CN113702711B - Resistance test circuit and resistance test method - Google Patents
Resistance test circuit and resistance test method Download PDFInfo
- Publication number
- CN113702711B CN113702711B CN202010435210.9A CN202010435210A CN113702711B CN 113702711 B CN113702711 B CN 113702711B CN 202010435210 A CN202010435210 A CN 202010435210A CN 113702711 B CN113702711 B CN 113702711B
- Authority
- CN
- China
- Prior art keywords
- resistor
- test
- tested
- resistance
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 237
- 238000010998 test method Methods 0.000 title abstract description 6
- 230000003321 amplification Effects 0.000 claims description 22
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 22
- 238000005259 measurement Methods 0.000 abstract description 14
- 238000000034 method Methods 0.000 description 11
- 101100452593 Caenorhabditis elegans ina-1 gene Proteins 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
Abstract
The invention relates to the technical field of resistance measurement, and provides a resistance test circuit and a resistance test method, which are used for measuring the resistance difference value of two tested resistors, wherein the resistance test circuit comprises: the voltage dividing module comprises a current source, a standard resistor, a first resistor to be tested and a second resistor to be tested which are connected in series between the power supply end and the ground; the first test module generates a first test voltage according to the voltages at two ends of the standard resistor; the second test module generates a second test voltage according to the voltage at two ends of the first resistor to be tested and the voltage at two ends of the second resistor to be tested, wherein the second test voltage represents the resistance difference value of the first resistor to be tested and the second resistor to be tested, and the resistance test circuit obtains the resistance difference value of the first resistor to be tested and the second resistor to be tested according to the resistance value of the standard resistor, the first test voltage and the second test voltage. Therefore, the measurement accuracy of a circuit capable of realizing the measurement of the difference value of two measured resistances and the reliability of the circuit are improved.
Description
Technical Field
The invention relates to the field of resistance measurement, in particular to a resistance test circuit and a resistance test method.
Background
The resistance is one of basic electric parameters, and a plurality of measuring methods are adopted, so that the resistance value can be accurately and practically measured, and the measuring methods and the used meters are different for different resistances.
The current scheme for measuring the difference value of the two resistors is to test the resistance values of the two resistors respectively and then perform subtraction operation. One prior art solution for testing the resistance is to measure the resistance R between two nodes of MN according to a resistance test circuit as shown in fig. 1, and this measurement method is called four-wire resistance measurement. The end A is connected with a current source I, the end B is grounded, and the end C and the end D are respectively connected with two nodes M and N of a resistor R. And a voltmeter V is connected between the C end and the D end. The measuring mode can avoid the influence of parasitic resistance between the connecting wire AM and the connecting wire BN on the test result. The measured resistance value is the ratio of the voltage value measured by the voltmeter V connected with the C end and the D end to the current value flowing through the resistor R.
However, in the process of testing (FINAL TEST), the testing precision of the resistor is directly limited by the precision of the voltmeter and the precision of the current source. In general, the accuracy of the voltmeter with higher accuracy configured on the test machine is 0.05% and the accuracy of the current source is 0.05%. That is, when measuring both the voltage and the current through the resistor, a random error of five parts per million occurs. According to the prior art, the two errors are overlapped to enable the measured resistance value of the single resistor to have a test error close to one thousandth, and the two resistances are subjected to difference to have an error of two thousandths, so that the measurement requirement of the high-precision resistance difference value cannot be met obviously, and meanwhile, the reliability is poor.
Disclosure of Invention
In order to solve the technical problems, the invention provides a resistance test circuit and a resistance test method, which can improve the measurement precision of a difference value measurement circuit of two tested resistors and improve the reliability of a test system.
In one aspect, the present invention provides a resistance testing circuit for measuring a resistance difference between two resistors under test, the resistance testing circuit comprising:
The voltage dividing module comprises a current source, a standard resistor, a first resistor to be tested and a second resistor to be tested which are connected in series between the power supply end and the ground;
The input end of the first test module is connected with two ends of the standard resistor to form a first path, and a first test voltage is generated according to the voltages of the two ends of the standard resistor;
The input ends of the second testing module are respectively connected with two ends of the first resistor to be tested and two ends of the second resistor to be tested, and a second testing voltage is generated according to the voltage of the two ends of the first resistor to be tested and the voltage of the two ends of the second resistor to be tested,
The second test voltage characterizes the resistance difference between the first to-be-tested resistor and the second to-be-tested resistor, and the resistance test circuit obtains the resistance difference between the first to-be-tested resistor and the second to-be-tested resistor according to the resistance value of the standard resistor, the first test voltage and the second test voltage.
Preferably, the second test module includes:
The input end of the first test unit is connected with two ends of a first resistor to be tested to form a second path, and a third test voltage is generated according to the voltages of the two ends of the first resistor to be tested;
The input end of the second testing unit is connected with two ends of a second resistor to be tested to form a third path, and fourth testing voltage is generated according to the voltages at the two ends of the second resistor to be tested;
and the input end of the third test unit is respectively connected with the output end of the first test unit and the output end of the second test unit, and the second test voltage is generated according to the third test voltage and the fourth test voltage.
Preferably, the first test module comprises a first amplifier.
Preferably, the first test unit comprises a third amplifier, the second test unit comprises a fourth amplifier, and the third test unit comprises a second amplifier.
Preferably, the amplification gain values of the first amplifier, the third amplifier, and the fourth amplifier are the same, or at least one of the three amplification gain values is different from the other amplification gain values.
Preferably, the first amplifier, the second amplifier, the third amplifier, and the fourth amplifier are instrumentation amplifiers.
Preferably, the standard resistor is a precision resistor.
In another aspect, the present invention further provides a resistance testing method for measuring a resistance difference between two measured resistances, including:
applying a preset test current on a serial circuit of the standard resistor, the first resistor to be tested and the second resistor to be tested;
acquiring first test voltages at two ends of a standard resistor under the preset test current;
Generating a second test voltage according to the voltage at the two ends of the first resistor to be tested and the voltage at the two ends of the second resistor to be tested under the preset test current;
obtaining the resistance difference value of the first resistor to be tested and the second resistor to be tested according to the resistance value of the standard resistor, the first test voltage and the second test voltage,
The second test voltage characterizes a resistance difference value of the first resistor to be tested and the second resistor to be tested.
Preferably, the generating the second test voltage according to the voltage across the first resistor to be tested and the voltage across the second resistor to be tested under the preset test current includes:
Generating a third test voltage according to the voltages at two ends of the first resistor to be tested;
generating a fourth test voltage according to the voltages at two ends of the second resistor to be tested; and
The second test voltage is generated according to the third test voltage and the fourth test voltage.
Preferably, after the second test voltage is generated according to the third test voltage and the fourth test voltage, the method further includes:
a second gain value of a third test unit that generates the second test voltage is obtained.
Preferably, the first gain value of the first test module generating the first test voltage, the third gain value of the first test unit generating the third test voltage, and the fourth gain value of the second test unit generating the fourth test voltage are the same, or at least one of the three is different from the other two.
Preferably, the obtaining the resistance difference between the first to-be-tested resistor and the second to-be-tested resistor according to the resistance value of the standard resistor, the first test voltage and the second test voltage includes:
and obtaining the resistance difference value of the first resistor to be tested and the second resistor to be tested according to the resistance value of the standard resistor, the first test voltage, the second test voltage and the second gain value of the third test unit for generating the second test voltage.
The beneficial effects of the invention are as follows: the invention provides a resistance test circuit and a resistance test method, which are characterized in that a preset test current is applied to a series circuit of a standard resistor, a first resistor to be tested and a second resistor to be tested; then obtaining first test voltages at two ends of the standard resistor under the preset test current; generating a second test voltage according to the voltage at the two ends of the first resistor to be tested and the voltage at the two ends of the second resistor to be tested under the preset test current; and finally, obtaining the resistance difference value of the first resistor to be tested and the second resistor to be tested according to the resistance value of the standard resistor, the first test voltage and the second test voltage. The resistance measurement precision of the circuit capable of realizing the difference measurement of two measured resistances is effectively improved, and meanwhile, the circuit is stable in output, high in response speed and high in reliability.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of embodiments of the present invention with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of a prior art resistance test circuit;
FIG. 2 is a schematic diagram of a resistance test circuit according to an embodiment of the present invention;
FIG. 3 shows a circuit configuration diagram of the resistance test circuit shown in FIG. 2;
Fig. 4 is a schematic flow chart of a resistance testing method according to an embodiment of the present invention.
Detailed Description
In order that the invention may be readily understood, a more complete description of the invention will be rendered by reference to the appended drawings. Preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
The present invention will be described in detail with reference to the accompanying drawings.
Fig. 2 is a schematic diagram of a structure of a resistance test circuit according to an embodiment of the present invention, and fig. 3 is a circuit configuration diagram of the resistance test circuit shown in fig. 2.
Referring to fig. 2 and 3, in one aspect, an embodiment of the present invention provides a resistance testing circuit 200 for measuring a resistance difference between two measured resistances, the resistance testing circuit 200 comprising: the voltage dividing module 210, the first testing module 220 and the second testing module 230, wherein the voltage dividing module 210 comprises a current source I1, a standard resistor R1, a first resistor R2 to be tested and a second resistor R3 to be tested which are connected in series between a power supply end VDD and the ground, the input end of the first testing module 220 is connected with two ends A and B of the standard resistor R1 to form a first path, and a first testing voltage V1 is generated according to the voltages at the two ends of the standard resistor R1; the input end of the second testing module 230 is respectively connected to two ends C and D of the first resistor to be tested R2 and two ends E and F of the second resistor to be tested R3, and generates a second testing voltage V2 according to the voltage at two ends of the first resistor to be tested R2 and the voltage at two ends of the second resistor to be tested R3, wherein the second testing voltage V2 characterizes a resistance difference value between the first resistor to be tested R2 and the second resistor to be tested R3, and the resistance testing circuit 200 obtains a resistance difference value between the first resistor to be tested R2 and the second resistor to be tested R3 according to the resistance value of the standard resistor R1, the first testing voltage V1 and the second testing voltage V2.
In a preferred embodiment, the second test module 230 includes: the input end of the first test unit 231 is connected to two ends C, D of the first resistor R2 to be tested to form a second path, and a third test voltage V3 is generated according to the voltages at two ends of the first resistor R2 to be tested; the input end of the second testing unit 232 is connected to two ends E, F of the second resistor R3 to be tested to form a third path, and a fourth testing voltage V4 is generated according to the voltages of the two ends of the second resistor R3 to be tested; the input end of the third test unit 233 is connected to the output end of the first test unit 231 and the output end of the second test unit 232, respectively, and generates the second test voltage V2 according to the third test voltage V3 and the fourth test voltage V4.
In a preferred embodiment, the first test module 220 includes, for example, but is not limited to, a first amplifier INA1.
In a preferred embodiment, the first test unit 231 includes a third amplifier INA3, the second test unit 232 includes a fourth amplifier INA4, and the third test unit 233 includes a second amplifier INA2.
Further, the amplification gain values of the first amplifier INA1, the third amplifier INA3, and the fourth amplifier INA4 are the same.
It should be noted that, the amplification gain values of the first amplifier INA1, the third amplifier INA3 and the fourth amplifier INA4 may be the same, or the amplification gain value of at least one of the three may be different from the amplification gain value of the other two, which is not limited herein, but in the preferred embodiment of the present invention, the control and adjustment of the variables during the test and the calculation of the test result are facilitated by setting the amplification gain values of the first amplifier INA1, the third amplifier INA3 and the fourth amplifier INA4 to be the same.
In a preferred embodiment, the first amplifier INA1, the second amplifier INA2, the third amplifier INA3 and the fourth amplifier INA4 are instrumentation amplifiers, although the amplifying functions corresponding to the first test module 220, the first test unit 231, the second test unit 232 and the third test unit 233 may be implemented in other manners. For example, each test module or test unit may build up an amplifying circuit having the same amplifying function through one or more operational amplifiers, which is not limited herein. In the embodiment, the normal phase input of each instrument amplifier can greatly improve the input impedance of the circuit and reduce the attenuation of the circuit to weak input signals; the differential input can make the circuit amplify only the differential mode signal and only the common mode input signal act as a follower, so that the Common Mode Rejection Ratio (CMRR) in the test circuit can be effectively improved, the test effect is improved, and the measurement accuracy is improved.
