CN113030028A - Method for detecting two-dimensional space phase information by using SPR phase shift interference - Google Patents
Method for detecting two-dimensional space phase information by using SPR phase shift interference Download PDFInfo
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- 230000010363 phase shift Effects 0.000 title claims abstract description 53
- 238000000034 method Methods 0.000 title claims abstract description 31
- 238000001514 detection method Methods 0.000 claims abstract description 17
- 239000004973 liquid crystal related substance Substances 0.000 claims abstract description 16
- CPBQJMYROZQQJC-UHFFFAOYSA-N helium neon Chemical compound [He].[Ne] CPBQJMYROZQQJC-UHFFFAOYSA-N 0.000 claims abstract description 6
- 229910052782 aluminium Inorganic materials 0.000 claims description 11
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 11
- 238000005305 interferometry Methods 0.000 claims description 10
- 238000005070 sampling Methods 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 abstract description 6
- 238000002198 surface plasmon resonance spectroscopy Methods 0.000 description 19
- 230000035945 sensitivity Effects 0.000 description 5
- 238000005259 measurement Methods 0.000 description 3
- 238000000572 ellipsometry Methods 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
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- 239000002105 nanoparticle Substances 0.000 description 1
- 238000011275 oncology therapy Methods 0.000 description 1
- 229940125730 polarisation modulator Drugs 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000004416 surface enhanced Raman spectroscopy Methods 0.000 description 1
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- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
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- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
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Abstract
The invention discloses a method for detecting two-dimensional space phase information by using SPR phase shift interference, wherein a helium-neon laser emits incident laser, the incident laser reaches a first polarizer, the first polarizer generates p-polarized light and s-polarized light, then the p-polarized light and the s-polarized light enter a liquid crystal variable retarder, the liquid crystal variable retarder adjusts the p-polarized light to a fast axis, the s-polarized light is adjusted to a slow axis, when the p-polarized light excites surface plasmon polariton, phase shift related to angle and thickness is introduced, the s-polarized light does not excite the surface plasmon polariton, and phase difference is generated between the p-polarized light and the surface plasmon polariton, so that a space phase shift pattern is generated; the invention detects two-dimensional space phase information through a single optical path, has high efficiency, can be used for biological detection and has wide application range.
Description
Technical Field
The invention relates to a method for detecting two-dimensional space phase information by using SPR phase shift interference, belonging to the technical field of detection.
Background
The Surface Plasmon Resonance (SPR) sensing technology has the advantages of no mark, real-time monitoring, less sample consumption, high sensitivity and high-throughput detection, and is widely applied to the fields of environmental monitoring, food safety, genomics, proteomics and the like. Surface plasmons are electromagnetic surface waves that are confined to the interface of two materials (metal and dielectric) with opposite signs of dielectric constant. The special properties of surface plasmons, such as strong local electric fields, severe spatial changes of single nanoscale particles, or high sensitivity to environmental changes, are widely applied to optical devices such as on-chip spectrometers, plasmonic rectangular tubes, high-efficiency light emitting diodes and photovoltaics, surface-enhanced raman spectroscopy, cancer therapy, and label-free sensors.
In general, current commercially available SPR sensors are based on detecting the reflectance dip in the angular or wavelength domain, similar to the original device of Kretschmann. However, it has been found that the phase change of the reflected light relative to the incident light may be of greater magnitude than the local refractive index change, which establishes a strong basis for the use of sensor technology. By measuring the phase shift near resonance, rather than the reflection amplitude, additional two to three orders of magnitude sensitivity can be obtained.
The sensitivity is improved because the sharp change in phase amplitude is closer to the resonance angle than the corresponding change in reflectivity. More importantly, SPR sensors based on phase detection are inherently more suitable for SPR imaging and are capable of parallel detection of thousands of channels.
The phase detection schemes mainly include the following methods, mainly including an optical heterodyne method, an ellipsometry method and an interferometry method.
Optical heterodyne detection, one of the earliest phase measurement techniques employed in SPR sensors, employs an SPR heterodyne phase detection system using An Optical Modulator (AOM) and employs a phase-locking technique to equalize the amplitudes of a reference beam and a signal beam by amplitude modulation and modulation to extract a differential phase.
Ellipsometry is based on the measurement of p-and s-polarized light of reflected light, and phase differences can be extracted from the resulting series of interferograms using various phase retarders and polarization modulators (including noise filtering and signal processing), and SPR phase imaging with high sensitivity can also be achieved.
