CN112327126A

CN112327126A - IGBT module performance test system and method

Info

Publication number: CN112327126A
Application number: CN202011172358.4A
Authority: CN
Inventors: 刘秀田; 林川川; 李启国
Original assignee: Guangzhou Automobile Group Co Ltd
Current assignee: Gac Aion New Energy Vehicle Co ltd
Priority date: 2020-10-28
Filing date: 2020-10-28
Publication date: 2021-02-05

Abstract

The invention discloses a system and a method for testing the performance of an IGBT module, wherein the system comprises an upper computer, a function debugger, a battery simulator, an inductance simulator and a capacitance simulator, wherein the upper computer is used for setting test parameters according to the test requirements of the IGBT module and acquiring test data of the IGBT module through an acquisition device; the function debugger controls the IGBT module to be switched on and off through the control equipment so as to test the performance of the IGBT module; the battery simulator is used for providing test voltage for the IGBT module according to the test parameters; the inductance simulator is used for providing test inductance for the IGBT module according to the test parameters; the capacitance simulator is used for providing a test capacitance for the IGBT module according to the test parameters; in the invention, the battery simulator, the inductance simulator and the capacitance simulator are testing equipment with parameters set by an upper computer, and the testing parameters can be ensured to be consistent with the system design parameters, so that the constructed testing environment is ensured to be closer to the real use condition of the IGBT module, and the accuracy of the performance testing result of the IGBT module is improved.

Description

IGBT module performance test system and method

Technical Field

The invention relates to the field of insulated gate bipolar transistor IGBT testing, in particular to a system and a method for testing the performance of an IGBT module.

Background

An Insulated Gate Bipolar Transistor (IGBT) is a composite fully-controlled voltage-driven power semiconductor device which consists of a Bipolar triode and an Insulated Gate field effect Transistor and is widely applied to the industrial fields of strong electric control and the like of rail transit, aerospace, smart grids, new energy automobiles and the like. In the application of new energy vehicles and intelligent vehicles, the IGBT module is used as a core device of a motor controller, and the performance of the IGBT module and the performance of a matching circuit are reasonable or not, so that the performance of the whole vehicle is directly determined. Therefore, in the development process, the IGBT module and the hardware matching circuit need to be dynamically tested, so that the performance of the IGBT module is known according to the test result, and the performance of the IGBT module is optimized and ensured, thereby meeting the needs of the entire vehicle system and optimizing the system.

In the prior art, a general double-pulse test system for the IGBT module is mostly temporarily built, the test environment of the IGBT module is simulated according to different test requirements, and each IGBT module is tested in the corresponding test environment to obtain test data. However, in the test system set up according to the test requirements, most of the test parameters such as inductance and capacitance are fixed values, and the situation that the test parameters are not matched with the system design parameters can occur, so that the error of the obtained test data of the IGBT module is large, and finally, an accurate IGBT module performance test result cannot be obtained.

Disclosure of Invention

The invention provides a performance test system and method for an IGBT module, and aims to solve the problem that in the existing performance test, test parameters are not matched with the parameters of test equipment, so that the performance test result of the IGBT module is inaccurate.

Provided is an IGBT module performance test system, including:

the upper computer is used for setting test parameters according to the test requirements of the IGBT module and acquiring test data of the IGBT module through an acquisition device;

the function debugger is connected with the upper computer and controls the IGBT module to be switched on and off through control equipment so as to test the performance of the IGBT module;

the battery simulator is connected with the upper computer and used for providing test voltage for the IGBT module according to the test parameters;

the inductance simulator is connected with the upper computer and used for providing test inductance for the IGBT module according to the test parameters;

and the capacitance simulator is connected with the upper computer and used for providing test capacitance for the IGBT module according to the test parameters.

Furthermore, the IGBT module performance test system further comprises a constant temperature and humidity box, and the IGBT module is arranged in the constant temperature and humidity box.

Furthermore, the IGBT module performance test system further comprises a water cooling system, and the water cooling system is connected with the IGBT module and used for cooling the IGBT module.

Further, the collecting device comprises a multi-channel oscilloscope connected with the upper computer, and the multi-channel oscilloscope is used for collecting the voltage and the current of the IGBT module at different positions in the testing process.

Furthermore, the acquisition device further comprises a data acquisition unit connected with the upper computer, and the data acquisition unit is used for acquiring the test data of the inductance simulator, the capacitance simulator and the battery simulator.

Further, the control equipment comprises a control module and a driving module, and the function debugger, the control module and the driving module are sequentially connected to form a control circuit and a driving circuit of the IGBT module so as to control the IGBT module to perform performance testing.

Furthermore, the IGBT module performance test system also comprises a programmable low-voltage power supply, and the programmable low-voltage power supply is connected with the upper computer, the function debugger and the control module and is used for providing low-voltage for the IGBT module according to test parameters.

