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DE3480808D1 - Akustisches mikroskop. - Google Patents

Akustisches mikroskop.

Info

Publication number
DE3480808D1
DE3480808D1 DE8484101533T DE3480808T DE3480808D1 DE 3480808 D1 DE3480808 D1 DE 3480808D1 DE 8484101533 T DE8484101533 T DE 8484101533T DE 3480808 T DE3480808 T DE 3480808T DE 3480808 D1 DE3480808 D1 DE 3480808D1
Authority
DE
Germany
Prior art keywords
acoustic microscope
acoustic
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8484101533T
Other languages
English (en)
Inventor
Hiroshi Kanda
Kageyoshi Katakura
Isao Ishikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE3480808D1 publication Critical patent/DE3480808D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H3/00—Measuring characteristics of vibrations by using a detector in a fluid
    • G01H3/10—Amplitude; Power
    • G01H3/12—Amplitude; Power by electric means
    • G01H3/125—Amplitude; Power by electric means for representing acoustic field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
DE8484101533T 1983-03-07 1984-02-15 Akustisches mikroskop. Expired - Lifetime DE3480808D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58035828A JPS59162449A (ja) 1983-03-07 1983-03-07 超音波顕微鏡

Publications (1)

Publication Number Publication Date
DE3480808D1 true DE3480808D1 (de) 1990-01-25

Family

ID=12452813

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484101533T Expired - Lifetime DE3480808D1 (de) 1983-03-07 1984-02-15 Akustisches mikroskop.

Country Status (5)

Country Link
US (1) US4563898A (de)
EP (1) EP0121690B1 (de)
JP (1) JPS59162449A (de)
CA (1) CA1206585A (de)
DE (1) DE3480808D1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3417864A1 (de) * 1984-05-14 1985-11-14 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Verfahren und vorrichtung zum lokalselektiven nachweis und der erzeugung von polaren strukturausrichtungen in mikroskopischen objektbereichen
JPH071255B2 (ja) * 1987-11-16 1995-01-11 川崎製鉄株式会社 方向性珪素鋼板の結晶粒方位分布測定方法及び装置
JPH02193065A (ja) * 1989-01-20 1990-07-30 Canon Inc 超音波装置
US5549003A (en) * 1992-10-21 1996-08-27 The United States Of America As Represented By The Secretary Of Commerce Method and apparatus for visualization of internal stresses in solid non-transparent materials by ultrasonic techniques and ultrasonic computer tomography of stress
US5507818A (en) * 1994-06-30 1996-04-16 Mclaughlin; John A. Multipolar joint endoprosthesis
US5631425A (en) * 1996-03-07 1997-05-20 Integrated Device Technology, Inc. Method for identifying molding compound using an acoustic microscope
US7876423B1 (en) * 2008-06-27 2011-01-25 The United States Of America As Represented By The National Aeronautics And Space Administration Simultaneous noncontact precision imaging of microstructural and thickness variation in dielectric materials using terahertz energy
US7933027B1 (en) * 2008-06-27 2011-04-26 The United States Of America As Represented By The Administrator Of National Aeronautics And Space Administration Processing waveform-based NDE
KR102207211B1 (ko) 2014-10-27 2021-01-25 삼성전자주식회사 검사 장치, 및 이를 포함하는 영상 장치
CN107449379A (zh) * 2017-08-14 2017-12-08 北京智芯微电子科技有限公司 用于sim卡芯片的无损测量方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4012950A (en) * 1974-12-12 1977-03-22 The Board Of Trustees Of The Leland Stanford University Method of and apparatus for acoustic imaging
JPS599000B2 (ja) * 1979-02-13 1984-02-28 東レ株式会社 超音波トランスデユ−サ
JPS6312537B2 (de) * 1979-05-24 1988-03-19 Nat Res Dev
JPS57173746A (en) * 1981-04-21 1982-10-26 Olympus Optical Co Ltd Ultrasonic microscope
JPS57191543A (en) * 1981-05-21 1982-11-25 Olympus Optical Co Ltd Focus adjusting method of ultrasonic microscope
JPS5952751A (ja) * 1982-09-20 1984-03-27 Hitachi Ltd 超音波顕微鏡

Also Published As

Publication number Publication date
EP0121690A2 (de) 1984-10-17
CA1206585A (en) 1986-06-24
EP0121690A3 (en) 1985-07-31
US4563898A (en) 1986-01-14
JPS59162449A (ja) 1984-09-13
EP0121690B1 (de) 1989-12-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee