CN111599669B - 一种适用于发热涂层材料欧姆电极的制作方法 - Google Patents
一种适用于发热涂层材料欧姆电极的制作方法 Download PDFInfo
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- CN111599669B CN111599669B CN202010397246.2A CN202010397246A CN111599669B CN 111599669 B CN111599669 B CN 111599669B CN 202010397246 A CN202010397246 A CN 202010397246A CN 111599669 B CN111599669 B CN 111599669B
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- 238000000576 coating method Methods 0.000 title claims abstract description 52
- 239000011248 coating agent Substances 0.000 title claims abstract description 51
- 239000000463 material Substances 0.000 title claims abstract description 45
- 238000010438 heat treatment Methods 0.000 title claims abstract description 39
- 238000000034 method Methods 0.000 title claims abstract description 32
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 25
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 35
- 239000000758 substrate Substances 0.000 claims abstract description 31
- 239000000919 ceramic Substances 0.000 claims abstract description 21
- 229910052751 metal Inorganic materials 0.000 claims abstract description 17
- 239000002184 metal Substances 0.000 claims abstract description 17
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 13
- 239000002002 slurry Substances 0.000 claims abstract description 8
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 26
- 229910052799 carbon Inorganic materials 0.000 claims description 26
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 20
- 238000012545 processing Methods 0.000 claims description 11
- 229910052757 nitrogen Inorganic materials 0.000 claims description 10
- 238000004140 cleaning Methods 0.000 claims description 8
- 238000009616 inductively coupled plasma Methods 0.000 claims description 7
- 238000001035 drying Methods 0.000 claims description 5
- 239000007789 gas Substances 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- 239000001307 helium Substances 0.000 claims description 5
- 229910052734 helium Inorganic materials 0.000 claims description 5
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 5
- 238000004506 ultrasonic cleaning Methods 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 238000001816 cooling Methods 0.000 claims description 3
- 238000007650 screen-printing Methods 0.000 claims description 3
- 238000005507 spraying Methods 0.000 claims description 3
- 239000003575 carbonaceous material Substances 0.000 abstract description 15
- 230000008569 process Effects 0.000 abstract description 7
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- 238000000926 separation method Methods 0.000 abstract description 2
- 239000010410 layer Substances 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 10
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 6
- 239000001301 oxygen Substances 0.000 description 6
- 229910052760 oxygen Inorganic materials 0.000 description 6
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 5
- 229910052709 silver Inorganic materials 0.000 description 5
- 239000004332 silver Substances 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 150000002500 ions Chemical class 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 238000001020 plasma etching Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000001179 sorption measurement Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000004411 aluminium Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 239000008367 deionised water Substances 0.000 description 2
- 229910021641 deionized water Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 239000012466 permeate Substances 0.000 description 2
- 238000002791 soaking Methods 0.000 description 2
- 239000002344 surface layer Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- -1 and the like Substances 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 238000000861 blow drying Methods 0.000 description 1
- 239000006255 coating slurry Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005489 elastic deformation Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000004321 preservation Methods 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- FDNAPBUWERUEDA-UHFFFAOYSA-N silicon tetrachloride Chemical compound Cl[Si](Cl)(Cl)Cl FDNAPBUWERUEDA-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Images
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
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CN202010397246.2A CN111599669B (zh) | 2020-05-12 | 2020-05-12 | 一种适用于发热涂层材料欧姆电极的制作方法 |
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CN202010397246.2A CN111599669B (zh) | 2020-05-12 | 2020-05-12 | 一种适用于发热涂层材料欧姆电极的制作方法 |
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CN111599669A CN111599669A (zh) | 2020-08-28 |
CN111599669B true CN111599669B (zh) | 2023-01-31 |
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Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3402867A1 (de) * | 1984-01-27 | 1985-08-01 | Siemens AG, 1000 Berlin und 8000 München | Halbleiterbauelement mit kontaktloch |
US5395678A (en) * | 1988-04-30 | 1995-03-07 | Seiko Epson Corporation | Thin film color filter for liquid crystal display |
US6400388B1 (en) * | 1999-08-11 | 2002-06-04 | Riso Kagaku Corporation | Thick film thermal head and method of making the same |
CN101593650A (zh) * | 2009-06-25 | 2009-12-02 | 南京华显高科有限公司 | 能防止面板黄化的荫罩式等离子体显示面板前板金属电极的制作方法 |
WO2011047838A1 (de) * | 2009-10-19 | 2011-04-28 | Admedes Schuessler Gmbh | Verfahren zum herstellen einer elektrode und korrespondierende elektrode |
CN202014381U (zh) * | 2011-03-17 | 2011-10-19 | 武汉恒升电子有限公司 | 一种多孔陶瓷发热体 |
CN103150075A (zh) * | 2013-03-19 | 2013-06-12 | 宏科有限公司 | 带有立体导通孔的电容式控制屏及其制造方法 |
CN103163197A (zh) * | 2013-03-12 | 2013-06-19 | 西安交通大学 | 一种加工电化学微电极的方法 |
CN104538468A (zh) * | 2015-01-21 | 2015-04-22 | 李毅 | 硅基薄膜太阳能电池及其制造方法 |
CN107331489A (zh) * | 2017-05-16 | 2017-11-07 | 揭阳空港经济区弘新电子有限公司 | 一种复合电极电子陶瓷元件的制造工艺 |
CN110028252A (zh) * | 2019-05-22 | 2019-07-19 | 西安工业大学 | 一种提高玻璃基底发热涂层工作稳定性的方法 |
CN110401989A (zh) * | 2019-08-16 | 2019-11-01 | 西安工业大学 | 提高微晶玻璃基底上薄膜电极引出线工作稳定性的方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5141775B2 (ja) * | 2008-12-02 | 2013-02-13 | 株式会社村田製作所 | ガスセンサ |
-
2020
- 2020-05-12 CN CN202010397246.2A patent/CN111599669B/zh active Active
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3402867A1 (de) * | 1984-01-27 | 1985-08-01 | Siemens AG, 1000 Berlin und 8000 München | Halbleiterbauelement mit kontaktloch |
US5395678A (en) * | 1988-04-30 | 1995-03-07 | Seiko Epson Corporation | Thin film color filter for liquid crystal display |
US6400388B1 (en) * | 1999-08-11 | 2002-06-04 | Riso Kagaku Corporation | Thick film thermal head and method of making the same |
CN101593650A (zh) * | 2009-06-25 | 2009-12-02 | 南京华显高科有限公司 | 能防止面板黄化的荫罩式等离子体显示面板前板金属电极的制作方法 |
EP2461934A1 (de) * | 2009-10-19 | 2012-06-13 | Admedes Schuessler GmbH | Verfahren zum herstellen einer elektrode und korrespondierende elektrode |
WO2011047838A1 (de) * | 2009-10-19 | 2011-04-28 | Admedes Schuessler Gmbh | Verfahren zum herstellen einer elektrode und korrespondierende elektrode |
CN202014381U (zh) * | 2011-03-17 | 2011-10-19 | 武汉恒升电子有限公司 | 一种多孔陶瓷发热体 |
CN103163197A (zh) * | 2013-03-12 | 2013-06-19 | 西安交通大学 | 一种加工电化学微电极的方法 |
CN103150075A (zh) * | 2013-03-19 | 2013-06-12 | 宏科有限公司 | 带有立体导通孔的电容式控制屏及其制造方法 |
CN104538468A (zh) * | 2015-01-21 | 2015-04-22 | 李毅 | 硅基薄膜太阳能电池及其制造方法 |
CN107331489A (zh) * | 2017-05-16 | 2017-11-07 | 揭阳空港经济区弘新电子有限公司 | 一种复合电极电子陶瓷元件的制造工艺 |
CN110028252A (zh) * | 2019-05-22 | 2019-07-19 | 西安工业大学 | 一种提高玻璃基底发热涂层工作稳定性的方法 |
CN110401989A (zh) * | 2019-08-16 | 2019-11-01 | 西安工业大学 | 提高微晶玻璃基底上薄膜电极引出线工作稳定性的方法 |
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Effective date of registration: 20240123 Address after: Room 107-1, 1st Floor, Zhumengchuangzhi Space, Zone A, Zhonghan Industrial Park, Gaoke 3rd Road, High tech Industrial Development Zone, Xianyang City, Shaanxi Province, 2023 Patentee after: Shaanxi Yuhua Pule New Energy Technology Co.,Ltd. Country or region after: China Address before: 710032 No. 2 Xuefu Middle Road, Weiyang District, Xi'an City, Shaanxi Province Patentee before: XI'AN TECHNOLOGICAL University Country or region before: China |
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