CN215378932U - Electric alarm test system for optical transceiver driving chip - Google Patents
Electric alarm test system for optical transceiver driving chip Download PDFInfo
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- CN215378932U CN215378932U CN202121929035.5U CN202121929035U CN215378932U CN 215378932 U CN215378932 U CN 215378932U CN 202121929035 U CN202121929035 U CN 202121929035U CN 215378932 U CN215378932 U CN 215378932U
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- 238000004891 communication Methods 0.000 claims abstract description 26
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- 238000001514 detection method Methods 0.000 description 3
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- 230000002238 attenuated effect Effects 0.000 description 2
- 238000010295 mobile communication Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
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Abstract
The utility model discloses an electric alarm test system of an optical transceiving driving chip, which comprises an upper computer, an error code meter, a program-controlled electric attenuator, the optical transceiving driving chip and an IIC communication module, wherein the error code meter at least comprises an analog signal output port which is electrically connected with the input end of the program-controlled electric attenuator through the analog signal output port, the program-controlled electric attenuator at least comprises an adjustable output port which is electrically connected with the input end of the optical transceiving driving chip through the adjustable output port, and the IIC communication module is electrically connected with a digital communication interface of the optical transceiving driving chip. According to the utility model, through setting up the test environment once, the test requirement of complicated electric alarm function of the optical transceiving driving chip can be realized, and the manpower consumption and the loss of test equipment are reduced.
Description
Technical Field
The utility model relates to the field of optical transceiver chip testing, in particular to an electrical alarm testing system of an optical transceiver driving chip.
Background
The 5G as the fifth generation mobile communication network has the advantages of high speed, low delay and large bandwidth, and the development of communication chips in the mobile communication, wireless Internet and wireless data transmission industries and the large trend of three-network integration, especially the communication chip supporting 5G, will become the largest application market in the global semiconductor chip industry.
The lack of domestic optical chips becomes a key for restricting the development of the communication optoelectronic device industry, and particularly, the development capability and the testing capability of the high-end communication chips are relatively deficient. The optical communication chip has complex functions, a plurality of test items and frequent test conditions and indexes which challenge the limit of equipment.
In the aspect of testing the alarm function of the optical transceiving driving chip, the mode of combining the output of the error code meter with a fixed type electrical attenuator is adopted for testing at present, the mode needs an operator to install a fixed electrical attenuator with a larger attenuation multiplying factor in advance, then the output amplitude of the error code meter is modified, whether the alarm can be simultaneously met under the current fixed electrical attenuator is confirmed, if the alarm cannot be met, the fixed electrical attenuator with the other multiplying factor needs to be replaced again, if the alarm can be met, the operator needs to manually and finely adjust the output amplitude of the error code meter from large to small, and simultaneously, the alarm state bit information of the optical transceiving driving chip is manually read so as to judge whether the chip alarms at the moment, and if the chip alarms do not exist, the output amplitude of the error code meter is continuously adjusted to be small until the alarm appears; the alarm-solving test is to increase the output amplitude of the error code meter from the alarm value until the alarm is solved.
The testing method needs to frequently replace the fixed electric attenuator, is very easy to cause the damage of an instrument interface and a testing cable, manually adjusts the output of the error code instrument, and has low efficiency and higher misoperation probability.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the defects in the prior art and provides an electric alarm test system of an optical transceiver driving chip.
In order to achieve the purpose, the utility model adopts the following technical scheme: an electric alarm test system of an optical transceiving driving chip comprises an upper computer, an error code meter, a program-controlled electric attenuator, an optical transceiving driving chip and an IIC communication module;
the error code instrument at least comprises an analog signal output port and is electrically connected with the input end of the program-controlled electrical attenuator through the analog signal output port;
the program control electric attenuator at least comprises an adjustable output port and is electrically connected with the input end of the optical transceiving driving chip through the adjustable output port;
the IIC communication module is electrically connected with the digital communication interface of the optical transceiving driving chip.
As a further description of the above technical solution:
the programmable electric attenuator is selected from a type capable of adjusting attenuation multiplying power.
As a further description of the above technical solution:
the error code meter is provided with one of an RJ45 interface, a GPIB interface or a USB interface and is electrically connected with an upper computer through the interface.
As a further description of the above technical solution:
the program control electric attenuator is provided with one of an RJ45 interface, a GPIB interface or a USB interface and is electrically connected with an upper computer through the interface.
As a further description of the above technical solution:
the IIC communication module is provided with one of an RJ45 interface, a GPIB interface or a USB interface and is electrically connected with an upper computer through the interface.
As a further description of the above technical solution:
the upper computer is provided with an RJ45 interface, a GPIB interface or a USB interface.
The utility model has the following beneficial effects:
1. according to the utility model, the complicated test requirements of the optical transceiver driving chip can be realized by setting up the test environment at one time, and compared with the existing test mode, the manpower consumption and the loss of test equipment can be reduced.
2. The utility model can realize automatic test of the light receiving and transmitting driving chip, improve the test efficiency and avoid the generation of artificial test errors.
Drawings
FIG. 1 is a schematic diagram of a hardware connection of an electrical alarm testing system of an optical transceiver driver chip according to the present invention;
FIG. 2 is a front stage of a testing process of an electrical alarm testing system of an optical transceiver driver chip according to the present invention;
FIG. 3 is a middle stage of a testing process of an electrical alarm testing system of an optical transceiver driver chip according to the present invention;
fig. 4 is a later stage of a testing process of the electrical alarm testing system of the optical transceiver driver chip according to the present invention.
Illustration of the drawings: the flow lines at a in fig. 2 point to the flow lines at a in fig. 3, and the flow lines at B in fig. 3 point to the flow lines at B in fig. 4.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance, and furthermore, unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 1, the present invention provides an embodiment: an electrical alarm test system for an optical transceiving driving chip comprises an upper computer, an error code meter, a program-controlled electrical attenuator, an optical transceiving driving chip and an IIC communication module, wherein the IIC communication module is generally written as an I2C communication module and is a common simple and bidirectional two-wire system synchronous serial bus, the upper computer is used for receiving and transmitting information and controlling the actions of the error code meter and the program-controlled electrical attenuator, and reading and setting alarm related parameters on the transceiving driving chip through the IIC communication module, the error code meter is used for generating test signals, meanwhile, selectable code patterns are PRBS7/15/23/31 and 1010, the signal rate is 125M-12.5G Bit, the signal output amplitude is 250 mV-2.5V, and the selected program-controlled electrical attenuator can adjust the attenuation rate, the bandwidth of the attenuator is more than 26.5GHz, the attenuation rate is 0-40dB, and the increment and adjustment of 10dB are supported.
The error code meter at least comprises an analog signal output port and is electrically connected with the input end of the program-controlled electric attenuator through the analog signal output port, the program-controlled electric attenuator at least comprises an adjustable output port and is electrically connected with the input end of the optical transceiving driving chip through the adjustable output port, and the IIC communication module is electrically connected with the digital communication interface of the optical transceiving driving chip.
The code error meter is provided with one of an RJ45 interface, a GPIB interface or a USB interface and is electrically connected with an upper computer through the interface, the program-controlled electrical attenuator is provided with one of an RJ45 interface, a GPIB interface or a USB interface and is electrically connected with the upper computer through the interface, and the IIC communication module is provided with one of an RJ45 interface, a GPIB interface or a USB interface and is electrically connected with the upper computer through the interface.
The optical transceiver driving chip is provided with an alarm circuit for testing, and the upper computer can read and write a register in the optical transceiver driving chip through the IIC communication module and set an alarm threshold and an output polarity.
The upper computer is provided with an RJ45 interface, a GPIB interface or a USB interface, and is provided with a display screen, a keyboard, a mouse and other peripherals, when the test is carried out, Labview control software is adopted by the upper computer as a control program for the test, and related test steps can be programmed and preset on the Labview, so that the automatic test of the optical transceiver driving chip is realized.
The test flow comprises the following steps: as shown in fig. 2-4, a testing environment is set up through the above, the working state of the alarm detection circuit in the optical transceiver driver chip is set through the IIC communication module, including alarm output polarity, alarm threshold, etc., meanwhile, software controls the analog signal of the output rate of the error code meter through the instruction, sets the output amplitude of the error code meter as the maximum allowable output amplitude of the device, the analog signal is connected to the input end of the program-controlled electrical attenuator through a high-speed cable, the program-controlled electrical attenuator sets the attenuation multiple according to the instruction of the Labview software, outputs the attenuated analog signal, the attenuated analog signal is switched to the alarm detection circuit input port of the tested transceiver driver chip through the cable and the PCB line, the alarm detection circuit judges whether the amplitude of the input signal exceeds the alarm threshold according to the preset register setting, and stores the judgment result in the alarm state register of the chip, labview control software reads the alarm state bit register information of the tested light transceiving driving chip through the IIC communication module, displays the alarm state of the tested light transceiving driving chip, compares the alarm state with the test condition, reduces the output amplitude of the error code meter if the alarm is not given, and then continues to read the alarm state bit information of the tested light transceiving driving chip until the alarm is given;
the alarm-solving test process is similar, firstly, the output amplitude of the error code meter is set as the output value obtained by the alarm test, the alarm state bit register information of the tested light transceiving driving chip is read, the alarm-solving state of the tested light transceiving driving chip is displayed, the test conditions are compared, if the alarm is not solved, the output amplitude of the error code meter is increased, and then the alarm state bit information of the tested light transceiving driving chip is continuously read until the alarm is solved.
The testing process can be programmed and preset by adopting Labview software, the program can be directly called when testing is carried out, the automatic testing of the optical transceiving driving chip can be realized, the testing environment is built at one time, and compared with the existing testing mode, the testing method can reduce the manpower consumption and the loss of cables and interfaces.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments or portions thereof without departing from the spirit and scope of the utility model.
Claims (6)
1. An electric alarm test system of an optical transceiving driving chip is characterized by comprising an upper computer, an error code meter, a program-controlled electric attenuator, the optical transceiving driving chip and an IIC communication module;
the error code instrument at least comprises an analog signal output port and is electrically connected with the input end of the program-controlled electrical attenuator through the analog signal output port;
the program control electric attenuator at least comprises an adjustable output port and is electrically connected with the input end of the optical transceiving driving chip through the adjustable output port;
the IIC communication module is electrically connected with the digital communication interface of the optical transceiving driving chip.
2. The electrical alarm test system of the optical transceiver driver chip of claim 1, wherein: the programmable electric attenuator is selected from a type capable of adjusting attenuation multiplying power.
3. The electrical alarm test system of the optical transceiver driver chip of claim 1, wherein: the error code meter is provided with one of an RJ45 interface, a GPIB interface or a USB interface and is electrically connected with an upper computer through the interface.
4. The electrical alarm test system of the optical transceiver driver chip of claim 1, wherein: the program control electric attenuator is provided with one of an RJ45 interface, a GPIB interface or a USB interface and is electrically connected with an upper computer through the interface.
5. The electrical alarm test system of the optical transceiver driver chip of claim 1, wherein: the IIC communication module is provided with one of an RJ45 interface, a GPIB interface or a USB interface and is electrically connected with an upper computer through the interface.
6. The electrical alarm test system of the optical transceiver driver chip of claim 1, wherein: the upper computer is provided with an RJ45 interface, a GPIB interface or a USB interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121929035.5U CN215378932U (en) | 2021-08-17 | 2021-08-17 | Electric alarm test system for optical transceiver driving chip |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121929035.5U CN215378932U (en) | 2021-08-17 | 2021-08-17 | Electric alarm test system for optical transceiver driving chip |
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| CN215378932U true CN215378932U (en) | 2021-12-31 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118473515A (en) * | 2024-07-15 | 2024-08-09 | 厦门优迅芯片股份有限公司 | Method for screening alarm and hysteresis consistency of optical transceiver chip |
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2021
- 2021-08-17 CN CN202121929035.5U patent/CN215378932U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118473515A (en) * | 2024-07-15 | 2024-08-09 | 厦门优迅芯片股份有限公司 | Method for screening alarm and hysteresis consistency of optical transceiver chip |
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Address after: 361008 402, No. 52, guanri Road, phase II, software park, Xiamen, Fujian Patentee after: Xiamen Youxun Chip Co.,Ltd. Country or region after: China Address before: 361008 402, No. 52, guanri Road, phase II, software park, Xiamen, Fujian Patentee before: XIAMEN UX HIGH-SPEED IC Co.,Ltd. Country or region before: China |
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