CN113654765A - Phase deflection measuring method and system based on curved screen and terminal - Google Patents
Phase deflection measuring method and system based on curved screen and terminal Download PDFInfo
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Abstract
The application is suitable for the technical field of optical measurement, and provides a phase deflection measuring method, a system and a terminal based on a curved screen, wherein the method comprises the following steps: the method comprises the steps of displaying a set number of phase shift fringe graphs on a curved surface display screen in sequence, controlling an image collector to collect images of an object to be detected, obtaining first virtual images corresponding to each phase shift fringe graph respectively, and conducting three-dimensional surface reconstruction on the object to be detected by adopting a phase deflection technology based on the relative pose relation between the curved surface display screen and the image collector and the first virtual images. The scheme can achieve the acquisition of complete phase information of the surface of the object with larger curvature, and improves the reconstruction effect of the three-dimensional shape of the high-reflection object.
Description
Technical Field
The application belongs to the technical field of optical measurement, and particularly relates to a phase deflection measuring method, system and terminal based on a curved screen.
Background
Non-contact, high-precision measurement of specular reflective surfaces has become an important scientific problem in the field of three-dimensional optical measurements. The diffuse reflection structured light measurement method is not suitable for obtaining the characteristic information of the measured surface. The phase deflection technique has the advantages of simple principle, low cost, large dynamic measurement range, quick full-field measurement and the like, and is more widely applied to the topography measurement of the surface of a high-reflection object.
In the application of the existing phase deflection technology, the measurement effect on a relatively flat high-reflection object is optimal, when the high-reflection object to be tested has relatively large curvature, the high-reflection object to be tested is influenced by the large curvature surface in the object to be tested in the process of image acquisition through a camera, so that the image information acquired by the camera is too little or lost, the complete phase information of the surface of the object cannot be acquired, and the reconstruction of the three-dimensional shape of the high-reflection object to be tested is influenced.
Disclosure of Invention
The embodiment of the application provides a phase deflection measuring method, a phase deflection measuring system and a terminal based on a curved screen, and aims to solve the problem that the existing phase deflection measuring system cannot acquire complete phase information of the surface of an object with a large curvature and influences the reconstruction of the three-dimensional shape of the high-reflection object to be measured.
A first aspect of an embodiment of the present application provides a phase deflection measurement method based on a curved screen, which is applied to a phase deflection measurement system, where the phase deflection measurement system includes: the phase deflection measuring method comprises the following steps of:
sequentially displaying a set number of phase shift fringe patterns on the curved surface display screen, wherein the phase shift fringe patterns form a first virtual image on the surface of the object to be detected;
controlling the image collector to collect images of the object to be detected, and respectively obtaining a first virtual image corresponding to each phase shift fringe pattern;
and based on the relative pose relation between the curved surface display screen and the image collector and the first virtual image, performing three-dimensional surface type reconstruction on the object to be detected by adopting a phase deflection technology.
A second aspect of the embodiments of the present application provides a phase deflection measurement system based on a curved screen, including: the device comprises a curved surface display screen and an image collector, wherein the display surface of the curved surface display screen faces to the position of an object to be detected; the phase deflection measurement system further includes:
the display module is used for sequentially displaying a set number of phase shift fringe patterns on the curved surface display screen, and the phase shift fringe patterns form a first virtual image on the surface of the object to be detected;
the image acquisition module is used for controlling the image acquisition device to acquire images of the object to be detected so as to respectively obtain a first virtual image corresponding to each phase-shift fringe pattern;
and the three-dimensional surface type reconstruction module is used for reconstructing the three-dimensional surface type of the object to be detected by adopting a phase deflection technology based on the relative pose relation between the curved surface display screen and the image collector and the first virtual image.
A third aspect of embodiments of the present application provides a terminal, including a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the steps of the method according to the first aspect when executing the computer program.
A fourth aspect of embodiments of the present application provides a computer-readable storage medium, in which a computer program is stored, which, when executed by a processor, performs the steps of the method according to the first aspect.
A fifth aspect of the present application provides a computer program product, which, when run on a terminal, causes the terminal to perform the steps of the method of the first aspect described above.
Therefore, in the embodiment of the application, the plane display screen is replaced by the curved surface display screen on the basis of the traditional phase deflection measurement system, the irradiation range of the display screen under the same radial dimension is enlarged through the arrangement of the curved surface display screen, the measurement area and the measurement angle of a measured object are expanded, the phase deflection measurement system is ensured to be capable of acquiring complete phase information of the surface of an object with larger curvature, and the reconstruction effect of the three-dimensional shape of the high-reflection object is improved.
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In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a first schematic structural diagram of a phase deviation measurement system provided in an embodiment of the present application;
FIG. 2 is a schematic view illustrating the radiation range advantage of a curved display screen provided in an embodiment of the present application;
fig. 3 is a first flowchart of a phase deflection measurement method based on a curved screen according to an embodiment of the present application;
fig. 4 is a second flowchart of a phase deviation measurement method based on a curved screen according to an embodiment of the present application;
FIG. 5 is a schematic cylindrical coordinate system diagram of a curved display screen provided in an embodiment of the present application;
fig. 6 is a schematic structural diagram of a phase deviation measurement system according to an embodiment of the present application;
fig. 7 is a structural diagram of a calibration apparatus for calibrating a pose relationship in a phase deflection measurement system according to an embodiment of the present application;
fig. 8 is a structural diagram of a terminal according to an embodiment of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the present application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in the specification of the present application and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should be further understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
As used in this specification and the appended claims, the term "if" may be interpreted contextually as "when", "upon" or "in response to a determination" or "in response to a detection". Similarly, the phrase "if it is determined" or "if a [ described condition or event ] is detected" may be interpreted contextually to mean "upon determining" or "in response to determining" or "upon detecting [ described condition or event ]" or "in response to detecting [ described condition or event ]".
In particular implementations, the terminals described in embodiments of the present application include, but are not limited to, other portable devices such as mobile phones, laptop computers, or tablet computers having touch sensitive surfaces (e.g., touch screen displays and/or touch pads). It should also be understood that in some embodiments, the device is not a portable communication device, but is a desktop computer having a touch-sensitive surface (e.g., a touch screen display and/or touchpad).
In the discussion that follows, a terminal that includes a display and a touch-sensitive surface is described. However, it should be understood that the terminal may include one or more other physical user interface devices such as a physical keyboard, mouse, and/or joystick.
The terminal supports various applications, such as one or more of the following: a drawing application, a presentation application, a word processing application, a website creation application, a disc burning application, a spreadsheet application, a gaming application, a telephone application, a video conferencing application, an email application, an instant messaging application, an exercise support application, a photo management application, a digital camera application, a web browsing application, a digital music player application, and/or a digital video player application.
Various applications that may be executed on the terminal may use at least one common physical user interface device, such as a touch-sensitive surface. One or more functions of the touch-sensitive surface and corresponding information displayed on the terminal can be adjusted and/or changed between applications and/or within respective applications. In this way, a common physical architecture (e.g., touch-sensitive surface) of the terminal can support various applications with user interfaces that are intuitive and transparent to the user.
It should be understood that, the sequence numbers of the steps in this embodiment do not mean the execution sequence, and the execution sequence of each process should be determined by the function and the inherent logic of the process, and should not constitute any limitation to the implementation process of the embodiment of the present application.
The embodiment of the application provides a phase deflection measuring method based on a curved surface screen, and the method is applied to a phase deflection measuring system with a curved surface display screen, wherein the curved surface display screen in the phase deflection measuring system faces to the position of an object to be measured, and image acquisition is performed on the object in a visual field range through an image acquisition device, so that in the phase deflection measuring method executing process, a phase shift fringe pattern is displayed by using the curved surface display screen, a virtual image is formed on the surface of the object to be measured in a larger irradiation range and irradiation angle, when the image acquisition is performed on the virtual image formed on the surface of the object to be measured through the image acquisition device, the acquisition of complete phase information on the surface of the object with larger curvature is realized, and the reconstruction effect of the three-dimensional shape of a high-reflection object is improved.
In order to explain the technical solution described in the present application, the following description will be given by way of specific examples.
The phase deflection measurement method based on the curved screen provided in the embodiment of the application is applied to a phase deflection measurement system shown in fig. 1.
Specifically, as shown in fig. 1, the phase deviation measurement system includes: the device comprises a curved surface display screen and an image collector, wherein the display surface of the curved surface display screen faces to the position of an object to be detected.
This phase place deflection measurement system is with the replacement of plane display screen for curved surface display screen on traditional phase place deflection measurement system basis, combines shown in figure 2, through the setting of curved surface display screen, will enlarge the irradiation scope of display screen under the same radial dimension, the expansion is to the measuring area and the measurement angle of testee.
The curved surface display screen can be a spherical surface screen or even a free curved surface screen, and the screen is customized according to a specific measuring object to adapt to the measuring requirement of the measuring object. The number of the image collectors is not limited to a specific number, and the image collectors may be one or two, or a plurality of image collectors may be provided to measure a more complex reflecting surface.
The image collector is used for collecting images of an object in a field of view, and may be a camera or a video camera, and specifically may be a CCD (charge coupled device) camera.
The position of the object to be detected is a preset position, specifically a fixed position, or an adjustable position for realizing the acquisition of the multi-phase image by matching with a camera.
The measured object placed in the position of the object to be measured is different objects in different application stages. Specifically, in the calibration stage of the phase deflection measurement system, a plane mirror is disposed at the position of the object to be measured.
The method comprises the steps of placing a plane mirror at the position of an object to be measured, wherein the plane mirror is used for imitating light reflection propagation of a high-reflection object in an ideal state, when a calibration image is displayed in a curved surface display screen, a virtual image of the image appears in the plane mirror, an image collector can collect the curved surface screen virtual image reflected by the mirror surface through mirror reflection, and then shooting and storing are carried out so as to calibrate the pose relation between the curved surface display screen and the image collector in a phase deflection measurement system in the follow-up processing, so that the phase deflection measurement system after the pose relation calibration is enabled to carry out three-dimensional shape measurement on the flat or uneven high-reflection object to be measured.
And in the use stage of the phase deflection measurement system, the object to be measured is placed at the measurement position, and the calibrated phase deflection measurement system is utilized to implement the measurement and three-dimensional surface reconstruction processing processes of the object to be measured.
The phase deflection measurement method based on the curved screen will be described below with reference to different application stages of the phase deflection measurement system.
Referring to fig. 3, fig. 3 is a first flowchart of a phase deviation measurement method based on a curved screen according to an embodiment of the present application. As shown in fig. 3, the method for measuring phase deflection based on the curved screen includes the following steps:
and 301, sequentially displaying the phase shift fringe patterns with a set number on the curved surface display screen.
This process corresponds to the measurement phase of the phase deflection measurement system. Each phase shift fringe pattern forms a first virtual image on the surface of the object to be measured.
The set number of the phase shift fringe patterns can be set according to the actual requirement of the phase deviation measurement, for example, three, five, six, etc., so as to realize the phase decoding of the image based on the sequentially displayed phase shift fringe patterns.
The phase-shifted fringe pattern may be a sinusoidal fringe pattern in a particular application, and in particular a standard sinusoidal annular fringe pattern. The phase-shift fringe pattern forms a virtual image on the surface of the object to be detected, and the phase-shift fringe pattern is influenced by the three-dimensional surface of the object to be detected to generate fringe deformation when being projected to the surface of the object to be detected, so that the image collector can better capture the structural information of the object to be detected.
In one embodiment, the displaying of the phase-shift fringe pattern on the curved display screen is performed by sequentially displaying a plurality of phase-shift fringe patterns, and the texture structures of the plurality of phase-shift fringe patterns may not be consistent.
In the implementation, a set number of pictures of the multi-frequency phase-shift sine stripes in the horizontal and vertical directions can be generated by computer coding and are sequentially displayed on the curved screen.
The object to be detected is a highly reflective object, specifically a highly reflective object with a large curvature outer surface, such as a curved screen of a mobile phone or automobile glass in a special shape.
The display surface of the curved surface display screen faces to the position of the object to be measured, when a phase shift stripe image is displayed, the displayed image can form a virtual image on the surface of the object to be measured in a larger irradiation range and irradiation angle, the measurement area and the measurement angle of the object to be measured are expanded, and the requirement for measuring the surface type of the object with large curvature is met.
And step 302, controlling the image acquisition device to acquire images of the object to be detected, and respectively obtaining a first virtual image corresponding to each phase shift fringe pattern.
When the image collector collects images of an object to be measured to obtain a virtual image, the image collector collects the virtual image once when the curved surface display screen displays a phase shift fringe pattern.
Therefore, the first virtual image is acquired in accordance with the number of the displayed phase-shift fringe patterns.
Correspondingly, the virtual image acquired by the image acquisition device at the moment comprises a virtual image which is deformed after being modulated by the object to be measured. Therefore, the virtual image acquired by the image acquisition device is a modulation image.
And 303, based on the relative pose relation between the curved surface display screen and the image collector and the first virtual image, performing three-dimensional surface reconstruction on the object to be detected by adopting a phase deflection technology.
The principle of the phase deflection technology is that the gradient information of the mirror surface of the measured object is determined according to the phase information, and the three-dimensional surface type of the measured object is determined by methods such as gradient integration or interpolation.
After a group of first virtual image images are acquired by an image acquisition device, the specific application process of the phase deflection technology comprises the following steps:
the method comprises the steps that corresponding point matching is carried out by utilizing a first virtual image and a phase-shift fringe pattern displayed on a curved surface display screen, specifically, a pixel point of a virtual image and a pixel point corresponding to the pixel point on the curved surface display screen are searched by decoding through a multi-frequency heterodyne principle, and the corresponding point matching is realized; and then carrying out gradient computer reconstruction, specifically, after the correspondence between the camera imaging image pixel points and the curved screen display image pixel points is completed, unifying the coordinates of the virtual image pixel points and the screen display image pixel points to the same coordinate system by using the relative pose relationship between the curved screen display and the image collector which is calibrated by the phase deflection measurement system, acquiring the surface gradient distribution data of the object to be measured by a fringe reflection method, and then determining the three-dimensional surface type of the object to be measured by methods such as gradient integration or interpolation according to the relationship between the virtual image and the screen display image.
In the process of reconstructing the three-dimensional surface shape of the object to be measured, the image collector can collect virtual images of the object to be measured from more angles and in a wider range, so that complete phase information of the surface of the object to be measured can be acquired as much as possible, and the reconstruction effect of the three-dimensional shape of the high-reflection object is improved.
Therefore, in the embodiment of the application, the plane display screen is replaced by the curved surface display screen on the basis of the traditional phase deflection measurement system, the irradiation range of the display screen under the same radial dimension is enlarged through the arrangement of the curved surface display screen, the measurement area and the measurement angle of a measured object are expanded, the phase deflection measurement system is ensured to be capable of acquiring complete phase information of the surface of the object with larger curvature, and the reconstruction effect of the three-dimensional shape of the high-reflection object is improved.
