CN112445357A - Calibration method, calibration device and storage medium - Google Patents
Calibration method, calibration device and storage medium Download PDFInfo
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- CN112445357A CN112445357A CN201910802756.0A CN201910802756A CN112445357A CN 112445357 A CN112445357 A CN 112445357A CN 201910802756 A CN201910802756 A CN 201910802756A CN 112445357 A CN112445357 A CN 112445357A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0414—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means using force sensing means to determine a position
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
- G06F3/0418—Control or interface arrangements specially adapted for digitisers for error correction or compensation, e.g. based on parallax, calibration or alignment
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Abstract
The application provides a calibration method, a calibration device and a storage medium, wherein the calibration method comprises the following steps: acquiring original force values detected after the same acting force is applied to a plurality of target points of a plurality of surfaces to be calibrated, wherein the plurality of surfaces to be calibrated are surfaces to be calibrated on a plurality of devices to be calibrated, and each surface to be calibrated comprises a plurality of target points; determining a calibration model according to the original force values of a plurality of target points of the plurality of surfaces to be calibrated; and calibrating the equipment to be calibrated according to the calibration model and the acting force. According to the scheme provided by the embodiment, the equipment to be calibrated is calibrated, so that the equipment to be calibrated can accurately detect the force.
Description
Technical Field
The present disclosure relates to electronic technologies, and more particularly, to a calibration method, an apparatus and a storage medium.
Background
Conventional electronic devices, such as notebook computers, are provided with input devices such as touch pads. Since electronic devices are frequently used, high demands are placed on input devices of the electronic devices. When the electronic device is shipped from a factory, the performance of the touch pad is often tested, for example, whether the touch pad is sensitive or effective is tested.
Disclosure of Invention
The application provides a calibration method, a calibration device and a storage medium.
At least one embodiment of the present application provides a calibration method, including:
acquiring original force values detected after the same acting force is applied to a plurality of target points of a plurality of surfaces to be calibrated, wherein the plurality of surfaces to be calibrated are surfaces to be calibrated on a plurality of devices to be calibrated, and each surface to be calibrated comprises a plurality of target points;
determining a calibration model according to the original force values of a plurality of target points of the plurality of surfaces to be calibrated;
and calibrating the equipment to be calibrated according to the calibration model and the acting force.
In an embodiment, the target points are grid points formed by dividing the surface to be calibrated according to rows and columns.
In an embodiment, the determining a calibration model according to the raw force values of the target points of the surfaces to be calibrated includes:
determining a surface to be calibrated of which the original force value meets a first preset condition, and determining a calibration model according to the original force values of a plurality of target points of each surface to be calibrated meeting the first preset condition.
In an embodiment, the surface to be calibrated whose original force value satisfies the first preset condition includes at least one of:
the original force value of the target point of the surface to be calibrated is in a first preset range;
and the curvature of a curve formed by the original force values of the target points of the surface to be calibrated according to a preset sequence is in a second preset range.
In an embodiment, determining the calibration model according to the original force values of the target points of each surface to be calibrated that satisfy the first preset condition includes:
for any target point, obtaining the force value of the target point in the calibration model according to the average value of the original force values of the target point of each surface to be calibrated meeting the first preset condition; or
Generating a curve or a curved surface according to the original force value of each target point of the surface to be calibrated meeting the first preset condition in a preset sequence, fitting the generated curves or curved surfaces to obtain a calibration curve or a calibration curved surface, and generating the calibration model based on the calibration curve or the calibration curved surface.
In an embodiment, the calibrating the device to be calibrated according to the calibration model and the acting force includes:
and calculating a calibration coefficient coe, which is F/force, for any target point, where F is the acting force, and force is a force value of the target point in the calibration model, determining calibration coefficients of other points on the surface to be calibrated except the target point by interpolation, and sending the calibration coefficients to the device to be calibrated.
In an embodiment, the method further comprises:
acquiring a calibrated force value after the acting force is applied to a plurality of test points of the surface to be calibrated for the surface to be calibrated of each device to be calibrated, and when the calibrated force value of the test point meets a second preset condition, the device to be calibrated passes calibration, wherein the calibrated force value of one test point is the product of the original force value detected at the test point and the calibration coefficient of the test point;
when a first device to be calibrated exists and the calibrated force value of the test point of the first device to be calibrated does not meet a second preset condition, acquiring an original force value detected after the same acting force is applied to part or all of the target points of the first device to be calibrated, determining a corrected calibration model suitable for the first device to be calibrated according to the original force value detected after the same acting force is applied to part or all of the target points of the first device to be calibrated, and calibrating the first device to be calibrated according to the corrected calibration model.
In an embodiment, determining a corrected calibration model applicable to the first device to be calibrated according to the original force values detected after the same force is applied to the part of the target points of the first device to be calibrated includes:
the calibration model is an H multiplied by L matrix a, and the part of target points are target points formed by H rows and L columns in H multiplied by L grid points;
corrected calibration model B ═ W1·C+W2G, wherein said W1、W2Is a weight factor, and W1、W2The matrix C is an H multiplied by L matrix obtained by interpolating a force value matrix B, and the force value matrix B is an H multiplied by L matrix formed by original force values detected after the same acting force is applied to part of target points of the first equipment to be calibrated;
the matrix G satisfies: gij＝Rij·Cij,i＝1,...,H,j＝1,...,L，RijIs the value of the ith row, jth column, C of the matrix RijThe matrix R is an H multiplied by L matrix obtained by interpolation of an H multiplied by L ratio matrix which is the value of the ith row and the jth column of the matrix C, and the H multiplied by L ratio matrix is generated by dividing each force value in the matrix b by the force value corresponding to the same target point in the matrix a.
In an embodiment, the surfaces to be calibrated are touch surfaces on a plurality of touch devices in the same batch.
At least one embodiment of the present invention provides a calibration apparatus, including a memory and a processor, where the memory stores a program, and the program, when read and executed by the processor, implements the calibration method according to any one of the embodiments.
At least one embodiment of the invention provides a computer-readable storage medium storing one or more programs, the one or more programs being executable by one or more processors to implement the calibration method of any of the embodiments.
Compared with the related art, an embodiment of the present application includes a calibration method, which obtains an original force value detected after applying the same acting force to a plurality of target points of a plurality of surfaces to be calibrated, where the plurality of surfaces to be calibrated are surfaces to be calibrated on a plurality of devices to be calibrated, and each surface to be calibrated includes a plurality of target points; determining a calibration model according to the original force values of a plurality of target points of the plurality of surfaces to be calibrated; and calibrating the equipment to be calibrated according to the calibration model and the acting force. The scheme that this embodiment provided can treat calibration equipment and calibrate for treat that calibration equipment can accurate detection dynamics.
Additional features and advantages of the application will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by the practice of the application. Other advantages of the application may be realized and attained by the instrumentalities and combinations particularly pointed out in the specification, claims, and drawings.
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The accompanying drawings are included to provide an understanding of the present disclosure and are incorporated in and constitute a part of this specification, illustrate embodiments of the disclosure and together with the examples serve to explain the principles of the disclosure and not to limit the disclosure.
FIG. 1 is a flowchart of a calibration method according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a target point according to an embodiment of the present invention;
FIG. 3 is a flowchart of a calibration method according to another embodiment of the present application;
FIG. 4 is a schematic diagram of a correction point according to an embodiment of the present invention;
FIG. 5 is a block diagram of a calibration apparatus according to an embodiment of the present application;
fig. 6 is a block diagram of a computer-readable storage medium provided in an embodiment of the present application.
Detailed Description
The present application describes embodiments, but the description is illustrative rather than limiting and it will be apparent to those of ordinary skill in the art that many more embodiments and implementations are possible within the scope of the embodiments described herein. Although many possible combinations of features are shown in the drawings and discussed in the detailed description, many other combinations of the disclosed features are possible. Any feature or element of any embodiment may be used in combination with or instead of any other feature or element in any other embodiment, unless expressly limited otherwise.
The present application includes and contemplates combinations of features and elements known to those of ordinary skill in the art. The embodiments, features and elements disclosed in this application may also be combined with any conventional features or elements to form a unique inventive concept as defined by the claims. Any feature or element of any embodiment may also be combined with features or elements from other inventive aspects to form yet another unique inventive aspect, as defined by the claims. Thus, it should be understood that any of the features shown and/or discussed in this application may be implemented alone or in any suitable combination. Accordingly, the embodiments are not limited except as by the appended claims and their equivalents. Furthermore, various modifications and changes may be made within the scope of the appended claims.
Further, in describing representative embodiments, the specification may have presented the method and/or process as a particular sequence of steps. However, to the extent that the method or process does not rely on the particular order of steps set forth herein, the method or process should not be limited to the particular sequence of steps described. Other orders of steps are possible as will be understood by those of ordinary skill in the art. Therefore, the particular order of the steps set forth in the specification should not be construed as limitations on the claims. Further, the claims directed to the method and/or process should not be limited to the performance of their steps in the order written, and one skilled in the art can readily appreciate that the sequences may be varied and still remain within the spirit and scope of the embodiments of the present application.
In this application, the function of extension touch-control board through increasing elastic wave sensor, realizes that the dynamics detects. The elastic wave sensor can detect an elastic wave signal generated by the collision of an object, and can be a piezoelectric ceramic sensor, a piezoelectric film sensor, a piezoelectric crystal sensor or other sensors with piezoelectric effect. When an external force is applied to the touch pad, a force value is output, but when the same force is applied to different positions of the touch pad, different force values may be detected, and thus, it is necessary to calibrate the touch pad.
As shown in fig. 1, an embodiment of the present invention provides a calibration method, including:
the device to be calibrated may be, for example, a standalone touch pad, or may be a device including a touch pad, such as a notebook computer. The plurality of devices to be calibrated are the same device. For example, the surfaces to be calibrated are touch surfaces on multiple touch devices in the same batch, but may also be touch surfaces on multiple touch devices in the same model without limiting the batch.
The surface to be calibrated may be, for example, the front surface of the touch pad receiving the touch of the user, or may be a plane or a curved surface of any fixed structure.
The target points are a plurality of points on the surface to be calibrated for calibration, and can be selected as required. In an embodiment, the target points are grid points formed by dividing the surface to be calibrated according to rows and columns. As shown in fig. 2, a plurality of target points 21 are present on the surface to be calibrated 20. When dividing, the two rows can be divided evenly, that is, the distance between two adjacent rows is the same, and the distance between two adjacent columns is the same. In another embodiment, the target points are arranged radially with respect to the surface to be calibrated as the center, i.e., the target points are located on each circle with respect to the center of the surface to be calibrated as the center. It should be noted that the selection of the target point is not limited to this, and the target point may be selected in other manners as needed.
Assuming that there are M target points, M raw force values are collected on each device to be calibrated. The raw force values are force values that were not calibrated.
A plurality of elastic wave sensor detects the elastic wave signal that produces when treating the calibration face by the contact collision to convert into corresponding signal of telecommunication, the signal of telecommunication passes through corresponding hardware circuit and converts into the dynamics signal, obtains original strength value promptly according to the dynamics signal. The size of the original force value is influenced by the material of the surface to be calibrated and the installation position of the elastic wave sensor. The different positions of the surface to be calibrated are pressed with the same force, and the intensity of the elastic wave signals received by the elastic wave sensor is different. The method can use a pointing device of a calibration test device to click (called pointing) a target point of a surface to be calibrated, and acquire an original force value of the whole surface to be calibrated in a pointing mode of the surface to be calibrated. The elastic wave sensor detects an elastic wave signal, converts the elastic wave signal into a voltage signal, transmits the voltage signal to the processor, and the processor calculates the original force value of each target point according to the voltage signal.
102, determining a calibration model according to original force values of a plurality of target points of the plurality of surfaces to be calibrated;
the calibration model comprises a plurality of force values, and the force values correspond to the target points one by one.
According to the scheme provided by the embodiment, the equipment to be calibrated is calibrated, so that the equipment to be calibrated can accurately detect the force.
In one embodiment, determining the calibration model according to the raw force values of the target points of the surfaces to be calibrated includes:
determining a surface to be calibrated of which the original force value meets a first preset condition, and determining a calibration model according to the original force values of a plurality of target points of each surface to be calibrated meeting the first preset condition. Namely, only the data meeting the first preset condition in the collected original force values are used for determining the calibration model. This step is to remove outlier data in the raw force values collected.
In an embodiment, the surface to be calibrated whose original force value satisfies the first preset condition includes at least one of:
the original force value of the target point of the surface to be calibrated is in a first preset range;
and the curvature of a curve or a curved surface formed by the original force values of the target points of the surface to be calibrated according to a preset sequence is positioned in a second preset range.
For example, the target points are numbered, the number of the target points is taken as the x coordinate of the planar rectangular coordinate system, and the original force value of the target points is taken as the y coordinate, so that each target point corresponds to one point of the planar rectangular coordinate system, and the points are connected into a curve according to a preset sequence. Or, taking the position of the target point as an x coordinate and a y coordinate in a rectangular spatial coordinate system, taking the original force value as a z coordinate, and connecting the points into a curve or a curved surface according to a preset sequence, where it is to be noted that the preset sequence may be set as required, but the target points of the surfaces to be calibrated generate the curve or the curved surface according to the same sequence. The predetermined order is, for example, the number size of the target points.
The first preset range and the second preset range can be determined according to an actual test result. The solution eliminates outliers in the acquired raw force values. It should be noted that the first preset condition is only an example, and the abnormal data may be eliminated in other ways.
In an embodiment, determining the calibration model according to the original force values of the target points of each surface to be calibrated that satisfy the first preset condition includes:
for any target point, obtaining the force value of the target point in the calibration model according to the average value of the original force values of the target point of each surface to be calibrated meeting the first preset condition; the calibration model may be a matrix in which each value represents a corresponding force value for a target point. Of course, the calibration model may also be a vector, for example, number the target points, list the force values of the target points in the order of the number, and so on.
Or generating a curve or a curved surface according to the original force value of each target point of the surface to be calibrated meeting the first preset condition in a preset sequence, fitting the generated curves or curved surfaces to obtain a calibration curve or a calibration curved surface, and generating the calibration model based on the calibration curve or the calibration curved surface.
In an embodiment, the calibrating the device to be calibrated according to the calibration model and the acting force includes:
calculating a calibration coefficient coe, which is F/force, for any target point, where F is the acting force, and force is a force value of the target point in the calibration model, determining calibration coefficients of other points on the surface to be calibrated except the target point by interpolation, and sending the calibration coefficients to the device to be calibrated; in one embodiment, the interpolation method is, for example, bilinear interpolation.
And acquiring the calibrated force values after the acting force is applied to the plurality of test points of the surface to be calibrated for the surface to be calibrated of each device to be calibrated, and when the calibrated force values of the test points meet a second preset condition, the device to be calibrated passes the calibration, wherein the calibrated force value of one test point is the product of the original force value detected at the test point and the calibration coefficient of the test point. And outputting the calibrated force value by the equipment to be calibrated.
In an embodiment, when a first device to be calibrated exists and the calibrated force value of the test point of the first device to be calibrated does not satisfy a second preset condition, an original force value detected after the same acting force is applied to part or all of the target points of the first device to be calibrated is obtained, and a calibration model suitable for the first device to be calibrated is determined according to the original force value detected after the same acting force is applied to part or all of the target points of the first device to be calibrated. I.e. the device to be calibrated which fails the test, needs to be corrected for its calibration model. The correction method has various types, and the calibration model can be corrected by acquiring the original force values of all the target points again, or by acquiring the original force values of only part of the target points.
In an embodiment, determining a corrected calibration model applicable to the first device to be calibrated from the original force values detected after the same force is applied to the part of the target points of the first device to be calibrated includes:
the calibration model is an H multiplied by L matrix a, and the part of target points are target points formed by H rows and L columns in H multiplied by L grid points;
the corrected calibration model B ═ W1·C+W2G, wherein said W1、W2Is a weight factor, and W1、W2The value of (a) is such that the calibration is passed when the first device to be calibrated is calibrated by using the corrected calibration model B, the matrix C is an H multiplied by L matrix obtained by interpolating a strength value matrix B, andthe force value matrix b is an h multiplied by l matrix formed by original force values detected after the same acting force is applied to part of target points of the first equipment to be calibrated;
the matrix G satisfies: gij＝Rij·Cij,i＝1,...,H,j＝1,...,L，RijIs the value of the ith row, jth column, C of the matrix RijThe matrix R is an H multiplied by L matrix obtained by interpolation of an H multiplied by L ratio matrix which is the value of the ith row and the jth column of the matrix C, and the H multiplied by L ratio matrix is generated by dividing each force value in the matrix b by the force value corresponding to the same target point in the matrix a.
Examples are as follows:
assuming that the surface to be calibrated is divided into H × L grids, when the calibration is performed, some rows and some columns arranged in rows and columns in the H × L grids are selected to form an H × L mesh structure, a corresponding force value matrix of the H × L mesh structure is represented as b, and a force value matrix of the calibration model A is represented as a.
And interpolating the matrix b to obtain H multiplied by L force values, wherein the matrix is represented as C, and the interpolation method can adopt bilinear interpolation, cubic interpolation or bicubic spline interpolation.
Calculating a ratio matrix S of hxl
Wherein, f'ijAnd fIJCorresponding to the same target point, SijIs the value of the ith row and jth column of the ratio matrix S.
Interpolating the comparison value matrix S to obtain an H multiplied by L ratio matrix R, wherein during interpolation, the same row of the comparison value matrix S is interpolated to obtain 1 multiplied by L ratio values to obtain L rowsAnd interpolating two adjacent lines to obtain a ratio value corresponding to a target point between the two lines, so as to obtain a ratio matrix R. For example, the first row of the matrix S of values is interpolated to obtain d1Interpolating the second row of the matrix S to obtain d2Can use (w)1·d1+w2·d2) The ratio values of the other rows between the first row and the second row are obtained. And multiplying the elements of the matrix R with the elements of the corresponding position of the matrix C to obtain the elements of the corresponding position of the matrix G. w ═ w1 w2]Is a weighting factor.
The interpolation method can be linear interpolation, cubic polynomial interpolation or cubic spline interpolation. And only collecting the original force values of part of target points during correction, so that the time for calibration can be shortened, and the efficiency is improved.
The application is further illustrated by the following specific example.
As shown in fig. 3, an embodiment of the present invention provides a calibration method, including:
In this embodiment, the M point is 10 × 9 — 90 points, as shown in fig. 2. The target points are 10 x 9 grid points.
In collecting raw force data, the same force F may be applied to each target point.
The force curve refers to a curve formed by a force value vector formed by the original force values of the corresponding target points in a certain sequence in step 301, for example, the positions of the target points are taken as x and y coordinates in a spatial rectangular coordinate system, the original force values are taken as z coordinates, each target point corresponds to one point in a three-dimensional coordinate system, the points are connected into a curve or a curved surface according to a preset sequence, it should be noted that the preset sequence can be set as required, but the target points of each surface to be calibrated generate a curve or a curved surface according to the same sequence. The smoothness of the force curve can be evaluated by using the curvature as an evaluation index. The target points can also be numbered, the number of the target points is taken as the x coordinate of the plane rectangular coordinate system, the original force value of the target points is taken as the y coordinate, so that each target point corresponds to one point of the plane rectangular coordinate system, and the points are connected into a curve according to a preset sequence. The order may be set as needed, but the target points of the respective surfaces to be calibrated generate curves in the same order.
The calibration model A comprises a plurality of force values which are in one-to-one correspondence with the target points. In this embodiment, the calibration model a is a matrix a, and the corresponding force values of the target point in the ith row and the target point in the ith column of the calibration model a are the values of the ith row and the jth column in the matrix a.
In this embodiment, before the calibration model a is generated, data is cleaned, abnormal data caused by external equipment or other interference is removed, at least one of the curvature and the force value of the target point may be used as a determination standard, if the curvature exceeds a certain range relative to normal data, or the force value exceeds a certain range, the data is considered as abnormal data, and if the abnormal data is greater than a preset ratio, step 301 is repeated.
And averaging the cleaned data to corresponding target points of the plurality of calibration surfaces to serve as force values of the target points to generate a calibration model A, or performing curve or surface fitting to generate a calibration curve or a calibration surface, and generating the calibration model A based on the calibration curve or the calibration surface. The fitting method can refer to a general fitting algorithm, and is not described herein again.
In addition, when the target points are radially distributed on the surface to be calibrated, the characteristic values can also include the force change of the target points at the same angle, for the omnidirectional force sensor, when the distance between the target points and the sensor is approximately equal in an isotropic or quasi-isotropic structure, the force values are equal, the force values are divided according to polar coordinates at the same angle, and then the force value of the whole surface to be calibrated can be obtained.
And 304, calibrating the equipment to be calibrated by taking the calibration model A as a basis to achieve the effect of force balance.
Specifically, the method comprises the following steps: and calculating a calibration coefficient of each target point, wherein for any target point, the calibration coefficient coe is F/force, the force refers to a force value corresponding to the target point in the calibration model a, and F is the acting force applied in step 301. And (4) solving the force coefficients of other points on the surface to be calibrated except the target point by interpolation calculation, and issuing the calibration coefficients to the equipment to be calibrated.
And after the calibration device obtains the calibration coefficient, multiplying the calibration coefficient by the acquired original force value to obtain a calibrated force value, and during subsequent detection, outputting the calibrated force value by the calibration device.
And applying an acting force F to any equipment to be calibrated (a received calibration coefficient) at any position (called a test point) on the surface to be calibrated, and if the difference value between the acquired calibrated force value and the target value is within the error range, determining that the equipment to be calibrated achieves force balance. In one embodiment, the error range is required to be plus or minus 0-50%. Of course, when other actual operations can be set according to needs, the error range can be set according to actual needs. In one embodiment, M1 test points may be selected for test verification, and the size of M1 is not limited.
In this embodiment, it is assumed that the target points are as shown in fig. 2, H is 10, L is 9, and there are 90 points, the correction points are as shown in fig. 4, and there are 4 points 3 and 12 points for the correction point 41.
Assuming that a surface to be calibrated is divided into 10 × 9 grids, some rows and some columns arranged in rows and columns in the 10 × 9 grids are selected as calibration point positions for force data acquisition, so as to form a 4 × 3 mesh structure, a corresponding force value matrix is represented as b, and a force matrix of the calibration model a is represented as a.
And step 306, correcting the calibration model A according to the strength value matrix B to obtain a corrected calibration model B suitable for the first equipment to be calibrated.
And interpolating the matrix b to obtain new 10 multiplied by 9 force values, wherein the matrix is represented as C, and the interpolation method can adopt bilinear interpolation, cubic interpolation or bicubic spline interpolation.
The calculation of r is carried out in such a way that,
the r is interpolated to obtain 1 × L (in this example, 1 × 9) proportional values, which are denoted as d1＝[d11 d12 … d19]。d1And c1Is multiplied by the value of the corresponding position of (e) to obtain e1＝[d11·c11 d12·c12 … d1L·c1L]＝[d11·c11 d12·c12… d19·c19]. The interpolation method for r can be linear interpolation, cubic polynomial interpolation or cubic spline interpolation.
According to the result of e1The following is calculated in a similar manner:
the matrix e is used as the 1 st, 4 th, 7 th and 10 th rows of the matrix G, and for other rows, linear operation is carried out by adopting the proportional values of two adjacent rows, and the linear operation is multiplied by the elements of the corresponding row of the matrix C. The 2 nd, 3 rd, 5 th, 6 th, 8 th, 9 th rows of the matrix G are obtained according to the adjacent rows of the rows (the adjacent rows refer to the rows in the matrix e), for example, the 2 nd row of the matrix G can use the proportion value d of the 1 st row1And the ratio value d of row 42And row 2C of matrix C2Obtaining: (w)1·d1+w2·d2)·c2Here, the vector multiplication refers to multiplication of elements at corresponding positions. For example, row 3 of the matrix G may use the scaling value d of row 11And the ratio value d of row 42And row 3C of matrix C3Obtaining: (w)1·d1+w2·d2)·c3. Different lines may use different weight values w1And w2。
Let W be [ W ]1 W2]Calculating W1·C+W2G, obtaining a corrected calibration model B. Where W is a weighting factor.
And 307, calibrating the first device to be calibrated based on the corrected calibration model B, ending if the first device to be calibrated passes the calibration, and modifying the weighting factors in the step 306 if the first device to be calibrated fails the calibration, and recalculating to obtain the corrected calibration model until the test passes the calibration.
As shown in fig. 5, based on the same inventive concept, an embodiment of the present invention provides a calibration apparatus 50, which includes a memory 510 and a processor 520, where the memory 510 stores a program, and when the program is read and executed by the processor 520, the program implements the calibration method according to any embodiment.
As shown in fig. 6, based on the same inventive concept, an embodiment of the present invention provides a computer-readable storage medium 60, where the computer-readable storage medium 60 stores one or more programs 610, and the one or more programs 610 can be executed by one or more processors to implement the calibration method according to any embodiment. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, Digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can accessed by a computer.
It will be understood by those of ordinary skill in the art that all or some of the steps of the methods, systems, functional modules/units in the devices disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. In a hardware implementation, the division between functional modules/units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component may have multiple functions, or one function or step may be performed by several physical components in cooperation. Some or all of the components may be implemented as software executed by a processor, such as a digital signal processor or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as is well known to those of ordinary skill in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, Digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can accessed by a computer. In addition, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media as known to those skilled in the art.
Claims (11)
1. A method of calibration, comprising:
acquiring original force values detected after the same acting force is applied to a plurality of target points of a plurality of surfaces to be calibrated, wherein the plurality of surfaces to be calibrated are surfaces to be calibrated on a plurality of devices to be calibrated, and each surface to be calibrated comprises a plurality of target points;
determining a calibration model according to the original force values of a plurality of target points of the plurality of surfaces to be calibrated;
and calibrating the equipment to be calibrated according to the calibration model and the acting force.
2. The calibration method according to claim 1, wherein the target points are grid points formed by dividing the surface to be calibrated into rows and columns.
3. The calibration method according to claim 1, wherein determining the calibration model according to the raw force values of the target points of the plurality of surfaces to be calibrated comprises:
determining a surface to be calibrated of which the original force value meets a first preset condition, and determining a calibration model according to the original force values of a plurality of target points of each surface to be calibrated meeting the first preset condition.
4. The calibration method according to claim 3, wherein the surface to be calibrated whose original force value satisfies the first preset condition includes at least one of:
the original force value of the target point of the surface to be calibrated is in a first preset range;
and the curvature of a curve formed by the original force values of the target points of the surface to be calibrated according to a preset sequence is in a second preset range.
5. The calibration method according to claim 3, wherein determining the calibration model according to the original force values of the target points of each surface to be calibrated satisfying the first preset condition comprises:
for any target point, obtaining the force value of the target point in the calibration model according to the average value of the original force values of the target point of each surface to be calibrated meeting the first preset condition; or
Generating a curve or a curved surface according to the original force value of each target point of the surface to be calibrated meeting the first preset condition in a preset sequence, fitting the generated curves or curved surfaces to obtain a calibration curve or a calibration curved surface, and generating the calibration model based on the calibration curve or the calibration curved surface.
6. The calibration method according to any one of claims 1 to 5, wherein the calibrating the device to be calibrated according to the calibration model and the applied force comprises:
and calculating a calibration coefficient coe, which is F/force, for any target point, where F is the acting force, and force is a force value of the target point in the calibration model, determining calibration coefficients of other points on the surface to be calibrated except the target point by interpolation, and sending the calibration coefficients to the device to be calibrated.
7. The calibration method according to claim 6, wherein the method further comprises:
acquiring a calibrated force value after the acting force is applied to a plurality of test points of the surface to be calibrated for the surface to be calibrated of each device to be calibrated, and when the calibrated force value of the test point meets a second preset condition, the device to be calibrated passes calibration, wherein the calibrated force value of one test point is the product of the original force value detected at the test point and the calibration coefficient of the test point;
when a first device to be calibrated exists and the calibrated force value of the test point of the first device to be calibrated does not meet a second preset condition, acquiring an original force value detected after the same acting force is applied to part or all of the target points of the first device to be calibrated, determining a corrected calibration model suitable for the first device to be calibrated according to the original force value detected after the same acting force is applied to part or all of the target points of the first device to be calibrated, and calibrating the first device to be calibrated according to the corrected calibration model.
8. The calibration method according to claim 7, wherein determining the corrected calibration model for the first device to be calibrated based on the original force values detected after the same force is applied to the target points of the first device to be calibrated comprises:
the calibration model is an H multiplied by L matrix a, and the part of target points are target points formed by H rows and L columns in H multiplied by L grid points;
corrected calibration model B ═ W1·C+W2G, wherein said W1、W2Is a weight factor, and W1、W2The matrix C is an H multiplied by L matrix obtained by interpolating a force value matrix B, and the force value matrix B is an H multiplied by L matrix formed by original force values detected after the same acting force is applied to part of target points of the first equipment to be calibrated;
the matrix G satisfies: gij＝Rij·Cij,i＝1,...,H,j＝1,...,L，RijIs the value of the ith row, jth column, C of the matrix RijThe matrix R is an H multiplied by L matrix obtained by interpolation of an H multiplied by L ratio matrix which is the value of the ith row and the jth column of the matrix C, and the H multiplied by L ratio matrix is generated by dividing each force value in the matrix b by the force value corresponding to the same target point in the matrix a.
9. Calibration method according to any one of claims 1 to 5,
the surfaces to be calibrated are touch surfaces on a plurality of touch devices in the same batch.
10. A calibration device comprising a memory and a processor, the memory storing a program which, when read and executed by the processor, implements the calibration method of any one of claims 1 to 9.
11. A computer readable storage medium storing one or more programs, the one or more programs being executable by one or more processors to implement a calibration method according to any one of claims 1 to 9.
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| CN114964617B (en) * | 2022-05-30 | 2024-04-02 | 国家石油天然气管网集团有限公司 | Calibration method for comprehensive stress detection equipment of long oil and gas pipeline |
| CN116718220B (en) * | 2023-08-11 | 2023-10-31 | 南京中旭电子科技有限公司 | Hall sensor calibration method and system based on multidimensional data |
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