CN113064196B - Method and system for rapidly discriminating radiation sensitive position of electronic system based on X-rays - Google Patents
Method and system for rapidly discriminating radiation sensitive position of electronic system based on X-rays Download PDFInfo
- Publication number
- CN113064196B CN113064196B CN202110292224.4A CN202110292224A CN113064196B CN 113064196 B CN113064196 B CN 113064196B CN 202110292224 A CN202110292224 A CN 202110292224A CN 113064196 B CN113064196 B CN 113064196B
- Authority
- CN
- China
- Prior art keywords
- electronic system
- dose
- shielding
- window
- component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/02—Dosimeters
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention provides a method and a system for rapidly discriminating a radiation sensitive position of an electronic system based on X-rays, which solve the problem that the radiation sensitive position is difficult to rapidly and accurately position in the process of an electronic system-level total dose effect test. The method and the system adopt a local shielding technology and a device-by-device scanning irradiation mode in the test process, can quickly and accurately obtain the radiation sensitive position of the electronic system, do not need to change the design of the system, avoid the problems of long line bias, off-line test and the like, and have the advantages of simple and easy implementation method, short test period, low cost and simple operation method.
Description
Technical Field
The invention belongs to the field of evaluation of total dose effect of an electronic system, relates to a method and a system for rapidly screening a radiation sensitive position of the electronic system based on X rays, and particularly relates to a method for estimating the radiation resistance of the total dose effect of the electronic system and rapidly screening the radiation sensitive position of the electronic system.
Background
The existing total dose effect test of the electronic whole system is mainly utilized 60 Co gamma rays are developed, and the Co gamma rays have the advantages of strong penetrability, uniform dosage field and the like, but also have the defects of high experimental cost, difficult shielding, long circuit wire leading-out of bias and test circuits and the like. Furthermore, withWith the increase in functionality and complexity of electronic systems, this has led to full system performance 60 During Co gamma total dose test, the radiation sensitive position of the system is difficult to quickly and accurately position, and the prediction of the total dose resistance of the system and the development of radiation resistance reinforcement design work are seriously influenced.
Currently, two main approaches are used for radiation-sensitive position location in system-level total dose experiments: firstly, extracting the output of key components in a system in the system design process, and monitoring the working state of the key components in real time in the irradiation process; and secondly, performing off-line test on the system after irradiation, measuring each component and the key link in the system point by point for multiple times after irradiation, and replacing the key component by trial so as to obtain the weak component and the sensitive position of the system. Obviously, the first method needs to add additional test points or test circuits in the actual system design process, and this way not only increases the design difficulty and complexity of the system, but also affects the normal working state of the system. The second method is time-consuming and labor-consuming, and is easy to damage the system in the process of point-by-point testing and secondary replacement of components, thereby causing additional damage. Therefore, a system-level total dose effect test method is urgently needed, and the problem that the radiation sensitive position is difficult to position in the process of the system total dose effect test is solved.
Disclosure of Invention
In order to improve the efficiency of a system total dose effect test and solve the problem that the radiation sensitive position is difficult to quickly and accurately position in the electronic system level total dose effect test process, the invention provides a method and a system for quickly screening the radiation sensitive position of an electronic system based on X-rays.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
a method for rapidly screening a radiation sensitive position of an electronic system based on X rays comprises the following steps:
step one, setting a relative position distribution diagram of components of an electronic system according to a PCB component layout diagram of the tested electronic system;
step two, processing the shielding body, and opening a window on the shielding body according to the size of components in the electronic system;
fixing the electronic system on a X, Y moving automatic guide rail, and aligning a window of the shielding body to a component needing to be irradiated in the electronic system;
setting the voltage, current and surface distance between the window and the component of the X-ray source, thereby obtaining the required dose rate, and calibrating the component surface dose rate below the window of the shielding body and the dose rate below the shielding position by using a dose calibrator, so that the dose difference between the two is in a set range;
step five, supplying power to the electronic system, and monitoring the output of the electronic system in real time;
step six, starting an X-ray source, and irradiating the 1 st component in the electronic system to a specified total dose point;
step seven, moving an automatic guide rail according to the relative position distribution diagram obtained in the step one, moving the 2 nd component to the position below a shielding window, and irradiating and accumulating total dose to a specified total dose point;
step eight, moving an automatic guide rail according to the relative position distribution diagram obtained in the step one, sequentially moving all components in the electronic system to the position below a window for irradiation, and accumulating the total dose to a specified total dose point;
step nine, repeating the steps six to eight after all components in the electronic system are irradiated, and accumulating the 2 nd and 3 rd … … th total dose points;
step ten, monitoring the output of the electronic system in the irradiation process, if the output abnormality or the system function failure occurs, judging that the component under the window which is receiving the irradiation is a weak component of the system, and recording the total accumulated dose value of the component at the moment;
step eleven, judging the output failure mode of the system, if the whole system fails, terminating the irradiation test, wherein the total dose resistance of the system is determined by the sum of total doses accumulated by the current weak devices; if the system output failure only occurs in part of the system links, skipping over the failure sample, and irradiating the next component to find the second and third sensitive devices in the system until the whole functions of the system are in failure.
In the fourth step, the dose rate of the surface of the component below the shielding window and the dose rate below the shielding position are calibrated by a dose calibrator, and the dose rate difference between the surface of the component below the shielding window and the dose rate below the shielding position is more than 3 orders of magnitude.
Meanwhile, the invention also provides another method for rapidly screening the radiation sensitive position of the electronic system based on X rays, which comprises the following steps:
step one, processing a shielding body, and opening a window on the shielding body according to the obtained size of components in an electronic system;
fixing the electronic system on a X, Y moving automatic guide rail, aligning a shielding body window to a component needing to be irradiated in the electronic system, aligning a ray outlet of an X-ray tube to the shielding body window, and ensuring that the center of the ray outlet, the center of the shielding body window and the center of the irradiated component are on the same straight line;
setting the voltage and current of the X-ray source so as to obtain the required dose rate, and calibrating the surface dose rate of the component below the shielding window and the dose rate below the shielding position by using a dose calibrator so that the dose rate difference of the surface dose rate and the dose rate below the shielding position is within a set range;
step four, supplying power to the electronic system, and monitoring the output of the electronic system in real time;
step five, starting an X-ray source, irradiating until system output or function fails, and recording accumulated total dose at the time of failure to obtain the total dose resistance of the component under the bias state condition in an electronic system;
step six, replacing invalid components in the electronic system or replacing the electronic system, and repeating the step two to the step five to obtain the total dose resistance of all components in the electronic system;
and step seven, acquiring the radiation sensitive position of the electronic system according to the total dose resistance of all the components obtained in the step six.
In addition, the invention also provides a rapid screening system of the radiation sensitive position of the electronic system based on X rays, which comprises an automatic guide rail, a ray tube guide rail, an X ray tube and a shielding body; the automatic guide rail is arranged below the electronic system and is used for realizing the movement of the electronic system in the X, Y direction; the X-ray tube is arranged on the ray tube guide rail and is used for providing irradiated X-rays; the shielding body is arranged between the X-ray tube and the electronic system, a window is arranged on the end face of the shielding body, and the X-rays irradiate onto components of the electronic system through the window.
Further, the X-ray shielding device also comprises a plurality of shielding sheets, wherein the shielding sheets are used for shielding windows which do not pass through X-rays.
Further, the shielding body is a lead shielding body.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention provides a method and a system for rapidly discriminating a radiation sensitive position of an electronic system based on X-rays, which can rapidly and accurately find a weak position of the total dose of the system, give out the total dose resistance of the system and provide powerful data support for the application of the electronic system in a radiation environment and the radiation resistance reinforcement.
2. The system and the method for the local shielding irradiation based on the X-ray system can effectively solve the problems of long line, bias setting and the like in the device-level test process, and can accurately give the total dose level of internal devices when the system is in a normal working state.
3. The method and the system for rapidly discriminating the radiation sensitive position can effectively solve the technical problem in the evaluation of the total dose effect of the system, are simple and effective, greatly reduce the test cost of the total dose effect of the system, and have good application prospects.
Drawings
FIG. 1 is a flow chart of a method for rapidly discriminating radiation sensitive positions of an electronic system based on X-rays;
fig. 2 is a schematic diagram of a system for quickly discriminating radiation sensitive positions of an electronic system based on X-rays.
Reference numerals: 1-automatic guide rail, 2-ray tube guide rail, 3-X ray tube, 4-shielding body, 5-shielding sheet, 6-electronic system, 41-window and 61-component.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
The X-ray source is one of the radiation sources for ground simulating the effect of total dose in radiation environment, and 60 compared with a Co gamma ray source, the Co gamma ray source has the advantages of easy shielding, easy generation and the like. By utilizing the advantages, the invention provides a method and a system for rapidly discriminating the radiation sensitive position of an electronic system based on 10keV-X rays, which solve the problem that the radiation sensitive position of the system is difficult to determine in the ground assessment test process of the electronic system. The method and the system adopt a local shielding technology and a device-by-device scanning irradiation mode in the test process, can quickly and accurately obtain the radiation sensitive position of the electronic system, do not need to change the design of the system, avoid the problems of long line bias, off-line test and the like, and have the advantages of simple and easy implementation method, short test period, low cost and simple operation method.
As shown in fig. 2, the invention provides a rapid screening system for a radiation sensitive position of an electronic system based on X-rays, which comprises an automatic guide rail 1, a ray tube guide rail 2, an X-ray tube 3, a shielding body 4 and a shielding sheet 5; the automatic guide rail 1 is arranged below the electronic system 6 and is used for realizing the movement of the electronic system 6 in the direction of X, Y; an X-ray tube 3 is provided on the tube rail 2 for providing irradiated X-rays; the shielding body 4 is arranged between the X-ray tube 3 and the electronic system 6, the end face of the shielding body is provided with a window 41, the X-rays are irradiated onto the component 61 of the electronic system 6 through the window 41, the plurality of windows 41 on the shielding body 4 can be arranged, and the shielding sheet 5 is used for shielding the window 41 which does not pass through the X-rays.
As shown in fig. 1, the method for rapidly screening the radiation sensitive position of the electronic system based on the X-ray provided by the invention specifically comprises the following steps:
step one, according to the layout diagram of the components of the PCB of the tested electronic system 6, making a relative position distribution diagram of the components of the electronic system;
step two, processing the shielding body 4, and opening a window 41 on the shielding body 4 according to the size of the component 61 in the electronic system 6;
step three, fixing the electronic system 6 on the automatic guide rail 1 which is movable in the X, Y direction, arranging the shielding body 4 between the X-ray source and the electronic system 6, and aligning the window 41 of the shielding body 4 with the components 61 needing to be irradiated in the electronic system 6;
setting the voltage and current of the X-ray source and the distance between the window 41 and the surface of the component 61, thereby obtaining the required dose rate; in order to ensure the shielding effect of the shielding body 4 and determine the set value of the target dosage rate, a dosage calibration instrument (Unidos) is utilized to calibrate the surface dosage rate of the component 61 below the shielding body window 41 and the dosage rate below the shielding position, and meanwhile, the dosage difference between the surface dosage rate and the dosage rate below the shielding position should be ensured to be more than 3 orders of magnitude so as to ensure that the misjudgment on the total dosage resistance of the target component caused by the accumulated excessive total dosage of the shielding component in the test process is avoided;
and fifthly, supplying power to the electronic system 6, and monitoring the output of the electronic system 6 in real time.
Step six, starting an X-ray source, and irradiating the 1 st component 61 in the electronic system 6 to a specified total dose point;
step seven, moving the automatic guide rail 1 according to the relative position distribution diagram obtained in the step one, moving the 2 nd component 61 to the position below the window 41 of the shielding body 4, and irradiating to a specified total dose point;
step eight, moving the automatic guide rail 1 according to the relative position distribution diagram obtained in the step one, sequentially moving all components 61 in the electronic system 6 to the position below the window 41 for irradiation, and accumulating the total dose to a specified total dose point;
step nine, repeating the steps six to eight after all components 61 in the system are irradiated, and accumulating the 2 nd and 3 rd … … th total dose points;
step ten, monitoring the output of the electronic system 6 in the irradiation process, if an output abnormality or system function failure occurs, determining the component 61 under the window 41 which is receiving irradiation as a weak component of the system, and recording the total accumulated dose value of the components at the moment;
step eleven, judging the output failure mode of the system, if the whole system fails, terminating the irradiation test, wherein the total dose resistance of the system is determined by the sum of total doses accumulated by the current weak devices; if the system output failure only occurs in part of the system links, the failure sample can be skipped, and the next device can be irradiated to find the second and third sensitive devices in the system until the whole functions of the system are in functional failure.
Meanwhile, the invention also provides another method for rapidly screening the radiation sensitive position of the electronic system based on X-ray, the method is based on the X-ray system level local shielding irradiation, the system is in a full working state, the target components 61 in the system are irradiated, the other components 61 are shielded by using the designed shielding body 4, the radiation is until the system output or the function fails, the total dose is accumulated at the time of failure is recorded, the total dose resistance of the components 61 under the bias state condition of the system can be obtained, thereby realizing the accurate assessment of the radiation resistance of each component 61 in the electronic system 6, and further obtaining the radiation sensitive position of the system, the method specifically comprises the following steps:
firstly, processing the shielding body 4, and opening a window 41 on the shielding body 4 according to the size of a component 61 to be evaluated in the electronic system 6;
fixing the electronic system 6 on the X, Y moving automatic guide rail 1, aligning the window 41 of the shielding body 4 with the component 61 to be irradiated in the electronic system 6, aligning the ray outlet of the ray tube with the window 41 of the shielding body 4, and ensuring that the center of the ray outlet, the center of the window 41 of the shielding body 4 and the center of the irradiated component 61 are on the same straight line;
setting the voltage and current of the X-ray source so as to obtain the required dose rate, and calibrating the dose rate at the surface of the component 61 below the window 41 of the shielding body 4 and the dose rate of a selected point at the shielding position by using Unidos;
step four, the electronic system 6 supplies power, and the output of the electronic system 6 is monitored in real time;
step five, starting an X-ray source, irradiating until the output of the system or the function fails, and recording the accumulated total dose at the time of failure to obtain the total dose resistance of the component 61 under the bias state condition in the system;
step six, replacing the failed components 61 in the electronic system 6 or replacing the electronic system 6, and repeating the step two to the step five to obtain the total dose resistance of all the components 61 in the electronic system 6;
and step seven, acquiring the radiation sensitive position of the electronic system 6 according to the total dose resistance of all the components 61 obtained in the step six.
The method avoids the problems of long line bias, off-line test and the like, ensures that the bias condition in the irradiation process of each component 61 in the system is a real working condition, and has the advantages of simple and feasible implementation method, short experimental period, low cost and simple operation method.
The process according to the invention is described in detail below by means of specific examples.
Step one, according to the layout diagram of the components 61 of the PCB board of the tested electronic system 6, a relative position distribution diagram of the components 61 of the system is made, and the components 61 of the system needing to be irradiated are numbered, such as 1#, 2#, 3# … … n#, and the other 1# component is used as an origin, and the positions of 2# and 3# … … n# can be reached through the movement in the x and y directions;
step two, processing the shielding body 4, and opening the window 41 for the shielding body 4 according to the sizes of the components 61 in the system, wherein the system comprises components 61 with various sizes, and the shielding body 4 needs to be provided with the window 41 according to the size classification of the components 61, for example: (1) the window 41 with the size of # is suitable for the components 61 with the size of # 1, 2# and 3#, the hole (2) is suitable for the components 61 with the size of # 4 and 5#, when the (1) # Kong Fuzhao is used weakly in radiation, the window 41 with the size of # 2 is shielded by the shielding sheet 5, and similarly, the hole (1) # is shielded when the hole (2) # is used, and the number of the windows 41 is determined by the size type of the components 61 in the system;
step three, fixing the electronic system 6 on the movable automatic guide rail 1 in the x and y directions, aligning the window 41 of the shielding body 4 with the 1# component 61 to be irradiated in the system, aligning the ray outlet of the ray tube with the window 41 of the shielding body 4, and ensuring that the center of the ray outlet, the center of the window 41 of the shielding body 4 and the center of the irradiated component 61 are on the same straight line, as shown in fig. 2;
setting the voltage and current of the X-ray source so as to obtain the required dose rate, and calibrating the dose rate at the surface of the component 61 below the window 41 of the shielding body 4 and the dose rate at a point selected at the shielding position by Unidos, wherein the dose rate difference between the two is more than 3 orders of magnitude;
