CN201927361U

CN201927361U - Replaceable internal memory test socket

Info

Publication number: CN201927361U
Application number: CN2011200057143U
Authority: CN
Inventors: 彭玉元
Original assignee: Individual
Current assignee: DONGGUAN HUAHUI ELECTRONIC TECHNOLOGY Co Ltd
Priority date: 2011-01-10
Filing date: 2011-01-10
Publication date: 2011-08-10
Anticipated expiration: 2021-01-10

Abstract

The utility model relates to an internal memory test socket, in particular to a replaceable internal memory test socket used for realizing the test for a plurality of internal memories at the same time. The replaceable internal memory test socket comprises a printed circuit board (PCB), test sockets fixed on the PCB, and a universal serial bus (USB) interface connected with a computer, wherein the two or more then two test sockets are available, and are respectively connected with USB sockets which are connected with test schemes; the USB sockets are connected with the USB interface by a concentrator; and the test sockets are respectively and correspondingly provided with a status indicator lamp and a control switch. The same PCB is simultaneously integrated with the multiple different internal memory test sockets, and the various different test schemes are connected by a plug-in way, so that the aim of simultaneously testing multiple different internal memories as well as the different test schemes of a single internal memory or multiple internal memories can be realized; therefore, the detection efficiency is greatly improved, a plurality of testing devices are not needed to be manufactured, and the production detection cost of enterprises can be reduced.

Description

A kind of changeable type memory test seat

Technical field

The utility model relates to a kind of memory test seat, specifically is a kind of changeable type memory test seat of realizing simultaneously a plurality of memory test.

Background technology

Flash memory (FLASH) is a kind of important components and parts that are widely used in various daily digital necessary articles such as USB flash disk, portable hard drive, SD card, TF card, GPS, digital camera, DV, and it is packaged with multiple mode, and TSOP is more typically arranged, BGA, types such as LGA.Internal memory all needs just can put goods on the market after tested in process of production, but existing detection volume production device structure is single, need be at various dissimilar internal memories, and the different independent respectively manufacturing test seat of testing scheme of various internal memories is tested, not only testing efficiency is low, and make many cover testing apparatus cost height, waste a large amount of production costs.

The utility model content

At the deficiency of existing memory test equipment, the utility model provides a kind of changeable type memory test seat, and it can realize that simultaneously to multiple different internal memories, different testing schemes detect, and improve detection efficiency greatly, have reduced the production testing cost.

For realizing this purpose, the technical scheme that this practicality is taked is: a kind of changeable type memory test seat, comprise test bench fixing on pcb board, the pcb board and the USB interface that is connected to computer, described test bench is two or more, described each test bench is connected to the USB seat respectively, connect testing scheme on the USB seat, described USB seat is connected with described USB interface by hub.

The technical scheme that realizes the utility model purpose comprises further that also described test bench and USB seat are positioned at the heteropleural of pcb board.

And described each test bench correspondence respectively is provided with status indicator lamp and gauge tap.

The utility model is integrated multiple different memory test seat of while on same pcb board, and adopt the mode of pegging graft to connect various testing scheme, thereby can realize simultaneously to multiple different internal memory, the purpose that single kind or the different testing scheme of multiple internal memory are tested simultaneously, not only improve detection efficiency greatly, and need not to make a plurality of testing apparatuss, reduced enterprise's production testing cost.

Description of drawings

Fig. 1 is the utility model front view.

Fig. 2 is the utility model rear view.

Fig. 3 is the utility model and computer connection diagram.

Embodiment

Below in conjunction with drawings and Examples the utility model structure and principle of work are elaborated.

As shown in Figure 1 and Figure 2, test bench described in the utility model comprises test bench 3 fixing on pcb board 1, the pcb board and the USB interface 2 that is connected to computer.Described test bench 3 comprises at TSOP, BGA, the test bench of the internal memory that multiple mode such as LGA encapsulates, realized the purpose of the multiple internal memory of test on same test board, and described test bench 3 is two or more, because the best volume production object of the detection limit stages of labor preface that each testing scheme merchant provides number is 16, therefore, the utility model is embodiment with 16 test benches, and test bench is four, eight, 32, during 64 numbers such as grade, its structural principle and the utility model are identical, only need simply repeat to get final product to the PCB circuit.Each test bench 3 correspondence respectively is provided with gauge tap 4, is used to realize in batches or control separately the work of this tested object, and establishes status indicator lamp 5 simultaneously, shows the duty of this test bench.

Described each test bench 3 is connected to USB seat 6 respectively, and the utility model preferably is located at USB seat 6 heteropleural of pcb board 1.Each USB seat 6 is connected with described USB interface 2 by hub 8, can connect various testing schemes 7 respectively on the USB seat 6.

During test, the utility model USB interface 2 is connected to computer 10 by USB connecting line 9, as Fig. 3, difference plug-in mounting internal memory to be tested on each test bench, and the testing scheme of the internal memory to be tested of on the USB seat, pegging graft, can realize simultaneously that to multiple different internal memory single the kind or purpose that the different testing scheme of multiple internal memory is tested simultaneously improved detection efficiency greatly.

Above content be in conjunction with concrete preferred implementation to further describing that the utility model is done, can not assert that concrete enforcement of the present utility model is confined to these explanations.For the utility model person of an ordinary skill in the technical field, under the prerequisite that does not break away from the utility model design, can also make some simple deduction or replace, all should be considered as belonging to protection domain of the present utility model.

Claims

1. changeable type memory test seat, comprise test bench fixing on pcb board, the pcb board and the USB interface that is connected to computer, it is characterized in that, described test bench (3) is two or more, described each test bench (3) is connected to USB seat (6) respectively, USB seat (6) is gone up and is connected testing scheme (7), and described USB seat (6) is connected with described USB interface (2) by hub (8).

2. changeable type memory test seat according to claim 1 is characterized in that, described test bench (3) and USB seat (6) are positioned at the heteropleural of pcb board (1).

3. changeable type memory test seat according to claim 1 is characterized in that, described each test bench (3) correspondence respectively is provided with gauge tap (4).

4. changeable type memory test seat according to claim 1 is characterized in that, described each test bench (3) correspondence respectively is provided with status indicator lamp (5).