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DE68926589D1 - Prüfgerät - Google Patents

Prüfgerät

Info

Publication number
DE68926589D1
DE68926589D1 DE68926589T DE68926589T DE68926589D1 DE 68926589 D1 DE68926589 D1 DE 68926589D1 DE 68926589 T DE68926589 T DE 68926589T DE 68926589 T DE68926589 T DE 68926589T DE 68926589 D1 DE68926589 D1 DE 68926589D1
Authority
DE
Germany
Prior art keywords
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68926589T
Other languages
English (en)
Other versions
DE68926589T2 (de
Inventor
Toru Johodenshikenkyusho Ogino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of DE68926589D1 publication Critical patent/DE68926589D1/de
Publication of DE68926589T2 publication Critical patent/DE68926589T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S706/00Data processing: artificial intelligence
    • Y10S706/902Application using ai with detail of the ai system
    • Y10S706/911Nonmedical diagnostics
    • Y10S706/913Vehicle or aerospace

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Control Of Position, Course, Altitude, Or Attitude Of Moving Bodies (AREA)
  • Navigation (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE68926589T 1988-03-30 1989-03-29 Prüfgerät Expired - Fee Related DE68926589T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7700788A JP2705087B2 (ja) 1988-03-30 1988-03-30 試験装置

Publications (2)

Publication Number Publication Date
DE68926589D1 true DE68926589D1 (de) 1996-07-11
DE68926589T2 DE68926589T2 (de) 1997-01-30

Family

ID=13621705

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68926589T Expired - Fee Related DE68926589T2 (de) 1988-03-30 1989-03-29 Prüfgerät

Country Status (4)

Country Link
US (1) US5109380A (de)
EP (1) EP0335380B1 (de)
JP (1) JP2705087B2 (de)
DE (1) DE68926589T2 (de)

