CN216449688U

CN216449688U - Probe structure for PCB flying probe testing machine

Info

Publication number: CN216449688U
Application number: CN202122926966.6U
Authority: CN
Inventors: 钱江辉; 曾锋; 刘早兰
Original assignee: China Brilliant Electronic Co ltd
Current assignee: China Brilliant Electronic Co ltd
Priority date: 2021-11-25
Filing date: 2021-11-25
Publication date: 2022-05-06
Anticipated expiration: 2031-11-25

Abstract

The utility model discloses a probe structure for a PCB flying probe tester, which comprises: the test device comprises a test chip, a probe seat, a mounting seat, a fixed probe and a movable probe, wherein the test chip and the mounting seat are respectively arranged on two sides of the probe seat; the activity of activity probe sets up in the inslot that is located the mount pad, and is located fixed probe one side, and activity probe top is connected with presses the pressing sheet, press the pressing sheet to be located the top of mount pad, be provided with the bellying on the activity probe. According to the utility model, two groups of probes with different thicknesses are arranged at the same time, the test probes are quickly changed in a pressing manner, and the thickness of the probes can be quickly adjusted according to the batch size of the PCB, so that the probes can be better contacted with pins, the accuracy of flying pins is improved, and the adjustment is simple and quick.

Description

Probe structure for PCB flying probe testing machine

Technical Field

The utility model relates to the technical field related to PCB processing, in particular to a probe structure for a PCB flying probe tester.

Background

The flying probe machine is an instrument for testing a PCB (printed circuit board) with high element arrangement density, multiple layers, large wiring density and small measuring point distance, mainly tests the insulation and conduction values of the PCB, and has the characteristics of fine pitch, no limitation of grids, flexible test, high speed and the like.

The probe is a flat long sheet structure, and the end part of the probe is in sharp point contact with the pin. The sizes of the pins on the PCB boards with different sizes are often inconsistent, and the sharp points with the same width can often have the problem that the pins with different sizes exceed the width of the pins and are contacted with other pins, so that the PCB boards with different batches and sizes need to be replaced by different probe seats, wherein the problems of the disassembly and the assembly of the probe seats and the connection of circuits are involved, and more time is delayed.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a probe structure for a PCB flying probe tester, which aims to solve the problems in the background technology.

In order to achieve the purpose, the utility model provides the following technical scheme:

a probe structure for PCB flying probe tester includes: the test device comprises a test chip, a probe seat, a mounting seat, a fixed probe and a movable probe, wherein the test chip and the mounting seat are respectively arranged on two sides of the probe seat, the fixed probe is fixedly connected with the mounting seat, the movable probe is movably connected with the mounting seat, and the thickness of the fixed probe is greater than that of the movable probe; the movable probe is movably arranged in a groove in the mounting seat and located on one side of the fixed probe, the top end of the movable probe is connected with a pressing sheet, the pressing sheet is located above the mounting seat, and a protruding portion is arranged on the movable probe.

As a further scheme of the utility model: an end cover is installed on one side of the installation seat, and two positioning bulges are arranged on the inner side of the end cover.

As a further scheme of the utility model: the protruding part is provided with a positioning groove correspondingly matched with the positioning protrusion.

As a further scheme of the utility model: the bottom end of the movable probe is connected with a bending part, and the bending part inclines towards one side of the fixed probe.

As a further scheme of the utility model: the inside fretwork groove that is provided with of pressing plate, the fretwork inslot is provided with the pressure spring.

As a further scheme of the utility model: the connecting part of the bending part and the movable probe is provided with a thin-wall part.

As a further scheme of the utility model: the fixed probe and the movable probe are respectively connected with the test chip.

Compared with the prior art, the utility model has the beneficial effects that: according to the utility model, two groups of probes with different thicknesses are arranged at the same time, the test probes are quickly changed in a pressing mode, and the thickness of the probes can be quickly adjusted according to the batch size of the PCB, so that the probes can be better contacted with pins, the accuracy of flying pins is improved, and the adjustment is simple and quick.

Drawings

FIG. 1 is a schematic structural diagram of the present invention.

Fig. 2 is a schematic structural view of the mounting base of the present invention.

Fig. 3 is an enlarged structural view at a in fig. 2.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1 and 2, in an embodiment of the present invention, a probe structure for a PCB flying probe tester includes: the probe comprises a test chip 1, a probe seat 2, a mounting seat 3, a fixed probe 4 and a movable probe 5, wherein the test chip 1 and the mounting seat 3 are respectively arranged at two sides of the probe seat 2, the fixed probe 4 and the movable probe 5 are both arranged on the mounting seat 3 and are respectively connected with the test chip 1, the fixed probe 4 is fixedly connected with the mounting seat 3, the movable probe 5 is movably connected with the mounting seat 3, specifically, the movable probe 5 is movably arranged in a groove in the mounting seat 3 and is positioned at one side of the fixed probe 4, the top end of the movable probe 5 is connected with a pressing sheet 51, the pressing sheet 51 is positioned above the mounting seat 3, a hollow groove 511 is arranged in the pressing sheet 51, and a pressure spring is arranged in the hollow groove 511; the movable probe 5 is provided with a protruding portion 52, the protruding portion 52 is provided with a positioning groove 521, the end cover 31 is installed on one side of the installation base 3, the inner side of the end cover 31 is provided with two positioning protrusions 311, the bottom end of the movable probe 5 is connected with a bending portion 53, and the bending portion 53 inclines towards one side of the fixed probe 4 relatively.

The thickness of the fixed probe 4 is larger than that of the movable probe 3, so that the width of a sharp point at the bottom end of the fixed probe 4 is larger than that of the movable probe 3, when the fixed probe 4 is used, the sharp point of the movable probe 5 is positioned above the fixed probe 4, and when the fixed probe 4 is used for testing, the fixed probe 4 is contacted with a pin of a PCB (printed circuit board); when a PCB with a smaller size needs to be tested, the pressing sheet 51 is pressed to press the movable probe 5 downwards, on one hand, the movable probe 5 moves downwards, on the other hand, the boss 52 is contacted with the positioning boss 311 to enable the movable probe 5 to approach the fixed probe 4, after the positioning boss 311 at the lower part is matched with the positioning groove 521, the position of the movable probe 5 is fixed, and the pointed point of the movable probe 5 is positioned under the fixed probe 4, at the moment, the movable probe 5 is contacted with a pin during testing, so that the PCB is suitable for testing the pin with a smaller width. Similarly, when the fixed probe 4 is used, the pressing piece 51 may be lifted up.

As shown in fig. 3, a thin portion 54 is disposed at a connection position of the bending portion 53 and the movable probe 5, the thin portion 54 has a certain elasticity, and the bending portion 53 can buffer the golden finger by using a certain elasticity when pressing the golden finger, so as to prevent the sharp point with a smaller width from damaging the golden finger under a larger pressure.

It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.

Claims

1. A probe structure for PCB flying probe tester includes: test chip (1), probe seat (2), mount pad (3), fixed probe (4) and activity probe (5), test chip (1) and mount pad (3) set up respectively in the both sides of probe seat (2), its characterized in that: the fixed probe (4) is fixedly connected with the mounting seat (3), the movable probe (5) is movably connected with the mounting seat (3), and the thickness of the fixed probe (4) is larger than that of the movable probe (5); the movable probe (5) is movably arranged in a groove in the mounting seat (3) and located on one side of the fixed probe (4), the top end of the movable probe (5) is connected with a pressing sheet (51), the pressing sheet (51) is located above the mounting seat (3), and a protruding portion (52) is arranged on the movable probe (5).

2. The probe structure for PCB flying probe tester as claimed in claim 1, wherein: an end cover (31) is installed on one side of the installation seat (3), and two positioning protrusions (311) are arranged on the inner side of the end cover (31).

3. The probe structure for PCB flying probe tester as claimed in claim 2, wherein: the protruding part (52) is provided with a positioning groove (521) correspondingly matched with the positioning protrusion (311).

4. The probe structure for PCB flying probe tester as claimed in claim 1, wherein: the bottom end of the movable probe (5) is connected with a bending part (53), and the bending part (53) is inclined relatively to one side of the fixed probe (4).

5. The probe structure for PCB flying probe tester as claimed in claim 1, wherein: a hollow groove (511) is formed in the pressing sheet (51), and a pressure spring is arranged in the hollow groove (511).

6. The probe structure for PCB flying probe tester as claimed in claim 4, wherein: the connecting part of the bending part (53) and the movable probe (5) is provided with a thin part (54).

7. The probe structure for PCB flying probe tester as claimed in claim 1, wherein: the fixed probe (4) and the movable probe (5) are respectively connected with the test chip (1).