CN112985488B - Temperature stress accelerated life test system and method for sensor - Google Patents
Temperature stress accelerated life test system and method for sensor Download PDFInfo
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Abstract
The invention belongs to the technical field of test devices, and discloses a temperature stress accelerated life test system and method for a sensor, wherein the temperature stress accelerated life test system for the sensor comprises: the device comprises a heating module, a refrigeration module, a central control module, a debugging module, a temperature monitoring module, a humidity monitoring module, a driving module, a stress testing module, a corrosion testing module, a data analysis module, a data storage module and an updating display module. The temperature stress accelerated life test system for the sensor is debugged before test, can realize control on the test and realize accurate promotion of the test. Meanwhile, the consistency of failure mechanisms of the constant-temperature stress accelerated life test and the temperature high accelerated life test is comprehensively considered, so that the obtained life age data is more in line with the actual condition. The temperature stress failure-free accelerated life test method provided by the invention can effectively compress the life time, improve the test efficiency and reduce the test cost.
Description
Technical Field
The invention belongs to the technical field of test devices, and particularly relates to a temperature stress accelerated life test system and method for a sensor.
Background
At present, a sensor technology is widely applied to various advanced devices and systems as one of three main pillars of a modern information technology, and the reliability of the sensor is analyzed, so that the reliability of the devices and systems is improved, and the long-term stable operation of the devices and systems is ensured. The conventional life test is to test the product under specified use and maintenance conditions, and the test result is analyzed to obtain the reliability level of the product. But with the rapid development of the current production and scientific technology, the service life of the sensor is longer. If the reliability level of the sensor is evaluated by a method of testing the service life of the sensor under normal test conditions, a long time and a large amount of manpower and material resources are required.
In order to shorten the test time, reduce the test cost and improve the test efficiency, an accelerated life test method is often adopted. The accelerated life test is a test technology under a normal stress level by searching a mapping relation-an accelerated model between the product life and the stress and utilizing the life characteristics under a high (accelerated) stress level to extrapolate or evaluate on the basis of assuming that the failure mechanism of a product is not changed. The accelerated life test technology breaks through the technical idea of the traditional reliability test, introduces an excited test mechanism into the reliability test, and can quickly evaluate the service life and reliability level of a high-reliability long-life product within time. Three stress applying modes for accelerated life test are provided: constant stress, step stress, and progressive stress, wherein constant stress accelerated life test is a life test in which all samples are divided into several groups, each group of samples being performed at a certain constant accelerated stress level. In the accelerated life test, a timing truncation test scheme is widely adopted. In the timing truncation test, the product with high reliability is likely to have no fault data even if the test is carried out for a long time, and the data which is obtained in the timing truncation test and has no product failure in the specified test time is called non-failure data. Under the condition of no failure data, the reliability of the product is statistically analyzed, and the traditional timing truncation test method based on the failure data can not be used any more.
At present, the research on the temperature stress failure-free accelerated life test of the sensor in the timing tail-cutting test is just started, and a temperature stress failure-free accelerated life test method of the sensor suitable for engineering application is not available.
Through the above analysis, the problems and defects of the prior art are as follows: at present, the research on the temperature stress failure-free accelerated life test of the sensor in the timing tail-cutting test is just started, and a temperature stress failure-free accelerated life test method of the sensor suitable for engineering application is not available.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a temperature stress accelerated life test system and method for a sensor.