In a preferred embodiment, the standard resistor R1 is a precision resistor, which is tested by an eight-bit half digital multimeter (the precision of the eight-bit half measured resistor is about 0.0007%, which can meet the requirements under various instrument testing conditions, so that no error can be basically considered to exist), and has low time drift and low temperature drift, and is used in the resistor testing circuit 200 in this embodiment, so that the testing effect can be improved, and the measurement accuracy can be improved.
On the other hand, the embodiment of the invention also provides a resistance testing method for measuring the resistance difference value of two tested resistances, and referring to fig. 4, the resistance testing method comprises the following steps:
Step S110: and applying a preset test current to the serial circuit of the standard resistor, the first resistor to be tested and the second resistor to be tested.
In step S110, a preset test current is applied to the standard resistor, the first resistor to be tested and the second resistor to be tested on the serial line by sequentially connecting in series the current source, the standard resistor, the first resistor to be tested and the current source in the voltage dividing module formed by the first resistor to be tested and the second resistor to be tested between the power supply end and the ground.
Step S120: and obtaining a first test voltage at two ends of the standard resistor under the preset test current.
In step S120, a first path is formed by connecting the input terminals of the first test module to two ends of the standard resistor, and a first test voltage is generated according to the voltages of the two ends of the standard resistor.
Step S130: and generating a second test voltage according to the voltage at the two ends of the first resistor to be tested and the voltage at the two ends of the second resistor to be tested under the preset test current.
In step S130, a second path is formed by connecting the input end of the first test unit to two ends of the first resistor to be tested, a third test voltage is generated according to the voltages at the two ends of the first resistor to be tested, a third path is formed by connecting the input end of the second test unit to two ends of the second resistor to be tested, a fourth test voltage is generated according to the voltages at the two ends of the second resistor to be tested, and a second test voltage is generated according to the third test voltage and the fourth test voltage.
Step S140: a second gain value of a third test unit that generates the second test voltage is obtained.
In this embodiment, the first test module includes, for example, a first amplifier, the first test unit includes a third amplifier, the second test unit includes a fourth amplifier, and the third test unit includes a second amplifier. Further, the amplification gain values of the first amplifier, the third amplifier and the fourth amplifier are the same, or at least one of the three amplification gain values is different from the other two amplification gain values.
It should be noted that the amplification gain values of the first amplifier, the third amplifier and the fourth amplifier may be the same, or at least one of the amplification gain values may be different from the amplification gain values of the other two, which is not limited herein, but in the preferred embodiment of the present invention, the amplification gain values of the first amplifier, the third amplifier and the fourth amplifier are the same, so that the control and adjustment of the variables and the calculation of the test results in the test process are facilitated.
In further embodiments, the first amplifier, the second amplifier, the third amplifier, and the fourth amplifier may be, but are not limited to, instrumentation amplifiers. Of course, the amplifying functions corresponding to the first test module, the first test unit, the second test unit and the third test unit may also be implemented in other manners. For example, each test module or test unit may build up an amplifying circuit having the same amplifying function through one or more operational amplifiers, which is not limited herein.
In step S140, a second gain value of a third amplifier (instrumentation amplifier) in a third test unit that generates the second test voltage is acquired.
Step S150: and obtaining the resistance difference value of the first resistor to be tested and the second resistor to be tested according to the resistance value of the standard resistor, the first test voltage, the second test voltage and the second gain value of the third test unit for generating the second test voltage.
Referring to the resistance test circuit 200 shown in fig. 3, we can obtain:
The output voltage V1 of the first amplifier INA1 in the first test module 220:
V1＝I*R1*G1 (1)
In the formula (1), G1 is an amplification gain value of the first amplifier INA1, R1 is a resistance value of the standard resistor R1, I is a current value of a preset test current provided by the current source I1, and further, the standard resistor R1 is a precision resistor;
and, the output voltage V3 of the third amplifier INA3 in the second test module 230:
V3＝I*R2*G3 (2)
In the formula (2), G3 is an amplification gain value of the third amplifier, and R2 is a resistance value of the first resistor R2 to be tested;
And, the output voltage V4 of the fourth amplifier INA4 in the second test module 230:
V4＝I*G4*R3 (3)
In the formula (3), G4 is an amplification gain value of the fourth amplifier, and in the present embodiment, the amplification gain value G1 of the first amplifier INA1, the amplification gain value G3 of the third amplifier INA3, and the amplification gain value G4 of the fourth amplifier are the same;
And, combining the above formula (2) and formula (3) to obtain the output voltage V2 of the second amplifier INA2 in the second test module 230:
V2＝I*G1*G2*(R2-R3) (4)
In the formula (4), R2 is the resistance of the first resistor to be tested R2, and R3 is the resistance of the second resistor to be tested R3.
