CN203519647U - Atomic force microscope under-liquid probe tip support applicable to acid-base environments - Google Patents
Atomic force microscope under-liquid probe tip support applicable to acid-base environments Download PDFInfo
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- CN203519647U CN203519647U CN201320639994.2U CN201320639994U CN203519647U CN 203519647 U CN203519647 U CN 203519647U CN 201320639994 U CN201320639994 U CN 201320639994U CN 203519647 U CN203519647 U CN 203519647U
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- probe
- static line
- atomic force
- shaft collar
- force microscope
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Abstract
An atomic force microscope under-liquid probe tip support applicable to acid-base environments is provided. A groove on the upper surface of a probe fixing disk is a rectangular groove. A probe fixing line and a transparent sheet are both made of corrosion-resistant materials. The lower surface of the probe fixing disk is provided with the elastic probe fixing line which transversely spans a boss. The atomic force microscope under-liquid probe tip support is specifically structured through the following manners that: the front end of the probe fixing line is inserted into a front through hole of the probe fixing disk; a pin that is inserted into the external end of the front through hole is tightly matched with an end portion of the probe fixing line; the back end of the probe fixing line is inserted into the inner end of a back through hole of the probe fixing disk, a spring and the inner cavity of a moving pin; and a pin that is inserted into the external end of the inner cavity of the moving pin is tightly matched with the other end portion of the probe fixing line. With the atomic force microscope under-liquid probe tip support adopted, an atomic force microscope can perform nanoscale morphology detection and related processing experiments in the acid-base environments; the probe fixing line can be disassembled and replaced, and therefore, the maintenance cost of the microscope is low; and the transparent sheet will not shift in a use process, and therefore, microscopic observation and analysis as well as correct processing results can be ensured.
Description
Technical field
The utility model relates to a kind of parts of atomic force microscope, relates in particular to the parts of the controlled atomic force microscope of a kind of environment.
Background technology
In contemporary science and technology field, people generally believe that the nanoscale science and technology rising in the world beginning of the nineties late 1980s is new science and technology geared to the 21st century.Atomic force microscope (Atomic Force Microscopy, AFM) is an important research tool and is bringing into play vital effect in nanosecond science and technology.Compare with traditional optical microscope, atomic force microscope have advantages of three outstanding: high resolving power (generally can reach nano-precision); Three-dimensional imaging ability and can directly carry out nanoscale processing to sample surfaces.
Yet, along with the development of nanosecond science and technology, atomic force microscope has been proposed to the controlled requirement of increasing environment, there is realizing vacuum temperature, humidity, the controlled atomic force microscope of various environment of the controllable environments such as liquid phase and Acidity of Aikalinity thereof.And the demand of acid or alkali environment has been increasingly sharpened, for example: simulating CMP (Chemical Mechanical Polishing) process by atomic force microscope, just to require liquid environment be acid or alkaline; Also the liquid environment that needs Acidity of Aikalinity when research corrosion environment affects the nanoprocessing of sample; In addition, the physicochemical property by all right researching DNA of atomic force microscope under liquid phase environment, under acid or alkali environment, the sex change of DNA research is an important content.The controlled atomic force microscope of vacuum environment and humidity environment is to realize by a vacuum cavity; Temperature is controlled and can be realized by the sample stage of controlled heating.The control of liquid phase and Acidity of Aikalinity thereof is mainly to support the use to realize by needle tip bracket under a liquid and a liquid pool.The major function of liquid pool is that contain fluid and sample are realized liquid environment, and under liquid, needle tip bracket plays the probe of clamping atomic force microscope and makes it to be together immersed under liquid environment, thereby realizes the interaction of probe and sample under liquid environment.
Needle tip bracket under existing liquid phase environment atomic force microscope liquid, its composition is: in the circular trough of the probe shaft collar of magnetic absorption on microscope probe ring flange, probe shaft collar upper surface, be embedded with adaptive glass sheet, three fixing pressure arms of probe shaft collar upper surface screw thread are pushed down glass sheet, there is boss at glass sheet lower surface middle part, this boss is arranged in the through hole of circular trough, probe shaft collar lower surface is fixed with the flexible probe static line across boss, by probe static line, probe is pressed solidly on boss.The problem existing is: 1, glass and probe static line are all not corrosion-resistant, are not suitable for having the soda acid liquid phase environment of obvious corrosive property; Thereby the circular glass sheet 2, being fixed in circular trough by pressure arm mode in use occurs to be offset to cause resetting to be forbidden to affect microexamination and analysis unavoidably; 3, probe static line is fixed on probe shaft collar, can not dismounting and change, and when damaging because of corrosion or other reasons, probe static line must change whole support, and working service cost is high.
Utility model content
The purpose of this utility model is to provide needle tip bracket under a kind of atomic force microscope liquid can be applicable in acid or alkali environment, this support can be operated under acid or alkali environment, thereby realize atomic force microscope, under acid or alkali environment, sample is carried out to the pattern detection of nanoscale and the machining experiment of being correlated with; And probe static line is detachably changed, microscopical working service cost is low; It is accurate that slide in use can not be offset resetting, guarantees that the result of microexamination and analysis is correct.
The utility model solves its goal of the invention, the technical scheme adopting is, needle tip bracket under a kind of atomic force microscope liquid can be applicable in acid or alkali environment, comprise the probe shaft collar of magnetic absorption on microscope probe ring flange, in the groove of probe shaft collar upper surface, be embedded with adaptive slide, the fixing pressure arm of probe shaft collar upper surface screw thread is pushed down slide, there is boss at slide lower surface middle part, this boss is arranged in the through hole of the groove of shaft collar, probe shaft collar lower surface is provided with the flexible probe static line across boss, probe static line presses solidly probe on boss, it is characterized in that:
The groove of described probe shaft collar upper surface is rectangular channel, and probe static line is that corrosion-resistant tension antifatigue material is made, and slide is that resistant material is made; Flexible its concrete structure of probe static line that probe shaft collar lower surface is provided with across boss is: the front end of probe static line inserts the front through hole of probe shaft collar, the front pin that insert the outer end of front through hole and the end wringing fit of probe static line; In the spring groove of the rear through hole of probe shaft collar, be provided with spring, the outside of rear through hole is inserted with removable pin, the rear end of probe static line penetrates the inner chamber of inside, spring and the removable pin of rear through hole successively, the rear pin that insert the inner chamber outer end of removable pin and the end wringing fit of probe static line.
Using method of the present utility model is:
, by the take probe of atomic force microscope of tweezers, inwardly press the removable pin at needle tip bracket rear portion in the probe of taking by needle tip bracket reverse side upward, removable pin Compress Spring inwardly puts in, so that upwards arch upward in probe static line middle part; Then between the probe static line that needle point is placed in to boss and arches upward, and make it directly over probe with tweezers control probe static line.After this removable pin that comes up, under the effect of spring, probe static line, slowly near boss, is fixed on transparent boss the probe of atomic force microscope.Again the liquid pool that fills liquid and lay sample is placed on the sample stage of probe ring flange endoporus below; And the upset of whole needle tip bracket is made to face up and be placed on the blue dish of sonde method and complete the Preparatory work of experiment under liquid environment.Finally, start atomic force microscope and can carry out pattern scanning or the nanoscale processing under controlled liquid phase environment to sample.
Compared with prior art, the beneficial effects of the utility model:
One, probe static line is that corrosion-resistant tension antifatigue material is made, slide is that resistant material is made, make the liquid environment of the controlled atomic force microscope of environment extend to the various solution acid-base condition from neutral solution, it is applied widely, can carry out sample topography scanning or nanoscale processing under acid or alkali environment.
Two, the groove of probe shaft collar upper surface is rectangular channel, be pressed in rectangle slide adaptive with it on rectangular channel can not deflect after repeatedly using, guarantee the positioning precision of the boss of slide after many experiments and upper installation probe thereof, guaranteed the correctness of microexamination, analysis and processing.
Three, after the wearing and tearing of probe static line, will split out with the friction tight pin in probe static line two ends, probe static line will be taken out through hole before and after probe shaft collar; Through hole, spring, removable pin reinsert pin and make static line two ends and pin wringing fit before and after newer probe static line being penetrated again, complete dismounting and the replacing of probe static line.Probe static line is detachably changed, and has reduced microscopical working service cost.
The rear threads of above-mentioned probe shaft collar is connected with two handles.
Like this, the installation and removal of more convenient probe shaft collar and probe ring flange.
Above-mentioned probe static line is molybdenum filament.
Molybdenum probe static line tensile strength is high and fatigue resistence is good, long service life.And its good corrosion resistance is not all corroded under the various acid or alkali environments of 0<pH<14.
Above-mentioned slide is organic glass sheet.
The good corrosion resistance of organic glass sheet is not all corroded under the various acid or alkali environments of 0<pH<14.
Below in conjunction with accompanying drawing and concrete embodiment, the utility model is described in further detail.
Accompanying drawing explanation
Fig. 1 is the plan structure schematic diagram of the utility model embodiment.
Fig. 2 is the A-A cross-sectional view of Fig. 1.
Fig. 3 is the structural representation of looking up of the utility model embodiment.
Embodiment
Embodiment
Fig. 1-3 illustrate, a kind of embodiment of the present utility model is, needle tip bracket under a kind of atomic force microscope liquid can be applicable in acid or alkali environment, comprise the probe shaft collar 1 of magnetic absorption on microscope probe ring flange, in the groove 1a of probe shaft collar 1 upper surface, be embedded with adaptive slide 2, the fixing pressure arm 3 of probe shaft collar 1 upper surface screw thread is pushed down slide 2, there is boss 2a at slide 2 lower surface middle parts, this boss 2a is arranged in the through hole 1b of the groove 1a of shaft collar 1, probe shaft collar 1 lower surface is provided with the flexible probe static line 4 across boss 2a, probe static line 4 presses solidly probe on boss 2a.
The groove 1a of described probe shaft collar 1 upper surface is rectangular channel, and probe static line 4 is made for corrosion-resistant tension antifatigue material, and slide 2 is made for resistant material; Flexible probe static line 4 its concrete structures that probe shaft collar 1 lower surface is provided with across boss 2a are: the front end of probe static line 4 inserts the front through hole of probe shaft collar 1, the front pin 8 that insert the outer end of front through hole and the end wringing fit of probe static line 4; In the spring groove of the rear through hole of probe shaft collar 1, be provided with spring 7, the outside of rear through hole is inserted with removable pin 6, the rear end of probe static line 4 penetrates the inner chamber of inside, spring and the removable pin 6 of rear through hole successively, the rear pin 9 that insert the inner chamber outer end of removable pin 6 and the end wringing fit of probe static line 4.
The rear threads of the probe shaft collar 1 that this is routine is connected with two handles 5, and probe static line 4 is molybdenum filament, and slide 2 is organic glass sheet.
Claims (4)
1. needle tip bracket under the atomic force microscope liquid can be applicable in acid or alkali environment, comprise the probe shaft collar (1) of magnetic absorption on microscope probe ring flange, in the groove (1a) of probe shaft collar (1) upper surface, be embedded with adaptive slide (2), the fixing pressure arm (3) of probe shaft collar (1) upper surface screw thread is pushed down slide (2), there is boss (2a) at slide (2) lower surface middle part, this boss (2a) is arranged in the through hole (1b) of the groove (1a) of shaft collar (1), probe shaft collar (1) lower surface is provided with the flexible probe static line (4) across boss (2a), probe static line (4) presses solidly probe on boss (2a), it is characterized in that:
The groove (1a) of described probe shaft collar (1) upper surface is rectangular channel, and probe static line (4) is made for corrosion-resistant tension antifatigue material, and slide (2) is made for resistant material; Its concrete structure of flexible probe static line (4) that probe shaft collar (1) lower surface is provided with across boss (2a) is: the front end of probe static line (4) inserts the front through hole of probe shaft collar (1), the front pin (8) that insert the outer end of front through hole and the end wringing fit of probe static line (4); In the spring groove of the rear through hole of probe shaft collar (1), be provided with spring (7), the outside of rear through hole is inserted with removable pin (6), the rear end of probe static line (4) penetrates the inner chamber of inside, spring and the removable pin (6) of rear through hole successively, the rear pin (9) that insert the inner chamber outer end of removable pin (6) and the end wringing fit of probe static line (4).
2. needle tip bracket under a kind of atomic force microscope liquid can be applicable in acid or alkali environment according to claim 1, is characterized in that: the rear threads of described probe shaft collar (1) is connected with two handles (5).
3. needle tip bracket under a kind of atomic force microscope liquid can be applicable in acid or alkali environment according to claim 1, is characterized in that: described probe static line (4) is molybdenum filament.
4. needle tip bracket under a kind of atomic force microscope liquid can be applicable in acid or alkali environment according to claim 1, is characterized in that: described slide (2) is organic glass sheet.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320639994.2U CN203519647U (en) | 2013-10-16 | 2013-10-16 | Atomic force microscope under-liquid probe tip support applicable to acid-base environments |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320639994.2U CN203519647U (en) | 2013-10-16 | 2013-10-16 | Atomic force microscope under-liquid probe tip support applicable to acid-base environments |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203519647U true CN203519647U (en) | 2014-04-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320639994.2U Withdrawn - After Issue CN203519647U (en) | 2013-10-16 | 2013-10-16 | Atomic force microscope under-liquid probe tip support applicable to acid-base environments |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203519647U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103529245A (en) * | 2013-10-16 | 2014-01-22 | 西南交通大学 | Atomic force microscope under-water needle tip bracket applicable to acid/alkali environment |
| CN104155479A (en) * | 2014-07-15 | 2014-11-19 | 大连理工大学 | Probe frame for modular scanning probe microscope |
-
2013
- 2013-10-16 CN CN201320639994.2U patent/CN203519647U/en not_active Withdrawn - After Issue
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103529245A (en) * | 2013-10-16 | 2014-01-22 | 西南交通大学 | Atomic force microscope under-water needle tip bracket applicable to acid/alkali environment |
| CN103529245B (en) * | 2013-10-16 | 2016-08-24 | 西南交通大学 | Needle tip bracket under a kind of AFM liquid that can be applicable in acid or alkali environment |
| CN104155479A (en) * | 2014-07-15 | 2014-11-19 | 大连理工大学 | Probe frame for modular scanning probe microscope |
| CN104155479B (en) * | 2014-07-15 | 2016-08-17 | 大连理工大学 | Modular scanning probe microscopy probe carriage |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20140402 Effective date of abandoning: 20160824 |
|
| C25 | Abandonment of patent right or utility model to avoid double patenting |