CN202383251U - Automatic testing circuit of 1553B bus interface module - Google Patents
Automatic testing circuit of 1553B bus interface module Download PDFInfo
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- CN202383251U CN202383251U CN 201120564670 CN201120564670U CN202383251U CN 202383251 U CN202383251 U CN 202383251U CN 201120564670 CN201120564670 CN 201120564670 CN 201120564670 U CN201120564670 U CN 201120564670U CN 202383251 U CN202383251 U CN 202383251U
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Abstract
The utility model relates to an automatic testing circuit of a 1553B bus interface module. The automatic testing circuit comprises an industrial personal computer (IPC) parallel port, a signal driving circuit, a bus control logic circuit and a testing network control logic circuit connected in order; the testing network control logic circuit comprises an electricity testing network circuit, the electricity testing network circuit comprises a first triode, a first relay, a second relay and an electricity network circuit; control ends of the first relay and the second relay are respectively provided with a diode in parallel, a base electrode of the first triode receives a control signal sent by the bus control logic circuit, a positive end of each of the first diode and the second diode is connected with a collector of the first triode, a working end of the first relay is connected with one end of the electricity network circuit through an excitation signal IDET, the working end of the second relay is connected with the other end of the electricity network circuit through a testing signal UUTA. The automatic testing circuit provided by the utility model solves the technical problem that the existing testing has low efficiency, realizes the automatic switching, and improves the testing efficiency and the reliability.
Description
Technical field
The utility model is applied to be specifically related to a kind of automatic testing circuit of 1553B bus interface module in the environment of 1553B bus interface module PTP test.
Background technology
During 1553B bus interface module test in the past,, detect test result fully by the manual switch test network of people.Owing to the artificial origin, not only test result is inaccurate, is easy to generate error, and testing efficiency is very low like this.
Summary of the invention
Accomplish test in order to solve existing manual manual switchover test network to the 1553B bus interface module, the technical matters that testing efficiency is low, the utility model provides a kind of automatic testing circuit of 1553B bus interface module.
The technical solution of the utility model:
A kind of automatic testing circuit of 1553B bus interface module; Comprise the industrial computer parallel port, signal drive circuit, bus control logic circuit and the test network control logic circuit that connect successively; Its special character is: said test network control logic circuit comprises the electric test lattice network; Said electric test lattice network comprises first triode, first relay, second relay and electrical network circuit
Said electrical network circuit comprises first resistance, second resistance, the 3rd resistance, the 4th resistance and the 5th resistance, and said first resistance, second resistance, the 3rd resistance and the 4th resistance series connection back are parallelly connected with the 5th resistance;
The control end of said first relay also has first diode, and the control end of said second relay also has second diode,
The base stage of said first triode receives the control signal that the bus control logic circuit sends,
The anode of the anode of said first diode, second diode all is connected with the collector of first triode,
The grounded emitter of said first triode,
The working end of said first relay is sent pumping signal IDET through testing apparatus and is connected with an end of electrical network circuit,
The working end of said second relay connects through the other end of the test signal UUTA electrical network circuit that the 1553B bus interface module sends.
Above-mentioned test network control logic circuit also comprises the protocol test lattice network, and said protocol test lattice network comprises second triode, the 3rd relay and protocol network circuit,
Said protocol test lattice network comprises the 6th resistance;
The control end of said the 3rd relay also has the 3rd diode,
The base stage of said second triode receives the control signal that the bus control logic circuit sends,
The anode of said the 3rd diode is connected with the collector of second triode,
The grounded emitter of said second triode, the working end of said the 3rd relay are sent test signal UUTA through testing apparatus and are connected with the protocol test lattice network.
Above-mentioned first relay, second relay and the 3rd relay are solid-state relay.
The advantage that the utility model is compared with prior art had:
1, the utility model has solved the defective that can't automatically switch of 1553B interface module PTP test network, has realized automatic switchover, improves testing efficiency and reliability.
2, that the automatic testing circuit that the utility model provided has is flexible to operation and with low cost, simple in structure, be easy to realize.
Description of drawings
Fig. 1 is the utility model 1553B bus interface module automatic testing circuit theory diagram;
Fig. 2 is the utility model electric test lattice network figure;
Fig. 3 is the utility model protocol test lattice network figure.
Embodiment
As shown in Figure 1; The automatic testing circuit of 1553B bus interface module; Comprise the industrial computer parallel port, control signal driving circuit, bus control logic circuit and the test network control logic circuit that connect successively, the test network control logic circuit comprises the electric test lattice network.
As shown in Figure 2; The electric test lattice network comprises the first triode T1, the first relay U1, the second relay U2 and electrical network circuit; The electrical network circuit comprises that first resistance R 1, second resistance R 2, the 3rd resistance R 3, the 4th resistance R 4 and the 5th resistance R 5, the first resistance R 1, second resistance R 2, the 3rd resistance R 3 and the 4th resistance R 4 series connection backs are parallelly connected with the 5th resistance R 5; The control end of the first relay U1 also has the first diode D1; The control end of second relay also has the second diode D2; The base stage of the first triode T1 receives the control signal that the bus control logic circuit sends; The anode of the anode of the first diode D1, the second diode D2 all is connected with the collector of first triode, the grounded emitter of first triode
The working end of first relay is sent pumping signal IDET through testing apparatus and is connected with an end of electrical network circuit, and the working end of second relay connects through the other end of the test signal UUTA electrical network circuit that the 1553B bus interface module sends.
As shown in Figure 3, the test network control logic circuit also comprises the protocol test lattice network, and the protocol test lattice network comprises the second triode T2, the 3rd relay U3 and protocol network circuit, and the protocol test lattice network comprises the 6th resistance R 6; The control end of the 3rd relay U3 also has the 3rd diode D3; The base stage of second triode receives the control signal that the bus control logic circuit sends; The anode of the 3rd diode D3 is connected with the collector of the second triode T2; The grounded emitter of said second triode, the working end of the 3rd relay are sent test signal UUTA through testing apparatus and are connected with the protocol test lattice network.
The principle of this 1553B bus interface module PTP test network automatic switch-over circuit is data, control and status signal through the industrial computer parallel port, and controls the selection and the automatic switchover of PTP test network according to the needs of test.
The parallel port signal of industrial computer is through after the control signal driving circuit; Send into the bus control logic circuit; The bus control logic circuit is controlled the driving of industrial computer signal and is latched output, and the parallel port signal of industrial computer is sent into test network control logic circuit circuit through driving and latching.Test network gate logic control comprises and selects electric performance test network, protocol test network etc. to the selection of PTP test network and according to the automatic switchover of the different PTP test networks of testing requirement.
The electric test lattice network is made up of one or more relay, triode, diode; Control signal process control signal driving circuit that send the industrial computer parallel port and data message are for the control bus control logic circuit; When gating needed certain test network, control signal was output as the TTL high level, inserted the transistor base of corresponding network gating circuit; At this moment triode and the conducting of relay control end, relay closes.When relay closes, the different testing tools of ATE testing apparatus insert the test point of tested 1533B bus interface module (UUT) through the PTP test network.Simultaneously, can be through the different test network of program software control gate logic automatic switchover.Need to prove that the diode that is connected across on the relay control end can play a protective role to device under the excessive situation of voltage.And relay is selected solid-state relay, load is separated on electric with the control signal of switch, and the physics contact resistance between the terminal is extremely low, has guaranteed the stable and indeformable of test signal output.
Claims (3)
1. the automatic testing circuit of a 1553B bus interface module; Comprise the industrial computer parallel port, signal drive circuit, bus control logic circuit and the test network control logic circuit that connect successively; It is characterized in that: said test network control logic circuit comprises the electric test lattice network; Said electric test lattice network comprises first triode, first relay, second relay and electrical network circuit
Said electrical network circuit comprises first resistance, second resistance, the 3rd resistance, the 4th resistance and the 5th resistance, and said first resistance, second resistance, the 3rd resistance and the 4th resistance series connection back are parallelly connected with the 5th resistance;
The control end of said first relay also has first diode, and the control end of said second relay also has second diode,
The base stage of said first triode receives the control signal that the bus control logic circuit sends,
The anode of the anode of said first diode, second diode all is connected with the collector of first triode,
The grounded emitter of said first triode,
The working end of said first relay is sent pumping signal IDET through testing apparatus and is connected with an end of electrical network circuit,
The working end of said second relay connects through the other end of the test signal UUTA electrical network circuit that the 1553B bus interface module sends.
2. the automatic testing circuit of 1553B bus interface module according to claim 1; It is characterized in that: said test network control logic circuit also comprises the protocol test lattice network; Said protocol test lattice network comprises second triode, the 3rd relay and protocol network circuit
Said protocol test lattice network comprises the 6th resistance;
The control end of said the 3rd relay also has the 3rd diode,
The base stage of said second triode receives the control signal that the bus control logic circuit sends,
The anode of said the 3rd diode is connected with the collector of second triode,
The grounded emitter of said second triode, the working end of said the 3rd relay are sent test signal UUTA through testing apparatus and are connected with the protocol test lattice network.
3. the automatic testing circuit of 1553B bus interface module according to claim 1 and 2 is characterized in that: said first relay, second relay and the 3rd relay are solid-state relay.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201120564670 CN202383251U (en) | 2011-12-29 | 2011-12-29 | Automatic testing circuit of 1553B bus interface module |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201120564670 CN202383251U (en) | 2011-12-29 | 2011-12-29 | Automatic testing circuit of 1553B bus interface module |
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| CN202383251U true CN202383251U (en) | 2012-08-15 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 201120564670 Expired - Lifetime CN202383251U (en) | 2011-12-29 | 2011-12-29 | Automatic testing circuit of 1553B bus interface module |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103063942A (en) * | 2012-11-15 | 2013-04-24 | 上海航空电器有限公司 | Cycle detection method of HB 6096 bus interface |
| CN104536858A (en) * | 2015-01-04 | 2015-04-22 | 中国科学院光电技术研究所 | Method for automatically testing remote terminal in 1553B bus communication |
| CN105843717A (en) * | 2016-04-05 | 2016-08-10 | 河北上元工控技术有限公司 | Interface detection protection circuit for lane controller |
| CN106557022A (en) * | 2015-09-29 | 2017-04-05 | 上海宇航系统工程研究所 | A kind of carrier rocket redundancy sequential control system |
| CN108089952A (en) * | 2016-11-22 | 2018-05-29 | 北京计算机技术及应用研究所 | A kind of automated test device |
| CN109739789A (en) * | 2018-12-06 | 2019-05-10 | 西安翔迅科技有限责任公司 | A kind of terminal resistor automatic match circuit and method |
-
2011
- 2011-12-29 CN CN 201120564670 patent/CN202383251U/en not_active Expired - Lifetime
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103063942A (en) * | 2012-11-15 | 2013-04-24 | 上海航空电器有限公司 | Cycle detection method of HB 6096 bus interface |
| CN103063942B (en) * | 2012-11-15 | 2017-08-22 | 上海航空电器有限公司 | The periodicity detection methods of HB6096 EBIs |
| CN104536858A (en) * | 2015-01-04 | 2015-04-22 | 中国科学院光电技术研究所 | Method for automatically testing remote terminal in 1553B bus communication |
| CN104536858B (en) * | 2015-01-04 | 2017-10-20 | 中国科学院光电技术研究所 | Method for automatically testing remote terminal in 1553B bus communication |
| CN106557022A (en) * | 2015-09-29 | 2017-04-05 | 上海宇航系统工程研究所 | A kind of carrier rocket redundancy sequential control system |
| CN106557022B (en) * | 2015-09-29 | 2021-04-23 | 上海宇航系统工程研究所 | Carrier rocket redundant time sequence control system |
| CN105843717A (en) * | 2016-04-05 | 2016-08-10 | 河北上元工控技术有限公司 | Interface detection protection circuit for lane controller |
| CN105843717B (en) * | 2016-04-05 | 2023-02-28 | 河北上元智能科技股份有限公司 | Interface detection protection circuit of lane controller |
| CN108089952A (en) * | 2016-11-22 | 2018-05-29 | 北京计算机技术及应用研究所 | A kind of automated test device |
| CN108089952B (en) * | 2016-11-22 | 2021-11-16 | 北京计算机技术及应用研究所 | Automatic change test equipment |
| CN109739789A (en) * | 2018-12-06 | 2019-05-10 | 西安翔迅科技有限责任公司 | A kind of terminal resistor automatic match circuit and method |
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| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20120815 |