CN215728394U

CN215728394U - Current test circuit of camera module

Info

Publication number: CN215728394U
Application number: CN202121457066.5U
Authority: CN
Inventors: 杨金彪
Original assignee: Sunwin Hubei Optoelectronic Technology Co Ltd
Current assignee: Sunwin Hubei Optoelectronic Technology Co Ltd
Priority date: 2021-06-29
Filing date: 2021-06-29
Publication date: 2022-02-01
Anticipated expiration: 2031-06-29

Abstract

The utility model provides a current test circuit of a camera module, which comprises a main control chip, a connector CN1 for connecting the camera module to be tested and a functional chip for current test, wherein a power supply pin of the connector CN1 is connected with a test resistor in series, two ends of the test resistor are connected to a monitoring pin of the functional chip, a capacitor is connected to the test resistor in parallel, and the functional chip is electrically connected with the main control chip through a communication port. In the utility model, the main control chip and the functional chip for current testing are communicated through I2C, and compared with the oscilloscope test, the current testing circuit provided by the utility model has the advantages of low cost, high speed and simple operation. The current test circuit provided by the utility model can quickly test the current data of the pin of the camera module, and records the data at the computer end through the serial port communication between the main control chip and the computer, so that the current test circuit is simple and convenient to operate, low in price and capable of being used for large-scale batch test.

Description

Current test circuit of camera module

Technical Field

The utility model relates to the field of camera module testing, in particular to a current data testing device for quickly and automatically testing a power supply pin of a camera module, which is used for electrical property analysis of the camera module, and particularly relates to a current testing circuit of the camera module.

Background

In the field of camera module testing, current data of a camera module is required to be collected frequently, the traditional method is to lead out a power supply pin of the camera module through a flying wire, test data by means of an oscilloscope with a high price, and finally record the data manually, so that the operation is complex, the efficiency is low, and batch or large-scale testing is inconvenient.

Therefore, it is necessary to design a current test circuit of a camera module, which can simply and rapidly test the current data of the pins of the camera module to solve the above problems.

SUMMERY OF THE UTILITY MODEL

The utility model aims to overcome the defects of the prior art and provides a current test circuit of a camera module so as to realize automatic and rapid test of current data of the camera module and at least solve part of problems in the prior art.

The utility model is realized by the following steps:

the utility model provides a current test circuit of a camera module, which comprises a main control chip, a connector CN1 for connecting the camera module to be tested and a functional chip for current test, wherein a power supply pin of the connector CN1 is connected with a test resistor in series, two ends of the test resistor are connected to a monitoring pin of the functional chip, a capacitor is connected to the test resistor in parallel, and the functional chip is electrically connected with the main control chip through a communication port.

Preferably, the master control chip is a CY8C3866AXI-040 chip.

Preferably, the functional chip is an INA226 chip.

Preferably, the main control chip is electrically connected with the function chip through an I2C communication port.

Preferably, the test resistance is 0.75 Ω, and the capacitance is 0.1 u.

Preferably, the power pins of the connector CN1 include a DOVDD _ IN pin, a DVDD _ IN pin, an AFVCC _ IN pin, and an AVDD _ IN pin.

Preferably, the main control chip is connected with the upper computer through serial port communication.

The utility model has the following beneficial effects:

1. in the utility model, the main control chip and the functional chip for current testing are communicated through I2C, and the I2C communication address is flexible and variable, thereby avoiding address conflict with other devices, and further realizing the simultaneous testing of each current pin.

2. In the utility model, the functional chip for current test can quickly test the current data of all the power supply pins only by receiving the test instruction of the main control chip.

3. Compared with oscilloscope test, the current test circuit provided by the utility model has the advantages of low cost, high speed and simple operation.

4. The current test circuit provided by the utility model can quickly test the current data of the pin of the camera module, and records the data at the computer end through the serial port communication between the main control chip and the computer, so that the current test circuit is simple and convenient to operate, low in price and capable of being used for large-scale batch test.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

Fig. 1 is a connector circuit for connecting a camera module to be tested according to an embodiment of the present invention;

FIG. 2 is a circuit diagram of a chip connection between the power pin DOVDD _ IN and the INA226 according to an embodiment of the present invention;

FIG. 3 is a circuit diagram of a chip connection between a power pin DVDD _ IN and an INA226 according to an embodiment of the present invention;

FIG. 4 is a circuit diagram of a chip connection between the AFVCC _ IN power pin and the INA226 according to an embodiment of the present invention;

FIG. 5 is a circuit diagram of a power pin AVDD _ IN and INA226 chip connection circuit according to an embodiment of the present invention;

fig. 6 is a circuit diagram of a main control portion according to an embodiment of the present invention;

FIG. 7 is a partial enlarged view of the first section of FIG. 6 according to an embodiment of the present invention;

FIG. 8 is a second enlarged view of the portion of FIG. 6 according to an embodiment of the present invention;

FIG. 9 is a third enlarged view of the portion of FIG. 6 according to an embodiment of the present invention;

fig. 10 is a fourth enlarged view of the portion in fig. 6 according to the embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1 to 10, an embodiment of the present invention provides a current test circuit for a camera module, including a main control chip communicating with a serial port of an upper computer (PC), a connector CN1 for connecting the camera module to be tested, and a functional chip for current testing, the master control chip is a CY8C3866AXI-040 chip, the functional chip is an INA226 chip, the connector CN1 is plugged with the camera module, the power pin of the connector CN1 is electrically connected with the main control chip through the functional chip, specifically, the power supply pin of the connector CN1 is connected IN series with a test resistor of 0.75 Ω, the two ends of the test resistor are connected to the monitor pins (IN + pin and IN-pin of the INA226 chip) of the functional chip, and the test resistor is connected with a 0.1u capacitor in parallel, and the functional chip is electrically connected with the main control chip through a communication port. The power supply pins of the connector CN1 comprise a DOVDD _ IN pin, a DVDD _ IN pin, an AFVCC _ IN pin and an AVDD _ IN pin.

In the utility model, the functional chip for current test can quickly test the current data of all the power supply pins only by receiving the test instruction of the main control chip. Compared with oscilloscope test, the current test circuit provided by the utility model has the advantages of low cost, high speed and simple operation.

In this embodiment, the main control chip and the function chip are electrically connected through an I2C communication port, the SDA pin of the INA226 chip is connected to the CX3_ SDA pin of the CY8C3866AXI-040 chip, and the SCL pin of the INA226 chip is connected to the CX3_ SCL pin of the CY8C3866AXI-040 chip, as shown in fig. 5-6 and 8.

In the utility model, the main control chip and the functional chip for current testing are communicated through I2C, and the I2C communication address is flexible and variable, thereby avoiding address conflict with other devices, and further realizing the simultaneous testing of each current pin.

The conventional camera module power pin mainly comprises four paths of AVDD, DVDD, DOVDD and AFVCC. The utility model takes CY8C3866AXI-040 chip of the Seplacian as a main control chip, takes I2C communication as a main communication mode, and takes an INA226 chip as a functional chip for current test. When a test instruction of the main control chip is received, the INA226 chip acquires data accessed to the corresponding power supply pin, the CY8C3866AXI-040 chip calculates corresponding current according to the corresponding data, the corresponding current is transmitted to a computer, and then the current data of the power supply pin can be stored.

Taking the AVDD _ IN pin as an example, the process of testing the current data of the power supply pin is described as follows:

1. the camera module to be tested is plugged IN the universal connector CN1, and the power supply pin AVDD of the camera module is plugged IN the AVDD _ IN pin of the connector CN 1;

2. the circuit connects AVDD _ IN pin to be tested IN series with 0.75 Ω resistor, and connects two ends (AVDP, AVDN) of the resistor to the monitor pins (IN +, IN-) of INA226 chip, as shown IN FIG. 5;

3. when the INA226 chip of the circuit receives a test instruction communicated by the CY8C3866AXI-040 chip I2C, the INA226 chip formally detects data and transmits the data to the main control chip, and the main control chip analyzes and processes the data to obtain current data;

4. the obtained current data are transmitted to the PC through serial port communication, and the PC stores the data.

The testing process of the DOVDD _ IN pin, the DVDD _ IN pin and the AFVCC _ IN pin is the same as that of the AVDD _ IN pin, and is not described herein again.

The current test circuit provided by the utility model can quickly test the current data of the pin of the camera module, and records the data at the computer end through the serial port communication between the main control chip and the computer, so that the current test circuit is simple and convenient to operate, low in price and capable of being used for large-scale batch test.

The current data tested are as follows:

the above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the utility model, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims

1. The utility model provides a current test circuit of module of making a video recording which characterized in that: including main control chip, be used for connecting the connector CN1 of the module of making a video recording that awaits measuring, be used for the functional chip of current test, connector CN 1's power pin and test resistance are established ties, test resistance's both ends are connected to on the control pin of functional chip, a parallelly connected electric capacity on the test resistance, functional chip with through the communication port electricity between the main control chip is connected.

2. The current test circuit of a camera module of claim 1, wherein: the master control chip is a CY8C3866AXI-040 chip.

3. The current test circuit of a camera module of claim 1, wherein: the functional chip is an INA226 chip.

4. The current test circuit of a camera module of claim 1, wherein: the main control chip is electrically connected with the functional chip through an I2C communication port.

5. The current test circuit of a camera module of claim 1, wherein: the test resistance is 0.75 Ω, and the capacitance is 0.1 u.

6. The current test circuit of a camera module of claim 1, wherein: the power supply pins of the connector CN1 comprise a DOVDD _ IN pin, a DVDD _ IN pin, an AFVCC _ IN pin and an AVDD _ IN pin.

7. The current test circuit of a camera module of claim 1, wherein: the main control chip is connected with the upper computer through serial port communication.