digital converter with digital error correction
JPS6312985A (ja) * 1986-07-03 1988-01-20 Toshiba Corp 放射線エネルギ−弁別回路
JPH03179919A (ja) * 1989-12-08 1991-08-05 Fujitsu Ltd アナログディジタル変換装置
US5304808A (en) * 1993-02-08 1994-04-19 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for data sampling

Also Published As

Publication number Publication date
DE69413304T2 (de) 1999-05-12
JP3552744B2 (ja) 2004-08-11
JPH06300854A (ja) 1994-10-28
US5545900A (en) 1996-08-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PANALYTICAL B.V., ALMELO, NL