CN208621655U - Micro-strip device test fixture - Google Patents

Abstract

The utility model discloses a kind of micro-strip device test fixtures, including substrate (1), bracket (2) and test module (3), wherein the bracket (2) is located on substrate (1), and the test module (3) is located on bracket (2)；The test module (3) includes cavity (6), elastic spring (7), lower top flat (8), handle (9), limit plate (10), test connector (11) and test contact pin (12)；The utility model can effectively solve the problems, such as that conventional microstrip test fixture contact pin rapid wear, imperfect earth and production efficiency are low, frequency of use DC~the 60GHz of the utility model, and conventional microstrip test fixture frequency of use DC~20GHz, the test frequency of the micro-strip that extended significantly device, the testing efficiency of the utility model is≤1.2 minutes/, and conventional microstrip test fixture testing efficiency is >=10 minutes/, testing efficiency is greatly improved, and improves the accuracy of micro-strip device test fixture test.

Description

Micro-strip device test fixture

Technical field

The utility model relates to microwave device testing field more particularly to a kind of micro-strip device test fixtures.

Background technique

Micro-strip device is widely used in Modern wireless communication, radar, electronic countermeasure by miniaturization, high performance advantage Etc. in electronic systems.Important procedure and key technology of the test of micro-strip device as research and development and production link, it is micro- for a long time Test with device is always the bottleneck that puzzlement device is produced in enormous quantities.

Specifically, for a long time, the measuring technique of traditional micro-strip device measured without forming an efficient general, Existing test method can only be used in the device of low frequency (DC~20GH exists), and existing micro-strip device test fixture structure is such as Shown in Fig. 1, including tray 13 and test contact pin 12, test specimen 4 are located between tray 13 and test contact pin 12, test contact pin 12 It is two, it is symmetrical in the top left and right ends of tray 13.Such test fixture, has the disadvantage in that

(1) 12 subject to damage of contact pin is tested: because the strength that tray 13 applies upwards every time is different, the result meeting of test Difference, test contact pin 12 are also easier to damage；

(2) frequency limited: for this structure due to imperfect earth, which is only applicable to 20GHz frequency below, In the test of higher frequency, unacceptable error can be brought；Measurement for high-frequency microstrip device, or even need to pass through welding The mode of coaxial connector measures it；

(3) production efficiency is low: because the inaccuracy of test result, causes test job to repeat, production efficiency is low.

That is, existing test fixture, it is that micro-strip device detection faces that testing efficiency is not high, high-frequency element can not be tested accurately Main problem, certain high-frequency micro-strip products generally require after welding to product to obtain its performance indicator, then into Row test, not only damages product, but also expensive, inefficiency is not suitable for producing yet in this way.

Summary of the invention

The purpose of this utility model, which is that, provides a kind of novel micro-strip device test fixture, to solve the above problems.

To achieve the goals above, the technical solution adopted in the utility model is such that a kind of micro-strip device detection folder Tool, including substrate, bracket and test module, wherein the bracket is located on substrate, and the test module is located on bracket；Institute Stating test module includes cavity, elastic spring, lower top flat, handle, limit plate, test connector and test contact pin, the elasticity Reed top within the cavity, the lower top flat are bonded with cavity, and lower top flat is connected with handle, and the limit plate is located at cavity top Portion, the test contact pin is between lower top flat and limit plate, the test connector) it is located above cavity and can connects with instrument It connects.

The core component of this test fixture of test module, wherein

Cavity: the structural framing as test module；

Elastic spring: lower top flat can be closely adhered on the surface of cavity by elastic spring；

Lower top flat: under the action of elastic force, remaining upward state and strength, and can be bonded with limit plate, It is to guarantee that measured piece is grounded good key component；

Handle: by that can be moved down lower top flat to handle, lower top flat and limit plate are separated；

Limit plate；It is the limit plate that lower top flat moves up, and the limit plate of test contact pin deflection；

Test connector: can be connected with test equipment by the test connector；

Test contact pin: the center conductor connecting with measured piece input port and output port.

As a preferred technical scheme: the micro-strip device test fixture further includes foot pad, and the foot pad is located at substrate base Portion.Setting foot pad facilitates fixed test fixture.

Compared with the prior art, the advantages of the utility model are: the utility model can effectively solve conventional microstrip survey Fixture contact pin rapid wear, imperfect earth and the low problem of production efficiency are tried, the micro-strip device test fixture of the utility model uses Frequency DC~60GHz, and conventional microstrip test fixture frequency of use DC~20GHz, the test frequency of the micro-strip that extended significantly device Rate, the micro-strip device test fixture testing efficiency of the utility model is≤1.2 minutes/, and conventional microstrip test fixture is tested Efficiency is >=10 minutes/, greatly improves testing efficiency, and improves the accuracy of micro-strip device test fixture test.

Detailed description of the invention

Fig. 1 is the structural schematic diagram of the utility model prior art；

Fig. 2 is the side view of the utility model micro-strip device test fixture；

Fig. 3 is the top view of the utility model micro-strip device test fixture；

Fig. 4 is the structural schematic diagram of test module in Fig. 3；

By the structural schematic diagram of lower handle when Fig. 5 is product test；

The structural schematic diagram of release handle when Fig. 6 is product test；

Fig. 7 is the schematic perspective view of the utility model.

In figure: 1, substrate；2, bracket；3, test module；4, test specimen；5, foot pad；6, cavity；7, elastic spring； 8, lower top flat；9, handle；10, limit plate；11, test connector；12, contact pin is tested；13, tray.

Specific embodiment

Below in conjunction with attached drawing, the utility model is described in further detail.

Embodiment:

Referring to fig. 2,3,4, a kind of micro-strip device test fixture, including substrate 1, bracket 2, test module 3 and foot pad 5, In, the bracket 2 is located on substrate 1, and the test module 3 is located on bracket 2, and the foot pad 5 is located at 1 bottom of substrate；It is described Test module 3 includes cavity 6, elastic spring 7, lower top flat 8, handle 9, limit plate 10, test connector 11 and tests contact pin 12, Wherein, elastic spring top within the cavity, the lower top flat are bonded with cavity, and lower top flat is connected with handle, the limit Position plate is located at the top of cavity, and between lower top flat and limit plate, the test connector is located on cavity the test contact pin Side can be connected with instrument, and the tail portion that the test contact pin is located at test connector can be connected with test specimen.

Application method:

Handle 9 is pressed downwards when use, lower top flat 8 can be moved down, be separated with limit plate 10, will be tested at this time Test specimen 4 is placed between lower roof plate 8 and limit plate 10, and the position of centering test contact pin and microstrip line, release handle 9 are completed micro- Connection with device input mouth, using the output port of same procedure connection micro-strip device, as shown in Figure 5 and Figure 6；

Control to test contact pin deflection:

When lower top flat 8 drives measured piece 4 to move up, be first that test specimen 4 is contacted with contact pin 12 is tested, and continue to Upper movement, testing contact pin 12 therewith, deformation occurs, then when test specimen 4 is overlapped with limit plate 10, moves up stopping, surveying Examination contact pin 12 also stops deformation.The deformation of test contact pin 12 can guarantee that micro-strip device contacts are good, and limit plate 10 can be protected The each deflection of card test contact pin 12.

Effective grounding:

Test specimen 4 directly can not carry out effective grounding with cavity 6, and the power applied by elastic spring 7 is tight by lower top flat 8 On the close surface for being fitted in cavity 6, in this way but also lower top flat 8 can also be used as effective ground connection carrier；Test specimen 4 is placed on Between lower top flat 8 and limit plate 10, ensure that the ground connection of test specimen 4 is good by the clamping power of the two.

The above is only the preferred embodiment of the utility model only, is not intended to limit the utility model, all at this Made any modifications, equivalent replacements, and improvements etc., should be included in the utility model within the spirit and principle of utility model Protection scope within.

Claims (2)

1. a kind of micro-strip device test fixture, it is characterised in that: including substrate (1), bracket (2) and test module (3), wherein The bracket (2) is located on substrate (1), and the test module (3) is located on bracket (2)；The test module (3) includes cavity (6), elastic spring (7), lower top flat (8), handle (9), limit plate (10), test connector (11) and test contact pin (12), In, the elastic spring (7) is located at top, the lower top flat (8) in cavity (6) and is bonded with cavity (6), lower top flat (8) and hand Handle (9) is connected, and the limit plate (10) is located at the top of cavity (6), and the test contact pin (12) is located at lower top flat (8) and limit plate (10) between, the test connector (11) is located above cavity (6).

2. micro-strip device test fixture according to claim 1, it is characterised in that: the micro-strip device test fixture also wraps It includes foot pad (5), the foot pad (5) is located at substrate (1) bottom.