DE1521953A1 - Verfahren zur Herstellung eines Oxydbelages auf einem vorzugsweise einkristallinen Koerper aus Halbleitermaterial - Google Patents
Verfahren zur Herstellung eines Oxydbelages auf einem vorzugsweise einkristallinen Koerper aus HalbleitermaterialInfo
- Publication number
- DE1521953A1 DE1521953A1 DE19621521953 DE1521953A DE1521953A1 DE 1521953 A1 DE1521953 A1 DE 1521953A1 DE 19621521953 DE19621521953 DE 19621521953 DE 1521953 A DE1521953 A DE 1521953A DE 1521953 A1 DE1521953 A1 DE 1521953A1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor material
- oxide coating
- body made
- production
- pla
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 11
- 238000000034 method Methods 0.000 title claims description 10
- 238000000576 coating method Methods 0.000 title claims description 6
- 239000011248 coating agent Substances 0.000 title claims description 5
- 239000000463 material Substances 0.000 title claims description 5
- 238000004519 manufacturing process Methods 0.000 title description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 8
- 239000000126 substance Substances 0.000 claims description 6
- 239000001257 hydrogen Substances 0.000 claims description 4
- 229910052739 hydrogen Inorganic materials 0.000 claims description 4
- 239000003513 alkali Substances 0.000 claims description 3
- 150000002500 ions Chemical class 0.000 claims description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 8
- FVAUCKIRQBBSSJ-UHFFFAOYSA-M sodium iodide Chemical compound [Na+].[I-] FVAUCKIRQBBSSJ-UHFFFAOYSA-M 0.000 description 6
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 5
- 239000003708 ampul Substances 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 235000002639 sodium chloride Nutrition 0.000 description 3
- 239000011780 sodium chloride Substances 0.000 description 3
- -1 Hydrogen ions Chemical class 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- BYDQGSVXQDOSJJ-UHFFFAOYSA-N [Ge].[Au] Chemical compound [Ge].[Au] BYDQGSVXQDOSJJ-UHFFFAOYSA-N 0.000 description 2
- 235000009518 sodium iodide Nutrition 0.000 description 2
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- VMHLLURERBWHNL-UHFFFAOYSA-M Sodium acetate Chemical compound [Na+].CC([O-])=O VMHLLURERBWHNL-UHFFFAOYSA-M 0.000 description 1
- 229910001413 alkali metal ion Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- BNIILDVGGAEEIG-UHFFFAOYSA-L disodium hydrogen phosphate Chemical compound [Na+].[Na+].OP([O-])([O-])=O BNIILDVGGAEEIG-UHFFFAOYSA-L 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- GPRLSGONYQIRFK-UHFFFAOYSA-N hydron Chemical compound [H+] GPRLSGONYQIRFK-UHFFFAOYSA-N 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- 235000011007 phosphoric acid Nutrition 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000001632 sodium acetate Substances 0.000 description 1
- 235000017281 sodium acetate Nutrition 0.000 description 1
- PTLRDCMBXHILCL-UHFFFAOYSA-M sodium arsenite Chemical compound [Na+].[O-][As]=O PTLRDCMBXHILCL-UHFFFAOYSA-M 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
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- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/009—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
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- C—CHEMISTRY; METALLURGY
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- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/50—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials
- C04B41/5025—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials with ceramic materials
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- C—CHEMISTRY; METALLURGY
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- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/85—Coating or impregnation with inorganic materials
- C04B41/87—Ceramics
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F3/00—Brightening metals by chemical means
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B31/00—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
- C30B31/02—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion materials in the solid state
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- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B31/00—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
- C30B31/06—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion material in the gaseous state
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- H—ELECTRICITY
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- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
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- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H01L21/02129—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material being boron or phosphorus doped silicon oxides, e.g. BPSG, BSG or PSG
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- H01L21/02145—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing silicon and at least one metal element, e.g. metal silicate based insulators or metal silicon oxynitrides the material containing aluminium, e.g. AlSiOx
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- H01L21/02233—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer
- H01L21/02236—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer group IV semiconductor
- H01L21/02238—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer group IV semiconductor silicon in uncombined form, i.e. pure silicon
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- H01L21/02107—Forming insulating materials on a substrate
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- H01L21/02255—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by thermal treatment
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
- H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
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- H01L21/31654—Inorganic layers composed of oxides or glassy oxides or oxide based glass formed by oxidation of semiconductor materials, e.g. the body itself
- H01L21/31658—Inorganic layers composed of oxides or glassy oxides or oxide based glass formed by oxidation of semiconductor materials, e.g. the body itself by thermal oxidation, e.g. of SiGe
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- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Formation Of Insulating Films (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Silicon Compounds (AREA)
- Glass Compositions (AREA)
Description
Verfahren zur Herstellung eines Oxydbelages auf einem vorzugsweise einkristallinen Körper aus Halbleitermaterial
Zusatz zu Patent (Anm. P 15 21 950.8 - PLA 61/1786)
Das Hauptpatent (Anm. P 15 21 950.8 - PLA 61/1786)
betrifft ein Verfahren zur Herstellung eines Oxydbelages auf einem vorzugsweise einkristallinen Körper aus Halbleitermaterial,
insbesondere aus Silizium, unter Verwendung von Wasserdampf, wobei dem Wasserdampf ein bei erhöhter Temperatur
Wasserstoffionen und/oder Alkaliionen abspaltender und sich mindestens teilweise verflüchtigender Stoff beigemengt
wird. Die Erfindung betrifft eine Verbesserung dieses Verfahrens und ist dadurch gekennzeichnet, daß anstelle von Wasser Wasser-
Wl/Fö
009828/1 647
bad original
PLA 62/1289
stoffsuperoxyd verwendet wird, insbesondere Wasserstoffsuperoxyd mit einer hohen. Konzentration von z.B. 30 $.
Es hat sich als zweckmäßig erwieeen, auf die Oberfläche eines Halbleiterkörpers einen Oxydbelag aufzubringen, der nach Fertigstellung
eines Halbleiterbauelementes weitgehend das Eindringen von Fremdstoffen verhindern kann. Oxydbeläge können auch zur
Maskierung bei der Herstellung von Halbleiteranordnungen durch Diffusion dienen. Weiter können Oxydhäute mit eingelagerten
Dotieiungsstoffen auf Halbleiterkörper aufgebracht und anschliessend
durch eine Wärmebehandlung die Dotierungs3toffe in das Halbleitermaterial eindiffundiert werden.
Das Verfahren gemäß dem Hauptpatent dient zur Herstellung von Oxydhäuten zu diesen Zwecken. Es hat sich gezeigt, daß die nach
diesem Verfahren hergestellten Oxydhäute wisch- und chlorfest sind. Der Hauptvorteil des Verfahrens ist darin zu sehen, daß verhältnismäßig
niedrige Temperaturen angewendet werden, z.B. Temperaturen die unterhalb des Schmelzpunktes des Gold-Germanium- bzw« des GoId-Silizium-Eutektikums
liegen (360 bzw. 370 0C). Bei der Erzeugung
von Oxydschichten mit Hilfe von Wasserdampf ohne Verwendung, eines
Wasserstoffionen oder Alkaliionen abspaltenden Stoffes liegt die untere Grenze der Entstehung von Oxyden im Falle von Silizium
bei etwa 600 0C.
Das Verfahren gemäß der Erfindung wird in der gleichen Weise wie dao Verfahren gemäß dem Hauptpatent durchgeführt. Es wird lediglich
Wasserstoffsuperoxyd anstelle von Wasser verwendet. Es
009828/1647 ^
BAD ORiGlNAL - 2 - Si/Küp
PLA 62/1289
zeigte sich, daß bei gleicher Temperatur, Kenge und Zeit mindestens
doppelt so große Schichtdicken der entstehenden Oxydhäute
wie bei dem Verfahren gemäß dem Häuptpatent erzielt werden können. Offenbar ist dies darauf zurückzuführen, dai3 im
Falle der Verwendung von Wasserstoffsuperoxyd Sauerstoff in einer besonders reaktionsfreudigen Form vorhanden ist.
Man kann beispielsweise in einer Ampulle, die aus Quarz oder
Glas bestehen kann, eine Reihe von scheibenförmigen Halbleiterkörpern
anordnen, sowie in einer gewissen Entfernung davon, z.3. in einer Abschnürung der Ampulle, 100 mg Wasserstoffsuperoxyd
und 20 mg Kochsalz. Danach wird die Ampulle abgeschmolzen und beispielsweise in einem Ofen erwärmt. Zweckmäßig wird die Ampulle
auf eine Temperatur von mehr als 2500C, insbesondere 35OT, gebracht
und mindestens 30 Minuten auf dieser Temperatur belassen. Beispielsweise kann eine Wärmebehandlung von' 3.0CW und von 16 Std.
Dauer vorgenommen werden. Nach der Wärmebehandlung besitzen die Halbleiterkörper eine Oxydhaut von einigen 1000 & Dicke.
Als Wasserstoffionen und bzw. oder Alkaliionen abspaltende Stoffe haben sich insbesondere Natriumacetat CH-COONa . 3H?0, Orthophosphorsäure
H-PO^, Schwefelsäure H2SO., Dinatriumhydrogenphosphat
Na HPO4 . 12H2O, Kochsalz NaCl, Natriumiodid NaJ und Natriumarsenit
Ua-AsO- als geeignet erwiesen."
3 Patentansprüche
00982 8/16^7 ... .
- 3 - BAD ORIGINAL Si/Küp
Claims (1)
- PLA 62/1289Patentansprüche1. Vorfahren sur Herstellung eines Oxydbelages auf einem vorzugsweise einkristallinen Körper aus-Halbleitermaterial, insbesondere aus 'oilizium, unter Verwendung von Wasserdampf,P 15 21 950.8 wobei gem:iß Patent ... ... (Anmeldung SxffcsxSixXiii*?&±£, PLA 61/I7bb) dein Wasserdampf ein bei erhöhter Temperatur Wasstrstoffionen und/oder Alkaliionen abspaltender und sich mindestens teilweise verflüchtigender Stoff beigemengt wird, dadurch gekennzeichnet, daß anstelle von Wasser Wasserstoffsuparoxyd verwendet wird.P. /erfahren nach Anspruch 1f dadurch gekennzeichnet, daß ■.VasserQtoff3uperox.yd in einer Konzentration von 30 fo verwendet wird.3. Verfahren nach Anepruch 1, dadurch gekennzeichnet! daß es bei einer !Temperatur von mehr als 2500C, "insbesondere von etwa 35OH;, durchgeführt wird.Urne Unterlagen nut?st. ...-.. ... >;, ..:.r...al«..« - ι■< 009828/16A7- 4 - - ' %/KüpBAD ORIGINAL
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DES0076751 | 1961-11-18 | ||
DES0079385 | 1962-05-10 | ||
DES0079384 | 1962-05-10 | ||
DES0079385 | 1962-05-10 |
Publications (3)
Publication Number | Publication Date |
---|---|
DE1521953A1 true DE1521953A1 (de) | 1970-07-09 |
DE1521953B2 DE1521953B2 (de) | 1972-08-17 |
DE1521953C DE1521953C (de) | 1973-03-22 |
Family
ID=
Also Published As
Publication number | Publication date |
---|---|
NL289736A (de) | |
SE323451B (de) | 1970-05-04 |
NL285088A (de) | |
CH471239A (de) | 1969-04-15 |
US3260626A (en) | 1966-07-12 |
GB1001620A (en) | 1965-08-18 |
SE324184B (de) | 1970-05-25 |
DE1521952A1 (de) | 1969-07-31 |
NL287407A (de) | |
DE1521950A1 (de) | 1970-03-12 |
DE1521950B2 (de) | 1971-07-29 |
CH471240A (de) | 1969-04-15 |
GB1014287A (en) | 1965-12-22 |
GB1014286A (en) | 1965-12-22 |
DE1521953B2 (de) | 1972-08-17 |
CH406779A (de) | 1966-01-31 |
DE1521952B2 (de) | 1972-06-08 |
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