CN1251445C - PCI bus expansion method and detecting device for PCI card batch detection - Google Patents
PCI bus expansion method and detecting device for PCI card batch detection Download PDFInfo
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- CN1251445C CN1251445C CN 02117679 CN02117679A CN1251445C CN 1251445 C CN1251445 C CN 1251445C CN 02117679 CN02117679 CN 02117679 CN 02117679 A CN02117679 A CN 02117679A CN 1251445 C CN1251445 C CN 1251445C
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Abstract
The present invention discloses a PCI bus extending method used for the batch testing of PCI cards. The present invention has the key points that a PCI bus extension slot is led out of a PCI bus of a PC system; a high-speed signal switch used for isolating data signal lines is arranged between the PCI bus of a system and the PCI bus extension slot; a power supply used for isolating power supply signals is simultaneously set, and trigger and control circuits of the two switches are set; when the PCI extension slot is used for testing PCI cards, an on-off control circuit controls the connection and the disconnection of data signals and power supply signals of the PCI extension slot. The proposal can simplify testing operation on the PCI cards so that a computer connected to a testing device does not have to be closed and opened repeatedly when the PCI board cards are tested. As a result, the present invention has the advantages of greatly increased testing efficiency, reduced testing cost, protection of the PCI cards and the computer, and enhanced testing safety. The present invention also provides a testing device of PCI cards.
Description
Technical field
The present invention relates to the peripheral component interconnect (pci) card batch testing apparatus in a kind of computer and the communication equipment, especially be applied to the ON-OFF control circuit of this device.
Background technology
Along with computer and development of Communication Technique, peripheral parts interconnected (PCI, Peripheral ComponentInterconnect) the local bus technology is also constantly perfect, performance is constantly strengthened, feasible PCI integrated circuit board based on the PCI technology progressively replaces the ISA card based on Industry Standard Architecture (1SA) technology, to promote the interface handling property of computer, communication equipment, as sound card, modulator-demodulator (MODEM) and network interface card etc.Because the extensive application and the batch process of pci bus integrated circuit board, the challenge that brings to production test.
U.S. Patent number US6321174B1 discloses a kind of apparatus and method of testing computer system optional equipment.Described testing apparatus is used for the interface card on the testing computer system, it links to each other with computer system by first bus, described bus can be STD bus such as PCI, includes the slot that is used for holding interface card in the testing apparatus, i.e. bus expansion slot of drawing from system's pci bus; Data/address switch circuit that the isolated data of being used for/address wire is arranged between first bus and the slot, be used for the power switch circuit of insulating power supply line, in test process, be used for the control circuit that control data/address switch circuit and power switch circuit connect and close: when employed interface card is pci card, when the insertion neocaine is tested, power on earlier and carry out the log-on data processing again: when extracting test card end test, remove control signal earlier, remove again the control signal of power switch circuit is come powered-down data/address switch circuit.Need not repeatedly open and close computer system again when this invention has realized the pci card batch testing, improve testing efficiency.
In above-mentioned PCI method of testing, the necessary suitable order that guarantees mains switch and data/address switch action: when powering on, necessary first switch power supply switch, open signaling switch again: when electric down, must first shutdown signal switch, powered-down switch again.Only so, could guarantee to obtain correct test result and do not damage pci card.Therefore, adopting suitable ON-OFF control circuit to realize to guarantee above-mentioned running order ground, is the important step of implementing this method of testing.Above-mentioned patent does not provide this circuit design scheme, causes the enforcement of this method of testing to have difficulties.
Summary of the invention
The object of the present invention is to provide a kind of device that is used for peripheral parts interconnected pci card batch testing, this device can guarantee the suitable order of mains switch and data/address switch action, realizes the purpose to the pci card batch testing.
The device that is used for peripheral parts interconnected pci card batch testing provided by the invention comprises pci bus slot, expansion pci bus slot, high speed signal isolating switch, power-supply isolation switch and ON-OFF control circuit;
Described high speed signal isolating switch is connected between the data signal line of the pci bus between pci bus slot and the expansion pci bus slot, is used to switch on and off the data-signal on the expansion pci bus slot;
Power-supply isolation switch is connected between the power line of the pci bus between pci bus slot and the expansion pci bus slot, is used to switch on and off the power supply signal on the expansion pci bus slot;
ON-OFF control circuit, be used to control the switching of high speed signal isolating switch and power-supply isolation switch, when above-mentioned switch connection and pci card begin to test, make the high speed signal isolating switch postpone to connect than power-supply isolation switch, time of delay is more than or equal to the stable turn-on time of power supply signal on the expansion pci bus slot, during EOT, power-supply isolation switch is than the late release of high speed signal isolating switch; This ON-OFF control circuit comprises first delay circuit, first Schmidt's negater circuit, second delay circuit and second Schmidt's negater circuit, and first delay circuit connects first Schmidt's negater circuit, output pci bus power-supply isolation switch signal; Second delay circuit connects second Schmidt's negater circuit, time-delay output pci bus high speed signal isolating switch signal.
Preferably, described first delay circuit comprises switching diode and capacitance-resistance delay circuit, and an end, negative electrode that the anode connection resistance of switching diode is not connected with electric capacity are connected the end that resistance is connected with electric capacity; Described second delay circuit comprises switching diode and capacitance-resistance delay circuit, and an end, the negative electrode of the resistance that the negative electrode connection resistance of switching diode is not connected with electric capacity are connected the end that resistance is connected with electric capacity.
The present invention provides a kind of device that is used for peripheral parts interconnected pci card batch testing in addition, comprises pci bus slot, expansion pci bus slot, high speed signal isolating switch, power-supply isolation switch and ON-OFF control circuit;
Described high speed signal isolating switch is connected between the data signal line of the pci bus between pci bus slot and the expansion pci bus slot, is used to switch on and off data-signal on the expansion pci bus slot;
Power-supply isolation switch is connected between the power line of the pci bus between pci bus slot and the expansion pci bus slot, is used to switch on and off the power supply signal on the expansion pci bus slot;
ON-OFF control circuit, be used to control the switching of high speed signal isolating switch and power-supply isolation switch, when above-mentioned switch connection and pci card begin to test, make the high speed signal isolating switch postpone to connect than power-supply isolation switch, time of delay is more than or equal to the stable turn-on time of power supply signal on the expansion pci bus slot, during EOT, power-supply isolation switch is than the late release of high speed signal isolating switch; This ON-OFF control circuit comprises:
The rising edge testing circuit, whether the rising edge that is used to detect control signal is effective;
The trailing edge testing circuit, whether the trailing edge that is used to detect control signal is effective;
The switching signal output control circuit that is connected with rising edge testing circuit, trailing edge testing circuit is used for selecting effective signal output in the output signal of rising edge testing circuit and trailing edge testing circuit;
With the signal delay circuit that the switching signal output control circuit is connected, be used to export pci bus power-supply isolation switch signal and time-delay output pci bus high speed signal isolating switch signal.
Adopt ON-OFF control circuit provided by the invention, can be in above-mentioned method of testing, guarantee the suitable order of mains switch and data/address switch action, the automatic control of high speed switching, power supply and bus signals of pci bus signal and the order problem that powers on of bus signals have been solved jointly with original testing scheme, simplified operation, need not repeatedly to repeat to close the computer that is connected with testing apparatus with unlatching when making test PCI integrated circuit board, improved testing efficiency greatly, reduced testing cost.Simultaneously also protect pci card and computer itself, improved the fail safe of test.Can also realize automatic test by the computer operated switch control circuit in addition.
Description of drawings
Fig. 1 adopts method of testing embodiment flow chart involved in the present invention:
Fig. 2 is the embodiment block diagram of device of the present invention:
Fig. 3 is the first kind of implementation circuit diagram of Schmidt trigger circuit among Fig. 2;
Fig. 4 is the second kind of implementation block diagram of Schmidt trigger circuit among Fig. 2:
Fig. 5 is the rising edge testing circuit figure that Fig. 4 adopts:
Fig. 6 is the trailing edge testing circuit figure that Fig. 4 adopts:
Fig. 7 is switching signal output control circuit and the delay circuit figure that Fig. 4 adopts:
Fig. 8 is the switch controlling signal output timing diagram that Fig. 3 and Fig. 4 produce.
Embodiment
The present invention is described in further detail below in conjunction with accompanying drawing.
Fig. 1 is the embodiment flow chart of described pci card method of testing.The described method of Fig. 1 is divided into four steps, and first three step is the preparation of testing, the control that last step is tested.At first carry out step 1, the pci bus expansion slot of drawing from system's pci bus is set.This expansion slot is actually the copy of the PCI slot of computer system, be exclusively used in the test pci card,, can avoid repeatedly repeating to open and close computer system by the pci bus signal on this expansion slot being carried out break-make control, to improve testing efficiency, reduce testing cost.For making the pci bus expansion slot can satisfy requirements such as signal transmission delay, impedance matching, carry out step 2, between system's pci bus and pci bus expansion slot, be provided for the high speed signal switch of isolated data signal, be provided for the mains switch of insulating power supply signal simultaneously.Above-mentioned high speed signal switch adopts the high-speed bus switch chip, this routine chips model is iDT74FST163212, such chip has ultralow conducting resistance (5 ohm), switching delay can reach can ignore (＜0, degree 5ns), can carry out bang-bang control to all bus signals except that power supply in the PCI slot, this high-speed bus switch chip has a signaling switch to come the connection of control signal and closes.Above-mentioned mains switch adopts relay, adopting model in this example is the relay of 0Z-SS one 105L, can control the 3.3V of pci bus and the supply voltage of 5V, and adopting model is the relay of TN2-5V, the control pci bus+/ one 12V voltage, to carry out the switch control of pci bus power supply signal.
Owing to there are two switches to control, according to the cmos device order requirement that powers on, the action of these two switches is that orderliness requires: when powering on, necessary first switch power supply switch, open signaling switch again: when electric down, must first shutdown signal switch, powered-down switch again.Therefore, carry out step 3, the control circuit of described high speed signal switch of step 2 and mains switch is set, makes the high speed signal switching signal of this circuit output and power switch signal that the certain time sequence relation be arranged, when pci card begins to test, power on earlier with the power supply that guarantees the pci bus expansion slot.The time that described high speed signal switch triggering signal postpones than mains switch triggering signal should be not less than the stable time of connecting of power supply signal on the pci expansion slot.It is the control circuit of the schmitt inverter of 74AHC14 as control high speed signal switch and mains switch that the present invention adopts a kind of model, realizes the automatic sequencing control of above-mentioned two circuit.In this example, the input signal of ON-OFF control circuit can be existing by software control PC I/O cause for gossip, without manual intervention, the I/O control module is embedded into testing software, can realize the automatic test of PCI integrated circuit board fully.
Based on above-mentioned steps, at last in step 4, during using pci expansion slot test pci card, when tested pci card is in test, power supply signal and data-signal by ON-OFF control circuit control pci expansion slot are connected successively, when tested pci card was in the plug state, data-signal and the power supply signal of being controlled pci expansion slot by trigger control circuit disconnected successively.
Fig. 2 is the embodiment block diagram of device of the present invention.The testing apparatus of the pci card described in the figure comprises pci bus slot 1 and expansion pci bus slot 2, also comprises high speed signal isolating switch 3, power-supply isolation switch 4 and ON-OFF control circuit 5, wherein:
High speed signal isolating switch 3 is connected between the data signal line of the pci bus between pci bus slot 1 and the expansion pci bus slot 2, is used to switch on and off data-signal;
Power-supply isolation switch 4 is connected between the power line of the PC bus between pci bus slot 1 and the expansion pci bus slot 2, is used to switch on and off power supply signal;
ON-OFF control circuit 5, be used to control the switching of high speed signal driving switch 3 and power drives switch 4, and guarantee certain switching sequence, when above-mentioned switch connection and pci card begin to test, make high speed signal driving switch 3 postpone to connect, be not less than the stable turn-on time of power supply signal on the pci bus expansion slot time of delay than power drives switch 4.During EOT, power switch signal is closed than high speed signal switching delay.
In this example, it is iDT74FST163212 high-speed bus switch chip that high speed signal driving switch 3 adopts the chip model, it is the relay of 0Z-SS-105L that described power drives switch adopts model, with the 3.3V of control pci bus and the supply voltage of 5V, adopting model is the relay of TN2-5V, the control pci bus+/ one 12V voltage, it is Schmidt's reverser of 74H014 that ON-OFF control circuit adopts model.
In the described example of Fig. 2, high-speed bus switch chip 3 has two-way function, can be equivalent to a mechanical switch.All pci signals (the comprising power supply signal) transparent transmission that can control computer-side by linked switch SW is to expansion pci bus groove, and under the prerequisite that satisfies certain circuit board design rules, the pci bus after the expansion can be used as common PCI slot and use.When producing test in batches, setting in advance interlock control switch Sw is OFF, power control switch Pow-Sw and Signal-controlled switch Sig-Sw are Off, expansion pci bus groove 2 disconnects with computer-side bus slot 1, at this moment can plug tested PCI integrated circuit board, SW is set to ON again, then power control switch Pow-Sw is ON, Signal-controlled switch Sig-Sw automatically delaying becomes ON after a period of time, then can begin testing software and carry out the pci card test, after test is finished, it is Off that interlock control switch Sw is set again, then Signal-controlled switch Sig-Sw is for becoming Off, and power control switch Pow-Sw automatically delaying becomes off after a period of time, and expansion pci bus groove 2 disconnects with computer-side bus slot 1, at this moment, the pci card safety of finishing test can be pulled up, plug the action that next piece integrated circuit board continues to repeat just now again and test startup that need not be frequent/shut down computer.
Fig. 3 is the first kind of implementation circuit diagram of Schmidt trigger circuit among Fig. 2.ON-OFF control circuit described in the figure comprises first delay circuit 31, first Schmidt's negater circuit 32, second delay circuit 33 and second Schmidt's negater circuit 34, first delay circuit 31 connects first Schmidt's negater circuit signal 32, output pci bus power drives switching signal; Second delay circuit 33 connects second Schmidt's negater circuit 34, time-delay output pci bus Signal Spacing switching signal.
Described first delay circuit 31 comprises the capacitance-resistance delay circuit that switching diode D1 and R1, C1 form, and an end, negative electrode that the anode connection resistance R 1 of switching diode D1 is not connected with capacitor C 1 are connected the end that resistance R 1 is connected with capacitor C 1; Described second delay circuit 33 comprises the capacitance-resistance delay circuit that switching diode D2 and R2, C2 form, and an end, the negative electrode of the resistance that the negative electrode connection resistance R 2 of switching diode D2 is not connected with capacitor C 2 are connected the end that resistance R 2 is connected with capacitor C 2.
It is Schmidt's reverser of 74HC14,74HC04 that first circuits for triggering 32 among Fig. 3, second circuits for triggering 34 adopt model.
Adopt the described connected mode of Fig. 3, when coupled switch SW high level, because the forward of switching diode D1 connects, make the delay of SW without R1, C1, directly oppositely export through 74HC14, make the power control signal POW_SW of its control be added to power drives switch 4, and then the power supply of expansion pci bus groove is at first connected; And because the reverse connection of switching diode D2, make SW need delay, when the level of C1 is enough high, just oppositely export through 74HC14 through R1, C1, make the power control signal SIG_SW of its control be added to high speed signal driving switch 3, and then the data-signal time-delay of expansion pci bus groove is connected.
Fig. 4 is the second kind of implementation block diagram of Schmidt trigger circuit among Fig. 2, and this scheme adopts programmable logic device to realize.ON-OFF control circuit described in the figure comprises:
Rising edge testing circuit 41, whether the rising edge that is used to detect control signal is effective:
Trailing edge testing circuit 42, whether the trailing edge that is used to detect control signal is effective:
The switching signal output control circuit 43 that is connected with rising edge testing circuit, trailing edge testing circuit is used for selecting effective signal output in the output signal of rising edge testing circuit and trailing edge testing circuit;
The signal delay circuit 44 that is connected with the switching signal output control circuit is used to export the triggering signal of pci bus power drives switch and the triggering signal of time-delay output pci bus signal driving switch.
Among Fig. 4, utilizing signal to detect input switch signal Sw along testing circuit 41,42 is rising edge or trailing edge signal, whether export by switching signal output control circuit 43 control output switching signal Pow-Sw and Sig-Sw, thereby reach the control purpose by signal delay circuit.
The rising edge that Fig. 5, the 6th, Fig. 4 adopt, trailing edge testing circuit figure.Shown in the figure, it is rising edge or trailing edge that rising edge and trailing edge testing circuit can detect the SW signal, the purpose that adopts this sync detection circuit is the shake burr that may bring the exterior mechanical contact in order to eliminate, avoid false triggering (if logical circuit inside, then do not need such detection), export up signal and down signal (initial value all is ' 0 ') respectively.Rising edge and trailing edge testing circuit have comprised two cycle delays of Sw signal, are output as SW1.Switching signal control circuit and delay circuit and realization principle are with reference to figure 7.If rising edge appears in SW among Fig. 7, then SEL is 1, so Pow-Sw is Pow-Up, Sig-Sw is Sig-Up; If trailing edge appears in Sw, then SEL is 0, so Pow-Sw is Pow-DOWN, Sig-Sw is Sig-DOWN; The frequency of clock CLK can be determined by time of delay.
Fig. 8 is the switch controlling signal output timing diagram that Fig. 3 and Fig. 4 produce.
Among Fig. 8, time of delay, the empirical equation of t was t=R*C*ln (Vcc/ (Vcc-VT+)), generally got tens to 100 milliseconds and got final product.
It may be noted that at last when the present invention specifically implements: 1, circuit of the present invention can be integrated on the integrated circuit board with the required miscellaneous equipment of this method of testing; 2, the circuit model that adopts in the specific implementation of the present invention is not limited to the model that this paper provides.
Claims (3)
1, a kind of device that is used for peripheral parts interconnected pci card batch testing comprises pci bus slot and expansion pci bus slot, it is characterized in that, also comprises high speed signal isolating switch, power-supply isolation switch and ON-OFF control circuit;
Described high speed signal isolating switch is connected between the data signal line of the pci bus between pci bus slot and the expansion pci bus slot, is used to switch on and off the data-signal on the expansion pci bus slot;
Power-supply isolation switch is connected between the power line of the pci bus between pci bus slot and the expansion pci bus slot, is used to switch on and off the power supply signal on the expansion pci bus slot;
ON-OFF control circuit, be used to control the switching of high speed signal isolating switch and power-supply isolation switch, when above-mentioned switch connection and pci card begin to test, make the high speed signal isolating switch postpone to connect than power-supply isolation switch, time of delay is more than or equal to the stable turn-on time of power supply signal on the expansion pci bus slot, during EOT, power-supply isolation switch is than the late release of high speed signal isolating switch; This ON-OFF control circuit comprises first delay circuit, first Schmidt's negative circuit, second delay circuit and second Schmidt's negative circuit, and first delay circuit connects first Schmidt's negative circuit, output pci bus power-supply isolation switch signal; Second delay circuit connects second Schmidt's negative circuit, time-delay output pci bus high speed signal isolating switch signal.
2, the device of pci card batch testing according to claim 1, it is characterized in that, described first delay circuit comprises switching diode and capacitance-resistance delay circuit, and an end, negative electrode that the anode connection resistance of switching diode is not connected with electric capacity are connected the end that resistance is connected with electric capacity; Described second delay circuit comprises switching diode and capacitance-resistance delay circuit, and an end, the negative electrode of the resistance that the negative electrode connection resistance of switching diode is not connected with electric capacity are connected the end that resistance is connected with electric capacity.
3, a kind of device that is used for peripheral parts interconnected pci card batch testing comprises pci bus slot and expansion pci bus slot, it is characterized in that, also comprises high speed signal isolating switch, power-supply isolation switch and ON-OFF control circuit;
Described high speed signal isolating switch is connected between the data signal line of the pci bus between pci bus slot and the expansion pci bus slot, is used to switch on and off data-signal on the expansion pci bus slot;
Power-supply isolation switch is connected between the power line of the pci bus between pci bus slot and the expansion pci bus slot, is used to switch on and off the power supply signal on the expansion pci bus slot;
ON-OFF control circuit, be used to control the switching of high speed signal isolating switch and power-supply isolation switch, when above-mentioned switch connection and pci card begin to test, make the high speed signal isolating switch postpone to connect than power-supply isolation switch, time of delay is more than or equal to the stable turn-on time of power supply signal on the expansion pci bus slot, during EOT, power-supply isolation switch is than the late release of high speed signal isolating switch; This ON-OFF control circuit comprises:
The rising edge testing circuit, whether the rising edge that is used to detect control signal is effective;
The trailing edge testing circuit, whether the trailing edge that is used to detect control signal is effective;
The switching signal output control circuit that is connected with rising edge testing circuit, trailing edge testing circuit is used for selecting effective signal output in the output signal of rising edge testing circuit and trailing edge testing circuit;
With the signal delay circuit that the switching signal output control circuit is connected, be used to export pci bus power-supply isolation switch signal and time-delay output pci bus high speed signal isolating switch signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 02117679 CN1251445C (en) | 2002-05-14 | 2002-05-14 | PCI bus expansion method and detecting device for PCI card batch detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 02117679 CN1251445C (en) | 2002-05-14 | 2002-05-14 | PCI bus expansion method and detecting device for PCI card batch detection |
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| CN1458766A CN1458766A (en) | 2003-11-26 |
| CN1251445C true CN1251445C (en) | 2006-04-12 |
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| CN 02117679 Expired - Fee Related CN1251445C (en) | 2002-05-14 | 2002-05-14 | PCI bus expansion method and detecting device for PCI card batch detection |
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Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007529813A (en) | 2004-03-19 | 2007-10-25 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | PCI Express endpoint simulation circuit and downstream port for PCI Express switch |
| CN100419702C (en) * | 2005-04-22 | 2008-09-17 | 鸿富锦精密工业（深圳）有限公司 | Peripheral component interconnecting device assembling rightness verifying device and method |
| CN101118268B (en) * | 2006-07-31 | 2010-04-14 | 英业达股份有限公司 | System and method for testing external component interconnection extension slot |
| CN100591144C (en) * | 2007-07-12 | 2010-02-17 | 英业达股份有限公司 | Method for testing and switching interfaces of multi-television tuner |
| CN101615152B (en) * | 2009-07-13 | 2013-07-03 | 中兴通讯股份有限公司 | Method and device for detecting hot plug fault of storage card |
| CN102394789A (en) * | 2011-09-19 | 2012-03-28 | 中国北车股份有限公司大连电力牵引研发中心 | Board card test device |
| CN102999140B (en) * | 2012-05-30 | 2015-12-09 | 国家计算机网络与信息安全管理中心 | A kind of electrifying timing sequence control system of PCIE board and method |
| CN103853678B (en) * | 2012-12-06 | 2016-12-21 | 鸿富锦精密工业（深圳）有限公司 | Board managing device and use its plate card management system and control card |
| TW201423409A (en) | 2012-12-06 | 2014-06-16 | Hon Hai Prec Ind Co Ltd | Management device for managing multiple control cards and management system and control card using the management device |
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