The embodiment of the application also provides different implementation modes of the phase deflection measuring method based on the curved screen.
Referring to fig. 4, fig. 4 is a second flowchart of a phase deviation measurement method based on a curved screen according to an embodiment of the present application. Referring to fig. 4, the method for measuring phase deviation based on a curved screen includes:
The process corresponds to a calibration stage of the phase deflection measurement system, and in the calibration stage, the relative pose relationship between the curved surface display screen and the image collector is determined. The calibration image forms a second virtual image on the surface of the plane mirror, and the plane mirror is arranged at the position of the object to be measured.
Specifically, the calibration image is, for example, a classical checkerboard image, or other calibration images with mark points.
The calibration image may be a pattern with a mark point, which is generated by programming and is adapted to the resolution of the screen, and the pattern is displayed on the curved display screen in a full-screen display manner.
The method comprises the steps of converting pixel coordinates in a calibration image into three-dimensional space coordinates, wherein the three-dimensional space coordinates are specifically a cylindrical coordinate system constructed on the basis of a curved surface display screen, correspondingly matching mark point pixel points in the calibration image to the cylindrical coordinate system of the curved surface display screen, so that when the calibration image is projected to a plane mirror, coordinate information can be transmitted on the basis of the mark image coordinate points in the cylindrical coordinate system, curved surface information of the curved surface display screen can be transmitted through the space coordinates in the cylindrical coordinate system of the mark points in the calibration image, and finally the pose relation between a camera and the curved surface display screen can be accurately obtained.
When the calibration image is projected from the curved display screen to the plane mirror, the irradiation range is larger, and the calibration image with the mark points also has a larger coverage area in a virtual image in the plane mirror.
The second virtual image also has corresponding mark points, and the mark points can be obtained by converting first position coordinates of the mark points in the calibration image under a cylindrical coordinate system through a mirror imaging principle.
Specifically, as an optional implementation manner, the converting, based on the pixel coordinates of the mark point in the calibration image, to obtain first position coordinates of the mark point in the calibration image in the cylindrical coordinate system of the curved display screen, and mapping, based on the first position coordinates, to obtain second position coordinates of the mark point in the second virtual image, includes:
based on the pixel coordinates (S) of the marker point in the calibration imagepx,Spy) Obtaining the first position coordinate (x) of the mark point in the calibration image under the cylindrical coordinate system of the curved surface display screen through the coordinate conversion relational expressions,ys,zs)：
Wherein, referring to fig. 5, r is the curvature radius of the curved display screen, w is the horizontal pixel value of the curved display screen, pp is the pixel pitch of the curved display screen,
the included angle between the projection line of the connecting line between the mark point and the origin of the cylindrical coordinate system on the plane XOZ and the X axis;
after the first position coordinates of the mark points in the calibration image under the cylindrical coordinate system of the curved surface display screen are obtained, the second position coordinates of the mark points in the second virtual image are obtained through mapping (x) based on the first position coordinates by the mirror imaging principles,ys,-zs)。
The x-axis coordinate and the y-axis coordinate between the second position coordinate and the first position coordinate are the same, and the z-axis coordinate value is opposite.
And step 403, controlling the image collector to collect images of the plane mirror covered with the calibration plate to obtain an image of the calibration plate, and collecting images of the plane mirror uncovered with the calibration plate to obtain a second virtual image corresponding to the second virtual image.
Wherein, the calibration board can be a marking board with black and white checkerboard. After a calibration plate is covered on the plane mirror, the image collector collects images of the plane mirror at the moment to obtain a calibration plate image, position information of the plane mirror is obtained based on the calibration plate image to establish a pose relation between the image collector and the plane mirror, when the calibration plate is covered on the plane mirror, the image collector collects images of the plane mirror at the moment to obtain an image of a virtual image corresponding to the calibration image in the curved surface display screen in the plane mirror, and space position information of a virtual curved surface display screen (namely the virtual image of the curved surface display screen mapped in the plane mirror) is obtained based on the collected virtual image.
The image collector can collect the curved surface screen virtual images reflected by the mirror surfaces of the plane mirrors, and can select to change the postures of the plane mirrors for many times in the process of collecting the virtual image images and the calibration plate images so as to store the next groups of collected images and record more phase information.
And step 404, calculating to obtain a first position and posture relationship between the image collector and the second virtual image based on the second position coordinate and the imaging principle of the image collector and in combination with the second virtual image, and obtaining a second position and posture relationship between the image collector and the plane mirror based on the calibration plate image and the imaging principle of the image collector.
The imaging principle of the image collector is generally a pinhole imaging principle, and based on a second position coordinate of a virtual image (namely a virtual image of a curved display screen) of a mark point in a calibrated image in a plane mirror and a virtual image obtained by image collection of the virtual image in the plane mirror by the image collector, the pose relationship between the image collector and the virtual image in the plane mirror can be obtained by analysis by utilizing the propagation principle of light in the pinhole imaging process. Similarly, the pose relationship between the image collector and the virtual image in the plane mirror can be obtained by analyzing the position and orientation relationship based on the calibration plate image obtained by the image collector performing image collection on the plane mirror by using the propagation principle of light in the pinhole imaging process.