Kabashin and Nikitin pioneer the discovery of SPR phase measurement interferometry based on Mach-Zehnder interferometer structures. The interference method mainly extracts phase information of a two-dimensional space by forming an interference light path by a sample light path and a reference light path together.
Disclosure of Invention
The invention aims to provide a method for detecting two-dimensional space phase information by using SPR phase shift interference. The invention detects two-dimensional space phase information through a single optical path, has high efficiency, can be used for biological detection and has wide application range.
In order to solve the technical problems, the technical scheme provided by the invention is as follows: a method for detecting two-dimensional space phase information by utilizing SPR phase shift interference is characterized in that a helium-neon laser emits incident laser, the incident laser reaches a first polarizer, the first polarizer generates p-polarized light and s-polarized light, then the p-polarized light and the s-polarized light enter a liquid crystal variable retarder, the liquid crystal variable retarder adjusts the p-polarized light to a fast axis and adjusts the s-polarized light to a slow axis, when the p-polarized light excites surface plasmon polariton, phase shift related to angle and thickness is introduced, the s-polarized light does not excite the surface plasmon polariton, and phase difference is generated between the p-polarized light and the surface plasmon polariton, so that a space phase shift pattern is generated; the spatial phase shift pattern is expanded and collimated by the beam expander and then reaches a micromirror array of the digital microscope matched with the spatial phase shift pattern, the phase shift pattern passing through the micromirror array is refracted by the prism and then reaches a second polarizer, the second polarizer enables p-polarized light or s-polarized light to select a corresponding sampling or reference interference pattern, the p-polarized light or s-polarized light finally enters the CCD, and the CCD captures the interference pattern associated with the phase shift and displays the interference pattern as a digital image; and obtaining the domain space frequency in the horizontal direction and the vertical direction from the interference pattern by using an algorithm based on two-dimensional Fourier transform and domain space frequency determination, further obtaining phase shift, and finally obtaining two-dimensional space phase information through the phase shift.
In the method for detecting two-dimensional spatial phase information by using SPR phase shift interference, the fast axis of a controller in the liquid crystal variable retarder forms 45 degrees with the horizontal direction, and p-polarized light and s-polarized light which pass through the controller are rapidly switched.
In the method for detecting two-dimensional spatial phase information by using SPR phase shift interferometry, the controller of the liquid crystal variable retarder is modulated to be a fixed value or a sine function with a period T of 100ms and a delay range of + -%/4.
In the aforementioned method for detecting two-dimensional spatial phase information by using SPR phase shift interference, the wavelength of the light source of the he-ne laser is 632.8 nm.
In the foregoing method for detecting two-dimensional spatial phase information by using SPR phase shift interferometry, the micromirror array includes a base, on which 608 × 684 square aluminum mirrors arranged obliquely at 45 ° are arranged, and the bottom length is 7.64 μm; the square aluminum mirror is hinged with the base.
In the method for detecting two-dimensional spatial phase information by using SPR phase shift interferometry, an included angle between the square aluminum mirror and the base in a rotation range is-12 ° to +12 °.
Compared with the prior art, the helium-neon laser emits incident laser, the incident laser reaches the first polarizer, the first polarizer generates p-polarized light and s-polarized light, then the p-polarized light and the s-polarized light enter the liquid crystal variable retarder, the liquid crystal variable retarder adjusts the p-polarized light to a fast axis and adjusts the s-polarized light to a slow axis, when the p-polarized light excites surface plasmon polariton, phase shift related to angle and thickness is introduced, the s-polarized light does not excite surface plasmon polariton, phase difference is generated between the p-polarized light and the surface plasmon polariton, and therefore a space phase shift pattern is generated; the spatial phase shift pattern is expanded and collimated by the beam expander and then reaches a micromirror array of the digital microscope matched with the spatial phase shift pattern, the phase shift pattern passing through the micromirror array is refracted by the prism and then reaches a second polarizer, the second polarizer enables p-polarized light or s-polarized light to select a corresponding sampling or reference interference pattern, the p-polarized light or s-polarized light finally enters the CCD, and the CCD captures the interference pattern associated with the phase shift and displays the interference pattern as a digital image; obtaining domain space frequency in the horizontal direction and the vertical direction from the interference pattern by using an algorithm based on two-dimensional Fourier transform and domain space frequency determination, further obtaining phase shift, and finally obtaining two-dimensional space phase information through the phase shift; the invention only uses a single light path for detection, compared with the method for detecting two-dimensional space phase information by synthesizing an interference light path by two light paths of a common sample light path and a reference light path, the method has the advantages of simple and convenient operation and high efficiency, does not need to mark for detection, can be used for a non-marking biological detection device, and has wide application range.
