CN113596441B - Optical axis adjusting device, method, system and readable storage medium - Google Patents
Optical axis adjusting device, method, system and readable storage medium Download PDFInfo
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- CN113596441B CN113596441B CN202110941304.8A CN202110941304A CN113596441B CN 113596441 B CN113596441 B CN 113596441B CN 202110941304 A CN202110941304 A CN 202110941304A CN 113596441 B CN113596441 B CN 113596441B
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- 238000003384 imaging method Methods 0.000 claims abstract description 181
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B43/00—Testing correct operation of photographic apparatus or parts thereof
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Abstract
The application discloses an optical axis adjusting device, an optical axis adjusting method, an optical axis adjusting system and a readable storage medium. The optical axis adjusting device of the present application includes: a lens; a first test target surface; a second test target surface; the circuit board is used for acquiring imaging information and comparing the imaging information with preset imaging information to generate a comparison result; and the multi-axis adjusting component is used for adjusting the relative positions of the lens and the circuit board according to the comparison result. According to the optical axis adjusting device, the offset of imaging of the camera under ideal and actual conditions can be calculated, the multi-axis adjusting component is operated according to the offset, the optical axis of the camera is adjusted to an ideal position, namely, the optical axis is perpendicular to the light receiving surface of the image sensor, and the center point of the optical axis and the light receiving surface coincide, so that the offset of the optical axis and the center point of the image sensor is adjusted while the perpendicularity of the optical axis of the camera and the image sensor is adjusted, and the imaging effect of the camera is enabled to reach an optimal state.
Description
Technical Field
The present invention relates to the field of optical axis adjustment technologies, and in particular, to an optical axis adjustment device, an optical axis adjustment method, an optical axis adjustment system, and a readable storage medium.
Background
With the wide application of cameras, the requirement for the image quality of the cameras is also continuously increasing, wherein the position of the optical axis of the camera is particularly important for the image quality of the camera. However, in the camera production process, it is difficult to accurately adjust the optical axis position of the camera, so that the imaging of the camera cannot meet the requirements of practical application.
Disclosure of Invention
The present invention aims to solve at least one of the technical problems existing in the prior art. Therefore, the invention provides an optical axis adjusting device, an optical axis adjusting method, an optical axis adjusting system and a readable storage medium, wherein the optical axis adjusting method can adjust the offset of an optical axis and a center point of an image sensor and the perpendicularity of the optical axis and a light receiving surface of the image sensor, so that the imaging effect of a camera reaches an optimal state.
In a first aspect, the present invention discloses an optical axis adjustment device, including: a lens; a first test target surface; a second test target surface; the circuit board is used for acquiring imaging information and comparing the imaging information with preset imaging information to generate a comparison result; and the multi-axis adjusting component is used for adjusting the relative positions of the lens and the circuit board according to the comparison result.
The imaging information is the image information of focusing the lens on the light rays of the first test target surface and the second test target surface to form the first test target surface and the second test target surface; the preset imaging information is image information obtained by calculation according to a first distance, a second distance, a first setting parameter of the first test target surface, a second setting parameter of the second test target surface and the lens parameter; the first distance represents the distance between the first test target surface and the lens; the second distance represents the distance between the second test target surface and the lens.
According to the embodiment, by setting the first test target surface and the second test target surface with different setting parameters, when the optical axis of the lens is perpendicular to the light receiving surface of the image sensor and the optical axis is coincident with the center of the light receiving surface, the imaging position and the imaging size of the first test target surface and the second test target surface with different setting parameters in the image sensor after converging imaging through the lens are calculated, namely the preset imaging information; and shooting by a camera to obtain the actual imaging position and the actual imaging size of the imaging sensor after imaging the first test target surface and the second test target surface with different setting parameters by a lens, namely the imaging information. The offset of imaging under ideal and actual conditions is obtained by comparing the preset imaging information and the imaging information, and the optical axis of the camera can be adjusted to an ideal position by operating the multi-axis adjusting component according to the offset, namely, the optical axis is perpendicular to the light receiving surface of the image sensor and the center point of the optical axis and the light receiving surface coincides, and the offset of the optical axis and the center point of the image sensor can be adjusted while the perpendicularity of the optical axis of the camera and the image sensor is adjusted, so that the imaging effect of the camera reaches the optimal state.
In some embodiments, the first test target surface is provided with a plurality of first test points, and the plurality of first test points are symmetrically distributed; the second test target surface is provided with a plurality of second test points, and the second test points are symmetrically distributed; the first test point comprises a plurality of first identification blocks and a plurality of second identification blocks, and the characteristics of the first identification blocks are different from those of the second identification blocks; the first identification blocks and the second identification blocks are arranged in an array; the second test point comprises a plurality of third identification blocks and a plurality of fourth identification blocks, and the characteristics of the third identification blocks are different from those of the fourth identification blocks; the plurality of third identification blocks are arranged with the plurality of fourth identification block arrays.
In some embodiments, the optical axis adjustment device further comprises: the first support comprises a first substrate, a second substrate and a first support part, wherein the first substrate and the second substrate are oppositely arranged, the first support part is respectively connected with the first substrate and the second substrate, the first substrate is used for bearing the second test target surface, and a through hole is formed in the second substrate; the second supporting frame is arranged between the first test target surface and the second test target surface; wherein, the camera lens sets up in through-hole department.
In some embodiments, the optical axis adjustment device further comprises: the multi-axis adjusting fixing frame is connected with the multi-axis adjusting component and used for fixing the circuit board and the multi-axis adjusting component on one side, away from the first substrate, of the second substrate.
In some embodiments, the geometric center of the lens is on the same line as the geometric center of the first test target surface, and the geometric center of the first test target surface is on the same line as the geometric center of the second test target surface; the lens is arranged in parallel with the first test target surface, and the first test target surface is arranged in parallel with the second test target surface.
In a second aspect, the present invention further provides an optical axis adjustment method, which is applied to the optical axis adjustment device in any one of the foregoing embodiments, where the optical axis adjustment method includes:
acquiring imaging information; the imaging information is the image information of the first test target surface and the second test target surface formed by focusing the light rays of the first test target surface and the second test target surface by the lens;
Comparing the imaging information with preset imaging information, and obtaining a comparison result; the preset imaging information is image information obtained by calculation according to a first distance, a second distance, a first setting parameter of the first test target surface, a second setting parameter of the second test target surface and the lens parameter; the first distance represents the distance between the first test target surface and the lens; the second distance represents the distance between the second test target surface and the lens;
And controlling the multi-axis adjusting component according to the comparison result so as to adjust the relative position of the lens and the circuit board.
In some embodiments, the first test target surface includes a plurality of first test points, the second test target surface includes a plurality of second test points, and before the comparing the imaging information with the preset imaging information and obtaining the comparison result, the optical axis adjustment method further includes:
Acquiring a first preset coordinate; wherein the first preset coordinates include: a first coordinate corresponding to the plurality of first test points in the first test target surface coordinate system, and a second coordinate corresponding to the plurality of second test points in the first test target surface coordinate system;
Calculating according to the first preset coordinates to obtain second preset coordinates; wherein the second preset coordinates include: a third coordinate corresponding to the first coordinates in an imaging plane coordinate system of the lens, and a fourth coordinate corresponding to the second coordinates in the imaging plane coordinate system of the lens;
Calculating according to the second preset coordinates to obtain third preset coordinates; wherein the third preset coordinates include: a fifth coordinate corresponding to the third coordinates in the circuit board coordinate system, and a sixth coordinate corresponding to the fourth coordinates in the circuit board coordinate system;
And establishing the preset imaging information according to the third preset coordinates.
In some embodiments, the comparing result includes an offset, and the comparing the imaging information with preset imaging information and obtaining the comparing result includes:
Acquiring imaging coordinates according to the imaging information; wherein the imaging coordinates include: a first imaging coordinate of the first plurality of test points in the circuit board coordinate system and a second imaging coordinate of the second plurality of test points in the circuit board coordinate system; and calculating the offset of the imaging coordinate and the third preset coordinate.
The controlling the multi-axis adjusting part according to the comparison result includes:
and adjusting the multi-axis adjusting component according to the offset to adjust the relative position of the lens and the circuit board.
In a third aspect, the present invention also provides an optical axis adjustment system, which includes an optical axis adjustment device according to any one of the embodiments described above.
In a fourth aspect, the present invention also provides a computer-readable storage medium storing computer-executable instructions for performing the optical axis adjustment method according to any one of the above embodiments.
Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
The invention is further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a schematic diagram of an optical axis adjusting device according to an embodiment of the invention;
FIG. 2 is a schematic diagram of another structure of an optical axis adjusting device according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a first test target surface and a second test target surface according to an embodiment of the invention;
FIG. 4 is a schematic diagram of a first identification block (or a third identification block) and a second identification block (or a fourth identification block) according to an embodiment of the present invention;
FIG. 5 is a flowchart of an optical axis adjustment method according to an embodiment of the invention;
FIG. 6 is another flowchart of an optical axis adjustment method according to an embodiment of the present invention;
FIG. 7 is a flow chart of a method for adjusting an optical axis according to an embodiment of the present invention;
fig. 8 is a schematic diagram of an optical axis adjustment method according to an embodiment of the invention.
Reference numerals: 100. an optical axis adjusting device; 110. a lens; 120. a circuit board; 130. a first test target surface; 131. a first test point; 1311. a first identification block; 1312. a second identification block; 140. a second test target surface; 141. a second test point; 1411. a third identification block; 1412. a fourth identification block; 150. a multi-axis adjustment member; 161. a first substrate; 162. a second substrate; 163. a first support portion; 170. a second support frame; 180. and a multi-axis adjusting fixing frame.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative only and are not to be construed as limiting the invention.
In the description of the present invention, it should be understood that references to orientation descriptions such as upper, lower, front, rear, left, right, etc. are based on the orientation or positional relationship shown in the drawings, are merely for convenience of description of the present invention and to simplify the description, and do not indicate or imply that the apparatus or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention.