step five, the electronic system 6 supplies power, and monitors the output of the system in real time;
step six, starting an X-ray source, and irradiating the 1# component 61 to a specified total dose point;
step seven, controlling an automatic moving guide rail to move the 2# component 61 to the position below the window 41 of the shielding body 4, and irradiating and accumulating the total dose to a specified total dose point;
step eight, sequentially moving all numbered components 613#, 4#, 5# … … in the electronic system 6 to the position below the window 41 for irradiation by moving the automatic guide rail 1, and accumulating the total dose to a specified total dose point;
step nine, repeating the steps six to eight after all components 61 in the system are irradiated, and accumulating the 2 nd and 3 rd … … th total dose points of all components 61;
step ten, real-time monitoring is needed to be carried out on the output of the system in the irradiation process, once the output abnormality or the system function failure occurs, the component 61 under the window 41 which is receiving irradiation can be judged to be a weak component of the system, and the total accumulated total dose value of the components at the moment is recorded;
step eleven, judging the failure mode of the system output, if the full system function fails, terminating the irradiation test, wherein the total dose resistance of the system is determined by the sum of the total doses accumulated by the current irradiation component 61, and the component 61 is sensitive to the radiation of the system; if the system output failure only occurs in the non-critical link of the system, and the main functions of the system still remain normal, the failure sample can be skipped to irradiate the next component 61 to find the 2 nd and 3 rd sensitive components 61 in the system, and irradiation is continued until the whole functions of the system are in functional failure.
Claims (6)
1. The method for rapidly screening the radiation sensitive position of the electronic system based on the X-rays is characterized by comprising the following steps of:
step one, setting a relative position distribution diagram of components of an electronic system according to a PCB component layout diagram of the tested electronic system;
step two, processing the shielding body, and opening a window on the shielding body according to the size of components in the electronic system;
fixing the electronic system on a X, Y moving automatic guide rail, and aligning a window of the shielding body to a component needing to be irradiated in the electronic system;
setting the voltage, current and surface distance between the window and the component of the X-ray source, thereby obtaining the required dose rate, and calibrating the component surface dose rate below the window of the shielding body and the dose rate below the shielding position by using a dose calibrator, so that the dose difference of the two is within a set range;
step five, supplying power to the electronic system, and monitoring the output of the electronic system in real time;
step six, starting an X-ray source, and irradiating the 1 st component in the electronic system to a specified total dose point;
step seven, moving an automatic guide rail according to the relative position distribution diagram obtained in the step one, moving the 2 nd component to the position below a shielding window, and irradiating and accumulating total dose to a specified total dose point;
step eight, moving an automatic guide rail according to the relative position distribution diagram obtained in the step one, sequentially moving all components in the electronic system to the position below a window for irradiation, and accumulating the total dose to a specified total dose point;
step nine, repeating the steps six to eight after all components in the electronic system are irradiated, and accumulating the 2 nd and 3 rd … … th total dose points;
step ten, monitoring the output of the electronic system in the irradiation process, if the output abnormality or the system function failure occurs, judging that the component under the window which is receiving the irradiation is a weak component of the system, and recording the total accumulated dose value of the component at the moment;
step eleven, judging the output failure mode of the system, if the whole system fails, terminating the irradiation test, wherein the total dose resistance of the system is determined by the sum of total doses accumulated by the current weak devices; if the system output failure only occurs in part of the system links, skipping over the failure sample, and irradiating the next component to find the second and third sensitive devices in the system until the whole functions of the system are in failure.
2. The method for quickly identifying radiation sensitive locations of an X-ray based electronic system of claim 1, wherein: and step four, calibrating the surface dose rate of the components below the shielding window and the dose rate below the shielding position by using a dose calibrator, wherein the dose difference between the surface dose rate and the dose rate is more than 3 orders of magnitude.
3. The method for rapidly screening the radiation sensitive position of the electronic system based on the X-rays is characterized by comprising the following steps of:
step one, processing a shielding body, and opening a window on the shielding body according to the size of components in an electronic system;
fixing the electronic system on a X, Y moving automatic guide rail, aligning a shielding body window to a component needing to be irradiated in the electronic system, aligning a ray outlet of an X-ray tube to the shielding body window, and ensuring that the center of the ray outlet, the center of the shielding body window and the center of the irradiated component are on the same straight line;
setting the voltage and current of the X-ray source so as to obtain the required dose rate, and calibrating the surface dose rate of the component below the shielding window and the dose rate below the shielding position by using a dose calibrator so that the dose rate difference of the surface dose rate and the dose rate below the shielding position is within a set range;
step four, supplying power to the electronic system, and monitoring the output of the electronic system in real time;
step five, starting an X-ray source, irradiating until system output or function fails, and recording accumulated total dose at the time of failure to obtain the total dose resistance of the component under the bias state condition in an electronic system;
step six, replacing invalid components in the electronic system or replacing the electronic system, and repeating the step two to the step five to obtain the total dose resistance of all components in the electronic system;
and step seven, acquiring the radiation sensitive position of the electronic system according to the total dose resistance of all the components obtained in the step six.
4. The method for quickly identifying radiation-sensitive locations in an X-ray based electronic system of claim 3, wherein: and fifthly, calibrating the surface dose rate of the component below the shielding window and the dose rate below the shielding position by using a dose calibration instrument, wherein the dose difference between the surface dose rate and the dose rate is more than 3 orders of magnitude.
5. An electronic system radiation sensitive position fast screening system based on X rays is characterized in that: comprises an automatic guide rail (1), a ray tube guide rail (2), an X-ray tube (3), a shielding body (4) and a shielding sheet (5); the automatic guide rail (1) is arranged below the electronic system (6) and is used for realizing the movement of the electronic system (6) in the X, Y direction; the X-ray tube (3) is arranged on the tube guide rail (2) and is used for providing irradiated X-rays; the shielding body (4) is arranged between the X-ray tube (3) and the electronic system (6), a plurality of windows (41) are arranged on the end face of the shielding body, and X-rays irradiate onto components (61) of the electronic system (6) through the windows (41); the shielding sheet (5) is used for shielding a window (41) which does not pass X rays.
6. The X-ray based electronic system radiation sensitive location fast screening system of claim 5, wherein: the shielding body (4) is a lead shielding body.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110292224.4A CN113064196B (en) | 2021-03-18 | 2021-03-18 | Method and system for rapidly discriminating radiation sensitive position of electronic system based on X-rays |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110292224.4A CN113064196B (en) | 2021-03-18 | 2021-03-18 | Method and system for rapidly discriminating radiation sensitive position of electronic system based on X-rays |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113064196A CN113064196A (en) | 2021-07-02 |
| CN113064196B true CN113064196B (en) | 2023-06-27 |
Family
ID=76562060
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110292224.4A Active CN113064196B (en) | 2021-03-18 | 2021-03-18 | Method and system for rapidly discriminating radiation sensitive position of electronic system based on X-rays |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113064196B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114518498B (en) * | 2021-12-28 | 2024-06-07 | 西北核技术研究所 | Space electronic system total dose effect test method based on end point alignment irradiation |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102081164A (en) * | 2009-11-26 | 2011-06-01 | 横河电机株式会社 | X-ray measurement apparatus |
| WO2013187973A1 (en) * | 2012-03-15 | 2013-12-19 | The Regents Of The University Of California | Devices and methods for determining sensitivity to radiation |
| CN110133401A (en) * | 2019-05-13 | 2019-08-16 | 成都凯天电子股份有限公司 | The method for checking electronic product electromagnetic radiation sensitivity failure |
| CN110531400A (en) * | 2019-09-02 | 2019-12-03 | 北京卫星环境工程研究所 | The in-orbit radiation risk detection device of spacecraft |
| CN110554421A (en) * | 2019-08-14 | 2019-12-10 | 上海卫星工程研究所 | method for identifying weak point of total dose damage of on-satellite sensitive component |
-
2021
- 2021-03-18 CN CN202110292224.4A patent/CN113064196B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102081164A (en) * | 2009-11-26 | 2011-06-01 | 横河电机株式会社 | X-ray measurement apparatus |
| WO2013187973A1 (en) * | 2012-03-15 | 2013-12-19 | The Regents Of The University Of California | Devices and methods for determining sensitivity to radiation |
| CN110133401A (en) * | 2019-05-13 | 2019-08-16 | 成都凯天电子股份有限公司 | The method for checking electronic product electromagnetic radiation sensitivity failure |
| CN110554421A (en) * | 2019-08-14 | 2019-12-10 | 上海卫星工程研究所 | method for identifying weak point of total dose damage of on-satellite sensitive component |
| CN110531400A (en) * | 2019-09-02 | 2019-12-03 | 北京卫星环境工程研究所 | The in-orbit radiation risk detection device of spacecraft |
Non-Patent Citations (2)
| Title |
|---|
| 薛院院等.星用CMOS图像传感器在轨质子辐照损伤蒙特卡罗模拟研究.《2016第八届全国计算物理会议报告文集》.2016,全文. * |
| 郭红霞等.电路级模拟技术在SRAM型FPGA总剂量效应敏感性预测中的应用.《现代应用物理》.2018,全文. * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113064196A (en) | 2021-07-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7441168B2 (en) | Fault detecting method and layout method for semiconductor integrated circuit | |
| US20110012613A1 (en) | Failure Detection Method and Failure Detection Apparatus | |
| CN108630330B (en) | Pressurized water reactor nuclear power station instrument system detector test processing method, device and system | |
| CN113064196B (en) | Method and system for rapidly discriminating radiation sensitive position of electronic system based on X-rays | |
| DE112016002277T5 (en) | VOLTAGE CONTRAST BASED FAULT AND DEFECT INTERFERENCE IN LOGIC CHIPS | |
| CN102879730A (en) | Single event upset characteristic testing method for partially triple modular redundancy reinforced SRAM (static random access memory) type FPGA (field programmable gate array) | |
| US20140203836A1 (en) | Method of characterizing the sensitivity of an electronic component subjected to irradiation conditions | |
| KR102418634B1 (en) | A semiconductor device inspection method, a semiconductor device radiation test system, a test beam evaluation method, and a test beam evaluation system using reference semiconductor device | |
| CN108535578B (en) | Method for testing ionization radiation of component | |
| CN111521883A (en) | Method and system for obtaining electric field measurement value of high-voltage direct-current transmission line | |
| CN110632491B (en) | System and method for measuring volt-ampere characteristic curve of semiconductor laser after irradiation | |
| KR102574579B1 (en) | Beam characteristic evaluation device using standard sample and beam characteristic evaluation method using the same | |
| CN108931808A (en) | A kind of follow-on ion beam vertical angle measurement method | |
| O'Bryan et al. | Compendium of current single event effects for candidate spacecraft electronics for NASA | |
| CN102109605B (en) | Method for measuring energy of accelerator | |
| CN111929559B (en) | Failure rate evaluation method and device for power device caused by atmospheric neutrons | |
| Aloisio et al. | The trigger chambers of the ATLAS muon spectrometer: production and tests | |
| Khani et al. | Radiation hardness of Si-and SiC-power-MOSFETs in particle accelerator environments | |
| CN114518498B (en) | Space electronic system total dose effect test method based on end point alignment irradiation | |
| KR100469320B1 (en) | Control method of electron beam irradiation to improve characteristics of the power semiconductors | |
| RU2082178C1 (en) | Method for selecting plates with radiation-resistant mos integrated circuits | |
| Kulkarni et al. | Reliability analysis of a modern power supply under nuclear radiation effects | |
| CN114068694B (en) | Method and system for testing charge collection resistance of germanium-silicon heterojunction bipolar transistor | |
| Seimova et al. | Software-hardware complex for assessing the effect of an electrostatic discharge on electronic devices | |
| KR102418633B1 (en) | A semiconductor device radiation test method, and a semiconductor device radiation test system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |