DE112012002312A5 - Infrarot-Sensoranordnung und deren Verwendung - Google Patents
Infrarot-Sensoranordnung und deren Verwendung Download PDFInfo
- Publication number
- DE112012002312A5 DE112012002312A5 DE112012002312.9T DE112012002312T DE112012002312A5 DE 112012002312 A5 DE112012002312 A5 DE 112012002312A5 DE 112012002312 T DE112012002312 T DE 112012002312T DE 112012002312 A5 DE112012002312 A5 DE 112012002312A5
- Authority
- DE
- Germany
- Prior art keywords
- infrared sensor
- sensor arrangement
- arrangement
- infrared
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0801—Means for wavelength selection or discrimination
- G01J5/0802—Optical filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0205—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/07—Arrangements for adjusting the solid angle of collected radiation, e.g. adjusting or orienting field of view, tracking position or encoding angular position
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0808—Convex mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0893—Arrangements to attach devices to a pyrometer, i.e. attaching an optical interface; Spatial relative arrangement of optical elements, e.g. folded beam path
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/407—Optical elements or arrangements indirectly associated with the devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102011103818.7 | 2011-06-01 | ||
DE102011103818A DE102011103818A1 (de) | 2011-06-01 | 2011-06-01 | Infrarot-Sensoranordnung und deren Verwendung |
PCT/EP2012/002328 WO2012163539A1 (de) | 2011-06-01 | 2012-06-01 | Infrarot-sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
DE112012002312A5 true DE112012002312A5 (de) | 2014-02-27 |
Family
ID=46395568
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102011103818A Withdrawn DE102011103818A1 (de) | 2011-06-01 | 2011-06-01 | Infrarot-Sensoranordnung und deren Verwendung |
DE112012002312.9T Pending DE112012002312A5 (de) | 2011-06-01 | 2012-06-01 | Infrarot-Sensoranordnung und deren Verwendung |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102011103818A Withdrawn DE102011103818A1 (de) | 2011-06-01 | 2011-06-01 | Infrarot-Sensoranordnung und deren Verwendung |
Country Status (4)
Country | Link |
---|---|
US (1) | US9052235B2 (de) |
CN (1) | CN103797345B (de) |
DE (2) | DE102011103818A1 (de) |
WO (1) | WO2012163539A1 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6198411B2 (ja) * | 2013-03-04 | 2017-09-20 | 大阪瓦斯株式会社 | 温度測定装置 |
US9735135B2 (en) * | 2014-12-04 | 2017-08-15 | Pixart Imaging (Penang) Sdn. Bhd. | Optical sensor package and optical sensor assembly |
WO2016152222A1 (ja) * | 2015-03-25 | 2016-09-29 | Semitec株式会社 | 赤外線温度センサ及び赤外線温度センサを用いた装置 |
US9917242B2 (en) | 2015-03-27 | 2018-03-13 | Maxim Integrated Products, Inc. | Thermopile temperature sensor field of view narrowing using integrated light blocking layer and lens |
EP3078951A1 (de) | 2015-04-10 | 2016-10-12 | Silverlight AG | Einrichtung mit pir sensor |
US9915567B2 (en) * | 2016-06-28 | 2018-03-13 | Excelitas Technologies Singapore Pte. Ltd. | Unreleased thermopile infrared sensor using material transfer method |
US10775030B2 (en) | 2017-05-05 | 2020-09-15 | Flex Ltd. | Light fixture device including rotatable light modules |
US20180320885A1 (en) * | 2017-05-05 | 2018-11-08 | Flex Ltd. | Light module having a heatsink crimped around a lens, and a method for crimping a heat sink around a lens of a light module |
CN108151887A (zh) * | 2017-12-25 | 2018-06-12 | 湖南航天诚远精密机械有限公司 | 一种微波实验炉 |
JP7121289B2 (ja) * | 2019-02-05 | 2022-08-18 | 日本電信電話株式会社 | 波長選択型光受信装置 |
US11041742B2 (en) * | 2019-09-27 | 2021-06-22 | Lyft, Inc. | Secure thermally-managed case for a sensing device |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4384207A (en) * | 1981-01-23 | 1983-05-17 | Eltec Instruments, Inc. | Differential pyroelectric detector |
NZ198264A (en) * | 1981-09-03 | 1985-03-20 | Nz Government | Hand-held multispectral radiometer for remote sensing |
US4626686A (en) | 1984-04-09 | 1986-12-02 | Exergen Corporation | Variable field of view heat scanner |
DE3650770T2 (de) | 1985-04-17 | 2003-02-27 | Thermoscan Inc., San Diego | Elektronisches Infrarotthermometer und Verfahren zur Temperaturmessung |
GB8706507D0 (en) * | 1987-03-19 | 1987-04-23 | Land Infrared Ltd | Radiation thermometer |
JPH0530105Y2 (de) * | 1987-05-29 | 1993-08-02 | ||
US5018872A (en) | 1988-11-01 | 1991-05-28 | Diatek, Inc. | Probe assembly for infrared thermometer |
US4970403A (en) * | 1988-11-18 | 1990-11-13 | Ltv Aerospace And Defense Company | Focal array reimaging system |
US5672875A (en) * | 1992-07-15 | 1997-09-30 | Optix Lp | Methods of minimizing scattering and improving tissue sampling in non-invasive testing and imaging |
US5721430A (en) * | 1995-04-13 | 1998-02-24 | Engelhard Sensor Technologies Inc. | Passive and active infrared analysis gas sensors and applicable multichannel detector assembles |
JPH10281864A (ja) * | 1997-04-03 | 1998-10-23 | Nikon Corp | 熱型赤外線カメラ |
KR100370001B1 (ko) * | 1998-10-31 | 2003-01-29 | 엘지전자 주식회사 | 온도감지장치 |
DE10144343A1 (de) * | 2001-09-10 | 2003-03-27 | Perkinelmer Optoelectronics | Sensor zum berührugslosen Messen einer Temperatur |
US7427758B2 (en) * | 2003-05-28 | 2008-09-23 | Opto-Knowledge Systems, Inc. | Cryogenically cooled adjustable apertures for infra-red cameras |
US7157706B2 (en) * | 2003-05-28 | 2007-01-02 | Opto-Knowledge Systems, Inc. | Cryogenically cooled adjustable apertures for infrared cameras |
DE102004030418A1 (de) | 2004-06-24 | 2006-01-19 | Robert Bosch Gmbh | Mikrostrukturierter Infrarot-Sensor und ein Verfahren zu seiner Herstellung |
US7064909B2 (en) * | 2004-08-26 | 2006-06-20 | Prodisc Technology Inc. | Image pickup lens assembly with a filter lens |
US20080204757A1 (en) * | 2006-08-17 | 2008-08-28 | Christopher Manning | Handheld FT-IR spectrometer |
EP2310189B1 (de) | 2008-07-07 | 2015-01-28 | Max Canti | Verfahren zur gewinnung einer mischung für die herstellung handgefertigter artikel zur beschichtung oder bildung von oberflächen und anhand dieses verfahrens gewonnene mischung |
US9335219B2 (en) * | 2010-06-07 | 2016-05-10 | Exergen Corporation | Dual waveband temperature detector |
WO2012100230A1 (en) * | 2011-01-20 | 2012-07-26 | Fivefocal, Llc | Passively athermalized infrared imaging system and methods of manufacturing same |
-
2011
- 2011-06-01 DE DE102011103818A patent/DE102011103818A1/de not_active Withdrawn
-
2012
- 2012-06-01 WO PCT/EP2012/002328 patent/WO2012163539A1/de active Application Filing
- 2012-06-01 DE DE112012002312.9T patent/DE112012002312A5/de active Pending
- 2012-06-01 US US14/123,049 patent/US9052235B2/en active Active
- 2012-06-01 CN CN201280030660.3A patent/CN103797345B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
WO2012163539A1 (de) | 2012-12-06 |
CN103797345A (zh) | 2014-05-14 |
CN103797345B (zh) | 2017-06-16 |
US9052235B2 (en) | 2015-06-09 |
US20140291521A1 (en) | 2014-10-02 |
DE102011103818A1 (de) | 2012-12-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R012 | Request for examination validly filed | ||
R081 | Change of applicant/patentee |
Owner name: TE CONNECTIVITY SENSORS GERMANY GMBH, DE Free format text: FORMER OWNER: MEAS DEUTSCHLAND GMBH, 44227 DORTMUND, DE |
|
R082 | Change of representative |
Representative=s name: KOENIG SZYNKA TILMANN VON RENESSE PATENTANWAEL, DE |
|
R016 | Response to examination communication | ||
R016 | Response to examination communication | ||
R016 | Response to examination communication | ||
R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: G01J0005080000 Ipc: G01J0005060000 |
|
R016 | Response to examination communication |