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JP2534392B2 (ja) * 1990-09-21 1996-09-11 三田工業株式会社 画像形成装置のための自己診断および自己修復システム
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JP2952124B2 (ja) * 1992-11-25 1999-09-20 富士写真フイルム株式会社 写真処理機の故障診断システム
US5448722A (en) * 1993-03-10 1995-09-05 International Business Machines Corporation Method and system for data processing system error diagnosis utilizing hierarchical blackboard diagnostic sessions
SE502777C2 (sv) * 1993-04-29 1996-01-08 Ellemtel Utvecklings Ab Felisolering av delar hos ett tele- och datakommunikationssystem
US5410495A (en) * 1993-07-20 1995-04-25 Texas Instruments Incorporated Apparatus, systems, and methods for diagnosing anomalous mass flow controller operation
US5590395A (en) * 1993-11-10 1996-12-31 Motorola, Inc. Satellite cellular network resource management method and apparatus
US5586252A (en) * 1994-05-24 1996-12-17 International Business Machines Corporation System for failure mode and effects analysis
US5544308A (en) * 1994-08-02 1996-08-06 Giordano Automation Corp. Method for automating the development and execution of diagnostic reasoning software in products and processes
KR0136620B1 (ko) * 1995-03-24 1998-06-01 양승택 위성 관제 시스템에서 원격 명령 자동 제어/검증 방법
KR19990011713A (ko) * 1997-07-25 1999-02-18 윤종용 시나리오형 사용자 인터페이스에 의한 문자 정보 전송
JP2003530483A (ja) * 2000-04-11 2003-10-14 ルシェルシュ 2000 インコーポレイテッド 電気分解装置の動作パラメータの捕捉、監視、表示、および診断の方法および装置
EP1219946A3 (de) * 2000-12-28 2008-03-12 Fuji Jukogyo Kabushiki Kaisha KFZ-Organisationssystem
US6959586B2 (en) * 2001-11-07 2005-11-01 Seagate Technology Llc Evaluating data handling devices by means of a marker impurity
US7035769B2 (en) * 2001-12-26 2006-04-25 Stmicroelectronics S.R.L. Design failure mode effect analysis (DFMEA)
WO2004034166A1 (de) * 2002-09-26 2004-04-22 Siemens Aktiengesellschaft Vorrichtung und verfahren zur überwachung einer mehrere systeme umfassenden technischen anlage, insbesondere einer kraftwerksanlage
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US7509538B2 (en) * 2004-04-21 2009-03-24 Microsoft Corporation Systems and methods for automated classification and analysis of large volumes of test result data
US7865888B1 (en) 2004-12-21 2011-01-04 Zenprise, Inc. Systems and methods for gathering deployment state for automated management of software application deployments
US20060237384A1 (en) * 2005-04-20 2006-10-26 Eric Neumann Track unit with removable partitions
JP4759402B2 (ja) * 2006-02-03 2011-08-31 コスモ石油ルブリカンツ株式会社 商品の品質管理サポートシステム及び品質管理サポート方法
US8762165B2 (en) 2006-06-14 2014-06-24 Bosch Automotive Service Solutions Llc Optimizing test procedures for a subject under test
US7643916B2 (en) 2006-06-14 2010-01-05 Spx Corporation Vehicle state tracking method and apparatus for diagnostic testing
US8423226B2 (en) * 2006-06-14 2013-04-16 Service Solutions U.S. Llc Dynamic decision sequencing method and apparatus for optimizing a diagnostic test plan
US9081883B2 (en) 2006-06-14 2015-07-14 Bosch Automotive Service Solutions Inc. Dynamic decision sequencing method and apparatus for optimizing a diagnostic test plan
US7865278B2 (en) * 2006-06-14 2011-01-04 Spx Corporation Diagnostic test sequence optimization method and apparatus
US8428813B2 (en) 2006-06-14 2013-04-23 Service Solutions Us Llc Dynamic decision sequencing method and apparatus for optimizing a diagnostic test plan
US20070293998A1 (en) * 2006-06-14 2007-12-20 Underdal Olav M Information object creation based on an optimized test procedure method and apparatus
US20100324376A1 (en) * 2006-06-30 2010-12-23 Spx Corporation Diagnostics Data Collection and Analysis Method and Apparatus
JP5011947B2 (ja) * 2006-10-19 2012-08-29 オムロン株式会社 Fmeaシートの作成方法およびfmeaシート自動作成装置
EP1980964B1 (de) * 2007-04-13 2016-03-23 Yogitech Spa Verfahren und Computerprogramm zur Durchführung Fehlermöglichkeits-und Einflussanalyse für integrierte Schaltungen
CN100456191C (zh) * 2007-11-16 2009-01-28 航天东方红卫星有限公司 一种卫星自动化测试平台及测试方法
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US8793048B2 (en) 2007-12-26 2014-07-29 Hewlett-Packard Development Company, L.P. Apparatus and method for analyzing multiple fault occurrence of multiple-state device
US20090216584A1 (en) * 2008-02-27 2009-08-27 Fountain Gregory J Repair diagnostics based on replacement parts inventory
US20090216401A1 (en) * 2008-02-27 2009-08-27 Underdal Olav M Feedback loop on diagnostic procedure
US8239094B2 (en) * 2008-04-23 2012-08-07 Spx Corporation Test requirement list for diagnostic tests
US20090313506A1 (en) * 2008-06-12 2009-12-17 Microsoft Corporation Test Result Aggregation and Analysis Using Text Expressions
US8170968B2 (en) * 2008-08-15 2012-05-01 Honeywell International Inc. Recursive structure for diagnostic model
US8648700B2 (en) * 2009-06-23 2014-02-11 Bosch Automotive Service Solutions Llc Alerts issued upon component detection failure
DE102011007049A1 (de) * 2011-04-08 2012-10-11 Siemens Ag Österreich Verfahren zur raschen Notabschaltung von verteilten Anlagen und zugehörige Vorrichtung
CN103234768A (zh) * 2013-04-24 2013-08-07 广东石油化工学院 组合式风机复合故障诊断试验方法
EP3059676B1 (de) 2015-02-20 2019-09-11 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Analyse der Verfügbarkeit eines Systems, insbesondere eines sicherheitskritischen Systems
US10241852B2 (en) * 2015-03-10 2019-03-26 Siemens Aktiengesellschaft Automated qualification of a safety critical system
CN106610345B (zh) * 2015-10-27 2019-10-25 北京卫星环境工程研究所 一套用于空间环境模拟试验设备的健康状态监测系统
CN105404275B (zh) * 2015-11-26 2018-04-27 航天东方红卫星有限公司 一种卫星控制测试设备自动检测系统及检测方法
CN105947238B (zh) * 2016-05-30 2017-05-10 北京航空航天大学 一种转动惯量不确定的火星着陆器抗干扰姿态控制方法
CN108490461B (zh) * 2018-02-28 2022-11-29 上海交通大学 一种卫星导航信号采集回放仪定位精度一致性的测试方法
CN110361630A (zh) * 2019-07-12 2019-10-22 广东电网有限责任公司 一种基于fmea的电缆故障数据管理与分析方法
US11501033B2 (en) * 2019-10-07 2022-11-15 The Boeing Company Model-based systems engineering model conversion with text requirements
US11807405B2 (en) 2020-10-28 2023-11-07 Maxar Space Llc Spacecraft with universal test port
CN113312271B (zh) * 2021-06-28 2024-09-06 四创电子股份有限公司 一种基于大数据的射频组件自动化测试与诊断平台

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JPH0650442B2 (ja) * 1983-03-09 1994-06-29 株式会社日立製作所 設備群制御方法およびシステム
US4736296A (en) * 1983-12-26 1988-04-05 Hitachi, Ltd. Method and apparatus of intelligent guidance in natural language
US4649515A (en) * 1984-04-30 1987-03-10 Westinghouse Electric Corp. Methods and apparatus for system fault diagnosis and control
US4670848A (en) * 1985-04-10 1987-06-02 Standard Systems Corporation Artificial intelligence system
JPS6267668A (ja) * 1985-09-20 1987-03-27 Mitsubishi Electric Corp 試験装置
US4754410A (en) * 1986-02-06 1988-06-28 Westinghouse Electric Corp. Automated rule based process control method with feedback and apparatus therefor
JPS63204118A (ja) * 1987-02-19 1988-08-23 Mitsubishi Electric Corp 試験装置
JPS63228080A (ja) * 1987-03-17 1988-09-22 Mitsubishi Electric Corp 試験装置

Also Published As

Publication number Publication date
DE68926589T2 (de) 1997-01-30
JP2705087B2 (ja) 1998-01-26
EP0335380B1 (de) 1996-06-05
EP0335380A2 (de) 1989-10-04
EP0335380A3 (de) 1991-01-30
JPH01250016A (ja) 1989-10-05
US5109380A (en) 1992-04-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee