CN221405992U - Power supply probe and measuring equipment - Google Patents
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- CN221405992U CN221405992U CN202323257954.4U CN202323257954U CN221405992U CN 221405992 U CN221405992 U CN 221405992U CN 202323257954 U CN202323257954 U CN 202323257954U CN 221405992 U CN221405992 U CN 221405992U
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Abstract
The application provides a power supply probe and measuring equipment, which are characterized in that a high-frequency signal gain and a low-frequency signal gain in a measured signal are inconsistent due to the addition of a source impedance compensation matching module.
Description
Technical Field
The application relates to the technical field of probes of test equipment, in particular to a power supply probe and measurement equipment.
Background
The measurement device typically uses a power probe to make measurements when measuring the supply voltage. In general, the power supply probe has the characteristics of high low-frequency input impedance, low high-frequency input impedance, low noise, high measurement bandwidth and the like. As shown in fig. 1, fig. 1 shows an equivalent impedance model of a power supply and a power supply probe, and the power supply can be regarded as a signal source with very low output impedance due to a large filter capacitance and bypass capacitance from the power supply to the ground, in the equivalent impedance model of the power supply, VAC is an alternating current signal source, VDC is a direct current signal source, and ZOUT is the output impedance of the power supply; in the equivalent impedance model of the power supply probe, ZFL is low-frequency impedance, ZFH is high-frequency impedance, C1 is dc blocking capacitance, where ZFH is typically 50Ω, and ZFL is much larger than ZFH, so in the high frequency band, the high-frequency input impedance of the power supply probe can be regarded as ZFH.
Since the output impedance ZOUT (generally less than 1 Ω) of the power supply is much smaller than the high-frequency input impedance ZFH (generally 50 Ω) of the power supply probe, and a long coaxial cable is further passed between the measurement point of the power supply and the power supply probe, the coaxial cable has an active end 102A and a terminal 102B, the active end 102A is used for connecting with the measurement point of the power supply, the terminal 102B is used for connecting with the measurement interface of the power supply probe, the impedance of the active end 102A is the output impedance ZOUT of the power supply, the impedance Z0 of the terminal 102B is equal to the high-frequency input impedance ZFH of the power supply probe, as mentioned above, since ZOUT is much smaller than ZFH, the impedance between the active end 102A and the terminal 102B of the coaxial cable is not matched, and a long coaxial cable forms serious signal reflection at a high frequency band (greater than 300 MHz), as shown in fig. 2, the frequency response curve of the power supply probe (including the coaxial cable) is shown, the amplitude of the measured signal is severely distorted, the measured result is inaccurate, and the amplitude of the measured signal varies with the frequency.
In order to improve the signal reflection problem, a source impedance compensation matching module is added to the input end of the power supply probe, as shown in fig. 3, the problem of inconsistent gain of high-frequency and low-frequency signals is introduced, as shown in fig. 4, while the problem of signal reflection can be improved, the gain of the high-frequency signals can be attenuated by 6dB.
Disclosure of utility model
The application provides a power supply probe and a measuring device, which can solve the problem of inconsistent gains of high-frequency signals and low-frequency signals.
According to an aspect of the present application, there is provided in an embodiment a power probe for a measurement apparatus, comprising:
The power supply probe main body module is used for acquiring a power supply voltage signal of a tested power supply and outputting a first signal corresponding to the power supply voltage signal, wherein the first signal comprises an alternating current signal with a first frequency band and/or an alternating current signal with a second frequency band, and the first frequency band is larger than the second frequency band; wherein the first frequency band belongs to a high frequency band, and the second frequency band belongs to a low frequency band;
the high-frequency compensation module is used for performing gain compensation on the alternating current signal with the first frequency band in the first signal so as to enable the gain of the alternating current signal with the first frequency band to be matched with the gain of the alternating current signal with the second frequency band, and outputting a measuring signal to the measuring equipment.
In one embodiment, the high frequency compensation module includes:
The high-pass filter circuit is used for performing gain compensation on the alternating current signal with the first frequency band in the first signal and outputting a second signal;
And the inverting circuit is used for inverting the second signal and outputting the measuring signal.