In the description of the present invention, the meaning of a number is one or more, the meaning of a number is two or more, and greater than, less than, exceeding, etc. are understood to exclude the present number, and the meaning of a number is understood to include the present number. The description of the first and second is for the purpose of distinguishing between technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless explicitly defined otherwise, terms such as arrangement, installation, connection, etc. should be construed broadly and the specific meaning of the terms in the present invention can be reasonably determined by a person skilled in the art in combination with the specific contents of the technical scheme.
In the description of the present invention, the descriptions of the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The lens, also called an optical lens, is an optical component for generating an image, and is composed of a plurality of lenses, and the optical lens can image an object to be photographed by collecting reflected light of the object to be photographed and focusing the light on an image sensor. The principle of lens imaging is that a convex lens is used for imaging, and the convex lens has the function of converging light rays, so the lens is also called a converging lens. The principle of convex lens imaging refers to that an object is placed on one side of a convex lens, and an inverted real image is formed on the other side of the convex lens, and in an optical lens, imaging is formed by converging actual light rays, and the imaging is called real image, and the real image can be connected by an image sensor. The optical axis of the lens is a straight line passing through the center of the lens and perpendicular to the mirror surface, and the light rays parallel to the optical axis pass through the lens and then intersect at a point, wherein the intersection point is the focus of the lens, and the light rays coincident with the optical axis do not refract when passing through the lens. In the related art, the optical axis of the camera, that is, the optical axis of the lens, often deviates from the light receiving surface of the image sensor, and the optical axis center of the lens and the center of the light receiving surface do not coincide, and are not perpendicular to each other. In the camera, when the optical axis of the lens coincides with the pixel center of the image sensor for imaging and the optical axis is perpendicular to the light receiving surface, the imaging effect of the camera is the best. When the lens is fixed on the optical axis adjusting device, namely the optical axis of the lens is unchanged, the pixel center of the circuit board is overlapped with the optical axis by adjusting the relative positions of the circuit board and the lens, and then the adjustment of the camera is completed.
Referring to fig. 1 and 2, wherein a dashed line is an optical axis of a lens 110, the present invention provides an optical axis adjusting device 100, wherein the optical axis adjusting device 100 includes the lens 110, a first test target surface 130, a second test target surface 140, a circuit board 120, and a multi-axis adjusting member 150; the circuit board 120 is configured to obtain imaging information, and compare the imaging information with preset imaging information to generate a comparison result; the multi-axis adjusting part 150 is configured to adjust a relative position of the lens 110 and the circuit board 120 according to the comparison result; the imaging information is the image information of focusing the lens 110 on the first test target surface 130 and the second test target surface 140 to form the first test target surface 130 and the second test target surface 140; the preset imaging information is image information calculated according to a first distance, a second distance, a first setting parameter of the first test target surface 130, a second setting parameter of the second test target surface 140, and the lens 110 parameter; the first distance represents a distance between the first test target surface 130 and the lens 110; the second distance represents a distance of the second test target surface 140 from the lens 110.
Specifically, in this embodiment, two test target surfaces are disposed on the object side imaged by the lens 110, including the first test target surface 130 and the second test target surface 140 (the first test target surface 130 and the second test target surface 140 are collectively referred to as test target surfaces in the following description). The test target surface is used as an object to be irradiated of the lens 110, and the light irradiated on the test target surface is focused through the lens group of the lens 110 after being diffusely reflected and imaged on the circuit board 120. The circuit board 120 is provided with an image sensor, also called a photosensitive element, which is a device for converting an optical image into an electronic signal. The light-receiving surface of an image sensor is composed of a plurality of light-sensing units, typically in megapixels. When the light receiving surface of the image sensor is irradiated by light, each photosensitive unit reflects the change of the charge on the component of the image sensor, namely, the light is converted into the charge. All signals generated by the photosensitive units are superimposed together to form a complete image, and then converted into digital signals, compressed and stored in the memory of the circuit board 120, and can be output to an external display screen for displaying the image. Furthermore, the digital signals of the images can be transmitted to a computer for processing, and the digital signals can be modified according to actual needs. For the camera, when there is an offset between the optical axis of the lens 110 and the center point of the image sensor, or the optical axis is not perpendicular to the light receiving surface of the image sensor, the local area of the imaging of the camera is unclear, which causes serious image defects.
It can be appreciated that the multi-axis adjustment component 150 in this embodiment can adjust the relative position of the optical axis of the lens 110 and the image sensor. Before adjusting the optical axis, preset imaging information is established. The preset imaging information refers to imaging information of the object to be shot passing through the lens 110 after passing through the lens 110 when the optical axis of the lens 110 is at an ideal position, i.e. the optical axis is perpendicular to the light receiving surface of the image sensor, and the optical axis is coincident with the center of the light receiving surface. In order to acquire preset imaging information, according to the imaging principle of the lens, different imaging positions of the first test target surface 130 and the second test target surface 140 on the light receiving surface of the image sensor after respectively converging and imaging through the lens 110 when the optical axes are at ideal positions are calculated. The imaging principle is to calculate imaging data of the object to be imaged on the image side of the lens 110 according to parameters of the lens or lens group of the lens 110 for imaging, the object distance between the object to be imaged and the lens 110, and the position and size of the object to be imaged.