The invention is realized in such a way that the temperature stress accelerated life test method for the sensor comprises the following steps:
the method comprises the following steps that firstly, a heater is used for heating through a heating module, and the temperature of the space environment of the temperature stress accelerated life test is adjusted; refrigerating by using a refrigerating machine through a refrigerating module, and adjusting the temperature of the space environment of the temperature stress accelerated life test;
step two, the central control module utilizes a central processing unit to coordinate and control the normal operation of each module of the temperature stress accelerated life test system for the sensor; randomly extracting N sensors as test samples through a debugging module;
detecting whether the components for carrying out the temperature stress accelerated life test are complete or not by utilizing a debugging program; starting each component to perform test operation of a temperature stress accelerated life test; carrying out a temperature high accelerated life test on the extracted N sensors to realize the debugging of the temperature stress accelerated life test;
step four, for each monitoring point, calculating a first temperature threshold of the monitoring point of the space environment of the temperature stress accelerated life test in the current first period through a temperature monitoring module; judging whether to alarm or not by using a temperature monitor according to a comparison result of a first temperature threshold on a current first period and the temperature of the monitoring point acquired currently;
step five, on each subsequent first period, the steps of calculating a first temperature threshold and judging whether to alarm or not according to the first temperature threshold and the acquired temperature are repeated; monitoring the humidity of the space environment of the humidity stress accelerated life test by using a humidity monitor through a humidity monitoring module;
driving the humidity stress accelerated life test by using a motor through a driving module; carrying out stress test on the humidity stress accelerated life test by using a stress test program through a stress test module; performing corrosion test on the humidity stress accelerated life test by using a corrosion test module through the corrosion test module;
recording test data through a data analysis module, acquiring associated software of at least one data recording object included in the terminal by using a data analysis program, and polling a triggering summary entry process of the associated software; scanning a task queue after receiving the trigger information, and sequentially executing summary tasks in the task queue according to the priority levels of a plurality of summary tasks; acquiring information generated by each summary task of the associated software, and summarizing the data object information;
step eight, storing the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the data analysis result by using a memory through a data storage module;
and step nine, updating and displaying the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the real-time data of the data analysis result by using the display through the updating and displaying module.
Further, in the third step, N is a natural number, and the temperature monitor is disposed at a monitoring point of the spatial environment of the temperature stress accelerated life test.
Further, in the third step, the step of performing a temperature high accelerated life test on the N extracted sensors to realize the debugging of the temperature stress accelerated life test includes:
(1) the N sensors are all placed at an accelerated temperature stress level S in a stepping stress mode k Carrying out a stepping stress accelerated life test;
(2) increasing the accelerated temperature stress level to S after a time of delta t k2 The sample which is not failed is set at S k2 Continuing to perform a life test; continuing the process until the damage limit is generated, and stopping the test;
(3) the stress of failure temperature generated in the high-temperature accelerated life test is recorded as S m The corresponding mean duration of the test is denoted t m Said t is m I.e. the lifetime under ultimate stress.
Further, in step four, the first period is equally divided into a plurality of stages.
Further, in step four, the calculating, by the temperature monitoring module, a first temperature threshold of a monitoring point of the spatial environment of the temperature stress accelerated life test in a current first period includes:
for each phase in the current first cycle, a first temperature threshold for the phase in the current first cycle for the monitoring point is calculated.
Further, in the fourth step, the determining whether to alarm according to a comparison result between a first temperature threshold in the current first period and the temperature of the monitoring point collected currently includes:
and for each stage in the current first period, judging whether to alarm or not according to the comparison result of the first temperature threshold of the stage in the current first period and the temperature of the monitoring point acquired in the stage.
Further, in the seventh step, when the summary task is executed, an old-new method is adopted, which includes:
multiplying the data in the backup table by-1, adding the data of the original data to calculate difference data, and summarizing the difference data into the summary table.
Another object of the present invention is to provide a temperature stress accelerated life test system for a sensor, which applies the temperature stress accelerated life test method for a sensor, the temperature stress accelerated life test system for a sensor comprising:
the heating module is connected with the central control module and used for heating through the heater and adjusting the temperature of the space environment of the temperature stress accelerated life test;
the refrigerating module is connected with the central control module and is used for refrigerating through the refrigerator and adjusting the temperature of the space environment of the temperature stress accelerated life test;
the central control module is connected with the heating module, the refrigerating module, the debugging module, the temperature monitoring module, the humidity monitoring module, the driving module, the stress testing module, the corrosion testing module, the data analysis module, the data storage module and the updating display module and is used for coordinating and controlling the normal operation of each module of the temperature stress accelerated life test system for the sensor through the central processing unit;
the debugging module is connected with the central control module and is used for debugging the temperature stress accelerated life test through a debugging program;
the temperature monitoring module is connected with the central control module and is used for monitoring the temperature of the space environment of the temperature stress accelerated life test through the temperature monitor;
the humidity monitoring module is connected with the central control module and is used for monitoring the humidity of the space environment of the humidity stress accelerated life test through the humidity monitor;
the driving module is connected with the central control module and used for driving the humidity stress accelerated life test through the motor;
the stress test module is connected with the central control module and is used for carrying out stress test on the humidity stress accelerated life test through a stress test program;
the corrosion testing module is connected with the central control module and is used for carrying out corrosion testing on the humidity stress accelerated life test through the corrosion testing module;
the data analysis module is connected with the central control module and used for recording test data through a data analysis program, summarizing the recorded information and analyzing the summarized data;
the data storage module is connected with the central control module and used for storing the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the data analysis result through the memory;
and the updating display module is connected with the central control module and used for updating and displaying the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the real-time data of the data analysis result through a display.
It is another object of the present invention to provide a computer program product stored on a computer readable medium, comprising a computer readable program for providing a user input interface to implement the temperature stress accelerated life test method for a sensor when executed on an electronic device.
It is another object of the present invention to provide a computer-readable storage medium storing instructions that, when executed on a computer, cause the computer to perform the temperature stress accelerated life test method for a sensor.
By combining all the technical schemes, the invention has the advantages and positive effects that: the temperature stress accelerated life test system for the sensor is debugged before test, can realize control on the test and realize accurate promotion of the test. The invention comprehensively considers the consistency of failure mechanisms of the constant temperature stress accelerated life test and the temperature high accelerated life test, so that the obtained life age data is more in line with the actual condition. The temperature stress failure-free accelerated life test method provided by the invention can effectively compress the life time, improve the test efficiency and reduce the test cost.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the embodiments of the present application will be briefly described below, and it is obvious that the drawings described below are only some embodiments of the present application, and it is obvious for those skilled in the art that other drawings can be obtained from the drawings without creative efforts.
Fig. 1 is a flowchart of a temperature stress accelerated life test method for a sensor according to an embodiment of the present invention.
FIG. 2 is a block diagram of a temperature stress accelerated life test system for a sensor according to an embodiment of the present invention;
in the figure: 1. a heating module; 2. a refrigeration module; 3. a central control module; 4. a debugging module; 5. a temperature monitoring module; 6. a humidity monitoring module; 7. a drive module; 8. a stress testing module; 9. a corrosion test module; 10. a data analysis module; 11. a data storage module; 12. and updating the display module.
Fig. 3 is a flowchart of a method for performing temperature stress accelerated life test debugging by using a debugging module and a debugging program according to an embodiment of the present invention.
Fig. 4 is a flowchart of a method for monitoring the temperature of the space environment of the temperature stress accelerated life test by using a temperature monitor through a temperature monitoring module according to an embodiment of the present invention.
Fig. 5 is a flowchart of a method for recording test data by a data analysis module using a data analysis program, summarizing recorded information, and analyzing summarized data according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In view of the problems in the prior art, the present invention provides a temperature stress accelerated life test system and method for a sensor, which will be described in detail below with reference to the accompanying drawings.
As shown in fig. 1, a temperature stress accelerated life test method for a sensor according to an embodiment of the present invention includes the following steps:
s101, heating by a heater through a heating module, and adjusting the temperature of a space environment of a temperature stress accelerated life test; refrigerating by using a refrigerating machine through a refrigerating module, and adjusting the temperature of the space environment of the temperature stress accelerated life test;
s102, coordinating and controlling normal operation of each module of the temperature stress accelerated life test system for the sensor by using a central processing unit through a central control module; debugging of a temperature stress accelerated life test is carried out by using a debugging program through a debugging module;
s103, monitoring the temperature of the space environment of the temperature stress accelerated life test by using a temperature monitor through a temperature monitoring module; monitoring the humidity of the space environment of the humidity stress accelerated life test by using a humidity monitor through a humidity monitoring module;
s104, driving a humidity stress accelerated life test by a motor through a driving module; the stress testing module is used for carrying out stress testing on the humidity stress accelerated life test by utilizing a stress testing program;
s105, performing corrosion test on the humidity stress accelerated life test by using the corrosion test module through the corrosion test module; recording test data by using a data analysis program through a data analysis module, summarizing the recorded information and analyzing the summarized data;
s106, storing the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the data analysis result by using a memory through a data storage module;
and S107, updating and displaying the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the real-time data of the data analysis result by using the display through the updating and displaying module.
As shown in fig. 2, a temperature stress accelerated life test system for a sensor according to an embodiment of the present invention includes: the system comprises a heating module 1, a refrigeration module 2, a central control module 3, a debugging module 4, a temperature monitoring module 5, a humidity monitoring module 6, a driving module 7, a stress testing module 8, a corrosion testing module 9, a data analysis module 10, a data storage module 11 and an updating display module 12.
The heating module 1 is connected with the central control module 3 and used for heating through a heater and adjusting the temperature of the space environment of the temperature stress accelerated life test;
the refrigerating module 2 is connected with the central control module 3 and is used for refrigerating through a refrigerator and adjusting the temperature of the space environment of the temperature stress accelerated life test;
the central control module 3 is connected with the heating module 1, the refrigerating module 2, the debugging module 4, the temperature monitoring module 5, the humidity monitoring module 6, the driving module 7, the stress testing module 8, the corrosion testing module 9, the data analyzing module 10, the data storage module 11 and the updating display module 12 and is used for coordinating and controlling the normal operation of each module of the temperature stress accelerated life test system for the sensor through a central processing unit;
the debugging module 4 is connected with the central control module 3 and is used for debugging the temperature stress accelerated life test through a debugging program;
the temperature monitoring module 5 is connected with the central control module 3 and is used for monitoring the temperature of the space environment of the temperature stress accelerated life test through a temperature monitor;
the humidity monitoring module 6 is connected with the central control module 3 and used for monitoring the humidity of the space environment of the humidity stress accelerated life test through a humidity monitor;
the driving module 7 is connected with the central control module 3 and used for driving the humidity stress accelerated life test through a motor;
the stress test module 8 is connected with the central control module 3 and is used for carrying out stress test on the humidity stress accelerated life test through a stress test program;
the corrosion testing module 9 is connected with the central control module 3 and is used for carrying out corrosion testing on the humidity stress accelerated life test through the corrosion testing module;
the data analysis module 10 is connected with the central control module 3 and used for recording test data through a data analysis program, summarizing the recorded information and analyzing the summarized data;
the data storage module 11 is connected with the central control module 3 and used for storing the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the data analysis result through a memory;
and the updating display module 12 is connected with the central control module 3 and is used for updating and displaying the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the real-time data of the data analysis result through a display.
The invention is further described with reference to specific examples.
Example 1
Fig. 1 shows a method for testing an accelerated lifetime of a temperature stress of a sensor according to an embodiment of the present invention, and fig. 3 shows a preferred embodiment of the method for testing an accelerated lifetime of a temperature stress of a sensor according to an embodiment of the present invention, where a debugging module is used to debug a temperature stress accelerated lifetime test, the method including:
s201, randomly extracting N sensors as test samples through a debugging module;
s202, detecting whether the components for carrying out the temperature stress accelerated life test are complete or not by utilizing a debugging program;
s203, starting each component to perform test operation of a temperature stress accelerated life test;
and S204, carrying out a temperature high accelerated life test on the extracted N sensors, and debugging the temperature stress accelerated life test.
N provided by the embodiment of the invention is a natural number, and the temperature monitor is arranged on a monitoring point of a space environment of the temperature stress accelerated life test.
The method for testing the high-temperature accelerated life of the N extracted sensors to realize debugging of the temperature stress accelerated life test comprises the following steps:
(1) the N sensors are all placed at an accelerated temperature stress level S in a stepping stress mode k Carrying out a stepping stress accelerated life test;
(2) increasing the accelerated temperature stress level to S after a time of delta t k2 The sample which is not failed is set at S k2 Continuing to perform a life test; continuing the process until the damage limit is generated, and stopping the test;
(3) the stress of failure temperature generated in the high-temperature accelerated life test is recorded as S m The corresponding mean duration of the test is denoted t m Said t is m I.e. the lifetime under ultimate stress.
Example 2
Fig. 1 shows a method for testing a temperature stress accelerated life of a sensor according to an embodiment of the present invention, and as a preferred embodiment, fig. 4 shows a method for monitoring a temperature of a space environment for a temperature stress accelerated life test by a temperature monitoring module according to an embodiment of the present invention, which includes:
s301, for each monitoring point, calculating a first temperature threshold of the monitoring point of the space environment of the temperature stress accelerated life test in the current first period through a temperature monitoring module;
s302, judging whether to alarm or not by using a temperature monitor according to a comparison result of a first temperature threshold on a current first period and the temperature of the monitoring point acquired currently;
and S303, repeating the steps of calculating the first temperature threshold and judging whether to alarm according to the first temperature threshold and the acquired temperature in each subsequent first period.
The first cycle provided by the embodiment of the invention is equally divided into a plurality of stages.
The method for calculating the first temperature threshold of the monitoring point of the space environment of the temperature stress accelerated life test in the current first period through the temperature monitoring module provided by the embodiment of the invention comprises the following steps: for each phase in the current first cycle, a first temperature threshold for the phase in the current first cycle for the monitoring point is calculated.
The embodiment of the invention provides a method for judging whether to alarm according to the comparison result of a first temperature threshold on a current first period and the temperature of a currently acquired monitoring point, which comprises the following steps: and for each stage in the current first period, judging whether to alarm or not according to a comparison result of a first temperature threshold of the stage on the current first period and the temperature of the monitoring point acquired in the stage.
Example 3
Fig. 1 shows a method for testing an accelerated lifetime of a sensor under temperature stress according to an embodiment of the present invention, and fig. 5 shows a preferred embodiment of the method for testing an accelerated lifetime of a sensor under temperature stress according to an embodiment of the present invention, where a data analysis module records test data by using a data analysis program, collects the recorded information, and analyzes the collected data, where the method includes:
s401, recording test data through a data analysis module, acquiring associated software of at least one data recording object included in a terminal by using a data analysis program, and polling a triggering summary entry process of the associated software;
s402, after receiving the trigger information, scanning a task queue, and sequentially executing summary tasks in the task queue according to the priority levels of a plurality of summary tasks;
and S403, acquiring information generated by each of the summarizing tasks of the associated software, and summarizing the data object information.
The method for adding old and new when executing the summary task provided by the embodiment of the invention comprises the following steps: multiplying the data in the backup table by-1, adding the data of the original data to calculate difference data, and summarizing the difference data into the summary table.
In the above embodiments, the implementation may be wholly or partially realized by software, hardware, firmware, or any combination thereof. When used in whole or in part, can be implemented in a computer program product that includes one or more computer instructions. When loaded or executed on a computer, cause the flow or functions according to embodiments of the invention to occur, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a network of computers, or other programmable device. The computer instructions may be stored in a computer readable storage medium or transmitted from one computer readable storage medium to another, for example, the computer instructions may be transmitted from one website site, computer, server, or data center to another website site, computer, server, or data center via wire (e.g., coaxial cable, fiber optic, Digital Subscriber Line (DSL), or wireless (e.g., infrared, wireless, microwave, etc.)). The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device, such as a server, a data center, etc., that includes one or more of the available media. The usable medium may be a magnetic medium (e.g., floppy Disk, hard Disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., Solid State Disk (SSD)), among others.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention, and the scope of the present invention is not limited thereto, and any modification, equivalent replacement, and improvement made by those skilled in the art within the technical scope of the present invention disclosed herein, which is within the spirit and principle of the present invention, should be covered by the present invention.
Claims (5)
1. A temperature stress accelerated life test method for a sensor is characterized by comprising the following steps:
the method comprises the following steps that firstly, a heating module is used for heating through a heater, and the temperature of the space environment of the temperature stress accelerated life test is adjusted; refrigerating by using a refrigerating machine through a refrigerating module, and adjusting the temperature of the space environment of the temperature stress accelerated life test;
step two, the central control module utilizes a central processing unit to coordinate and control the normal operation of each module of the temperature stress accelerated life test system for the sensor; randomly extracting N sensors as test samples through a debugging module;
detecting whether the components for carrying out the temperature stress accelerated life test are complete or not by utilizing a debugging program; starting each component to perform test operation of a temperature stress accelerated life test; carrying out a temperature high accelerated life test on the extracted N sensors to realize the debugging of the temperature stress accelerated life test;
step four, for each monitoring point, calculating a first temperature threshold of the monitoring point of the space environment of the temperature stress accelerated life test in the current first period through a temperature monitoring module; judging whether to alarm or not by using a temperature monitor according to a comparison result of a first temperature threshold on a current first period and the temperature of the monitoring point acquired currently;
step five, on each subsequent first period, the steps of calculating a first temperature threshold and judging whether to alarm or not according to the first temperature threshold and the acquired temperature are repeated; monitoring the humidity of the space environment of the humidity stress accelerated life test by using a humidity monitor through a humidity monitoring module;
driving the humidity stress accelerated life test by using a motor through a driving module; carrying out stress test on the humidity stress accelerated life test by using a stress test program through a stress test module; performing corrosion test on the humidity stress accelerated life test by using a corrosion test module through the corrosion test module;
recording test data through a data analysis module, acquiring associated software of at least one data recording object included in the terminal by using a data analysis program, and polling a triggering summary entry process of the associated software; scanning a task queue after receiving the trigger information, and sequentially executing summary tasks in the task queue according to the priority levels of a plurality of summary tasks; acquiring information generated by each summary task of the associated software, and summarizing the data object information;
step eight, storing the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the data analysis result by using a memory through a data storage module;
the display is used for updating and displaying the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the real-time data of the data analysis result by the updating and displaying module;
in step four, the first cycle is equally divided into a plurality of stages;
in step four, calculating, by the temperature monitoring module, a first temperature threshold of a monitoring point of the space environment of the temperature stress accelerated life test in a current first period, includes:
for each phase in the current first period, calculating a first temperature threshold of the monitoring point in the phase in the current first period;
in the fourth step, the determining whether to alarm according to a comparison result between a first temperature threshold in the current first period and the temperature of the currently acquired monitoring point includes:
and for each stage in the current first period, judging whether to alarm or not according to the comparison result of the first temperature threshold of the stage in the current first period and the temperature of the monitoring point acquired in the stage.
2. The temperature stress accelerated life test method for the sensor according to claim 1, wherein in step three, N is a natural number, and the temperature monitor is disposed at a monitoring point of a space environment of the temperature stress accelerated life test.
3. The method according to claim 1, wherein in step three, the step of performing a temperature high accelerated life test on the extracted N sensors to achieve debugging of the temperature stress accelerated life test includes:
(1) the N sensors are all placed at an accelerated temperature stress level S in a stepping stress mode k Carrying out a stepping stress accelerated life test;
(2) increasing the accelerated temperature stress level to S after a time of delta t k2 The sample which is not failed is set at S k2 Continuing to perform a life test; continuing the process until the damage limit is generated, and stopping the test;
(3) the stress of failure temperature generated in the high-temperature accelerated life test is recorded as S m The corresponding mean duration of the test is denoted t m Said t is m I.e. the lifetime under ultimate stress.
4. A temperature stress accelerated life test system for a sensor to which the temperature stress accelerated life test method for a sensor according to any one of claims 1 to 3 is applied, the temperature stress accelerated life test system for a sensor comprising:
the heating module is connected with the central control module and used for heating through the heater and adjusting the temperature of the space environment of the temperature stress accelerated life test;
the refrigerating module is connected with the central control module and is used for refrigerating through the refrigerator and adjusting the temperature of the space environment of the temperature stress accelerated life test;
the central control module is connected with the heating module, the refrigerating module, the debugging module, the temperature monitoring module, the humidity monitoring module, the driving module, the stress testing module, the corrosion testing module, the data analysis module, the data storage module and the updating display module and is used for coordinating and controlling the normal operation of each module of the temperature stress accelerated life test system for the sensor through the central processing unit;
the debugging module is connected with the central control module and is used for debugging the temperature stress accelerated life test through a debugging program;
the temperature monitoring module is connected with the central control module and is used for monitoring the temperature of the space environment of the temperature stress accelerated life test through the temperature monitor;
the humidity monitoring module is connected with the central control module and is used for monitoring the humidity of the space environment of the humidity stress accelerated life test through the humidity monitor;
the driving module is connected with the central control module and used for driving the humidity stress accelerated life test through the motor;
the stress test module is connected with the central control module and is used for carrying out stress test on the humidity stress accelerated life test through a stress test program;
the corrosion testing module is connected with the central control module and is used for carrying out corrosion testing on the humidity stress accelerated life test through the corrosion testing module;
the data analysis module is connected with the central control module and used for recording test data through a data analysis program, summarizing the recorded information and analyzing the summarized data;
the data storage module is connected with the central control module and used for storing the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the data analysis result through the memory;
and the updating display module is connected with the central control module and is used for updating and displaying the temperature data of the space environment, the debugging data of the temperature stress accelerated life test, the temperature and humidity monitoring data, the stress test result, the corrosion test result and the real-time data of the data analysis result through the display.
5. A computer-readable storage medium storing instructions which, when executed on a computer, cause the computer to perform the temperature stress accelerated life test method for a sensor according to any one of claims 1 to 3.
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