In one embodiment, the high pass filter circuit comprises: resistor R1, resistor R2, resistor R3, capacitor C1 and operational amplifier U1;
One end of the resistor R1 is used for receiving a first signal, the other end of the resistor R1 is connected with one end of the resistor R2, the other end of the resistor R2 is connected with the negative phase input end of the operational amplifier U1, the capacitor C1 is connected with two ends of the resistor R2, the resistor R3 is connected between the negative phase input end of the operational amplifier U1 and the output end of the operational amplifier U1, and the positive phase input end of the operational amplifier U1 is connected with the ground; the output end of the operational amplifier U1 is used for outputting the second signal.
In one embodiment, the resistance value of the resistor R1 is set equal to the input impedance of the measuring device.
In one embodiment, the second signal is obtained by the following expression:
V2＝F*VIN
Wherein V2 represents a voltage corresponding to the second signal, and VIN represents a voltage corresponding to the first signal;
F represents a transfer function of the high-pass filter circuit, f=r3/(r1+r2||xc1), xc1 represents a capacitive reactance of the capacitor C1, xc11=1/(2pi f×c1), and F is a frequency of the first signal.
In one embodiment, the inverting circuit includes: a resistor R4, a resistor R5, a resistor R6 and an operational amplifier U2;
One end of the resistor R4 is used for receiving the second signal, the other end of the resistor R4 is connected with the negative phase input end of the operational amplifier U2, the positive phase input end of the operational amplifier U2 is connected with the ground, the resistor R5 is connected between the negative phase input end and the output end of the operational amplifier, the output end of the operational amplifier U2 is connected with one end of the resistor R6, and the other end of the resistor R6 is used for outputting the measurement signal.
In one embodiment, the measurement signal is obtained by the following expression:
VO＝V2*(R5/R4)
wherein VO represents a voltage corresponding to the measurement signal, and V2 represents a voltage corresponding to the second signal.
In one embodiment, the power probe body module includes:
the coaxial cable is provided with a source end and a terminal, wherein the source end of the coaxial cable is used for acquiring a power supply voltage signal of a tested power supply, and the terminal of the coaxial cable is used for outputting the acquired power supply voltage signal;
The high-frequency signal acquisition module is used for extracting an alternating current signal with a first frequency band from the power supply voltage signal output by the terminal of the coaxial cable to obtain a high-frequency signal, wherein the high-frequency signal is the alternating current signal with the first frequency band; the power supply voltage signal comprises the alternating current signal with the first frequency band, the alternating current signal with the second frequency band and the direct current signal;
The low-frequency signal acquisition module is used for extracting the alternating current signal and the direct current signal with the second frequency band in the input power voltage signals, acquiring a first bias voltage signal, and at least partially canceling the direct current signal in the power voltage signals by using the first bias voltage signal to obtain a low-frequency signal, wherein the low-frequency signal comprises the alternating current signal with the second frequency band and a part of direct current signal which is not canceled;
The low-frequency signal gain compensation module is used for acquiring the low-frequency signal and compensating the gain of the low-frequency signal so as to enable the gain of the compensated low-frequency signal to be matched with the gain of the high-frequency signal;
The high-low frequency intersection module is used for converging the high-frequency signal and the low-frequency signal after gain compensation and outputting a first signal to the high-frequency compensation module;
The source impedance compensation matching module is connected between the source end of the coaxial cable and the tested power supply and is used for compensating the source end impedance of the coaxial cable so as to match the source end impedance of the coaxial cable with the terminal impedance of the coaxial cable;
The bias voltage providing module is used for receiving a second bias voltage signal output by the measuring equipment and generating the first bias voltage signal according to the second bias voltage signal; wherein the magnitude of the second bias voltage signal is related to the magnitude of the supply voltage signal.
In one embodiment, the measurement device is an oscilloscope.
According to an aspect of the present application, there is provided in an embodiment a measurement apparatus comprising:
the power supply probe is the power supply probe according to any one of the embodiments, and is configured to obtain a power supply voltage of a power supply to be tested;
And the signal input channel is used for receiving the power supply voltage acquired by the power supply probe and measuring the power supply voltage.
According to the power supply probe and the measuring equipment, the problem that the gain of the high-frequency band signal and the gain of the low-frequency band signal in the measured signal are inconsistent is introduced due to the addition of the source impedance compensation matching module.
Drawings
FIG. 1 is an equivalent impedance model of a prior art power supply and power supply probe;
FIG. 2 is a frequency response curve of a prior art power probe (including coaxial cable);
FIG. 3 is a schematic diagram of a power probe after adding a source impedance compensation matching module between the source end of the coaxial cable and the power source under test;
FIG. 4 is a frequency response curve of the power probe;
FIG. 5 is a schematic diagram of an example of a power probe connected to an oscilloscope;
FIG. 6 is a signal flow diagram after adding a high frequency compensation module;
fig. 7 is a schematic structural diagram of a power supply probe according to an embodiment of the present application;
FIG. 8 is a schematic diagram of a high frequency compensation module according to an embodiment;
FIG. 9 is a schematic diagram of a power probe body module according to an embodiment;
FIG. 10 is a schematic circuit diagram of a source impedance compensation matching module according to an embodiment;
FIG. 11 is a schematic circuit diagram of a source impedance compensation matching module according to another embodiment;
FIG. 12 is a schematic circuit diagram of a source impedance compensation matching module according to yet another embodiment;
FIG. 13 is a schematic circuit diagram of a portion of a power probe body module of an embodiment;
fig. 14 is a schematic structural view of a measuring apparatus of an embodiment.
Detailed Description
The application will be described in further detail below with reference to the drawings by means of specific embodiments. Wherein like elements in different embodiments are numbered alike in association. In the following embodiments, numerous specific details are set forth in order to provide a better understanding of the present application. However, one skilled in the art will readily recognize that some of the features may be omitted, or replaced by other elements, materials, or methods in different situations. In some instances, related operations of the present application have not been shown or described in the specification in order to avoid obscuring the core portions of the present application, and may be unnecessary to persons skilled in the art from a detailed description of the related operations, which may be presented in the description and general knowledge of one skilled in the art.
Furthermore, the features, operations, or characteristics described in the specification may be combined in any suitable manner to form various embodiments, and the operational steps involved in the embodiments may be sequentially exchanged or adjusted in a manner apparent to those skilled in the art. Accordingly, the description and drawings are merely for clarity of describing certain embodiments and are not necessarily intended to imply a required composition and/or order.
The numbering of the components itself, e.g. "first", "second", etc., is used herein merely to distinguish between the described objects and does not have any sequential or technical meaning. The term "coupled" as used herein includes both direct and indirect coupling (coupling), unless otherwise indicated.
In the embodiment of the present application, referring to fig. 3, after a source impedance compensation matching module is added between a source end of a coaxial cable and a measured power supply, the reflection problem of signals is improved, but gains of the signals in a high frequency band and a low frequency band are inconsistent, as shown in fig. 4, the gain of the high frequency band is attenuated by 6dB, so as to affect the measurement result.
Referring to fig. 5, fig. 5 shows an example of a connection of a power probe to an oscilloscope, applicants' research found that: in the power supply probe shown in fig. 5, if the low-frequency input impedance is far greater than the high-frequency input impedance, the source impedance compensation matching module is connected to the source end of the coaxial cable, and the compensation impedance provided by the source impedance compensation matching module is equivalent to the high-frequency input impedance of the power supply probe, so that the high-frequency gain of the signal can be reduced according to the principle of resistance voltage division, and if the attenuation ratio of the probe is increased and the system noise is deteriorated by compensating at low frequency, the applicant adds a high-frequency compensation module for compensating the high-frequency gain between the power supply probe and the oscilloscope on the basis of the power supply probe shown in fig. 5, so that the high-frequency gain is equal to the low-frequency gain, the signal flow chart is shown in fig. 6, the high-frequency power supply probe network can be the power supply probe network shown in fig. 5, or other existing power supply probe networks, the transmission function of the high-frequency compensation module is F (2), and the final transmission function F (N) is obtained after the two are multiplied, and the frequency gain curve of the transmission function is the transmission function under each module in fig. 6, so that the frequency gain after compensation is consistent.
