CN113242089A - Test method and test circuit based on 400G optical module - Google Patents
Test method and test circuit based on 400G optical module Download PDFInfo
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- CN113242089A CN113242089A CN202110505103.3A CN202110505103A CN113242089A CN 113242089 A CN113242089 A CN 113242089A CN 202110505103 A CN202110505103 A CN 202110505103A CN 113242089 A CN113242089 A CN 113242089A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a test method based on a 400G optical module, wherein the test method comprises the following steps: including, host computer control standard photoelectric module works in pseudo-random code mode and error code detection mode, replace high-end error code appearance through standard photoelectric module, standard photoelectric module and the photoelectric module that awaits measuring all set up on same production testing board simultaneously, adopt 16 to connect high-speed electric differential signal group, need not 32 expensive radio frequency connecting wires, through above-mentioned connected mode, realize the production test to the 400G optical module, high-end error code appearance has both been saved, 32 expensive radio frequency connecting wires, the replacement cost who surveys the board has also greatly reduced.
Description
Technical Field
The invention relates to the field of photoelectric testing, in particular to a testing method and a testing circuit based on a 400G optical module.
Background
With the enlargement and upgrading of the scale of the data center, the 400G QSFP-DD/OSFP optical modules are more and more popular. As shown in fig. 1, a 400G optical module to be tested is inserted into a 400G production test board, then a differential signal sent by the high-end error tester is received by 16 radio frequency lines, the 400G optical module receives the differential signal and performs electro-optical conversion on the differential signal, after the conversion is completed, the optical signal is sent to a light receiving port of the 400G optical module to be tested from a light emitting port of the 400G optical module to be tested through an optical fiber self-loop, the 400G optical module receives the optical signal and performs electro-optical conversion on the optical signal into 8 pairs of differential electrical signals, then the differential signals are sent to the high-end error tester through 16 radio frequency lines, and the high-end error tester performs analysis processing according to the received signal to obtain a test result. At present, one high-end error code meter usually needs hundreds of thousands of units to millions of units, 32 expensive radio frequency connecting wires need to be arranged on a test board, each radio frequency connecting wire needs to be near thousand units of RMB, an optical module connector of the test board has certain plugging and unplugging frequency service life limitation, the test board needs to be replaced regularly in the production test process, and the cost is very high. Based on the existing testing device, the specific testing method is as follows: the high-end error code instrument sends a corresponding error code signal, the photoelectric module to be tested receives the corresponding error code signal and turns the error code signal to the high-end error code instrument, and the high-end error code instrument performs analysis processing according to the received signal to obtain a test result.
Disclosure of Invention
Based on the technical defects, a test method and a test circuit based on a 400G optical module specifically comprise the following steps:
in one aspect, the present invention provides a test method based on a 400G optical module, wherein: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
forming a pseudo-random code generation control instruction through a first preset instruction, controlling a standard photoelectric module to work in a pseudo-random code mode under the action of the pseudo-random code generation control instruction, and generating and sending a pseudo-random code by the standard photoelectric module; controlling the temperature control table to work in a first temperature state, and performing calibration operation on the photoelectric module to be tested;
the upper computer sets the temperature control table to work in a second temperature state, a first test control instruction is formed through a second preset instruction, and the photoelectric module to be tested is controlled to be tested under the action of the first test control instruction so as to form a first test result and a second test result to be output;
the upper computer sets a temperature control table to work in a third temperature state, a third test control instruction is formed through a third preset instruction, and the photoelectric module to be tested is controlled to be tested under the action of the third test control instruction so as to form a third test result and a fourth test result to be output;
the upper computer sets a temperature control table to work in a first temperature state, a fourth test control instruction is formed through a fourth preset instruction, and the photoelectric module to be tested is controlled to be tested under the action of the fourth test control instruction so as to form a fifth test result and a sixth test result to be output;
and forming a detection result according to the first test result, the second test result, the third test result, the fourth test result, the fifth test result and the sixth test result.
Preferably, the test method based on the 400G optical module is as follows: forming a pseudo-random code generation control instruction through a first preset instruction, controlling a standard photoelectric module to work in a pseudo-random code mode under the action of the pseudo-random code generation control instruction, and generating and sending a pseudo-random code by the standard photoelectric module; controlling the temperature control table to work in a first temperature state, and calibrating the to-be-measured photoelectric module specifically comprises:
reading and recording the type, P/N information and S/N information of the photoelectric module to be detected by the upper computer in the state that the photoelectric module to be detected is inserted into a preset position; the upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, and sets a pseudo-random code of an SSPRQ mode output by a transmitting end of the standard photoelectric module;
the upper computer sets the temperature control table to work in a first temperature state, so that the shell temperature of the photoelectric module to be tested is kept at 40 ℃,
the upper computer carries out calibration operation to the photoelectric module to be measured through the I2C instruction, and the calibration data at least includes transmitting terminal eye diagram, transmitting optical power monitoring, receiving optical power monitoring, temperature monitoring, voltage monitoring, receiving no light alarm level and elimination level.
Preferably, in the testing method based on the 400G optical module, the setting, by the upper computer, of the temperature control console to work in the second temperature state, forming a first test control instruction through a second predetermined instruction, and controlling the optoelectronic module to be tested to perform a test under the action of the first test control instruction to form a first test result and output a second test result specifically includes:
the upper computer sets a temperature control table to work in a second temperature state, so that the temperature of the shell of the photoelectric module to be tested is kept at 0 ℃, 3.3V voltage of the photoelectric module to be tested is set to be 3.3V (100-5%) V,
the upper computer tests the photoelectric module to be tested, the first test data at least comprises an emitting end eye pattern, emitting optical power and emitting optical power monitoring precision, a first test result is formed according to the first test data, and the first test result is output to the detection device through a GPIB interface;
the upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, sets a pseudo random code of a PRBS31 mode type output by a transmitting end, and controls a receiving end of the standard photoelectric module to be in a working state;
and the upper computer tests the photoelectric module to be tested of the DUT, the second test data at least comprises receiving sensitivity, optical power monitoring precision, temperature monitoring, voltage monitoring, receiving no optical alarm level and eliminating level, a second test result is formed according to the second test data, and the second test result is output to the standard photoelectric module through a GPIB interface.
Preferably, in the testing method based on the 400G optical module, the setting, by the upper computer, of the temperature control console to work in a third temperature state, a third test control instruction is formed through a third predetermined instruction, and the controlling, under the action of the third test control instruction, the to-be-tested optoelectronic module to be tested to form a third test result and the outputting of the fourth test result specifically include:
the upper computer sets a temperature control table to work in a third temperature state, so that the shell temperature of the photoelectric module to be tested is kept at 70 ℃, and the 3.3V voltage of the photoelectric module to be tested is set to be
3.3V*(100％+5％)V，
The upper computer configures a standard photoelectric module as an error code detection mode through an I2C instruction, and sets a transmitting end to output a pseudo-random code of an SSPRQ mode type;
the upper computer tests the photoelectric module to be tested of the DUT, third test data comprise an emitting end eye diagram, emitting optical power and emitting optical power monitoring precision, and a third test result is output to the detection device through a GPIB interface;
the upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, sets a pseudo random code of a PRBS31 mode type output by a transmitting end, and controls a receiving end of the standard photoelectric module to be in a working state;
and the upper computer tests the photoelectric module to be tested of the DUT, the fourth test data at least comprises receiving sensitivity, optical power monitoring precision, temperature monitoring, voltage monitoring, receiving no optical alarm level and eliminating level, a fourth test result is formed according to the fourth test data, and the fourth test result is output to the standard photoelectric module through a GPIB interface.
Preferably, in the testing method based on the 400G optical module, the setting, by the upper computer, of the temperature control console to work in the first temperature state, a fourth test control instruction is formed through a fourth predetermined instruction, and the controlling, under the action of the fourth test control instruction, the to-be-tested optoelectronic module to be tested to form a fifth test result and outputting a sixth test result specifically includes: the upper computer sets the temperature control table to work in a first temperature state, so that the temperature of the shell of the photoelectric module to be tested is kept at 40 ℃, and 3.3V voltage of the photoelectric module to be tested is set to be 3.3V.
The upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, and sets a pseudo-random code of an SSPRQ mode output by a transmitting end of the standard photoelectric module;
the host computer tests the photoelectric module to be tested, fifth test data at least comprise an emitting end eye pattern, emitting optical power and emitting optical power monitoring precision, and a fifth test result is output to the detection device through a GPIB interface;
the upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, sets a pseudo random code of a PRBS31 mode type output by a transmitting end, and controls a receiving end of the standard photoelectric module to be in a working state;
and the upper computer tests the photoelectric module to be tested of the DUT, sixth test data at least comprise receiving sensitivity, optical power monitoring precision, temperature monitoring, voltage monitoring, receiving no optical alarm level and eliminating level, and a sixth test result is formed according to the sixth test data and is output to the standard photoelectric module through a GPIB interface.
In another aspect, the present invention further provides a test circuit based on a 400G optical module, wherein: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
producing a test board;
a photoelectric module to be tested; inserting the test board into a first preset position of the production test board;
the standard photoelectric module is inserted into a second preset position of the production test board and controls the standard photoelectric module to work in a pseudo-random code generation and error code detection mode; wherein the first predetermined location is disposed at a back of the second predetermined location; wherein the standard photovoltaic module is formed by a standard 400G optical module;
the high-speed electrical differential signal group is connected between the photoelectric module to be tested and the standard photoelectric module; the high-speed electrical differential signal group comprises 8 pairs of 8-by-50G high-speed transmitting signal differential lines and 8 pairs of 8-by-50G high-speed receiving signal differential lines;
and the power supply unit is respectively connected with the photoelectric module to be detected and the standard photoelectric module.
Preferably, the test circuit based on the 400G optical module is described above, wherein: the standard photoelectric module generates 8 pairs of differential test signals and sends the differential test signals to the photoelectric module to be tested through 8 pairs of 8-by-50G high-speed emission signal differential lines.
Preferably, the test circuit based on the 400G optical module is described above, wherein: the photoelectric module to be tested generates 8 pairs of differential test signals and sends the differential test signals to the standard photoelectric module through 8 pairs of 8-by-50G high-speed receiving signal differential lines.
Compared with the prior art, the invention has the advantages that:
can utilize integrated pseudo-random code transmission and error code detection function in the inside DSP chip of 400G optical module, set up 400G optical module to work in pseudo-random code production and error code detection mode in order to form standard photoelectric module, replace high-end error code appearance through standard photoelectric module, standard photoelectric module and the photoelectric module that awaits measuring all set up on same production test board simultaneously, adopt 16 to connect high-speed electric differential signal group, need not 32 expensive radio frequency connecting wires, through the above-mentioned connected mode, realize the production test to 400G optical module, high-end error code appearance has both been saved, 32 expensive radio frequency connecting wires, the replacement cost who surveys the board has also greatly reduced.
Drawings
FIG. 1 is a prior art connection diagram of a production test circuit of a 400G optical module;
fig. 2 is a schematic flow chart of a test method based on a 400G optical module provided in the present invention;
fig. 3 is a schematic flow chart of a test method based on a 400G optical module provided in the present invention;
fig. 4 is a schematic flow chart of a test method based on a 400G optical module provided in the present invention;
fig. 5 is a schematic flow chart of a test method based on a 400G optical module provided in the present invention;
fig. 6 is a schematic flow chart of a test method based on a 400G optical module provided in the present invention;
fig. 7 is a connection diagram of a test circuit based on a 400G optical module provided in the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example one
As shown in fig. 2, a test method based on 400G optical module, wherein: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
step S110, forming a pseudo-random code generation control instruction through a first preset instruction, controlling a standard photoelectric module to work in a pseudo-random code mode under the action of the pseudo-random code generation control instruction, and generating and sending a pseudo-random code by the standard photoelectric module; and controlling the temperature control table to work in a first temperature state, and calibrating the photoelectric module to be tested. The method specifically comprises the following steps:
as shown in fig. 3, in step S1101, in a state where the optoelectronic module to be tested is inserted into the predetermined position, the upper computer reads and records the type, P/N information, and S/N information of the optoelectronic module to be tested; the upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, and sets a pseudo-random code of an SSPRQ mode output by a transmitting end of the standard photoelectric module;
step S1102, setting the temperature control table to work in a first temperature state by the upper computer, keeping the temperature of the shell of the photoelectric module to be tested at 40 ℃,
step S1103, the upper computer performs calibration operation on the photoelectric module to be measured through an I2C instruction, and calibration data at least comprise a transmitting end eye diagram, transmitting optical power monitoring, receiving optical power monitoring, temperature monitoring, voltage monitoring, receiving no optical alarm level and eliminating level.
