CN112344810A - Missile weapon test equipment - Google Patents
Missile weapon test equipment Download PDFInfo
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- CN112344810A CN112344810A CN202010955469.6A CN202010955469A CN112344810A CN 112344810 A CN112344810 A CN 112344810A CN 202010955469 A CN202010955469 A CN 202010955469A CN 112344810 A CN112344810 A CN 112344810A
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F42—AMMUNITION; BLASTING
- F42B—EXPLOSIVE CHARGES, e.g. FOR BLASTING, FIREWORKS, AMMUNITION
- F42B35/00—Testing or checking of ammunition
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Abstract
The embodiment of the application provides a guided missile weapon test equipment, includes: the initiating explosive device switching device is used for being connected with each initiating explosive device connector on the missile; the on-missile test switching device is used for being connected with the missile controller; the ground test switching device is used for being connected with the ground test, launch and control equipment; and the test host is respectively connected with the initiating explosive device switching device, the missile-borne test switching device and the ground test switching device through the connectors and is used for carrying out initiating explosive equivalent test, carrying out function test on the switching value or analog quantity or communication interface of the missile controller and testing the interface of the ground test, control and control equipment. The missile weapon test equipment provided by the embodiment of the application can test a plurality of test items of interfaces and time sequence signals of missile weapons, has a simple structure, and can improve the test efficiency.
Description
Technical Field
The application relates to a weapon test technology, in particular to missile weapon test equipment.
Background
The missile weapon development process needs to be strictly tested, and the ground test equipment and the equivalent test equipment are products for testing the missile-borne electrical system and are mainly responsible for communication test, time sequence test, interface test and the like of the missile-borne electrical system. With the rapid development of tactical missile weapons, miniaturization, light weight, generalization and low-cost design become main development directions. The integration level of the missile-borne electrical system is higher and higher, the functions are stronger and stronger, but the ground test equipment and the equivalent test equipment for testing the missile-borne electrical system still adopt a distributed design mode, and each single unit is responsible for production and development. The main defects of the current distributed test equipment are as follows:
1. the test equipment is of various types, and the test is complicated: the current common ground test equipment comprises an oscilloscope, a resistor array, analog quantity acquisition equipment, a ground equivalent device, a repeater and the like, the equipment types are relatively more, and the test equipment required by each test is different, so that a great amount of time is required for preparing a test environment before the test, manpower and material resources are wasted, and the test efficiency is reduced;
2. the test equipment repetition rate is high: because the testing equipment adopts a distributed design, each single unit is responsible for production and development in the traditional mode, and a set of testing equipment needs to be produced for each testing content, the repetition rate of the testing equipment is high, for example, each unit is provided with an industrial personal computer when being provided with the testing equipment, but the functions are different, so that a large amount of waste is caused, and the product cost is increased;
3. data judgment is complex, and human factors are many: the traditional test equipment is used for collecting equipment, only can store original data, cannot automatically interpret according to test items, needs manual participation to solve the data and interpret, and thus a large amount of time is spent in the test process to arrange and interpret the data, and the test efficiency is reduced.
Disclosure of Invention
In order to solve one of the technical defects, the embodiment of the application provides missile weapon testing equipment.
The embodiment of the application provides a guided missile weapon test equipment, includes:
the initiating explosive device switching device is used for being connected with each initiating explosive device connector on the missile;
the on-missile test switching device is used for being connected with the missile controller;
the ground test switching device is used for being connected with the ground test, launch and control equipment;
and the test host is respectively connected with the initiating explosive device switching device, the missile-borne test switching device and the ground test switching device through the connectors and is used for carrying out initiating explosive equivalent test, carrying out function test on the switching value or analog quantity or communication interface of the missile controller and testing the interface of the ground test, control and control equipment.
According to the technical scheme provided by the embodiment of the application, an initiating explosive device switching device connected with each initiating explosive device connector on a missile, an on-missile test switching device connected with a missile controller and a ground test switching device connected with ground test, launch and control equipment are adopted; still adopt the test host computer to link to each other with initiating explosive device switching device, test switching device on the bullet respectively, ground test switching device for carry out initiating explosive device equivalence test, carry out functional test to the switching value or the analog quantity or the communication interface of guided missile controller, test the interface of ground survey control equipment, then adopt the test equipment that this embodiment provided just can realize above various test items, just can accomplish the test task through test equipment less in quantity, shorten the time of preparation work before the test, reduce the consumption of manpower and materials, improve efficiency of software testing, reduce the cost of production and test.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a block diagram of missile weapon testing equipment provided by an embodiment of the present application;
fig. 2 is a block diagram illustrating a structure in which an initiating explosive device adaptor in the missile weapon testing equipment provided in the embodiment of the present application is connected to a testing host and an initiating explosive device connector, respectively;
FIG. 3 is a schematic structural diagram of an initiating explosive device adapter in missile weapon testing equipment provided by the embodiment of the application;
fig. 4 is a block diagram of a missile on-board test adapter device in the missile weapon test equipment provided in the embodiment of the present application, which is connected to a test host and a missile on-board controller, respectively;
FIG. 5 is a schematic structural diagram of an on-missile test adapter device in missile weapon test equipment provided in an embodiment of the present application;
FIG. 6 is a block diagram of a ground test adapter device of the missile weapon test equipment, which is connected to a test host and a ground test, launch and control device, respectively, according to an embodiment of the present disclosure;
FIG. 7 is a schematic structural diagram of a ground test adapter device in the missile weapon test equipment provided by the embodiment of the application;
FIG. 8 is a schematic structural diagram of a test host in the missile weapon test equipment provided by the embodiment of the present application;
FIG. 9 is a schematic structural diagram of the FPGA digital control board in FIG. 8;
fig. 10 is a schematic diagram of the equivalent circuit of fig. 9.
Reference numerals:
1-testing the host machine; 11-master controller board; 12-an industrial control unit; 13-a power supply unit;
2-initiating explosive device switching device; 21-initiating explosive device connector;
3-popping up the test adapter; 31-a pop-up controller;
4-testing the switching device on the ground; 41-ground measuring, sending and controlling equipment.
Detailed Description
In order to make the technical solutions and advantages of the embodiments of the present application more apparent, the following further detailed description of the exemplary embodiments of the present application with reference to the accompanying drawings makes it clear that the described embodiments are only a part of the embodiments of the present application, and are not exhaustive of all embodiments. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict.
The embodiment provides missile weapon testing equipment which is used for testing an on-missile system and a ground system of a weapon such as a missile.
Fig. 1 is a schematic structural diagram of missile weapon testing equipment provided in an embodiment of the present application. As shown in fig. 2, the missile weapon testing equipment provided by the present embodiment includes: the device comprises a test host 1, an initiating explosive device switching device 2, an on-missile test switching device 3 and a ground test switching device 4.
The initiating explosive device switching device 2 is used for being connected with each initiating explosive device connector on the missile, the on-missile testing switching device 3 is used for being connected with a missile controller, and the ground testing switching device 4 is used for being connected with ground testing, launching and controlling equipment. The initiating explosive device connectors, the missile controller and the ground measuring, launching and controlling equipment on the missile are all existing equipment, and the switching devices provided by the embodiment are correspondingly connected according to interfaces of the existing equipment. For example: in a conventional scheme, a first interface and a second interface of a missile controller are correspondingly connected with test equipment, and in this embodiment, the first interface and the second interface of the missile controller are connected with the on-missile test adapter device 3.
The test host 1 is respectively connected with the initiating explosive device switching device 2, the missile-borne test switching device 3 and the ground test switching device 4 through connectors and is used for carrying out initiating explosive equivalent test, carrying out function test on the switching value or analog quantity or communication interface of the missile controller and testing the interface of the ground test, launch and control equipment. Corresponding receiving and transmitting circuits, conversion circuits and the like are arranged in the initiating explosive device switching device 2, the on-bomb test switching device 3 and the ground test switching device 4, and the effects of interface conversion and data transmission are achieved.
The test host 1 integrates the functions of testing the initiating explosive devices, the missile controllers and the ground test, launch and control equipment, such as: the functions of the controller adopted in each test in the conventional test scheme are now integrated in the test host 1, and the functions can be realized by setting a hardware structure, an operation program and the like of the test host 1.
When the test host 1 is combined with the initiating explosive device switching device 2, the testing host is connected with each initiating explosive device connector in the popup cable, so that the initiating explosive device equivalent test can be started through the test host 1. When the test host 1 is combined with the on-board test switching device 3 and connected with the on-board controller, the function tests of the controller switching value, the analog quantity and the communication interface can be started. When the test host 1 is combined with the ground test switching device 4, the interface test of ground test issuing control can be completed.
According to the technical scheme provided by the embodiment, an initiating explosive device switching device connected with each initiating explosive device connector on the missile, an on-missile test switching device connected with a missile controller and a ground test switching device connected with ground test, launch and control equipment are adopted; still adopt the test host computer to link to each other with initiating explosive device switching device, test switching device on the bullet respectively, ground test switching device for carry out initiating explosive device equivalence test, carry out functional test to the switching value or the analog quantity or the communication interface of guided missile controller, test the interface of ground survey control equipment, then adopt the test equipment that this embodiment provided just can realize above various test items, just can accomplish the test task through test equipment less in quantity, shorten the time of preparation work before the test, reduce the consumption of manpower and materials, improve efficiency of software testing, reduce the cost of production and test.
The initiating explosive device switching device 2 is a connector for switching an initiating explosive device connector in a cable network into equivalent portable testing equipment. On the basis of the above technical solution, the embodiment provides an implementation manner of the initiating explosive device switching device 2:
fig. 2 is a block diagram of a structure in which an initiating explosive device adaptor in the missile weapon testing equipment provided in the embodiment of the present application is connected to a testing host and an initiating explosive device connector, respectively, and fig. 3 is a schematic structural diagram of an initiating explosive device adaptor in the missile weapon testing equipment provided in the embodiment of the present application.
As shown in fig. 2 and 3, the explosive device adaptor 2 includes: a plurality of interfaces used for being connected with the priming sytem connectors 21 on the missile, four host interfaces connected with the test host 1 and interfaces used for being connected with the priming sytems on the missile.
The initiating explosive device switching device 2 is connected with the initiating explosive device connector 21, specifically is connected with two connecting ends 70-1 and 71 of the initiating explosive device connector 21, and the length is 500 mm. The initiating explosive device switching device 2 is provided with a plurality of measuring points for controlling the initiating explosive device to work, and can be externally connected with an oscilloscope or a writing instrument to record or test waveforms.
The initiating explosive device switching device 2 is connected with the test host 1, specifically connected with four connecting ends CS-2, CS-3, CS-4 and CS-5 of the test host 1 through four host interfaces, and the length is 800 mm. The initiating explosive device switching device 2 is used for sending the time sequence signal sent by the initiating explosive device connector 21 to the test host 1 through the corresponding connecting end, so that the equivalent circuit in the test host 1 tests and processes the time sequence signal, and the working state and the interface state of the corresponding equipment of the initiating explosive device are obtained.
The terminal and data transmission mode of the initiating explosive device switching device 2 connected to the test host 1 and the initiating explosive device connector 21 can be various, and this embodiment is not limited to the above, so that data can be transmitted between the two.
The on-board test switching device 3 is a connector for converting an on-board controller-to-external connector into a connector capable of being connected with equivalent portable test equipment. The embodiment provides an implementation manner of the on-board test switching device 3:
fig. 4 is a block diagram of a structure in which an on-missile test adapter device in the missile weapon test equipment provided in the embodiment of the present application is connected to a test host and an on-missile controller, respectively, and fig. 5 is a schematic structural diagram of an on-missile test adapter device in the missile object test equipment provided in the embodiment of the present application.
As shown in fig. 4 and 5, the on-board test changeover device 3 is connected to the on-board controller 31, and specifically to the three test connection terminals ZD-1, ZD-5, and ZD-6 of the on-board controller 31. The on-board test switching device 3 CAN receive the switching value signal and the analog signal sent by the on-board Controller 31, CAN also send the switching value signal and the analog signal by the on-board Controller 31, and CAN perform data transmission and test with the on-board Controller through a serial interface RS422, data transmission and test through an ethernet, and data transmission and test through a Control Area Network (CAN) bus.
The on-board test switching device 3 is connected with the test host 1, specifically connected with five connecting ends CS-2, CS-3, CS-4, CS-5 and NET1 of the test host 1, and has a length of 1000 mm. The on-board test switching device 3 CAN send a switching value or analog signal to the on-board controller 31 according to a signal sent by the test host 1, and CAN also send a signal to the on-board controller 31 through an RS422, ethernet or CAN bus. The on-board test switching device 3 can also send the analog quantity signal and the digital quantity signal sent by the on-board controller 31 and the signals sent through the communication buses to the test host 1, so that the test host 1 can process and analyze the analog quantity signal and the digital quantity signal to obtain the working state and the interface states of the on-board controller 31.
The terminals and data transmission modes of the on-board test switching device 3 connected to the test host 1 and the on-board controller 31 may be various, and the present embodiment is not limited to this, and data may be transmitted between the two.
The ground test switching device 4 is a connector for converting a connector connected with ground test, launch and control equipment into a connector connected with equivalent portable test equipment. The embodiment provides an implementation manner of the ground test switching device 4:
fig. 6 is a block diagram of a structure in which a ground test switching device in the missile weapon test equipment provided in the embodiment of the present application is connected to a test host and a ground test control device, respectively, and fig. 7 is a schematic structural view of the ground test switching device in the missile weapon test equipment provided in the embodiment of the present application.
As shown in fig. 6 and 7, the ground test switching device 4 is connected to the ground test, launch and control equipment 41, and specifically, to the digital input/output end, the RS422 interface, and the elastic-ground release interface of the ground test, launch and control equipment 41, and is configured to receive the switching value signal sent by the ground test, launch and control equipment 41, send the switching value signal to the ground test, launch and control equipment 41, and transmit data and test through the RS422 interface and the elastic-ground release interface.
The ground test switching device 4 is connected with the test host machine 1, specifically connected with five connecting ends CS-3, CS-4, CS-7, NET1 and NET2 of the test host machine 1, and the length of the ground test switching device is 1000 mm. The ground test switching device 4 can send a switching value signal to the ground test and transmission control equipment 41 according to a signal sent by the test host 1, and can also send a signal to the ground test and transmission control equipment 41 through the RS422 and the TC bus. The ground test switching device 4 can also send the digital quantity signals sent by the ground test, transmission and control equipment 41 and the signals sent by each communication bus to the test host 1, so that the test host 1 can process and analyze the digital quantity signals and the signals to acquire the working state and each interface state of the ground test, transmission and control equipment 41.
The ground test switching device 4 can be connected to the test host 1 and the ground test, transmission and control equipment 41 through various terminals and data transmission modes, and this embodiment is not limited to the above embodiments, so as to transmit data between the two.
The embodiment provides an implementation manner of the test host 1:
fig. 8 is a schematic structural diagram of a test host in the missile weapon test equipment provided in the embodiment of the present application. As shown in fig. 8, the test host 1 includes: a master control board 11, an industrial control unit 12 and a power supply unit 13. The main controller control panel 11 is used for acquiring test data in the process of performing equivalent test on initiating explosive devices, performing functional test on switching values or analog quantities or communication interfaces of missile controllers, and performing test on interfaces of ground test, launch and control equipment. The industrial control unit 12 communicates with the master control board 11 through a digital bus. The industrial control unit 12 is configured to receive data acquired by the main controller control panel 11, and generate a control instruction after processing and analysis to send the control instruction to the main controller control panel 11, so that the main controller control panel 11 sends a control signal to the explosive device switching device, the on-missile test switching device, and the ground test switching device through the connector. The power supply unit 13 is used for supplying power to the master control board 11 and the industrial control power supply 12.
According to the functions of the above units, the embodiment provides a specific implementation manner:
the industrial control unit 12 includes a motherboard, on which a control chip, a chip peripheral circuit and an interface circuit are disposed, where the interface circuit includes an RS232 interface circuit, a Universal Serial Bus (USB) interface circuit and an ethernet NET interface circuit. The control chip can run upper computer software, control main controller control panel 11 and accomplish the test, gather and save test data to test intelligence interpretation.
The power supply unit 13 receives the commercial power AC220V, and converts the commercial power into a direct current signal required by the main controller control board 11 and the industrial control unit 12 after performing AC-dc conversion and dc voltage reduction conversion.
Fig. 9 is a schematic structural diagram of the FPGA digital control board in fig. 8. As shown in fig. 8 and 9, the master control board 11 includes: the test circuit comprises a main controller, and an equivalent test circuit, an input/output interface circuit, an RS422 interface circuit and a CAN bus interface circuit which are respectively connected with the main controller. The main controller may be a processor or a microcontroller commonly used in the art, and may also be a Field Programmable Gate Array (FPGA). In this embodiment, the FPGA is used as the main controller, and the control board of the main controller may also be referred to as an FPGA digital control board.
The RS422 interface circuit comprises: RS422 driver and associated circuitry. The CAN bus interface circuit comprises a CAN bus controller and related circuits. The input/output interface circuit includes: the device comprises a switching value acquisition circuit, a switching value output circuit, an analog value acquisition circuit and an analog value output circuit.
Wherein, switching value acquisition circuit includes: the device comprises a switching value acquisition module and an optical coupling isolation module, wherein the optical coupling isolation module is connected between the switching value acquisition module and the FPGA. The switching value acquisition module receives 10 switching value signals and outputs 6 first voltage signals and 4 second voltage signals.
The switching value output circuit includes: the switching value output module and the switching value driving module are connected between the switching value output module and the main controller. The switching value output module sends 10 switching value signals according to the 6 first voltage signals and the 4 second voltage signals generated by the switching value driving module. The first voltage signal is 28V, and the second voltage signal is 5V
The analog quantity acquisition circuit comprises: the digital isolation module is connected between the analog-to-digital converter and the main controller, and the analog-to-digital converter receives 4 paths of analog quantity signals and converts the analog quantity signals into digital quantity signals.
The analog quantity output circuit includes: the digital isolation module is connected between the digital-to-analog converter and the main controller. The digital-to-analog converter generates 4 paths of analog quantity signals according to the signals sent by the digital quantity isolation module. The amplitude of the analog quantity signal is-10V to + 10V.
The equivalent circuit adopts the equivalent circuit and the switch tube to realize the selection of the circuit channel, and completes the sequential function test of the electric system on the bullet together with the initiating explosive device switching device 2. The equivalent test circuit includes: the digital isolation circuit comprises an equivalent circuit, an operational amplifier, an analog-to-digital converter and a digital isolation module which are sequentially connected, wherein the digital isolation module is connected with a main controller. The input end of the equivalent circuit receives 4 paths of timing signals, such as the timing signals received by the initiating explosive device switching device 2. In this embodiment, the number of the equivalent test circuits is 7, and 7 groups of timing signals can be tested simultaneously.
Fig. 10 is a schematic diagram of the equivalent circuit of fig. 9. As shown in fig. 10, the equivalent circuit includes: the device comprises a first switch, a second switch, a third switch, a fourth switch, a measuring resistor R1, a first power resistor R2 and a second power resistor R3. The number of the first switches is 4, specifically, the first switches K1, K2, K3, and K4 in fig. 10, where front ends of the first switches respectively receive a positive phase signal of a single path of timing signal.
The second switch is switch K5 in FIG. 10, which is connected in series with a measurement resistor R1 to form a first test channel. The third switch is the switch K6 in fig. 10, and is connected in series with the first power resistor R2 to form a second test channel. The fourth switch is the switch K7 in fig. 10, and is connected in series with the second power resistor R3 to form a third test channel. The front end of a line formed by connecting the first test channel, the second test channel and the third test channel in parallel is connected with the rear end of each first switch.
In addition, the positive phase input end of the operational amplifier receives the positive phase signal of the 4 paths of timing signals, and the negative phase input end of the operational amplifier receives the negative phase signal of the 4 paths of timing signals. The inverting input end of the operational amplifier is also connected with the rear end of a line formed by connecting the first test channel, the second test channel and the third test channel in parallel.
The output end of the operational amplifier is connected with the input end of an analog-to-digital converter ADS8678, and the output end of the analog-to-digital converter ADS8678 is connected with a digital isolator ISO 7762.
The FPGA digital control board realizes the input and output functions of switching value and analog quantity and the simulation and real-time voltage acquisition functions of various equivalent circuits, provides 1-path CAN bus interface and 3-path RS422 interface, and integrates an isolation power supply and an isolation communication chip. The industrial control unit realizes the control and management of each test function and data display and processing. The power supply unit provides effective, stable and reliable working power supply for all the functional modules.
The FPGA serves as a control chip and is provided with 10 paths of switching value signal receiving, wherein 6 paths of input voltage 28V and 4 paths of input voltage 5V switching value signals are continuously high-level effective; 10 switching value outputs, wherein 6 outputs 28V switching value signals and 4 outputs 5V switching value signals; designing 4 paths of analog signal acquisition functions, wherein the range of analog input quantity is-10V, and the single-channel sampling rate is 200 kSps; 4 paths of DA analog quantity output, and the resolution of an output DAC is 16 bits.
The FPGA digital control board card has 7 groups of 28 equivalent circuit signal inputs. The voltage signal that the piece was surveyed input passes through load equivalent circuit, and load equivalent circuit adopts 7 unidirectional conduction switch tubes to control 4 circuit channels, and every passageway current bearing capacity is higher than 20A instantaneous current, and wherein 2 power resistance can connect in parallel in the test and use, and the quantity of parallel resistance is decided by the piece input signal demand that is surveyed, and measuring resistance is used for detecting whether voltage is normal. The FPGA digital control board controls the voltage of an input signal to be 0-5V through operational amplifier, and then the test is completed through ADC sampling and FPGA communication. The FPGA sends a switch tube control signal, the switch tube control signal is digitally isolated and then converted into a parallel signal through a digital displacement register, the switch tube is controlled, and a circuit channel is controlled through a one-way conduction switch tube.
The test main unit 1 in this embodiment is of a portable design, and the internal module is designed in the form of a portable computer. The size of the case is 508.4mm multiplied by 428.3mm multiplied by 132mm, which is convenient for being held by a single hand. The box body is provided with a flip display, the display is an industrial display and is used for displaying human-computer interaction and a test state, and the shock-proof performance is achieved. And a keyboard 104, a touch mouse and a test equipment state indicator lamp are arranged on the box body. A radiating hole is formed in one side face of the case, and an air cooling radiating design is adopted. The other side of the case is provided with 6 aerial plug test interfaces CS-2, CS-3, CS-4, CS-5, CS-6 and CS-7 for connecting with three switching devices.
The initiating explosive device test for the missile weapon can test whether the time sequence of the initiating explosive device on the missile is normal or not through the FPGA digital control board and the initiating explosive device switching device 2. The FPGA digital control board is connected with the initiating explosive device switching device 2 through the test host 1.
The on-missile functional test of the missile weapon can test whether each interface of the on-missile electrical system is normal through the FPGA digital control board and the on-missile test switching device 3. The FPGA digital control board is connected with the on-missile test switching device 3 through the test host 1.
The ground function test of the missile weapon can test whether each interface of the ground electrical system is normal through the FPGA digital control board and the ground test switching device 4. The FPGA digital control board is connected with the ground test switching device 4 through the test host 1.
The combined missile weapon test equipment realizes different test items on the missile and on the ground through the combination of the test host 1 and different switching devices, realizes the integrated design of the ground test equipment, reduces the types and the number of the ground test equipment, and improves the product reuse rate. The test host adopts portable design, can effectively improve the efficiency of seting up of product, can operate intelligent interpretation software simultaneously, realizes the quick interpretation of data, reduces the human factor, improves efficiency of software testing.
In the description of the present application, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on those shown in the drawings, and are used merely for convenience of description and for simplicity of description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be operated, and thus should not be considered as limiting the present application.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In this application, unless expressly stated or limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can include, for example, fixed connections, removable connections, or integral parts; can be mechanically connected, electrically connected or can communicate with each other; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all alterations and modifications as fall within the scope of the application.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (10)
1. A missile weapons testing facility, comprising:
the initiating explosive device switching device is used for being connected with each initiating explosive device connector on the missile;
the on-missile test switching device is used for being connected with the missile controller;
the ground test switching device is used for being connected with the ground test, launch and control equipment;
and the test host is respectively connected with the initiating explosive device switching device, the missile-borne test switching device and the ground test switching device through the connectors and is used for carrying out initiating explosive equivalent test, carrying out function test on the switching value or analog quantity or communication interface of the missile controller and testing the interface of the ground test, control and control equipment.
2. The test apparatus of claim 1, wherein the test host comprises: the main controller control panel, the industrial control unit and the power supply unit;
the main controller control panel is used for acquiring test data in the processes of initiating explosive device equivalent test, function test on switching value or analog quantity or communication interface of the missile controller and test on the interface of the ground test, launch and control equipment;
the industrial control unit is communicated with the control panel of the main controller through a digital bus; the industrial control unit is used for receiving data acquired by the main controller control panel, generating a control instruction after processing and analysis and sending the control instruction to the main controller control panel so that the main controller control panel sends a control signal to the explosive article switching device, the on-missile test switching device and the ground test switching device through the connector;
and the power supply unit is used for supplying power to the main controller control panel and the industrial control power supply.
3. The test apparatus of claim 2, wherein the master control board comprises: the device comprises a main controller, and an equivalent test circuit, a switching value acquisition circuit, a switching value output circuit, an analog value acquisition circuit, an analog value output circuit, a serial interface RS422 circuit and a controller area network CAN bus circuit which are respectively connected with the main controller.
4. The test apparatus of claim 3, wherein the switching value acquisition circuit comprises: the optical coupling isolation module is connected between the switching value acquisition module and the main controller; the switching value acquisition module receives 10 switching value signals and outputs 6 first voltage signals and 4 second voltage signals.
5. The test apparatus of claim 3, wherein the switching value output circuit comprises: the switching value driving module is connected between the switching value output module and the main controller; the switching value driving module generates 6 paths of first voltage signals and 4 paths of second voltage signals; and the switching value output module sends 10 switching value signals according to the 6 paths of first voltage signals and the 4 paths of second voltage signals generated by the switching value driving module.
6. The test apparatus of claim 3, wherein the analog acquisition circuit comprises: the digital isolation module is connected between the analog-to-digital converter and the main controller; the analog-to-digital converter receives 4 paths of analog quantity signals and converts the analog quantity signals into digital quantity signals.
7. The test apparatus of claim 3, wherein the analog output circuit comprises: the digital isolation module is connected between the digital-to-analog converter and the main controller; the digital-to-analog converter generates 4 paths of analog quantity signals according to signals sent by the digital quantity isolation module.
8. The test apparatus of claim 3, wherein the equivalent test circuit comprises: the digital isolation circuit comprises an equivalent circuit, an operational amplifier, an analog-to-digital converter and a digital isolation module which are connected in sequence, wherein the digital isolation module is connected with a main controller; the input end of the equivalent circuit receives 4 paths of timing signals.
9. The test apparatus of claim 8, wherein the equivalent circuit comprises: the device comprises a first switch, a second switch, a third switch, a fourth switch, a measuring resistor, a first power resistor and a second power resistor;
the number of the first switches is 4, and the front end of each first switch receives a path of time sequence signal;
the second switch is connected with the measuring resistor in series to form a first test channel, the third switch is connected with the first power resistor in series to form a second test channel, and the fourth switch is connected with the second power resistor in series to form a third test channel; the front end of a line formed by connecting the first test channel, the second test channel and the third test channel in parallel is connected with the rear end of each first switch.
10. The test apparatus of claim 1, wherein the pyrotechnic item interface device comprises: the device comprises a plurality of interfaces used for being connected with the connectors of all the initiating explosive devices on the missile, four host interfaces connected with a test host and a knob used for controlling the work of all the initiating explosive devices on the missile.
Priority Applications (1)
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| CN116608741A (en) * | 2023-07-20 | 2023-08-18 | 东方空间技术(山东)有限公司 | Initiating explosive device time sequence testing system, method and equipment of rocket |
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