CN202710470U - Array type semiconductor laser unit near infrared spectroscopy analysis meter - Google Patents
Array type semiconductor laser unit near infrared spectroscopy analysis meter Download PDFInfo
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- CN202710470U CN202710470U CN 201220016403 CN201220016403U CN202710470U CN 202710470 U CN202710470 U CN 202710470U CN 201220016403 CN201220016403 CN 201220016403 CN 201220016403 U CN201220016403 U CN 201220016403U CN 202710470 U CN202710470 U CN 202710470U
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Abstract
The utility model discloses an array type semiconductor laser unit near infrared spectroscopy analysis meter and belongs to the technical field of near infrared nondestructive testing. The array type semiconductor laser unit near infrared spectroscopy analysis meter comprises a light source semiconductor laser unit, an integrating sphere, a sample cup, a microprocessor, a keyboard input and output display device and a computer data processing unit. The semiconductor laser unit is connected with the integrating sphere through optical fiber, and light of the semiconductor laser unit enters into the integrating sphere through the optical fiber. The integrating sphere comprises a light incidence hole arranged on the wall of the integrating sphere in an integration mode, a detector mouth and a sample cup mouth. The sample cup is connected with the integrating sphere through the sample cup mouth. The keyboard input and output display device is arranged on a shell of the analysis meter and is connected with the microprocessor. The computer data processing unit is connected with the microprocessor through a universal serial bus (USB) interface. A detector is arranged on the detector mouth placed on the outer circumference of the integrating sphere. Optical signal changes detected by the detector are connected with the microprocessor through a preposed amplifying circuit. The array type semiconductor laser unit near infrared spectroscopy analysis meter can achieve rapid testing of different composition.
Description
Technical field
The utility model belongs to the near infrared technical field of nondestructive testing, relates to a kind of novel semiconductor laser array near infrared spectrometer.
Background technology
Near-infrared spectrum analysis is as a kind of analytical approach rapidly and efficiently, can carry out fast, accurately quantitatively or qualitative analysis the various samples such as comprising from gas to transparent or muddy liquid, from homogenate to the powder, from the solid material to the biological tissue.Near-infrared spectrum analysis (NIR) is one of high-new analytical technology with the fastest developing speed over past ten years, its amount of samples is few and do not destroy sample, need not sample is carried out chemical treatment, and can carry out simultaneously quantitative test to the Multiple components in the sample in the short time at 1 ~ 2 minute the utmost point, have cost low, speed is fast, and precision is high, pollution-free, be convenient in real time, the advantages such as on-line analysis and control.
The near infrared detection technology all obtains fine application in fields such as agricultural, petrochemical industry, pharmacy, food, and obtains fabulous society and economic benefit.Composition detection such as the check of the bread basket in the agricultural product, dairy produce; The half-finished on-line monitoring of stages in the detection of finished product and the preparation process in the pharmaceuticals industry.In drug abuse test, near-infrared spectral analysis technology has been the differentiation means of the medicine true and false of a large-scale popularization.Near-infrared spectral analysis technology the quality of Chinese herb differentiate and preparation in analysis of effective component aspect application is also arranged.China abounds in tea, and the online detection of studying fast tea grades and tea product process with near-infrared spectral analysis technology all has been reported.In recent years, near-infrared spectrum analysis is used widely in petrochemical field, and is applied to gradually online process analysis procedure analysis.
