CN113504030B - Phase randomization testing device and method for high-speed pulse laser - Google Patents
Phase randomization testing device and method for high-speed pulse laser Download PDFInfo
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Abstract
The invention discloses a phase randomization testing device of a high-speed pulse laser, which comprises: the laser source is connected with the input end of the beam splitter, the beam splitter is respectively connected with the long arm of the sagnac interference ring and the FM reflection short arm, and the front and back pulse reflected light of the long arm of the sagnac interference ring is interfered at the beam splitter; the detection module is used for converting the optical signals generated by interference into electric signals and testing the interference optical power at the same time; and the data analysis module is used for detecting the pulse randomness of the laser based on the interference light power and the electric signal of the interference light. Whether the laser has random phase or not is qualitatively judged by testing the visibility ratio of interference fringes under the continuous light and pulse light modes of the laser, and the laser can be tested by using an optical power meter, so that the optical path is simple and the cost is low; the single pulse interference peak value is sampled by a single time, so that sampling errors caused by time jitter are eliminated, the laser phase randomness is quantitatively judged based on the randomness of the interference peak, and the detection accuracy of the laser phase randomness is improved.
Description
Technical Field
The invention belongs to the technical field of quantum communication, and particularly relates to a phase randomization testing device and method for a high-speed pulse laser.
Background
The quantum secret communication technology is based on the unknown quantum state unclonable principle and the Hessenberg uncertainty principle, and is proved to be an absolute safe encryption technology in theory. Currently, the maturity of a Quantum Key Distribution (QKD) system based on BB84 protocol is highest, and scientific research teams such as the Toshiba corporation Cambridge institute, the university of solar shingles, japanese NEC and NICT, the American NIST and the China university realize BB84 practical QKD systems of 1 GHz-1.25 GHz, and the system has wide application prospects in the aspects of military, government affairs, customs, banks and the like.
For the BB84 quantum key distribution protocol, the phase randomness of the single photon source is one of the necessary factors to ensure its security. In current QKD systems, the single photon source is mostly generated after attenuation by a gain-switched DFB laser, in which each laser pulse is generated by a spontaneously radiating seed light, the photons vanish in the interval before the next pulse excitation, the spontaneously radiating phase is random, thus proving that the source phase is random. However, as the laser pulse frequency increases, the possibility of overlapping of front and rear pulses increases, and the randomization of pulse phases is questioned to some extent, and a qualitative and quantitative test method for the parameter is still lacking at present. Under the condition of rapid development of quantum communication, the method for designing the pulse phase randomness test of the laser light source is a key step of the security verification of the QKD system. In the prior art, pulse peak data are mostly tested by controlling an ADC (analog to digital converter) through an FPGA (field programmable gate array) through front-back pulse interference, but for a high-speed QKD system, the pulse repetition frequency is high, the pulse interval is shorter, the time jitter between pulses and the polarization inconsistency of pulses with different optical paths of long and short arms in an MZ interference ring lead to unstable interference caused by polarization and environmental change, and the influence on a test result is larger.
Disclosure of Invention
The invention provides a phase randomization testing device of a high-speed pulse laser, which aims to solve the problems.
The invention is realized by a high-speed pulse laser phase randomization testing device, which comprises:
the output end of the beam splitter is respectively connected with the long arm of the sagnac interference ring and the FM reflection short arm, and the front and back pulse reflected light of the long arm of the sagnac interference ring is interfered at the beam splitter;
the detection module is used for converting the optical signals generated by interference into electric signals and testing the interference optical power at the same time;
and the data analysis module is used for detecting the pulse randomness of the laser based on the interference light power and the electric signal of the interference light.
Further, the sagnac interferometric ring long arm further comprises:
a polarization beam splitter, a port 1 of the polarization beam splitter is connected with a port 2 of the phase modulation module, a port 3 of the polarization beam splitter is connected with a port 4 of the phase modulation module, the distance from the port 1 to the port 2 is equal to the distance from the port crossing 3 to the port 4,
the polarization beam splitter divides the pulse laser beam output by the beam splitter into two pulse lasers with horizontal polarization and vertical polarization, the two pulse lasers propagate along opposite directions, the phase modulation module synchronously adjusts the phases of the two pulse lasers, and the two pulse lasers are coupled into one laser beam at the polarization beam splitter and return to the beam splitter;
the FM reflection short arm is composed of a Faraday rotation reflector rotating by 90 degrees of polarization, and pulse laser output by the beam splitter is reflected by the Faraday rotation reflector rotating by 90 degrees of polarization and returns to the beam splitter;
the long arm of the sagnac interference ring has a reflection light delay nT compared with the FM short arm, wherein T is the emission period of the laser source pulse;
further, the device further comprises:
and the light intensity adjusting unit is used for adjusting the light pulse amplitude of the FM reflection short arm and the light pulse amplitude of the FM reflection short arm is consistent with the pulse amplitude of the long arm of the sagnac interference ring.
The invention also provides a phase randomization test method of the high-speed pulse laser, which comprises the following steps:
s1, acquiring the light intensity value of interference light to calculate the visibility theta of the pulse light interference fringes 1 ；
S2, calculating the visibility theta of interference fringes of continuous light by collecting the light intensity value of the interference light by a meter 2 ；
S3, calculating visibility theta of interference fringes 1 And dryFringe visibility theta 2 If the ratio is close to 0, preliminarily judging that the laser meets the phase randomization, and executing step S4;
s4, searching a pulse intensity peak value and a time interval t between the pulse intensity peak value and the period starting time in a pulse period based on an electric pulse signal of interference light 1 At a period t from the start of each cycle 1 And acquiring the pulse intensity of each pulse period, carrying out randomness detection on the acquired pulse intensity value, and if the randomness detection is passed, determining that the laser meets the phase randomness.
Further, the light pulse amplitude of the FM reflection short arm is adjusted by the light intensity adjusting unit to be consistent with the pulse amplitude of the long arm of the sagnac interference ring.
The phase randomization testing device for the high-speed pulse laser provided by the invention has the following beneficial technical effects:
(1) The FSM interference ring is used for replacing the traditional MZ interference ring, in the MZ interference ring, due to inconsistent long and short arm optical paths, the interference is influenced by unstable environmental change due to inconsistent polarization changes of the long and short arms, and the output pulse of the long and short arms of the FSM interference ring rotates 90 degrees relative to the polarization of the input pulse, so that the interference output is stable compared with the MZ interference ring;
(2) The method can qualitatively judge whether the laser has random phase or not by testing the visibility ratio of interference fringes under the continuous light and pulse light modes of the laser, and can be tested by using an optical power meter, so that the optical path is simple and the cost is low;
(3) The single pulse interference peak value is sampled by a single time, so that sampling errors caused by time jitter are eliminated, the phase randomness of the laser is quantitatively judged based on the randomness of the interference peak, the detection accuracy of the phase randomness of the laser is improved, and the method is suitable for the phase randomness test of the high-speed laser with the frequency of more than 1 GHz.
Drawings
FIG. 1 is a schematic diagram of a high-speed pulse laser phase randomization test device according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a continuous optical interference result provided by an embodiment of the present invention;
FIG. 3 is a schematic diagram of a pulse light interference result provided by an embodiment of the present invention;
fig. 4 is a schematic comparison diagram of electric pulse signal acquisition principle provided by the embodiment of the present invention, where (a) wei provides a data acquisition method in the prior art, and (b) provides a data acquisition method in the technical scheme of the present invention;
FIG. 5 is a graph of the probability density distribution of interference intensity provided by an embodiment of the present invention;
FIG. 6 is a schematic diagram of phase and intensity modulation of an interference module according to an embodiment of the present invention;
fig. 7 is a schematic diagram of a data detection and analysis structure according to an embodiment of the present invention.
