CN212192671U

CN212192671U - Chemical mechanical planarization equipment

Info

Publication number: CN212192671U
Application number: CN202020596914.XU
Authority: CN
Inventors: 李婷; 岳爽; 尹影; 崔凯; 蒋锡兵; 靳阳
Original assignee: Beijing Semicore Microelectronics Equipment Co Ltd
Current assignee: Beijing Jingyi Precision Technology Co ltd
Priority date: 2020-04-20
Filing date: 2020-04-20
Publication date: 2020-12-22
Anticipated expiration: 2030-04-20

Abstract

The utility model relates to a semiconductor equipment technical field, concretely relates to chemical machinery flattening equipment, the test platform comprises a support, the frame is gone up to remove and is provided with hydrojet subassembly and repaiies the subassembly, the hydrojet subassembly follows the subassembly of repairing removes, the hydrojet subassembly has at least one liquid outlet, follows liquid outlet spun liquid distributes uniformly on the region of repairing of polishing pad. The utility model provides a chemical mechanical planarization equipment of wafer surface degree of consistency has been improved.

Description

Chemical mechanical planarization equipment

Technical Field

The utility model relates to a semiconductor equipment technical field, concretely relates to chemical machinery flattening equipment.

Background

With the development of moore's law, the role of chemical mechanical planarization equipment in the semiconductor manufacturing process flow becomes more and more important, and the requirements for the process performance of the equipment also become higher and higher. In the process performance of chemical mechanical planarization, the most critical factor is the surface topography of the wafer, and whether the surface topography of the wafer is smooth or not directly affects the subsequent process, and may cause the electrical performance of the final chip to be affected, so effectively improving the surface topography of the wafer is one of the most important targets for optimizing the performance of the chemical mechanical planarization equipment.

When the existing chemical mechanical planarization equipment is used for polishing a wafer, a polishing pad is used for polishing the wafer, polishing liquid is conveyed while polishing, so that the polishing liquid and the surface of the wafer are subjected to chemical reaction, and the purpose of planarizing the surface of the wafer is achieved.

SUMMERY OF THE UTILITY MODEL

Therefore, the to-be-solved technical problem of the utility model lies in solving the chemical mechanical planarization equipment among the prior art polishing back, the poor problem of wafer surface degree of consistency to a chemical mechanical planarization equipment that has improved the wafer surface degree of consistency is provided.

In order to solve the technical problem, the utility model provides a chemical mechanical planarization equipment, the test platform comprises a support, the frame is gone up to remove and is provided with hydrojet subassembly and repaiies the subassembly, the hydrojet subassembly follows the subassembly of repairing removes, the hydrojet subassembly has at least one liquid outlet, follows liquid outlet spun liquid distributes evenly on the region of repairing of polishing pad.

Further, the spray assembly is disposed on the conditioning assembly.

Further, the hydrojet subassembly includes the nozzle, the tip of nozzle is the liquid outlet, the subassembly of repairing includes the end of repairing, nozzle and the end of repairing set up in parallel.

Further, the trimming assembly further comprises a moving arm connecting the trimming end with the base, and the nozzle is arranged on the moving arm.

Further, at least one of the nozzles is arranged on the moving arm at intervals.

Further, the finishing end is provided with an installation part, and the installation part is provided with the nozzle.

Further, the mounting portion is located on a side of the trimming end away from the moving arm.

Further, the installation department winds the periphery equipartition setting of repairment end, the nozzle winds the periphery equipartition of repairment end is provided with two at least.

Further, the hydrojet subassembly still includes the transfer line, the transfer line sets up in the inside of finishing the subassembly.

The utility model discloses technical scheme has following advantage:

1. the utility model provides a chemical machinery flattening equipment, the test platform comprises a support, the frame is gone up to move and is provided with hydrojet subassembly and repaiies the subassembly, the hydrojet subassembly is followed it removes to repair the subassembly, the hydrojet subassembly has at least one liquid outlet, follows liquid outlet spun liquid distributes uniformly on polishing pad's the region of repairing.

The hydrojet subassembly can remove along with the removal of trimming assembly, thereby make trimming assembly and hydrojet subassembly remove for the frame simultaneously, liquid in the hydrojet subassembly passes through the liquid outlet blowout, spun liquid can distribute uniformly on the trimming area on the polishing pad, make this liquid on the trimming area can and the surface of wafer between take place chemical reaction, and then improved the degree of consistency on wafer surface, avoid wafer edge polishing rate sudden change, appear sharply reducing then increase, or the direct condition that increases by a wide margin, thereby the yields of wafer has been improved, the waste because of the processing problem causes has been reduced.

2. The utility model provides a chemical machinery planarization equipment, at least one the spaced setting of nozzle is in on the shifting arm for the nozzle can be in advance to the region of repairing spraying liquid that is about to maintain, recycles diamond wheel and maintains to the polishing pad, makes liquid distribution more even on the polishing pad, has improved the effect of repairing of diamond wheel.

3. The utility model provides a chemical machinery flattening equipment, the installation department winds the periphery equipartition of trimming end sets up, the nozzle winds the periphery equipartition of trimming end is provided with two at least, and the both sides that the trimming end can be followed to the nozzle spray liquid towards the polishing pad for spout more even to the liquid on the polishing pad.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

Fig. 1 is a schematic structural diagram of a chemical mechanical planarization apparatus provided by the present invention;

FIG. 2 is a schematic structural diagram of another embodiment;

FIG. 3 is a schematic structural diagram of another embodiment;

FIG. 4 is a cross-sectional view of FIG. 3;

fig. 5 is a bottom view of the finishing end of fig. 3.

Description of reference numerals:

1-a polishing pad; 2-a wafer; 3-a finishing assembly; 31-trimming end; 311-a fixed seat; 312-a diamond wheel; 313-storage space; 32-a moving arm; 4-a machine base; 5-a nozzle; 6-an infusion tube;

Detailed Description

The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Furthermore, the technical features mentioned in the different embodiments of the invention described below can be combined with each other as long as they do not conflict with each other.

When the chemical mechanical planarization equipment in the prior art performs polishing treatment on the wafer 2, the wafer 2 is placed on the polishing pad 1 for trimming, polishing liquid is conveyed to the surface of the polishing pad 1, and the purpose of polishing and leveling the surface of the wafer 2 is achieved through chemical reaction between the polishing liquid and the surface of the wafer 2.

Referring to fig. 1 to 5, the present embodiment provides a chemical mechanical planarization apparatus for polishing a wafer 2 in a polishing work area. The polishing pad polishing device comprises a base 4, wherein a liquid spraying assembly and a trimming assembly 3 are movably arranged on the base 4, namely the liquid spraying assembly and the trimming assembly 3 can move relative to the base 4, the liquid spraying assembly moves along with the trimming assembly 3, the liquid spraying assembly is provided with at least one liquid outlet, and liquid sprayed out of the liquid outlet is uniformly distributed on a trimming area of the polishing pad 1.

The wafer 2 is polished while being placed on the polishing pad 1, whereby the surface of the wafer 2 is ground. Because the dressing component 3 is movably arranged relative to the polishing pad 1, and the liquid spraying component moves along with the movement of the dressing component 3 in the moving process of the dressing component 3, the dressing component 3 and the liquid spraying component simultaneously move relative to the machine base 4, liquid is contained in the liquid spraying component, the liquid is polishing liquid which chemically reacts with the surface of the wafer 2, the liquid in the liquid spraying component is sprayed out through the liquid outlet, the sprayed liquid can be uniformly distributed on a dressing area on the polishing pad 1, and the dressing area can be the motion track of the wafer 2 or the surface of the whole polishing pad 1; make this liquid on the region of repairing can take place chemical reaction with the surface of wafer 2 between, and then improved 2 surperficial degrees of consistency of wafer, avoid 2 edges of wafer polishing rate sudden change, and appear sharply reducing then increase, or the direct condition of increasing by a wide margin to improve 2 yields of wafer, reduced the waste because of the processing problem causes.

