CN201859194U - Connection inspection board - Google Patents
Connection inspection board Download PDFInfo
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- CN201859194U CN201859194U CN2010205651044U CN201020565104U CN201859194U CN 201859194 U CN201859194 U CN 201859194U CN 2010205651044 U CN2010205651044 U CN 2010205651044U CN 201020565104 U CN201020565104 U CN 201020565104U CN 201859194 U CN201859194 U CN 201859194U
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- joint
- wire jumper
- plate
- pilot lamp
- pin
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Abstract
The utility model relates to a connection inspection board for detecting if a pin of a chip sample to be detected is excellently contacted with the pin of a socket of a DUT (device under test) board. The connection inspection board comprises a plurality of ox horn connectors and a printed circuit board, wherein the ox horn connectors are fixedly arranged on the surface of the printed circuit board; the horn connectors are matched with golden fingers of the DUT board; the printed circuit board is provided with a plurality of indicator lamps, a plurality of resistors and a power supply; one connector is in series connection with one indicator lamp; and the connectors and the indicator lamps that are in series connection with one another are selectively connected with the anode or the cathode of the power supply through the resistors. The connection inspection board of the utility model can directly position the pin of the chip sample to be detected which is in poor contact and has small work load for detection and high efficiency.
Description
Technical field
The utility model relates to the chip-scale test of encapsulation, relates in particular to a kind of connection inspection plate.
Background technology
(device under test, DUT) plate connects chip sample to be measured and testing apparatus to use DUT in the chip-scale test of encapsulation.
Referring to Fig. 1, DUT plate 100 is provided with a plurality of sockets (sockets) 110 and a plurality of golden finger (goldfingers) 120, each socket 110 comprises a plurality of pin ones 11 again, during test, the pin of chip sample to be measured inserts the pin one 11 of described socket 110, realize being connected of described chip sample to be measured and described DUT plate 100, the golden finger 120 of described DUT plate 100 inserts testing apparatuss, realizes being connected of described DUT plate 100 and described testing apparatus.The quantity of the pin one 11 of described socket 110 equals the quantity of described golden finger 120, and a described pin one 11 is electrically connected with a described golden finger 120.
The long-term use of DUT plate or the package quality problem of chip sample to be measured all can cause chip sample to be measured can't form good the contact with the DUT plate, when going wrong with the electrical connecting passage of golden finger, the pin of socket also can cause chip sample to be measured can't form good the contact with the DUT plate, if do not detect the bad contact problems of chip sample to be measured and DUT plate the primary stage in the chip-scale test of encapsulation, will directly cause test crash.
In the prior art, detect chip sample to be measured and whether contact the golden finger that good use general-purpose ohmmeter is measured the DUT plate with the DUT plate, it is unusual that the resistance value that relies on the general-purpose ohmmeter to show judges whether contact has, in other words, if find that in the chip-scale test process of encapsulation the problem of loose contact appears in chip sample to be measured and DUT plate, because can't specifically know the pin loose contact of which pin and the socket that are which chip sample to be measured, for finding out the root of problem, just need to use the general-purpose ohmmeter to detect all pins of all chip samples to be measured, the testing amount is big, and efficient is low.
The utility model content
The purpose of this utility model is to provide a kind of connection inspection plate, whether the pin that is used to detect chip sample to be measured contacts well with the pin of DUT plate socket, this connection inspection plate can directly be located the pin of the chip sample to be measured of loose contact, and the testing amount is little, the efficient height.
To achieve the above object, the utility model provides a kind of connection inspection plate, and whether the pin that detects chip sample to be measured contacts well with the pin of DUT plate socket, it is characterized in that, comprises ox horn joint and printed circuit board (PCB); Described ox horn joint is fixedly installed on the surface of described printed circuit board (PCB); Described ox horn joint is provided with a plurality of joints, and the golden finger of described a plurality of joints and described DUT plate is complementary; Described printed circuit board (PCB) is provided with a plurality of pilot lamp, a plurality of resistance and a power supply; Described pilot lamp of a described joint series connection, the described joint of series connection and pilot lamp are connected the positive pole or the negative pole of described power supply by described resistance selection.