As an optional implementation manner, based on the second position coordinate and the imaging principle of the image collector, the first position-posture relationship between the image collector and the second virtual image is obtained by calculation in combination with the second virtual image, including:
establishing a nonlinear optimization objective function according to an imaging model of the image collector, and solving to obtain an internal reference matrix K of the image collector1And distortion D1And a first translation matrix between the image collector and the second virtual image
And a first rotation matrix
Wherein P is the second virtual image,
q' is a second position coordinate;
and obtaining a first attitude relationship based on the first rotation matrix and the first translation matrix.
As shown in fig. 1, for the image acquisition device, it is assumed that a mark point on the curved display screen is denoted as Q, a corresponding virtual image point in the plane mirror is denoted as Q', and an image of the virtual image point in the image acquisition device is denoted as P. Q and Q' are both (S) for the same pixel coordinatepx,Spy) And the values in the z-axis direction in the three-dimensional space coordinates of Q and Q' are opposite in positive and negative.
The process of establishing the nonlinear optimization objective function according to the imaging model of the image collector and solving the nonlinear optimization objective function can be realized by adopting a Zhang-Zhengyou calibration algorithm. After solving, the internal parameters of the image collector and the external parameters of the pose relationship between the virtual images in the plane mirror can be obtained simultaneously. In this embodiment, a translation matrix and a rotation matrix are used to indicate the pose relationship between two objects.
Further, when the second position-posture relationship between the image collector and the plane mirror is obtained through calculation, the second position-posture relationship between the image collector and the plane mirror can be obtained by adopting a PnP (passive-n-point) algorithm based on the calibration plate image.
And 405, calculating to obtain the pose relation between the image collector and the curved surface display screen based on the first pose relation and the second pose relation by combining a mirror reflection principle.
After the pose relationship between the image collector and the virtual image in the plane mirror and the pose relationship between the image collector and the plane mirror are obtained, the pose relationship between the image collector and the curved surface display screen is obtained through conversion based on the mirror surface attribute because the mirror surface has the attribute of reflection imaging.
The first attitude relationship includes a first rotation matrix and a first translation matrix, and the second attitude relationship includes a second rotation matrix and a second translation matrix. That is, a translation matrix and a rotation matrix are employed to indicate the pose relationship between two objects.
As an optional implementation manner, the calculating to obtain the relative pose relationship between the image collector and the curved surface display screen based on the first pose relationship and the second pose relationship by combining the mirror reflection principle includes:
based on the first position and attitude relationship and the second position and attitude relationship, and in combination with the mirror reflection principle, a third rotation matrix and a third translation matrix between the image collector and the curved surface display screen are calculated through the following relational expressions:
wherein ,I3Is an identity matrix, e3＝[0 0 1]T，ncIs a normal vector of the plane mirror,
is the distance between the plane mirror and the image collector,
in the form of a first rotation matrix, the first rotation matrix,
in order to be the first translation matrix,
in order to be the third rotation matrix, the first rotation matrix,
a third translation matrix;
wherein ,
in order to be the second rotation matrix, the first rotation matrix,
a second translation matrix;
and obtaining the pose relation between the image collector and the curved surface display screen based on the third rotation matrix and the third translation matrix.
Based on the second rotation matrix and the second translation matrix, calculating to obtain a normal vector of the plane mirror and a distance between the plane mirror and the image collector through a mirror reflection principle, then calculating to obtain a third rotation matrix and a third translation matrix between the image collector and the curved display screen through a corresponding relation formula by adopting Householder transformation, and taking the third rotation matrix and the third translation matrix as a pose relation between the image collector and the curved display screen.
Further, as an optional implementation manner, when there are at least two image collectors in the phase deflection measurement system, as shown in fig. 6, the image collector includes a first image collector (camera 1) and a second image collector (camera 2), the first image collector and the second image collector have a common view range, and the position of the object to be measured is located in the common view range.
It should be noted that, when the image collector includes a first image collector and a second image collector, the execution actions defined in steps 403, 404, and 405 are executed for each image collector, so that the relative pose relationship between each image collector and the curved display screen is finally calculated.
Correspondingly, when the image collector comprises a first image collector and a second image collector, after the relative pose relationship between the image collector and the curved surface display screen is calculated and obtained based on the first pose relationship and the second pose relationship and by combining the mirror reflection principle, the method further comprises the following steps:
and converting to obtain the relative pose relationship between the first image collector and the second image collector based on the relative pose relationship between the first image collector and the curved surface display screen and the relative pose relationship between the second image collector and the curved surface display screen.
In the step, the pose relationship between the two image collectors is obtained through conversion based on the pose relationship between the two image collectors and the same object. Therefore, the pose relationship between the first image collector and the curved surface display screen, the pose relationship between the second image collector and the curved surface display screen and the pose relationship between the first image collector and the second image collector can be obtained respectively, calibration of all the pose relationships in the phase deflection measurement system is achieved, and the phase deflection measurement system is further assisted to carry out effective three-dimensional reconstruction on the measured object in the subsequent stage.