By combining the above formulas (1) and (4), it is possible to obtain:
The resistance difference between the first resistor R2 to be tested and the second resistor R3 to be tested can be obtained by arranging the formula (4):
In the above formula (6), R1 is a precision resistor, and G2 is a voltage gain value of the second amplifier INA 2. The value of V2/V1 in this equation is the ratio of the two voltages measured by the 0.05% precision voltmeter, with a maximum of 0.1% error. However, in equation (6) for calculating (R2-R3), the test error for this ratio is divided by the second gain G2. G2 can be typically set to more than 100 times so that the error from the test is reduced to 0.001%. That is, the test precision of the resistance difference value (R2-R3) of the two resistors to be tested can reach 0.001%, the resistance measurement precision of the resistance test circuit capable of realizing the measurement of the two measured resistance difference values is effectively improved, and meanwhile, the circuit is stable in output, high in response speed and high in reliability.
It should be noted that in the description of the present invention, it should be understood that the terms "upper," "lower," "inner," and the like indicate an orientation or a positional relationship, and are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the components or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
Finally, it should be noted that: it is apparent that the above examples are only illustrative of the present invention and are not limiting of the embodiments. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. And obvious variations or modifications thereof are contemplated as falling within the scope of the present invention.
Claims (4)
1. A resistance test circuit for measuring a resistance difference between two resistors under test, the resistance test circuit comprising:
The voltage dividing module comprises a current source, a standard resistor, a first resistor to be tested and a second resistor to be tested which are connected in series between the power supply end and the ground;
the input end of the first test module is connected with two ends of the standard resistor to form a first path, a first test voltage is generated according to the voltage of the two ends of the standard resistor, and the first test module comprises a first amplifier;
The input ends of the second test module are respectively connected with the two ends of the first resistor to be tested and the two ends of the second resistor to be tested, and generate a second test voltage according to the voltage of the two ends of the first resistor to be tested and the voltage of the two ends of the second resistor to be tested,
Wherein the second test module comprises:
The input end of the first test unit is connected with two ends of the first resistor to be tested to form a second path, a third test voltage is generated according to the voltage of the two ends of the first resistor to be tested, and the first test unit comprises a third amplifier;
The input end of the second testing unit is connected with two ends of the second resistor to be tested to form a third path, a fourth testing voltage is generated according to the voltages at the two ends of the second resistor to be tested, and the second testing unit comprises a fourth amplifier;
The input end of the third test unit is respectively connected with the output end of the first test unit and the output end of the second test unit, the second test voltage is generated according to the third test voltage and the fourth test voltage, the third test unit comprises a second amplifier,
The second test voltage characterizes the resistance difference between the first resistance to be tested and the second resistance to be tested, the resistance test circuit obtains the resistance difference between the first resistance to be tested and the second resistance to be tested according to the resistance value of the standard resistance, the first test voltage and the second test voltage, the amplification gain values of the first amplifier, the third amplifier and the fourth amplifier are the same,
The resistance difference value of the first resistor to be tested and the second resistor to be tested is: R1 is the resistance value of the standard resistor,
R2 is the resistance of the first resistor to be tested, R3 is the resistance of the second resistor to be tested, V1 is the output voltage of the first amplifier, V2 is the output voltage of the second amplifier, and G2 is the voltage gain value of the second amplifier.
2. The resistance test circuit of claim 1, wherein the first amplifier, the second amplifier, the third amplifier, and the fourth amplifier are instrumentation amplifiers.
