CN208060025U - Realize the light path of two width interference patterns of the polarization state and phase that measure arbitrary beam - Google Patents
Realize the light path of two width interference patterns of the polarization state and phase that measure arbitrary beam Download PDFInfo
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- CN208060025U CN208060025U CN201820539153.7U CN201820539153U CN208060025U CN 208060025 U CN208060025 U CN 208060025U CN 201820539153 U CN201820539153 U CN 201820539153U CN 208060025 U CN208060025 U CN 208060025U
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Abstract
The utility model is related to realize the light path of two width interference patterns of the polarization state of measurement arbitrary beam and phase, to complete that the polarization state of arbitrary beam and the method for phase are proposed while measured based on geometric phase theory, this light path includes depolarization Amici prism and polarization beam splitting system；Reference beam and measured light beam are inputted from two orthogonal directions of depolarization Amici prism respectively, and the injection light path of depolarization Amici prism is equipped with polarization beam splitting system, and the output of polarization beam splitting system obtains two width interference patterns.On the basis of two obtained width interference pattern, implement at the same measure arbitrary beam polarization state and phase method when, it only needs once to acquire two width interference patterns simultaneously, by carrying out holographic numerical reconstruction to interference pattern, extract phase therein, amplitude information, you can calculate the polarization and phase distribution of measured light beam.The utility model cannot be only used for measuring the polarization state and phase distribution of arbitrary beam, it can also be used to detect polarization optical element.
Description
Technical Field
The invention belongs to the technical field of photoelectricity, and relates to a light path for measuring two interference patterns of polarization states and phases of any light beams.
Background
The polarization state is an important feature of the optical field and plays an important role in basic scientific research and engineering applications. The polarization state of a conventional beam is spatially uniform and is often referred to as a scalar beam. When the light beam is subjected to spatial polarization modulation, a spatially non-uniformly polarized light beam, namely a vector light beam, can be generated. The most typical vector light beam is a cylindrical vector light beam with a polarization state showing axisymmetric distribution in a space coordinate system, and can obtain special focal field distribution after being focused by a high numerical aperture lens, for example, a radial vector light beam can generate a focal spot with a super-diffraction limit, and further can generate a plurality of singular structural focal fields such as an optical needle, an optical cage, an optical chain and the like after being modulated by an optical element. The unique tight focusing characteristic and polarization characteristic of the vector beam enable the vector beam to have wide application prospects in the aspects of ultra-fine processing, plasma focusing, super-resolution imaging and the like.
The Stokes (Stokes) parameter may fully describe the polarization state of the light field. The most common measurement method at present is to use a quarter-wave plate and a polarizer combination, record intensity maps corresponding to different angles, and then obtain corresponding stokes parameters through numerical analysis. In the measuring process, the quarter-wave plate and the polaroid are required to be rotated to record the intensity distribution of different angles in sequence, so the measuring process is complex and slow. And the non-uniform transmittance of the wave plate can cause certain system errors. Furthermore, when measuring the phase distribution of a vector light field using these methods, more complicated operations and algorithms are required. In order to measure the polarization state and phase of a light beam synchronously, researchers propose to measure the polarization state and phase of the light beam by using an interference phase shift method, but the method can only be used for measuring the light beam with a linear polarization state in a local polarization state and has certain limitation, and the method also needs to acquire a plurality of images, so that the process is complex and slow.
Disclosure of Invention
Technical problem to be solved
In order to avoid the defects of the prior art, the invention provides a light path for realizing two interference patterns for measuring the polarization state and the phase of any light beam.
Technical scheme
A light path for realizing two interference patterns for measuring the polarization state and phase of any light beam is characterized by comprising a depolarization beam splitter prism 1 and a polarization beam splitting system 2; the reference beam and the measured beam are respectively input from two orthogonal directions of the depolarization beam splitter prism 1, a polarization beam splitting system 2 is arranged on an emergent light path of the depolarization beam splitter prism 1, and two interference patterns are obtained through the output of the polarization beam splitting system 2.
The method comprises the steps of interchanging a depolarization beam splitting prism 1 and a polarization beam splitting system 2 in a front-back sequence, inputting a measured light beam into the polarization beam splitting system 2, arranging the depolarization beam splitting prism 1 on an output light path of the polarization beam splitting system 2, inputting two interference light beams output by the polarization beam splitting system 2 and a reference light beam from the depolarization beam splitting prism 1 in two orthogonal directions respectively, and obtaining two interference patterns from the output of the depolarization beam splitting prism 1.
The polarization beam splitting system 2 adopts a triangular interferometer.
The polarization beam splitting system 2 comprises a quarter wave plate 8 and a beam shifter 12; the quarter-wave plate 8 is located at the front end of the optical path of the beam shifter 12, and the light beam enters the beam shifter 12 after passing through the quarter-wave plate 8 to form two beams of interference light output.
The polarization beam splitting system 2 comprises a quarter wave plate 8 and a Wollaston prism 13, the quarter wave plate is positioned at the front end of a light path of the Wollaston prism 13, and light beams enter the Wollaston prism 13 after passing through the quarter wave plate to form two beams of interference light to be output.
The triangular interferometer comprises a quarter-wave plate 8, a first reflecting mirror 9, a second reflecting mirror 10 and a polarization beam splitter prism 11; the quarter-wave plate 8 is positioned at the front end of the light path of the polarization beam splitter prism 11; the first reflector 9, the second reflector 10 and the polarization beam splitter prism 11 form a triangular interferometer; the light beam is input into the triangular interferometer after passing through the quarter-wave plate 8, and then two beams of light beams with mutually orthogonal polarization states are output by the triangular interferometer.
Advantageous effects
The invention provides a light path for realizing two interferograms for measuring the polarization state and the phase of any light beam, and provides a method for simultaneously measuring the polarization state and the phase of any light beam for completing the geometric phase theory, wherein the light path comprises a depolarization beam splitter prism 1 and a polarization beam splitting system 2; a reference beam and a measured beam are respectively input from two orthogonal directions of a depolarization beam splitter prism 1, a polarization beam splitting system 2 is arranged on an emergent light path of the depolarization beam splitter prism 1, and two interference patterns are obtained through the output of the polarization beam splitting system 2; or the front and back of the depolarization beam splitter prism 1 and the polarization beam splitting system 2 are exchanged in sequence, and two interference patterns can be obtained through output. On the basis of the two obtained interference patterns, when the method for simultaneously measuring the polarization state and the phase of any beam is implemented, the two interference patterns are acquired at the same time, the holographic numerical reconstruction is carried out on the interference patterns, the phase and amplitude information in the interference patterns is extracted, and the polarization and phase distribution of the measured beam can be calculated. The invention can be used for measuring the polarization state and phase distribution of any light beam and can also be used for detecting a polarization optical element.
Drawings
FIGS. 1 and 2 are schematic structural diagrams for efficiently and synchronously measuring the polarization state and the phase of any light beam, which are provided by the invention; in the figure, 1-depolarization beam splitter prism and 2-polarization beam splitting system.
Fig. 3 is a schematic diagram of a polarization beam splitting system 2 that can be formed in fig. 1 and 2, wherein fig. (a), (b), and (c) correspond to a first polarization beam splitting system 5, a second polarization beam splitting system 6, and a third polarization beam splitting system 7, respectively; in FIG. (a), 8-quarter wave plate, 9-first mirror, 10-second mirror, 11-polarizing beam splitter prism; in FIG. (b), 12-Beam shifter; in FIG. c, the 13-Wollaston prism.
FIG. 4 is a schematic diagram of a specific implementation optical path and structure for synchronously measuring the polarization state and phase of any light beam by using the principle of FIG. 1. In the figure, 14-light source, 15-first half wave plate, 16-first depolarization beam splitter prism, 17-second half wave plate, 18-first reflector, 19-second reflector, 20-polarization conversion system, 21-second depolarization beam splitter prism, and 22-polarization beam splitting system corresponding to fig. 3.
FIG. 5 is a graph showing the results of measuring a first order vector beam carrying a tapered phase using the experimental optical path of FIG. 4 in accordance with the present invention. In the figure, the first line is two interferograms which are acquired by a CCD camera at the same time; the second action is to obtain the corresponding results after analyzing the recorded interferogram, namely the intensity of the vector light field and the Stokes parameter S from left to right1、S2、S3The cone phase carried by the beam
Detailed Description
The invention will now be further described with reference to the following examples and drawings:
based on the geometric phase theory, the method for efficiently and synchronously measuring the polarization state and the phase of any light beam comprises the following steps:
the two orthogonal polarization components of the measured light beam and the linear polarization reference light beam are respectively superposed to form two interference fields, after the two interference fields are separated by the polarization beam splitting system, two interference patterns are simultaneously collected and processed to obtain phase and amplitude information of the two interference patterns, and the polarization state and the phase distribution of the measured light beam are obtained through calculation.
The key of the method for realizing efficient synchronous measurement of the polarization state and the phase of any beam is to obtain two interferograms of a measured beam and a linearly polarized reference beam, and the adopted light path is as follows: firstly, a reference beam and a measured beam can pass through a depolarization beam splitter prism 1 and then are superposed and interfered, and then the interference beam is decomposed into two orthogonal polarization components by a polarization beam splitting system 2 and is transmitted in a separated mode; secondly, the measured light beam is decomposed into two orthogonal polarization components by the polarization beam splitting system 3 and is transmitted in a separation mode, and then the two orthogonal polarization components enter the depolarization beam splitting prism 4 to interfere with the reference light beam.
The polarization beam splitting systems 2, 3 may each be constituted by a polarization beam splitting system 5 or a polarization beam splitting system 6 or by a polarization beam splitting system 7.
The beam splitting system 5 consists of a quarter-wave plate 8 and a triangular interferometer consisting of reflecting mirrors 9 and 10 and a polarization beam splitter prism 11; the beam splitting system 6 is composed of a quarter wave plate 12 and a beam shifter 13; the beam splitting system 7 is formed by a quarter wave plate 14 and a wollaston prism 15.
Example (b): as shown in fig. 4, the linearly polarized light beam output by the coherent light source 14 changes its orthogonal polarization component amplitude ratio by the first half-wave plate 15, and is divided into two beams of mutually perpendicular transmission light and reflection light by the first depolarizing beam splitter 16, the transmission light changes the polarization direction by the second half-wave plate 17, and forms a reference beam polarized in the 45 ° direction, and then enters the second depolarizing beam splitter 21 after being reflected by the first reflector 18; the reflected light is reflected by the second reflecting mirror 19, enters the polarization conversion system 20 to generate a measured light beam, and then enters the second depolarizing beam splitter prism 21. The reference beam and the measured beam pass through the second depolarizing beam splitter prism 21 and then are superimposed and interfered, and pass through the polarization beam splitting system 22, so that two orthogonal polarization components of the interference beam are separated, two interference beams transmitted in parallel at a certain interval are formed in a space domain, and two interference patterns are simultaneously collected by one CCD detector as shown in the first line of fig. 4.
The measurement process can be divided into two schemes for the polarization beam splitting system 22 including the quarter-wave plate 8:
the first scheme is as follows: the polarization beam splitting system 22 includes a quarter wave plate 8.
Scheme II: the quarter wave plate 8 is not included in the polarization beam splitting system 22.
Therefore, the calculation methods of interferograms corresponding to different schemes are slightly different: based on the geometric phase theory, the interference pattern intensities of two polarization components are assumed to be I respectivelyPAnd IP’The corresponding complex amplitudes are respectively E calculated by holographic numerical techniquePAnd eP’The polarization state of the measured beam can be determined from the azimuthal angle phi on the poincare sphereiX shape of polar angleiCoordinate (2 psi)i,2χi) (i ═ 1,2 for case one and case two, respectively) determine:
the Stokes parameter (S) of the light beam is measured1,S2,S3) Can be expressed as:
the phase carried by the measured beam can be expressed as:
wherein,wherein,andePAnd ePThe phase of.
In this example, the polarization beam splitting system 22 adopts the first scheme, and the first polarization beam splitting system 5 is used to extract the complex amplitude of the interferogram to obtain the intensity and the stokes parameter S of the measured light beam1、S2、S3The phase profile is shown in the second row of fig. 4. From the experimental result map it can be determined that the measured beam is an angularly polarized beam carrying a conical phase.
Claims (6)
1. An optical path for realizing two interference patterns for measuring the polarization state and the phase of any light beam is characterized by comprising a depolarization beam splitter prism (1) and a polarization beam splitting system (2); the reference beam and the measured beam are respectively input from two orthogonal directions of the depolarization beam splitter prism (1), a polarization beam splitting system (2) is arranged on an emergent light path of the depolarization beam splitter prism (1), and two interference patterns are obtained through the output of the polarization beam splitting system (2).
2. The optical path for realizing two interferograms for measuring the polarization state and phase of an arbitrary beam according to claim 1, characterized in that: the method comprises the steps that a depolarization beam splitter prism (1) and a polarization beam splitting system (2) are sequentially exchanged front and back, a measured light beam is input into the polarization beam splitting system (2), the depolarization beam splitter prism (1) is arranged on an output light path of the polarization beam splitting system (2), two interference light beams and a reference light beam output by the polarization beam splitting system (2) are respectively input from two orthogonal directions of the depolarization beam splitter prism (1), and two interference images are obtained through the output of the depolarization beam splitter prism (1).
3. The optical circuit according to claim 1 or 2, characterized in that: the polarization beam splitting system (2) adopts a triangular interferometer.
4. The optical circuit according to claim 1 or 2, characterized in that: the polarization beam splitting system (2) comprises a quarter wave plate (8) and a beam shifter (12); the quarter-wave plate (8) is positioned at the front end of the light path of the light beam shifter (12), and light beams enter the light beam shifter (12) after passing through the quarter-wave plate (8) to form two beams of interference light output.
5. The optical circuit according to claim 1 or 2, characterized in that: the polarization beam splitting system (2) comprises a quarter wave plate (8) and a Wollaston prism (13), the quarter wave plate is located at the front end of a light path of the Wollaston prism (13), and light beams enter the Wollaston prism (13) after passing through the quarter wave plate to form two beams of interference light to be output.
6. The optical circuit of claim 3, wherein: the triangular interferometer comprises a quarter-wave plate (8), a first reflector (9), a second reflector (10) and a polarization beam splitter prism (11); the quarter-wave plate (8) is positioned at the front end of the light path of the polarization beam splitter prism (11); the first reflector (9), the second reflector (10) and the polarization beam splitter prism (11) form a triangular interferometer; the light beams are input into the triangular interferometer after passing through the quarter-wave plate (8), and then two light beams with mutually orthogonal polarization states are output by the triangular interferometer.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108593114A (en) * | 2018-04-16 | 2018-09-28 | 西北工业大学 | A kind of method and light path of the polarization state and phase of high efficiency synchronous measurement arbitrary beam |
| CN111025668A (en) * | 2019-12-30 | 2020-04-17 | 珠海光库科技股份有限公司 | Optical device integrating polarization coherent beam splitting |
| CN111780873A (en) * | 2020-07-10 | 2020-10-16 | 天津大学 | Prism type interference measuring device |
| CN115442493A (en) * | 2022-08-12 | 2022-12-06 | 西北工业大学 | Asymmetric optical encryption method based on Poincare sphere basis vector conversion |
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2018
- 2018-04-16 CN CN201820539153.7U patent/CN208060025U/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108593114A (en) * | 2018-04-16 | 2018-09-28 | 西北工业大学 | A kind of method and light path of the polarization state and phase of high efficiency synchronous measurement arbitrary beam |
| CN108593114B (en) * | 2018-04-16 | 2020-04-03 | 西北工业大学 | Method and light path for efficiently and synchronously measuring polarization state and phase of any light beam |
| CN111025668A (en) * | 2019-12-30 | 2020-04-17 | 珠海光库科技股份有限公司 | Optical device integrating polarization coherent beam splitting |
| CN111025668B (en) * | 2019-12-30 | 2023-04-25 | 珠海光库科技股份有限公司 | Optical device integrating polarization coherent beam splitting |
| CN111780873A (en) * | 2020-07-10 | 2020-10-16 | 天津大学 | Prism type interference measuring device |
| CN115442493A (en) * | 2022-08-12 | 2022-12-06 | 西北工业大学 | Asymmetric optical encryption method based on Poincare sphere basis vector conversion |
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