CN1696653A - Measuring Method of Kashmir Force in Rectangular Cavity - Google Patents
Measuring Method of Kashmir Force in Rectangular Cavity Download PDFInfo
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- CN1696653A CN1696653A CN 200510040458 CN200510040458A CN1696653A CN 1696653 A CN1696653 A CN 1696653A CN 200510040458 CN200510040458 CN 200510040458 CN 200510040458 A CN200510040458 A CN 200510040458A CN 1696653 A CN1696653 A CN 1696653A
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- 238000000034 method Methods 0.000 title claims abstract description 10
- 239000000523 sample Substances 0.000 claims abstract description 21
- 238000005259 measurement Methods 0.000 claims abstract description 14
- 239000000758 substrate Substances 0.000 claims abstract description 14
- 239000002131 composite material Substances 0.000 claims abstract description 5
- 238000002715 modification method Methods 0.000 claims description 2
- 238000005381 potential energy Methods 0.000 claims description 2
- 238000012360 testing method Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- 238000003868 zero point energy Methods 0.000 description 3
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- 241000755266 Kathetostoma giganteum Species 0.000 description 1
- 238000005411 Van der Waals force Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
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- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 238000005329 nanolithography Methods 0.000 description 1
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Abstract
Description
技术领域technical field
本发明涉及力的测量方法,特指一种矩形腔内卡什米尔力的测量方法。The invention relates to a method for measuring force, in particular to a method for measuring Kashmir force in a rectangular cavity.
背景技术Background technique
随着微机械的发展,机构的特征尺寸越来越小,导致零件的质量迅速减小,同时随着零件间间距的缩小,逐渐进入了长程量子力的作用范畴,这样原本在机械运行中可以忽略的量子效应,就变得重要起来,有时已经成为某些微机械系统能否正常运行的关键。而在长程量子力的作用中,一般认为在20nm以内作用的长程量子力为范德华力(Van derWaals),而在20nm以外的长程量子力则为卡什米尔力(Casimir)。With the development of micromachines, the characteristic size of the mechanism is getting smaller and smaller, resulting in a rapid reduction in the mass of the parts. Neglected quantum effects become important and sometimes have become the key to the normal operation of certain micromechanical systems. In the long-range quantum force, it is generally believed that the long-range quantum force acting within 20nm is Van der Waals force (Van der Waals), while the long-range quantum force outside 20nm is called Casimir force.
自从Casimir通过零点能提出了两平行平面间存在Casimir力,并提出了Casimir的计算公式后,人们不断尝试对Casimir力进行测量,并与理论公式进行比较、修正。虽然Casimir力可作为一种宏观条件下的量子力,但是它的值完全决定于间距的大小,在以前的测量手段所能够提供的最小尺寸条件下,它的值是非常小的。例如理想条件下,在两间距为1μm,面积为1cm2的平行平面间的Casimir力只有10-7N,这对于以前的测试设备是个不小的挑战。原子力显微镜AFM是目前所有测量过Casimir力仪器中,所用精度最高的。它不仅能精确测量物体间的Casimir力,还能消除静电力的影响,同时真空环境的实验条件,可以消除空气中尘埃的影响,更难能可贵的是,AFM还能对平面的表面形貌做出准确的测量,目前还没有以原子力显微镜为测试手段,对矩形腔内Casimir力进行测量的文献报道。Since Casimir proposed the existence of Casimir force between two parallel planes through zero-point energy, and proposed the calculation formula of Casimir, people have been trying to measure the Casimir force, and compared and corrected it with the theoretical formula. Although the Casimir force can be regarded as a quantum force under macroscopic conditions, its value depends entirely on the size of the distance, and its value is very small under the condition of the smallest size that can be provided by previous measurement methods. For example, under ideal conditions, the Casimir force between two parallel planes with a distance of 1 μm and an area of 1 cm 2 is only 10 -7 N, which is a big challenge for the previous test equipment. The atomic force microscope (AFM) has the highest precision among all the instruments used to measure the Casimir force. It can not only accurately measure the Casimir force between objects, but also eliminate the influence of electrostatic force. At the same time, the experimental conditions of vacuum environment can eliminate the influence of dust in the air. What's more commendable is that AFM can also make a detailed analysis of the surface topography of the plane. Accurate measurement, there is no literature report on the measurement of Casimir force in a rectangular cavity by using an atomic force microscope as a test method.
发明内容Contents of the invention
本发明的目的是要利用现有AFM,稍加改进来实现有效测量矩形腔内Casimir力。The purpose of the present invention is to use the existing AFM and slightly improve it to realize the effective measurement of the Casimir force in the rectangular cavity.
本发明提供了一种对矩形腔内卡什米尔力的测量方法,该方法是在多功能扫描探针显微镜上的原子力显微镜(AFM)模式下实现的,对主显微镜按类似其常规测试表面势能时的改装方法进行改装,并把它的探针换成平面探针,平面探针的尺寸在6~10μm之间,基片采用矩形腔跟平面的复合结构,尺寸在20×10×2μm~40×20×4μm之间,同时基片上的矩形腔要求三边尺寸都在100~1000nm之间,长和高的尺寸与宽的尺寸的比值大于3,腔与腔之间的平板厚度小于150nm,当平头探针跟基片的平面部分正对,形成两平行平面结构,得到一个测量值1,再将AFM的平头探针移到基片上矩形腔结构上方,得到测量值2,测量值2减去测量值1就可以得到矩形腔结构内Casimir力值。The invention provides a method for measuring the Kashmir force in a rectangular cavity, which is realized in the atomic force microscope (AFM) mode on a multifunctional scanning probe microscope, and the surface potential energy of the main microscope is tested similarly to its routine The modification method at the time is modified, and its probe is replaced with a planar probe. The size of the planar probe is between 6 and 10 μm. The substrate adopts a composite structure of a rectangular cavity and a plane, and the size is 20×10×2 μm~ Between 40×20×4μm, at the same time, the rectangular cavity on the substrate requires that the dimensions of the three sides are between 100 and 1000nm, the ratio of the length and height to the width is greater than 3, and the thickness of the plate between the cavities is less than 150nm , when the flat probe is facing the plane part of the substrate, two parallel plane structures are formed, and a measurement value 1 is obtained, and then the flat probe of the AFM is moved above the rectangular cavity structure on the substrate, and the measurement value 2 is obtained, and the measurement value 2 The value of the Casimir force in the rectangular cavity structure can be obtained by subtracting the measured value 1.
在还末见矩形腔内Casimir力相关测量的前提下,本发明提供了一种测量矩形腔内Casimir力的方法,同时还跟两平行平面结构结合起来,通过两平行平面结构,间接地实现矩形腔内Casimir力的测量。On the premise that there is no Casimir force related measurement in the rectangular cavity, the present invention provides a method for measuring the Casimir force in the rectangular cavity. At the same time, it is combined with two parallel plane structures, and indirectly realizes the rectangular cavity through the two parallel plane structures. Measurement of intraluminal Casimir forces.
附图说明Description of drawings
图1 Nanoword公司所提供的平面探针示意图Figure 1 Schematic diagram of the planar probe provided by Nanoword
图2基片示意图Figure 2 Schematic diagram of the substrate
图3基片上矩形腔的示意图Figure 3 Schematic diagram of a rectangular cavity on a substrate
图4是测量矩形腔跟平面复合结构时的效果图,其中黄色平面代表平面探针,蓝色部分代表基片。Figure 4 is the effect diagram when measuring the composite structure of rectangular cavity and plane, in which the yellow plane represents the plane probe, and the blue part represents the substrate.
具体实施方式Detailed ways
结合测量效果图3详细说明依据本发明的工作过程。The working process according to the present invention is described in detail in conjunction with the measurement effect Fig. 3 .
首先在美国DI公司的原子力显微镜上进行一定的改装,把探针换成德国Nanoworld公司提供的平头探针,同时尺寸选为6μm。基座的总体尺寸选为20×10×2μm,其中平面部分跟矩形腔部分各占10μm,矩形腔的尺寸为1000×100×600nm,腔与腔之间的平板厚100nm,这些尺寸的选取,主要考虑了现有制造技术的限制。该基座采用电子束纳米光刻系统来进行加工。First of all, a certain modification was carried out on the atomic force microscope of DI Company in the United States, and the probe was replaced with a flat-head probe provided by Nanoworld Company of Germany, and the size was selected as 6 μm. The overall size of the pedestal is selected as 20×10×2μm, of which the planar part and the rectangular cavity part each occupy 10μm, the size of the rectangular cavity is 1000×100×600nm, and the thickness of the plate between the cavity and the cavity is 100nm. The selection of these dimensions, The limitation of the existing manufacturing technology is mainly considered. The pedestal is processed using an electron beam nanolithography system.
在AFM的平头探针跟基片的平面部分正对时,形成两平行平面结构,这时两平行平面结构内的零点能及Casimir力的计算公式仍然适用,因为此时两平面的间距跟探针的尺寸比起来还是很小的,满足理想条件下的计算公式。此时测出来的结果应为两平行平面的结果。而当AFM的平头探针移到基片上矩形腔结构上方时,就不能简单地用矩形腔内的零点能计算公式对它进行计算,可以认为是在两平行平面的基础上加上了矩形腔结构,所以所得到的测量结果可认为是两平行平面结构与矩形腔结构组成的复合结构,通过测量的结果减去两平行平面时测到的结果就可以得到矩形腔结构内Casimir力的结果。When the flat probe of the AFM is facing the plane part of the substrate, two parallel plane structures are formed. At this time, the calculation formulas of the zero-point energy and the Casimir force in the two parallel plane structures are still applicable, because the distance between the two planes is the same as that of the probe. The size of the needle is still very small compared to the calculation formula under ideal conditions. The measured result at this time should be the result of two parallel planes. However, when the flat probe of AFM moves above the rectangular cavity structure on the substrate, it cannot simply be calculated with the formula for calculating the zero-point energy in the rectangular cavity. It can be considered that a rectangular cavity is added on the basis of two parallel planes. structure, so the obtained measurement results can be considered as a composite structure composed of two parallel plane structures and a rectangular cavity structure, and the result of the Casimir force in the rectangular cavity structure can be obtained by subtracting the measured results of the two parallel planes from the measurement results.
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2443024A (en) * | 2006-10-19 | 2008-04-23 | Stephen Joseph Kaye | Device claimed to manipulate the zero-point field |
CN106558263A (en) * | 2016-11-01 | 2017-04-05 | 同济大学 | A kind of room temperature multistable balanced microcomputer tool system and its implementation |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2443024A (en) * | 2006-10-19 | 2008-04-23 | Stephen Joseph Kaye | Device claimed to manipulate the zero-point field |
CN106558263A (en) * | 2016-11-01 | 2017-04-05 | 同济大学 | A kind of room temperature multistable balanced microcomputer tool system and its implementation |
CN106558263B (en) * | 2016-11-01 | 2019-01-25 | 同济大学 | A room temperature multi-stable equilibrium micromechanical system and its realization method |
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