Specifically, the liquid spraying assembly is arranged on the conditioning assembly 3, and the liquid spraying assembly and the conditioning assembly 3 can be jointly moved relative to the polishing pad 1, so that the moving track of the liquid spraying assembly and the conditioning assembly 3 is the same as the moving track of the wafer 2 relative to the polishing pad 1, wherein the moving track can be that the wafer 2 rotates along the circumference of the polishing pad 1, or can be separately moved according to a fixed shape, for example, the moving track of the wafer 2 on the polishing pad 1 is in a V shape or an L shape; the liquid ejected from the liquid ejection assembly is uniformly ejected on the trimming area by the movement of the liquid ejection assembly with the movement of the trimming assembly 3.

Specifically, as shown in fig. 1, the liquid jet assembly includes a nozzle 5, i.e., the liquid is jetted onto the polishing pad 1 through the nozzle 5, the end of the nozzle 5 is the liquid outlet, the dressing assembly 3 includes a dressing end 31, and the nozzle 5 and the dressing end 31 are arranged in parallel, i.e., the nozzle 5 is arranged at the left side of the dressing end 31, so that the liquid jetted from the nozzle 5 is uniformly jetted onto the polishing pad 1.

In this embodiment, the dressing assembly 3 further comprises a movable arm 32 connecting the dressing end 31 and the machine base 4, wherein the dressing end 31 comprises a fixed seat 311 connected with the movable arm 32, and a diamond wheel 312 arranged at the bottom of the fixed seat 311, and the diamond wheel 312 is in contact with the polishing pad 1 through the diamond wheel 312 so as to dress the surface of the polishing pad 1, and the contact position of the diamond wheel 312 and the surface of the polishing pad 1 is a dressing area. While the nozzle 5 is also provided on the moving arm 32, the nozzle 5 can spray the liquid onto the dressing area when the diamond wheel 312 dresses the polishing pad 1, thereby making the distribution of the liquid more uniform over the dressing area.

Specifically, as shown in fig. 2, at least one nozzle 5 is arranged on the moving arm 32 at intervals, through the arrangement of the intervals, the nozzle 5 can spray liquid to the trimming area to be trimmed in advance, and then the diamond wheel 312 is used for trimming the polishing pad 1, so that the liquid is distributed on the polishing pad 1 more uniformly, and the trimming effect of the diamond wheel 312 is improved.

As an alternative embodiment, the trimming end 31 is provided with a mounting portion, that is, a mounting portion is provided on the fixing base 311, wherein the mounting portion is a portion for mounting the nozzle 5, the mounting portion may be a mounting hole, an internal thread is provided in the mounting hole, and an external thread is provided at an end of the nozzle 5 connected to the mounting hole, so as to mount the nozzle 5 on the trimming end 31. Of course, the mounting portion may also be an insertion structure, so that the nozzle 5 is directly inserted into the fixing seat 311 to connect the nozzle 5 and the fixing seat 311.

In the present embodiment, the mounting portion is located on the side of the dressing end 31 remote from the moving arm 32, i.e., the mounting portion is provided on the left side of the fixed base 311, so as to spray liquid against the polishing pad 1. Of course, the mounting portion may be disposed on the right side of the fixing base 311.

As an alternative embodiment, as shown in fig. 2, the mounting portions are uniformly arranged around the outer circumference of the diamond wheel 312, and at least two nozzles 5 are uniformly arranged around the outer circumference of the diamond wheel 312. That is, the mounting portions are provided on the moving arm 32, and the moving arm 32 leaves mounting positions provided on the mounting portions, two of which are symmetrically provided centering on the diamond wheel 312, so that the liquid is ejected toward the dressing area of the polishing pad 1 on both sides of the dressing end 31. In the present embodiment, the number of the nozzles 5 is 3.

As an alternative, the mounting portions are not evenly arranged around the circumference of the diamond wheel 312, and the nozzles 5 are arranged at least two around the circumference of the diamond wheel 312.

Alternatively, as shown in fig. 3 and 5, the nozzles 5 may be provided in plural numbers, for example, five, uniformly around the periphery of the conditioning end 31, thereby ensuring uniformity in distribution of the liquid on the polishing pad 1. Of course, uneven arrangement is also possible.

Specifically, as shown in fig. 3 to 4, the liquid spray assembly further includes a liquid delivery tube 6, and the liquid delivery tube 6 is disposed inside the conditioning assembly 3. Wherein, the infusion tube 6 is arranged in the base 4 and the moving arm 32, one end of the infusion tube 6 is communicated with a liquid container (not shown in the figure) which is filled with liquid; the other end of the liquid transfer tube 6 communicates with the storage space 313 in the fixed holder 311, the nozzle 5 communicates with the storage space 313, the nozzle 5 is disposed toward the polishing pad 1, and the liquid in the liquid container is uniformly sprayed on the contact area of the polishing pad 1 through the nozzle 5.

Alternatively, the other end of the infusion tube 6 communicates with the nozzle 5 on the moving arm 32.

The specific working process is as follows: the wafer 2 is placed on the polishing pad 1 for polishing, during the polishing process, impurities left on the surface of the polishing pad 1 after the wafer 2 is ground are removed by the dressing assembly 3, and during the movement of the dressing assembly 3, the liquid in the liquid container is uniformly sprayed on the dressing area of the polishing pad 1 by the nozzle 5, so that the wafer 2 is polished until the polishing process of the wafer 2 is completed.

It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications can be made without departing from the scope of the invention.

Claims

1. A chemical mechanical planarization device is characterized by comprising a base (4), wherein a liquid spraying assembly and a trimming assembly (3) are movably arranged on the base (4), the liquid spraying assembly moves along with the trimming assembly (3), the liquid spraying assembly is provided with at least one liquid outlet, and liquid sprayed out of the liquid outlet is uniformly distributed on a trimming area of a polishing pad (1).

2. The chemical mechanical planarization apparatus of claim 1, wherein the liquid spray assembly is disposed on the conditioning assembly (3).

3. The chemical mechanical planarization apparatus of claim 2, wherein the liquid spray assembly comprises a nozzle (5), the end of the nozzle (5) is the liquid outlet, the trim assembly (3) comprises a trim end (31), and the nozzle (5) and the trim end (31) are arranged in parallel.

4. The chemical mechanical planarization apparatus of claim 3, wherein said conditioning assembly (3) further comprises a moving arm (32) connecting said conditioning end (31) with said housing (4), said nozzle (5) being provided on said moving arm (32).

5. Chemical mechanical planarization apparatus according to claim 4, characterized in that at least one of said nozzles (5) is arranged spaced apart on said moving arm (32).

6. The chemical mechanical planarization apparatus of claim 3, wherein said finishing end (31) is provided with a mounting portion on which said nozzle (5) is provided.

7. The chemical mechanical planarization apparatus of claim 6, wherein the mounting portion is located on a side of the conditioning end (31) away from the moving arm (32).

8. The chemical mechanical planarization apparatus of claim 6, wherein said mounting portions are evenly disposed around the periphery of said trim end (31), and said nozzles (5) are evenly disposed at least two around the periphery of said trim end (31).

9. The chemical mechanical planarization apparatus of any one of claims 1-8, wherein said liquid spray assembly further comprises a liquid delivery tube (6), said liquid delivery tube (6) being disposed inside said conditioning assembly (3).