Above-mentioned connection inspection plate, wherein, the joint of described ox horn joint is divided into many groups, a socket of one group of corresponding described DUT plate of described joint, in certain sequence, get a series arm parallel connection of forming by described joint and pilot lamp, the described resistance of contacting again after the parallel connection from every group.
Above-mentioned connection inspection plate, wherein, the number of the joint that every group of described joint comprised equals the number of a pin that socket comprised of described DUT plate.
Above-mentioned connection inspection plate, wherein, the quantity of described resistance equals the number of the joint that every group of described joint comprise.
Above-mentioned connection inspection plate, wherein, described printed circuit board (PCB) also is provided with a plurality of resistance wire jumper ends, a plurality of positive source wire jumper end and a plurality of power cathode wire jumper end; Described a plurality of positive source wire jumper end is connected with the positive pole of described power supply respectively; Described a plurality of power cathode wire jumper end is connected with the negative pole of described power supply respectively; A described resistance wire jumper end is connected with a described resistance.
Above-mentioned connection inspection plate, wherein, the quantity of described positive source wire jumper end equals the quantity of described resistance wire jumper end.
Above-mentioned connection inspection plate, wherein, the quantity of described power cathode wire jumper end equals the quantity of described resistance wire jumper end.
Connection inspection plate of the present utility model is set up with chip sample to be measured and DUT plate by the ox horn joint and is electrically connected, form electric loop by the wire jumper mode, whether the pin that shows chip sample to be measured with pilot lamp contacts well with the pin of DUT plate socket, can directly locate the pin of the chip sample to be measured of loose contact, the testing amount is little, the efficient height;
Connection inspection plate of the present utility model is got a series arm parallel connection of being made up of described joint and pilot lamp from every group in certain sequence, as long as jump primary line, uses very simple when detecting a plurality of chip sample to be measured at the same time;
The ox horn joint of connection inspection plate of the present utility model and the golden finger of DUT plate mate, and are applicable to the chip sample to be measured of the different pin numbers that mate with the DUT plate, and applicability is wide;
Connection inspection plate of the present utility model can detect a plurality of chip samples to be measured simultaneously, not only can fast detecting go out the chip sample to be measured of loose contact, and directly the pin of location loose contact is multiple functional;
Connection inspection plate cost of the present utility model is low.
Description of drawings
Connection inspection plate of the present utility model is provided by following embodiment and accompanying drawing.
Fig. 1 is the structural representation of DUT plate in the prior art.
Fig. 2 is the structural representation that the utility model connects inspection plate one preferred embodiment.
Fig. 3 is the vertical view of printed circuit board (PCB) in the utility model.
Fig. 4 is the circuit diagram that the utility model connects inspection plate one preferred embodiment.
Fig. 5 is the synoptic diagram of test structure in the utility model.
Embodiment
Below with reference to Fig. 2～Fig. 5 connection inspection plate of the present utility model is described in further detail.
Now describe connection inspection plate of the present utility model in detail with a specific embodiment:
Referring to Fig. 2, the connection inspection plate of present embodiment comprises ox horn joint 210 and printed circuit board (PCB) 220;
Described ox horn joint 210 is fixedly installed on the surface of described printed circuit board (PCB) 220.
Described ox horn joint 210 is complementary with the golden finger of DUT plate;
In the present embodiment, described DUT plate as shown in Figure 1, this DUT plate 100 is provided with 6 sockets 110, each socket 110 comprises 8 pin ones 11, correspondingly, this DUT plate 100 is provided with 48 golden fingers 120;
Described ox horn joint 210 is provided with a plurality of joints 211, and the quantity of described joint 211 equals the quantity of the golden finger 120 that described DUT plate 100 comprised, and in the present embodiment, described ox horn joint 210 has 48 joints 211;
The be complementary golden finger of the joint 211 that is meant described ox horn joint 210 and described DUT plate of the golden finger of described ox horn joint 210 and described DUT plate is complementary;
48 joints 211 of described ox horn joint 210 are divided into 6 groups, every group comprises 8 joints 211, every set of joints is corresponding to a socket, when promptly using present embodiment to connect inspection plate, 8 joints of same group will be set up with 8 pins of same socket respectively and be electrically connected, clear for what explain, with 6 group difference called after A groups, the B group, the C group, the D group, E group and F group, 8 joints for the A group are distinguished called after A1 in order, A2, A3, A4, A5, A6, A7 and A8,8 joints for the B group are distinguished called after B1 in order, B2, B3, B4, B5, B6, B7 and B8, the name of other each set of joints by that analogy.
Referring to Fig. 3 and Fig. 4, described printed circuit board (PCB) 220 is provided with a plurality of pilot lamp 221, a plurality of resistance 222, a plurality of wire jumper end 223 and power supply 224;
The quantity of described pilot lamp 221 equals the quantity of described joint 211;
Described wire jumper end 223 comprises three types, is respectively positive source wire jumper end jump P, power cathode wire jumper end jump N and resistance wire jumper end jump R, and every type wire jumper end includes a plurality of;
Continuation is referring to Fig. 4, and in the present embodiment, described printed circuit board (PCB) 220 is provided with 48 pilot lamp 221, pilot lamp 221 of a joint 211 series connection of described ox horn joint 210;
The other end of the pilot lamp of connecting with first joint A1 in the A set of joints, the other end of the pilot lamp of connecting with first joint B1 in the B set of joints, the other end of the pilot lamp of connecting with first joint C1 in the C set of joints, the other end of the pilot lamp of connecting with first joint D1 in the D set of joints, the other end of the pilot lamp of connecting with first joint E1 in the E set of joints, be connected with the other end of the pilot lamp of first joint F1 series connection in the F set of joints, be that first joint branch road that forms of connecting with a pilot lamp is in parallel in each set of joints, the resistance of connecting again after the parallel connection, the other end of this resistance is connected with a resistance wire jumper end jump R;
The other end of the pilot lamp of connecting with second joint A2 in the A set of joints, the other end of the pilot lamp of connecting with second joint B2 in the B set of joints, the other end of the pilot lamp of connecting with second joint C2 in the C set of joints, the other end of the pilot lamp of connecting with second joint D2 in the D set of joints, the other end of the pilot lamp of connecting with second joint E2 in the E set of joints, be connected with the other end of the pilot lamp of second joint F2 series connection in the F set of joints, promptly connect with the pilot lamp branch road of formation of second joint is in parallel in each group, the resistance of connecting again after the parallel connection, the other end of this resistance is connected with a resistance wire jumper end jump R;
By that analogy, the other end with the 8th pilot lamp that joint A8 connects in the A set of joints, the other end with the 8th pilot lamp that joint B8 connects in the B set of joints, the other end with the 8th pilot lamp that joint C8 connects in the C set of joints, the other end with the 8th pilot lamp that joint D8 connects in the D set of joints, the other end with the 8th pilot lamp that joint E8 connects in the E set of joints, be connected with the other end of the pilot lamp of the 8th joint F8 series connection in the F set of joints, it is in parallel promptly respectively organizing the 8th the joint branch road that forms of connecting with a pilot lamp, the resistance of connecting again after the parallel connection, the other end of this resistance is connected with a resistance wire jumper end jump R;
Described resistance 222 is used for holding circuit, the quantity of described resistance 222 equals the quantity of the pin one 11 that each socket 110 comprised, the quantity of described resistance wire jumper end jump R equals the quantity of the pin one 11 that each socket 110 comprised, in this enforcement, described resistance 222 has 8, and described resistance wire jumper end jump R has 8;
Described a plurality of positive source wire jumper end jump P is connected with the positive pole of described power supply 224 respectively, the quantity of described positive source wire jumper end jump P equals the quantity of the pin one 11 that each socket 110 comprised, be in the present embodiment, described positive source wire jumper end jump P has 8;
Described a plurality of power cathode wire jumper end jump N is connected with the negative pole of described power supply 224 respectively, the quantity of described power cathode wire jumper end jump N equals the quantity of the pin one 11 that each socket 110 comprised, be in the present embodiment, described power cathode wire jumper end jump N has 8;
Described resistance wire jumper end jump R can select to be connected with described positive source wire jumper end jump P or power cathode wire jumper end jump N.
When using the connection inspection plate of present embodiment, chip sample to be measured is inserted the socket 110 of described DUT plate 100, the golden finger 120 of described DUT plate 100 inserts the ox horn joint 210 that present embodiment connects inspection plate, the joint 211 of described ox horn joint 210 is connected with the golden finger 120 of described DUT plate 100, and the golden finger 120 of described DUT plate 100 is connected with the socket 110 of described DUT plate 100, sets up the annexation between the connection inspection plate three of chip sample to be measured, DUT plate and present embodiment like this.
Now illustrate the principle of work of the connection inspection plate of present embodiment:
Referring to Fig. 5, chip sample to be measured adopts the test structure 300 of four interface end, four interface end of described test structure 300 are respectively positive pole exert pressure end F+, negative pole exert pressure end F-, anodal induction end S+ and negative pole induction end S-, in the present embodiment, use the connection inspection plate of present embodiment to detect two test structures 300 simultaneously;
Four interface end of test structure are inserted in four pins of a socket of DUT plates, the golden finger of this DUT plate is inserted the ox horn joint that present embodiment connects inspection plate, set up being electrically connected between test structure interface end and the joint, for example, four interface end F+ of first test structure, S+, corresponding respectively four the joint A8 that are connected in the ox horn joint A set of joints of the pin of S-and four sockets of F-insertion, A7, A2 and A1, four interface end F+ of second test structure, S+, corresponding respectively four the joint B8 that are connected in the ox horn joint B set of joints of the pin of S-and four sockets of F-insertion, B7, B2 and B1, as shown in Figure 4;
The resistance wire jumper end jump R that will be connected with joint A1 is connected with a power cathode wire jumper end jump N, the resistance wire jumper end jump R that is connected with A2 is connected with another power cathode wire jumper end jump N, the resistance wire jumper end jump R that is connected with joint A7 is connected with a positive source wire jumper end jump P, the resistance wire jumper end jump R that is connected with joint A8 is connected with another positive source wire jumper end jump P, as shown in Figure 3, like this, each test structure 4 loops have been set up, with first test structure is example, and first loop is the positive pole of power supply, the pilot lamp that is connected with joint A8, joint A8, the positive pole of test structure is exerted pressure and is held F+, the negative pole induction end S-of test structure, joint A2, the pilot lamp that is connected with joint A2 and the negative pole of power supply; The positive pole of the positive pole that second loop is power supply, the pilot lamp that is connected with joint A8, joint A8, test structure the exert pressure negative pole of end F+, test structure exert pressure end F-, joint A1, the pilot lamp that is connected with joint A1 and the negative pole of power supply; The 3rd positive pole, the pilot lamp that is connected with joint A7, joint A7, the anodal induction end S+ of test structure, negative pole induction end S-, the joint A2 of test structure, the pilot lamp that is connected with joint A2 and the negative pole of power supply that the loop is a power supply; The anodal induction end S+ of the positive pole that the 4th loop is power supply, the pilot lamp that is connected with joint A7, joint A7, test structure, the negative pole of test structure exert pressure end F-, joint A1, the pilot lamp that is connected with joint A1 and the negative pole of power supply;
Though detect two test structures simultaneously, as long as jump primary line, because joint A1 is in parallel with joint B1, joint A2 is in parallel with joint B2, and joint A7 is in parallel with joint B7, and joint A8 is in parallel with joint B8; When connection inspection plate of the present utility model detects a plurality of chip sample to be measured simultaneously,, use very simple as long as jump primary line;
When in four interface end of test structure the pin loose contact of interface end and socket being arranged, certain or some loops are disconnected, pilot lamp in the loop that disconnects can be not bright, therefore, can determine which interface end of test structure and the pin loose contact of socket by pilot lamp is whether bright, for example, the pin loose contact of end F+ and socket if the positive pole of first test structure is exerted pressure, then the pilot lamp that is connected with joint A8 does not work, and other pilot lamp are all bright, promptly use the connection inspection plate of present embodiment can directly locate which interface end of which test structure and the pin loose contact of socket, the testing amount is little, the efficient height.
Connection inspection plate of the present utility model not only can fast detecting go out the chip sample to be measured of loose contact, and directly the pin of location loose contact is multiple functional;
Connection inspection plate applicability of the present utility model is wide, is applicable to the chip sample to be measured of different pin numbers, as long as this chip sample to be measured can be applicable to the socket of DUT plate; Connection inspection plate cost of the present utility model is low.
Claims (7)
1. one kind connects inspection plate, and whether the pin that detects chip sample to be measured contacts well with the pin of DUT plate socket, it is characterized in that, comprises ox horn joint and printed circuit board (PCB);
Described ox horn joint is fixedly installed on the surface of described printed circuit board (PCB);
Described ox horn joint is provided with a plurality of joints, and the golden finger of described a plurality of joints and described DUT plate is complementary;
Described printed circuit board (PCB) is provided with a plurality of pilot lamp, a plurality of resistance and a power supply;
Described pilot lamp of a described joint series connection, the described joint of series connection and pilot lamp are connected the positive pole or the negative pole of described power supply by described resistance selection.
2. connection inspection plate as claimed in claim 1, it is characterized in that, the joint of described ox horn joint is divided into many groups, a socket of one group of corresponding described DUT plate of described joint, in certain sequence, get a series arm parallel connection of forming by described joint and pilot lamp, the described resistance of contacting again after the parallel connection from every group.
3. connection inspection plate as claimed in claim 2 is characterized in that the number of the joint that every group of described joint comprised equals the number of a pin that socket comprised of described DUT plate.
4. as claim 2 or 3 described connection inspection plates, it is characterized in that the quantity of described resistance equals the number of the joint that every group of described joint comprise.
5. connection inspection plate as claimed in claim 2 is characterized in that, described printed circuit board (PCB) also is provided with a plurality of resistance wire jumper ends, a plurality of positive source wire jumper end and a plurality of power cathode wire jumper end;
Described a plurality of positive source wire jumper end is connected with the positive pole of described power supply respectively;
Described a plurality of power cathode wire jumper end is connected with the negative pole of described power supply respectively;
A described resistance wire jumper end is connected with a described resistance.
6. connection inspection plate as claimed in claim 4 is characterized in that, the quantity of described positive source wire jumper end equals the quantity of described resistance wire jumper end.
7. connection inspection plate as claimed in claim 4 is characterized in that, the quantity of described power cathode wire jumper end equals the quantity of described resistance wire jumper end.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010205651044U CN201859194U (en) | 2010-10-16 | 2010-10-16 | Connection inspection board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010205651044U CN201859194U (en) | 2010-10-16 | 2010-10-16 | Connection inspection board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201859194U true CN201859194U (en) | 2011-06-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010205651044U Expired - Fee Related CN201859194U (en) | 2010-10-16 | 2010-10-16 | Connection inspection board |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102841289A (en) * | 2012-08-08 | 2012-12-26 | 中国北车集团大连机车车辆有限公司 | Testing device and method for jumper address plug |
| CN103954877A (en) * | 2014-04-15 | 2014-07-30 | 京东方科技集团股份有限公司 | Integrated circuit testing method and device |
| CN104007353A (en) * | 2013-02-26 | 2014-08-27 | 鸿富锦精密工业(武汉)有限公司 | Interface detection circuit |
| CN105005160A (en) * | 2015-07-29 | 2015-10-28 | 句容骏成电子有限公司 | LCD pin detection device |
| WO2017070902A1 (en) * | 2015-10-29 | 2017-05-04 | 华为技术有限公司 | Method for detecting btb fastening reliability, terminal and detection apparatus |
| CN109425810A (en) * | 2017-08-18 | 2019-03-05 | 台湾积体电路制造股份有限公司 | Semiconductor test apparatus, semiconductor test system and semiconductor test method |
| CN109444713A (en) * | 2018-11-13 | 2019-03-08 | 无锡中微腾芯电子有限公司 | A kind of wafer test contact fault diagnostic method |
| CN110389278A (en) * | 2019-08-01 | 2019-10-29 | 珠海市运泰利自动化设备有限公司 | A kind of B2B connector device is fitted on level detecting apparatus |
-
2010
- 2010-10-16 CN CN2010205651044U patent/CN201859194U/en not_active Expired - Fee Related
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102841289A (en) * | 2012-08-08 | 2012-12-26 | 中国北车集团大连机车车辆有限公司 | Testing device and method for jumper address plug |
| CN102841289B (en) * | 2012-08-08 | 2015-04-08 | 中国北车集团大连机车车辆有限公司 | Testing device and method for jumper address plug |
| CN104007353B (en) * | 2013-02-26 | 2016-12-28 | 国网山东省电力公司菏泽供电公司 | Interface testing circuit |
| CN104007353A (en) * | 2013-02-26 | 2014-08-27 | 鸿富锦精密工业(武汉)有限公司 | Interface detection circuit |
| CN103954877B (en) * | 2014-04-15 | 2017-03-08 | 京东方科技集团股份有限公司 | IC testing method and test device |
| CN103954877A (en) * | 2014-04-15 | 2014-07-30 | 京东方科技集团股份有限公司 | Integrated circuit testing method and device |
| CN105005160A (en) * | 2015-07-29 | 2015-10-28 | 句容骏成电子有限公司 | LCD pin detection device |
| CN105005160B (en) * | 2015-07-29 | 2018-03-06 | 句容骏成电子有限公司 | A kind of LCD pin detection devices |
| WO2017070902A1 (en) * | 2015-10-29 | 2017-05-04 | 华为技术有限公司 | Method for detecting btb fastening reliability, terminal and detection apparatus |
| CN107209224A (en) * | 2015-10-29 | 2017-09-26 | 华为技术有限公司 | A kind of detection BTB fastens method, terminal and the detection means of reliability |
| CN107209224B (en) * | 2015-10-29 | 2020-03-10 | 华为技术有限公司 | Method, terminal and detection device for detecting buckling reliability of BTB (Business to Board) |
| CN109425810A (en) * | 2017-08-18 | 2019-03-05 | 台湾积体电路制造股份有限公司 | Semiconductor test apparatus, semiconductor test system and semiconductor test method |
| CN109425810B (en) * | 2017-08-18 | 2021-08-24 | 台湾积体电路制造股份有限公司 | Semiconductor test apparatus, semiconductor test system, and semiconductor test method |
| CN109444713A (en) * | 2018-11-13 | 2019-03-08 | 无锡中微腾芯电子有限公司 | A kind of wafer test contact fault diagnostic method |
| CN110389278A (en) * | 2019-08-01 | 2019-10-29 | 珠海市运泰利自动化设备有限公司 | A kind of B2B connector device is fitted on level detecting apparatus |
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Legal Events
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| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING Free format text: FORMER OWNER: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION Effective date: 20130320 |
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| C41 | Transfer of patent application or patent right or utility model | ||
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Free format text: CORRECT: ADDRESS; FROM: 201203 PUDONG NEW AREA, SHANGHAI TO: 100176 DAXING, BEIJING |
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| TR01 | Transfer of patent right |
Effective date of registration: 20130320 Address after: 100176 No. 18, Wenchang Avenue, Beijing economic and Technological Development Zone Patentee after: Semiconductor Manufacturing International (Beijing) Corporation Address before: 201203 Shanghai City, Pudong New Area Zhangjiang Road No. 18 Patentee before: Semiconductor Manufacturing International (Shanghai) Corporation |
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| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110608 Termination date: 20181016 |
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| CF01 | Termination of patent right due to non-payment of annual fee |