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DE602007007829D1 - Scantest - Google Patents

Scantest

Info

Publication number
DE602007007829D1
DE602007007829D1 DE602007007829T DE602007007829T DE602007007829D1 DE 602007007829 D1 DE602007007829 D1 DE 602007007829D1 DE 602007007829 T DE602007007829 T DE 602007007829T DE 602007007829 T DE602007007829 T DE 602007007829T DE 602007007829 D1 DE602007007829 D1 DE 602007007829D1
Authority
DE
Germany
Prior art keywords
scan test
scan
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602007007829T
Other languages
English (en)
Inventor
Paul Armagnat
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Publication of DE602007007829D1 publication Critical patent/DE602007007829D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
DE602007007829T 2006-01-27 2007-01-25 Scantest Active DE602007007829D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0600787A FR2896884A1 (fr) 2006-01-27 2006-01-27 Test de scan

Publications (1)

Publication Number Publication Date
DE602007007829D1 true DE602007007829D1 (de) 2010-09-02

Family

ID=37460082

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602007007829T Active DE602007007829D1 (de) 2006-01-27 2007-01-25 Scantest

Country Status (4)

Country Link
US (1) US7739566B2 (de)
EP (1) EP1813952B1 (de)
DE (1) DE602007007829D1 (de)
FR (1) FR2896884A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8166343B2 (en) * 2009-12-01 2012-04-24 Hamilton Sundstrand Corporation Processing system hardware diagnostics
FR2969765A1 (fr) * 2010-12-27 2012-06-29 St Microelectronics Grenoble 2 Circuit numerique testable par seulement deux broches
US10768232B2 (en) 2017-07-14 2020-09-08 International Business Machines Corporation ATE compatible high-efficient functional test

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69126575T2 (de) * 1990-08-06 1997-12-11 Texas Instruments Inc Durch Ereignis befähigte Prüfarchitektur
US6154856A (en) * 1997-04-08 2000-11-28 Advanced Micro Devices, Inc. Debug interface including state machines for timing synchronization and communication
US6618775B1 (en) * 1997-08-15 2003-09-09 Micron Technology, Inc. DSP bus monitoring apparatus and method
US6836757B1 (en) * 1999-02-19 2004-12-28 Texas Instruments Incorporated Emulation system employing serial test port and alternative data transfer protocol
US6654383B2 (en) * 2001-05-31 2003-11-25 International Business Machines Corporation Multi-protocol agile framer
US20070204089A1 (en) * 2006-02-27 2007-08-30 Microsoft Corporation Multi-protocol removable storage device

Also Published As

Publication number Publication date
EP1813952A1 (de) 2007-08-01
US7739566B2 (en) 2010-06-15
FR2896884A1 (fr) 2007-08-03
EP1813952B1 (de) 2010-07-21
US20070260953A1 (en) 2007-11-08

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