Detailed Description
The following detailed description of the embodiments of the invention, given by way of example only, is presented in the accompanying drawings to aid in a more complete, accurate, and thorough understanding of the inventive concepts and aspects of the invention by those skilled in the art.
The phase randomization testing device of the high-speed pulse laser mainly comprises an interference module, a phase modulation module, a detection module and a data analysis module, wherein the interference module consists of a long arm of a sagnac interference ring (short long arm) and a short arm of FM (short arm) reflection, the phase modulation module is integrated in the interference module, adjacent pulses of laser or pulses separated by a plurality of periods are interfered, and the phase randomization of the pulses is tested by interference light intensity. Since the correlation probability between adjacent pulses is greater than that between separated pulse phases, the adjacent pulse phases are tested for randomness in this example.
The interference module used in this example is an FSM interference ring that can be fabricated in the form of a fiber structure, a free space structure, or a waveguide chip structure, as will be appreciated by those skilled in the relevant arts. In the prior art, the MZ interference ring is used, the polarization of the light pulse is inconsistent in the two long and short arms, so that the interference result is greatly influenced by environmental change, the sagnac ring and the FM in the FSM interference ring have anti-polarization disturbance performance, the interference result is little influenced by environmental change, the pulse acquisition modes acquire the single pulse intensity at the same time, the sampling error caused by adjacent pulse time jitter is reduced, and the method is more suitable for being used in a high-speed system.
The light pulse generated by the light source enters the interference module, and the delay time of the interference module is an integral multiple of the light pulse period, so that adjacent pulses interfere in output phase. The phase modulation module is arranged in the long arm of the sagnac interference ring, the phase difference of the long and short arm light pulses in the interference module is changed by adjusting the phase, the interference output is connected with the optical power meter, the optical power meter tests the average power of the optical signals, and if the fixed phase relation exists between the pulses, the power meter can see obvious light intensity change and clear interference fringes appear when the phase difference of the long and short arm light pulses is adjusted. If the phase between the pulses is random, when the phase difference of the long and short arm light pulses is adjusted, the power meter test light intensity is not changed under the accumulation of average time, interference fringes are not seen, and the test result is shown in fig. 3.
The laser comprises two modes, a continuous light mode and a gain switch pulse mode, wherein the laser emits continuous laser in the continuous light mode, and emits pulse laser in the gain switch pulse mode. Because the continuous optical phase is fixed, when the optical phase difference of the long and short arms of the interference module is regulated, obvious light intensity change can be seen in the power meter, and the visibility theta of interference fringes is tested 0 Close to 1. The laser is operated at the pulse frequency when the QKD system is operated again, the light pulse passes through the same interference module, the output interference light intensity is connected into the optical power meter, when the optical phase difference of the long and short arms is regulated, the light intensity is not obviously changed when the optical power meter is tested, and the visibility theta of interference fringes is tested 1 Close to 0. The interference light intensity of the laser in the two modes is collected, so that the interference fringe visibility ratio of continuous light and pulse light can be calculated, the interference fringe visibility ratio is used for qualitative detection of laser phase randomization, and the calculation formula of the interference fringe visibility theta is specifically as follows:
wherein I is max And I min The intensity values at which the interference constructors and the interference destructors are respectively, the closer the visibility of the interference fringes is to 1 as the phase correlation increases. The relationship between fringe visibility and phase dependence is described below, and the interference output intensity can be expressed as:
wherein ε is the dielectric constant, α A And alpha B For the field of adjacent interference pulses, θ is the relative phase of adjacent pulses, C is a constant, and the term for interference is given by the above equation:
while the phase isThe relative phase θ varies slowly and is a probability variable, and the visibility of the visible interference fringes is determined by the expected value of the relative phase θ. If the relative phase is subject to theta 0 Centered, the standard deviation is a gaussian probability density function of σ:
the expected values are:
the interference fringe visibility and the relative phase standard deviation relationship are as follows from equations (2) - (5):
as can be seen from equation (6), the smaller the relative phase standard deviation, the greater the relative phase correlation of adjacent pulses, and the higher the visibility of the interference fringes. Whereas the lower the visibility of the interference fringes. Thus, the test interference results in the continuous light and pulse light modes are shown in fig. 2 and 3, respectively. By testing the same interference ring, the randomness of the pulse phase can be determined by the ratio of the visibility of the interference fringes in the pulse mode to the visibility of the interference fringes in the continuous light mode.
Fig. 1 is a schematic diagram of a mechanism of a high-speed pulse laser phase randomization testing device according to an embodiment of the present invention, and for convenience of explanation, only a portion related to the embodiment of the present invention is shown, where the system includes:
the output end of the beam splitter is respectively connected with the long arm of the sagnac interference ring and the FM reflection short arm, and reflected light of the FM reflection short arm and the long arm of the sagnac interference ring is interfered at the beam splitter;
in the embodiment of the invention, the FM reflection short arm is composed of a Faraday rotation reflector with 90-degree polarization rotation; the sagnac interference ring long arm consists of a polarization beam splitter and a phase modulation module, wherein the polarization beam splitter is provided with two ports, namely a port 1 and a port 2, the phase modulation module is provided with two ports, namely a port 3 and a port 4, the port 1 of the polarization beam splitter is connected with the port 2 of the phase modulation module, the port 3 of the polarization beam splitter is connected with the port 4 of the phase modulation module, and the distance L from the port 1 to the port 2 12 Distance L from port intersection 3 to port 4 34 Equal.
The laser periodically emits pulse laser, the emission period is T, the pulse laser is divided into two pulse lasers by a beam splitter, namely pulse laser 1 and pulse laser 2, the pulse laser 1 is input into a Faraday rotary reflector with 90-degree polarization rotation, and then reflected to the beam splitter by the Faraday rotary reflector with 90-degree polarization rotation; the pulse laser 2 is divided into a pulse laser beam 21 with horizontal polarization and a pulse laser beam 22 with vertical polarization by a polarization beam splitter, the pulse laser beam 21 (pulse laser beam 22) propagates to a phase modulation module along the clockwise direction, the pulse laser beam 22 (pulse laser beam 21) propagates to the phase modulation module along the anticlockwise direction, the pulse laser beam 21 and the pulse laser beam 22 simultaneously carry out phase modulation on the phase modulation module, the pulse laser beam 21 and the pulse laser beam 22 modulated by the phase modulation module continue to propagate along the original direction, a new pulse laser beam is coupled at the polarization beam splitter, which is called a pulse laser beam 3, a phase difference exists between the pulse laser beam 3 and the pulse laser beam 2, a Faraday rotator FR is integrated inside the polarization beam splitter, the pulse laser beam 3 is reflected to the beam splitter, the reflected light of the pulse laser beam 2 is delayed to be nT of the pulse laser beam 1 by controlling the arm length of a sagnac interference ring and FM reflection short arm, n is a positive integer, and the reflected light of the pulse laser beam 2 interferes with the reflected light of the pulse laser beam 1 at the beam splitter;
the detection module consists of a photoelectric detector and a high-precision high-range optical power meter, wherein the optical power meter collects the power (also called light intensity) of interference light at a beam splitter and outputs the power to the data analysis module; the photoelectric detection device converts the interfered optical pulse signals into electric pulse signals and outputs the electric pulse signals to the data analysis module;
the data analysis module calculates the visibility of interference fringes based on the light intensity of the interference light, performs qualitative detection of laser phase randomization based on the ratio of the visibility of the interference fringes of continuous light and pulse light, and performs quantitative detection of laser phase randomization based on the electric pulse signal after the qualitative detection meets the requirements.
Interference module in addition to the FSM interference ring described above, for FM interference rings that are also resistant to polarization disturbances, the same applies in the present invention as an interference module, with a phase modulation module in the middle of the Faraday-Sagnac-Michelson interference ring (FSM interference ring for short), as shown in the dashed box in fig. 6, comprising a phase modulator, which may be an electro-optical lithium niobate crystal, a piezoceramic, a thermo-optical modulation, and other forms of phase modulation products in the future. The driving control unit can be voltage driving control, temperature control and the like, and the device is mainly used for voltage driving, and the driving voltage amplitude is required to be more than or equal to half-wave voltage of the phase modulator. The drive control unit in the phase modulation module is a high-precision output high-amplitude signal source, two channels are adjustable, under the continuous light and pulse light modes of the laser, the voltage regulation step is controlled to be 0.05V, scanning is carried out in the voltage range of 0-V pi, so that the phase on the long arm of the interference ring is modulated at 0-2 pi, the maximum and minimum values of the power value of the optical power meter are observed at the moment, the visibility of interference fringes is calculated, the ratio of the continuous light to the pulse light interference fringes is calculated, if the ratio is close to 0, the laser meets phase randomization, quantitative test of the photoelectric detector is triggered, and otherwise quantitative test by the photoelectric detector is not needed.
In another embodiment of the present invention, the high-speed pulse laser phase randomization test device further includes:
the light intensity adjusting unit is used for adjusting the light pulse amplitude of the FM reflection short arm so that the pulse amplitude of the FM reflection short arm is basically consistent with the pulse amplitude of the long arm of the sagnac interference ring; the intensity modulation unit is also integrated in the interference module, is connected in the FSM interference ring short arm, adjusts the short arm light pulse amplitude through drive control, balances the long arm and the short arm pulse amplitude, and ensures that the visibility of interference fringes is the highest so as to improve the test precision. In the laser pulse mode, the bias voltage is adjusted at the bias port of the intensity modulator to 0.01V by the drive control unit, and the optical power metering is observed until the minimum power value of the optical power metering is written into the drive control unit.
The detection module in the invention is composed of a photoelectric detector and an optical power meter, and the structure is as shown in fig. 7, wherein a part of optical pulses output by the interference module is connected with the photoelectric detector, converts optical signals into electric signals, and then connects the output electric signals to the data analysis module. And the other part of the output optical signals are connected into a high-precision optical power meter, and the power values are input into a data analysis module.
The laser outputs continuous light and pulse light respectively, the optical power meter scans driving voltage through a driving control unit of the phase modulation module, the interference output optical power is tested after the phase modulation module modulates the phase, the power value is input into the data analysis module, an interference light intensity-voltage curve (the voltage scanning range is more than or equal to half-wave voltage) is drawn through the data analysis module, the visibility of interference fringes of the continuous light and the pulse light is tested, and the ratio of the two is close to 0. At the moment, the photoelectric detector is started, the tested optical pulse signal is converted into an electric pulse signal with the same frequency as the laser, and meanwhile, the electric pulse signal is output to enter the data analysis module.
The data analysis module in the device receives two signals of the detection module, wherein one part is the power value detected by the optical power meter, and the other part is the electric pulse signal detected by the photoelectric detector. The data analysis module firstly draws an interference light intensity-voltage curve through the light power value, and qualitatively judges the phase randomness of the laser through the interference fringe visibility ratio. After the randomness qualitative determination is passed, the detection module starts to collect the electric pulse signals of the photoelectric detector, as shown in fig. 4, in a fixed pulse period range P 1 Finding the peak value of the pulse, and determining the corresponding time t of the peak value 1 Then fix at t 1 And repeatedly acquiring pulse values at the moment, wherein the number of values is more than 10 k. The data analysis module draws the collected numerical values through the data analysis module to form an interference intensity probability density curve, and meanwhile, the numerical values are subjected to randomness test.
In the prior art, the equal interval pulse sampling is mostly adopted, the peak value of the interference pulse is acquired once in each interval of one time period, and the time jitter exists between each pulse, the pulse period has a certain variation interval, and the point of the interference peak value which is acquired during the equal interval sampling is not the actual point of the interference peak value, as shown in (a) of fig. 4, I 1 The sampling error may be caused by the fact that the peak value of the solid line pulse is collected during sampling at the positions of the front and rear dashed lines, and finally, the test error is caused. For lasers with higher pulse repetition frequencies, the more error the time jitter introduces to the test.
The invention adopts single pulse sampling, searches pulse intensity peak value in pulse period and time interval t from the start time of the period 1 At a period t from the start of each cycle 1 And the pulse intensity of each pulse period is acquired, as shown in (b) of fig. 4, the influence of adjacent pulse time jitter on the sampling accuracy is eliminated, and the accuracy of the test is improved. After the data of the interference peak point are acquired, the acquired result is drawn to be interferenceThe light intensity probability density curve, as shown in fig. 5, was simultaneously subjected to random number detection, thereby quantitatively testing the laser pulse randomness.
While the invention has been described above with reference to the accompanying drawings, it will be apparent that the invention is not limited to the above embodiments, but is capable of being modified or applied directly to other applications without modification, as long as various insubstantial modifications of the method concept and technical solution of the invention are adopted, all within the scope of the invention.
Claims (4)
1. A high-speed pulse laser phase randomization test device, the device comprising:
the output end of the beam splitter is respectively connected with the long arm of the sagnac interference ring and the FM reflection short arm, and the front and back pulse reflected light of the long arm of the sagnac interference ring is interfered at the beam splitter;
the detection module is used for converting the optical signals generated by interference into electric signals and testing the interference optical power at the same time;
the data analysis module is used for detecting the pulse randomness of the laser based on the interference light power and the electric signal of the interference light;
the sagnac interferometric loop long arm further comprises:
a polarization beam splitter, a port 1 of the polarization beam splitter is connected with a port 2 of the phase modulation module, a port 3 of the polarization beam splitter is connected with a port 4 of the phase modulation module, the distance from the port 1 to the port 2 is equal to the distance from the port crossing 3 to the port 4,
the polarization beam splitter divides the pulse laser beam output by the beam splitter into two pulse lasers with horizontal polarization and vertical polarization, the two pulse lasers propagate along opposite directions, the phase modulation module synchronously adjusts the phases of the two pulse lasers, and the two pulse lasers are coupled into one laser beam at the polarization beam splitter and return to the beam splitter;
the FM reflection short arm is composed of a Faraday rotation reflector rotating by 90 degrees of polarization, and pulse laser output by the beam splitter is reflected by the Faraday rotation reflector rotating by 90 degrees of polarization and returns to the beam splitter;
the long arm of the sagnac interference ring is compared with the reflective light delay nT of the FM reflective short arm, and T is the emission period of the laser source pulse.
2. The high-speed pulse laser phase randomization test device in accordance with claim 1, further comprising:
and the light intensity adjusting unit is used for adjusting the light pulse amplitude of the FM reflection short arm and the light pulse amplitude of the FM reflection short arm is consistent with the pulse amplitude of the long arm of the sagnac interference ring.
3. A phase randomization test method based on the high-speed pulse laser phase randomization test device of any one of claims 1 to 2, the method comprising the steps of:
s1, acquiring the light intensity value of interference light to calculate the visibility theta of the pulse light interference fringes 1 ；
S2, calculating the visibility theta of interference fringes of continuous light by collecting the light intensity value of the interference light by a meter 2 ；
S3, calculating visibility theta of interference fringes 1 Visibility theta with interference fringe 2 If the ratio is close to 0, preliminarily judging that the laser meets the phase randomization, and executing step S4;
s4, searching a pulse intensity peak value and a time interval t between the pulse intensity peak value and the period starting time in a pulse period based on an electric pulse signal of interference light 1 At a period t from the start of each cycle 1 And acquiring the pulse intensity of each pulse period, carrying out randomness detection on the acquired pulse intensity value, and if the randomness detection is passed, determining that the laser meets the phase randomness.
4. A method for phase randomization test of a fast pulse laser in accordance with claim 3, wherein the light pulse amplitude of the FM reflection short arm is adjusted to be consistent with the pulse amplitude of the sagnac interference ring long arm by a light intensity adjustment unit.
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