Specifically, in this embodiment, different setting parameters for the identification are set on the first test target surface 130 and the second test target surface 140, where the setting parameter of the first test target surface 130 is a first setting parameter, and the setting parameter of the second test target surface 140 is a second setting parameter. The imaging image positions and sizes of the imaging image sensors of the test target surfaces with different setting parameters after converging light rays through the lens 110 are different, and the distances between the first test target surface 130 and the second test target surface 140 and the lens 110 are different, namely the first distance and the second distance. Combining the above factors that affect the imaging position and size of the object to be imaged at the image sensor after passing through the lens 110: the distance between the test target surface and the lens 110, different setting parameters of the test target surface and parameters of the lens 110 can calculate preset imaging information of the first test target surface 130 and the second test target surface 140, that is, the imaging positions and sizes of the two test target surfaces when the optical axes are at ideal positions. In this embodiment, the camera includes a lens 110 and a circuit board 120, and an image sensor is disposed on the circuit board 120, wherein an optical axis of the camera is an optical axis of the lens 110. In order to adjust the optical axis of the camera, after calculating the preset imaging information, the imaging information under the condition that the relative position of the optical axis and the image sensor is not adjusted needs to be obtained, and the actual positions and sizes of the first test target surface 130 and the second test target surface 140 imaged in the image sensor in a converging manner through the lens 110 are required to be obtained. For this reason, the imaging information of the first test target surface 130 and the second test target surface 140 can be obtained by using a camera to perform shooting, where the imaging information includes the actual positions and sizes of the two test target surfaces with different setting parameters when imaging in the image sensor, that is, the actual image information of imaging different test target surfaces when the optical axis is not in the ideal position.
It can be understood that the preset imaging information is the imaging position and size of the two test target surfaces when the optical axis of the camera is at the ideal position, the imaging information is the actual imaging position and size of the camera, the comparison result is obtained by calculating according to the preset imaging information and the imaging information, that is, the offset and the angle difference between the optical axis of the actual position and the optical axis of the ideal position, and the relative position between the optical axis and the image sensor is adjusted by the multi-axis adjusting component 150 according to the comparison result.
In this embodiment, by setting the first test target surface 130 and the second test target surface 140 with different setting parameters, when the optical axis of the camera is perpendicular to the light receiving surface of the image sensor and the optical axis is coincident with the center of the light receiving surface, the imaging positions and the sizes of the first test target surface 130 and the second test target surface 140 with different setting parameters in the image sensor after converging and imaging through the lens 110, namely the preset imaging information are calculated; and the camera shoots and obtains the actual imaging position and the actual imaging size of the imaging sensor, namely the imaging information, of the first test target surface 130 and the second test target surface 140 with different setting parameters after imaging through the lens 110. By comparing the preset imaging information with the imaging information to obtain the offset of imaging under ideal and actual conditions, the multi-axis adjusting component 150 is operated according to the offset, so that the optical axis of the camera can be adjusted to an ideal position, namely, the optical axis is perpendicular to the light receiving surface of the image sensor, and the optical axis coincides with the center point of the light receiving surface, and the offset of the optical axis and the center point of the image sensor can be adjusted while the perpendicularity of the optical axis of the camera and the image sensor is adjusted, so that the imaging effect of the camera reaches the optimal state.
Referring to fig. 3 and fig. 4, in some embodiments, the first test target surface 130 is provided with a plurality of first test points 131, and the plurality of first test points 131 are symmetrically distributed; the second test target surface 140 is provided with a plurality of second test points 141, and the plurality of second test points 141 are symmetrically distributed; the first test point 131 includes a plurality of first identification blocks 1311 and a plurality of second identification blocks 1312, where the plurality of first identification blocks 1311 and the plurality of second identification blocks 1312 have different features; the plurality of first identification blocks 1311 and the plurality of second identification blocks 1312 are arrayed; the second test point 141 includes a plurality of third identification blocks 1411 and a plurality of fourth identification blocks 1412, where the plurality of first identification blocks 1311 and the plurality of second identification blocks 1312 have different features; the third plurality of identification blocks 1411 are arrayed with the fourth plurality of identification blocks 1412.
Referring to fig. 1 to 4, it can be understood that, in order to achieve more accurate adjustment of the optical axis of the camera, corresponding parameters need to be set on the first test target surface 130 and the second test target surface 140. Specifically, the first test target surface 130 is located on a side close to the lens 110, that is, the object distance from the center point of the first test target surface 130 to the lens 110 is smaller than the object distance from the center point of the second test target surface 140 to the lens 110; a plurality of first test points 131 are arranged on the first test target surface 130, a plurality of second test points 141 are arranged on the second test target surface 140, and the positions and the sizes of the first test points 131 and the second test points 141 are different. The size of the test point (including the first test point 131 and the second test point 141) is proportional to the distance between the test point and the lens 110.
As can be seen from the above, by providing corresponding test points on the first test target surface 130 and the second test target surface 140, different objects, i.e., the first test point 131 and the second test point 141, with different sizes of the object side of the lens 110 at different positions can be obtained. As can be seen from the imaging principle of the lens, the positions and sizes of the objects to be imaged are different from each other in the image sensor after the objects to be imaged are focused by the lens 110, so that a plurality of test point imaging pictures with different positions and sizes can be calculated in preset imaging information by setting different test points.
