CN221827043U - Power supply test system - Google Patents

Abstract

The embodiment of the application discloses a power supply test system, which comprises: the high-voltage direct-current power supply to be tested comprises an input end and an output end, wherein the input end of the high-voltage direct-current power supply to be tested is connected with a three-phase alternating-current power supply; the bidirectional power supply comprises a first end and a second end, wherein the first end is electrically connected with the input end of the high-voltage direct-current power supply to be tested, and the second end is electrically connected with the output end of the high-voltage direct-current power supply to be tested; wherein the bidirectional power supply is used for converting direct current output by the output end of the high-voltage direct current tested power supply into alternating current and feeding the alternating current back to the high-voltage direct current tested power supply through the first end, when the electric function test is carried out on the high-voltage direct current tested power supply, the bidirectional power supply can be used as a load of the high-voltage direct current tested power supply, the direct current output by the high-voltage direct current power supply to be tested can be converted into alternating current and fed back to the input end of the high-voltage direct current power supply to be tested, so that the energy recycling is realized, the testing cost is reduced, and the accuracy of the electrical performance testing result is improved.

Description

Power supply test system

Technical Field

The application relates to the technical field of power supply testing, in particular to a power supply testing system.

Background

The high-voltage direct-current power supply is an electric energy conversion device, is used as a switching power supply, can output hundreds of kilowatts to hundreds of kilowatts, has a stronger energy-saving effect and a more stable high-efficiency, and can be widely applied to the fields of new energy power generation, long-distance electric energy transmission, high-end electronic power utilization and the like.

Usually, the switch power supply needs to be subjected to electrical function test before leaving the factory so as to ensure that the product meets the requirements and further ensure the safety, stability and reliability of the product. Therefore, when the electrical function test is performed on the switching power supply before leaving the factory, a proper test platform needs to be built according to the characteristics of the product so as to meet the requirements under different test conditions.

However, the test platform adopted by the high-voltage direct-current power supply is easy to cause insufficient load power due to overlarge output power of the high-voltage direct-current power supply, so that the high-voltage direct-current power supply cannot be accurately tested for electrical functions. Meanwhile, the power consumption of the test platform is high, so that the test cost is high.

Disclosure of utility model

Aiming at the defects of the prior art, the application provides a power supply testing system, which aims to solve the technical problems of lower accuracy and higher cost of electrical function test of a high-voltage direct-current power supply in the prior art.

In order to solve the above problems, the present application provides a power supply testing system, comprising:

The high-voltage direct-current power supply to be tested comprises an input end and an output end, wherein the input end of the high-voltage direct-current power supply to be tested is connected with a three-phase alternating-current power supply;

The bidirectional power supply comprises a first end and a second end, wherein the first end is electrically connected with the input end of the high-voltage direct-current power supply to be tested, and the second end is electrically connected with the output end of the high-voltage direct-current power supply to be tested;

The bidirectional power supply is used for converting direct current output by the output end of the high-voltage direct current power supply to alternating current and feeding the alternating current back to the high-voltage direct current power supply through the first end.

Further, in the power supply test system, the high-voltage direct-current power supply to be tested further comprises a first EMI suppression circuit, a first power factor correction circuit, a first bus capacitor and a second EMI suppression circuit;

The first EMI suppression circuit is electrically connected with the input of the high-voltage direct-current power supply to be tested and the first power factor correction circuit respectively, the first power factor correction circuit is electrically connected with the first bus capacitor, the first bus capacitor is electrically connected with the second EMI suppression circuit, and the second EMI suppression circuit is electrically connected with the output end of the high-voltage direct-current power supply to be tested.

Further, in the power supply test system, the high-voltage direct-current power supply to be tested further comprises a first switch circuit and a thermistor;

One end of the first switch circuit is electrically connected with the second EMI suppression circuit, the other end of the first switch circuit is electrically connected with one end of the thermistor, and the other end of the thermistor is electrically connected with the output end of the high-voltage direct-current power supply to be tested.

Further, in the power supply test system, the first switch circuit includes a first switch, a second switch and a first resistor;

one end of the first switch is electrically connected with one end of the second switch to form a first connection point, the other end of the first switch is electrically connected with one end of the first resistor, the other end of the first resistor is electrically connected with the other end of the second switch to form a second connection point, the first connection point is electrically connected with the second EMI suppression circuit, and the second connection point is electrically connected with the output end of the high-voltage direct-current power supply to be tested.

Further, in the power supply test system, the bidirectional power supply further includes a third EMI suppression circuit, a second power factor correction circuit, a second bus capacitor, a bidirectional full-bridge resonance circuit, a buck-boost circuit, and a fourth EMI suppression circuit;

The third EMI suppression circuit is electrically connected with the first end and the second power factor correction circuit respectively, the second power factor correction circuit is electrically connected with the second bus capacitor, the second bus capacitor is electrically connected with the bidirectional full-bridge resonance circuit, the bidirectional full-bridge resonance circuit is electrically connected with the buck-boost circuit, the buck-boost circuit is electrically connected with the fourth EMI suppression circuit, and the fourth EMI suppression circuit is electrically connected with the second end.

Further, in the power supply test system, the bidirectional full-bridge resonant circuit includes a first full-bridge resonator and a second full-bridge resonator, and the step-up/step-down circuit includes a first step-up/step-down sub-circuit and a second step-up/step-down sub-circuit;

The first full-bridge resonator is connected in series with the first buck-boost sub-circuit to form a third end and a fourth end, the second full-bridge resonator is connected in series with the second buck-boost sub-circuit to form a fifth end and a sixth end, the third end and the fifth end are electrically connected with the second bus capacitor, and the fourth end and the sixth end are electrically connected with the fourth EMI suppression circuit.

Further, in the power supply test system, the bidirectional power supply further includes a second switch circuit;

one end of the second switch circuit is electrically connected with the fourth EMI suppression circuit, and the other end of the second switch is electrically connected with the second end.

Further, in the power supply test system, the second switch circuit includes a third switch and a diode;

One end of the third switch is electrically connected with the anode of the diode to form a third connection point, the other end of the third switch is electrically connected with the cathode of the diode to form a fourth connection point, the third connection point is electrically connected with the fourth EMI suppression circuit, and the fourth connection point is electrically connected with the second end.

Further, in the power supply test system, the system further comprises a sampling module;

One end of the sampling module is electrically connected with the input end of the high-voltage direct-current power supply to be tested, and the other end of the sampling module is electrically connected with the output end of the high-voltage direct-current power supply to be tested.

Further, in the power supply test system, the system further comprises a liquid cooling module, wherein the liquid cooling module is used for cooling the high-voltage direct-current power supply to be tested.

According to the power supply test system provided by the application, the bidirectional power supply is arranged between the input end and the output end of the high-voltage direct-current tested power supply, so that the bidirectional power supply can be used as a load of the high-voltage direct-current tested power supply when the high-voltage direct-current tested power supply is subjected to electrical function test, and the direct current output by the high-voltage direct-current tested power supply is converted into alternating current and fed back to the input end of the high-voltage direct-current tested power supply, thereby realizing the recycling of energy sources, reducing the test cost and improving the accuracy of an electrical performance test result.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic block diagram of a power test system provided by an embodiment of the present application;

FIG. 2 is a schematic block diagram of a high voltage DC power supply according to an embodiment of the present application;

Fig. 3 is a schematic block diagram of a high-voltage dc power supply according to an embodiment of the present application.

Detailed Description

The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.

It should be understood that the terms "comprises" and "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

It is also to be understood that the terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.

It should be further understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.

As analyzed by the background art of the present application, the accuracy of the test result of the electrical function test of the existing high-voltage direct-current power supply is poor and the test cost is high.

Referring to fig. 1, fig. 1 is a schematic block diagram of a power testing system according to an embodiment of the application.

As shown in fig. 1, a power supply test system includes:

The high-voltage direct-current power supply 10 comprises an input end and an output end, wherein the input end of the high-voltage direct-current power supply 10 is connected with a three-phase alternating-current power supply;

The bidirectional power supply 20 comprises a first end and a second end, wherein the first end is electrically connected with the input end of the high-voltage direct-current power supply 10 to be tested, and the second end is electrically connected with the output end of the high-voltage direct-current power supply 10 to be tested;

The bidirectional power supply 20 is configured to convert a dc output from the output end of the high-voltage dc power supply 10 to an ac, and feed the ac back to the high-voltage dc power supply 10 through the first end.

Specifically, the high-voltage dc power supply 10 according to the present application is a light source of other analysis apparatuses, such as deuterium lamp power supply, xenon lamp power supply, and zinc lamp power supply, which can convert ac to dc and provide dc power for various high-power devices. The output power of the hvdc power source 10 may be up to tens of kw or even hundreds of kw or more.

Meanwhile, the bidirectional power source 20 according to the present application may be a high-frequency isolated AC/DC bidirectional power source 20, which may be used as a direct current source or a load. When the bi-directional power supply 20 is used as a direct current source, the bi-directional power supply 20 may convert an alternating current power supply into a direct current power supply; when the bidirectional power supply 20 is used as a load, the bidirectional power supply 20 can convert direct current power supply into alternating current power supply and invert the alternating current power supply back to the power grid. That is, the two current directions of the bidirectional power source 20 can be switched directly without interruption.

In this embodiment, the hvdc power source 10 may be a 120kw hvdc power source, and the bidirectional power source 20 is mainly used as a load. Three wiring terminals are arranged at the input end of the high-voltage direct-current power supply 10 to be connected with a three-phase alternating-current power supply; the output end of the high-voltage direct current power supply 10 is provided with two connecting terminals for outputting the direct current power supply input to the second end of the bidirectional power supply 20, at this time, the bidirectional power supply 20 can be converted into alternating current, and the first end inputs the alternating current power supply to the input end of the high-voltage power supply to carry out energy feedback, so that the power supply quantity of a power grid to the high-voltage direct current power supply 10 can be reduced, and the energy consumption required by the electrical test of the high-voltage direct current power supply 10 is saved. The bi-directional power supply 20 of the present application is used as a feedback load, the energy recovery peak efficiency can reach more than 92%, and meanwhile, the bi-directional power supply 20 also has multiple modes of constant voltage, constant current, constant resistance and constant power, which not only can meet the test requirement of the high-voltage direct current tested power supply 10, but also can support the test of similar high-power high-voltage direct current products and charging piles or can be directly used as a power supply.

According to the power supply test system provided by the application, the bidirectional power supply 20 is arranged between the input end and the output end of the high-voltage direct-current tested power supply 10, so that the bidirectional power supply 20 can be used as a load of the high-voltage direct-current tested power supply 10 when the high-voltage direct-current tested power supply 10 is subjected to electrical function test, and the direct current output by the high-voltage direct-current tested power supply 10 is converted into alternating current so as to be fed back to the input end of the high-voltage direct-current tested power supply 10, thereby realizing the recycling of energy sources, reducing the test cost and improving the accuracy of an electrical performance test result.

In some embodiments, as shown in fig. 2, the hvth measured power supply 10 further includes a first EMI suppression circuit 101, a first pfc circuit 102, a first bus capacitor 103, and a second EMI suppression circuit 104; the first EMI suppression circuit 101 is electrically connected to the input of the high-voltage direct-current power supply 10 to be tested and the first power factor correction circuit 102, the first power factor correction circuit 102 is electrically connected to the first bus capacitor 103, the first bus capacitor 103 is electrically connected to the second EMI suppression circuit 104, and the second EMI suppression circuit 104 is electrically connected to the output end of the high-voltage direct-current power supply 10 to be tested.

In this embodiment, the first EMI suppression circuit 101 is disposed between the input end of the high-voltage dc power supply 10 and the first power factor correction circuit 102, that is, the input end of the first EMI suppression circuit 101 is electrically connected to the three connection terminals L1, L2 and L3 of the input end of the high-voltage dc power supply 10, and the output end of the first EMI suppression circuit 101 is electrically connected to the first power factor correction circuit 102, where the first EMI suppression circuit 101 is mainly used for filtering out flood of the three-phase ac end and suppressing high-frequency interference.

The first pfc circuit 102 is disposed between the first EMI suppression circuit 101 and the first bus capacitor 103, and is a three-phase pfc circuit, and may be regarded as three single-phase pfc circuits, each of which is equivalent to a circuit composed of two Boost circuits, which may alternately operate in positive and negative half cycles of an ac voltage.

The first bus capacitor 103 includes a capacitor C1 and a capacitor C2, where the capacitor C1 and the capacitor C2 are used as positive and negative bus capacitors, and three connection points are formed after the capacitor C1 and the capacitor C2 are connected in series, and are respectively electrically connected to the output end of the first power factor correction circuit 102.

The second EMI suppression circuit 104 is disposed between the output end of the high-voltage dc power supply 10 and the first bus capacitor 103, and the dc voltage output by the three-phase ac power supply after being processed by the first power factor correction circuit 102 and the first bus capacitor 103 can be filtered by the second EMI suppression circuit 104, so that the dc power supply can be stably provided for various high-power devices.

In some embodiments, as shown in fig. 2, the hvth power supply 10 further includes a first switch S1 circuit 105 and a thermistor R2; one end of the first switch S1 circuit 105 is electrically connected to the second EMI suppression circuit 104, the other end of the first switch S1 circuit 105 is electrically connected to one end of the thermistor R2, and the other end of the thermistor R2 is electrically connected to the output end of the high-voltage direct-current power supply 10 to be tested.

In this embodiment, two connection terminals disposed at the output end of the hvdc power source 10 are V ₁ + and V ₁ -, respectively, and the first switch S1 circuit 105 and the thermistor R2 are disposed between the connection terminal V ₁ + and the second EMI suppression circuit 104. The high-voltage direct current power supply 10 is a 120kw high-voltage direct current power supply, and when the high-power equipment is provided with the direct current power supply, the temperature is extremely easy to be too high in the power supply, so that the thermistor R2 and the first switch S1 circuit 105 are arranged between the output end of the high-voltage direct current power supply 10 and the second EMI suppression circuit 104, and the two ends of the thermistor R2 and the first switch S1 circuit 105 which are connected in series are respectively and electrically connected with the output end of the high-voltage direct current power supply 10 and the output end of the second EMI suppression circuit 104, so that the damage of the inside of the high-voltage direct current power supply 10 due to the too high temperature can be avoided.

Further, in some embodiments, as shown in fig. 2, the first switch S1 circuit 105 includes a first switch S1, a second switch S2, and a first resistor R1; one end of the first switch S1 is electrically connected to one end of the second switch S2 to form a first connection point, the other end of the first switch S1 is electrically connected to one end of the first resistor R1, the other end of the first resistor R1 is electrically connected to the other end of the second switch S2 to form a second connection point, the first connection point is electrically connected to the second EMI suppression circuit 104, and the second connection point is electrically connected to the output end of the high-voltage direct-current measured power supply 10.

In this embodiment, after the first switch S1 and the first resistor R1 connected in series are connected in parallel with the second switch S2, the first switch S1 is opened and the second switch S2 is closed in the process of providing the dc power to the high-power device by the high-voltage dc power to be tested 10 between the second EMI suppression circuit 104 and the thermistor R2. When the thermistor R2 detects that the internal temperature of the high-voltage direct-current power supply 10 is too high, the first switch S1 is turned on, the second switch S2 is turned off, and the first resistor R1 plays a role in voltage division, so that the damage of the internal temperature of the high-voltage direct-current power supply 10 due to the too high temperature can be avoided.

In some embodiments, as shown in fig. 3, the bi-directional power supply 20 further includes a third EMI suppression circuit 201, a second power factor correction circuit 202, a second bus capacitor 203, a bi-directional full bridge resonant circuit 204, a buck-boost circuit 205, and a fourth EMI suppression circuit 206; the third EMI suppression circuit 201 is electrically connected to the first end and the second power factor correction circuit 202, the second power factor correction circuit 202 is electrically connected to the second bus capacitor 203, the second bus capacitor 203 is electrically connected to the bidirectional full-bridge resonant circuit 204, the bidirectional full-bridge resonant circuit 204 is electrically connected to the buck-boost circuit 205, the buck-boost circuit 205 is electrically connected to the fourth EMI suppression circuit 206, and the fourth EMI suppression circuit 206 is electrically connected to the second end.

In this embodiment, the third EMI suppression circuit 201 is disposed between the first end of the bi-directional power supply 20 and the second power factor correction circuit 202, that is, one end of the third EMI suppression circuit 201 is electrically connected to the first end of the bi-directional power supply 20, the first end is provided with three connection terminals L4, L5 and L6, and the other end of the third EMI suppression circuit 201 is electrically connected to the second power factor correction circuit 202, where the third EMI suppression circuit 201 can filter out the flood of the three-phase ac end and suppress high-frequency interference, and further can stably feed back the converted three-phase ac power to the high-voltage dc measured power supply 10.

The second pfc circuit 202 is disposed between the third EMI suppression circuit 201 and the second bus capacitor 203, and is a three-phase pfc circuit, and may be regarded as three single-phase pfc circuits, each of which is equivalent to a circuit composed of two Boost circuits, which may alternately operate in positive and negative half cycles of the ac voltage. The second bus capacitor 203 includes a capacitor C3 and a capacitor C4, where the capacitor C3 and the capacitor C4 are used as positive and negative bus capacitors, and three connection points are formed after the capacitor C3 and the capacitor C4 are connected in series, and are electrically connected to the second power factor correction circuit 202 respectively. The second pfc circuit 202 and the second bus capacitor 203 may form a bidirectional AC/DC converter, so that the three-phase AC power supply and the internal DC power supply may be bidirectionally converted and energy exchanged.

The bidirectional full-bridge resonant circuit 204 is disposed between the second bus capacitor 203 and the buck-boost circuit 205, and can be used as a bidirectional DC/DC converter to realize bidirectional energy exchange, and meanwhile, a transformer is disposed in the bidirectional full-bridge resonant circuit 204, so that the DC power supplies on two sides of the transformer can be isolated. Meanwhile, the buck-boost circuit 205 is disposed between the bidirectional full-bridge resonant circuit 204 and the fourth EMI suppression circuit 206, and can be used as a buck-boost DC/DC converter to implement DC voltage conversion.

The fourth EMI suppression circuit 206 is disposed between the second terminal of the bi-directional power supply 20 and the step-up/down circuit 205, and may perform high-frequency interference suppression on the dc converted by the step-up/down circuit 205 or perform high-frequency interference suppression on the dc input from the second terminal.

Further, in some embodiments, as shown in fig. 3, the bidirectional full-bridge resonator circuit 204 includes a first full-bridge resonator 2041 and a second full-bridge resonator 2042, and the buck-boost circuit 205 includes a first buck-boost sub-circuit 2051 and a second buck-boost sub-circuit 2052; the first full-bridge resonator 2041 is connected in series with the first buck-boost sub-circuit 2051 to form a third end and a fourth end, the second full-bridge resonator 2042 is connected in series with the second buck-boost sub-circuit 2052 to form a fifth end and a sixth end, the third end and the fifth end are electrically connected to the second bus capacitor 203, and the fourth end and the sixth end are electrically connected to the fourth EMI suppression circuit 206.

In the present embodiment, the bidirectional full-bridge resonant circuit 204 is formed by connecting the first full-bridge resonator 2041 and the second full-bridge resonator 2042 in parallel, and is disposed between the buck-boost circuit 205 and the second bus capacitor 203, and each of the first full-bridge resonator 2041 and the second full-bridge resonator 2042 is formed by four switching tubes, a resonant capacitor, a resonant inductor, a transformer excitation inductor, a transformer and a rectifier.

The Buck-Boost circuit 205 is formed by connecting a first Buck-Boost sub-circuit 2051 and a second Buck-Boost sub-circuit 2052 in parallel, and is disposed between the bidirectional full-bridge resonant circuit 204 and the fourth EMI suppression circuit 206, where the first Buck-Boost sub-circuit 2051 and the second Buck-Boost sub-circuit 2052 may be any one of a Boost circuit and a Buck circuit, and may be selected according to practical applications.

Further, in some embodiments, as shown in fig. 3, the bi-directional power supply 20 further includes a second switching circuit 207; wherein one end of the second switch circuit 207 is electrically connected to the fourth EMI suppression circuit 206, and the other end of the second switch S2 is electrically connected to the second end.

In the present embodiment, two terminals V ₂ + and V ₂ -, respectively, are disposed at the second end of the bidirectional power source 20, and the second switch circuit 207 is disposed between the terminal V ₂ + and the fourth EMI suppression circuit 206. By providing the second switching circuit 207 between the fourth EMI suppression circuit 206 and the second terminal of the bi-directional power supply 20, the current flow between the first terminal and the second terminal of the bi-directional power supply 20 may be directed by the second switching circuit 207. When the first switch S1 circuit 105 is in an off state, the bidirectional power source 20 can be used as a direct current source; when the first switch S1 circuit 105 is in the on state, the bidirectional power supply 20 can be used as a load, and further can convert the dc power output by the high-voltage dc power under test 10 into ac power, and feed back the ac power to the high-voltage dc power under test 10.

Further, in some embodiments, as shown in fig. 3, the second switching circuit 207 includes a third switch S3 and a diode D1; one end of the third switch S3 is electrically connected to the anode of the diode D1 to form a third connection point, the other end of the third switch S3 is electrically connected to the cathode of the diode D1 to form a fourth connection point, the third connection point is electrically connected to the fourth EMI suppression circuit 206, and the fourth connection point is electrically connected to the second end.

In the present embodiment, the second switch circuit 207 is formed by connecting the third switch S3 in parallel with the diode D1, when the bi-directional power supply 20 is used as a dc source, the third switch S3 is turned off, and the dc converted by the bi-directional power supply 20 can be input to the second terminal output through the diode D1; when the bidirectional power supply 20 is used as a load, the third switch S3 is turned on, and the diode D1 plays a role of reverse connection prevention.

In some embodiments, as shown in fig. 1, the system further comprises a sampling module 30; one end of the sampling module 30 is electrically connected to the input end of the high-voltage direct-current power supply 10, and the other end of the sampling module 30 is electrically connected to the output end of the high-voltage direct-current power supply 10.

In this embodiment, the sampling module 30 includes a current sampling module 301 and a voltage sampling module 302, where the current sampling module 301 is used for collecting current at the input end of the high-voltage direct-current measured power supply 10, and the voltage collecting module is used for collecting current. The voltages at the input end and the output end of the high-voltage direct-current power supply 10 to be measured are further determined whether the electrical performance index of the high-voltage direct-current power supply 10 meets the standard.

Further, the sampling module 30 according to the present application may be a power meter, which may collect the voltage and current of three phases at the input end of the hvdc power source 10, and may also collect the voltage of the output end of the hvdc power source 10.

In addition, the application can also control at least one of the bidirectional power supply 20, the high-voltage direct-current tested power supply 10 and the power meter through the PC end, and collect various signal data to determine whether the equipment works normally, whether the communication of the tested product is normal, whether the voltage and current sampling value is in a normal range, and the like.

In some embodiments, as shown in fig. 1, the system further includes a liquid cooling module 40, where the liquid cooling module 40 is configured to liquid cool the hvth power under test 10.

In this embodiment, the present application further provides a liquid cooling module 40 for the hvdc power supply 10 to dissipate heat from the hvdc power supply 10, so that the hvdc power supply 10 can work normally at-30 to 60 ℃.

While the application has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the application. Therefore, the protection scope of the application is subject to the protection scope of the claims.

Claims (10)

1. A power supply testing system, comprising:

The high-voltage direct-current power supply to be tested comprises an input end and an output end, wherein the input end of the high-voltage direct-current power supply to be tested is connected with a three-phase alternating-current power supply;

The bidirectional power supply comprises a first end and a second end, wherein the first end is electrically connected with the input end of the high-voltage direct-current power supply to be tested, and the second end is electrically connected with the output end of the high-voltage direct-current power supply to be tested;

The bidirectional power supply is used for converting direct current output by the output end of the high-voltage direct current power supply to alternating current and feeding the alternating current back to the high-voltage direct current power supply through the first end.

2. The power test system of claim 1, wherein the high voltage dc power under test further comprises a first EMI suppression circuit, a first power factor correction circuit, a first bus capacitor, and a second EMI suppression circuit;

The first EMI suppression circuit is electrically connected with the input of the high-voltage direct-current power supply to be tested and the first power factor correction circuit respectively, the first power factor correction circuit is electrically connected with the first bus capacitor, the first bus capacitor is electrically connected with the second EMI suppression circuit, and the second EMI suppression circuit is electrically connected with the output end of the high-voltage direct-current power supply to be tested.

3. The power test system of claim 2, wherein the high voltage dc power under test further comprises a first switching circuit and a thermistor;

One end of the first switch circuit is electrically connected with the second EMI suppression circuit, the other end of the first switch circuit is electrically connected with one end of the thermistor, and the other end of the thermistor is electrically connected with the output end of the high-voltage direct-current power supply to be tested.

4. The power test system of claim 3, wherein the first switching circuit comprises a first switch, a second switch, and a first resistor;

one end of the first switch is electrically connected with one end of the second switch to form a first connection point, the other end of the first switch is electrically connected with one end of the first resistor, the other end of the first resistor is electrically connected with the other end of the second switch to form a second connection point, the first connection point is electrically connected with the second EMI suppression circuit, and the second connection point is electrically connected with the output end of the high-voltage direct-current power supply to be tested.

5. The power test system of claim 1, wherein the bi-directional power supply further comprises a third EMI suppression circuit, a second power factor correction circuit, a second bus capacitor, a bi-directional full bridge resonant circuit, a buck-boost circuit, and a fourth EMI suppression circuit;

The third EMI suppression circuit is electrically connected with the first end and the second power factor correction circuit respectively, the second power factor correction circuit is electrically connected with the second bus capacitor, the second bus capacitor is electrically connected with the bidirectional full-bridge resonance circuit, the bidirectional full-bridge resonance circuit is electrically connected with the buck-boost circuit, the buck-boost circuit is electrically connected with the fourth EMI suppression circuit, and the fourth EMI suppression circuit is electrically connected with the second end.

6. The power test system of claim 5, wherein the bi-directional full-bridge resonant circuit comprises a first full-bridge resonator and a second full-bridge resonator, the buck-boost circuit comprising a first buck-boost sub-circuit and a second buck-boost sub-circuit;

The first full-bridge resonator is connected in series with the first buck-boost sub-circuit to form a third end and a fourth end, the second full-bridge resonator is connected in series with the second buck-boost sub-circuit to form a fifth end and a sixth end, the third end and the fifth end are electrically connected with the second bus capacitor, and the fourth end and the sixth end are electrically connected with the fourth EMI suppression circuit.

7. The power test system of claim 5, wherein the bi-directional power supply further comprises a second switching circuit;

one end of the second switch circuit is electrically connected with the fourth EMI suppression circuit, and the other end of the second switch is electrically connected with the second end.

8. The power test system of claim 7, wherein the second switching circuit comprises a third switch and a diode;

One end of the third switch is electrically connected with the anode of the diode to form a third connection point, the other end of the third switch is electrically connected with the cathode of the diode to form a fourth connection point, the third connection point is electrically connected with the fourth EMI suppression circuit, and the fourth connection point is electrically connected with the second end.

9. The power test system of any one of claims 1-8, wherein the system further comprises a sampling module;

One end of the sampling module is electrically connected with the input end of the high-voltage direct-current power supply to be tested, and the other end of the sampling module is electrically connected with the output end of the high-voltage direct-current power supply to be tested.

10. The power test system of any one of claims 1-8, further comprising a liquid cooling module for liquid cooling the hvdc power under test.