Step S120, the upper computer sets a temperature control table to work in a second temperature state, a first test control instruction is formed through a second preset instruction, and the photoelectric module to be tested is controlled to be tested under the action of the first test control instruction so as to form a first test result and output a second test result; specifically, the method comprises, as shown in figure 3,
step S1201, the upper computer sets a temperature control table to work in a second temperature state, so that the temperature of the shell of the photoelectric module to be tested is kept at 0 ℃, 3.3V voltage of the photoelectric module to be tested is set to be 3.3V (100% -5%) V,
step S1202, the upper computer tests a to-be-tested photoelectric module, first test data at least comprise an emitting end eye pattern, emitting optical power and emitting optical power monitoring precision, a first test result is formed according to the first test data, and the first test result is output to the detection device through a GPIB interface;
step S1203, configuring a standard photoelectric module into an error code detection mode by the upper computer through an I2C instruction, setting a pseudo-random code of a PRBS31 mode type output by a transmitting end, and controlling a receiving end of the standard photoelectric module to be in a working state;
step S1204, the upper computer tests the photoelectric module to be tested of the DUT, the second test data at least include receiving sensitivity, optical power monitoring precision, temperature monitoring, voltage monitoring, receiving the level of non-optical alarm and eliminating the level, form the second test result according to the said second test data, the said second test result is outputted to the standard photoelectric module through GPIB interface.
Step S130, the upper computer sets a temperature control table to work in a third temperature state, a third test control instruction is formed through a third preset instruction, and the photoelectric module to be tested is controlled to be tested under the action of the third test control instruction so as to form a third test result and output a fourth test result; the method specifically comprises the following steps:
as shown in fig. 5, in step S1301, the upper computer sets the temperature control console to operate in the third temperature state, so as to maintain the temperature of the housing of the optoelectronic module to be tested at 70 ℃, set the voltage of the optoelectronic module to be tested at 3.3V (100% + 5%) V,
step S1302, configuring a standard photoelectric module as an error code detection mode by the upper computer through an I2C instruction, and setting a transmitting end to output a pseudo-random code of an SSPRQ mode type;
step S1303, the upper computer tests the photoelectric module to be tested of the DUT, third test data comprise an eye diagram of a transmitting end, transmitting optical power and transmitting optical power monitoring precision, and a third test result is output to the detection device through a GPIB interface;
step S1304, configuring a standard photoelectric module into an error code detection mode by the upper computer through an I2C instruction, setting a pseudo-random code of a PRBS31 mode type output by a transmitting end, and controlling a receiving end of the standard photoelectric module to be in a working state;
step S1305, the upper computer tests the to-be-tested photovoltaic module to be tested of the DUT, where the fourth test data at least includes reception sensitivity, optical power monitoring accuracy, temperature monitoring, voltage monitoring, reception of a no-light alarm level and a cancellation level, and a fourth test result is formed according to the fourth test data and is output to the standard photovoltaic module through the GPIB interface.
And S140, the upper computer sets the temperature control table to work in the first temperature state, a fourth test control instruction is formed through a fourth preset instruction, and the photoelectric module to be tested is controlled to be tested under the action of the fourth test control instruction so as to form a fifth test result and a sixth test result to be output.
As shown in fig. 6, in step S1401, the upper computer sets the temperature console to operate in the first temperature state, so that the temperature of the outer shell of the optoelectronic module to be tested is maintained at 40 ℃, and the 3.3V voltage of the optoelectronic module to be tested is set to 3.3V.
Step S1402, configuring the standard photoelectric module to be an error code detection mode by the upper computer through an I2C instruction, and setting a transmitting end of the standard photoelectric module to output a pseudo random code of an SSPRQ mode;
step S1403, the upper computer tests the photoelectric module to be tested, the fifth test data at least includes an emitting end eye diagram, an emitting optical power, and an emitting optical power monitoring precision, and the fifth test result is output to the detection device through the GPIB interface;
step S1404, configuring the standard photoelectric module into an error code detection mode by the upper computer through an I2C instruction, setting a pseudo-random code of a PRBS31 mode type output by a transmitting end, and controlling a receiving end of the standard photoelectric module to be in a working state;
step S1405, the upper computer tests the photoelectric module to be tested of the DUT, the sixth test data at least comprises receiving sensitivity, optical power monitoring precision, temperature monitoring, voltage monitoring, receiving lightless alarm level and eliminating level, a sixth test result is formed according to the sixth test data, and the sixth test result is output to the standard photoelectric module through a GPIB interface;
step S150, a detection result is formed according to the first test result, the second test result, the third test result, the fourth test result, the fifth test result, and the sixth test result.
Example two
As shown in fig. 7, a test circuit based on 400G optical module, wherein: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
producing a test board 1; the production test board 1 is a high-speed circuit board, can support the transmission of a 50G high-speed signal retest board, and ensures good signal quality.
A photoelectric module to be tested 2; inserting into a first preset position of the production test board 1; wherein the first predetermined location is disposed at a back of the second predetermined location.
The standard photoelectric module 3 is inserted into a second preset position of the production test board 1 and controls the standard photoelectric module 3 to work in a pseudo-random code generation and error code detection mode; wherein the standard photovoltaic module 3 is formed by a standard 400G optical module.
And the high-speed optical fiber line group 4 is connected between the photoelectric module to be tested 2 and the standard photoelectric module 3.
The photoelectric module 2 to be detected or the standard photoelectric module 3 is a 400G optical module, wherein the photoelectric module 2 to be detected is a 400G optical module which is not detected to pass, and the standard photoelectric module 3 is a 400G optical module which is detected to pass. DSP chips are arranged in the 400G optical modules, and the standard photoelectric module 3 can be formed by setting the DSP chips in the 400G optical modules which pass the detection and verification as pseudo-random code generation and error code monitoring modes. When the standard photoelectric module 3 works in a pseudo-random code and error code monitoring mode, 8 paths of differential 8x50Gbps pseudo-random code signals can be formed, 8 paths of differential 8x50Gbps pseudo-random code signals can be received, and error code analysis processing is carried out on the received pseudo-random code signals.
The test based on the 400G optical module
A circuit, wherein: the photoelectric module to be tested is characterized by further comprising a power supply unit 5, wherein the power supply unit 5 is respectively connected with the photoelectric module to be tested 2 and the standard photoelectric module 3. The power supply unit 5 outputs 3.3V voltage, and the photoelectric module 2 to be tested and the standard photoelectric module 3 realize the function of photoelectric conversion under the supply of 3.3V voltage signals.
As a further preferred embodiment, the test circuit based on the 400G optical module, wherein: the high-speed electrical differential signal group 4 includes 8 pairs of 8 × 50G high-speed transmit signal differential lines and 8 pairs of 8 × 50G high-speed receive signal differential lines.
As a further preferred embodiment, the test circuit based on the 400G optical module, wherein: the standard photoelectric module 3 generates 8 paths of differential test signals and sends the 8 paths of differential test signals to the photoelectric module to be tested 2 through 8 pairs of 8x50G high-speed transmitting signal differential lines, and the photoelectric module to be tested generates 8 paths of differential test signals and sends the 8 pairs of 8x50G high-speed receiving signal differential lines to the standard photoelectric module.
The specific working principle of the test circuit based on the 400G optical module is as follows: controlling the standard photoelectric module 3 to work in a pseudo-random code generation and error code detection mode; when the standard photoelectric module 3 works in the random code generation and error code detection states, the standard photoelectric module 3 forms 8 paths of differential 8x50Gbps pseudo random code signals to the photoelectric module 2 to be detected, the optoelectronic module to be tested 2 receives the 8-path differential 8x50Gbps pseudo random code signal, and the 8 paths of differential 8x50Gbps pseudo random code signals are converted through electro-optic, the optical signal after the conversion of the module to be tested is calibrated and tested through the test instrument, the optical signal returns to the receiving end of the photoelectric module 2 to be tested through the optical jumper, the photoelectric module 2 to be tested can convert the optical signal into an electric signal, the electric-optical conversion is carried out to form 8-path differential 8x50Gbps pseudo random code signals and output the signals to the standard photoelectric module 3, the error code analysis is carried out on the received signals by the standard photoelectric module 3 to form a calibration result to be output, and the performance of the receiving end of the photoelectric module 2 to be tested is determined according to the calibration result.
Can utilize the pseudo-random code (PRBS) transmission and the error code detection function of integrated in the inside DSP chip of 400G optical module, set up 400G optical module to work in pseudo-random code production and error code detection mode in order to form standard photoelectric module 3, replace high-end error code appearance through standard photoelectric module 3, standard photoelectric module 3 and the photoelectric module 2 that awaits measuring all set up on same production testing board 1 simultaneously, adopt 16 to high-speed electric high-speed signal group 4 can connect, need not 32 expensive radio frequency connecting wires, through above-mentioned connected mode, realize the production test to 400G high-end optical module, the error code appearance has both been saved, the replacement cost who surveys the board has also greatly reduced.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (8)
1. A test method based on a 400G optical module is characterized in that: the method comprises the following steps:
forming a pseudo-random code generation control instruction through a first preset instruction, controlling a standard photoelectric module to work in a pseudo-random code mode under the action of the pseudo-random code generation control instruction, and generating and sending a pseudo-random code by the standard photoelectric module; controlling the temperature control table to work in a first temperature state, and performing calibration operation on the photoelectric module to be tested;
the upper computer sets the temperature control table to work in a second temperature state, a first test control instruction is formed through a second preset instruction, and the photoelectric module to be tested is controlled to be tested under the action of the first test control instruction so as to form a first test result and a second test result to be output;
the upper computer sets a temperature control table to work in a third temperature state, a third test control instruction is formed through a third preset instruction, and the photoelectric module to be tested is controlled to be tested under the action of the third test control instruction so as to form a third test result and a fourth test result to be output;
the upper computer sets a temperature control table to work in a first temperature state, a fourth test control instruction is formed through a fourth preset instruction, and the photoelectric module to be tested is controlled to be tested under the action of the fourth test control instruction so as to form a fifth test result and a sixth test result to be output;
and forming a detection result according to the first test result, the second test result, the third test result, the fourth test result, the fifth test result and the sixth test result.
2. The test method based on the 400G optical module according to claim 1, wherein: forming a pseudo-random code generation control instruction through a first preset instruction, controlling a standard photoelectric module to work in a pseudo-random code mode under the action of the pseudo-random code generation control instruction, and generating and sending a pseudo-random code by the standard photoelectric module; controlling the temperature control table to work in a first temperature state, and calibrating the to-be-measured photoelectric module specifically comprises:
reading and recording the type, P/N information and S/N information of the photoelectric module to be detected by the upper computer in the state that the photoelectric module to be detected is inserted into a preset position; the upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, and sets a pseudo-random code of an SSPRQ mode output by a transmitting end of the standard photoelectric module;
the upper computer sets the temperature control table to work in a first temperature state, so that the shell temperature of the photoelectric module to be tested is kept at 40 ℃,
the upper computer carries out calibration operation to the photoelectric module to be measured through the I2C instruction, and the calibration data at least includes transmitting terminal eye diagram, transmitting optical power monitoring, receiving optical power monitoring, temperature monitoring, voltage monitoring, receiving no light alarm level and elimination level.
3. The test method based on the 400G optical module according to claim 1, wherein: the host computer sets up temperature control platform work under the second temperature state, forms first test control instruction through the predetermined instruction of second, in the test is done in order to form first test result, second test result output specifically includes to the optoelectronic module that awaits measuring under the effect of first test control instruction:
the upper computer sets a temperature control table to work in a second temperature state, so that the temperature of the shell of the photoelectric module to be tested is kept at 0 ℃, 3.3V voltage of the photoelectric module to be tested is set to be 3.3V (100-5%) V,
the upper computer tests the photoelectric module to be tested, the first test data at least comprises an emitting end eye pattern, emitting optical power and emitting optical power monitoring precision, a first test result is formed according to the first test data, and the first test result is output to the detection device through a GPIB interface;
the upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, sets a pseudo random code of a PRBS31 mode type output by a transmitting end, and controls a receiving end of the standard photoelectric module to be in a working state;
and the upper computer tests the photoelectric module to be tested of the DUT, the second test data at least comprises receiving sensitivity, optical power monitoring precision, temperature monitoring, voltage monitoring, receiving no optical alarm level and eliminating level, a second test result is formed according to the second test data, and the second test result is output to the standard photoelectric module through a GPIB interface.
4. The test method based on the 400G optical module according to claim 1, wherein: the host computer sets up temperature control platform work under the third temperature state, forms third test control instruction through third predetermined instruction, in the test is done in order to form third test result, fourth test result output specifically includes to the optoelectronic module that awaits measuring under the effect of third test control instruction:
the upper computer sets a temperature control table to work in a third temperature state, so that the temperature of the shell of the photoelectric module to be tested is kept at 70 ℃, 3.3V voltage of the photoelectric module to be tested is set to be 3.3V (100% + 5%) V,
the upper computer configures a standard photoelectric module as an error code detection mode through an I2C instruction, and sets a transmitting end to output a pseudo-random code of an SSPRQ mode type;
the upper computer tests the photoelectric module to be tested of the DUT, third test data comprise an emitting end eye diagram, emitting optical power and emitting optical power monitoring precision, and a third test result is output to the detection device through a GPIB interface;
the upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, sets a pseudo random code of a PRBS31 mode type output by a transmitting end, and controls a receiving end of the standard photoelectric module to be in a working state;
and the upper computer tests the photoelectric module to be tested of the DUT, the fourth test data at least comprises receiving sensitivity, optical power monitoring precision, temperature monitoring, voltage monitoring, receiving no optical alarm level and eliminating level, a fourth test result is formed according to the fourth test data, and the fourth test result is output to the standard photoelectric module through a GPIB interface.
5. The test method based on the 400G optical module according to claim 1, wherein: the host computer sets up temperature control platform work under first temperature state, forms fourth test control instruction through fourth predetermined instruction, in the test is done in order to form fifth test result, sixth test result output specifically includes to the optoelectronic module that awaits measuring under fourth test control instruction's the effect: the upper computer sets the temperature control table to work in a first temperature state, so that the temperature of the shell of the photoelectric module to be tested is kept at 40 ℃, and 3.3V voltage of the photoelectric module to be tested is set to be 3.3V.
The upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, and sets a pseudo-random code of an SSPRQ mode output by a transmitting end of the standard photoelectric module;
the host computer tests the photoelectric module to be tested, fifth test data at least comprise an emitting end eye pattern, emitting optical power and emitting optical power monitoring precision, and a fifth test result is output to the detection device through a GPIB interface;
the upper computer configures a standard photoelectric module into an error code detection mode through an I2C instruction, sets a pseudo random code of a PRBS31 mode type output by a transmitting end, and controls a receiving end of the standard photoelectric module to be in a working state;
and the upper computer tests the photoelectric module to be tested of the DUT, sixth test data at least comprise receiving sensitivity, optical power monitoring precision, temperature monitoring, voltage monitoring, receiving no optical alarm level and eliminating level, and a sixth test result is formed according to the sixth test data and is output to the standard photoelectric module through a GPIB interface.
6. A test circuit based on 400G optical module is characterized in that: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
producing a test board;
a photoelectric module to be tested; inserting the test board into a first preset position of the production test board;
the standard photoelectric module is inserted into a second preset position of the production test board and controls the standard photoelectric module to work in a pseudo-random code generation and error code detection mode; wherein the first predetermined location is disposed at a back of the second predetermined location; wherein the standard photovoltaic module is formed by a standard 400G optical module;
the high-speed electrical differential signal group is connected between the photoelectric module to be tested and the standard photoelectric module; the high-speed electrical differential signal group comprises 8 pairs of 8-by-50G high-speed transmitting signal differential lines and 8 pairs of 8-by-50G high-speed receiving signal differential lines;
and the power supply unit is respectively connected with the photoelectric module to be detected and the standard photoelectric module.
7. The test circuit based on the 400G optical module as claimed in claim 6, wherein: the standard photoelectric module generates 8 paths of differential test signals and sends the differential test signals to the photoelectric module to be tested through 8 pairs of 8-by-50G high-speed emission signal differential lines.
8. The test circuit based on the 400G optical module as claimed in claim 6, wherein: the photoelectric module to be tested generates 8 pairs of differential test signals and sends the differential test signals to the standard photoelectric module through 8 pairs of 8-by-50G high-speed receiving signal differential lines.
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