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CN87209437U - Confocal sphere f-p scanning interferometer - Google Patents

Confocal sphere f-p scanning interferometer Download PDF

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Publication number
CN87209437U
CN87209437U CN198787209437U CN87209437U CN87209437U CN 87209437 U CN87209437 U CN 87209437U CN 198787209437 U CN198787209437 U CN 198787209437U CN 87209437 U CN87209437 U CN 87209437U CN 87209437 U CN87209437 U CN 87209437U
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China
Prior art keywords
light
confocal
sphere
coated
scanning interferometer
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Ceased
Application number
CN198787209437U
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Chinese (zh)
Inventor
霍玉晶
周炳琨
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Tsinghua University
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Tsinghua University
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Publication date
Application filed by Tsinghua University filed Critical Tsinghua University
Priority to CN198787209437U priority Critical patent/CN87209437U/en
Publication of CN87209437U publication Critical patent/CN87209437U/en
Ceased legal-status Critical Current

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Abstract

The utility model belongs to the technical field of the optical spectroscopy and the laser technology, characterized in that two spherical reflectors are coated with reflecting film with high reflectance which is visible and invisible; one side of incident light is provided with an optical isolator, and each light surface of the optical isolator is coated with reflecting films which extinct the measured light. The utility model has the advantages of easy adjustment, high resolution, low cost, small interference on the measured light source and convenient use.

Description

Confocal sphere F-P scanning interferometer
The utility model belongs to spectroscopy and laser technology field.
Optical-fibre communications, spectral analysis need high-resolution confocal sphere F-P scanning interferometer, the especially near infrared ripple confocal sphere F-P scanning interferometer as 1.3 μ m and 1.55 μ m.The shell 5 that this instrument is coated with spherical reflector 1,2, the voltage ceramic 3 of highly reflecting films by two usually and has a light hurdle 4 is formed, and its theory structure is shown in accompanying drawing one.Catoptron 1 and 2 is formed optical resonator, incident beam 6 from right-hand incide in the optical resonator after, resonant cavity optical axis parallel light in the direction of propagation can repeatedly reflect and the resonator cavity of not overflowing from the side in the chamber, and when light incides on the catoptron 2 at every turn, all some light forms output light 7 from resonator cavity right-hand member transmission output, and output light 7 forms multiple-beam interference.Drive catoptron 1 with piezoelectric ceramics 3 and move, just can influence their interference state and change output intensity along optical axis direction.Light intensity one phase curve is shown in accompanying drawing two.I is represented light intensity, and ψ represents phase place.From the gained curve as can be known by the spectrum of photometry.The confocal sphere F-P of NIR-1 type 1.3 μ m scanning interferometer for example, it is made up of shell 8, the piezoelectric ceramics base plate 10 that has light hurdle 9, piezoelectric ceramics 11, left spheric reflection microscope base 12, left spherical reflector 13, right spheric reflection microscope base 14, right spherical reflector 15 and its trim ring 16, and its structure is shown in accompanying drawing three.Two spherical reflectors all are coated with 1.3 μ m highly reflecting films, distance between them is by the threaded adjustment between right reflection mirror seat 14 and the shell 8, when rotating right spheric reflection microscope base 14, the orientation of right spherical reflector 15 is guaranteed by the accurate axis of guide that right spheric reflection microscope base 14 and shell 8 constitute.Its free spectral range △ v is 4.3GHz, and meticulous constant F is the common development in 1986 of 120(Nankai University, Tsing-Hua University).The weak point of this instrument is: 1. adjust difficulty, for sightless 1.3 μ m light, make its little logical light light hurdle that sees through confocal sphere F-P scanning interferometer and coaxial very difficult with optical resonator, it then is difficult more that two catoptrons are adjusted to confocal state by the accurate axis of guide of one dimension adjustment to invisible light; 2. be difficult to be transferred to best confocal state owing to two catoptrons, so its meticulous constant is lower, instrumental resolution is low, cost is high; 3. since interferometer reflection returned measured light by photometry, the light source works state is produced serious the interference, this not only influences measuring accuracy, and can make measured light instability even cisco unity malfunction, uses inconvenience.
The purpose of this utility model is to propose a kind of novel confocal sphere F-P scanning interferometer, makes that it is adjusted easily, resolution is high, cost is low, easy to use, and measured light is disturbed little and bigger range of application is arranged.
Technical essential of the present utility model is to be coated with the reflectance coating that visible light and invisible light is all had high reflectance on two spherical reflectors; Side at incident light is equipped with optoisolator, is coated with on the logical light face of each of this optoisolator by the delustring reflectance coating of photometry.
Because the confocal state of two spherical reflectors is only irrelevant with optical wavelength by the decision of the relative geometry position between them, therefore, plating all has the reflectance coating of high reflectance to visible light and invisible light on two spherical reflectors, replace adjustment with regard to available adjustment to visible light to invisible light, promptly as long as visible light is adjusted to best confocal state, also just obtained simultaneously best confocal state, thereby adjusted easily invisible light.But again because of being Direct observation to two confocal states of spherical reflector of visible light adjustment, be easy to judge confocal state precision, detect and also be easy to, so visible luminous energy is adjusted to best confocal state soon, improved meticulous constant, obtain high instrumental resolution, and obtained simultaneously the best confocal state of invisible light and high instrumental resolution; Be coated with by the optoisolator of the delustring reflectance coating of photometry owing in incident light one side each logical light face is housed, the light of returning from interferometer reflection can not return light source, thus reduce so that eliminated interference measured light, easy to use; Owing to adopted the reflectance coating of dual wavelength, an instrument both can be used for visible light and had detected, and can be used for the invisible light spectral detection again, had enlarged range of application.
The utility model has the advantages that to be easy to adjustment, resolution height, cost low, measured light is disturbed little, easy to use, applied range.
Accompanying drawing four is embodiment of the present utility model, and it is made up of shell 17, incident light hurdle 18, piezoelectric ceramics base 19, piezoelectric ceramics 20, left spheric reflection microscope base 21, left spheric reflection picture frame 22, left spherical reflector 23, right spheric reflection microscope base 24, right spheric reflection picture frame 25, right spherical reflector 26, trim ring 27, polarizer 28, λ/4 wave plates 29, sleeve 30.
The little invar of shell 17 usefulness thermal expansivity is made, and incident light hurdle 18 is bonded on the piezoelectric ceramics base 19, and this seat is screwed on shell 17.Left side spherical reflector 23 is bonded in the left spheric reflection picture frame 22, left side spheric reflection picture frame 22 is bonded on the left spheric reflection microscope base 21, left side spheric reflection microscope base 21 is bonded on the piezoelectric ceramics 20, piezoelectric ceramics 20 is fixed on its seat 19, right spherical reflector 26 is bonded in the right spheric reflection picture frame 25, right spheric reflection picture frame 25 is bonded in after adjusting on the right spheric reflection microscope base 24, rotate right spheric reflection microscope base 24 and can change two distances between the spherical reflector, tighten trim ring 27 after mixing up, with fixing right spheric reflection microscope base 24;
Left side spherical reflector 23 and right spherical reflector 26 are formed optical resonator, are coated with 6328 on two spherical reflectors
Figure 87209437_IMG4
The highly reflecting films of visible light and 1.3 μ m or 1.55 μ m invisible lights, two spherical reflectors have identical radius-of-curvature r, and its size determines by required free spectral range, and the distance between two spherical reflectors equals r;
Polarizer 28 and λ/4 wave plates 29 are formed optoisolator, the main shaft angle at 45 of the polarization direction of polarizer 28 and λ/4 wave plates 29, and the two bonds together and is fixed on the sleeve 30, and sleeve 30 is fixed on the shell 17.Each logical light face of polarizer 28 and λ/4 wave plates 29 is coated with 6328 With 1.3 μ m or to 6328
Figure 87209437_IMG6
Delustring reflectance coating with 1.55 μ m.
The meticulous constant of the confocal sphere P-F scanning interferometer of this 1.3 μ m or 1.55 μ m can reach 180~200, and the free spectral range scope can be by 1GHz to 8GHz, and its cost reduces more than 5 times than the confocal sphere F-P of NIR-1 type 1.3 μ m scanning interferometer.
Description of drawings:
Accompanying drawing one is confocal sphere F-P scanning interferometer principle assumption diagram
1---catoptron
2---catoptron
3---piezoelectric ceramics
4---the light hurdle
5---shell
6---incident beam
7---output light
Accompanying drawing two is light intensity one phase curves
I---light intensity
ψ---phase place
Accompanying drawing three is the confocal sphere F-P of NIR-1 type 1.3 μ m scanning interferometer structural drawing.
8---shell
9---the light hurdle
10---the piezoelectric ceramics base plate
11---piezoelectric ceramics
12---left spheric reflection microscope base
13---left spherical reflector
14---right spheric reflection microscope base
15---right spherical reflector
16---trim ring
Accompanying drawing four is structural drawing of the present utility model.
17---shell
18---the incident light hurdle
19---the piezoelectric ceramics base
20---piezoelectric ceramics
21---left spheric reflection microscope base
22---left spheric reflection picture frame
23---left spherical reflector
24---right spheric reflection microscope base
25---right spheric reflection picture frame
26---right spherical reflector
27---trim ring
28---polarizer
29---λ/4 wave plates
30---sleeve

Claims (4)

1, a kind of confocal sphere F-P scanning interferometer, form by two spherical reflector, piezoelectric ceramics, Guang Lan, shell and adjusting mechanisms that are coated with highly reflecting films, it is characterized in that on two spherical reflectors, being coated with the reflectance coating that visible light and invisible light is all had high reflectance, side at incident light is equipped with optoisolator, and the logical light face of each of this isolator is coated with by the delustring reflectance coating of photometry.
2, according to the said confocal sphere F-P scanning interferometer of claim 1, it is characterized in that two spherical reflectors can be coated with 6328
Figure 87209437_IMG2
Visible light and 1.3 μ m invisible lights all have the reflectance coating of high reflectance.
3, according to the said confocal sphere F-P scanning interferometer of claim 1, it is characterized in that two spherical reflectors can be coated with 6328
Figure 87209437_IMG3
Visible light and 1.55 μ m invisible lights all have the reflectance coating of high reflectance.
4,, it is characterized in that said optoisolator can be made up of polarizer and λ/4 wave plates according to the said confocal sphere F-P scanning interferometer of claim 1.
CN198787209437U 1987-06-25 1987-06-25 Confocal sphere f-p scanning interferometer Ceased CN87209437U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN198787209437U CN87209437U (en) 1987-06-25 1987-06-25 Confocal sphere f-p scanning interferometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN198787209437U CN87209437U (en) 1987-06-25 1987-06-25 Confocal sphere f-p scanning interferometer

Publications (1)

Publication Number Publication Date
CN87209437U true CN87209437U (en) 1988-09-28

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CN198787209437U Ceased CN87209437U (en) 1987-06-25 1987-06-25 Confocal sphere f-p scanning interferometer

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CN (1) CN87209437U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104297935A (en) * 2013-11-27 2015-01-21 中国航空工业集团公司洛阳电光设备研究所 Refrigeration-type infrared imaging system and cold reflection elimination device and method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104297935A (en) * 2013-11-27 2015-01-21 中国航空工业集团公司洛阳电光设备研究所 Refrigeration-type infrared imaging system and cold reflection elimination device and method thereof

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