The first test points 131 on the first test target surface 130 are symmetrically distributed, the second test points 141 on the second test target surface 140 are symmetrically distributed, and whether the offset in each direction is symmetrical or not can be intuitively calculated by arranging the symmetrically distributed test points. For example, when the optical axis is not perpendicular to the light receiving surface of the image sensor, it can be found by comparing the preset imaging information of the embodiment with the imaging information that the offset of imaging of the left and right test points is asymmetric, which indicates that the optical axis is not perpendicular at this time. Through the offset difference of the symmetrically distributed test points, the offset of the optical axis and the center point of the image sensor can be intuitively calculated, and whether the optical axis is perpendicular to the light receiving surface of the image sensor can be obtained.
Specifically, the test point is composed of two identification blocks with different characteristics. The different features may be different colors of the two identification blocks or different filling modes of the identification blocks, and in one test point, the identification blocks with different features are set, for example, the first identification block 1311 is a black lattice, the second identification block 1312 is a white lattice, the contrast ratio between the different identification blocks is large, the identification is easy, and the accuracy of optical axis adjustment can be effectively improved.
In this embodiment, when the preset imaging information is that the optical axis is at the ideal position, the first test target surface 130 and the second test target surface 140 are imaged in the image sensor ideally; the imaging information is the actual imaging of the first test target surface 130 and the second test target surface 140 converged on the image sensor through the lens 110 when the optical axis is at an unadjusted position, i.e. when the optical axis is offset or not perpendicular to the image sensor. From the above, it can be seen that the different test target surfaces are provided with corresponding symmetrically distributed test points, and the test points are formed by arranging black grids and white grid arrays. The imaging information comprises a plurality of test points symmetrically distributed on two test target surfaces, wherein the test points are formed by arranging black grids and white grid arrays in the imaging information; the preset imaging information is a plurality of boxes calculated according to the sizes and the positions of different test points, and the positions and the sizes of the boxes are related to the positions and the sizes of the different test points. Comparing preset imaging information with imaging information, namely comparing a square frame when a plurality of test points on different test target surfaces are imaged ideally with a test point when the test points are imaged actually, and when the optical axis is not positioned at an ideal position, calculating the offset between the square frame in the preset imaging information and the test points according to the number of black grids or white grids in the test points, wherein the offset is a comparison result, and adjusting the optical axis according to the comparison result. Therefore, the smaller the area of the mark block on the test target surface, the more accurate the calculated offset, and the higher the adjustment accuracy of the optical axis adjustment device 100.
Referring again to fig. 1 and 2, in some embodiments, the optical axis adjustment device 100 further includes: the first support frame includes a first substrate 161, a second substrate 162, and a first support 163, where the first substrate 161 and the second substrate 162 are disposed opposite to each other, the first support 163 is connected to the first substrate 161 and the second substrate 162, the first substrate 161 is used to carry the second test target surface 140, and the second substrate 162 is provided with a through hole; the second supporting frame 170 is disposed between the first test target surface 130 and the second test target surface 140; wherein, the lens 110 is disposed at the through hole.
It will be appreciated that the first and second support frames 170 are used to place and fix the first and second test targets 130, 140 and the lens 110.
Referring again to fig. 1 and 2, in some embodiments, the optical axis adjustment device 100 further includes: the multi-axis adjustment fixing frame 180 is connected to the multi-axis adjustment component 150, and is used for fixing the circuit board 120 and the multi-axis adjustment component 150 to a side of the second substrate facing away from the first substrate.
Specifically, one end of the multi-axis adjusting component 150 is connected to the multi-axis adjusting fixing frame 180, so as to be fixed in the optical axis adjusting device; the other end of the multi-axis adjusting part 150 is connected to the camera circuit board 120 for adjusting the relative position between the camera circuit board 120 and the lens 110. The multi-axis adjusting member 150 may be a manual screw type adjusting mechanism or an automatic adjusting mechanism. When the multi-axis adjusting part 150 is a manual screw type adjusting mechanism, after the preset imaging information and the imaging information are obtained through the content, the two pieces of image information are transmitted to a display screen through a computer to be displayed on the same screen, a box in the preset imaging information and a test point of the imaging information are observed, and the multi-axis adjusting part 150 is adjusted according to the actual condition of offset so that the test point of the imaging information moves until the test point coincides with the box. When the multi-axis adjusting component 150 is an automatic adjusting mechanism, the image data of the preset imaging information and the imaging information are transmitted to the computer for processing, the computer generates corresponding control instructions according to the offset of the test points and the boxes, wherein the offset refers to the number of the black lattices at the non-overlapped part of the boxes and the test points, and the control instructions control the multi-axis adjusting component 150 to move the circuit board 120 of the camera, so that the relative positions of the image sensor and the lens 110 on the circuit board 120 are changed, and finally, the coincidence of the optical axis and the center point of the image sensor is realized and the light receiving surface of the image sensor is perpendicular.
It will be appreciated that the multi-axis adjustment member 150 moves the image sensor on the circuit board 120 to change the position of the center point of the image sensor so that the center point coincides with the optical axis. The multi-axis adjusting member 150 may be a two-axis, three-axis or six-axis adjusting member according to the adjustment accuracy. Wherein the two-axis multi-axis adjustment member 150 is capable of adjusting the center point in the x and y directions; the three-axis multi-axis adjustment member 150 is capable of adjusting the center point in the x, y, and z directions; the six-axis multi-axis adjustment unit 150 can adjust the center point in the x, y, z directions and in the x=y, y=z, x=z directions. By increasing the number of axes of the multi-axis adjustment member 150, more accurate optical axis adjustment can be achieved.
Referring to fig. 1 and 2 again, in some embodiments, the geometric center of the lens 110 and the geometric center of the first test target surface 130 are located on the same line, and the geometric center of the first test target surface 130 and the geometric center of the second test target surface 140 are located on the same line, i.e. the dashed line shown in fig. 1 is straight. The lens 110 is disposed parallel to the first test target surface 130, and the first test target surface 130 is disposed parallel to the second test target surface 140.
In a second aspect, referring to fig. 1 to 5, the present application further provides an optical axis adjustment method, which is applied to the optical axis adjustment device 100 of any one of the above embodiments, and the optical axis adjustment method includes the steps of:
s101, acquiring imaging information;
s102, comparing the imaging information with preset imaging information, and obtaining a comparison result;
S103, controlling the multi-axis adjusting component according to the comparison result so as to adjust the relative position of the lens and the circuit board.
The imaging information is the image information of the first test target surface 130 and the second test target surface 140 formed by focusing the light of the first test target surface 130 and the second test target surface 140 by the lens 110; the preset imaging information is image information calculated according to a first distance, a second distance, a first setting parameter of the first test target surface 130, a second setting parameter of the second test target surface 140, and the lens 110 parameter; the first distance represents a distance between the first test target surface 130 and the lens 110; the second distance represents a distance of the second test target surface 140 from the lens 110.
It can be understood that the circuit board 120 is provided with an image sensor, when the position of the optical axis is not adjusted, the first test target surface 130 and the second test target surface 140 reflect light rays, which are converged by the lens 110, and then the actual imaging image of the image sensor, and the preset imaging information is calculated according to the distances between the first test target surface 130 and the second test target surface 140 and the lens 110, and the parameters of the lens 110, the parameters of the first test target surface 130 and the second test target surface 140 of the adjusted camera, when the optical axis of the lens 110 is at the ideal position, the first test target surface 130 and the second test target surface 140 converge on the ideal imaging image of the image sensor through the lens 110. The offset of the ideal imaging image and the actual imaging image is compared to obtain a comparison result, and the relative position of the lens 110 and the image sensor on the circuit board 120 is adjusted according to the comparison result, so that the center point of the adjusted image sensor is consistent with the optical axis, and the optical axis is perpendicular to the light receiving surface of the image sensor.
Referring to fig. 1 to 6, in some embodiments, the first test target surface 130 includes a plurality of first test points 131, the second test target surface 140 includes a plurality of second test points 141, and the optical axis adjustment method further includes, before step S102:
S201, acquiring a first preset coordinate;
s202, calculating according to the first preset coordinates to obtain second preset coordinates;
s203, calculating according to the second preset coordinates to obtain third preset coordinates;
step S204, the preset imaging information is established according to the third preset coordinates.
Wherein the first preset coordinates include a plurality of first coordinates of the plurality of first test points 131 in the first test target surface 130 coordinate system, and a plurality of second coordinates of the plurality of second test points 141 in the first test target surface 130 coordinate system; wherein the second preset coordinates include a plurality of third coordinates of the plurality of first coordinates in an imaging plane coordinate system of the lens 110, and a plurality of fourth coordinates of the plurality of second coordinates in an imaging plane coordinate system of the lens 110; wherein the third preset coordinates include a plurality of fifth coordinates of the plurality of third coordinates in the circuit board 120 coordinate system and a plurality of sixth coordinates of the plurality of fourth coordinates in the circuit board 120 coordinate system; .
It can be appreciated that a first preset coordinate of the test target surface is established, where the first preset coordinate includes coordinates of a plurality of test points, and the first test point 131 on the first test target surface 130 is a first coordinate, and the second test point 141 on the second test target surface 140 is a second coordinate.
For example, referring to fig. 1 to 8, test points are providedWherein/>For the coordinate position of a boundary angle of the test point in the first preset coordinate, the distances between the boundary angle of the test point and the x-axis and the y-axis of the coordinate system of the test target surface are represented respectively,/>Representing the vertical height of the plane of the test point from the lens 110,/>For the angle between the line of the boundary angle and the lens 110 and the vertical optical axis in the x-axis direction,/>Is the angle between the line connecting the boundary angle and the lens 110 and the vertical optical axis in the y-axis direction. Calculating two included angles between the boundary angle of the test point and the optical axis of the lens 110 according to the following inverse trigonometric function formula:
Then according to the corresponding relation data of the parameters of the adjusted lens 110 and the parameters, calculating to obtain a second preset coordinate based on the imaging surface after imaging through the lens 110 when the boundary angle of the test point is at the ideal position of the optical axis . If the imaging relationship data corresponding to the lens 110, the second preset coordinate/>, is calculated according to the following formula：
In the above-mentioned formula(s),Focal length for lens 110. The first preset coordinate is calculated by the formula to be/>Second preset coordinates/>, after imaging through the lens 110, of the test point boundary angle of (c). Calculating according to the second preset coordinates to obtain third preset coordinates, wherein when the third preset coordinates are that the optical axis is at an ideal position, after the boundary angles of the test points are converged through the lens 110, the pixel coordinates in the image sensor are set, and the pixel center point coordinates of the image sensor are set as/>Wherein/>For the number of pixels in the horizontal direction of the image sensor,/>Is the number of pixels in the vertical direction of the image sensor. For example, an 800 ten thousand pixel image sensor with 3264/>, pixel count2448, Then/>. And combining the pixel center point coordinates of the image sensor with the second preset coordinates to obtain third preset coordinates, wherein the calculation formula is as follows:
Wherein, Is the length of the pixel. And converting the second preset coordinates into pixel coordinates of the image sensor through the formula, namely, the third preset coordinates, so as to obtain the pixel coordinates of the boundary angle of the test point in the image sensor when the optical axis is at the ideal position. According to the same calculation principle, the pixel coordinates of the other three boundary angles of the same test point are obtained. By combining the pixel coordinates of the four boundary angles, a box corresponding to the test point can be generated, wherein the box is an ideal imaging image of the test point on the image sensor after passing through the lens 110 when the optical axis is at the ideal position.
It can be appreciated that, by adopting the same method as described above, a first preset coordinate is obtained for the first test target surface 130 and the second test target surface 140 respectively for the first test points 131 and the second test points 141, a second preset coordinate of the test points is obtained by combining the distance between the test target surface and the lens 110 and the parameters of the lens 110 according to the first preset coordinate, and finally a third preset coordinate is obtained by calculating according to the second preset coordinate. And generating a square frame corresponding to the test point according to the third preset coordinates, wherein the position and the size of the square frame are the position and the size of the test point when the test point is imaged ideally.
Referring to fig. 1 to 7, in some embodiments, the comparison result of the optical axis adjustment method includes an offset, and step S102 includes the following sub-steps:
S301, acquiring imaging coordinates according to the imaging information;
s302, calculating the offset of the imaging coordinate and the third preset coordinate.
Step S103 includes the sub-steps of: and adjusting a multi-axis adjusting component according to the offset to adjust the relative position of the lens 110 and the circuit board.
Wherein the imaging coordinates include first imaging coordinates of the plurality of first test points 131 in the circuit board 120 coordinate system and second imaging coordinates of the plurality of second test points 141 in the circuit board 120 coordinate system.
Specifically, the imaging coordinates include a first imaging coordinate and a second imaging coordinate, where the first imaging coordinate is a pixel of the plurality of first test points 131 actually imaged on the image sensor after converging and imaging through the lens 110, and the second imaging coordinate is a pixel coordinate of the plurality of second test points 141 actually imaged on the image sensor after converging and imaging through the lens 110. The first test target surface 130 and the second test target surface 140 are directly shot by a camera, and the shot images are subjected to data recording, so that the pixel coordinates of actual imaging of the image sensor after corresponding test points on different test target surfaces are converged by the lens 110 when the optical axis is not adjusted, namely the imaging coordinates, can be obtained.
It can be understood that the third preset coordinates are ideal imaging coordinates of the first test points 131 and the second test points 141 in the pixel coordinate system of the image sensor when the optical axis is at an ideal position, i.e. the optical axis is perpendicular to the image sensor and coincides with the center point of the image sensor; when the imaging coordinates are that the optical axis is not in the ideal position, the cameras shoot the first test points 131 and the second test points 141 to obtain actual imaging coordinates. Calculating the offset of the third preset coordinates and imaging, specifically, calculating the number of identification blocks of the non-overlapped part by taking the non-overlapped part of the block generated by the third preset coordinates and the imaging coordinates of the test point as the offset part of the block generated by the third preset coordinates and the imaging coordinates of the test point. And taking the offset as a comparison result, and adjusting the multi-axis adjusting component 150 according to the comparison result, thereby changing the relative position of the image sensor of the circuit board 120 and the lens 110, enabling the imaging coordinate to coincide with the third preset coordinate, realizing the adjustment of the optical axis of the camera, enabling the optical axis to be perpendicular to the light receiving surface of the image sensor and coincide with the center point of the image sensor, and enabling the imaging effect of the camera to reach the optimal state.
In a third aspect, the present invention further provides an optical axis adjustment system, including an optical axis adjustment device according to any one of the embodiments described above.
In a fourth aspect, the present invention also provides a computer-readable storage medium storing computer-executable instructions for performing the optical axis adjustment method according to any one of the above embodiments.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of one of ordinary skill in the art without departing from the spirit of the present invention. Furthermore, embodiments of the invention and features of the embodiments may be combined with each other without conflict.
Claims (9)
1. An optical axis adjustment device, comprising:
A lens;
The first test target surface is provided with a plurality of first test points which are symmetrically distributed; the first test point comprises a plurality of first identification blocks and a plurality of second identification blocks, and the characteristics of the first identification blocks are different from those of the second identification blocks; the first identification blocks and the second identification blocks are arranged in an array;
The second test target surface is provided with a plurality of second test points, and the second test points are symmetrically distributed; the second test point comprises a plurality of third identification blocks and a plurality of fourth identification blocks, and the characteristics of the third identification blocks are different from those of the fourth identification blocks; the plurality of third identification blocks are arranged with the plurality of fourth identification block arrays; the first test target surface is smaller than the second test target surface;
The size of the first test point is in direct proportion to the distance between the first test point and the lens, and the size of the second test point is in direct proportion to the distance between the second test point and the lens;
Wherein the characteristic difference comprises different colors of the two identification blocks or different filling modes of the identification blocks;
the circuit board is used for acquiring imaging information and comparing the imaging information with preset imaging information to generate a comparison result;
the multi-axis adjusting component is used for adjusting the relative positions of the lens and the circuit board according to the comparison result;
the imaging information is the image information of focusing the lens on the light rays of the first test target surface and the second test target surface to form the first test target surface and the second test target surface;
the preset imaging information is image information obtained by calculation according to a first distance, a second distance, a first setting parameter of the first test target surface, a second setting parameter of the second test target surface and a lens parameter; the first setting parameter is a mark and is used for distinguishing different test target surfaces; the second setting parameter is a mark and is used for distinguishing different test target surfaces;
The first distance represents the distance between the first test target surface and the lens;
the second distance represents a distance between the second test target surface and the lens.
2. The optical axis adjustment device according to claim 1, further comprising:
The first support comprises a first substrate, a second substrate and a first support part, wherein the first substrate and the second substrate are oppositely arranged, the first support part is respectively connected with the first substrate and the second substrate, the first substrate is used for bearing the second test target surface, and a through hole is formed in the second substrate;
the second supporting frame is arranged between the first test target surface and the second test target surface;
Wherein, the camera lens sets up in through-hole department.
3. The optical axis adjusting apparatus according to claim 2, further comprising:
the multi-axis adjusting fixing frame is connected with the multi-axis adjusting component and used for fixing the circuit board and the multi-axis adjusting component on one side, away from the first substrate, of the second substrate.
4. The optical axis adjustment device of claim 3, wherein a geometric center of the lens and a geometric center of the first test target surface are on a same line, and wherein a geometric center of the first test target surface and a geometric center of the second test target surface are on a same line;
The lens is arranged in parallel with the first test target surface, and the first test target surface is arranged in parallel with the second test target surface.
5. An optical axis adjusting method applied to the optical axis adjusting device as claimed in any one of claims 1 to 4,
Acquiring imaging information; the imaging information is the image information of the first test target surface and the second test target surface formed by focusing the light rays of the first test target surface and the second test target surface by the lens;
Comparing the imaging information with preset imaging information, and obtaining a comparison result; the preset imaging information is image information obtained by calculation according to a first distance, a second distance, a first setting parameter of the first test target surface, a second setting parameter of the second test target surface and a lens parameter; the first distance represents the distance between the first test target surface and the lens; the second distance represents the distance between the second test target surface and the lens;
And controlling the multi-axis adjusting component according to the comparison result so as to adjust the relative position of the lens and the circuit board.
6. The optical axis adjustment method according to claim 5, wherein the first test target surface includes a plurality of first test points, the second test target surface includes a plurality of second test points, and the optical axis adjustment method further includes, before the comparing the imaging information with preset imaging information and obtaining a comparison result:
Acquiring a first preset coordinate; wherein the first preset coordinates include: the first test points are corresponding to first coordinates in a first test target surface coordinate system, and the second test points are corresponding to second coordinates in the first test target surface coordinate system;
Calculating according to the first preset coordinates to obtain second preset coordinates; wherein the second preset coordinates include: a third coordinate corresponding to the first coordinates in an imaging plane coordinate system of the lens, and a fourth coordinate corresponding to the second coordinates in the imaging plane coordinate system of the lens;
calculating according to the second preset coordinates to obtain third preset coordinates; wherein the third preset coordinates include: a fifth coordinate corresponding to the third coordinates in a circuit board coordinate system, and a sixth coordinate corresponding to the fourth coordinates in the circuit board coordinate system;
And establishing the preset imaging information according to the third preset coordinates.
7. The optical axis adjustment method according to claim 6, wherein the comparison result includes an offset, the comparing the imaging information with preset imaging information, and obtaining the comparison result includes:
Acquiring imaging coordinates according to the imaging information; wherein the imaging coordinates include: a first imaging coordinate of the first plurality of test points in the circuit board coordinate system and a second imaging coordinate of the second plurality of test points in the circuit board coordinate system;
calculating the offset of the imaging coordinate and the third preset coordinate;
the controlling the multi-axis adjusting part according to the comparison result includes:
and adjusting the multi-axis adjusting component according to the offset to adjust the relative position of the lens and the circuit board.
8. An optical axis adjustment system comprising the optical axis adjustment device according to any one of claims 1 to 4.
9. A computer-readable storage medium storing computer-executable instructions for: performing the optical axis adjustment method of any one of claims 5 to 7.
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