Drawings
FIG. 1 is a schematic flow chart of interference pattern acquisition of the present invention;
FIG. 2 is a schematic diagram of a micromirror array according to the present invention;
FIG. 3 is an interference pattern for p-polarized light;
FIG. 4 is an interference pattern of s-polarized light.
Reference numerals
1. A helium-neon laser; 2. a first polarizer; 3. a liquid crystal variable retarder; 4. fast axis; 5. a slow axis; 6. a beam expander; 7. a micromirror array; 8. a prism; 9. a CCD; 10. a base; 11. a square aluminum mirror; 12. a second polarizer.
Detailed Description
The invention is further illustrated by the following figures and examples, which are not to be construed as limiting the invention.
Example (b): a method for detecting two-dimensional spatial phase information by SPR phase shift interference, as shown in FIG. 1, a He-Ne laser 1 with a wavelength of 632.8nm emits incident laser light, the incident laser light reaches a first polarizer 2, the first polarizer generates p-polarized light and s-polarized light, such as p-polarized light, s-polarized light or p-polarized light and s-polarized light with balanced amplitude (1:1) configured relative to Kretschmann, and then the p-polarized light and the s-polarized light reach a liquid crystal variable retarder 3, which is Meadowlark
The Swift liquid crystal variable retarder is internally provided with a controller for modulation, and the controller is
3100, the modulation can be set to a fixed value, or can be set to a sinusoidal function with a period T of 100ms and a retardation range of ±%/4, the fast axis 4 of the controller being 45 ° to the horizontal, so that the passing polarized light is rapidly switched between p-polarized light and s-polarized light, or creating circularly polarized light containing two polarization components, which, when p-polarized light falls on the fast axis and s-polarized light falls on the slow axis 5 due to the 45 ° direction of the liquid crystal variable retarder relative, introduce a phase shift related to angle and thickness, while s-polarized light does not excite surface plasmons, and generate a phase difference, thereby generating a spatial phase shift pattern; the spatial phase shift pattern is expanded and collimated by a beam expander 6 and reaches a micromirror array 7 of a digital microscope matched with the spatial phase shift pattern, the phase shift pattern passing through the micromirror array is refracted by a prism 8 and reaches a second polarizer 12, the second polarizer distinguishes p-polarized light or s-polarized light to select a corresponding sampling or reference interference pattern, as shown in fig. 3 and 4, the p-polarized light or s-polarized light finally enters a CCD9, and different interference patterns associated with phase shift are captured and displayed as digital images; obtaining the domain spatial frequency in the horizontal and vertical directions from the interference pattern by using an algorithm based on two-dimensional Fourier transform and determining the domain spatial frequency, further obtaining a phase shift, and finally obtaining two-dimensional spatial phase information by phase shift, and extracting the phase information along the whole interface mapping of the metal and the medium by using the function of limiting and processing the spatial position of incident parallel light, and by using addressable MMA, for simple point measurement and calibration and verification of MMA results, a pinhole (0.10 μm) can be used to replace an MMA device; as shown in FIG. 2, the micromirror array is Texas instruments
3000, comprising a base 10, on which 608 × 684 square aluminum mirrors 11 are arranged, the bottom length of which is 7.64 μm, but the angle is 45 °, the square aluminum mirrors are hinged with the base and can be switched between two discrete angular positions of-12 ° and +12 °. When the square aluminum mirror is in the inactive state, the angular position is measured relative to the 0 DEG plane reference, and is parallelIn the plane of the array, which is tilted perpendicular to the hinge axis, the on position is directed to the left side of the package, and the switching time is typically 16 mus.
Claims (6)
1. A method for detecting two-dimensional space phase information by using SPR phase shift interference is characterized by comprising the following steps: the helium-neon laser emits incident laser, the incident laser reaches a first polarizer, the first polarizer generates p-polarized light and s-polarized light, then the p-polarized light and the s-polarized light enter a liquid crystal variable retarder, the liquid crystal variable retarder adjusts the p-polarized light to a fast axis and adjusts the s-polarized light to a slow axis, when the p-polarized light excites surface plasmon polariton, phase shift related to angle and thickness is introduced, the s-polarized light does not excite surface plasmon polariton, and phase difference is generated between the p-polarized light and the slow axis, so that a spatial phase shift pattern is generated; the spatial phase shift pattern is expanded and collimated by the beam expander and then reaches a micromirror array of the digital microscope matched with the spatial phase shift pattern, the phase shift pattern passing through the micromirror array is refracted by the prism and then reaches a second polarizer, the second polarizer distinguishes p-polarized light or s-polarized light to select a corresponding sampling or reference interference pattern, the p-polarized light or s-polarized light finally enters the CCD, and the CCD captures the interference pattern associated with the phase shift and displays the interference pattern as a digital image; and obtaining the domain space frequency in the horizontal direction and the vertical direction from the interference pattern by using an algorithm based on two-dimensional Fourier transform and domain space frequency determination, further obtaining phase shift, and finally obtaining two-dimensional space phase information through the phase shift.
2. The method of claim 1 for two-dimensional spatial phase information detection using SPR phase shift interferometry, wherein said method comprises: the fast axis of the controller inside the liquid crystal variable retarder is 45 degrees to the horizontal direction, and the controller is used for rapidly switching p-polarized light and s-polarized light.
3. The method of claim 1 for two-dimensional spatial phase information detection using SPR phase shift interferometry, wherein said method comprises: the controller inside the liquid crystal variable retarder modulates a sine function with the period T of 100ms and the delay range of +/-4%.
4. The method of claim 1 for two-dimensional spatial phase information detection using SPR phase shift interferometry, wherein said method comprises: the wavelength of the light source of the helium-neon laser is 632.8 nm.
5. The method of claim 1 for two-dimensional spatial phase information detection using SPR phase shift interferometry, wherein said method comprises: the micro mirror array comprises a base, wherein 608 multiplied by 684 square aluminum mirrors which are obliquely arranged at 45 degrees are arranged on the base, and the length of the bottom of the square aluminum mirrors is 7.64 mu m; the square aluminum mirror is hinged with the base.
6. The method of claim 5 for two-dimensional spatial phase information detection using SPR phase shift interferometry, wherein said method comprises: the included angle between the square aluminum mirror and the base in the rotation range is-12 degrees to +12 degrees.
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| US20060119859A1 (en) * | 2004-12-02 | 2006-06-08 | Su Yuan D | Surface plasmon resonance microscope using common-path phase-shift interferometry |
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| CN101915750A (en) * | 2010-07-07 | 2010-12-15 | 清华大学 | Biomolecular interaction detection method and system based on SPR interference imaging |
| US20130329230A1 (en) * | 2012-06-08 | 2013-12-12 | City University Of Hong Kong | Optical sensing devices and methods for detecting samples using the same |
| CN107219191A (en) * | 2017-04-14 | 2017-09-29 | 复旦大学 | A kind of oblique incident ray difference in reflection device based on Fourier transformation |
| CN110927122A (en) * | 2019-12-05 | 2020-03-27 | 深圳大学 | A phase-type SPR detection device and method based on interference spectroscopy |
| CN112332925A (en) * | 2020-09-23 | 2021-02-05 | 长春理工大学 | A non-mechanical scanning space laser communication receiving system |
| US20210098973A1 (en) * | 2018-11-06 | 2021-04-01 | Zhejiang University | Structured beam generation device and method based on beam shaping |
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2021
- 2021-04-20 CN CN202110421461.6A patent/CN113030028A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060119859A1 (en) * | 2004-12-02 | 2006-06-08 | Su Yuan D | Surface plasmon resonance microscope using common-path phase-shift interferometry |
| CN101398378A (en) * | 2008-01-28 | 2009-04-01 | 国家纳米科学中心 | Phase measurement method of surface plasma resonance and measuring system thereof |
| CN101915750A (en) * | 2010-07-07 | 2010-12-15 | 清华大学 | Biomolecular interaction detection method and system based on SPR interference imaging |
| US20130329230A1 (en) * | 2012-06-08 | 2013-12-12 | City University Of Hong Kong | Optical sensing devices and methods for detecting samples using the same |
| CN107219191A (en) * | 2017-04-14 | 2017-09-29 | 复旦大学 | A kind of oblique incident ray difference in reflection device based on Fourier transformation |
| US20210098973A1 (en) * | 2018-11-06 | 2021-04-01 | Zhejiang University | Structured beam generation device and method based on beam shaping |
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