The IGBT module performance testing method is used in the IGBT module performance testing system and comprises the following steps:

the upper computer obtains test parameters input by a tester, the test parameters are set according to the test requirements of the IGBT module, and the test parameters comprise a duty ratio of a function debugger, a test inductance value, a test capacitance value and a test voltage value;

the upper computer sets operation parameters of test equipment in the IGBT module performance test system according to the duty cycle of the function debugger, the test inductance value, the test capacitance value and the test voltage value so as to perform performance test on the IGBT module;

the upper computer acquires the change data of the IGBT module in the testing process through an acquisition device so as to acquire the testing data of the IGBT module;

and the upper computer analyzes the test data to obtain a performance test result of the IGBT module.

Further, the host computer sets up the operation parameter of test equipment in the IGBT module performance test system according to function debugger duty cycle, test inductance value, test capacitance value with the test voltage value includes:

the upper computer sets the operating parameters of the function debugger according to the duty ratio of the function debugger;

the upper computer sets the operation parameters of the inductance simulator according to the test inductance value;

the upper computer sets the operation parameters of the capacitance simulator according to the test capacitance value;

the upper computer sets the operation parameters of the voltage simulator according to the test voltage value;

the upper computer sets the operation parameters of the constant temperature and humidity box according to the test temperature in the test parameters;

and the upper computer sets the operation parameters of the cooling system according to the cooling water requirement in the test parameters.

Further, the host computer passes through collection system and acquires the change data of IGBT module in the test process to obtain the test data of IGBT module, include:

in the testing process, the upper computer controls the acquisition device to acquire the voltage and the current of the IGBT module at different positions so as to obtain sampling data;

the upper computer determines whether the sampling data meets a trigger condition;

and if the sampling data meet the triggering condition, the upper computer stores the sampling data to be used as test data of the IGBT module.

An upper computer, comprising:

the first acquisition module is used for acquiring test parameters input by a tester, wherein the test parameters are set according to the test requirements of the IGBT module, and the test parameters comprise a duty ratio of a function debugger, a test inductance value, a test capacitance value and a test voltage value;

the setting module is used for setting the operation parameters of the test equipment in the IGBT module performance test system according to the duty ratio of the function debugger, the test inductance value, the test capacitance value and the test voltage value so as to perform performance test on the IGBT module;

the second acquisition module is used for acquiring the change data of the IGBT module in the test process through the acquisition device so as to acquire the test data of the IGBT module;

and the analysis module is used for analyzing the test data to obtain a performance test result of the IGBT module.

A host computer comprises a memory, a processor and a computer program which is stored in the memory and can run on the processor, wherein the steps of the IGBT module performance testing method are realized when the processor executes the computer program.

A readable storage medium storing a computer program which, when executed by a processor, implements the steps of an IGBT module performance testing method.

The system and the method for testing the performance of the IGBT module comprise an upper computer, and a function debugger, a battery simulator, an inductance simulator and a capacitance simulator which are connected with the upper computer, wherein the upper computer is used for setting test parameters according to the test requirements of the IGBT module and acquiring test data of the IGBT module through an acquisition device; the function debugger controls the IGBT module to be switched on and off through the control equipment so as to test the performance of the IGBT module; the battery simulator is used for providing test voltage for the IGBT module according to the test parameters; the inductance simulator is used for providing test inductance for the IGBT module according to the test parameters; the capacitance simulator is used for providing a test capacitance for the IGBT module according to the test parameters; in the invention, the battery simulator, the inductance simulator and the capacitance simulator are all testing equipment with parameters set by an upper computer, and the testing parameters can be ensured to be consistent with the system design parameters, so that the constructed testing environment is ensured to be closer to the real use condition of the IGBT module, and the accuracy of the performance testing result of the IGBT module is improved.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without inventive labor.

Fig. 1 is a schematic structural diagram of an IGBT module performance testing system according to an embodiment of the present invention;

fig. 2 is a schematic flow chart of a method for testing the performance of the IGBT module according to an embodiment of the present invention;

FIG. 3 is a flowchart illustrating an implementation of step S30 in FIG. 2;

FIG. 4 is a schematic structural diagram of a host computer according to an embodiment of the present invention;

fig. 5 is another schematic structural diagram of the upper computer in an embodiment of the present invention.

Wherein, in the figures, the respective reference numerals:

1-an upper computer; 2-a battery simulator; 3-an inductance simulator; 4-an IGBT module; 5-a water cooling system; 6-function debugger; 7-a control module; 8-a drive module; 9-multichannel oscilloscope; 10-a data collector; 11-a programmable low voltage power supply; 12-a capacitance simulator; 13-constant temperature and humidity chamber; 14-auxiliary terminal current voltage collector; 15-power terminal current voltage collector; 16-data acquisition line; 17-a cooling water pipe; 18-communication link 18.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Example one

The performance test system for the IGBT module 4 provided in the embodiment of the present invention may provide an automatic test platform for a double pulse test of the IGBT module 4, as shown in fig. 1, the performance test system for the IGBT module 4 specifically includes the following devices:

the upper computer 1 is used for setting test parameters according to the test requirements of the IGBT module 4, and acquiring test data of the IGBT module 4 through the acquisition device.

The tester can set the test parameters of each test device in the IGBT module 4 test process according to the test requirements, and when the IGBT module 4 is tested, the set test parameters are input into the upper computer 1, so that each subsequent test device outputs corresponding test values according to the test parameters in the upper computer 1, and the test environment of the IGBT module 4 is constructed. The test parameters comprise duty ratio of the function debugger, test voltage value, test inductance value, test capacitance value and the like.

The upper computer 1 is provided with a communication device (such as a CAN communication device) and a collection device, so that in the process of testing the IGBT module 4, test control and data collection are carried out on each testing device, the collected data are synchronously recorded and analyzed, the data collected by the collection device are used as test data, the test data are analyzed, a test result is obtained, and the performance of the IGBT module 4 is evaluated according to the test result.

And the function debugger 6 is connected with the upper computer 1, and controls the IGBT module 4 to be switched on and off through the control equipment so as to test the performance of the IGBT module 4.

One end of the function debugger 6 is connected with the upper computer 1 through a communication connection line 18, the other end of the function debugger 6 is electrically connected with the IGBT module 4 to be tested through control equipment, different pulse width modulation signals (PWM signals) are output according to different duty ratios set by the upper computer 1, the PWM signals control the on and off of the IGBT module 4 through the control equipment, and therefore the action of the IGBT module 4 is achieved, and the performance test of the IGBT module 4 is conducted. The function debugger 6 has no specific shape, and the function debugger 6 may be a general-purpose function debugger 6 or a dedicated debugger provided by a vendor.

And the battery simulator 2 is connected with the upper computer 1 and used for providing test voltage for the IGBT module 4 according to the test parameters.

The battery simulator 2 in the embodiment has no specific shape, one end of the battery simulator 2 is connected with the upper computer 1 through a communication connecting line 18, and the other end of the battery simulator 2 is electrically connected with the IGBT module 4 to be tested. For different electric driving platforms, the voltages required for the performance test of the IGBT module 4 are different, which requires the system to match the appropriate voltages for the test according to the test requirements. Therefore, in the testing process of the IGBT module 4, the testing voltage can be provided for the IGBT module 4 according to the testing voltage value set by the upper computer 1, namely, the battery simulator 2 can provide different high-voltage voltages for the IGBT module 4 to be tested according to the testing requirement, so that the purpose of optimizing the testing voltage parameters is achieved.

And the inductance simulator 3 is connected with the upper computer 1 and used for providing test inductance for the IGBT module 4 according to the test parameters.

The inductance simulator 3 in the embodiment has no specific shape, one end of the inductance simulator 3 is connected with the upper computer 1 through a communication connection line 18, and the other end of the inductance simulator 3 is electrically connected with the IGBT module 4 to be tested. Aiming at different electric driving platforms, the inductance required by the performance test of the IGBT module 4 is different, and the system is required to match a proper inductance according to the test requirement for testing, so that in the test process of the IGBT module 4, the test inductance can be provided for the IGBT module 4 according to the test inductance value set by the upper computer 1, namely, the inductance simulator 3 can provide different inductances for the IGBT module 4 to be tested according to the test requirement, so as to achieve the purpose of optimizing the inductance parameter test.

And the capacitance simulator 12 is connected with the upper computer 1 and used for providing a test capacitance for the IGBT module 4 according to the test parameters.

The capacitance simulator 12 in the embodiment has no specific shape, one end of the capacitance simulator 12 is connected with the upper computer 1 through a communication connection line 18, and the other end of the capacitance simulator 12 is electrically connected with the IGBT module 4 to be tested. The capacitance needed by the performance test of the IGBT module 4 is different for different electric driving platforms, and the system is required to match a proper capacitor for testing according to the test requirement, so that in the test process of the IGBT module 4, the test capacitor can be provided for the IGBT module 4 according to the test capacitance value set by the upper computer 1, namely, the capacitor simulator 12 can provide different capacitors for the IGBT module 4 to be tested according to the test requirement, so as to achieve the purpose of optimizing the test capacitor parameters.

The test parameters set by the upper computer 1 can be matched with the parameters designed by the system, so that the accuracy of the test result is improved.

For example, in the design process of a test system, the bus capacitance in the system is determined to be 600uF, the motor inductance is 25nH, when the double-pulse test of the IGBT module 4 is performed, the inductance simulator 3 can set the test inductance to be 25nH, and the capacitance simulator 12 and the test capacitance 600uF can be used to ensure that the capacitance and the inductance in the test process are the same as the bus capacitance and the motor inductance in the design process of the system, so that the consistency and the accuracy of the double-pulse test are ensured, and the accuracy of the test result is improved.

In the performance test system of the IGBT module 4, the IGBT module 4 to be tested is connected with the battery simulator 2, the inductance simulator 3 and the capacitance simulator 12 through high-voltage-resistant large-current wiring harnesses to form a high-voltage loop comprising the IGBT module 4, the battery simulator 2, the inductance simulator 3 and the capacitance simulator 12; the function debugger 6, the control equipment and the IGBT module 4 to be tested are connected through a low-voltage wiring harness and a connector assembly to form a low-voltage control loop for controlling the IGBT module 4 to perform performance testing; the upper computer 1, the battery simulator 2, the inductance simulator 3, the capacitance simulator 12 and the function debugger 6 establish a communication connection line 18 through the CAN communication module, so that voltage and current of the IGBT module 4 to be tested at different positions at the same time are collected in the testing process, test data of the IGBT module 4 to be tested are obtained, and data support is provided for performance analysis of the IGBT module 4 to be subsequently carried out; the upper computer 1 is connected with the battery simulator 2, the inductance simulator 3, the IGBT module 4, the function debugger 6 and the capacitance simulator 12 through communication signals, and independent control of each testing device can be achieved through the upper computer 1. The specific working principle is as follows:

firstly, a tester determines an IGBT module 4 to be tested according to test requirements, selects a proper function debugger 6 and a proper control device, then builds a proper driving circuit according to the function debugger 6, the proper control device and the IGBT module 4, a battery simulator 2, an inductance simulator 3 and a capacitance simulator 12 build a high-voltage loop, and an upper computer 1 is in communication connection with each device to be tested 18 so as to complete the building of a test system.

Then, according to actual test requirements, test parameters meeting the test requirements are set through the upper computer 1, wherein the test parameters comprise test voltage values, test inductance values, test capacitance values, trigger signals for data acquisition and key variables for monitoring and storing. Specifically, an inductance value matched with the system design is set through the inductance simulator 3, a capacitance value matched with the system design is set through the capacitance simulator 12, sampling data and a collection trigger signal of the current sensor and the voltage sensor are set through the collection device, and key variables needing to be monitored and stored in the test process are set. The acquired data comprise loop current Ic, gate drive voltage Vg, power terminal voltage Vce1 of the IGBT module 4, auxiliary terminal voltage Vce2 of the IGBT module 4, direct-current bus voltage, turn-on loss of the IGBT module 4, turn-off loss of the IGBT module 4 and the like; the sampling data can be selected according to different test requirements, a specific value is set for the sampling data to be used for triggering variables, when the sampling data reaches the specific value, the triggering condition is met, a collection triggering signal is generated at the moment to record the sampling data of all the test variables at a certain moment, and finally the recorded sampling data is used as the test data. When the test data is sampled, partial sampled data is monitored and stored according to the setting of the upper computer 1, and the key variables needing to be monitored and stored comprise loop current Ic, gate driving voltage Vg, power terminal voltage Vce1 of the IGBT module 4, auxiliary terminal voltage Vce2 of the IGBT module 4, direct-current bus voltage and the like, the turn-on loss of the IGBT module 4, the turn-off loss of the IGBT module 4 and the like.

Finally, in the test process, the upper computer 1 controls the battery simulator 2 to set proper high voltage, the function debugger 6 outputs PWM signals through different duty ratios set by the upper computer 1, the PWM signals control the IGBT module 4 to be switched on and off through a hardware circuit (driving circuit) of the control device, thereby realizing the action of the IGBT module 4, namely, the performance test of the IGBT module 4 is realized, during the action of the IGBT module 4, the acquisition device acquires the voltage and current signals of the drive circuit and the high-voltage loop of the IGBT module 4 through the sensor, and then according to the trigger condition set by the upper computer 1, when the acquired data meet the trigger condition, recording and storing the acquired voltage and current signals, taking the acquired and stored voltage and current signals as test data, and analyzing the test data to obtain a performance test result of the IGBT module 4. For example, after the test data is obtained, the loss of the IGBT module 4 in the turn-on process, the peak current, the loss of the IGBT module 4 in the turn-off process, the turn-off peak voltage, and the like may be analyzed to evaluate the performance of the IGBT module 4, compare the performance of different IGBT modules 4, and optimize the driving parameters, such as turn-on resistance, turn-off resistance, and circuit, according to the test result.

The embodiment highly integrates the testing equipment, can systematically test the performance parameters of the IGBT module 4, the IGBT modules 4 of different suppliers and the hardware matching circuit of the IGBT module 4, can ensure the consistency of the testing process, and provides an effective basis for the performance comparison of different IGBT modules 4.

In the actual test process, the parameter setting and operation of each test device can be controlled through the upper computer 1 according to the actual test requirements, and the test parameters are ensured to be consistent with the actual product design parameters of each test device, so that the test environment of the IGBT module 4 is ensured to be closer to the real use working condition, the accuracy of the test data of the IGBT module 4 is ensured, and the capability of the IGBT module 4 can be conveniently, reasonably and accurately evaluated.

Meanwhile, the upper computer 1 is adopted for carrying out unified control and data acquisition, the same set of test equipment can be adopted for acquiring test data for the performance tests of different IGBT modules 4, the data acquisition object and the acquisition position are relatively fixed, and the test environment does not need to be frequently disassembled and set up, so that the manual intervention in the test process is reduced, and the efficiency, the precision and the reliability of the test process are improved.

Further, as shown in fig. 1, in the performance test system for the IGBT module 4 provided in this embodiment, the collecting device includes a multi-channel oscilloscope 9 connected to the upper computer 1, and the multi-channel oscilloscope 9 is used for collecting voltage and current actions and generated losses at different positions at the same time in the test process of the IGBT module 4.

The multichannel oscilloscope 9 is connected with the upper computer 1 in a communication connection line 18 mode, wherein the multichannel oscilloscope 9 comprises an auxiliary terminal current and voltage collector 14 and a power terminal current and voltage collector 15, and the auxiliary terminal current and voltage collector is positioned at an auxiliary end of the IGBT module 4 and is used for collecting current and voltage of a driving circuit of the IGBT module 4; the power terminal current and voltage collector 15 is located at the power end of the IGBT module 4 and is configured to collect current and voltage of the high-voltage loop of the IGBT module 4. In this embodiment, the multi-channel oscilloscope 9 collects the voltages and currents at different positions at the same time in the test process of the IGBT module 4 to be tested through the auxiliary terminal voltage collector and the power terminal voltage current collector, so as to improve the accuracy and diversity of data collection and provide more accurate data support for determining the performance of the IGBT module 4.

Further, as shown in fig. 1, in the performance test system for the IGBT module 4 provided in this embodiment, the control device includes a control module 7 and a driving module 8, the function debugger 6, the control module 7, and the driving module 8 are sequentially connected, the driving module 8 is connected with the IGBT module 4, and a control circuit and a driving circuit of the IGBT module 4 are formed to control the IGBT module 4 to perform a performance test. The control module 7 is used for performing program setting and double-pulse testing on the IGBT module 4 to be tested, and the drive module 8 is used for providing drive control for the IGBT module 4 according to the program setting and the double-pulse testing, so that the IGBT module 4 performs performance testing. The function debugger 6 outputs PWM signals through different duty ratios set by the upper computer 1, and the PWM signals control the IGBT module 4 to be switched on and off through hardware circuits of the control module 7 and the driving module 8, so that the action of the IGBT module 4 is achieved, and namely the performance test of the IGBT module 4 is achieved.

Further, as shown in fig. 1, in the performance test system for the IGBT module 4 provided in this embodiment, the performance test system for the IGBT module 4 further includes a programmable low-voltage power supply 11. Programmable low voltage power supply 11 can provide different low voltage for IGBT module 4 under test according to the test demand, programmable low voltage power supply 11 is connected through communication line 18 with host computer 1, programmable low voltage power supply 11 and function debugger 6, control module 7 and drive module 8 constitute IGBT module 4's low pressure control return circuit, connect through low pressure pencil and connector, function debugger 6 outputs PWM signal through the different duty cycles that host computer 1 set for, the PWM signal switches on and shuts off with control IGBT module 4 through control device's hardware circuit (drive circuit), thereby realize IGBT module 4's action, realize the capability test to IGBT module 4 promptly.

Further, as shown in fig. 1, the performance testing system for the IGBT module 4 provided in this embodiment further includes a water cooling system 5, the water cooling system 5 without a specific shape is connected to the upper computer 1 by a communication line 18, and is connected to the IGBT module 4 by a cold water pipe, and a temperature and a flow rate of a cooling water for operating the IGBT module 4 can be set by the water cooling system 5, so that the water cooling system 5 cools the IGBT module 4 according to a temperature parameter set by the upper computer 1, and the safety of the IGBT module 4 is ensured. In addition, the data collector 10 is connected with the water cooling system 5 through a data collecting line 16, and monitors the running state of the water cooling system 5 in the test process.

Further, as shown in fig. 1, the performance testing system for the IGBT module 4 provided in this embodiment further includes a constant temperature and humidity box 13, the constant temperature and humidity box 13 without a specific shape is connected with the upper computer 1 in a communication line 18 manner, so as to provide different testing temperatures and humidities for the IGBT module 4, and the constant temperature and humidity box 13 and the water cooling system 5 form a temperature and humidity testing environment for the IGBT module 4 to be tested, so as to provide a basis for temperature characteristic parameter research on the IGBT module 4. Wherein, IGBT module 4, function debugging 6, control module 7 and drive module 8 all set up in constant temperature and humidity case 13 to avoid because of not considering too high or low temperature to function debugging 6, control module 7 and drive module 8's influence, lead to the inaccurate condition of test data who obtains, make test environment and IGBT module 4 true service behavior more be close, thereby improve the accuracy of test result.

Further, as shown in fig. 1, in the performance test system of the IGBT module 4 provided in this embodiment, the acquisition device further includes a data acquisition unit 10 connected to the upper computer 1, and the data acquisition unit 10 is configured to acquire data of the inductance simulator 3, the capacitance simulator 12, and the battery simulator 2. The data acquisition device 10 is connected with the upper computer 1 in a communication connection line 18 mode, voltage and current signals of the water cooling system 5, the constant temperature and humidity box 13, the inductance simulator 3, the capacitance simulator 12, the battery simulator 2 and other equipment are acquired and monitored through the data acquisition line 16, and when errors occur in operation of the inductance simulator 3, the capacitance simulator 12, the battery simulator 2 and other equipment, error prompt is conducted to guarantee normal operation of the system.

Example two

The embodiment of the invention also provides a method for testing the performance of the IGBT module, which is applied to the IGBT module performance testing system shown in fig. 1, and as shown in fig. 2, the method specifically comprises the following steps:

s10: the upper computer obtains test parameters input by a tester, the test parameters are running parameters set for the IGBT module performance test system according to the test requirements of the IGBT module, and the test parameters comprise duty ratio of a function debugger, test inductance value, test capacitance value and test voltage value.

In the IGBT module performance test system, an IGBT module to be tested is connected with a battery simulator, an inductance simulator and a capacitance simulator through a high-voltage-resistant large-current wire harness to form a high-voltage loop comprising the IGBT module, the battery simulator, the inductance simulator and the capacitance simulator; the function debugger, the control equipment and the IGBT module to be tested are connected with the connector through a low-voltage wiring harness to form a low-voltage control loop for controlling the IGBT module to perform performance testing; the upper computer, the battery simulator, the inductance simulator, the capacitance simulator and the function debugger establish communication connection lines through the CAN communication module so as to collect voltage and current of the IGBT module to be tested at different positions at the same time in the testing process, obtain testing data of the IGBT module to be tested and provide data support for performance analysis of the IGBT module to be subsequently carried out; the upper computer is in communication signal connection with the battery simulator, the inductance simulator, the IGBT module, the function debugger and the capacitance simulator, and independent control over each testing device can be achieved through the upper computer.

Before the performance test of the IGBT module is performed, a tester needs to set test parameters of each test device in the IGBT module performance test system according to actual test requirements. After the test parameters of each test device are determined, the test parameters are input into an upper computer in the IGBT module performance test system, so that the upper computer receives the test parameters input by a tester, and then each test device is controlled to perform performance test on the IGBT module according to the test parameters. The testing parameters comprise duty ratio of the function debugger, testing inductance value, testing capacitance value and testing voltage value.

S20: and the upper computer sets the operating parameters of the test equipment in the IGBT module performance test system according to the duty ratio, the test inductance value, the test capacitance value and the test voltage value of the function debugger so as to perform performance test on the IGBT module.

After the test parameters of the IGBT module performance test system are obtained, the upper computer controls the test equipment to provide different test influence factors for the IGBT module according to the test parameters corresponding to the test equipment so as to construct a test environment of the IGBT module, and the IGBT module completes performance test in the constructed test environment. In the testing process, corresponding operating parameters can be set for testing equipment in the IGBT module performance testing system according to the duty ratio, the testing inductance value, the testing capacitance value and the testing voltage value of the function debugger set in the upper computer, so that the performance testing of the IGBT module meets the testing requirements.

For example, the test parameters set on the upper computer include inductance, capacitance, voltage and the like for testing, so that when the performance of the IGBT module is tested, the battery simulator, the inductance simulator and the capacitance simulator provide different test voltages, test inductors and test capacitors for the IGBT module to be tested according to different inductance, capacitance and voltage values, and the test can be smoothly carried out.

In this embodiment, the test parameters including the inductance value, the capacitance value, and the voltage value for the test are only exemplary illustrations, and in other embodiments, the test parameters may also include operating parameters of other test devices, which are not described herein again.

S30: the upper computer collects the change data of the IGBT module in the testing process through the collecting device so as to obtain the testing data of the IGBT module.

In the process of testing the performance of the IGBT module, the upper computer collects and records different signals of different positions of the IGBT module through the collecting device so as to record the operation data change of the IGBT module and obtain the test data of the IGBT module.

According to actual test requirements, the acquired signals mainly comprise loop current Ic, gate drive voltage Vg, IGBT power terminal voltage Vce1, auxiliary terminal voltage Vce2 of the IGBT module, direct-current bus voltage, turn-on loss of the IGBT module, turn-off loss of the IGBT module and the like.

In this embodiment, the collected signals mainly include loop current Ic, gate drive voltage Vg, IGBT power terminal voltage Vce1, auxiliary terminal voltage Vce2 of the IGBT module, dc bus voltage, turn-on loss of the IGBT module, and turn-off loss of the IGBT module are only exemplary illustrations, and the collected signals may be adjusted and changed according to actual test requirements, that is, in other embodiments, the collected signals may also include other signals, which is not described herein again.

S40: and the upper computer analyzes the test data to obtain a performance test result of the IGBT module.

After the test data of the IGBT module are obtained, the upper computer analyzes the test data of the IGBT module to obtain a performance test result of the IGBT module, wherein the performance data of loss in the turn-on process, peak current, loss in the turn-off process, turn-off peak voltage and the like of the IGBT module can be analyzed according to the test data, and then the performance of the IGBT module is evaluated according to the performance data.

In the embodiment, the upper computer can set the duty ratio, the test inductance value, the test capacitance value and the test voltage value of the function debugger according to the actual test requirements by acquiring the test parameters input by the tester, wherein the test parameters are the operating parameters set for the IGBT module performance test system according to the test requirements of the IGBT module, the test parameters comprise the duty ratio of the function debugger, the test inductance value, the test capacitance value and the test voltage value, then the performance test is carried out on the IGBT module according to the duty ratio of the function debugger, the test inductance value, the test capacitance value and the test voltage value of the function debugger, the change data of the IGBT module in the test process is acquired by the acquisition device to obtain the test data of the IGBT module, and finally the test data is analyzed to obtain the performance test result of the IGBT module, the duty ratio of the function debugger, the test inductance value, the test capacitance, therefore, the testing environment of the IGBT module 4 is closer to the real use working condition, and the accuracy of the testing data of the IGBT module 4 is ensured.

In addition, the upper computer is adopted for carrying out unified control and data acquisition, the same set of test equipment can be adopted for acquiring test data for the performance test of different IGBT modules, the data acquisition object and the acquisition position are relatively fixed, and the test environment does not need to be frequently disassembled and set up, so that the manual intervention in the test process is reduced, and the efficiency, the precision and the reliability of the test process are improved.

In an embodiment, the test parameters further include a test temperature, in step S20, that is, the upper computer sets the operation parameters of the test equipment in the IGBT module performance test system according to the duty cycle of the function debugger, the test inductance value, the test capacitance value, and the test voltage value, specifically including the following steps:

s21: the upper computer sets the operation parameters of the function debugger according to the duty ratio of the function debugger;

s22: the upper computer sets the operation parameters of the inductance simulator according to the test inductance value;

s23: the upper computer sets the operation parameters of the capacitance simulator according to the test capacitance value;

s24: the upper computer sets the operation parameters of the voltage simulator according to the test voltage value;

s25: the upper computer sets the operation parameters of the constant temperature and humidity box according to the test temperature in the test parameters;

s26: and the upper computer sets the operation parameters of the cooling system according to the cooling water requirement in the test parameters.

The IGBT module performance test system in the embodiment further comprises a constant temperature and humidity box, the constant temperature and humidity box is connected with the upper computer in a communication connection line mode and used for providing test temperature and test humidity for the IGBT module, the working temperature and humidity of the constant temperature and humidity box can be set through the upper computer to form the ambient temperature and humidity for testing the IGBT module, and therefore temperature characteristic test of the IGBT module is achieved.

After the duty ratio, the test inductance value, the test capacitance value, the test voltage value and the test temperature of the function debugger are set by the upper computer, the upper computer respectively sets the operation parameters of the function debugger, the constant temperature and humidity tank, the cooling system, the voltage simulator, the inductance simulator and the capacitance simulator according to the duty ratio, the test temperature value, the cooling water requirement, the test voltage value, the test inductance value and the test capacitance value of the function debugger, namely, each test device in the performance test system of the IGBT module outputs corresponding values according to the set test inductance value, test capacitance value, test voltage value and test temperature to provide a test environment for the IGBT module, the function debugger outputs corresponding pulse width modulation signals (PWM signals) according to the duty ratio of the function debugger set by the upper computer, the PWM signals control the on and off of the IGBT module through the control device, thereby realizing the action of the IGBT module, so as to control the IGBT module to complete performance test in a test environment.

Wherein, the test parameter that the host computer set for still includes other parameters. For example, the test parameters set on the upper computer include the environment temperature and humidity for testing, the cooling water flow and temperature, the inductance value, the capacitance value, the voltage value and the like, so that when the performance test is performed on the IGBT module, the battery simulator, the inductance simulator and the capacitance simulator provide different test voltages, test inductances and test capacitances for the IGBT module to be tested according to different inductance values, capacitance values and voltage values, and the constant temperature and humidity box and the water cooling system provide the environment temperature and humidity, the cooling water flow and temperature for the IGBT module to be tested according to different environment temperature and humidity, cooling water flow and temperature.

In this embodiment, the test parameters including the environment temperature and humidity, the cooling water flow rate and temperature, the inductance value, the capacitance value, and the voltage value for the test are only exemplary illustrations, and in other embodiments, the test parameters may also include the operation parameters of other test devices, which are not described herein again.

In the embodiment, the upper computer sets the operation parameters of the function debugger according to the duty ratio of the function debugger, setting the operation parameters of the inductance simulator according to the tested inductance value, setting the operation parameters of the capacitance simulator according to the tested capacitance value by the upper computer, setting the operation parameters of the voltage simulator according to the test voltage value, setting the operation parameters of the constant temperature and humidity box according to the test temperature in the test parameters, the operation parameters of the cooling system are set according to the cooling water requirement in the test parameters, the step of setting the operation parameters of the test equipment in the IGBT module test system according to the duty ratio of the function debugger, the test inductance value, the test capacitance value and the test voltage value is detailed, the test temperature can be set through the upper computer, on the basis of guaranteeing the accuracy of the test data, the temperature characteristic test can be carried out on the IGBT module, and the test range of the IGBT module is expanded.

In an embodiment, the test parameters further include a trigger condition, as shown in fig. 3, in step S30, that is, the upper computer acquires change data of the IGBT module in the test process through the acquisition device to obtain test data of the IGBT module, specifically including the following steps:

s31: in the testing process, the upper computer controls the acquisition device to acquire the voltage and the current of the IGBT module at different positions so as to obtain sampling data.

S32: it is determined whether the sampled data satisfies a trigger condition.

In order to save storage space and improve data acquisition and storage efficiency, the test parameters in this embodiment further include trigger conditions, that is, when the test parameters of each test device are set by the upper computer, the trigger conditions for recording and storing data can be set. In the testing process, after the sampling data is obtained, whether the triggering condition is met or not is determined according to the sampling data so as to determine whether the collected data is stored or not. And if the sampling data are determined not to meet the triggering condition, the testing environment of the IGBT module is not stable, and the sampling data are invalid, so that the sampling data obtained by the acquisition device are not stored.

S33: and if the sampling data meet the triggering condition, the upper computer stores the sampling data to be used as the test data of the IGBT module.

After whether the sampling data meet the trigger condition or not is determined, if the sampling data meet the trigger condition, the testing environment of the IGBT module is shown to be unstable, the sampling data are effective, the upper computer stores the sampling data to serve as the testing data of the IGBT module, and the accuracy of the testing data is improved.

In this embodiment, in the test process, the host computer passes through the collection system and gathers the voltage and the electric current of IGBT module different positions to obtain the sampling data, confirm whether the sampling data satisfies the trigger condition, if the sampling data satisfies the trigger condition, then save the sampling data, with the test data as the IGBT module, further guaranteed the accuracy of test data.

It should be understood that, the sequence numbers of the steps in the foregoing embodiments do not imply an execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present invention. For specific limitations of the IGBT module performance testing method, reference may be made to the above limitations of the IGBT module performance testing system, and details are not repeated here. Each test device in the IGBT module performance test system described above may be implemented wholly or partially by software, hardware, and a combination thereof.

In one embodiment, an upper computer is provided, and the upper computer corresponds to the performance test method for the IGBT module in the above embodiments one to one. As shown in fig. 4, the upper computer includes a first obtaining module 401, a setting module 402, a third obtaining module 403, and an analyzing module 404. The functional modules are explained in detail as follows:

the first obtaining module 401 is configured to obtain test parameters input by a tester, where the test parameters are set according to test requirements of the IGBT module, and the test parameters include a duty cycle of a function debugger, a test inductance value, a test capacitance value, and a test voltage value;

a setting module 402, configured to set an operating parameter of a test device in the IGBT module performance test system according to the duty cycle of the function debugger, the test inductance value, the test capacitance value, and the test voltage value, so as to perform a performance test on the IGBT module;

a second obtaining module 403, configured to obtain, by using an acquisition device, change data of the IGBT module in a test process, so as to obtain test data of the IGBT module;

an analyzing module 404, configured to analyze the test data to obtain a performance test result of the IGBT module.

Further, the setting module 402 is specifically configured to:

setting operation parameters of the function debugger according to the duty ratio of the function debugger;

setting operation parameters of an inductance simulator according to the test inductance value;

setting operation parameters of the capacitance simulator according to the test capacitance value;

setting operation parameters of the voltage simulator according to the test voltage value;

setting operation parameters of the constant temperature and humidity box according to the test temperature in the test parameters;

and setting the operation parameters of the cooling system according to the cooling water requirement in the test parameters.

Further, the second obtaining module 403 is specifically configured to:

in the testing process, controlling the acquisition device to acquire the voltage and the current of the IGBT module at different positions so as to obtain sampling data;

determining whether the sampled data satisfies a trigger condition;

and if the sampling data meet the triggering condition, storing the sampling data to be used as test data of the IGBT module.

In one embodiment, a host computer is provided that includes a processor, a memory, and a database connected by a system bus. Wherein, the processor of the upper computer is used for providing calculation and control capability. The memory of the upper computer comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The database of the upper computer is used for storing test data, test results and the like. The computer program is executed by a processor to implement a method for testing the performance of an IGBT module.

In one embodiment, as shown in fig. 5, there is provided a host computer, including a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the following steps:

In one embodiment, a readable storage medium is provided, having stored thereon a computer program which, when executed by a processor, performs the steps of:

It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Volatile memory can include Random Access Memory (RAM) or external cache memory.

It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions.

The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention.

Claims

1. An IGBT module performance test system, characterized by, includes:

2. The IGBT module performance testing system of claim 1, further comprising a constant temperature and humidity chamber, the IGBT module disposed within the constant temperature and humidity chamber.

3. The IGBT module performance testing system of claim 1, further comprising a water cooling system connected with the IGBT module for cooling the IGBT module.

4. The IGBT module performance testing system of claim 1, wherein the collecting device comprises a multi-channel oscilloscope connected with the upper computer, and the multi-channel oscilloscope is used for collecting voltage and current of the IGBT module at different positions in the testing process.

5. The IGBT module performance testing system of claim 1, wherein the acquisition device further comprises a data collector connected with the upper computer, the data collector being configured to acquire test data of the inductance simulator, the capacitance simulator, and the battery simulator.

6. The IGBT module performance testing system of any one of claims 1-5, characterized in that the control device comprises a control module and a drive module, and the function debugger, the control module and the drive module are sequentially connected and form a control circuit and a drive circuit of the IGBT module to control the IGBT module to perform performance testing.

7. The IGBT module performance testing system of claim 6, further comprising a programmable low voltage power supply connected with the upper computer, the function debugger, and the control module for providing a low voltage to the IGBT module according to test parameters.

8. An IGBT module performance testing method for use in the IGBT module performance testing system according to any one of claims 1 to 7, the method comprising:

9. The method for testing the performance of the IGBT module according to claim 8, wherein the upper computer sets the operating parameters of the test equipment in the IGBT module performance testing system according to the duty cycle of the function debugger, the test inductance value, the test capacitance value and the test voltage value, and comprises:

10. The IGBT module performance test method of claim 8, wherein the upper computer obtains the change data of the IGBT module in the test process through an acquisition device to obtain the test data of the IGBT module, and the method comprises the following steps: