CN112578193A - Direct current voltage stabilization testing device of semiconductor laser - Google Patents
Direct current voltage stabilization testing device of semiconductor laser Download PDFInfo
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- CN112578193A CN112578193A CN201910933268.3A CN201910933268A CN112578193A CN 112578193 A CN112578193 A CN 112578193A CN 201910933268 A CN201910933268 A CN 201910933268A CN 112578193 A CN112578193 A CN 112578193A
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Abstract
The invention discloses a direct current stabilized voltage testing device of a semiconductor laser, which also comprises a rectifying circuit for changing alternating sine alternating voltage into unidirectional pulse voltage, a filter circuit for reserving direct current component in the circuit, a starting circuit for establishing respective working current for electronic components in the circuit, a voltage stabilizing circuit capable of obtaining a stable direct current power supply, and a protective circuit, and the invention is scientific and reasonable and is safe and convenient to use, the direct current stabilized voltage testing device of the semiconductor laser realizes reliable and stable test for the semiconductor laser, especially the design and application of the starting circuit and the protective circuit, effectively solves the problem that the starting current impact is overlarge when the laser is just electrified, really achieves the effect of slow start and slow shut-off, and avoids the situation that the laser is damaged due to overlarge impact current, and further greatly improves the passing rate of the test.
Description
Technical Field
The invention relates to the technical field of semiconductor laser testing, in particular to a direct current voltage stabilization testing device of a semiconductor laser.
Background
The main performance indexes of semiconductor lasers are usually verified by electrical tests, that is, the output power of the device is observed to change during the test under a certain current, or the increase of the driving current during the test is observed under a certain output power. Typically, during testing, a device is considered to fail when the device output power drops to half the initial value or the drive current rises to 1.5 times the initial value.
Semiconductor lasers used under normal conditions have a long operating life, but semiconductor lasers are also easily destroyed. The following causes of damage may occur during testing:
1. when the drive structure of the test device is switched on, an overshoot occurs in the current, so that the PN junction may be electrically broken and the cleavage plane may be damaged or destroyed.
2. The drive structure is excessively large in connection with the laser, when a power supply is turned off, the capacitor discharges to cause overcurrent of the laser, a PN junction breaks down, and a cleavage plane is damaged.
3. The surge of the outer structure in parallel with the driving structure causes damage to the laser.
4. Accidental failure of the control structure results in laser damage.
According to incomplete statistics, the semiconductor laser suddenly fails, and more than half of the failures are caused by surge breakdown. The surge is a sudden transient electric pulse, so that the semiconductor laser instantaneously bears overvoltage and the PN junction breaks down. The interface may also be damaged by the large optical power generated by the forward overcurrent of the transient overvoltage, even if the maximum current allowed by the semiconductor laser is exceeded in nanoseconds, which may cause damage or damage.
The performance index of the semiconductor laser depends on the driving structure of the testing device, and the fluctuation of the current can cause the change of the optical power, thereby affecting the stability and reliability of the laser, and even causing COD due to large-range fluctuation. Therefore, in addition to the conventional driving structure, the output current should be more stable, so as to protect the laser more safely and effectively and ensure the stable and reliable operation of the semiconductor laser.
Therefore, a dc voltage stabilization testing device for semiconductor laser is needed to solve the above problems.
Disclosure of Invention
The invention aims to provide a direct current voltage stabilization testing device of a semiconductor laser, which aims to solve the problems in the prior art.
In order to achieve the purpose, the invention provides the following technical scheme: a direct current voltage stabilization testing device of a semiconductor laser comprises a transformer circuit for converting alternating current 220V voltage provided by a power supply into different common voltages, a rectifying circuit for converting alternating positive and negative sinusoidal alternating current voltage into unidirectional pulse voltage, a filter circuit for reserving direct current components in the circuit, a starting circuit for enabling electronic components in the circuit to establish respective working current, and a voltage stabilizing circuit capable of obtaining a stable direct current power supply;
the rectifier circuit utilizes the one-way conductivity of the diode to change the sine alternating voltage with the positive and negative alternation into the one-way pulse voltage, so that the direct current component of the output voltage is higher, the pulse coefficient is lower, and the phenomenon of breakdown on the semiconductor laser is avoided. The sampling structure and the reference power supply establish respective working current, after normal work, the starting circuit is disconnected, slow start and slow shut-off are realized, the stability of the voltage stabilizing structure is prevented from being influenced, and the protection circuit simultaneously reduces the output voltage and the output current to lower values when the output end is overloaded or even short-circuited, so as to protect the circuit.
As a preferred technical solution, the transformer circuit is electrically connected to the rectifying circuit, the rectifying circuit is electrically connected to the filter circuit, the filter circuit is electrically connected to the start circuit, and the start circuit is electrically connected to the voltage stabilizing circuit.
As a preferred technical solution, the starting circuit includes a resistor R2, a resistor R3, a resistor R4, a diode VD5, and a transistor VT 1;
triode VT1 and resistance R2, resistance R3, resistance R4 and diode VD5 electric connection, resistance R2 and diode VD5 series connection, resistance R2 and resistance R3 parallel connection, diode VD5 and resistance R4 parallel connection.
As a preferred technical solution, a base of the transistor VT1 is electrically connected to a first end of the resistor R2, an output end of the diode VD5 is electrically connected to a base of the transistor VT1, a collector of the transistor VT1 is electrically connected to a first end of the resistor R3, an emitter of the transistor VT1 is electrically connected to a first end of the resistor R4, a second end of the resistor R2 is electrically connected to a second end of the resistor R3, and a second end of the resistor R4 is electrically connected to an input end of the diode VD 5;
after power-on, the resistor R2 and the diode VD5 are firstly conducted, so that the triode VT1 is conducted, then the whole direct-current voltage stabilizing structure works normally, at the moment, the voltage drop of the resistor R4 is increased, so that the VT1 is cut off, the association between the starting circuit and the voltage stabilizing circuit is cut off, slow start and slow shut-off are realized, and the stability of the voltage stabilizing structure is prevented from being influenced.
As a preferred technical scheme, the voltage stabilizing circuit comprises an adjusting tube, a reference power supply, an amplifying structure, a sampling structure and a protection circuit;
the reference power supply is connected with the adjusting tube, the amplifying structure, the sampling structure and the protection circuit in an electric mode, the amplifying structure is connected with the adjusting tube and the sampling structure in an electric mode, and the adjusting tube is connected with the protection circuit and the sampling structure in an electric mode.
As a preferred technical scheme, the adjusting tube is a triode VT 2;
the reference power supply comprises a resistor R5 and a diode VD6, the output end of the diode VD6 is electrically connected with the first end of the resistor R5, and the second end of the resistor R5 is electrically connected with the collector of the triode VT 2;
the amplifying structure is an operational amplifier A, the output end of the operational amplifier A is electrically connected with the base electrode of the triode VT2, and the non-inverting input end of the operational amplifier A is electrically connected with the output end of the diode VD6 and the first end of the resistor R5;
the sampling structure comprises a resistor R11, a resistor R12 and a resistor R13, wherein the second end of the resistor R11 is connected with the first end of a resistor R12 in series, the second end of the resistor R12 is connected with the first end of a resistor R13 in series, the resistor R12 is electrically connected with the inverting input end of an operational amplifier A, the first end of the resistor R11 is electrically connected with the emitter of a triode VT2 and a protection circuit, and the second end of the resistor R13 is electrically connected with the protection circuit;
the voltage stabilizing circuit is used for stabilizing the voltage of the circuit, so that the output voltage is basically kept stable, and the phenomenon that the semiconductor laser is broken down due to the instantaneous change of the voltage is avoided.
As a preferred technical solution, the protection circuit includes a resistor R6, a resistor R7, a resistor R8, a resistor R9, a resistor R10, a transistor VT3, and an auxiliary power supply U;
the auxiliary power source U is electrically connected to a first end of a resistor R9, a second end of a resistor R8, and a second end of a resistor R10, a second end of the resistor R9 and a first end of a resistor R10 are connected in series, a second end of the resistor R10 is electrically connected to a second end of a resistor R8, the second end of the resistor R9 and the first end of the resistor R10 are both electrically connected to a base of a transistor VT3, a collector of the transistor VT3 is electrically connected to a second end of a resistor R6 and a first end of a resistor R7, a second end of the resistor R7 is electrically connected to a first end of a resistor R8, a first end of the resistor R6 is electrically connected to an emitter of a diode VT2, an emitter of the diode VT 84 is electrically connected to a base of a diode VT2, and a second end of the resistor R7 is electrically connected to an input end of a diode VD 6;
when the current passing through the triode VT3 is increased sharply, namely when the load current is increased, the voltage drop of the resistor R8 is increased, if the voltage passing through the triode VT3 is increased to make the triode VT3 enter an amplification region, a collector current is generated, the base of the triode VT2 is shunted by the conduction of the triode VT3, and the current passing through the triode VT2 is reduced, so that the protection of the whole circuit and the load can be realized, and the phenomenon that the circuit and the load are damaged due to the instantaneous increase of the current is avoided.
