DE10246347A1 - Test circuit arrangement for testing terminal connection e.g. of telecommunication network, includes test/control unit for authorizing simulation of signalling functions in cooperation with access unit during positive test result - Google Patents

Abstract

A test circuit arrangement (66) with test device connection (64a, 64b) for connecting a test device, has a input-side connection (76) for connection of the test circuit arrangement (66) to the data transmission network, a control unit for simulation the signalling function of a connection unit (12), and access unit for accessing a test result data in which a test result of a test of a connection unit (12) is featured, and a test/control unit which authorizes simulation of the signalling functions in cooperation with the access unit during a positive test result, but not during a negative test result. An Independent claim is included for a test procedure for terminal connection.

Description

The invention relates to a test circuit arrangement for testing a terminal connection in a data transmission network. The data transmission network is, for example, a telecommunications network in which voice data transfer switched become. The data transfer is through the phases, connection establishment, data transmission and connection clearing determined at all protocol levels. So the data is in time slots according to one Transfer time-division multiplexing. Individual transmission channels remain while a data transfer assigned to a connection.

However, the data transmission network can also a data packet transmission network be in which voice data or other useful data is transmitted in data packets that have a packet header and a packet trunk for transmission of user data. A connection-oriented transfer takes place in the data packet transmission networks only on higher ones Log levels instead.

However, the data transmission network can also a data transmission network be in which the data in a transmission section in a telecommunications network and in another transmission section transmitted in a data packet transmission network become. Such methods are used, for example, as a trunking method designated. For example, the first and the last data transmission section are located in one or two different telecommunications networks. On middle data transmission section is, for example, on the Internet.

It is an object of the invention to Testing a terminal connection to provide a simply constructed test circuit arrangement, in particular in a reliable Test procedures can be used with little operator effort. Moreover a test system, in particular a test system with such Test circuitry, and a test procedure can be specified.

The on the test circuitry related task is performed by a test circuit arrangement with the features specified in claim 1 fulfilled. Further training is in the subclaims specified.

• – einen Prüfeinrichtungsanschluss, der zum Anschluss einer Prüfeinrichtung geeignet ist, die Funktionen eines in einem Datenübertragungsnetz betriebenen Endgerätes nachbildet,
• – einen netzseitigen Anschluss, der zum Anschluss der Schaltungsanordnung an das Datenübertragungsnetz geeignet ist,
• – eine Steuereinheit, die Signalisierungsfunktionen einer Anschlusseinheit nachbildet, mit der ein Endgerät an das Datenübertragungsnetz angeschlossen wird,
• – eine vorzugsweise in der Steuereinheit enthaltene Zugriffseinheit, die auf ein Testergebnisdatum zugreift, in dem ein Testergebnis eines Tests einer zu testenden Anschlusseinheit vermerkt ist,
• – und eine vorzugsweise in der Steuereinheit enthaltene Kontrolleinheit, die im Zusammenwirken mit der Zugriffseinheit bei positivem Testergebnis eine Nachbildung von Signalisierungsfunktionen zulässt und bei negativem Testergebnis keine Nachbildung von Signalisierungsfunktionen zulässt.

The test circuit arrangement according to the invention contains:

• A test facility connection that is suitable for connecting a test facility that simulates the functions of a terminal device operated in a data transmission network,
• A network-side connection which is suitable for connecting the circuit arrangement to the data transmission network,
• A control unit which simulates signaling functions of a connection unit with which a terminal is connected to the data transmission network,
• An access unit, preferably contained in the control unit, which accesses a test result data in which a test result of a test of a connection unit to be tested is noted,
• - And a control unit, preferably contained in the control unit, which, in cooperation with the access unit, allows simulation of signaling functions in the case of a positive test result and no simulation of signaling functions in the case of a negative test result.

The test facility connection enables an external testing facility during the test to use, for example, a so-called MTA test facility (Metallic Test Access). A test facility is included in the test for the operating personnel is already trained. Moreover becomes a testing facility in the test involved that regardless of the connection unit to be tested or independently of one to be tested Exchange works and for example from another manufacturer has been produced as the connection unit or the switching center.