3. The resistance testing circuit of claim 1, wherein the standard resistance is a precision resistance.
4. A resistance testing method applied to the resistance testing circuit of claim 1 for measuring a resistance difference between two tested resistances, comprising:
applying a preset test current on a serial circuit of the standard resistor, the first resistor to be tested and the second resistor to be tested;
obtaining voltages at two ends of the standard resistor under the preset test current to generate a first test voltage;
generating a third test voltage according to the voltages at two ends of the first resistor to be tested;
generating a fourth test voltage according to the voltages at two ends of the second resistor to be tested;
generating a second test voltage according to the third test voltage and the fourth test voltage;
acquiring a second gain value of a third test unit generating the second test voltage;
Obtaining the resistance difference value of the first resistor to be tested and the second resistor to be tested according to the resistance value of the standard resistor, the first test voltage and the second test voltage,
Wherein the second test voltage characterizes the resistance difference between the first resistor to be tested and the second resistor to be tested, the first gain value of the first test module generating the first test voltage, the third gain value of the first test unit generating the third test voltage and the fourth gain value of the second test unit generating the fourth test voltage are the same,
The obtained resistance difference between the first to-be-measured resistor and the second to-be-measured resistor is: wherein R1 is the resistance value of the standard resistor,
R2 is the resistance value of the first resistor to be tested, R3 is the resistance value of the second resistor to be tested, V1 is the first test voltage output by the first test module, V2 is the second test voltage output by the third test unit, and G2 is the second gain value of the third test unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010435210.9A CN113702711B (en) | 2020-05-21 | Resistance test circuit and resistance test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010435210.9A CN113702711B (en) | 2020-05-21 | Resistance test circuit and resistance test method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113702711A CN113702711A (en) | 2021-11-26 |
| CN113702711B true CN113702711B (en) | 2024-11-12 |
Family
ID=
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102478422A (en) * | 2010-11-23 | 2012-05-30 | 上海诚佳电子科技有限公司 | Zero drift simulation calibration method and device |
| CN110161313A (en) * | 2019-06-19 | 2019-08-23 | 中南大学 | The resistance high precision measuring system and method for a kind of differential method in conjunction with rule of three |
| CN113702710A (en) * | 2020-05-21 | 2021-11-26 | 圣邦微电子（北京）股份有限公司 | Resistance test circuit and resistance test method |
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102478422A (en) * | 2010-11-23 | 2012-05-30 | 上海诚佳电子科技有限公司 | Zero drift simulation calibration method and device |
| CN110161313A (en) * | 2019-06-19 | 2019-08-23 | 中南大学 | The resistance high precision measuring system and method for a kind of differential method in conjunction with rule of three |
| CN113702710A (en) * | 2020-05-21 | 2021-11-26 | 圣邦微电子（北京）股份有限公司 | Resistance test circuit and resistance test method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7701227B2 (en) | High precision voltage source for electrical impedance tomography | |
| TWI603097B (en) | Active shunt ammeter apparatus and method | |
| US8358143B2 (en) | Internal self-check resistance bridge and method | |
| US5448173A (en) | Triple-probe plasma measuring apparatus for correcting space potential errors | |
| US4697151A (en) | Method and apparatus for testing operational amplifier leakage current | |
| CN100449322C (en) | Measurement circuit with improved accuracy | |
| CN113702711B (en) | Resistance test circuit and resistance test method | |
| CN113702710B (en) | Resistance test circuit and resistance test method | |
| US6803776B2 (en) | Current-comparator-based four-terminal resistance bridge for power frequencies | |
| CN112327057A (en) | On-resistance testing method for wire tester | |
| CN117544121A (en) | Differential amplifier and trimming and calibrating method for instrument amplifier | |
| CN113702711A (en) | Resistance test circuit and resistance test method | |
| CN113702710A (en) | Resistance test circuit and resistance test method | |
| US7429856B1 (en) | Voltage source measurement unit with minimized common mode errors | |
| CN219738060U (en) | uA level high-precision constant current source system | |
| CN103178708B (en) | Static charge source and method for calibrating same | |
| CN113777471B (en) | Method for calibrating relative voltage offset error of measurement module | |
| CN114485764B (en) | Self-calibration and anti-drift device for weak signal measurement | |
| CN113030689B (en) | Test circuit, test method and test device of operational amplifier | |
| CN118860050A (en) | Voltage calibration circuit and sampling voltage fitting and voltage calibration method | |
| Hess et al. | Evaluation of 100 A, 100 kHz transconductance amplifiers | |
| CN108333393B (en) | Probe and calibration method | |
| CN116908553A (en) | Measuring method and circuit for DC gain of operational amplifier ring | |
| CN113484811A (en) | Self-calibration method and system for direct-current resistor voltage divider | |
| JPH0349072B2 (en) |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant |