CN112525494B - Device and method for improving and measuring pointing stability of high-repetition-frequency ultrafast laser light wire - Google Patents
Device and method for improving and measuring pointing stability of high-repetition-frequency ultrafast laser light wire Download PDFInfo
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- CN112525494B CN112525494B CN202011327252.7A CN202011327252A CN112525494B CN 112525494 B CN112525494 B CN 112525494B CN 202011327252 A CN202011327252 A CN 202011327252A CN 112525494 B CN112525494 B CN 112525494B
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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Abstract
An apparatus for detecting pointing stability of a high repetition frequency ultrafast laser light filament, comprising: the laser comprises an ultrafast laser, a ceramic wafer, a microscope and a focusing lens arranged along the laser emitting direction of the ultrafast laser; device for improving the pointing stability of high-frequency ultrafast laser light wires, comprising: the laser comprises an ultrafast laser, a ceramic wafer, a microscope, a metal electrode connected with a high-voltage power supply and a focusing lens arranged along the laser emitting direction of the ultrafast laser; and a method for improving and measuring the pointing stability of the high-repetition-frequency ultrafast laser light wire. The invention applies an external electric field on an ultrafast laser gas filament forming area by using a high-voltage loaded metal electrode, and achieves the aim of improving the pointing stability of the high-frequency ultrafast laser filament by utilizing the guiding effect of laser plasma on the subsequent pulse of the high-frequency laser based on the strong interaction between the external electric field and the plasma in the ultrafast laser filament.
Description
Technical Field
The invention relates to high-voltage discharge and coupling action between an external electric field and ultrafast strong laser nonlinear filament forming, which is based on the plasma conductive property of ultrafast laser filament, utilizes the external electric field to regulate and control the plasma in the filament, and further improves the pointing stability of the ultrafast laser filament by guiding high-repetition-frequency ultrafast laser filament forming.
Background
In the transmission process of ultra-fast strong laser in the air, when the self-focusing effect caused by the Kerr effect and the defocusing effect caused by laser plasma reach dynamic balance, a uniform and slender plasma channel, namely a light wire, can be formed in the air. The ultra-fast laser wire-forming method has important application in the fields of processing and imaging, ultra-short pulse compression and ultra-continuous spectrum generation, terahertz and harmonic radiation sources, air lasers, remote atmosphere detection, air lasers and the like. High repetition frequency (> 100 Hz) laser ultrafast gas filaments are typically used in these applications, but for high repetition frequency laser gas filaments, the self-heating effect of the filaments can have a serious negative impact on the pointing stability of the filaments, reducing the measurement accuracy and resolution of many laser gas filament-based applications. Improving the pointing stability of high repetition frequency laser gas is a difficult problem to be solved urgently, and has great significance for the application of optical fibers.
The traditional technology for controlling the light wire transmission mainly depends on laser pulse wave front modulation, has quite limited improvement on the pointing stability of the ultrafast laser light wire, is limited by conditions such as laser energy, laser spot size, material damage threshold and the like, and some methods even sacrifice the energy of the ultrafast laser light wire, cannot reduce the influence of the thermal effect of the light wire on the pointing stability of the light wire, and cannot realize the long-distance stable transmission of the high-energy and high-repetition-frequency laser gas light wire.
Disclosure of Invention
Aiming at the bottleneck problem of high-repetition-frequency ultrafast laser filament forming heat-induced jitter and the defects and limitations of the traditional method for improving the directional stability of the high-repetition-frequency laser gas filament, the invention provides a brand new and effective method. Based on the strong coupling effect between the external electric field and the plasmas in the ultrafast laser light wire, the pointing stability of the ultrafast laser light wire is improved by utilizing the guiding effect of the laser plasmas on the subsequent pulses of the high-repetition-frequency laser. Under the action of an external electric field, the recombination process of electrons and ions in the ultrafast laser light wire is inhibited, so that the thermal effect of the high-repetition-frequency laser gas light wire is weakened; secondly, the ultrafast laser light wire has good conductive property, and under the action of an external electric field, the electrified metal electrode tip has coulomb force action on the ultrafast laser light wire, so that the position of the ultrafast laser light wire is fixed, and the pointing stability of the ultrafast laser light wire is improved. The method has great significance for the application of ultra-fast femtosecond laser gas light wires based on the laser repetition frequency of more than 100Hz, such as the application of femtosecond light wire micromachining and imaging, ultra-short pulse compression and ultra-continuous spectrum generation, terahertz and harmonic radiation sources, air lasers, remote atmosphere detection, air lasers, manual lightning initiation and the like, the pointing stability of the light wires is improved, and the precision, resolution and the like of related applications are improved.
The technical scheme of the invention is as follows:
the utility model provides a detect device of directional stability of high repetition frequency ultrafast laser light silk which characterized in that includes: the laser comprises an ultrafast laser, a ceramic wafer, a microscope and a focusing lens arranged along the laser emitting direction of the ultrafast laser;
the laser emitted by the ultrafast laser is focused by the focusing lens and then is formed into filaments in gas, and the ceramic sheet is placed in a filament forming area for ablation to form an ablation pattern;
the microscope is used for observing the ablation pattern, and when the area of the ablation pattern is larger, the pointing stability of the ultrafast laser filament is poorer, so that the pointing stability of the ultrafast laser filament is calibrated.
The utility model provides a promote device of directional stability of high repetition frequency ultrafast laser light silk which characterized in that includes: the laser comprises an ultrafast laser, a ceramic wafer, a microscope, a metal electrode connected with a high-voltage power supply and a focusing lens arranged along the laser emitting direction of the ultrafast laser;
the laser emitted by the ultrafast laser is focused by the focusing lens and then is formed into filaments in gas, and the ceramic sheet is placed in a filament forming area for ablation to form an ablation pattern;
the metal electrode is close to the wire forming area, the electrostatic field at the metal electrode is changed by changing the voltage of the high-voltage power supply, and the ceramic plate is replaced once when the voltage value is changed once;
the microscope is used for observing the ablation pattern, and when the area of the ablation pattern is larger, the laser light wire pointing stability is poorer, so that the ultrafast laser wire forming pointing stability is calibrated.
Preferably, the metal electrode is fixed at one end of the insulating component, and the other end of the insulating component is fixed on a grounded working platform.
The insulation assembly is formed by connecting an insulation support and an insulation plastic rod, and the metal electrode is fixed on the insulation support.
Preferably, the pulse width of the ultrafast laser is in the order of fs to ps, and the repetition frequency is>100Hz, generating laser pulsesThe peak power is greater than the self-focusing filamentation critical power P of laser pulse in the gas environment cr (P cr =3.77λ 2 /8πn 2 n 0 Lambda is the laser pulse center wavelength, n 0 And n 2 Linear index of refraction and kerr nonlinear index of refraction in air, respectively).
Preferably, the ultrafast laser is a titanium sapphire ultrafast laser, yb doped 3+ All-solid-state ultrafast lasers, fiber ultrafast lasers, and the like.
8. The device for improving the pointing stability of the high-frequency ultrafast laser light wire according to claim 3, wherein the metal electrode comprises a tip electrode, a linear array of tip metal electrodes and a wedge-shaped metal electrode, and the static external electric field is generated by connecting the metal electrode with a high-voltage power supply, and the external electric field is loaded on the ultrafast laser light wire.
Preferably, the ceramic plate is made of insulating materials such as silicon nitride, silicon carbide ceramic plate and the like, the diameter of the effective action range is larger than a plurality of millimeters, and the thickness is in the order of millimeters.
Preferably, the microscope resolution is 0.001mm.
The method for improving and measuring the pointing stability of the high-repetition-frequency ultrafast laser light wire is characterized by comprising the following steps of:
(1) Ultra-fast laser pulses with the repetition frequency of more than 100Hz emitted by the ultra-fast laser are focused by a focusing lens and are formed into filaments in gas, so that ultra-fast laser filaments are generated;
(2) Inserting a ceramic plate into the optical fiber, enabling a certain number of super laser optical fibers to ablate the ceramic plate, shooting an ablation pattern on the ceramic plate by using a microscope, and calibrating the ultra-fast laser fiber forming directional stability according to the fact that the larger the ablation area is, the worse the ultra-fast laser optical fiber directional stability is;
(3) The metal electrode connected with the high-voltage power supply is close to the ultrafast laser light wire, the electrostatic field at the metal electrode is changed by adjusting the voltage of the high-voltage power supply, a new ceramic plate is replaced every time the voltage value is changed, the same laser pulse number of each ceramic plate ablation is ensured, and the pointing stability of the light wire under different external electric fields is measured.
Further, the method also comprises the steps of:
(4) The voltage of the high-voltage power supply is fixed, the repetition frequency of the output laser pulse of the ultrafast laser is regulated, so that laser light wires with different repetition frequencies ablate the ceramic wafer, the same ablation pulse number is ensured, and the pointing stability of the ultrafast laser light wires can be measured under different repetition frequencies without or with an external electric field.
Compared with the prior art, the invention has the advantages that:
in the prior art, the wavefront modulation depending on the pumping light beam has a complex light path, is limited by conditions such as laser energy, material damage threshold and the like, cannot inhibit disturbance caused by the self thermal effect of the high-repetition-frequency laser light wire, has very limited effect of improving the pointing stability of the high-repetition-frequency laser light wire, and cannot realize long-distance stable transmission of the high-energy high-repetition-frequency laser gas light wire.
The light path is simple, implementation is convenient, the guiding effect of the laser plasma on the subsequent pulse of the high repetition frequency laser is utilized based on the strong coupling effect between the external electric field and the plasma in the ultra-fast laser light wire, the pointing stability of the high repetition frequency laser light wire can be obviously improved, and the requirement on the intensity of the external electric field is lower. Due to the variability of the electrode shape and the light path, the coupling efficiency of the external electric field and the light wire can be increased, so that the pointing stability of the light wire is further improved. Meanwhile, the ultra-fast laser light wire with high energy and high repetition frequency, which is stably transmitted in any dimension, can be realized as the ultra-fast laser light wire is not limited by a medium damage threshold. The method has great significance for the application of ultra-fast femtosecond laser gas light wires based on laser repetition frequency, such as the application of femtosecond light wire micromachining and imaging, ultra-short pulse compression and supercontinuum spectrum generation, terahertz and harmonic radiation source, air laser, remote atmosphere detection, air laser, artificial lightning initiation and the like, the pointing stability of the light wires is improved, and the precision, resolution and the like of related applications are improved.
The experimental device and the light path are quite simple, and after improvement, the experimental device and the light path have wider application prospect.
Drawings
FIG. 1 is a schematic diagram of a device for improving and measuring the pointing stability of a high-frequency ultrafast laser beam;
FIG. 2 shows the pattern ablated by the ultrafast laser beam in example 1 of the present invention, with a repetition rate of 1kHz, a pulse width of 32fs, a pulse energy of 3.4mJ, and an ablation area of about 3.5X18, with the number of pulses 3500 -3 mm 2 The picture is taken by a microscope;
FIG. 3 shows that in example 1 of the present invention, the ultrafast laser has a repetition rate of 1kHz, a pulse width of 32fs, a pulse energy of 3.4mJ, and a high voltage power supply of 5kV (electric field 6X 8) 6 V/m), the pattern ablated by the ceramic ultra-fast laser filament has 3500 pulses and an ablation area of about 3 x 8 -3 mm 2 The picture was taken with a microscope.
Detailed Description
The present invention will be described in detail with reference to the following examples and the accompanying drawings, but should not be construed to limit the scope of the invention:
example 1
As shown in FIG. 1, the invention provides a device for improving and measuring the pointing stability of a high-frequency ultra-fast laser light wire, which comprises an ultra-fast laser 1, a focusing lens 2, a metal electrode 3, a high-voltage power supply 9, a ceramic wafer 6 and a microscope 10;
the metal electrode 3 is arranged on the insulating converter 4 and fixedly connected with one end of the insulating plastic screw rod 5, the other end of the insulating plastic screw rod 5 is fixed on a grounded workbench, and the metal electrode 3 is connected with the high-voltage power supply 9 through a high-voltage cable;
after being focused by the focusing lens 2, the laser emitted by the titanium precious stone laser 1 is formed into wires in gas, the ceramic plate 6 is arranged in the wire forming area for ablation to form an ablation pattern, the ceramic plate 6 is fixed on the insulating support 7 and connected with the insulating plastic rod 8, and the other end of the insulating plastic rod 8 is fixed on a grounded workbench. The morphology of the ceramic wafer 6 after ultra-fast laser filament ablation was observed and recorded using a microscope 10.
The method for improving and measuring the pointing stability of the femtosecond laser light wire comprises the following specific steps:
firstly, regulating the repetition frequency of a titanium sapphire laser to be 1kHz, the pulse width to be 32fs, the energy to be 3.4mJ, passing laser pulses through a focusing lens with the focal length of 50cm, forming femtosecond laser light wires near the tip of a metal electrode, and enabling the distance between the tip of the electrode and the light wires to be about 1mm;
secondly, suspending the incidence of laser, fixing a ceramic plate on an insulating bracket and connecting the ceramic plate with an insulating plastic rod, fixing the other end of the insulating plastic rod on a workbench, and placing the ceramic plate at the tail end of a light wire;
then when the high-voltage power supply shows that the number is 0kV, the titanium precious stone laser is operated, so that a light wire is beaten on a ceramic sheet, and the incident laser is stopped again after 3500 pulses are accumulated;
the ceramic wafer was then removed and the ablated ceramic morphology was measured and recorded using a microscope, as shown in figure 2. The larger the ablation area is, the poorer the pointing stability of the ultrafast laser light wire is;
then, according to the steps, the voltage value of the high-voltage power supply is regulated to 0kV, 1kV, 2kV, 3kV, 4kV, 5kV, 3.5kV, 8kV, 9.5kV, 15kV, 13.5kV, 20kV, 25kV, 30kV, 35kV, 40kV, 45kV and 50kV, under each high-voltage condition, the pulse number of fixed laser is 3500, ceramic plates are respectively ablated, and a microscope is used for shooting, so that the pointing stability of the femtosecond laser light wire can be improved under different external electric fields;
secondly, when the indication numbers of the fixed high-voltage power supply are 0kV and 50kV, the laser repetition frequencies of 50Hz, 100Hz, 200Hz, 300Hz, 500Hz and 800Hz are changed, the fixed laser pulse number is 3500, the ablation areas of the ceramic plates are respectively measured, and the improvement effect of an external electric field on the directional stability of the femtosecond laser light wire can be obtained when the repetition frequencies are different;
after that, the repetition frequency of the fixed laser is 1kHz, the indication number of the high-voltage power supply is 5kV, the laser pulse energy is changed to 3mJ, 4mJ, 5mJ, 6mJ, 3mJ and 6mJ, the fixed laser pulse number is 3500, the ablation area of the ceramic plate is measured respectively, and the ultrafast laser light wire with different energy for stable transmission can be obtained.
Experiments show that the invention successfully utilizes an external electric field for the first time to improve and promote the pointing stability of the high repetition frequency optical fiber. The invention improves the pointing stability of the ultra-fast laser light wire by utilizing the guiding effect of the laser plasma on the subsequent pulse of the high-repetition-frequency laser based on the strong coupling effect between the external electric field and the plasma in the ultra-fast laser light wire. The high-repetition-frequency ultrafast laser light wire capable of realizing stable transmission under different conditions is simple and effective in experimental device and experimental method.
Claims (10)
1. Device for improving pointing stability of high-repetition-frequency ultrafast laser light wire, which is characterized by comprising: the laser comprises an ultrafast laser (1), a ceramic wafer (6), a microscope (10), a metal electrode (3) connected with a high-voltage power supply (9), and a focusing lens (2) arranged along the laser emitting direction of the ultrafast laser (1);
the laser emitted by the ultrafast laser (1) is focused by the focusing lens (2) and then is formed into filaments in gas, and the ceramic sheet (6) is arranged in a filament forming area for ablation to form an ablation pattern;
the metal electrode (3) is close to the wire forming area, and under the action of an external electric field, the recombination process of electrons and ions in the ultra-fast laser gas wire is inhibited, so that the thermal effect of the high-repetition-frequency laser gas wire is weakened; the electrified metal electrode tip has coulomb force effect on the optical fiber plasma channel, so that the pointing stability is improved; the electrostatic field at the electrode of the electrode (3) is changed by changing the voltage of the high-voltage power supply (9), and the ceramic piece is replaced once when the voltage value is changed once;
the microscope (10) is used for observing the ablation pattern, and when the area of the ablation pattern is larger, the pointing stability of the ultrafast laser light wire is poorer, so that the pointing stability of the ultrafast laser light wire is calibrated.
2. The device for improving the pointing stability of the high-frequency ultrafast laser light wire according to claim 1, further comprising an insulating component, wherein the metal electrode (3) is fixed at one end of the insulating component, and the other end of the insulating component is fixed on a grounded working platform.
3. The device for improving the pointing stability of the high-frequency ultrafast laser light wire according to claim 1, wherein the insulating assembly is formed by connecting an insulating bracket (4) with an insulating plastic rod (5), and the metal electrode (3) is fixed on the insulating bracket (4).
4. The device for improving the pointing stability of the high-frequency ultrafast laser light wire according to claim 1, wherein the pulse width of the ultrafast laser (1) is in the order of fs to ps, and the repetition frequency is the same as that of the ultrafast laser light wire>100Hz, the peak power of the generated laser pulse is greater than the self-focusing filament forming critical power P of the laser pulse in the gas environment cr (P cr =3.77λ 2 /8πn 2 n 0 Lambda is the laser pulse center wavelength, n 0 And n 2 Linear index of refraction and kerr nonlinear index of refraction in air, respectively).
5. The device for improving the pointing stability of the high-frequency ultra-fast laser light wire according to claim 4, wherein the ultra-fast laser (1) is a titanium sapphire ultra-fast laser doped with Yb 3+ All-solid-state ultrafast lasers, fiber ultrafast lasers, and the like.
6. The device for improving the pointing stability of the high-frequency ultrafast laser light wire according to claim 1, wherein the metal electrode (5) comprises a tip electrode, a linear array of tip metal electrodes and a wedge-shaped metal electrode, and a static external electric field is generated by being connected with a high-voltage power supply (9) and is applied to the ultrafast laser light wire.
7. The device for improving the pointing stability of the high-frequency ultrafast laser light wire according to claim 1, wherein the ceramic plate (6) is made of insulating materials such as silicon nitride, silicon carbide ceramic plates and the like, and the effective action range is larger than a few millimeters in diameter and is in the order of millimeters in thickness.
8. The device for improving the pointing stability of the high-frequency ultrafast laser light wire according to claim 1, wherein the resolution of the microscope (10) is 0.001mm.
9. A method for improving and measuring the pointing stability of a high-repetition-frequency ultrafast laser light wire is characterized by comprising the following steps:
(1) Ultra-fast laser pulses with the repetition frequency of more than 100Hz emitted by the ultra-fast laser are focused by a focusing lens and are formed into filaments in gas, so that ultra-fast laser filaments are generated;
(2) Inserting a ceramic plate into a light wire, enabling a certain number of super laser light wires to ablate the ceramic plate, shooting an ablation pattern on the ceramic plate by using a microscope, and calibrating the ultra-fast laser wire forming directional stability according to the fact that the larger the ablation area is, the worse the directional stability of the laser light wires is;
(3) The metal electrode connected with the high-voltage power supply is close to the ultrafast laser light wire, the electrostatic field at the metal electrode is changed by adjusting the voltage of the high-voltage power supply, a new ceramic plate is replaced every time the voltage value is changed, the same laser pulse number of each ceramic plate ablation is ensured, and the pointing stability of the light wire under different external electric fields is measured.
10. The method for improving and measuring the pointing stability of a high-repetition-rate ultrafast laser light filament of claim 9, further comprising the steps of:
(4) The voltage of the high-voltage power supply is fixed, the repetition frequency of the output laser pulse of the ultrafast laser is regulated, so that laser light wires with different repetition frequencies ablate the ceramic wafer, the same ablation pulse number is ensured, and the pointing stability of the ultrafast laser light wires can be measured under different repetition frequencies without or with an external electric field.
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