According to the scheme, a curved display screen is used for replacing a common flat display screen, the position of a pixel point on the curved display screen is described by defining a cylindrical coordinate system, the relation between the pixel point and two image collectors is calibrated, the limitation on the curvature and the measurement range of a measured object is reduced, and a more complete appearance reconstruction result can be obtained when a phase deflection measurement system is used for measuring a high-reflection object with larger curvature by further combining three-dimensional visual angle fusion.
And 406, sequentially displaying the phase shift fringe patterns of the set number on the curved surface display screen.
The phase shift fringe pattern forms a first virtual image on the surface of the object to be measured.
The specific implementation process of this step is the same as that of step 301 in the foregoing embodiment, and is not described here again.
And 407, controlling the image acquisition device to acquire images of the object to be detected, and respectively obtaining a first virtual image corresponding to each phase shift fringe pattern.
The specific implementation process of this step is the same as the implementation process of step 302 in the foregoing embodiment, and is not described here again.
And 408, based on the relative pose relation between the curved surface display screen and the image collector and the first virtual image, performing three-dimensional surface reconstruction on the object to be detected by adopting a phase deflection technology.
The specific implementation process of this step is the same as the implementation process of step 303 in the foregoing embodiment, and is not described here again.
In the embodiment of the application, a plane display screen is replaced by a curved surface display screen on the basis of a traditional phase deflection measurement system, the irradiation range of the display screen under the same radial dimension is expanded through the arrangement of the curved surface display screen, the measurement area and the measurement angle of a measured object are expanded, meanwhile, the pixel coordinates of the mark points in the image marked by the screen are converted into the cylindrical coordinate system of the curved surface display screen, the mark point coordinates of the virtual image corresponding to the plane mirror in the plane mirror are obtained, and the determination of the pose relation between the camera and the curved surface display screen in the phase deflection measurement system is realized by combining the image acquisition operation of the camera on the plane mirror, so that the phase deflection measurement system can acquire complete phase information of the surface of an object with larger curvature, and the reconstruction effect of the three-dimensional appearance of a high-reflection object is improved.
Referring to fig. 7, fig. 7 is a structural diagram of a curved-screen-based phase deviation measurement system according to an embodiment of the present application, and for convenience of description, only a portion related to the embodiment of the present application is shown.
The phase deflection measurement system includes: the curved surface display screen and the image collector are arranged, and the display surface of the curved surface display screen faces to the position of the object to be detected; the phase deflection measurement system 700 further includes:
the display module 701 is configured to sequentially display a set number of phase shift fringe patterns on the curved display screen, where the phase shift fringe patterns form a first virtual image on the surface of the object to be measured;
an image acquisition module 702, configured to control the image collector to perform image acquisition on the object to be detected, so as to obtain a first virtual image corresponding to each phase-shift fringe pattern;
and the three-dimensional surface reconstruction module 703 is configured to perform three-dimensional surface reconstruction on the object to be detected by using a phase deflection technique based on the relative pose relationship between the curved surface display screen and the image collector and the first virtual image.
The system further comprises:
a calibration module to:
displaying a calibration image with a mark point on the curved surface display screen, wherein the calibration image forms a second virtual image on the surface of a plane mirror, and the plane mirror is arranged at the position of the object to be detected;
converting to obtain a first position coordinate of the mark point in the calibration image under a cylindrical coordinate system of the curved surface display screen based on the pixel coordinate of the mark point in the calibration image, and mapping to obtain a second position coordinate of the mark point in the second virtual image based on the first position coordinate;
controlling the image collector to collect images of the plane mirror covered with the calibration plate to obtain a calibration plate image, and collecting images of the plane mirror not covered with the calibration plate to obtain a second virtual image corresponding to the second virtual image;
calculating to obtain a first position and posture relation between the image collector and the second virtual image based on the second position coordinate and the imaging principle of the image collector and in combination with the second virtual image, and obtaining a second position and posture relation between the image collector and the plane mirror based on the calibration plate image and the imaging principle of the image collector;
and calculating to obtain the relative pose relationship between the image collector and the curved surface display screen based on the first pose relationship and the second pose relationship by combining a mirror reflection principle.
Wherein, this calibration module is used for specifically:
based on the pixel coordinates (S) of the marker point in the calibration imagepx,Spy) Obtaining a first position coordinate (x) of the mark point in the calibration image under the cylindrical coordinate system of the curved surface display screen through a coordinate conversion relational expressions,ys,zs)：
Wherein r is the curvature radius of the curved surface display screen, w is the horizontal pixel value of the curved surface display screen, pp is the pixel point distance in the curved surface display screen,
the included angle between the projection line of the connecting line between the mark point and the origin of the cylindrical coordinate system on the plane XOZ and the X axis is set;
based on the first position coordinate, obtaining a second position coordinate (x) of the mark point in the second virtual image by mappings,ys,-zs)。
Wherein, this calibration module is used for specifically:
establishing a nonlinear optimization objective function according to the imaging model of the image collector, and solving to obtain an internal parameter matrix K of the image collector1And distortion D1And a first translation matrix between the image collector and the second virtual image
And a first rotation matrix
Wherein P is the second virtual image,
q' is the second position coordinate, and is the imaging function of the image collector;
and obtaining the first attitude relationship based on the first rotation matrix and the first translation matrix.
The first attitude relationship comprises a first rotation matrix and a first translation matrix, and the second attitude relationship comprises a second rotation matrix and a second translation matrix; correspondingly, the calibration module is specifically configured to:
based on the first position and attitude relationship and the second position and attitude relationship, and in combination with a mirror reflection principle, a third rotation matrix and a third translation matrix between the image collector and the curved surface display screen are calculated by the following relational expressions:
wherein ,I3Is an identity matrix, e3＝[0 0 1]T，ncIs the normal vector of the plane mirror,
is the distance between the plane mirror and the image collector,
for the purpose of the first rotation matrix,
in order to be said first translation matrix, the translation matrix,
for the purpose of the third rotation matrix, the first rotation matrix,
is the third translation matrix;
wherein ,
for the purpose of the second rotation matrix, the first rotation matrix,
is the second translation matrix;
and obtaining the pose relation between the image collector and the curved surface display screen based on the third rotation matrix and the third translation matrix.
Furthermore, the image collector comprises a first image collector and a second image collector, the first image collector and the second image collector have a public view range, and the position of the object to be detected is located in the public view range.
Wherein, the calibration module is further configured to:
and converting to obtain the relative pose relationship between the first image collector and the second image collector based on the relative pose relationship between the first image collector and the curved surface display screen and the relative pose relationship between the second image collector and the curved surface display screen.
The phase deflection measurement system based on the curved screen provided by the embodiment of the application can realize each process of the embodiment of the phase deflection measurement method based on the curved screen, and can achieve the same technical effect, and in order to avoid repetition, the repeated description is omitted here.
Fig. 8 is a structural diagram of a terminal according to an embodiment of the present application. As shown in the figure, the terminal 8 of this embodiment includes: at least one processor 80 (only one shown in fig. 8), a memory 81, and a computer program 82 stored in the memory 81 and executable on the at least one processor 80, the processor 80 implementing the steps in any of the various method embodiments described above when executing the computer program 82.
The terminal 8 may be a desktop computer, a notebook, a palm computer, a cloud server, or other computing devices. The terminal 8 may include, but is not limited to, a processor 80, a memory 81. It will be appreciated by those skilled in the art that fig. 8 is only an example of a terminal 8 and does not constitute a limitation of the terminal 8, and that it may comprise more or less components than those shown, or some components may be combined, or different components, for example the terminal may further comprise input output devices, network access devices, buses, etc.
The Processor 80 may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic device, discrete hardware component, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The memory 81 may be an internal storage unit of the terminal 8, such as a hard disk or a memory of the terminal 8. The memory 81 may also be an external storage device of the terminal 8, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card) and the like provided on the terminal 8. Further, the memory 81 may also include both an internal storage unit and an external storage device of the terminal 8. The memory 81 is used for storing the computer program and other programs and data required by the terminal. The memory 81 may also be used to temporarily store data that has been output or is to be output.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working processes of the units and modules in the system may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus/terminal and method may be implemented in other ways. For example, the above-described apparatus/terminal embodiments are merely illustrative, and for example, the division of the modules or units is only one logical division, and there may be other divisions when actually implemented, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated modules/units, if implemented in the form of software functional units and sold or used as separate products, may be stored in a computer readable storage medium. Based on such understanding, all or part of the flow in the method of the embodiments described above can be realized by a computer program, which can be stored in a computer-readable storage medium and can realize the steps of the embodiments of the methods described above when the computer program is executed by a processor. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, usb disk, removable hard disk, magnetic disk, optical disk, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), electrical carrier wave signals, telecommunications signals, software distribution medium, and the like. It should be noted that the computer readable medium may contain content that is subject to appropriate increase or decrease as required by legislation and patent practice in jurisdictions, for example, in some jurisdictions, computer readable media does not include electrical carrier signals and telecommunications signals as is required by legislation and patent practice.
The present application realizes all or part of the processes in the method of the above embodiments, and may also be implemented by a computer program product, when the computer program product runs on a terminal, the steps in the above method embodiments may be implemented when the terminal executes the computer program product.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (10)
1. A phase deflection measurement method based on a curved screen is applied to a phase deflection measurement system, and is characterized in that the phase deflection measurement system comprises: the phase deflection measuring method comprises the following steps of:
sequentially displaying a set number of phase shift fringe patterns on the curved surface display screen, wherein the phase shift fringe patterns form a first virtual image on the surface of the object to be detected;
controlling the image collector to collect images of the object to be detected, and respectively obtaining a first virtual image corresponding to each phase shift fringe pattern;
and based on the relative pose relation between the curved surface display screen and the image collector and the first virtual image, performing three-dimensional surface type reconstruction on the object to be detected by adopting a phase deflection technology.