The line-side connection ensures that the circuit arrangement in a simple manner during the test can use existing control functions. This can be done via the network connection transmit the test result date to the test circuit arrangement in a simple manner. However, there is also easy access to one elsewhere as the test result data stored in the test circuit arrangement via the line-side connection possible.

By including a test result date let yourself part of the test independently perform by the test circuit arrangement, for example by a self-test of the connection unit to be tested.

In a further development of the test circuit arrangement the functions of the control unit, the access unit and the control unit by an electronic processor without a processor Circuit accomplished. In an alternative training, a Circuit used, which contains a processor. The processor is working Program commands from a program and thereby performs functions the control unit, the access unit and the control unit.

In another training forms the control unit signaling functions of a connection unit for a terminal with an analog data transmission to. Alternatively, the control unit forms signaling functions for a Terminal with digital data transmission to.

• – Erzeugen eines Schleifenschlusses, und
• – die Wahl eines Kennzeichens.
• Die Testschaltungsanordnung enthält auf der anderen Seite Einheiten, die Grundfunktionen einer Anschlusseinheit zum Anschluss eines analogen Endgerätes nachbilden, nämlich:
• – eine Schleifenschlusserfassungseinheit,
• – eine Einheit zum Erfassen eines Wählkennzeichens,
• – eine Versorgungsschaltung, mit der eine Spannung an den Prüfeinrichtungsanschluss angelegt wird, und
• – eine Wähltonausgabeeinheit, die einen Wählton an die Prüfeinrichtung anlegt, d.h. ein sogenanntes Freizeichen.

In a further development, the test device simulates the basic functions of an analog terminal, namely:

• - creating a loop closure, and
• - the choice of a license plate.
• On the other hand, the test circuit arrangement contains units that emulate the basic functions of a connection unit for connecting an analog terminal, namely:
• - a loop closure detection unit,
• A unit for recording a dialing number,
• A supply circuit with which a voltage is applied to the test device connection, and
• - A dial tone output unit, which applies a dial tone to the test device, ie a so-called dial tone.

At a next training serves the test equipment connection for connecting a two-wire subscriber line. The network side Connection included a functional unit, the digital data according to a predetermined method sends and / or receives, preferably according to a PCM process (pulse Code modulation) or according to a ISDN (Integrated Services Digital Network) oriented procedures, e.g. the IOM2 process (ISDN oriented modulator interface second generation). In particular, the network connection is for replacement of tax reports. As part of these tax returns also accessed the test result date.

• – mehrere Anschlusseinheiten, an die jeweils ein Endgerät eines Datenübertragungsnetzes über eine Anschlussleitung angeschlossen ist und die jeweils eine Testfunktion für einen Selbsttest enthalten,
• – eine zentrale Steuereinheit, die Steuerfunktionen für die Anschlusseinheiten erbringt, beispielsweise unter Verwendung eines sogenannten Gruppenprozessors für mehrere Anschlusseinheiten oder unter Verwendung eines Zentralpro zessors für alle Anschlusseinheiten einer Netzknoteneinrichtung,
• – mindestens eine zentrale Prüfeinrichtung, die auch als externe Prüfeinrichtung ausgebildet sein kann,
• – Umschalteinheiten, an die jeweils ein zu einem Endgerät führender Abschnitt einer Anschlussleitung, ein zu einer Anschlusseinheit führender Verbindungsabschnitt und eine zu der zentralen Prüfeinrichtung führende Leitung angeschlossen sind,
• – und eine zwischen die zentrale Prüfeinrichtung und die zentrale Steuereinheit geschaltete oder schaltbare Testschaltungsanordnung, die Signalisierungsfunktionen einer Anschlusseinheit nachbildet.

In a further aspect, the invention relates to a test system which in particular contains a test circuit arrangement according to the invention or one of its developments. The test system contains:

• A plurality of connection units, to each of which a terminal of a data transmission network is connected via a connection line and which each contain a test function for a self-test,
• A central control unit which provides control functions for the connection units, for example using a so-called group processor for a plurality of connection units or using a central processor for all connection units of a network node device,
• At least one central test facility, which can also be designed as an external test facility,
• Switchover units to which a section of a connection line leading to a terminal, a connection section leading to a connection unit and a line leading to the central test device are connected,
• - And a test circuit arrangement connected or switchable between the central test device and the central control unit, which simulates signaling functions of a connection unit.

Due to this structure of the test system apply the for the test circuit arrangement and its training mentioned technical effects too. In addition, the test system contains only one small number of switching units. So are each connecting line in a further development only one relay is provided, which preferably contains fewer than four switches, for example, only two switches. Alternatively, each connecting line only four switching transistors used. Through these measures the manufacturing cost of the test system can be considerable reduce.

• – Senden einer Prüfanforderung an eine Anschlusseinheit, die zum Anschluss eines Endgerätes eines Datenübertragungsnetzes dient,
• – Ausführen eines Selbsttests der Anschlusseinheit,
• – Vermerken des Testergebnisses des Selbsttests, und
• – Ausführen eines Funktionstests mit Hilfe einer zentralen Prüfeinrichtung, die unabhängig von dem Testergebnis arbeitet, und mit Hilfe einer Prüfeinrichtungsanschlusseinheit, die abhängig von dem Testergebnis die Funktion der Anschlusseinheit nachbildet.

In another aspect, the invention relates to a method for testing a terminal connection, in particular with the test circuit arrangement according to the invention or with the test system according to the invention or with its developments. In the method according to the invention, the following method steps are carried out without being restricted by the sequence specified:

• Sending a test request to a connection unit which serves to connect a terminal of a data transmission network,
• - performing a self-test of the connection unit,
• - note the test result of the self-test, and
• - Execution of a function test with the help of a central test device that works independently of the test result and with the help of a test device connection unit that simulates the function of the connection unit depending on the test result.

Another training course the central control unit when processing an occupancy request included. This leaves check the utilization of a switching technology facility or Participant locks can be included in the test.

Thus apply to the method according to the invention and its further training also the above-mentioned technical Effects.

In the following, exemplary embodiments of the Invention explained with reference to the accompanying drawings. In this demonstrate:

1 Functional units of a test system for testing connection units for analog terminals to a switching center, and

2 Procedural steps performed during the test.

1 shows functional units of a test system, with the help of subscriber connection units 12 to 16 Have tested, for example, eight or thirty-two connection units of a line assembly (Line Trunc Group - LTG). Every connection unit 12 to 16 is a relay in each case 20 to 24 with one connection cable each 30 to 34 connected. The connecting cables 30 to 34 have two each Cores, for example made of copper, see a cores 30a to 34a and b-veins 30b to 34b , The connecting cables 30 to 34 lead to subscribers T1nA to T1nN, where N denotes a natural number, the value of which corresponds to the number of connection units 12 to 16 matches.

Between the relays 20 to 24 and the connection units 12 to 16 are each connecting sections 40 to 44 , which also each have two electrically conductive connecting wires 40a . 40b to 44a . 44b contain.

Any relay 20 to 24 contains two switches 20a . 20b to 24a . 24b , The switching of the switch 20a to 24b is for all connection units 12 to 16 is the same and will therefore only be used in the following for the changeover switch 20a and 20b explained.

The a-core 30a is with the center contact of the switch 20a connected. The switch 20a is at rest with the connecting section 40a connected. The center contact of the switch 20b is with the b-wire 30b connected. The switch is in the rest position 20b with the connecting section 40b connected. This also includes the connecting line 30 and the subscriber connection unit 12 connected with each other. A terminal of the subscriber T1nA is thus also connected to the telecommunications network.

The switch is for a test mode 20a with one line 50a connectable to a central testing facility 52 of the test system 10 leads. The switch is also 20b in test mode with one line 50b connected, also to the testing facility 52 leads. The lines 50a . 50b are also used as an outgoing test bus for the test facility 52 designated. In test mode, there is therefore no connection between a subscriber's terminal, for example T1nA, and a subscriber line unit, for example the line unit 12 , With the help of the other relays 20 to 24 are the other connection lines 30 to 34 with the test facility 52 optionally connectable.

The central testing facility 52 is, for example, a so-called MTA test facility (Metallic Test Access) and has a connection for the cables 50a . 50b another connection for cables 54a and 54b leading to a relay 60 cause that two working contacts 62a and 62b contains, ie so-called NO contacts. The administration 54a leads to work contact 62a , The administration 54b leads to work contact 62b , The other connection of the working contact 62a is with an electrically conductive connection 64a connected to a tester connector unit 66 leads. From the other connection of the working contact 62b makes a connection 64b to the tester connector 66 , The lines 54a . 54b are also used as the test facility's incoming test bus 52 designated.

The test system also contains 10 a central control unit 68 that over communication interfaces 70 to 74 with the subscriber connection units 12 to 16 and via a functionally identical communication interface 76 with the test equipment connection unit 66 Exchanges data. For example, the central control unit 68 a group processor for a group of line units or a central processor of an exchange in which there are several groups of line units for subscribers.

• – ein Hochvoltteil zum Schützen der Anschlusseinheit vor Oberspannungen auf einer Anschlussleitung,
• – eine Analog-Digital-Wandlereinheit bzw, eine Digital-Analog-Wandlereinheit,
• – eine Datenverarbeitungseinheit, und
• – eine integrierte Testfunktion für einen Selbsttest der Anschlusseinheit, die auch als ILTF-Einheit (Integrated Line Test Function) bezeichnet wird. Die ILTF-Einheit ist bspw. in einem Telekommunikationsschaltkreis einer Anschlusseinheit 12 bis 16 integriert.

The subscriber connection units 12 to 16 each contain:

• - a high-voltage part to protect the connection unit against high voltages on a connection line,
• An analog-digital converter unit or a digital-analog converter unit,
• - a data processing unit, and
• - An integrated test function for a self-test of the connection unit, which is also referred to as an ILTF unit (Integrated Line Test Function). The ILTF unit is, for example, in a telecommunication circuit of a connection unit 12 to 16 integrated.

The central testing facility 52 includes:

• - a unit for checking the line side on the lines 50a . 50b , Especially for checking electrical parameters such as shunt, alarm capacity, external voltages, etc.
• - A function test unit for the lines 54a . 54b out. In particular, the function test unit is used to establish a loop closure, to test a dial tone and to send a number.

• – eine Spannungserzeugungsschaltung zum Anlegen einer Spannung an die Verbindungen 64a, 64b,
• – eine Schleifenschlusserfassungseinheit,
• – eine Wähltonerzeugungseinheit,
• – eine Steuereinheit.

The tester connector unit 66 includes:

• - A voltage generating circuit for applying a voltage to the connections 64a . 64b .
• - a loop closure detection unit,
• A dial tone generating unit,
• - a control unit.

In the exemplary embodiment, the test device connection unit contains 66 an A / D converter and a D / A converter to use the connection unit for speech in special cases 66 to be able to transfer. In another embodiment, the tester connector includes 66 on the other hand, no A / D converter and no D / A converter, because there is no speech via the connection unit 66 must be transferred.

In 1 is a higher-level control circuit of the test system 10 to control the relays 20 to 24 and 60 not shown for reasons of better overview. This control circuit switches the relays 20 to 24 and 60 depending on the connection unit to be tested 12 to 16 in accordance with the comments on the 2 ,

2 shows process steps during the test of a connection unit, for example the connection unit 12 , with the help of the test system 10 , The process begins in one process step 100 with setting up the test system 10 ,

In a subsequent step 102 a test order is generated, for example automatically or manually. The test order is, for example, from the central test facility 52 or generated by another entity. On the basis of the test order, in one process step 104 the relay 20 switched and the relay 60 connected. This is the line side of the connection unit 12 not connected and the central test facility is connected to the connection line 30 as well as with the test device connection unit 66 connected.

Process steps then become simultaneous or in any order one after the other 106 to 108 executed. In the procedural step 106 with the help of the central testing facility 52 the connecting cable 30 measured. Electrical parameters are determined, for example a shunt resistance, an alarm capacity or an external voltage.

At the same time, in one process step 108 the testing of the subscriber connection unit 12 initiated with the help of the self-test, for example with the involvement of the central control unit 68 via the communication interface 70 , In this self-test, all functions of the connection unit 12 checked. At the end of the self-test, a test result date is sent via the communication interface 70 and the central control unit 68 to the test facility connection unit 66 sent and saved there, see process step 110 , Due to the disconnection of the connection line 30 the self-test can be carried out undisturbed.

After performing the process steps 106 to 110 a procedural step follows 112 , In the procedural step 112 generates the central test facility 52 a loop closure. The loop closure detection unit of the test facility connection unit 66 captures this loop closure and checks in one process step 114 whether the test result date reflects a positive test result. If this is the case, it follows immediately after the method step 114 a procedural step 116 , In the procedural step 116 becomes the assignment in the connection unit signaled by the loop closure 66 processed according to protocol. As a result, the connector unit generates 66 a dial tone on the connections 64a . 64b , The dial tone is in the central test facility 52 recorded and as a dial tone of the connection unit 12 considered.

In another embodiment, the assignment is sent to the central control unit 68 forwarded. The central control unit 68 reserves a time slot and confirms the reservation with a feedback to the connection unit 66 , The dial tone is only generated after the confirmation has arrived. Based on the dial tone response time, ie the time from closing the loop until the dial tone was recorded in the central test facility 52 , the switching capacity utilization of the switching center is also recorded. This procedure can also be used, for example, to simulate software-technical subscriber blocks in the test.

In contrast, in process step 114 determined that the stored test result date reflects a negative test result, the tester connector generates 66 no dial tone, see procedural step 118 , The central testing facility 52 detects the absence of the dial tone and evaluates it as an error of the subscriber connection unit 12 , ie the connection unit to be tested.

Further procedural steps 120 are in 2 represented by dots. During these process steps, additional functions are performed using the central test facility 52 checked. For example, a number is dialed. The tester connector unit 66 only issues the connection establishment request to the central control unit if the test result is positive 68 further. If the test result is negative, no connection establishment request is passed on, so that no connection establishment is initiated by the central test facility 52 is carried out to another subscriber of the telecommunications network.

After all in the central testing facility 52 provided test steps, the test procedure in one process step 122 completed.

In another exemplary embodiment, instead of only one test result date, several test result data for different test functions are stored in the test device connection unit 66 noted. This enables the function of the subscriber connection unit to be tested 12 in more detail through the tester connection unit 66 be replicated.

By using the test system 10 the reliability of the tests can be checked by the central testing facility 52 Increase the range of tests offered, because the test result date can also depend, for example, on test functions that are performed with the help of the central test facility 52 cannot be checked.

In the invention, the connection line test is therefore carried out via connection-specific relays for connecting the central test device. The connection units are tested using the connection unit self-test. The test result is sent to the central test facility indirectly via the so-called incoming connection 54a . 54b signaled. The tester connector unit 66 thus serves as the result interface for the test result date.

Claims (14)

Test circuit arrangement ( 66 ) with a test facility connection ( 64a . 64b ) which is used to connect a test facility ( 52 ) is suitable, which simulates the functions of a terminal device (T1nA) operated in a data transmission network, with a network-side connection ( 76 ) which is used to connect the circuit arrangement ( 66 ) to the data transmission network and / or as a communication interface, with a control unit, the signaling functions of a connection unit ( 12 ) with which an end device (T1nA) is connected to the data transmission network, with an access unit that accesses a test result data in which a test result of a test of a connection unit ( 12 ) is noted, and with a control unit which, in cooperation with the access unit, allows the simulation of signaling functions in the event of a positive test result and which does not permit the simulation of signaling functions in the event of a negative test result. Circuit arrangement ( 66 ) according to claim 1, characterized in that the data transmission network is a telecommunications network for the transmission of voice data, and / or that the network-side connection ( 76 ) is suitable for connection to a switching center of the telecommunications network, and / or that the network-side connection is suitable for transmitting the test result date. Circuit arrangement ( 66 ) according to claim 1 or 2, characterized in that the functions of the control unit and / or the functions of the access unit and / or the functions of the control unit are provided by an electronic circuit working without a processor or by an electronic circuit containing a processor. Circuit arrangement ( 66 ) according to one of the preceding claims, characterized in that the control unit signaling functions of a connection unit ( 12 ) for a terminal (T1nA) with analog data transmission or for a terminal with digital data transmission. Circuit arrangement ( 66 ) according to one of the preceding claims, characterized in that the test device ( 52 ) simulates a loop closure and / or the choice of a label, and / or that the circuit arrangement ( 66 ) contains a loop closure detection unit and / or a unit for detecting the choice of a label, and / or that the circuit arrangement ( 66 ) contains a supply circuit which is connected to the test device connection ( 64a . 64b ) applies a voltage, preferably a DC voltage, and / or that the circuit arrangement ( 66 ) includes a dial tone output unit that sends a dial tone to the tester port ( 64a . 64b ) creates. Circuit arrangement ( 66 ) according to one of the preceding claims, characterized in that the test device connection ( 64a . 64b ) is used to connect a two-wire line and / or that the test equipment connection ( 64a . 64b ) contains a current detection circuit, and / or that the mains connection ( 64 ) contains a functional unit that sends and / or receives digital data according to a predetermined method, preferably according to a PCM method or according to an ISDN-oriented method. Test system ( 10 ), especially with a test circuit arrangement ( 66 ) according to one of the preceding claims, with a plurality of connection units ( 12 to 16 ), to each of which at least one terminal (T1nA to T1nN) of a data transmission network via a connecting line ( 30 to 34 ) is connected and each contains a test function for a self-test (ILTF) with a central control unit ( 68 ), the control functions for the connection units ( 12 to 16 ) with a central testing facility ( 52 ), with switching units ( 20 to 24 ), to each of which a section leading to a terminal (T1n A to T1nN) ( 30a . 30b ) a connection line, one to a connection unit ( 12 ) leading connecting section ( 40a . 40b ) and one to the central examination facility ( 52 ) leading management ( 50a . 50b ) are connected, and with one between the central test facility ( 52 ) and the central control unit ( 68 ) switched or switchable test circuit arrangement ( 66 ), the signaling functions of a connection unit ( 12 ) reproduces. Test system ( 10 ) according to claim 7, characterized in that in the switching units per connecting line ( 30 to 34 ) only one relay ( 20 to 24 ) is provided or only four electronic switching elements are provided, and / or that a relay contains fewer than four changeover switches, preferably two changeover switches. Procedure for testing a terminal connection ( 30 . 12 ), especially with a test circuit arrangement ( 66 ) and / or with a test system ( 10 ) according to one of the preceding claims, with the method steps carried out without restriction by the specified sequence: sending a test request to a connection unit ( 12 ), which serves to connect a terminal (T1nA) of a data transmission network (102), perform a self-test ( 108 ) the connection Ness ( 12 ), Note ( 110 ) the test result of the self-test, execution of a function test ( 112 ) with the help of a central test facility ( 52 ), which works independently of the test result, and with the help of a test device connection unit ( 66 ) which, depending on the test result, the function of the connection unit ( 12 ) reproduces. A method according to claim 9, characterized in that the connection unit ( 12 ) to carry out the self-test with a switching unit ( 20 to 24 ) from a connection line leading to the terminal (T1nA) ( 30 ) is separated, and / or that the switching unit ( 20 ) the connecting cable ( 30 ) for a test with the central testing facility ( 52 ) connects, and / or that the central test facility ( 52 ) the connecting cable ( 30 ) and / or the function of the terminal (T1nA) is checked. A method according to claim 10, characterized in that the switching unit ( 20 to 24 ) per connecting cable ( 30 to 34 ) only one relay ( 20 ) or contains only four electronic switching elements, and / or that the switching unit ( 20 to 24 ) per connecting cable ( 30 to 34 ) only one relay ( 20 ) with less than four switches ( 20a . 20b ) contains, preferably with two switches ( 20a . 20b ). Method according to one of Claims 9 to 11, characterized in that the self-test is carried out by one in the connection unit ( 12 ) test unit included, in particular by one in the connection unit ( 12 ) integrated test unit (ILTF), preferably a test unit (ILTF) integrated together with a telecommunications module. Method according to one of claims 9 to 12, characterized in that several connection units ( 12 to 16 ) each contain their own test unit (ILTF) and / or that the central test facility ( 52 ) for testing multiple connection units ( 12 to 16 ) is used. Method according to one of Claims 9 to 13, characterized in that an occupancy signal is generated by the central test facility as part of a functional test, that the occupancy signal is generated by the test facility connection unit ( 66 ) to the central control unit ( 68 ) is passed on that the central control unit ( 68 ) allows an assignment depending on the utilization of a switching technology facility, and that the test facility connection unit ( 66 ) the assignment request also depends on the approval by the central control unit ( 68 ) processed.