CN205910222U - Improved Needle Seat Structure of Inspection Fixture - Google Patents
Improved Needle Seat Structure of Inspection Fixture Download PDFInfo
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- 238000007689 inspection Methods 0.000 title 1
- 238000001514 detection method Methods 0.000 claims abstract description 72
- 239000000523 sample Substances 0.000 claims abstract description 66
- 238000012360 testing method Methods 0.000 claims abstract description 63
- 239000000463 material Substances 0.000 claims abstract description 50
- 239000000758 substrate Substances 0.000 claims abstract description 36
- 238000000034 method Methods 0.000 claims description 6
- 239000004020 conductor Substances 0.000 claims description 5
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- 230000000149 penetrating effect Effects 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 9
- 238000003780 insertion Methods 0.000 abstract description 6
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Abstract
Description
技术领域technical field
本实用新型涉及一种改进的检测治具的针座结构,尤指针座的基座上方迭放有基材,且基座表面的多个第一穿孔错位于基材表面的多个第二穿孔,以使第一穿孔与第二穿孔间插设的测试探针形成倾斜部,即可使多个测试探针限位于基座与基材间,从而不会发生掉落的情形。The utility model relates to an improved needle seat structure of a detection fixture, in particular base materials are stacked above the base of the needle seat, and multiple first perforations on the surface of the base are staggered to multiple second perforations on the surface of the base material In this way, the test probes inserted between the first through hole and the second through hole form an inclined portion, so that a plurality of test probes can be limited between the base and the base material, so as not to fall.
背景技术Background technique
目前电路板上由多个配线来构成的配线图案(pattern),其必须向电路板所搭载的IC、半导体或电阻器等电子部件传递正确的电子信号,以往针对未安装半导体或电子部件等印刷电路板、柔性(flexiBle)基板、多层配线基板、液晶屏(LCD panel)或等离子显示屏(plasma display panel)等所使用的形成配线图案的电路配线基板,或半导体芯片等基板上所形成的配线图案来作为检测对象,以检测配线图案上所设置的多个检测点间的电阻值,用以判断出其电气特性是否良好。At present, the wiring pattern (pattern) composed of multiple wirings on the circuit board must transmit correct electronic signals to electronic components such as ICs, semiconductors, and resistors mounted on the circuit board. Circuit wiring boards such as printed circuit boards, flexible (flexiBle) substrates, multilayer wiring boards, liquid crystal panels (LCD panels) or plasma display panels (plasma display panels) that form wiring patterns, or semiconductor chips, etc. The wiring pattern formed on the substrate is used as the detection object to detect the resistance value between a plurality of detection points set on the wiring pattern to determine whether its electrical characteristics are good or not.
如图9、图10所示为现有的立体外观图及探针的侧视剖面图,由图中可清楚看出,目前为了检测电路板上的配线图案是否按设计完成,便提出了实际应用于各种电路板的检测治具,该检测治具包括检测装置A、缆线部B及检测平台C,其中该检测装置A可用于处理电气信号的导通状态,并通过缆线部B电性连接于检测平台C,检测平台C上方设置有检测用针座C1,且针座C1包括上支撑板C11、下支撑板C12、多个支撑杆C13及多个探针C14,其中该上支撑板C11、下支撑板C12为呈上、下间隔设置,且上支撑板C11、下支撑板C12为分别由多个第一板材C111、多个第二板材C121所组成,再于上支撑板C11贯设有多个第一穿孔C112,下支撑板C12贯设有与多个第一穿孔C112形成错位状态的多个第二穿孔C122,且该多个支撑杆C13为设置于上支撑板C11、下支撑板C12之间,以供支撑、固定上支撑板C11、下支撑板C12,该多个探针C14则分别穿设于上支撑板C11、下支撑板C12之间,且一端为穿入至多个第一穿孔C112内,以供电性接触于电路板上配线图案的多个检测点,另一端则穿入至多个第二穿孔C122内并电性连接于缆线部B的多个导线B1,即可通过此检测装置A来检测电路板的配线图案上的多个检测点之间是否电路断开或电路导通。As shown in Figure 9 and Figure 10, the existing three-dimensional appearance diagram and the side view sectional view of the probe can be clearly seen from the figure. At present, in order to detect whether the wiring pattern on the circuit board is completed according to the design, a It is actually applied to the detection fixture of various circuit boards. The detection fixture includes a detection device A, a cable part B and a detection platform C. The detection device A can be used to process the conduction state of the electrical signal, and through the cable part B is electrically connected to the detection platform C, and the needle base C1 for detection is arranged above the detection platform C, and the needle base C1 includes an upper support plate C11, a lower support plate C12, a plurality of support rods C13 and a plurality of probes C14, wherein the The upper support plate C11 and the lower support plate C12 are set up and down at intervals, and the upper support plate C11 and the lower support plate C12 are respectively composed of a plurality of first plates C111 and a plurality of second plates C121, and then supported on the upper The board C11 is provided with a plurality of first through holes C112, and the lower support plate C12 is provided with a plurality of second through holes C122 in a dislocation state with the plurality of first through holes C112, and the plurality of support rods C13 are arranged on the upper support plate Between C11 and the lower support plate C12, for supporting and fixing the upper support plate C11 and the lower support plate C12, the plurality of probes C14 are respectively installed between the upper support plate C11 and the lower support plate C12, and one end is Penetrate into a plurality of first through holes C112, and contact multiple detection points of the wiring pattern on the circuit board with power supply, and the other end penetrates into a plurality of second through holes C122 and is electrically connected to multiple detection points of the cable part B. A wire B1 can be used to detect whether the circuit is disconnected or the circuit is connected between multiple detection points on the wiring pattern of the circuit board through the detection device A.
另外,由于针座C1的上支撑板C11所穿设的多个第一穿孔C112为依照配线图案上的多个检测点做孔位设计,且多个第一穿孔C112与多个第二穿孔C122为呈错位状态,即可通过错位的方式来避免多个探针C14从上支撑板C11与下支撑板C12之间发生脱离的情况,所以当多个探针C14两端插入至第一穿孔C112及多个第二穿孔C122内时,会使多个探针C14呈倾斜状,且因多个探针C14倾斜角度、插设方向是依配线图案上的多个检测点做设计,导致并无统一性,且必须通过人工的方式,才可将多个探针C14一一插设至上支撑板C11与下支撑板C12之间,其不仅需要大量的人力,亦需要耗费大量的时间来进行插设作业,以致于制造的成本高居不下。In addition, since the multiple first through holes C112 pierced by the upper support plate C11 of the needle seat C1 are designed according to the multiple detection points on the wiring pattern, and the multiple first through holes C112 are connected with the multiple second through holes. C122 is in a dislocation state, which can prevent multiple probes C14 from detaching from the upper support plate C11 and the lower support plate C12 by means of dislocation, so when the two ends of multiple probes C14 are inserted into the first through hole When C112 and multiple second through holes C122 are inside, the multiple probes C14 will be inclined, and because the multiple probes C14 are inclined and inserted according to the design of multiple detection points on the wiring pattern, resulting in There is no uniformity, and a plurality of probes C14 must be manually inserted between the upper support plate C11 and the lower support plate C12, which not only requires a lot of manpower, but also takes a lot of time. The insertion operation is carried out, so that the manufacturing cost remains high.
另外,该针座C1的多个探针C14具有可导电的线材C141,且线材C141外表面通常涂布有绝缘层C142,用以防止相邻多个探针C14间形成电性接触,进而发生短路的情况,然而,由于多个探针C14需分别于外表面上涂布有绝缘层C142,以致于使加工作业复杂,进而提高整体加工上的成本,且若绝缘层C142涂布不确实、均匀,将会产生探针C14未电性导通于检测点或缆线部B的导线B1的情形,亦或相邻多个探针C14间发生短路的现象,导致降低使用上的可靠度。In addition, the multiple probes C14 of the needle base C1 have conductive wires C141, and the outer surface of the wires C141 is usually coated with an insulating layer C142 to prevent electrical contact between adjacent multiple probes C14, thereby causing In the case of a short circuit, however, since a plurality of probes C14 need to be coated with an insulating layer C142 on the outer surface, so that the processing operation is complicated, thereby increasing the overall processing cost, and if the insulating layer C142 is not coated properly, Evenly, the probe C14 will not be electrically connected to the detection point or the wire B1 of the cable part B, or a short circuit will occur between a plurality of adjacent probes C14, resulting in reduced reliability in use.
因此,如何设法解决上述问题,即为本领域技术人员亟欲研究改善的方向。Therefore, how to try to solve the above problems is the direction that those skilled in the art want to study and improve.
实用新型内容Utility model content
本实用新型的主要目的在于该基座表面上贯设有多个第一穿孔及多个第一定位孔,基座上方迭放有基材,且基材表面上贯设有与多个第一穿孔形成错位状态的多个第二穿孔,以及与多个第一定位孔形成对正状态的多个第二定位孔,其欲将多个测试探针设置于基座及基材之间时,先将多个第一穿孔对正于多个第二穿孔处,再将多个测试探针分别插入至多个第一穿孔与多个第二穿孔间,且待插设完成后,再使多个第一定位孔与多个第二定位孔形成对正状态,并于内部插设固定组件,以使基座与基材呈一稳固定位,同时,其测试探针会受到第一穿孔与第二穿孔内壁面的挤压,从而形成出倾斜部,便可通过倾斜部来将测试探针限位于基座与基材间,以防止从基座与基材间发生脱离、掉落的情形,且由于基材迭放于基座上方,便可省略现有技术中采用的多个支撑杆,以减少制造、降低成本,达到提升整体竞争力的目的。The main purpose of the present utility model is that the surface of the base is provided with a plurality of first through holes and a plurality of first positioning holes, the substrate is stacked above the base, and the surface of the substrate is provided with a plurality of first positioning holes. The perforations form a plurality of second perforations in a misaligned state, and a plurality of second positioning holes in an aligned state with a plurality of first positioning holes. When it is intended to arrange a plurality of test probes between the base and the substrate, Align the multiple first through-holes with the multiple second through-holes first, then insert multiple test probes between the multiple first through-holes and the multiple second through-holes, and after the insertion is completed, make the multiple test probes The first positioning hole and multiple second positioning holes form an alignment state, and a fixing component is inserted inside, so that the base and the substrate are in a stable position, and at the same time, the test probe will be affected by the first through hole and the second The extrusion of the inner wall surface of the perforation forms an inclined part, and the test probe can be limited between the base and the substrate through the inclined part, so as to prevent the situation of detachment and falling from between the base and the substrate, and Since the base material is stacked on the base, multiple supporting rods used in the prior art can be omitted, so as to reduce manufacturing and cost, and achieve the purpose of improving the overall competitiveness.
本实用新型的次要目的在于该针座的基座与基材间欲装设多个测试探针时,其多个第一穿孔与多个第二穿孔呈对正状态,所以多个测试探针便可通过自动化的机械设备来执行插设作业,其不仅可减少人力成本,亦可使插设作业更加地快速、精确,进而达到提高制造效率的同时,亦具有更高的产品合格率的目的。The secondary purpose of this utility model is that when a plurality of test probes are to be installed between the base of the needle base and the base material, the plurality of first perforations and the plurality of second perforations are aligned, so that the plurality of test probes The needles can be inserted and inserted through automated mechanical equipment, which can not only reduce labor costs, but also make the insertion and insertion operations faster and more accurate, thereby improving manufacturing efficiency and having a higher product qualification rate. Purpose.
本实用新型的另一目的于该针座的基材迭放于基座上方,所以当基座与基材之间插设有多个测试探针时,即可通过基座与基材来防止相邻多个测试探针间产生电性接触的情况,以避免发生短路的情形,且该多个测试探针外表面亦不需涂布有绝缘层,便可减少加工作业的难度,进而达到降低制造成本的目的。Another purpose of the utility model is that the base material of the needle holder is stacked above the base, so when a plurality of test probes are inserted between the base and the base material, the base and the base material can be used to prevent the Electrical contacts are generated between adjacent multiple test probes to avoid short circuits, and the outer surfaces of the multiple test probes do not need to be coated with an insulating layer, which can reduce the difficulty of processing operations, thereby achieving The purpose of reducing manufacturing costs.
为了达到上述目的,本实用新型提供了一种改进的检测治具的针座结构,该针座包括基座、基材及多个测试探针,其中:In order to achieve the above purpose, the utility model provides an improved needle seat structure of a detection fixture, the needle seat includes a base, a base material and a plurality of test probes, wherein:
该基座表面上贯设有多个第一穿孔,且基座表面上于多个第一穿孔周围处贯设有多个第一定位孔;The surface of the base is provided with a plurality of first through holes, and the surface of the base is provided with a plurality of first positioning holes around the plurality of first through holes;
该基材迭放于基座上方,并于基材表面上贯设有组装后与多个第一穿孔形成错位状态且对应于预设电路板的多个测试点位置处的多个第二穿孔,再于基材表面上且于多个第二穿孔周围处贯设有对正于多个第一定位孔处以供预设固定组件穿过并使基座与基材固定的多个第二定位孔;及The substrate is stacked above the base, and the surface of the substrate is provided with a plurality of second through-holes that are misaligned with the plurality of first through-holes after assembly and correspond to the positions of a plurality of test points of a predetermined circuit board. , and on the surface of the substrate and around the plurality of second through holes, a plurality of second positioning holes aligned with the plurality of first positioning holes are provided for passing the preset fixing component and fixing the base and the substrate hole; and
该多个测试探针为导电材质所制成且设置于基座及基材之间,并于测试探针一侧设有插入至第一穿孔内的第一端部,另一侧设有插入至第二穿孔内并与预设电路板的测试点形成电性接触的第二端部,且第一端部与第二端部之间形成有倾斜部。The plurality of test probes are made of conductive material and arranged between the base and the substrate, and one side of the test probes is provided with a first end inserted into the first through hole, and the other side is provided with an insert The second end portion is inserted into the second through hole and forms electrical contact with the test point of the predetermined circuit board, and an inclined portion is formed between the first end portion and the second end portion.
在本实用新型的一实施例中,该基座与基材呈长矩形。In an embodiment of the present invention, the base and the base material are long and rectangular.
在本实用新型的一实施例中,该基座的多个第一定位孔内侧壁面设有螺纹。In an embodiment of the present invention, the inner wall surfaces of the plurality of first positioning holes of the base are provided with threads.
为了达到上述目的,本实用新型还提供了另一种改进的检测治具的针座结构,包括检测治具及针座,其中:In order to achieve the above purpose, the utility model also provides another improved needle base structure of the detection jig, including the detection jig and the needle base, wherein:
该检测治具具有用以处理预设电路板的多个测试点间电气信号的导通状态的检测装置,并于检测装置一侧电性连接有具有多个导线的缆线部,且缆线部另一侧连接有检测平台,再于检测平台上贯设有供多个导线分别穿入的多个透孔;及The detection jig has a detection device for processing the conduction state of electrical signals between a plurality of test points of a predetermined circuit board, and a cable part with a plurality of wires is electrically connected to one side of the detection device, and the cable The other side of the part is connected to a detection platform, and a plurality of through holes for a plurality of wires to respectively pass through are formed on the detection platform; and
该针座包括基座、基材及多个测试探针,其中该基座定位于检测平台上方,并于基座表面上对位于检测平台的多个透孔处贯设有多个第一穿孔,再于基座表面上位于多个第一穿孔周围处贯设有多个第一定位孔,且该基座上方迭放有基材,并于基材表面上贯设有组装后与多个第一穿孔形成错位状态且对应于预设电路板的多个测试点位置处的多个第二穿孔,再于基材表面上且位于多个第二穿孔周围处贯设有对正于多个第一定位孔处以供预设固定组件穿过并使基座与基材固定的多个第二定位孔,该多个测试探针为导电材质所制成且设置于基座及基材之间,并于测试探针一侧设有插入至第一穿孔内且与缆线部的多个导线形成电性接触的第一端部,另一侧设有插入至第二穿孔内并与预设电路板的测试点形成电性接触的第二端部,再于第一端部与第二端部之间形成有倾斜部。The needle seat includes a base, a base material and a plurality of test probes, wherein the base is positioned above the detection platform, and a plurality of first through holes are formed on the surface of the base at the plurality of through holes located on the detection platform , and a plurality of first positioning holes are provided on the surface of the base around the plurality of first through holes, and a base material is stacked above the base, and a plurality of assembled and multiple positioning holes are provided on the surface of the base material. The first through-holes form a dislocation state and correspond to a plurality of second through-holes at a plurality of test point positions of the preset circuit board, and then on the surface of the substrate and located around the plurality of second through-holes, there are aligned multiple second through-holes. The first positioning hole is a plurality of second positioning holes for the predetermined fixing component to pass through and fix the base and the substrate, the plurality of test probes are made of conductive material and arranged between the base and the substrate , and one side of the test probe is provided with a first end that is inserted into the first through hole and forms electrical contact with a plurality of wires of the cable part, and the other side is provided with a first end that is inserted into the second through hole and is in contact with the preset The test point of the circuit board forms the second end portion of electrical contact, and a slope portion is formed between the first end portion and the second end portion.
在本实用新型的一实施例中,该针座的基座底面设有多个限位孔,该检测治具的检测平台表面上对应于多个限位孔处设有供定位于多个限位孔内的多个定位凸点。In one embodiment of the present utility model, the bottom surface of the base of the needle base is provided with a plurality of limit holes, and the surface of the detection platform of the detection jig is provided with positions corresponding to the plurality of limit holes for positioning in a plurality of limit holes. Multiple positioning bumps in bit holes.
在本实用新型的一实施例中,该针座的基座与基材呈长矩形。In an embodiment of the present invention, the base and the base material of the needle holder are in the shape of a long rectangle.
在本实用新型的一实施例中,该基座的多个第一定位孔内侧壁面设有螺纹。In an embodiment of the present invention, the inner wall surfaces of the plurality of first positioning holes of the base are provided with threads.
附图说明Description of drawings
图1为本实用新型的立体外观图;Fig. 1 is the three-dimensional exterior view of the utility model;
图2为本实用新型的立体分解图;Fig. 2 is a three-dimensional exploded view of the utility model;
图3为本实用新型另一视角的立体分解图;Fig. 3 is a three-dimensional exploded view of another perspective of the utility model;
图4为本实用新型组装时的侧视剖面图(一);Figure 4 is a side view sectional view (1) when the utility model is assembled;
图5为本实用新型组装时的侧视剖面图(二);Fig. 5 is a side view sectional view (two) when the utility model is assembled;
图6为本实用新型组装时的侧视剖面图(三);Figure 6 is a side view sectional view (three) when the utility model is assembled;
图7为本实用新型中的针座装设于检测治具的检测平台前的立体外观图;Fig. 7 is a three-dimensional appearance view of the needle seat installed in front of the detection platform of the detection fixture in the present invention;
图8为本实用新型中的针座装设于检测治具的检测平台后的立体外观图;Fig. 8 is a three-dimensional appearance view of the needle seat installed on the detection platform of the detection fixture in the present invention;
图9为现有的探针的立体外观图;Fig. 9 is a perspective view of an existing probe;
图10为现有的探针的侧视剖面图。Fig. 10 is a side sectional view of a conventional probe.
附图标记说明:1-针座;11-基座;111-第一穿孔;112-第一定位孔;1121-螺纹;113-限位孔;12-基材;121-第二穿孔;122-第二定位孔;13-测试探针;131-第一端部;132-第二端部;133-倾斜部;14-固定组件;141-固定插梢;142-螺丝;2-检测治具;21-检测平台;211-定位凸点;212-透孔;22-缆线部;221-导线;23-检测装置;A-检测装置;B-缆线部;B1-导线;C-检测平台;C1-针座;C11-上支撑板;C111-第一板材;C112-第一穿孔;C12-下支撑板;C121-第二板材;C122-第二穿孔;C13-支撑杆;C14-探针;C141-线材;C142-绝缘层。Explanation of reference signs: 1-needle seat; 11-base; 111-first through hole; 112-first positioning hole; 1121-thread; 113-limiting hole; 12-base material; 121-second through hole; 122 - second positioning hole; 13 - test probe; 131 - first end; 132 - second end; 133 - inclined part; 14 - fixed component; 141 - fixed pin; Tool; 21-detection platform; 211-positioning bump; 212-through hole; 22-cable part; 221-wire; 23-detection device; A-detection device; B-cable part; B1-wire; C- Detection platform; C1-needle seat; C11-upper support plate; C111-first plate; C112-first perforation; C12-lower support plate; C121-second plate; C122-second perforation; C13-support rod; C14 -probe; C141-wire; C142-insulation.
具体实施方式detailed description
为达成上述目的及功效,本实用新型所采用的技术手段及其构造,兹绘图就本创作的较佳实施例详加说明其特征与功能如下。In order to achieve the above-mentioned purpose and effect, the technical means and the structure thereof adopted by the utility model are hereby drawn to illustrate in detail its features and functions as follows with regard to the preferred embodiment of this creation.
如图1、图2、图3所示分别为本实用新型的立体外观图、立体分解图及另一视角的立体分解图,由图中所示可以清楚看出,本实用新型中的针座1包括基座11、基材12及多个测试探针13,其中:Shown in Fig. 1, Fig. 2, Fig. 3 are three-dimensional appearance diagram, three-dimensional exploded view and the three-dimensional exploded view of another angle of view of the present utility model respectively, it can be clearly seen from the figure that the needle holder in the present utility model 1 includes a base 11, a substrate 12 and a plurality of test probes 13, wherein:
该基座11表面上贯设有多个第一穿孔111,且第一穿孔111周围处贯设有多个第一定位孔112,再于基座11底面设有多个限位孔113。A plurality of first through holes 111 are formed on the surface of the base 11 , and a plurality of first positioning holes 112 are formed around the first through holes 111 , and a plurality of limiting holes 113 are formed on the bottom of the base 11 .
该基材12表面上贯设有与多个第一穿孔111形成错位状态且对应于外部电路板(图中未示出)的多个测试点位置处的多个第二穿孔121,再于基材12表面上且于多个第二穿孔121周围处贯设有对正于多个第一定位孔112处的多个第二定位孔122。The surface of the base material 12 is provided with a plurality of second through-holes 121 which form a dislocation state with the plurality of first through-holes 111 and correspond to a plurality of test point positions of an external circuit board (not shown in the figure). A plurality of second positioning holes 122 aligned with the plurality of first positioning holes 112 is formed on the surface of the material 12 and around the plurality of second through holes 121 .
该测试探针13为导电材质所制成,并于两侧分别设有第一端部131及第二端部132。The test probe 13 is made of conductive material, and has a first end 131 and a second end 132 on both sides respectively.
上述基座11与基材12于较佳实施例中为各由一片板材所组成,但于实际应用时,亦可分别由两片、三片或三片以上的多个板材所组成,故举凡可达成前述效果的结构皆应受本实用新型所涵盖,此种简易修饰及等效结构变化,均应同理包括于本实用新型的保护范围内,合予陈明。The above-mentioned base 11 and base material 12 are each composed of one plate in a preferred embodiment, but in actual application, they can also be composed of two, three or more than three plates. All structures that can achieve the aforementioned effects should be covered by the present invention, and such simple modifications and equivalent structural changes should be included in the scope of protection of the present invention in the same way.
另外,上述针座1的基座11与基材12较佳实施为呈矩形,但于实际应用时,亦可为三角形、圆形或各种型式的多边形板材,此部分有关基座11与基材12的形状很多,并可依实际的应用或需求来变更其外观,且该形状的构成并非本案的创作要点,在此仅作一简单叙述,以供了解。In addition, the base 11 and base material 12 of the above-mentioned needle hub 1 are preferably implemented in a rectangular shape, but in practical applications, they can also be triangular, circular or various types of polygonal plates. This part is about the base 11 and base material. The shape of the material 12 is many, and its appearance can be changed according to the actual application or demand, and the composition of the shape is not the main point of the creation of this case, and only a brief description is made here for understanding.
如图4、图5、图6所示分别为本实用新型组装时的侧视剖面图(一)、(二)及(三),由图中可清楚看出,本实用新型于组装时,先将基材12迭放于基座11上方,并将基材12的多个第二穿孔121分别对正于基座11的多个第一穿孔111,此时,该基座11的多个第一定位孔112与基材12的多个第二定位孔122呈错位状态,即可将多个测试探针13设置于基座11与基材12之间(如图4),以使测试探针13的第一端部131及第二端部132分别插入至多个第一穿孔111与多个第二穿孔121内,之后便可将基座11与基材12分别相对向内推移,以使多个第一穿孔111错位于多个第二穿孔121,且内部穿设的多个测试探针13便受到多个第一穿孔111及多个第二穿孔121内壁面推挤,则会使第一端部131及第二端部132之间产生弯曲变形,从而形成出倾斜部133(如图5),同时,其多个第一定位孔112与多个第二定位孔122形成对正状态,便可再于呈对正状态的第一定位孔112与第二定位孔122内侧装设有固定组件14,以使基座11与基材12呈一稳固结合状态(如图6),即可完成本实用新型的组装。Shown in Fig. 4, Fig. 5, Fig. 6 are respectively the side view sectional view (one), (two) and (three) when the utility model is assembled, can clearly find out from the figure, the utility model when assembling, Firstly, the base material 12 is stacked on the base 11, and the plurality of second through holes 121 of the base material 12 are respectively aligned with the plurality of first through holes 111 of the base 11. At this time, the plurality of holes of the base 11 The first positioning hole 112 and the plurality of second positioning holes 122 of the substrate 12 are in a misaligned state, so that a plurality of test probes 13 can be arranged between the base 11 and the substrate 12 (as shown in FIG. 4 ), so that the test The first end portion 131 and the second end portion 132 of the probe 13 are respectively inserted into the plurality of first through holes 111 and the plurality of second through holes 121, and then the base 11 and the base material 12 can be relatively pushed inward respectively, so as to If the multiple first through holes 111 are misplaced to the multiple second through holes 121, and the multiple test probes 13 pierced inside are pushed by the inner walls of the multiple first through holes 111 and the multiple second through holes 121, it will cause Bending deformation occurs between the first end portion 131 and the second end portion 132, thereby forming an inclined portion 133 (as shown in FIG. 5 ). At the same time, a plurality of first positioning holes 112 and a plurality of second positioning holes 122 are aligned state, then the fixing component 14 can be installed inside the first positioning hole 112 and the second positioning hole 122 in the aligned state, so that the base 11 and the base material 12 are in a firmly combined state (as shown in FIG. 6 ), The assembly of the utility model can be completed.
上述基座11的第一定位孔112与基材12的第二定位孔122为可供固定组件14插入,该固定组件14较佳实施为固定插梢141,以供定位于第一定位孔112与第二定位孔122内并使基座11及基材12结合固定,但于实际应用时,其第一定位孔112内侧壁面可增设有螺纹1121,该固定组件14可为螺丝142,即可将固定组件14穿过第二定位孔122以锁固于具螺纹1121的第一定位孔112内呈一定位,此部分有关基座11与基材12的组装、结合方式很多,且可依实际的应用或需求来变更实施,且该细部的构成并非本案的创作要点,在此仅作一简单叙述,以供了解。The first positioning hole 112 of the base 11 and the second positioning hole 122 of the substrate 12 can be inserted into the fixing component 14, and the fixing component 14 is preferably implemented as a fixing pin 141 for positioning in the first positioning hole 112. In the second positioning hole 122, the base 11 and the base material 12 are combined and fixed, but in actual application, the inner wall surface of the first positioning hole 112 can be provided with threads 1121, and the fixing component 14 can be a screw 142, that is, Pass the fixing component 14 through the second positioning hole 122 to be locked in the first positioning hole 112 with the thread 1121 to form a position. There are many ways to assemble and combine the base 11 and the base material 12 in this part, and it can be determined according to the actual situation. The application or demand of the application or demand to change the implementation, and the composition of the details is not the main point of the creation of this case, here is only a brief description for understanding.
如图7、图8所示为本实用新型中的针座装设于检测治具的检测平台前的立体外观图及针座装设于检测治具的检测平台后的立体外观图,由图中可清楚看出,针座1于实际使用时,先装设于检测治具2的检测平台21上,其检测平台21表面的多个定位凸点211分别扣入于针座1的基座11底面的多个限位孔113内,且检测平台21上对应于基座11的多个第一穿孔111处贯设有多个透孔212,再于多个透孔212内分别插设有与多个测试探针13的第一端部131形成电性接触缆线部22的多个导线221,多个导线221另一端为电性连接于可用以处理电气信号的导通状态的检测装置23,当针座1完成定位于检测治具2的检测平台21上后,即可于基材12上方放置待检测的外部电路板,其多个测试探针13的第二端部132便会电性接触于外部电路板上的配线图形的多个测定点,当欲检测时,该检测治具2的检测装置23便会将检测用的信号传输至缆线部22的多个导线221,再经由多个测试探针13发送至外部电路板上的多个测定点,并从多个测定点处接收检测用信号,便可依据接收的信号,来计算出多个测定点间的电阻值,藉此用来判断多个测定点间是否导通。As shown in Fig. 7 and Fig. 8, the three-dimensional appearance diagram of the needle holder installed in the detection platform of the detection fixture in the present invention and the three-dimensional appearance diagram of the needle holder installed in the detection platform of the detection fixture are shown in Fig. It can be clearly seen from the figure that when the needle holder 1 is actually used, it is first installed on the detection platform 21 of the detection fixture 2, and the multiple positioning bumps 211 on the surface of the detection platform 21 are buckled into the base of the needle holder 1 respectively. 11 bottom surface in a plurality of limit holes 113, and a plurality of through-holes 212 corresponding to the plurality of first through-holes 111 of the base 11 on the detection platform 21 are penetratingly provided with a plurality of through-holes 212, and then a plurality of through-holes 212 are respectively inserted with The first ends 131 of the plurality of test probes 13 form a plurality of wires 221 that electrically contact the cable portion 22, and the other ends of the plurality of wires 221 are electrically connected to a detection device that can be used to process the conduction state of electrical signals. 23. After the needle base 1 is positioned on the detection platform 21 of the detection fixture 2, the external circuit board to be detected can be placed on the substrate 12, and the second ends 132 of the plurality of test probes 13 will be The multiple test points of the wiring patterns on the external circuit board are electrically contacted. When testing is desired, the detection device 23 of the detection fixture 2 will transmit the detection signal to the multiple wires 221 of the cable part 22. , and then sent to a plurality of measurement points on the external circuit board through a plurality of test probes 13, and receive detection signals from the plurality of measurement points, and then calculate the resistance between the plurality of measurement points according to the received signals Value, which is used to judge whether there is continuity between multiple measurement points.
上述检测治具2的检测装置23可用于处理外部电路板上的多个测定点间的电气信号的导通状态,此部分有关如何处理电气信号的导通状态为现有技术,且该细部的构成并非本案的创设重点,故不再作一赘述,以供了解。The detection device 23 of the above-mentioned detection fixture 2 can be used to process the conduction state of the electrical signal between multiple measurement points on the external circuit board. This part is related to how to process the conduction state of the electrical signal. The composition is not the key point of the creation of this case, so I won't repeat it for understanding.
针座1的基座11上方迭放有基材12,并于基座11的多个第一穿孔111与基材12的多个第二穿孔121间插设有多个测试探针13,当基座11与基材12形成错位状态后,其多个测试探针13便会形成出倾斜部133,从而稳固限位于基座11与基材12之间,以供使用时不会脱离、掉落出基座11与基材12外部,进而达到良好的定位效果,该针座1相较于现有技术可省略多个支撑杆,且基座11及基材12的板材层数于较佳实施例中亦可各由一片板材所制成,即可减少基座11及基材12整体的厚度,进而达到降低材料、制造成本的目的,以提升整体竞争力。The substrate 12 is stacked above the base 11 of the needle hub 1, and a plurality of test probes 13 are interposed between the plurality of first through holes 111 of the base 11 and the plurality of second through holes 121 of the substrate 12. After the base 11 and the base material 12 form a misaligned state, the plurality of test probes 13 will form an inclined portion 133, so as to be firmly limited between the base 11 and the base material 12, so that they will not be separated or dropped during use. Falling out of the base 11 and base material 12 to achieve a good positioning effect, compared with the prior art, the needle holder 1 can omit multiple support rods, and the number of layers of the base 11 and base material 12 is better In the embodiment, each can be made of a piece of plate material, which can reduce the overall thickness of the base 11 and the base material 12 , thereby achieving the purpose of reducing material and manufacturing costs, and enhancing the overall competitiveness.
另外,针座1的基座11与基材12间欲装设多个测试探针13时,先将基材12的多个第二穿孔121分别对正于基座11的多个第一穿孔111,再将多个测试探针13插入,由于多个测试探针13插入时,其多个第一穿孔111与多个第二穿孔121呈对正状态,所以于实际应用时,便可通过自动化的机械设备来执行插入多个测试探针13的作业,即可减少人力上的成本,且利用自动化的机械设备亦可使插设作业更加地快速、精确,以达到加快制造效率的同时,亦具有更高产品合格率的目的。In addition, when a plurality of test probes 13 are to be installed between the base 11 and the substrate 12 of the needle holder 1, the plurality of second through-holes 121 of the base 12 are aligned with the plurality of first through-holes of the base 11 respectively. 111, and then insert a plurality of test probes 13, because when a plurality of test probes 13 are inserted, the plurality of first through-holes 111 and the plurality of second through-holes 121 are in a state of alignment, so in actual application, it can pass through Automated mechanical equipment is used to perform the operation of inserting multiple test probes 13, which can reduce the cost of manpower, and the use of automated mechanical equipment can also make the insertion operation faster and more accurate, so as to achieve faster manufacturing efficiency. It also has the purpose of higher product qualification rate.
然而,由于针座1的基材12迭放于基座11上方,所以基座11与基材12之间便不会产生空隙,当多个测试探针13装设于基座11与基材12之间时,便可通过基座11与基材12来防止相邻的多个测试探针13间产生电性接触的情况,以避免发生短路,且该多个测试探针13外表面相较于现有技术亦不需涂怖有绝缘层,即可降低加工作业的难度,进而达到降低制造、材料成本的效果。However, since the substrate 12 of the needle hub 1 is stacked above the base 11, there is no gap between the base 11 and the substrate 12. When a plurality of test probes 13 are installed on the base 11 and the substrate 12, the base 11 and the base material 12 can be used to prevent electrical contact between adjacent multiple test probes 13, so as to avoid short circuits, and the outer surfaces of the multiple test probes 13 are relatively In the prior art, there is no need to apply an insulating layer, which can reduce the difficulty of processing operations, thereby achieving the effect of reducing manufacturing and material costs.
综上,本实用新型主要针对利用针座1的基座11上方迭放有基材12,且基座11表面的多个第一穿孔111为与基材12表面的多个第二穿孔121形成错位状态,以使第一穿孔111与第二穿孔121间插设的测试探针13形成倾斜部133,即可使多个测试探针13限位于基座11与基材12间,从而不会发生脱离、掉落的情形,且亦可简化加工、组装作业,进而达到降低整体制造、材料成本,故举凡可达成前述效果的结构、装置皆应受本实用新型所涵盖,此种简易修饰及等效结构变化,均应同理包含于本实用新型的保护范围内,合予陈明。To sum up, the present utility model is mainly aimed at using the substrate 12 stacked above the base 11 of the needle holder 1, and the plurality of first through holes 111 on the surface of the base 11 are formed with the plurality of second through holes 121 on the surface of the base material 12. dislocation state, so that the test probe 13 inserted between the first through hole 111 and the second through hole 121 forms an inclined portion 133, so that a plurality of test probes 13 can be limited between the base 11 and the base material 12, so as not to The situation of detachment and falling occurs, and the processing and assembly operations can also be simplified, thereby reducing the overall manufacturing and material costs. Therefore, all structures and devices that can achieve the aforementioned effects should be covered by the present invention. This simple modification and Equivalent structural changes should be included in the protection scope of the present utility model in the same way, and should be stated together.
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CN108253879A (en) * | 2018-01-31 | 2018-07-06 | 广东欧珀移动通信有限公司 | The detection device and detection method of function test fixture thimble |
CN109813383A (en) * | 2019-01-28 | 2019-05-28 | 中国石油天然气股份有限公司 | Method and apparatus for measuring probe, assembly and oil phase volume flow and oil holdup |
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CN108253879A (en) * | 2018-01-31 | 2018-07-06 | 广东欧珀移动通信有限公司 | The detection device and detection method of function test fixture thimble |
CN109813383A (en) * | 2019-01-28 | 2019-05-28 | 中国石油天然气股份有限公司 | Method and apparatus for measuring probe, assembly and oil phase volume flow and oil holdup |
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