Referring to fig. 7, an embodiment of the present application provides a power supply probe, where the power supply probe 100 includes a power supply probe body module 101 and a high frequency compensation module 102, and the power supply probe is configured to obtain a power supply voltage of a measured power supply, and output the obtained power supply voltage to a measurement device, so that the measurement device measures the power supply voltage.
The power supply probe main body module 101 is configured to obtain a power supply voltage signal of a power supply to be tested, and output a first signal corresponding to the power supply voltage signal, where the first signal includes an ac signal having a first frequency band and/or an ac signal having a second frequency band, and the first frequency band is greater than the second frequency band; the first frequency band belongs to a high frequency band, and the second frequency band belongs to a low frequency band.
The high-frequency compensation module 102 is configured to perform gain compensation on the ac signal having the first frequency band in the first signal, so that the gain of the ac signal having the first frequency band is matched with the gain of the ac signal having the second frequency band, and output the measurement signal to the measurement device.
In the embodiment of the present application, the high-frequency compensation module 102 performs certain compensation on the gain of the high-frequency signal (the ac signal having the first frequency band) and the gain of the low-frequency signal (the ac signal having the second frequency band), where the gain compensation of the high-frequency signal is larger and the gain compensation of the low-frequency signal is smaller, so that the gain of the compensated high-frequency signal is identical to the gain of the low-frequency signal.
Referring to fig. 8, in some embodiments, the high frequency compensation module 102 includes a high pass filter circuit 1021 and an inverting circuit 1022, wherein the high pass filter circuit 1021 is configured to perform gain compensation on an ac signal having a first frequency band in the first signal, and finally output a second signal; the inverting circuit 1022 is configured to invert the second signal and output a measurement signal. Wherein:
In one embodiment, the high pass filter circuit 1021 may comprise: resistor R1, resistor R2, resistor R3, capacitor C1 and operational amplifier U1; one end of a resistor R1 is used for receiving a first signal, the other end of the resistor R1 is connected with one end of a resistor R2, the other end of the resistor R2 is connected with the negative phase input end of an operational amplifier U1, a capacitor C1 is connected with two ends of the resistor R2, a resistor R3 is connected between the negative phase input end of the operational amplifier U1 and the output end of the operational amplifier U1, and the positive phase input end of the operational amplifier U1 is connected with the ground; the output terminal of the operational amplifier U1 is used for outputting a second signal.
The transfer function f=r3/(r1+r2||xc1) of the high-pass filter circuit 1021, so that the voltage v2=fvin corresponding to the second signal, VIN represents the voltage corresponding to the first signal, xc1 represents the capacitive reactance of the capacitor C1, xc11=1/(2pi f|c1), and F is the frequency of the first signal; as is clear from the transfer function F, the high-frequency gain of the power supply probe 100 can be compensated to equalize the high-frequency gain and the low-frequency gain by setting the appropriate value of the resistance capacitance in the transfer function.
In one embodiment, inverting circuit 1022 includes: a resistor R4, a resistor R5, a resistor R6 and an operational amplifier U2; one end of the resistor R4 is used for receiving the second signal, the other end of the resistor R4 is connected with the negative phase input end of the operational amplifier U2, the positive phase input end of the operational amplifier U2 is connected with the ground, the resistor R5 is connected between the negative phase input end and the output end of the operational amplifier, the output end of the operational amplifier U2 is connected with one end of the resistor R6, and the other end of the resistor R6 is used for outputting a measuring signal.
The inverting circuit 1022 is configured to invert the input and output signals, and since the phases of the second signal V2 and the first signal VIN are opposite, the second signal V2 passes through the inverting circuit 1022, so that the phase of the finally output measurement signal VO is the same as the phase of the VIN, where vo=v2 (R5/R4).
In the high-frequency compensation module circuit provided in the above embodiment, the high-frequency input impedance thereof is equal to R1, and therefore, the requirement can be satisfied by setting the resistance value of R4 equal to the input impedance of the measuring apparatus. Taking an oscilloscope as an example, when the oscilloscope measures a high-frequency signal, the input impedance is generally 50 ohms, and then the input impedance of the high-frequency compensation module circuit is r1+r2||xc1, and because xc2 is very close to 0 in a high-frequency band, the input impedance of the high-frequency compensation module can be considered to be R1 in the high-frequency band.
Referring to fig. 9, in some embodiments, the power probe body module 101 includes: the system comprises a source impedance compensation matching module 1011, a coaxial cable 1012, a high-frequency signal acquisition module 1013, a low-frequency signal acquisition module 1014, a low-frequency signal gain compensation module 1015 and a high-low frequency intersection module 1016, wherein the coaxial cable 1012 is provided with a source end 1012a and a terminal 1012b, the input end of the source impedance compensation matching module 1011 is connected with a measuring point of a measured power supply, the output end of the source impedance compensation matching module 1011 is connected with the source end 1012a of the coaxial cable 1012, the terminal 1012b of the coaxial cable 1012 is connected with the input end of the high-frequency signal acquisition module 1013 and the input end of the low-frequency signal acquisition module 1014, the output end of the high-frequency signal acquisition module 1013 is connected with the input end of the high-low frequency intersection module 1016, the output end of the low-frequency signal gain compensation module 10114 is connected with the input end of the high-low frequency intersection module 1016, and the output end of the high-low frequency intersection module 1016 is the output of the main body module 101 of the power supply probe. The respective functional blocks of the power probe body module 101 are described in detail below.
The source impedance compensation matching module 1011 is used to compensate the source impedance of the coaxial cable 1012 so that the source impedance of the coaxial cable 1012 matches the termination impedance of the coaxial cable 1012. As shown in fig. 10, 11 and 12, fig. 10, 11 and 12 show three examples of a specific implementation circuit of the source impedance compensation matching module 1011, wherein a and B are an output terminal and an input terminal of the source impedance compensation matching module 1011, respectively.
The source end 1012a of the coaxial cable 1012 is used to acquire a power supply voltage signal of the power supply under test, and the terminal end 1012b of the coaxial cable 1012 is used to output the acquired power supply voltage signal. In this embodiment, the coaxial cable 10112 is a transmission line for transmitting the acquired signal to the main body module of the power probe (excluding the coaxial cable).
The high-frequency signal obtaining module 1013 is configured to extract an ac signal having a first frequency band from a power supply voltage signal output by the terminal 1012b of the coaxial cable 1012, to obtain a high-frequency signal, where the high-frequency signal is the ac signal having the first frequency band; the power supply voltage signal comprises an alternating current signal with a first frequency band, an alternating current signal with a second frequency band and a direct current signal; the high-frequency signal acquisition module 103 extracts a high-frequency signal from the power voltage signal, and in some embodiments, the high-frequency signal acquisition module 1013 may employ a circuit formed by one or more capacitors according to the characteristic of "pass-through and blocking-up" of the capacitor; in other embodiments, other circuits capable of passing through ac and dc may be used, which will not be described in detail herein.
The low-frequency signal acquisition module 1014 is configured to extract an ac signal and a dc signal having a second frequency band from the input power voltage signals, and acquire a first bias voltage signal, and at least partially cancel the dc signal in the power voltage signals by using the first bias voltage signal, so as to obtain a low-frequency signal, where the low-frequency signal includes the ac signal having the second frequency band and a part of the dc signal that is not cancelled.
In some embodiments, the magnitude of the first bias voltage signal is approximately the same as the magnitude of the dc signal in the supply voltage signal, and the first bias voltage signal may be used to subtract the supply voltage signal, so that the first bias voltage signal at least partially cancels the dc signal in the supply voltage signal to extract the low frequency signal in the supply voltage signal. In one embodiment, the low frequency signal acquisition module 1014 may be implemented using adder circuitry.
In some embodiments, the first bias voltage signal may be obtained directly from the outside, for example, the second bias voltage signal output by the oscilloscope is directly used as the first bias voltage signal, but the second bias voltage signal output by the oscilloscope is often different from the dc signal in the power supply voltage signal greatly, which is not the optimal solution.
In other embodiments, the power supply probe provided by the embodiment of the present application further includes a bias voltage providing module 1017, where the bias voltage providing module 1017 is configured to receive a second bias voltage signal input by the measurement device, and generate the first bias voltage signal according to the second bias voltage signal; wherein the magnitude of the second bias voltage signal is related to the magnitude of the supply voltage signal. In some embodiments, according to the voltage of the measured power supply, the user sets the measurement device, so that the measurement device outputs a second bias voltage signal according to a command input by the user, the magnitude of the second bias voltage signal is positively correlated with the voltage of the measured power supply, and since the second bias voltage signal and the direct current signal in the power supply voltage signal cannot be completely offset, the second bias voltage signal needs to be amplified, and therefore the second bias voltage signal also needs to be amplified by the amplifying circuit to obtain the first bias voltage signal. In this way, the magnitude of the first bias voltage signal output to the low frequency signal acquisition module 1014 does not differ significantly from the magnitude of the dc signal in the power supply voltage signal, and can be directly cancelled.
The low frequency signal gain compensation module 1015 is configured to obtain a low frequency signal and compensate the gain of the low frequency signal, so that the gain of the compensated low frequency signal matches the gain of the high frequency signal. It should be noted that, the low-frequency signal gain compensation module 1015 reduces the gain of the ac signal having the second frequency band and the gain of the dc signal that is not partially cancelled in the low-frequency signal, so that the gain of the low-frequency signal matches the gain of the high-frequency signal.
The high-low frequency convergence module 1016 is configured to converge the high-frequency signal and the gain-compensated low-frequency signal, and output a first signal to the high-frequency compensation module 102.
The circuit structures of the high frequency signal acquisition module 1013, the low frequency signal acquisition module 1014, the low frequency signal gain compensation module 1015, the high and low frequency convergence module 1016, and the bias voltage supply module 1017 may be as shown in fig. 13, or may be other circuit structures capable of implementing the above functions, which is not limited herein.
Referring to fig. 14, the embodiment of the present application further provides a measurement device, where the measurement device includes a power probe 100 and a signal input channel 300, and the power probe 100 is configured to acquire a power voltage signal on a measured power supply 200, and transmit the acquired power voltage signal to the signal input channel 300; after receiving the signal, the signal input channel 300 may perform subsequent processing on the signal to measure the signal. It should be noted that, the subsequent processing of the measurement signal by the signal input channel 300 is a conventional technical means for processing the signal by the measurement device, which is not described in detail in this embodiment. And will not be repeated here. In some embodiments, the measuring device is an oscilloscope or other device with a signal measuring function, and this embodiment is not illustrated one by one.
The foregoing description of the utility model has been presented for purposes of illustration and description, and is not intended to be limiting. Several simple deductions, modifications or substitutions may also be made by a person skilled in the art to which the utility model pertains, based on the idea of the utility model.
Claims (10)
1. A power probe for a measurement device, comprising:
The power supply probe main body module is used for acquiring a power supply voltage signal of a tested power supply and outputting a first signal corresponding to the power supply voltage signal, wherein the first signal comprises an alternating current signal with a first frequency band and/or an alternating current signal with a second frequency band, and the first frequency band is larger than the second frequency band; wherein the first frequency band belongs to a high frequency band, and the second frequency band belongs to a low frequency band;
the high-frequency compensation module is used for performing gain compensation on the alternating current signal with the first frequency band in the first signal so as to enable the gain of the alternating current signal with the first frequency band to be matched with the gain of the alternating current signal with the second frequency band, and outputting a measuring signal to the measuring equipment.
2. The power probe of claim 1, wherein the high frequency compensation module comprises:
The high-pass filter circuit is used for performing gain compensation on the alternating current signal with the first frequency band in the first signal and outputting a second signal;
And the inverting circuit is used for inverting the second signal and outputting the measuring signal.
3. The power probe of claim 2 wherein the high pass filter circuit comprises: resistor R1, resistor R2, resistor R3, capacitor C1 and operational amplifier U1;
One end of the resistor R1 is used for receiving a first signal, the other end of the resistor R1 is connected with one end of the resistor R2, the other end of the resistor R2 is connected with the negative phase input end of the operational amplifier U1, the capacitor C1 is connected with two ends of the resistor R2, the resistor R3 is connected between the negative phase input end of the operational amplifier U1 and the output end of the operational amplifier U1, and the positive phase input end of the operational amplifier U1 is connected with the ground; the output end of the operational amplifier U1 is used for outputting the second signal.
4. A power probe as claimed in claim 3, wherein the resistance of the resistor R1 is set equal to the input impedance of the measurement device.
5. A power probe as claimed in claim 3, wherein the second signal is derived by the expression:
V2＝F*VIN
Wherein V2 represents a voltage corresponding to the second signal, and VIN represents a voltage corresponding to the first signal;
F represents a transfer function of the high-pass filter circuit, f=r3/(r1+r2||xc1), xc1 represents a capacitive reactance of the capacitor C1, xc11=1/(2pi f×c1), and F is a frequency of the first signal.
6. A power probe as claimed in claim 3, wherein the inverting circuit comprises: a resistor R4, a resistor R5, a resistor R6 and an operational amplifier U2;
One end of the resistor R4 is used for receiving the second signal, the other end of the resistor R4 is connected with the negative phase input end of the operational amplifier U2, the positive phase input end of the operational amplifier U2 is connected with the ground, the resistor R5 is connected between the negative phase input end and the output end of the operational amplifier, the output end of the operational amplifier U2 is connected with one end of the resistor R6, and the other end of the resistor R6 is used for outputting the measurement signal.
7. The power probe of claim 6, wherein the measurement signal is obtained by the expression:
VO＝V2*(R5/R4)
wherein VO represents a voltage corresponding to the measurement signal, and V2 represents a voltage corresponding to the second signal.
8. The power probe of any one of claims 1 to 7, wherein the power probe body module comprises:
the coaxial cable is provided with a source end and a terminal, wherein the source end of the coaxial cable is used for acquiring a power supply voltage signal of a tested power supply, and the terminal of the coaxial cable is used for outputting the acquired power supply voltage signal;
The high-frequency signal acquisition module is used for extracting an alternating current signal with a first frequency band from the power supply voltage signal output by the terminal of the coaxial cable to obtain a high-frequency signal, wherein the high-frequency signal is the alternating current signal with the first frequency band; the power supply voltage signal comprises the alternating current signal with the first frequency band, the alternating current signal with the second frequency band and the direct current signal;
The low-frequency signal acquisition module is used for extracting the alternating current signal and the direct current signal with the second frequency band in the input power voltage signals, acquiring a first bias voltage signal, and at least partially canceling the direct current signal in the power voltage signals by using the first bias voltage signal to obtain a low-frequency signal, wherein the low-frequency signal comprises the alternating current signal with the second frequency band and a part of direct current signal which is not canceled;
The low-frequency signal gain compensation module is used for acquiring the low-frequency signal and compensating the gain of the low-frequency signal so as to enable the gain of the compensated low-frequency signal to be matched with the gain of the high-frequency signal;
The high-low frequency intersection module is used for converging the high-frequency signal and the low-frequency signal after gain compensation and outputting a first signal to the high-frequency compensation module;
The source impedance compensation matching module is connected between the source end of the coaxial cable and the tested power supply and is used for compensating the source end impedance of the coaxial cable so as to match the source end impedance of the coaxial cable with the terminal impedance of the coaxial cable;
The bias voltage providing module is used for receiving a second bias voltage signal output by the measuring equipment and generating the first bias voltage signal according to the second bias voltage signal; wherein the magnitude of the second bias voltage signal is related to the magnitude of the supply voltage signal.
9. The power probe of claim 8 wherein the measurement device is an oscilloscope.
10. A measurement device, comprising:
A power supply probe according to any one of claims 1 to 9 for obtaining a power supply voltage of a power supply to be tested;
And the signal input channel is used for receiving the power supply voltage acquired by the power supply probe and measuring the power supply voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202323257954.4U CN221405992U (en) | 2023-11-30 | 2023-11-30 | Power supply probe and measuring equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202323257954.4U CN221405992U (en) | 2023-11-30 | 2023-11-30 | Power supply probe and measuring equipment |
Publications (1)
| Publication Number | Publication Date |
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| CN221405992U true CN221405992U (en) | 2024-07-23 |
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