Preferably, the transformer circuit includes a transformer T, and the transformer T includes a primary side U1 and a secondary side U2.
As a preferable technical scheme, the rectifying circuit comprises a diode VD1, a diode VD2, a diode VD3 and a diode VD 4;
a first end of the secondary side U2 is electrically connected to an input end of the diode VD1 and an output end of the diode VD4, and a second end of the secondary side U2 is electrically connected to an output end of the diode VD2 and an input end of the diode VD 3.
As a preferred technical solution, the filter circuit includes a capacitor C1, a capacitor C2 and a resistor R1;
the first end of the resistor R1 is electrically connected with the anode of the capacitor C1, the second end of the resistor R1 is electrically connected with the anode of the capacitor C2, the cathode of the capacitor C1 is electrically connected with the cathode of the second C2, the capacitor C1 is electrically connected with the rectifying circuit, and the capacitor C2 is electrically connected with the starting circuit.
Compared with the prior art, the invention has the beneficial effects that:
1. the direct-current voltage stabilization testing device of the semiconductor laser realizes reliable and stable testing of the semiconductor laser, particularly the design and application of the starting circuit and the protection circuit, effectively solves the problem that the starting current impact is too large when the laser is just electrified during testing, really achieves the effect of slow start and slow turn-off, avoids the situation that the laser is damaged due to too large impact current, and further greatly improves the passing rate of the testing.
2. According to the direct-current voltage stabilization testing device of the semiconductor laser, disclosed by the invention, in the testing process of the laser adopting the constant current source mode, the problem that the device is irreversibly damaged due to the fact that the instantaneous fluctuation range of the output current is overlarge and even reaches the COD current is solved, the cost of scrapping the device due to the power supply problem is saved, the working efficiency is improved, and the yield is increased.
Drawings
FIG. 1 is a circuit diagram of a DC voltage stabilization testing apparatus of a semiconductor laser according to the present invention;
fig. 2 is a dotted line portion showing a transformer structure of the dc voltage stabilization testing apparatus of the semiconductor laser device according to the present invention;
fig. 3 is a single-phase bridge rectifier circuit diagram of the dc voltage stabilization testing apparatus of the semiconductor laser according to the present invention, which is shown in dotted line;
FIG. 4 is a dashed line diagram of a complex RC-pi filter circuit of the DC voltage stabilization testing apparatus of the semiconductor laser according to the present invention;
fig. 5 is a broken line portion of a starting circuit diagram of a dc voltage stabilization testing apparatus of a semiconductor laser according to the present invention;
FIG. 6 is a diagram of a series DC regulator circuit of the DC regulator testing apparatus of a semiconductor laser according to the present invention, shown in phantom;
fig. 7 is a protection circuit diagram of a dc voltage stabilization testing apparatus of a semiconductor laser according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example (b): as shown in fig. 1, a dc voltage stabilization testing apparatus for a semiconductor laser includes a transformer circuit for converting an ac 220V voltage provided by a power supply into different common voltages, a rectifying circuit for converting a sinusoidal ac voltage with alternating positive and negative into a unidirectional pulse voltage, a filter circuit for retaining a dc component in the circuit, a start circuit for establishing respective working currents for electronic components in the circuit, and a voltage stabilizing circuit for obtaining a stable dc power supply.
The transformer circuit is electrically connected with the rectifying circuit, the rectifying circuit is electrically connected with the filter circuit, the filter circuit is electrically connected with the starting circuit, and the starting circuit is electrically connected with the voltage stabilizing circuit.
As shown in fig. 2, the transformer circuit includes a transformer T including a primary side U1 and a secondary side U2.
As shown in fig. 3, the rectifier circuit includes a diode VD1, a diode VD2, a diode VD3, and a diode VD 4;
a first end of the secondary side U2 is electrically connected with an input end of a diode VD1 and an output end of a diode VD4, and a second end of the secondary side U2 is electrically connected with an output end of a diode VD2 and an input end of a diode VD 3;
four diodes of a diode VD1, a diode VD2, a diode VD3 and a diode VD4 are connected to form a bridge, when the positive half cycle of a secondary side U2 is carried out, the diode VD1 and the diode VD2 are conductive, the diode VD3 and the diode VD4 are cut off, and current i is output to a load to obtain the upper positive and lower negative voltage polarities; when the secondary side U2 is at the negative half cycle, the diode VD3 and the diode VD4 are conductive, the diode VD1 and the diode VD2 are cut off, the current i is output to the load, the voltage polarity is also positive, negative and positive, and therefore a unidirectional pulsating voltage is obtained on the load.
As shown in fig. 4, the filter circuit includes a capacitor C1, a capacitor C2, and a resistor R1;
the first end of the resistor R1 is electrically connected with the anode of the capacitor C1, the second end of the resistor R1 is electrically connected with the anode of the capacitor C2, the cathode of the capacitor C1 is electrically connected with the cathode of the second C2, the capacitor C1 is electrically connected with the rectifying circuit, and the capacitor C2 is electrically connected with the starting circuit.
In order to obtain better filtering effect, basic filtering element capacitor C1, capacitor C2 and resistor R1 are combined to form a compound RC-pi type filtering structure by utilizing the energy storage function of the basic filtering element capacitor C1, the capacitor C2 and the resistor R1, and the impedance presented to alternating current and direct current components is different, at the moment, the voltage at two ends of the capacitor C1 comprises a direct current component and an alternating current component, wherein the direct current component is divided between the resistor R1 and a load,the AC component is between the load R and the load
Due to load
Since the voltage is always smaller than the load R, the dc component is attenuated less in the load resistor R, and the ac component is attenuated more, so that the ripple component of the output voltage is further reduced.
As shown in fig. 5, the starting circuit includes a resistor R2, a resistor R3, a resistor R4, a diode VD5, and a transistor VT 1;
triode VT1 and resistance R2, resistance R3, resistance R4 and diode VD5 electric connection, resistance R2 and diode VD5 series connection, resistance R2 and resistance R3 parallel connection, diode VD5 and resistance R4 parallel connection.
The base of the triode VT1 is electrically connected with the first end of the resistor R2, the output end of the diode VD5 is electrically connected with the base of the triode VT1, the collector of the triode VT1 is electrically connected with the first end of the resistor R3, the emitter of the triode VT1 is electrically connected with the first end of the resistor R4, the second end of the resistor R2 is electrically connected with the second end of the resistor R3, and the second end of the resistor R4 is electrically connected with the input end of the diode VD 5;
after power-on, the resistor R2 and the diode VD5 are firstly conducted, so that the triode VT1 is also conducted, then the whole direct-current voltage stabilizing structure enters normal work, at the moment, the voltage drop of the resistor R4 is increased, the triode VT1 is cut off, and the association between the starting structure and the direct-current voltage stabilizing structure is cut off.
As shown in fig. 6, the voltage stabilizing circuit includes an adjusting tube, a reference power supply, an amplifying structure, a sampling structure and a protection circuit;
the reference power supply is connected with the adjusting tube, the amplifying structure, the sampling structure and the protection circuit in an electric mode, the amplifying structure is connected with the adjusting tube and the sampling structure in an electric mode, and the adjusting tube is connected with the protection circuit and the sampling structure in an electric mode.
The adjusting tube is a triode VT 2;
the reference power supply comprises a resistor R5 and a diode VD6, the output end of the diode VD6 is electrically connected with the first end of the resistor R5, and the second end of the resistor R5 is electrically connected with the collector of the triode VT 2;
the amplifying structure is an operational amplifier A, the output end of the operational amplifier A is electrically connected with the base electrode of the triode VT2, and the non-inverting input end of the operational amplifier A is electrically connected with the output end of the diode VD6 and the first end of the resistor R5;
the sampling structure comprises a resistor R11, a resistor R12 and a resistor R13, wherein the second end of the resistor R11 is connected with the first end of a resistor R12 in series, the second end of the resistor R12 is connected with the first end of a resistor R13 in series, the resistor R12 is electrically connected with the inverting input end of an operational amplifier A, the first end of the resistor R11 is electrically connected with the emitter of a triode VT2 and a protection circuit, and the second end of the resistor R13 is electrically connected with the protection circuit;
the output voltage at this moment is quite different from the ideal direct current power supply, because when the power supply fluctuates, the output voltage of the rectifying structure is directly related to the secondary voltage of the transformer, so the corresponding change is needed, in order to obtain a more stable direct current power supply, a series direct current voltage stabilizing circuit is adopted, which mainly comprises a regulating tube, an amplifying structure, a reference power supply and a sampling structure, and if the output voltage UO is increased due to the increase of the input voltage U1 or the reduction of the load current, the voltage Uf fed back to the inverting input end of the amplifying structure after sampling is also increased proportionally, but the reference voltage Uz of the non-inverting input end is kept unchanged, so the differential mode input voltage Uid of the amplifying structure is reduced as Uz-Uf, so the output voltage of the amplifying structure is reduced, the base input voltage Ube of the triode VT2 is reduced, and the collector current Ic of the triode VT2 is reduced accordingly, meanwhile, the collector voltage Uce is increased, the output voltage U0 is kept basically unchanged, and the output voltage is kept basically stable through voltage negative feedback.
As shown in fig. 7, the protection circuit includes a resistor R6, a resistor R7, a resistor R8, a resistor R9, a resistor R10, a transistor VT3, and an auxiliary power supply U;
the auxiliary power source U is electrically connected to a first end of a resistor R9, a second end of a resistor R8, and a second end of a resistor R10, a second end of the resistor R9 and a first end of a resistor R10 are connected in series, a second end of the resistor R10 is electrically connected to a second end of a resistor R8, the second end of the resistor R9 and the first end of the resistor R10 are both electrically connected to a base of a transistor VT3, a collector of the transistor VT3 is electrically connected to a second end of a resistor R6 and a first end of a resistor R7, a second end of the resistor R7 is electrically connected to a first end of a resistor R8, a first end of the resistor R6 is electrically connected to an emitter of a diode VT2, an emitter of the diode VT 84 is electrically connected to a base of a diode VT2, and a second end of the resistor R7 is electrically connected to an input end of a diode VD 6;
when the output end is overloaded or even short-circuited, the current passing through the transistor VT3 is increased sharply, which may cause damage, so necessary protection measures are taken, once this phenomenon occurs, the output voltage and the output current are decreased to lower values at the same time, that is, when the load current is increased, the voltage drop on the resistor R8 is increased, if the voltage passing through the transistor VT3 is increased to make the V transistor T3 enter an amplification region, a collector current is generated, and the conduction of the transistor VT3 will shunt the base of the regulating tube, and the current of the over-regulating tube is decreased, thereby realizing the protection of the whole circuit.
The working principle of the invention is as follows: firstly, the primary side U1 and the secondary side U2 of a transformer T of a transformer circuit are utilized to convert an input voltage U0 into common voltages of different grades, a diode VD1, a diode VD2, a diode VD3 and a diode VD4 of a rectifying circuit are utilized to enable a current i at the output end of the secondary side U2 on a load to be kept positive and negative all the time, so that a unidirectional pulse voltage is obtained on the load, because the output voltage rectified by the rectifying circuit contains a larger pulse component, at the moment, a filter circuit is utilized to filter the pulse component in the output voltage, the alternating current component in the output voltage is divided between the load and a capacitor C2, because the load of a capacitor C2 is smaller than the load in the circuit, the direct current component on a load resistor R is attenuated less, and the alternating current component is attenuated more, so that the pulse component of the output voltage is further reduced, the output voltage at this moment has a considerable difference with an ideal direct current power supply, because when the power supply fluctuates, the output voltage of the rectifying circuit is directly related to the secondary voltage of the transformer, and therefore, the output voltage also has a corresponding change, and at this moment, the final output voltage U0 is basically kept unchanged by using the voltage stabilizing circuit, so that the stability of the output voltage is ensured.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (10)
1. The utility model provides a direct current steady voltage testing arrangement of semiconductor laser, includes the transformer circuit who converts the alternating current 220V voltage that the power provided to different common voltages, its characterized in that: the DC voltage stabilization testing device also comprises a rectifying circuit for converting the sine AC voltage with alternating positive and negative into unidirectional pulse voltage, a filter circuit for reserving DC components in the circuit, a starting circuit for enabling electronic components in the circuit to establish respective working current, and a voltage stabilizing circuit capable of obtaining a stable DC power supply.
2. The direct-current voltage stabilization testing device of a semiconductor laser according to claim 1, characterized in that: the transformer circuit is electrically connected with the rectifying circuit, the rectifying circuit is electrically connected with the filter circuit, the filter circuit is electrically connected with the starting circuit, and the starting circuit is electrically connected with the voltage stabilizing circuit.
3. The direct-current voltage stabilization testing device of a semiconductor laser according to claim 1, characterized in that: the starting circuit comprises a resistor R2, a resistor R3, a resistor R4, a diode VD5 and a triode VT 1;
triode VT1 and resistance R2, resistance R3, resistance R4 and diode VD5 electric connection, resistance R2 and diode VD5 series connection, resistance R2 and resistance R3 parallel connection, diode VD5 and resistance R4 parallel connection.
4. The direct current voltage stabilization testing device of a semiconductor laser according to claim 5, characterized in that: the base of the triode VT1 is electrically connected with the first end of the resistor R2, the output end of the diode VD5 is electrically connected with the base of the triode VT1, the collector of the triode VT1 is electrically connected with the first end of the resistor R3, the emitter of the triode VT1 is electrically connected with the first end of the resistor R4, the second end of the resistor R2 is electrically connected with the second end of the resistor R3, and the second end of the resistor R4 is electrically connected with the input end of the diode VD 5.
5. The direct-current voltage stabilization testing device of a semiconductor laser according to claim 1, characterized in that: the voltage stabilizing circuit comprises an adjusting tube, a reference power supply, an amplifying structure, a sampling structure and a protection circuit;
the reference power supply is connected with the adjusting tube, the amplifying structure, the sampling structure and the protection circuit in an electric mode, the amplifying structure is connected with the adjusting tube and the sampling structure in an electric mode, and the adjusting tube is connected with the protection circuit and the sampling structure in an electric mode.
6. The direct current voltage stabilization testing device of a semiconductor laser according to claim 5, characterized in that: the adjusting tube is a triode VT 2;
the reference power supply comprises a resistor R5 and a diode VD6, the output end of the diode VD6 is electrically connected with the first end of the resistor R5, and the second end of the resistor R5 is electrically connected with the collector of the triode VT 2;
the amplifying structure is an operational amplifier A, the output end of the operational amplifier A is electrically connected with the base electrode of the triode VT2, and the non-inverting input end of the operational amplifier A is electrically connected with the output end of the diode VD6 and the first end of the resistor R5;
the sampling structure comprises a resistor R11, a resistor R12 and a resistor R13, the second end of the resistor R11 is connected with the first end of the resistor R12 in series, the second end of the resistor R12 is connected with the first end of the resistor R13 in series, the resistor R12 is electrically connected with the inverting input end of the operational amplifier A, the first end of the resistor R11 is electrically connected with the emitter and the protection circuit of the triode VT2, and the second end of the resistor R13 is electrically connected with the protection circuit.
7. The direct current voltage stabilization testing device of a semiconductor laser according to claim 6, characterized in that: the protection circuit comprises a resistor R6, a resistor R7, a resistor R8, a resistor R9, a resistor R10, a triode VT3 and an auxiliary power supply U;
the auxiliary power source U is electrically connected to a first end of the resistor R9, a second end of the resistor R8, and a second end of the resistor R10, a second end of the resistor R9 and a first end of the resistor R10 are connected in series, a second end of the resistor R10 is electrically connected to a second end of the resistor R8, the second end of the resistor R9 and the first end of the resistor R10 are both electrically connected to a base of the transistor VT3, a collector of the transistor VT3 is electrically connected to a second end of the resistor R6 and a first end of the resistor R7, a second end of the resistor R7 is electrically connected to a first end of the resistor R8, a first end of the resistor R6 is electrically connected to an emitter of the diode VT2, an emitter of the diode VT 84 is electrically connected to a base of the diode VT2, and a second end of the resistor R7 is electrically connected to an input end of the diode VD 6.
8. The direct-current voltage stabilization testing device of a semiconductor laser according to claim 1, characterized in that: the transformer circuit includes a transformer T including a primary side U1 and a secondary side U2.
9. A direct current voltage stabilization testing device of a semiconductor laser according to claim 1 or 8, characterized in that: the rectifying circuit comprises a diode VD1, a diode VD2, a diode VD3 and a diode VD 4;
a first end of the secondary side U2 is electrically connected to an input end of the diode VD1 and an output end of the diode VD4, and a second end of the secondary side U2 is electrically connected to an output end of the diode VD2 and an input end of the diode VD 3.
10. The direct-current voltage stabilization testing device of a semiconductor laser according to claim 1, characterized in that: the filter circuit comprises a capacitor C1, a capacitor C2 and a resistor R1;
the first end of the resistor R1 is electrically connected with the anode of the capacitor C1, the second end of the resistor R1 is electrically connected with the anode of the capacitor C2, the cathode of the capacitor C1 is electrically connected with the cathode of the second C2, the capacitor C1 is electrically connected with the rectifying circuit, and the capacitor C2 is electrically connected with the starting circuit.
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Application publication date: 20210330 |