Traditional near-infrared spectrometers kind is a lot, can be divided into set wave elongated and sweep type, the set wave elongated is divided into again optical filter type and LED type, the light that optical filter type near-infrared spectrometers adopts some interference filters that light source is launched carries out light splitting, as required wavelength rotatable lamella wheel is selected a suitable optical filter light path during measurement, the instrument volume very much not is convenient for carrying, the monochromatic bands of a spectrum of this analyser are wider, the wavelength resolution rate variance, power consumption is large, efficient light power is little, and the life-span is short.Light emitting diode (LED) type near-infrared spectrometers is to adopt LED as light source, produce different wavelength with different light emitting diodes, the spectral half-width of such near-infrared analyzer is excessive to be reached more than the 30nm, do not satisfy the selection requirement for accurate specific wavelength, still can adopt LED to add the mode of optical filter on some instrument in addition, the too small situation of effective luminous power be can occur equally, measuring accuracy and accuracy affected.Sweep type is divided into again grating type, Fourier-type, acousto-optic turnable filter type (AOTF type) and multi-channel type.What the grating type near-infrared analyzer adopted is grating beam splitting, so the restriction of slit makes its resolution and sensitivity lower, and strict to light path, and extraneous light intensity can affect test result, and sweep velocity is slow.The Fourier-type near-infrared analyzer can shake and deflection in scanning process because of with moving-member, causes the unstable of interference signal, and sensitivity descends.Acousto-optic turnable filter type (AOTF type) near-infrared analyzer uses the arrangement realization of alternating electric field control crystal to the light splitting of complex light, and the bands of a spectrum of light splitting are wider, and resolution is lower, and natural veiling glare can be influential.The principle of multi-channel type near-infrared analyzer is: the light that light source sends focuses on the fixed grating through behind the sample, and the light after the holographic grating dispersion is detected simultaneously by multichannel detector.Its shortcoming is that dynamic range is limited, and to responsive to temperature.
After early 1970s realized the room temperature, continuous-wave lasing of semiconductor laser, the new period of having started the semiconductor laser development.It has been irreplaceable important light source in optical-fibre communications, Fibre Optical Sensor, video disc recording storage, light interconnection, laser printing and printing, laser molecular spectroscopy and the solid state laser pumping at present, in addition, also be widely used at the aspects such as fundamental research of optical measurement, robot and automatically control, medical treatment, atom and molecular physics.It has been to need indispensable optical device in the optoelectronic device of high efficiency monochromatic light source.
The principle of work of semiconductor laser (LD) is, utilize semiconductor substance (both having utilized electronics) luminous in the energy interband transition, cleavage plane with semiconductor crystal forms two parallel reflective mirrors as catoptron, form resonator cavity, make the radiation of light generation, feedback, generation light amplify Output of laser.Compare with the laser instrument of other kinds, semiconductor laser has advantages of very outstanding, except the advantages such as volume is little, lightweight, conversion efficiency is high, power saving, the sharp radio frequency rate of semiconductor laser can be tuning in wider scope, swash and to penetrate power and frequency can make things convenient for, directly modulate efficiently, and modulation range is large.And LD spectrum is compared its half-breadth less than 2nm with LED spectrum, and limit film rejection ratio is greater than 30dB, and efficient light power is high.
Summary of the invention
In order to overcome the existing limitation of traditional near-infrared spectrometers, provide semiconductor laser array near infrared spectrometer.
Semiconductor laser array near infrared spectrometer, this instrument comprise light source semiconductor laser, integrating sphere, sample cup, microprocessor, keyboard input and device displaying result, computer data processing unit; Described semiconductor laser is connected with integrating sphere by optical fiber, and the light of semiconductor laser enters integrating sphere by optical fiber; Described integrating sphere comprises incident light hole, detector mouth and the sample cup entrance that is integrated on the integrating sphere wall, and sample cup is connected with integrating sphere by the sample cup entrance; The keyboard input places on the shell of instrument with device displaying result, links to each other with microprocessor.The computer data processing unit links to each other with microprocessor by USB interface; Establish detector on the detector mouth on the excircle of integrating sphere, the change in optical signal that detector is measured links to each other with microprocessor by pre-amplification circuit.
Wherein said semiconductor laser (LD) is semiconductor laser array, at first different semiconductor lasers (LD) array is arranged, and by optical fiber light is spread out of, then multiple beams of optical fiber is carried out outer coupling by coupling mechanism, and by an optical fiber output, by the incident light hole of integrating sphere, sample in the sample cell is shone.Can select different LD wave bands to encapsulate according to user's needs, to meet the different needs, can in the LD that has encapsulated, select as required in addition a combination to light to measure different sample compositions.
The sample cup entrance of wherein said integrating sphere has to make sample cup fixing groove and register pin; Light enters integrating sphere by incident light hole, and sample cup is inserted integrating sphere by the sample cup entrance, and the rotary sample cup is fixed its position until register pin enters flange circle groove.Irradiation constantly reflects at integrating sphere inwall and sample surfaces on sample cup, and sample fully absorbs light in the sample cup, puts into the light signal that detector will carry sample message in the detector hole and converts electric signal to and pass to microprocessor.
Wherein said sample cup adopts low-hydroxy-group squartz glass to make, shape adopts cylindrical, the lower end adds the end, and adopts the flange circle to fix the degree of depth of inserting integrating sphere, on the flange circle fluted for detection of the time register pin on the integrating sphere is inserted so that more accurate location; Sample cup is vertically put into integrating sphere inside by integrating sphere sample chamber entrance, realizes that sample absorbs the body of near infrared light, sample chamber specification and the measurement model parameter of the corresponding different-diameter of design feature per sample.
Adopt near-infrared spectrometers provided by the utility model, because light source is arranged by a plurality of semiconductor laser array formulas, when spectrum is gathered, can select different semiconductor lasers to make up and light, thereby can detect multiple heterogeneity.The utility model adopts integrating sphere diffuse reflection mode that microprocessor is collected and passed to the light signal that carries sample message and processes.
Description of drawings
Fig. 1 is the structural drawing of semiconductor laser array provided by the utility model (LD) near-infrared analyzer;
Fig. 2 is light source provided by the utility model and spectra collection unit connection diagram;
Fig. 3 is integrating sphere diagrammatic cross-section provided by the utility model and sample cup structural representation;
Fig. 4 is sample cup structural representation provided by the utility model.
Embodiment
The utility model is described in further detail below in conjunction with accompanying drawing.
Fig. 1 is the composition structural representation of semiconductor laser array provided by the utility model (LD) near-infrared spectrometers, this instrument comprises light source semiconductor laser 10, integrating sphere 20, sample cup 30, microprocessor 50, keyboard input and device displaying result 60, computer data processing unit 70; Described semiconductor laser 10 is connected with integrating sphere 20 by optical fiber 13, and the light of semiconductor laser 10 enters integrating sphere 20 by optical fiber 13; Described integrating sphere 20 comprises incident light hole 21, detector mouth 25 and the sample cup entrance 22 that is integrated on the integrating sphere wall, and sample cup 30 is connected with integrating sphere 20 by sample cup entrance 22; The keyboard input places on the shell 90 of instrument with device displaying result 60, links to each other with microprocessor 50.Computer data processing unit 70 links to each other with microprocessor 50 by USB interface 71; Establish detector 40 on the detector mouth 25 on the excircle of integrating sphere 20, the change in optical signal that detector is measured links to each other with microprocessor by pre-amplification circuit.
As shown in Figure 2, wherein said semiconductor laser (LD) 10 is semiconductor laser array, at first different semiconductor lasers (LD) array is arranged, and by optical fiber 12 light is spread out of, then multiple beams of optical fiber 12 is carried out outer coupling by coupling mechanism 11, and by 13 outputs of an optical fiber, by the incident light hole 21 of integrating sphere 20, sample in the sample cell 30 is shone.Can select different LD wave bands to encapsulate according to user's needs, to meet the different needs, can in the LD that has encapsulated, select as required in addition a combination to light to measure different sample compositions.
The output power of described semiconductor laser 10 can difference per sample be preseted by the user, in order to guarantee the consistent of sample test, output power after the setting is constant as much as possible, semiconductor laser is input as excitation with electric current, can adopt current feedback circuit to obtain stable input current, obtain stable luminous power by the control to electric current.
Described integrating sphere comprises that the incident light hole 21, sample cup entrance 22 and the detector mouth 25 that are integrated on the integrating sphere wall form as shown in Figure 3, and sample cup entrance 22 has to make sample cup fixing groove 23 and register pin 24; Light enters integrating sphere 20 by incident light hole 21, and sample cup 30 is inserted integrating sphere 20 by sample cup entrance 22, and rotary sample cup 30 is fixed its position until register pin 24 enters flange circle 31 grooves 32.Irradiation is on sample cup 30, constantly reflect at integrating sphere 20 inwalls and sample surfaces, sample fully absorbs light in the sample cup 30, puts into the light signal that detector 40 will carry sample message in the detector hole 25 and converts electric signal to and pass to microprocessor 50.
As shown in Figure 4, described sample cup 30 adopts low-hydroxy-group squartz glass to make, shape adopts cylindrical, the lower end adds the end, and adopt flange circle 31 to fix the degree of depth of inserting integrating sphere, on the flange circle 31 fluted 32 for detection of the time register pin 24 on the integrating sphere 20 is inserted so that more accurate location; Sample cup 30 is vertically put into integrating sphere 20 inside by integrating sphere sample chamber entrance 22, realizes that sample absorbs the body of near infrared light, sample chamber specification and the measurement model parameter of the corresponding different-diameter of design feature per sample.
The semiconductor indium that described detector 40 adopts is sowed the arsenic detector, is used for receiving the diffuse transmission spectral signal of the material of surveying that all is distributed in the integrating sphere inwall, and these near infrared light signals that carry sample message are changed into electric signal.
50 pairs of electric signal that receive of described microprocessor are processed, and comprise semiconductor laser (LD) control module, A/D modular converter, computing module and memory module.
Wherein said semiconductor laser (LD) control module is used for control semiconductor laser array 10, comprising the selection to required LD, and lighting order and lighting the control of time and to the FEEDBACK CONTROL of LD input current stability the LD that selects.
The analog signal conversion that described A/D modular converter is used for detector 40 outputs is digital signal, to data analysis, processing, computing.Under the A/D modular converter can adopt A/D converter, its formation and to be connected to those skilled in the art known.
The data that described memory module stores data processor and storage produce when carrying out this program are so described storer comprises the zone of the data that memory processes program and storage produce when carrying out this program.
Described computing module can be set up instance model according to the sample of measuring in advance, and according to this instance model the sample that will measure is predicted.
The input of described keyboard and display module 60 as a result, the keyboard input is used for the pattern that detects is selected, and luminous power is regulated, and data processing mode is selected.Display is used for the demonstration to result.
Described computer data processing unit 70 is used for the processing to data, and sets up model, by USB interface 71, the model of setting up is passed in the respective memory of microprocessor 50, after being convenient to it is directly called.
Described semiconductor laser (LD) near-infrared spectrometers also comprises shell 90, attaching plug 85, switch 80, USB interface 71, is used for controlling whole instrument, as shown in Figure 1.
The test operation of sample is as follows:
1. plug in 85, turn on the power switch 80, the parameter of installing each annex is arranged.As the intensity of light source is set, chooses the combination of required measurement wavelength and light the time interval etc. in turn.
2. the sample cup 30 of testing sample being packed into, sample size is inserted in the integrating sphere 20 by sample cup entrance 22 for there not to be flange circle 31.The illumination that semiconductor laser 10 sends is mapped to the testing sample surface, and integrating sphere 20 interior continuous reflections, sample fully absorbs light in the sample cup, detector receives and carries the light of sample message and convert thereof into electric signal subsequently, and pass in the microprocessor 50, through the A/D conversion equipment analog signal conversion is become digital signal, and choose the model of having set up test volume is calculated, a certain quality index values of this material of calculating is shown with device displaying result by the keyboard input.
3. the sample after will testing takes out, and the cleaning sample cup is done next time test and prepared.
Below by example the utility model is done and to be specified.
The utility model can be measured the component content of many kinds of substance, lifts an embodiment that is used for the Measuring Moisture Content of Tea content detection at this, and the detection of other samples can be with reference to the detection method of this embodiment.
At first the characteristic wavelength of moisture and the semiconductor laser 10 of reference wavelength are carried out the array encapsulation, and the optical fiber of output carried out outer coupling by coupling mechanism 11, be connected to light entrance port 21 with in the light input integral ball by optical fiber output (or from the semiconductor laser array that has encapsulated, choose required wavelength combinations and light) at last.
Get some parts of the tealeaves (about 100 parts) of different in moisture, a part is as calibration set (about 80 parts), and remainder is as forecast set (about 20 parts).The national standard and the industry standard GB8304-87 that check according to existing tea quality measure the water cut of all samples as measured value; With semiconductor laser (LD) near-infrared spectrometers it is carried out spectra collection, the absorption spectrum signal value that detecting device is obtained is kept in the microprocessor 50.Then by usb communication interface 71 with data importing in computer data processing unit 70, set up the correlation model between spectral signal value and the tealeaves water cut.The model parameter that obtains is written in microprocessor 50 respective storage areas of spectrometer by usb communication interface 71.
Next just can carry out Fast Measurement to the tealeaves of unknown moisture.The line 85 that plugs in turns on the power switch 80, and selecting detecting patterns by keyboard input and display module 60 is that Measuring Moisture Content of Tea detects; With tealeaves to be measured sample cup 30 is filled to and did not have the flange circle, add a cover, inserted to rotate to register pin 24 by sample cup entrance 22 and place in the flange circle groove 32, begin to detect; Program according to prior setting, combination of light sources selected in the incident light source is lighted in beginning in turn, and light source sends enters integrating sphere 20, and wall and sample surfaces constantly reflect within it, sample fully absorbs light in the sample cup 30, and diffuse reflection light is out received by detecting device 40; The near infrared light signal that detecting device will carry sample message changes electric signal into, changes in the digital signal input microprocessor 50 by A/D again; Microprocessor is accepted this spectral signal value and spectral signal value substitution model is calculated, the keyboard input with can show this tealeaves water cut on the display module 60 as a result, so far the tealeaves water cut detects and finishes.
Above-mentioned near infrared detection method can realize the modeling of instrument, after model is set up, realizes fast detecting and the demonstration of the index of quality.
This example only is an embodiment of the present utility model.Obviously, the utility model is not limited only to this, and many distortion can also be arranged, and all distortion that those of ordinary skill in the art can directly derive or associate from the disclosed content of the utility model all should be thought protection domain of the present utility model.
Claims (1)
1. semiconductor laser array near infrared spectrometer is characterized in that comprising light source semiconductor laser, integrating sphere, sample cup, microprocessor, keyboard input and device displaying result, the computer data processing unit; Described semiconductor laser is connected with integrating sphere by optical fiber, and the light of semiconductor laser enters integrating sphere by optical fiber; Described integrating sphere comprises incident light hole, detector mouth and the sample cup entrance that is integrated on the integrating sphere wall, and sample cup is connected with integrating sphere by the sample cup entrance; The keyboard input places on the shell of instrument with device displaying result, links to each other with microprocessor;
The computer data processing unit links to each other with microprocessor by USB interface; Establish detector on the detector mouth on the excircle of integrating sphere, the change in optical signal that detector is measured links to each other with microprocessor by pre-amplification circuit.
2Semiconductor laser array near infrared spectrometer according to claim 1, the sample cup entrance that it is characterized in that wherein said integrating sphere have the groove and the register pin that make sample cup fixing; Light enters integrating sphere by incident light hole, and sample cup is inserted integrating sphere by the sample cup entrance, and the rotary sample cup is fixed its position until register pin enters flange circle groove; Irradiation constantly reflects at integrating sphere inwall and sample surfaces on sample cup, and sample fully absorbs light in the sample cup, puts into the light signal that detector will carry sample message in the detector hole and converts electric signal to and pass to microprocessor.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220016403 CN202710470U (en) | 2012-01-16 | 2012-01-16 | Array type semiconductor laser unit near infrared spectroscopy analysis meter |
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| Application Number | Priority Date | Filing Date | Title |
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| CN 201220016403 CN202710470U (en) | 2012-01-16 | 2012-01-16 | Array type semiconductor laser unit near infrared spectroscopy analysis meter |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109975239A (en) * | 2019-04-15 | 2019-07-05 | 北京市农林科学院 | Near-infrared spectrometers |
| CN112871725A (en) * | 2019-11-29 | 2021-06-01 | 山东华光光电子股份有限公司 | Automatic test marking system and method for semiconductor laser |
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2012
- 2012-01-16 CN CN 201220016403 patent/CN202710470U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109975239A (en) * | 2019-04-15 | 2019-07-05 | 北京市农林科学院 | Near-infrared spectrometers |
| CN112871725A (en) * | 2019-11-29 | 2021-06-01 | 山东华光光电子股份有限公司 | Automatic test marking system and method for semiconductor laser |
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| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130130 Termination date: 20140116 |