2. The phase deflection measurement method according to claim 1, wherein the determination of the relative pose relationship comprises:
displaying a calibration image with a mark point on the curved surface display screen, wherein the calibration image forms a second virtual image on the surface of a plane mirror, and the plane mirror is arranged at the position of the object to be detected;
converting to obtain a first position coordinate of the mark point in the calibration image under a cylindrical coordinate system of the curved surface display screen based on the pixel coordinate of the mark point in the calibration image, and mapping to obtain a second position coordinate of the mark point in the second virtual image based on the first position coordinate;
controlling the image collector to collect images of the plane mirror covered with the calibration plate to obtain a calibration plate image, and collecting images of the plane mirror not covered with the calibration plate to obtain a second virtual image corresponding to the second virtual image;
calculating to obtain a first position and posture relation between the image collector and the second virtual image based on the second position coordinate and the imaging principle of the image collector and in combination with the second virtual image, and obtaining a second position and posture relation between the image collector and the plane mirror based on the calibration plate image and the imaging principle of the image collector;
and calculating to obtain the relative pose relationship between the image collector and the curved surface display screen based on the first pose relationship and the second pose relationship by combining a mirror reflection principle.
3. The method for measuring phase deviation according to claim 2, wherein the obtaining of the first position coordinates of the marker point in the calibration image under the cylindrical coordinate system of the curved display screen through conversion based on the pixel coordinates of the marker point in the calibration image, and obtaining the second position coordinates of the marker point in the second virtual image through mapping based on the first position coordinates comprises:
based on the pixel coordinates (S) of the marker point in the calibration imagepx,Spy) Obtaining a first position coordinate (x) of the mark point in the calibration image under the cylindrical coordinate system of the curved surface display screen through a coordinate conversion relational expressions,ys,zs)：
Wherein r is the curvature radius of the curved surface display screen, w is the horizontal pixel value of the curved surface display screen, pp is the pixel point distance in the curved surface display screen,
the included angle between the projection line of the connecting line between the mark point and the origin of the cylindrical coordinate system on the plane XOZ and the X axis is set;
based on the first position coordinate, obtaining a second position coordinate (x) of the mark point in the second virtual image by mappings,ys,-zs)。
4. The method for measuring phase deviation according to claim 2, wherein the calculating a first position-orientation relationship between the image collector and the second virtual image based on the second position coordinates and an imaging principle of the image collector in combination with the second virtual image includes:
establishing a nonlinear optimization objective function according to the imaging model of the image collector, and solving to obtain an internal parameter matrix K of the image collector1And distortion D1And a first translation matrix between the image collector and the second virtual image
And a first rotation matrix
Wherein P is the second virtual image,
q' is the second position coordinate, and is the imaging function of the image collector;
and obtaining the first attitude relationship based on the first rotation matrix and the first translation matrix.
5. The method according to claim 2, wherein the first attitude relationship includes a first rotation matrix and a first translation matrix, and the second attitude relationship includes a second rotation matrix and a second translation matrix; the calculating based on the first position and posture relation and the second position and posture relation and by combining a mirror reflection principle to obtain the relative position and posture relation between the image collector and the curved surface display screen comprises the following steps:
based on the first position and attitude relationship and the second position and attitude relationship, and in combination with a mirror reflection principle, a third rotation matrix and a third translation matrix between the image collector and the curved surface display screen are calculated by the following relational expressions:
wherein ,I3Is an identity matrix, e3＝[0 0 1]T，ncIs the normal vector of the plane mirror,
is the distance between the plane mirror and the image collector,
for the purpose of the first rotation matrix,
in order to be said first translation matrix, the translation matrix,
for the purpose of the third rotation matrix, the first rotation matrix,
is the third translation matrix;
wherein ,
for the purpose of the second rotation matrix, the first rotation matrix,
is the second translation matrix;
and obtaining the pose relation between the image collector and the curved surface display screen based on the third rotation matrix and the third translation matrix.
6. The method for measuring phase deviation according to claim 2, wherein the image collector includes a first image collector and a second image collector, the first image collector and the second image collector have a common field of view, and the position of the object to be measured is located in the common field of view.
7. The method for measuring phase deflection according to claim 6, wherein after the relative pose relationship between the image collector and the curved display screen is calculated based on the first pose relationship and the second pose relationship in combination with a specular reflection principle, the method further comprises:
and converting to obtain the relative pose relationship between the first image collector and the second image collector based on the relative pose relationship between the first image collector and the curved surface display screen and the relative pose relationship between the second image collector and the curved surface display screen.
8. A curved screen based phase deflection measurement system, comprising: the device comprises a curved surface display screen and an image collector, wherein the display surface of the curved surface display screen faces to the position of an object to be detected; the phase deflection measurement system further includes:
the display module is used for sequentially displaying a set number of phase shift fringe patterns on the curved surface display screen, and the phase shift fringe patterns form a first virtual image on the surface of the object to be detected;
the image acquisition module is used for controlling the image acquisition device to acquire images of the object to be detected so as to respectively obtain a first virtual image corresponding to each phase-shift fringe pattern;
and the three-dimensional surface type reconstruction module is used for reconstructing the three-dimensional surface type of the object to be detected by adopting a phase deflection technology based on the relative pose relation between the curved surface display screen and the image collector and the first virtual image.
9. A terminal comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor implements the steps of the method according to any of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 7.
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