CN111460189B

CN111460189B - Panel re-judging method, device, server, computer equipment and storage medium

Info

Publication number: CN111460189B
Application number: CN202010248333.1A
Authority: CN
Inventors: 王彬旭; 刘志伟
Original assignee: China Display Optoelectronics Technology Huizhou Co Ltd
Current assignee: China Display Optoelectronics Technology Huizhou Co Ltd
Priority date: 2020-04-01
Filing date: 2020-04-01
Publication date: 2024-09-06
Anticipated expiration: 2040-04-01
Also published as: CN111460189A

Abstract

The invention relates to a panel re-judging method, a device, a server, computer equipment and a storage medium, wherein the method comprises the steps of obtaining test data of a panel; detecting whether the test data is matched with preset test data or not; when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to a part of the test data which is not matched with the preset test data; detecting whether the defect characteristic picture is matched with a preset characteristic picture or not; and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state. When the panel is determined to be subjected to the repeated judgment, a corresponding defect characteristic picture is generated according to the acquired test data, and is compared with a preset characteristic picture, so that the repeated judgment state of the panel is rapidly judged, the repeated judgment process is automated through the collection of the test data of the panel, the manual detection process is reduced, and the repeated judgment difficulty of the panel is reduced.

Description

Panel re-judging method, device, server, computer equipment and storage medium

Technical Field

The present invention relates to the field of panel detection, and in particular, to a panel re-judging method, device, server, computer device, and storage medium.

Background

With the improvement of the technical level of the liquid crystal display industry, the defect of the display screen of the liquid crystal module becomes an important standard for the excellent judgment of the liquid crystal display. In the liquid crystal module industry, AOI (Automated Optical Inspection, automatic optical inspection) is adopted to detect the defects of the product picture at present in the picture inspection, the defective products of the equipment after the inspection are required to be manually subjected to repeated judgment inspection again, and test information related to the product is not bound in the repeated judgment process, so that each area of each picture is required to be inspected respectively, and the repeated judgment operation difficulty is high.

Disclosure of Invention

Based on this, it is necessary to provide a panel re-judging method, device, server, computer device and storage medium for reducing the re-judging difficulty of the panel.

A panel re-judging method comprises the following steps: acquiring test data of a panel; detecting whether the test data are matched with preset test data or not; when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to a part of the test data which is not matched with the preset test data; detecting whether the defect characteristic picture is matched with a preset characteristic picture or not; and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

In one embodiment, the acquiring test data of the panel includes: carrying out optical detection on the panel and obtaining a detection picture of the panel; and acquiring the test data according to the detection picture.

In one embodiment, the test data comprises test result data; and the characteristic position data are used for determining the position of the test result data on the panel.

In one embodiment, the detecting whether the test data matches the preset test data includes: detecting whether the test result data is identical to the preset test data; and when the test result data is different from the preset test data, judging that the test data is not matched with the preset test data.

In one embodiment, when the test data does not match the preset test data, the obtaining the defect feature picture corresponding to the portion of the test data that does not match the preset test data includes: and when the test data are not matched with the preset test data, acquiring characteristic position data corresponding to a part, which is different from the preset test data, of the test result data, and acquiring the corresponding defect characteristic picture according to the characteristic position data.

In one embodiment, the defect feature screen includes at least one feature detection screen; the detecting whether the defect characteristic picture is matched with a preset characteristic picture comprises the following steps: detecting whether each feature detection picture is identical to a corresponding preset feature picture or not in sequence; and when the characteristic detection picture is the same as the corresponding preset characteristic picture, judging that the defect characteristic picture is matched with the preset characteristic picture.

In one embodiment, after the sequentially detecting whether each of the feature detection frames is the same as the corresponding preset feature frame, the method further includes: and when the characteristic detection picture is different from the corresponding preset characteristic picture, judging that the defect characteristic picture is not matched with the preset characteristic picture.

In one embodiment, after the determining that the defect feature screen does not match the preset feature screen, the method further includes: and when the defect characteristic picture is not matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging failure state.

In one embodiment, the re-judging state corresponds to the panel, and the sorting device is used for sorting the panel according to the updated re-judging state.

A panel re-judging device, comprising: the acquisition module is used for acquiring test data of the panel; the first detection module is used for detecting whether the test data are matched with preset test data or not; when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to a part of the test data which is not matched with the preset test data; the second detection module is used for detecting whether the defect characteristic picture is matched with a preset characteristic picture or not; and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of: acquiring test data of a panel; detecting whether the test data are matched with preset test data or not; when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to a part of the test data which is not matched with the preset test data; detecting whether the defect characteristic picture is matched with a preset characteristic picture or not; and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

A server, comprising: a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the steps of: acquiring test data of a panel; detecting whether the test data are matched with preset test data or not; when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to a part of the test data which is not matched with the preset test data; detecting whether the defect characteristic picture is matched with a preset characteristic picture or not; and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

A computer readable storage medium having stored thereon a computer program which when executed by a processor performs the steps of: acquiring test data of a panel; detecting whether the test data are matched with preset test data or not; when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to a part of the test data which is not matched with the preset test data; detecting whether the defect characteristic picture is matched with a preset characteristic picture or not; and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

In the panel re-judging method, the device, the server, the computer equipment and the storage medium, whether the panel needs to be re-judged or not is judged according to the specific condition of the test data of the panel, when the panel is determined to need to be re-judged, the corresponding defect characteristic picture is generated according to the test data acquired before, and the defect characteristic picture is compared with the preset characteristic picture, so that the re-judging state of the panel is judged rapidly, the re-judging process is automated through the collection of the test data of the panel, the manual detection procedure is reduced, and the re-judging difficulty of the panel is reduced.

Drawings

FIG. 1 is a flow chart of a panel re-judging method according to an embodiment;

fig. 2 is an internal structural diagram of a computer device according to an embodiment.

Detailed Description

In order that the invention may be readily understood, a more complete description of the invention will be rendered by reference to the appended drawings. The drawings illustrate preferred embodiments of the invention. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

It will be understood that when an element is referred to as being "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like are used herein for illustrative purposes only and are not meant to be the only embodiment.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.

The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.

The invention relates to a panel re-judging method. In one embodiment, the panel re-judging method includes: acquiring test data of a panel; detecting whether the test data is matched with preset test data or not; when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to a part of the test data which is not matched with the preset test data; detecting whether the defect characteristic picture is matched with a preset characteristic picture or not; and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state. Judging whether the panel needs to be subjected to the re-judgment according to the specific condition of the test data of the panel, generating a corresponding defect characteristic picture according to the test data acquired before when the panel needs to be subjected to the re-judgment, and comparing the defect characteristic picture with a preset characteristic picture, so that the re-judgment state of the panel is judged quickly, the re-judgment process is automated through the collection of the test data of the panel, the manual detection procedure is reduced, and the re-judgment difficulty of the panel is reduced.

Please refer to fig. 1, which is a flowchart illustrating a panel re-judging method according to an embodiment of the present invention.

A panel re-judging method comprises the following steps.

S100: test data of the panel is obtained.

In this embodiment, the test data is the data of the panel after the panel is detected by the automatic optical detector, that is, the test data is the frame detection data of the panel, that is, the test data is the frame defect detection data of the panel, the test data includes the surface data information of the panel, and the test data shows that the defect condition of the current frame of the panel is converted into specific data. The method comprises the steps of converting the picture defect condition of the panel into test data, adopting an image processing mode to realize the conversion, and generating the test data after the test data are detected by an automatic optical detector, namely, the test data are automatically generated in the automatic optical detector, the test data are transmitted to a database by a system or a device where the automatic optical detector is positioned for storage and update, and the test data of each panel are respectively and independently stored in the database, so that a follow-up panel re-judging device can acquire the test data corresponding to each panel from the database, thereby being convenient for accurately acquiring the defect picture of each panel, further being convenient for accurately detecting the panel needing re-judgment, reducing the steps of manually re-judging and checking again, and reducing the re-judging detection difficulty. And after the test data is acquired, the test data is uploaded to a database for updating and storing, so that the subsequent acquisition of the test condition of the product according to the identification code on the product is facilitated.

S200: and detecting whether the test data is matched with the preset test data.

In this embodiment, the preset test data is standard test data, that is, the preset test data is preset test data of the panel re-judging device, and the preset test data is test data obtained after the panel meeting the production requirement is detected by the automatic optical detector, that is, the preset test data is test data serving as a detection standard for detecting the panel to be re-judged. Thus, according to the test data of the panel detected by the optical detector, the test data of the panel is compared with the test data of the standard panel, so that the defect condition of the current panel can be accurately compared, and whether the current panel is a product needing to be re-judged according to the comparison result can be conveniently and subsequently judged, so that a judgment basis is provided for the re-judgment of the panel detected by the automatic optical detector, and further, the qualified products and the re-judged products in a plurality of panels can be conveniently distinguished, and the classification of the panel needing to be re-judged can be conveniently realized.

S300: and when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to the part of the test data which is not matched with the preset test data.

In this embodiment, the defect feature picture is a picture of the test data when the test data is not matched with the preset test data, that is, a feature picture corresponding to the test data when the test data is not matched with the preset test data, that is, a feature picture of the test data with defects corresponding to a portion of the test data not matched with the preset test data when the test data is not matched with the preset test data. Because the preset test data corresponds to the test data of the standard panel, after the preset test data is compared with the test data of the panel, whether the current panel is the standard panel or not is convenient to judge, and even if the current panel is a qualified panel or not, whether the current panel is a panel needing to be judged again or not is also convenient to judge. The test data is not matched with the preset test data, which indicates that the test data of the current panel is different from the preset test data, so that the defect is detected after the current panel passes through the automatic optical detector, namely, the current panel is the panel needing to be subjected to the re-judgment, namely, the next procedure of the current panel is the re-judgment detection. And when the test data of the current panel is not matched with the preset test data, the defect data of the current panel is obtained according to the test data, namely, the defect characteristic picture of the current panel is obtained, so that the defect condition of the current panel is displayed in an image form, the defect characteristic picture of the current panel is extracted from the test data, the current panel is convenient to be re-judged according to the defect characteristic picture, a judgment basis is provided for determining whether the current panel is a re-judged qualified product in the follow-up re-judgment, and the follow-up rapid judgment of the qualification condition of the current panel is convenient. In one embodiment, the defect feature screen has at least one defect, for example, the defect feature screen has at least one of a bubble defect, a bright dark spot defect, and a black cluster defect.

S400: and detecting whether the defect characteristic picture is matched with the preset characteristic picture or not.

In this embodiment, the defect feature frame is a frame with a defect of the currently detected panel, the preset feature frame is a frame with a defect of the panel conforming to the re-judging standard, and the detected defect feature frame and the preset feature frame are the frame with a defect of the detected current panel and the frame with a defect of the panel conforming to the re-judging standard. In this way, when the test data detect that the current panel is different from the preset test data, the current panel carries out the repeated judgment detection, and the current panel is compared with the panel meeting the repeated judgment standard by comparing the defect characteristic picture of the current panel with the preset characteristic picture, so that a judgment basis is provided for judging whether the current panel is the panel meeting the repeated judgment standard, further, the follow-up repeated judgment qualification of the current panel is facilitated, namely, the follow-up determination of whether the current panel is the panel meeting the repeated judgment standard is facilitated.

S500: and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

In this embodiment, the defect feature picture is matched with the preset feature picture, which indicates that the defect of the current panel is in the allowable range, wherein the preset feature picture provides a detection standard for the defect feature of the current panel, that is, the defect feature parameter of the current panel is smaller than the defect feature parameter in the preset feature picture, that is, the defect feature parameter of the current panel is in the range corresponding to the defect feature in the preset feature picture, so that the defect feature parameter of the current panel is in the normal feature parameter range, and therefore the defect feature parameter of the current panel meets the defect feature parameter requirement of the panel which is qualified in the re-judgment, and the current panel is conveniently determined to be the panel which is qualified in the re-judgment. And then updating the re-judging state of the current panel into a database, namely replacing the re-judging state corresponding to the current panel in the database with a re-judging qualified state, namely replacing the re-judging state corresponding to the current panel and stored in the database with the re-judging qualified state.

In the panel re-judging method, whether the panel needs to be re-judged or not is judged according to the specific condition of the test data of the panel, when the panel needs to be re-judged is determined, a corresponding defect characteristic picture is generated according to the test data acquired before, and the defect characteristic picture is compared with a preset characteristic picture, so that the re-judging state of the panel is judged rapidly, the re-judging process is automated through the collection of the test data of the panel, the manual detection procedure is reduced, and the re-judging difficulty of the panel is reduced. In the embodiment, after the method is applied to the production line, the omission factor of the whole production line is reduced by 21.7%, and 6 manual re-judging personnel are saved on each production line, namely, the number of the manual re-judging personnel on each production line is reduced from 8 to 2, so that the manufacturing cost of panel production is reduced.

In one embodiment, acquiring test data for a panel includes: performing optical detection on the panel, and acquiring a detection picture of the panel; and acquiring test data according to the detection picture. In this embodiment, the detection frame is a frame on the current panel, that is, the detection frame is obtained from the current panel by the optical detector, that is, the optical detector obtains the detection frame after performing optical test on the surface of the current panel, where the detection frame includes all frames on the surface of the current panel, so that all frames of the current panel are detected, and thus, the detection frame is convenient to obtain test data corresponding to the current panel, that is, the test data is a parameter corresponding to the test frame of the current panel, and the subsequent detection of the frame of the current panel is convenient.

In one embodiment, the test data comprises test result data; and the characteristic position data are used for determining the position of the test result data on the panel. In this embodiment, the test data includes test result data for determining whether the panel is defective or not, and feature position data for determining a defective position of the panel, where the feature position data on each panel corresponds to the test result data of the panel itself, that is, each of the test result data has the corresponding feature position data. The test result data is one of the test data, the test result data is determined by the optical detector according to the defect condition of the current panel, namely the current panel has defects, and the test result data corresponding to the current panel is unqualified for optical test; and the current panel has no defect, and the test result data corresponding to the current panel is qualified by light test. When the defect condition exists in the current panel, the characteristic position data is a parameter corresponding to the defect on the current panel, namely the characteristic position data is a characteristic parameter of the defect on the current panel, for example, the characteristic position data comprises a coordinate position parameter corresponding to the defect on the current panel; as another example, the feature location data includes an area parameter corresponding to a defect on the current panel; as another example, the feature location data includes defect type parameters corresponding to defects on the current panel. The test result data and the characteristic position data are stored in the database, namely, the test result data and the characteristic position data of the current panel are updated in the database.

In one embodiment, prior to acquiring the test data, the method comprises: acquiring an identification code of a panel; the panel is optically inspected according to the identification code. Thus, the test data of the panel is acquired according to the result of the optical detection.

In one embodiment, after acquiring the test data, the method comprises: detecting whether a test record exists in the database according to the identification code of the panel; when the database has a test record corresponding to the identification code of the panel, detecting whether the database is updated normally or not; when the database update is normal, the test data is updated in the database. Therefore, the test data of the current panel with the test records are updated according to the identification codes of the current panel, so that the real-time test data of the current panel is ensured to be updated in the database, the latest test data of the current panel is conveniently obtained from the database, and the detection accuracy of the current panel is improved. In one embodiment, the database comprises a cloud server.

In one embodiment, when the database has a test record corresponding to the identification code of the panel, detecting whether the database update is normal further includes: when the database is updated abnormally, storing the test data in a local server; detecting whether a local network is normal; when the local network is normal, the test data is retried to be uploaded to the database. When the local network is abnormal and the test data is failed to be re-tried to be uploaded to the database, the current data uploading failure is prompted. Therefore, under the condition that the network is abnormal, the optical detection system stores the test data in the local server, so that the test data can be stored temporarily, and the loss of the test data is avoided. After the re-uploading fails, the test data is processed from the local server by a human, for example, the test data in the local server is manually updated in the database, so that the test data of each panel can be queried in the database, and further the data loss in the database is avoided.

In one embodiment, the detecting whether the test record exists in the database according to the identification code of the panel further comprises: and when the test record corresponding to the identification code of the panel does not exist in the database, writing the test data into the database. In this way, the test data of the panel which is not detected is inserted into the database to form new test data, so that the test data of the panel which is newly added and needs to be detected can be conveniently stored. In one embodiment, the identification code includes a two-dimensional code of the panel, so that after the two-dimensional code is read, the sorting system obtains test data of the corresponding panel in the database through the two-dimensional code, and simultaneously prompts a complex judgment operator in a voice mode. In one embodiment, the two-dimensional code is also used for tracing the production of the panel, namely, the optical detection of the panel, the complex judgment result and other data can be obtained in the database through the two-dimensional code, namely, in the database, the production and detection information of the corresponding panel are obtained according to the two-dimensional code, so that the complex inspection of all the manufacturing processes of the panel is facilitated.

In one embodiment, detecting whether the test data matches the preset test data includes: detecting whether the test result data is the same as the preset test data; and when the test result data is different from the preset test data, judging that the test data is not matched with the preset test data. In this embodiment, the preset test data includes a test result corresponding to the standard panel, that is, the preset test data includes preset test result data after the standard panel is detected by the optical detector, that is, whether the detected test result data is the same as the preset test data includes: and detecting whether the test result data is the same as the preset test result data, and determining the test result of the current panel according to the comparison with the preset test result data, so that the matching condition of the test data of the current panel and the preset test data is determined, and further, the condition of whether the current panel has defects is determined. And when the test data is not matched with the preset test data, obtaining a defect feature picture corresponding to a part of the test data, which is not matched with the preset test data, includes: and when the test data are not matched with the preset test data, acquiring characteristic position data corresponding to a part, which is different from the preset test data, of the test result data, and acquiring the corresponding defect characteristic picture according to the characteristic position data. When the test result data is different from the preset test data, the defect of the surface of the current panel is indicated, namely, the defect picture of the surface of the current panel is determined after the current panel passes through the optical detector, and the test data of the current panel comprises characteristic position data which corresponds to specific parameters of the defect position of the current panel, namely, the characteristic position data shows the specific position condition of the defect position of the current panel, for example, the characteristic position data comprises the position coordinates of the defect of the current panel, thereby facilitating the acquisition of the characteristic position data corresponding to the part of the test result data which is different from the preset test data, And further obtaining a defect characteristic picture corresponding to the current panel. in this way, under the condition that the test result data is different from the preset test data, the defect on the current panel is determined, so that the current panel needs to be subjected to a subsequent repeated judging process, in order to facilitate the subsequent accurate repeated judgment of the current panel, a defect characteristic picture of the current panel is generated according to the characteristic position data, the defect characteristic picture shows the specific condition of the defect on the current panel, and the subsequent judgment of whether the current panel meets the repeated judging standard according to the defect characteristic picture is facilitated, thereby facilitating the subsequent judgment of whether the current panel is a qualified panel for repeated judgment according to the specific defect picture, and further facilitating the distinguishing of products which need to be repeated judgment after being detected by the optical detector. In one embodiment, the test result data and the feature position data are respectively stored in the database in a corresponding manner, and the test result data and the feature position data correspond to the identification codes of the corresponding panels, so that the test result data and the feature position data of the panels can be obtained by reading the identification codes of the panels, and a defect feature picture which is subsequently compared with a preset feature picture can be conveniently generated. In one embodiment, the defect feature picture is a defect feature picture corresponding to a portion of the test result data that is different from the preset test data, that is, the defect feature picture is a feature picture corresponding to a portion of the test result data that is different from the preset test data and has a defect.

In one embodiment, the defect feature screen includes at least one feature detection screen. In this embodiment, each feature detection picture is used for comparing with a corresponding preset feature picture, and the defect feature picture includes multiple defects, that is, multiple defects exist on the panel at the same time, and the same defect features are presented in the same feature detection picture, so that the defects of the same type are conveniently compared, the defects of various types are conveniently and respectively compared, and the comparison difficulty of the defect feature picture and the preset feature picture is reduced. In one embodiment, different defect types exist in different areas on the panel, i.e. each area of the panel corresponds to a defect, and each area forms a corresponding feature detection screen.

In one embodiment, detecting whether the defect feature screen matches the preset feature screen includes: sequentially detecting whether each feature detection picture is identical to a corresponding preset feature picture; and when the feature detection picture is the same as the corresponding preset feature picture, judging that the defect feature picture is matched with the preset feature picture. In this embodiment, the preset feature frames include a plurality of feature frames, each feature frame corresponds to a defective feature frame, that is, the preset feature frame includes a plurality of standard defect frames, each feature detection frame is compared with the corresponding standard defect frame to detect whether the feature detection frame is identical to the corresponding standard defect frame, and the standard defect frame is a standard detection frame for judging the feature detection frame, that is, when the parameter of the defect on the feature detection frame is smaller than or equal to the parameter of the defect on the standard defect frame, the defective feature frame of the current panel is a panel meeting the re-judging standard, that is, when the parameter of the defect on the feature detection frame is within the range of the parameter of the defect on the standard defect frame, the defective feature frame of the current panel is a panel meeting the re-judging standard. In addition, the defects on the preset feature pictures provide a controllable range of parameters of the defects, namely, the defects on the preset feature pictures provide an allowable error range of parameters of the defects, so long as the defects on each feature detection picture of the current panel are within the allowable error range of the defects of the corresponding preset feature pictures, the current panel can be judged to be the panel with qualified re-judgment, namely, the re-judgment state of the current panel is the re-judgment state, and the re-judgment state of the current panel is stored in the database in the form of data, so that a sorting system can conveniently obtain the optical detection and the re-judgment condition of each panel through the database, and the sorting system can conveniently rapidly distinguish and select the panel with qualified re-judgment and the panel with unqualified re-judgment, and the re-judgment difficulty of the panel is reduced. In one embodiment, the faulty panel is transferred to a manual inspection location for manual inspection.

In one embodiment, the same standard of the feature detection frames and the corresponding preset feature frames is that each feature detection frame is the same as the corresponding preset feature frame, i.e. all feature detection frames are the same as the corresponding preset feature frames, wherein the same is that the defects of the feature detection frames are within the allowable range of the defects of the corresponding preset feature frames, so that the defects of all feature detection frames meet the standard of the panel with qualified re-judgment.

In one embodiment, the allowable range of the defects of the preset feature screen includes at least one of the parameters of the number, width, length, area and area ratio in the screen, that is, the number of the defects of the feature detection screen is smaller than the number of the defects of the preset feature screen; for another example, the area of the defect of the feature detection picture is smaller than the area of the defect of the preset feature picture; for another example, the area ratio of the defect of the feature detection picture in the picture is smaller than the area ratio of the defect of the preset feature picture in the picture. Therefore, on the premise of not affecting the final display effect of the panel, the panel with the defects in the allowable range can be regarded as a qualified panel for the re-judgment, namely a panel meeting the production requirement.

In one embodiment, after sequentially detecting whether each feature detection picture is identical to the corresponding preset feature picture, the method further includes: and when the feature detection picture is different from the corresponding preset feature picture, judging that the defect feature picture is not matched with the preset feature picture. In this embodiment, since the feature detection frames have the same defects as the corresponding preset feature frames, that is, the defect type of each feature detection frame is the same as the defect type of the corresponding preset feature frame, for example, one of the defect of the feature detection frames is a black cluster defect, and the defect liquid level of the corresponding preset feature frame is a black cluster defect, the feature detection frames are compared with the corresponding preset feature frames, that is, the defect of the feature detection frames is compared with the defect of the same type of the corresponding preset feature frames. And after the defect characteristic picture is not matched with the preset characteristic picture, the method further comprises the following steps: and when the defect characteristic picture is not matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging failure state. The defect of the preset characteristic picture is taken as a re-judging standard, when the characteristic detection picture is different from the corresponding preset characteristic picture, the defect of the characteristic detection picture exceeds the error range allowed by the defect of the preset characteristic picture, namely the defect of the characteristic detection picture is not in accordance with the re-judging standard, namely the defect picture with the defect affecting panel display is indicated, so that the panel is determined to be an unqualified panel, the current panel is conveniently judged to be the panel with re-judging failure, the re-judging failure state of the current panel is stored in a database, namely the re-judging failure state is stored in the corresponding position of the identification code of the current panel in the database, and the sorting system is convenient to identify the panel with re-judging failure.

In one embodiment, the re-judging state corresponds to the panel, and the sorting device is used for sorting the panel according to the updated re-judging state. In this embodiment, the re-judging status is updated in a database, that is, each panel corresponds to updated re-judging status data, where the re-judging status of the panel is obtained according to the identification code, that is, after the identification code of the current panel is obtained, the corresponding re-judging status data is found in the database according to the identification code, and the product status of the current panel is judged according to the re-judging status data, for example, when the re-judging status data is in a re-judging qualified status, the product status corresponding to the panel is in a yellow single status. Therefore, the panel after the optical automatic detection is qualified, namely the panel with the product state of white single state, and the panel with the product state of yellow single state are sorted on the production line together, so that the qualified panel without repeated judgment and the panel after repeated judgment are sorted on the production line at the same time, and the production efficiency is improved.

In the above embodiments, the feature detection screen includes an ROI (region of interest ) defect definition map, and the defect region on the panel is mapped with pertinence to facilitate detection of the defective region screen. In one embodiment, the ROI defect definition map includes feature parameters of the defect, e.g., the ROI defect definition map includes X-axis coordinates and Y-axis coordinates of the defect; as another example, the ROI defect definition map includes the length and width of the defect; as another example, the ROI defect definition map includes defect type names of defects; as another example, the ROI defect definition map includes colors of corresponding pictures of defects. Therefore, the method is convenient for detecting different defect definition graphs, so that the pictures with different defects can be easily subjected to the re-judgment, and further, the pictures with different types of defects can be conveniently distinguished and subjected to the re-judgment.

In one embodiment, updating the re-determination status of the panel in the database to the re-determination failure status further includes: and acquiring defect position data according to at least one characteristic detection picture, and updating the defect position data to test data corresponding to the inner surface of the database.

In the embodiments, after the panel re-judging method is applied to the production line, the omission factor of the whole production line is reduced by 21.7%, 6 manual re-judging personnel are saved on each production line, namely 8 manual re-judging personnel on each production line are reduced to 2, so that the manufacturing cost of panel production is reduced.

It should be understood that, although the steps in the flowchart of fig. 1 are shown in sequence as indicated by the arrows, the steps are not necessarily performed in sequence as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in fig. 1 may include multiple sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, nor do the order in which the sub-steps or stages are performed necessarily performed in sequence, but may be performed alternately or alternately with at least a portion of other steps or sub-steps of other steps.

In one embodiment, a panel re-judging device is provided, the device comprising: the device comprises an acquisition module, a first detection module and a second detection module, wherein: the acquisition module is used for acquiring test data of the panel; the first detection module is used for detecting whether the test data are matched with preset test data or not; when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to a part of the test data which is not matched with the preset test data; the second detection module is used for detecting whether the defect characteristic picture is matched with the preset characteristic picture or not; and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

In this embodiment, the test data acquired by the acquisition module is the data of the panel after the panel is detected by the automatic optical detector, that is, the test data acquired by the acquisition module is the frame detection data of the panel, that is, the test data acquired by the acquisition module is the frame defect detection data of the panel, the test data includes the surface data information of the panel, and the test data shows that the defect condition of the current frame of the panel is converted into specific data. The image defect condition of the panel is converted into test data, the image processing mode is adopted, the test data panel is generated after being detected by the automatic optical detector, namely, the test data are automatically generated in the automatic optical detector, the acquisition module further transmits the test data to the database for storage and update, the test data of each panel are respectively and independently stored in the database, so that a follow-up panel re-judging device can acquire the test data corresponding to each panel from the database, the defect image of each panel can be conveniently and accurately acquired, the follow-up detection of the panel needing re-judging is facilitated, the steps of manually re-judging and checking are reduced, and the re-judging detection difficulty is reduced.

The preset test data is standard test data, namely the preset test data is preset test data of the panel re-judging device, and the preset test data is test data obtained after the panel meeting the production requirement is detected by the automatic optical detector, namely the preset test data is test data serving as detection standard and is used for detecting the panel needing re-judging. Thus, according to the test data of the panel detected by the optical detector at present, the first detection module compares the test data of the panel with the test data of the standard panel, namely, the first detection module compares the test data of the panel with the test data corresponding to the standard panel in the database, so that the defect condition of the current panel can be accurately compared, whether the current panel is a product needing to be re-judged according to the comparison result is convenient, a judgment basis is provided for re-judging the panel after the detection of the automatic optical detector, and further, qualified products and re-judged products in a plurality of panels can be distinguished, and the classification of the panel needing to be re-judged can be realized conveniently.

Because the preset test data corresponds to the test data of the standard panel, after the preset test data is compared with the test data of the panel, the first detection module is convenient to judge whether the current panel is the standard panel, and even if the first detection module is convenient to judge whether the current panel is a qualified panel, the first detection module is convenient to judge whether the current panel is the panel needing to be judged again. When the first detection module detects that the test data is not matched with the preset test data, the first detection module indicates that the test data of the current panel is different from the preset test data, so that the defect is detected after the current panel passes through the automatic optical detector, namely the current panel is the panel needing to be subjected to the re-judgment, namely the next procedure of the current panel is the re-judgment detection. And when the first detection module determines that the test data of the current panel is not matched with the preset test data, the defect data of the current panel is acquired according to the test data, namely, the first detection module acquires the defect characteristic picture of the current panel, so that the defect condition of the current panel is displayed in an image form, the defect characteristic picture of the current panel is extracted from the test data, the current panel is convenient to carry out repeated judgment according to the defect characteristic picture, a judgment basis is provided for determining whether the current panel is a qualified product of repeated judgment in the subsequent repeated judgment, and therefore, the subsequent rapid judgment of the qualification condition of the current panel is convenient. In one embodiment, the defect feature screen has at least one defect, for example, the defect feature screen has at least one of a bubble defect, a bright dark spot defect, and a black cluster defect.

The defect characteristic picture is a picture which is obtained by the first detection module and has defects of the currently detected panel, the preset characteristic picture is a picture which has defects of the panel conforming to the re-judging standard, the preset characteristic picture is a standard characteristic picture which is built in the second detection module and is used for re-judging, and the second detection module detects the defect characteristic picture and the preset characteristic picture, namely the picture which has defects of the current panel and the picture which has defects of the panel conforming to the re-judging standard are detected by the second detection module. In this way, when the test data detect that the current panel is different from the preset test data, the current panel carries out the repeated judgment detection, and the current panel is compared with the panel meeting the repeated judgment standard by comparing the defect characteristic picture of the current panel with the preset characteristic picture, so that a judgment basis is provided for judging whether the current panel is the panel meeting the repeated judgment standard, further, the follow-up repeated judgment qualification of the current panel is facilitated, namely, the follow-up determination of whether the current panel is the panel meeting the repeated judgment standard is facilitated.

When the second detection module detects that the defect characteristic picture is matched with the preset characteristic picture, the defect of the current panel is in an allowable range, wherein the preset characteristic picture provides a detection standard for the defect characteristic of the current panel, namely the defect characteristic parameter of the current panel is smaller than the defect characteristic parameter in the preset characteristic picture, namely the defect characteristic parameter of the current panel is in a range corresponding to the defect characteristic in the preset characteristic picture, so that the defect characteristic parameter of the current panel is in a normal characteristic parameter range, the defect characteristic parameter of the current panel meets the defect characteristic parameter requirement of the panel which is qualified in the re-judgment, and the current panel is conveniently determined to be the panel which is qualified in the re-judgment. And then, the second detection module updates the re-judging state of the current panel into the database, namely the second detection module replaces the re-judging state corresponding to the current panel in the database with the re-judging qualified state, namely the second detection module replaces the re-judging state corresponding to the current panel and stored in the database with the re-judging qualified state.

In one embodiment, the obtaining module is further configured to optically detect the panel, and obtain a detection picture of the panel; and acquiring test data according to the detection picture. In this embodiment, the detection frame acquired by the acquisition module is a frame on the current panel, that is, the detection frame is acquired from the current panel by the optical detector, that is, the optical detector acquires the detection frame after performing optical test on the surface of the current panel, where the detection frame acquired by the acquisition module includes all frames on the surface of the current panel, so that all frames of the current panel are detected, and thus, test data corresponding to the current panel is acquired according to the detection frame, that is, the test data is a parameter corresponding to the test frame of the current panel, so that the subsequent first detection module is convenient to detect the frame of the current panel.

In one embodiment, the test data acquired by the acquiring module includes test result data and feature position data, the test result data is used for judging whether the panel is defective, and the feature position data is used for determining a defective position of the panel. In this embodiment, the test result data acquired by the acquisition module is one of the test data, the test result data acquired by the acquisition module is determined by the optical detector according to the defect condition of the current panel, that is, the current panel has a defect, and the test result data corresponding to the current panel is failed in light test; and the current panel has no defect, and the test result data corresponding to the current panel is qualified by light test. When the defect condition exists in the current panel, the characteristic position data is a parameter corresponding to the defect on the current panel, namely the characteristic position data is a characteristic parameter of the defect on the current panel, for example, the characteristic position data comprises a coordinate position parameter corresponding to the defect on the current panel; as another example, the feature location data includes an area parameter corresponding to a defect on the current panel; as another example, the feature location data includes defect type parameters corresponding to defects on the current panel. The test result data and the characteristic position data acquired by the acquisition module are stored in the database, namely the acquisition module updates the test result data and the characteristic position data of the current panel in the database.

In one embodiment, the first detection module is further configured to detect whether the test result data is the same as the preset test data; and when the test result data is different from the preset test data, acquiring a corresponding defect characteristic picture according to the characteristic position data. In this embodiment, the preset test data includes a test result corresponding to the standard panel built in the first detection module, that is, the preset test data includes preset test result data after the standard panel is detected by the optical detector, that is, whether the detected test result data is the same as the preset test data includes: and detecting whether the test result data is the same as the preset test result data, and determining the test result of the current panel according to the comparison with the preset test result data, so that whether the current panel has defects or not is determined. And when the first detection module detects that the test result data is different from the preset test result data, the fact that the test result data is different from the preset test result data is indicated, and meanwhile, the fact that the surface of the current panel is defective is also indicated, namely, the fact that the surface of the current panel is provided with a defective picture is determined after the current panel passes through the optical detector is indicated, the test data of the current panel comprises characteristic position data, the characteristic position data corresponds to specific parameters of the defect position of the current panel, namely, the characteristic position data shows specific position conditions of the defect position of the current panel, and for example, the characteristic position data comprises position coordinates of the defect of the current panel. In this way, under the condition that the first detection module detects that the test result data is different from the preset test data, the defect on the current panel is determined, so that the current panel needs to be subjected to a subsequent repeated judgment process, in order to facilitate accurate repeated judgment of the current panel by the subsequent second detection module, a defect characteristic picture of the current panel is generated according to the characteristic position data, the defect characteristic picture shows the specific condition of the defect on the current panel, the subsequent second detection module is convenient to judge whether the current panel meets the repeated judgment standard according to the defect characteristic picture, the subsequent second detection module is convenient to judge whether the current panel is a repeated judgment qualified panel according to the specific defect picture, and the first detection module is convenient to distinguish products which need to be repeated judgment after detection by the optical detector. In one embodiment, the test result data and the feature position data are respectively stored in the database in a corresponding manner, and the test result data and the feature position data correspond to the identification codes of the corresponding panels, so that the test result data and the feature position data of the panels can be obtained by reading the identification codes of the panels, and a defect feature picture which is subsequently compared with a preset feature picture can be conveniently generated.

In one embodiment, the defect feature frames acquired by the second detection module include at least one feature detection frame, and each feature detection frame is used for comparing with a corresponding preset feature frame. In this embodiment, the defect feature frames obtained by the second detection module include multiple defects, that is, multiple defects exist on the panel at the same time, and the second detection module is convenient to compare the defects of the same type by presenting the same defect features in the same feature detection frame, so that the second detection module is convenient to compare the defects of the different types respectively, and the comparison difficulty of the defect feature frame and the preset feature frame is reduced. In one embodiment, different defect types exist in different areas on the panel, i.e. each area of the panel corresponds to a defect, and each area forms a corresponding feature detection screen.

In one embodiment, the second detection module is further configured to sequentially detect whether each feature detection picture is the same as the corresponding preset feature picture; and when the characteristic detection picture is the same as the corresponding preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state. In this embodiment, the preset feature frames in the second detection module include a plurality of feature frames, and each feature frame corresponds to a feature frame of a defect, that is, the preset feature frame includes a plurality of standard defect frames, each feature detection frame is compared with the corresponding standard defect frame, the second detection module detects whether the feature detection frame is the same as the corresponding standard defect frame, and the standard defect frame is a standard detection frame for judging the feature detection frame, that is, when the parameter of the defect on the feature detection frame is less than or equal to the parameter of the defect on the standard defect frame, the defect feature frame of the current panel is a panel meeting the re-judging standard, that is, when the parameter of the defect on the feature detection frame is within the range of the parameter of the defect on the standard defect frame, the defect feature frame of the current panel is a panel meeting the re-judging standard. And the defects on the preset characteristic pictures in the second detection module provide a controllable range of parameters of the defects, namely the defects on the preset characteristic pictures provide an allowable error range of parameters of the defects, so long as the defects on each characteristic detection picture of the current panel are within the allowable error range of the defects of the corresponding preset characteristic pictures, the second detection module judges that the current panel is a qualified panel for the re-judgment, namely the re-judgment state of the current panel is the qualified state of the re-judgment, and the second detection module stores the data of the qualified state of the current panel in a database, so that a sorting system can conveniently obtain the optical detection and the re-judgment condition of each panel through the database, and the sorting system can conveniently and rapidly distinguish and select the qualified panel and the unqualified panel for the re-judgment, thereby reducing the re-judgment difficulty of the panel. In one embodiment, the faulty panel is transferred to a manual inspection location for manual inspection.

In one embodiment, the second detection module is further configured to update the re-judgment state corresponding to the panel in the database to a re-judgment failure state when the feature detection frame is different from the corresponding preset feature frame. In this embodiment, since the feature detection frames have the same defects as the corresponding preset feature frames, that is, the defect type of each feature detection frame is the same as the defect type of the corresponding preset feature frame, for example, one of the feature detection frames has a black cluster defect, and the corresponding defect level of the preset feature frame has a black cluster defect, the second detection module compares the feature detection frame with the corresponding preset feature frame, that is, the second detection module compares the defect of the feature detection frame with the defect of the same type of the corresponding preset feature frame. When the characteristic detection picture is different from the corresponding preset characteristic picture, the defect of the characteristic detection picture is indicated to exceed the error range allowed by the defect of the preset characteristic picture, namely the defect of the characteristic detection picture is indicated to be a defect which does not accord with the preset judgment standard, namely the defect picture which has influence on panel display is indicated to be the defect picture, so that the second detection module judges the panel to be a disqualified panel, the judgment that the current panel is a panel with the disqualified judgment is facilitated, the second detection module stores the disqualified judgment state of the current panel in a database, namely the disqualified judgment state of the disqualified judgment is stored in the corresponding position of the identification code of the current panel in the database, and the sorting system is facilitated to identify the disqualified panel with the disqualified judgment.

In the embodiments, after the panel re-judging device is applied to the production line, the omission factor of the whole production line is reduced by 21.7%, 6 manual re-judging personnel are saved on each production line, namely, the number of the manual re-judging personnel on each production line is reduced to 2 from 8, so that the manufacturing cost of panel production is reduced.

For specific limitations of the panel re-determination device, reference may be made to the above limitations of the panel re-determination method, and the description thereof will not be repeated here. All or part of the modules in the panel re-judging device can be realized by software, hardware and a combination thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.

In one embodiment, a computer device is provided, which may be a server, the internal structure of which may be as shown in FIG. 2. The computer device includes a processor, a memory, a network interface, and a database connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The database of the computer device is used for storing the panel re-judging data. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program, when executed by the processor, implements a panel re-determination method.

In one embodiment, a computer device is provided, which may be a terminal, and the internal structure of which may be as shown in fig. 2. The computer device includes a processor, a memory, a network interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program, when executed by the processor, implements a panel re-determination method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, can also be keys, a track ball or a touch pad arranged on the shell of the computer equipment, and can also be an external keyboard, a touch pad or a mouse and the like.

It will be appreciated by persons skilled in the art that the architecture shown in fig. 2 is merely a block diagram of some of the architecture relevant to the present inventive arrangements and is not limiting as to the computer device to which the present inventive arrangements are applicable, and that a particular computer device may include more or fewer components than shown, or may combine some of the components, or have a different arrangement of components.

In one embodiment, a computer device is provided that includes a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the following steps when executing the computer program:

S100: test data of the panel is obtained. In this embodiment, the test data is the data of the panel after the panel is detected by the automatic optical detector, that is, the test data is the frame detection data of the panel, that is, the test data is the frame defect detection data of the panel, the test data includes the surface data information of the panel, and the test data shows that the defect condition of the current frame of the panel is converted into specific data. The method comprises the steps of converting the picture defect condition of the panel into test data, adopting an image processing mode to realize the conversion, and generating the test data after the test data are detected by an automatic optical detector, namely, the test data are automatically generated in the automatic optical detector, the test data are transmitted to a database by a system or a device where the automatic optical detector is positioned for storage and update, and the test data of each panel are respectively and independently stored in the database, so that a follow-up panel re-judging device can acquire the test data corresponding to each panel from the database, thereby being convenient for accurately acquiring the defect picture of each panel, further being convenient for accurately detecting the panel needing re-judgment, reducing the steps of manually re-judging and checking again, and reducing the re-judging detection difficulty.

S200: and detecting whether the test data is matched with the preset test data. In this embodiment, the preset test data is standard test data, that is, the preset test data is preset test data of the panel re-judging device, and the preset test data is test data obtained after the panel meeting the production requirement is detected by the automatic optical detector, that is, the preset test data is test data serving as a detection standard for detecting the panel to be re-judged. Thus, according to the test data of the panel detected by the optical detector, the test data of the panel is compared with the test data of the standard panel, so that the defect condition of the current panel can be accurately compared, and whether the current panel is a product needing to be re-judged according to the comparison result can be conveniently and subsequently judged, so that a judgment basis is provided for the re-judgment of the panel detected by the automatic optical detector, and further, the qualified products and the re-judged products in a plurality of panels can be conveniently distinguished, and the classification of the panel needing to be re-judged can be conveniently realized.

S300: and when the test data are not matched with the preset test data, obtaining a defect characteristic picture corresponding to the part of the test data which is not matched with the preset test data. In this embodiment, since the preset test data corresponds to the test data of the standard panel, after the preset test data is compared with the test data of the panel, it is convenient to determine whether the current panel is the standard panel, that is, whether the current panel is a qualified panel, that is, whether the current panel is a panel requiring a re-determination. The test data is not matched with the preset test data, which indicates that the test data of the current panel is different from the preset test data, so that the defect is detected after the current panel passes through the automatic optical detector, namely, the current panel is the panel needing to be subjected to the re-judgment, namely, the next procedure of the current panel is the re-judgment detection. And when the test data of the current panel is not matched with the preset test data, the defect data of the current panel is obtained according to the test data, namely, the defect characteristic picture of the current panel is obtained, so that the defect condition of the current panel is displayed in an image form, the defect characteristic picture of the current panel is extracted from the test data, the current panel is convenient to be re-judged according to the defect characteristic picture, a judgment basis is provided for determining whether the current panel is a re-judged qualified product in the follow-up re-judgment, and the follow-up rapid judgment of the qualification condition of the current panel is convenient. In one embodiment, the defect feature screen has at least one defect, for example, the defect feature screen has at least one of a bubble defect, a bright dark spot defect, and a black cluster defect.

S400: and detecting whether the defect characteristic picture is matched with the preset characteristic picture or not. In this embodiment, the defect feature frame is a frame with a defect of the currently detected panel, the preset feature frame is a frame with a defect of the panel conforming to the re-judging standard, and the detected defect feature frame and the preset feature frame are the frame with a defect of the detected current panel and the frame with a defect of the panel conforming to the re-judging standard. In this way, when the test data detect that the current panel is different from the preset test data, the current panel carries out the repeated judgment detection, and the current panel is compared with the panel meeting the repeated judgment standard by comparing the defect characteristic picture of the current panel with the preset characteristic picture, so that a judgment basis is provided for judging whether the current panel is the panel meeting the repeated judgment standard, further, the follow-up repeated judgment qualification of the current panel is facilitated, namely, the follow-up determination of whether the current panel is the panel meeting the repeated judgment standard is facilitated.

S500: and when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state. In this embodiment, the defect feature picture is matched with the preset feature picture, which indicates that the defect of the current panel is in the allowable range, wherein the preset feature picture provides a detection standard for the defect feature of the current panel, that is, the defect feature parameter of the current panel is smaller than the defect feature parameter in the preset feature picture, that is, the defect feature parameter of the current panel is in the range corresponding to the defect feature in the preset feature picture, so that the defect feature parameter of the current panel is in the normal feature parameter range, and therefore the defect feature parameter of the current panel meets the defect feature parameter requirement of the panel which is qualified in the re-judgment, and the current panel is conveniently determined to be the panel which is qualified in the re-judgment. And then updating the re-judging state of the current panel into a database, namely replacing the re-judging state corresponding to the current panel in the database with a re-judging qualified state, namely replacing the re-judging state corresponding to the current panel and stored in the database with the re-judging qualified state.

In one embodiment, the processor when executing the computer program further performs the steps of: acquiring test data of the panel includes: performing optical detection on the panel, and acquiring a detection picture of the panel; and acquiring test data according to the detection picture. In this embodiment, the detection frame is a frame on the current panel, that is, the detection frame is obtained from the current panel by the optical detector, that is, the optical detector obtains the detection frame after performing optical test on the surface of the current panel, where the detection frame includes all frames on the surface of the current panel, so that all frames of the current panel are detected, and thus, the detection frame is convenient to obtain test data corresponding to the current panel, that is, the test data is a parameter corresponding to the test frame of the current panel, and the subsequent detection of the frame of the current panel is convenient.

In one embodiment, the processor when executing the computer program further performs the steps of: the test data comprises test result data and characteristic position data, wherein the test result data is used for judging whether the panel is defective, and the characteristic position data is used for determining the defective position of the panel. In this embodiment, the test result data is one of the test data, the test result data is determined by the optical detector according to the defect condition of the current panel, that is, the current panel has a defect, and the test result data corresponding to the current panel is failed in optical test; and the current panel has no defect, and the test result data corresponding to the current panel is qualified by light test. When the defect condition exists in the current panel, the characteristic position data is a parameter corresponding to the defect on the current panel, namely the characteristic position data is a characteristic parameter of the defect on the current panel, for example, the characteristic position data comprises a coordinate position parameter corresponding to the defect on the current panel; as another example, the feature location data includes an area parameter corresponding to a defect on the current panel; as another example, the feature location data includes defect type parameters corresponding to defects on the current panel. The test result data and the characteristic position data are stored in the database, namely, the test result data and the characteristic position data of the current panel are updated in the database.

In one embodiment, the processor when executing the computer program further performs the steps of: detecting whether the test data is matched with the preset test data comprises the following steps: detecting whether the test result data is the same as the preset test data; when the test data is not matched with the preset test data, the step of obtaining the corresponding defect characteristic picture according to the test data comprises the following steps: and when the test result data is different from the preset test data, acquiring a corresponding defect characteristic picture according to the characteristic position data. In this embodiment, the preset test data includes a test result corresponding to the standard panel, that is, the preset test data includes preset test result data after the standard panel is detected by the optical detector, that is, whether the detected test result data is the same as the preset test data includes: and detecting whether the test result data is the same as the preset test result data, and determining the test result of the current panel according to the comparison with the preset test result data, so that whether the current panel has defects or not is determined. And when the test result data is different from the preset test data, the fact that the test result data is different from the preset test result data is indicated, and meanwhile, the fact that the surface of the current panel is defective is also indicated, namely, the fact that the surface of the current panel is provided with a defective picture after the current panel passes through the optical detector is indicated, the test data of the current panel comprises characteristic position data, the characteristic position data corresponds to specific parameters of the defect position of the current panel, namely, the characteristic position data shows specific position conditions of the defect position of the current panel, and for example, the characteristic position data comprises position coordinates of the defect of the current panel. In this way, under the condition that the test result data is different from the preset test data, the defect on the current panel is determined, so that the current panel needs to be subjected to a subsequent repeated judging process, in order to facilitate the subsequent accurate repeated judgment of the current panel, a defect characteristic picture of the current panel is generated according to the characteristic position data, the defect characteristic picture shows the specific condition of the defect on the current panel, and the subsequent judgment of whether the current panel meets the repeated judging standard according to the defect characteristic picture is facilitated, thereby facilitating the subsequent judgment of whether the current panel is a qualified panel for repeated judgment according to the specific defect picture, and further facilitating the distinguishing of products which need to be repeated judgment after being detected by the optical detector. In one embodiment, the test result data and the feature position data are respectively stored in the database in a corresponding manner, and the test result data and the feature position data correspond to the identification codes of the corresponding panels, so that the test result data and the feature position data of the panels can be obtained by reading the identification codes of the panels, and a defect feature picture which is subsequently compared with a preset feature picture can be conveniently generated.

In one embodiment, the processor when executing the computer program further performs the steps of: the defect characteristic picture comprises at least one characteristic detection picture, and each characteristic detection picture is used for being compared with a corresponding preset characteristic picture. In this embodiment, the defect feature frame includes multiple defects, that is, multiple defects exist on the panel at the same time, and the same defect feature is presented in the same feature detection frame, so that the defects of the same type are conveniently compared, the defects of the different types are conveniently compared respectively, and the comparison difficulty of the defect feature frame and the preset feature frame is reduced. In one embodiment, different defect types exist in different areas on the panel, i.e. each area of the panel corresponds to a defect, and each area forms a corresponding feature detection screen.

In one embodiment, the processor when executing the computer program further performs the steps of: detecting whether the defect characteristic picture is matched with the preset characteristic picture comprises the following steps: sequentially detecting whether each feature detection picture is identical to a corresponding preset feature picture; when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state of the panel in the database to be the qualified state comprises the following steps: and when the characteristic detection picture is the same as the corresponding preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state. In this embodiment, the preset feature frames include a plurality of feature frames, each feature frame corresponds to a defective feature frame, that is, the preset feature frame includes a plurality of standard defect frames, each feature detection frame is compared with the corresponding standard defect frame to detect whether the feature detection frame is identical to the corresponding standard defect frame, and the standard defect frame is a standard detection frame for judging the feature detection frame, that is, when the parameter of the defect on the feature detection frame is smaller than or equal to the parameter of the defect on the standard defect frame, the defective feature frame of the current panel is a panel meeting the re-judging standard, that is, when the parameter of the defect on the feature detection frame is within the range of the parameter of the defect on the standard defect frame, the defective feature frame of the current panel is a panel meeting the re-judging standard. In addition, the defects on the preset feature pictures provide a controllable range of parameters of the defects, namely, the defects on the preset feature pictures provide an allowable error range of parameters of the defects, so long as the defects on each feature detection picture of the current panel are within the allowable error range of the defects of the corresponding preset feature pictures, the current panel can be judged to be the panel with qualified re-judgment, namely, the re-judgment state of the current panel is the re-judgment state, and the re-judgment state of the current panel is stored in the database in the form of data, so that a sorting system can conveniently obtain the optical detection and the re-judgment condition of each panel through the database, and the sorting system can conveniently rapidly distinguish and select the panel with qualified re-judgment and the panel with unqualified re-judgment, and the re-judgment difficulty of the panel is reduced. In one embodiment, the faulty panel is transferred to a manual inspection location for manual inspection.

In one embodiment, the processor when executing the computer program further performs the steps of: after detecting whether each feature detection picture is the same as the corresponding preset feature picture in sequence, the method further comprises the following steps: and when the characteristic detection picture is different from the corresponding preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging failure state. In this embodiment, since the feature detection frames have the same defects as the corresponding preset feature frames, that is, the defect type of each feature detection frame is the same as the defect type of the corresponding preset feature frame, for example, one of the defect of the feature detection frames is a black cluster defect, and the defect liquid level of the corresponding preset feature frame is a black cluster defect, the feature detection frames are compared with the corresponding preset feature frames, that is, the defect of the feature detection frames is compared with the defect of the same type of the corresponding preset feature frames. When the characteristic detection picture is different from the corresponding preset characteristic picture, the defect of the characteristic detection picture is indicated to exceed the error range allowed by the defect of the preset characteristic picture, namely the defect of the characteristic detection picture is indicated to be a defect which does not meet the re-judging standard, namely the defect picture which has an influence on panel display is indicated to ensure that the panel is determined to be a disqualified panel, thereby being convenient for judging that the current panel is a panel with re-judging failure, storing the re-judging failure state of the current panel in a database, namely storing the re-judging failure state in the corresponding position of the identification code of the current panel in the database, and facilitating the sorting system to identify the panel with re-judging failure.

In the embodiments, after the computer equipment adopting the panel re-judging method is applied to the production line, the omission factor of the whole production line is reduced by 21.7%, 6 manual re-judging personnel are saved on each production line, namely, the number of the manual re-judging personnel on each production line is reduced from 8 to 2, so that the manufacturing cost of panel production is reduced.

In one embodiment, a server is provided, comprising: a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the steps of:

s100: test data of the panel is obtained.

S200: and detecting whether the test data are matched with preset test data or not.

S300: and when the test data is not matched with the preset test data, obtaining a defect characteristic picture corresponding to the part of the test data which is not matched with the preset test data.

S400: and detecting whether the defect characteristic picture is matched with a preset characteristic picture or not.

In one embodiment, a computer readable storage medium is provided having a computer program stored thereon, which when executed by a processor, performs the steps of:

In one embodiment, the computer program when executed by the processor further performs the steps of: acquiring test data of the panel includes: performing optical detection on the panel, and acquiring a detection picture of the panel; and acquiring test data according to the detection picture. In this embodiment, the detection frame is a frame on the current panel, that is, the detection frame is obtained from the current panel by the optical detector, that is, the optical detector obtains the detection frame after performing optical test on the surface of the current panel, where the detection frame includes all frames on the surface of the current panel, so that all frames of the current panel are detected, and thus, the detection frame is convenient to obtain test data corresponding to the current panel, that is, the test data is a parameter corresponding to the test frame of the current panel, and the subsequent detection of the frame of the current panel is convenient.

In one embodiment, the computer program when executed by the processor further performs the steps of: the test data comprises test result data and characteristic position data, wherein the test result data is used for judging whether the panel is defective, and the characteristic position data is used for determining the defective position of the panel. In this embodiment, the test result data is one of the test data, the test result data is determined by the optical detector according to the defect condition of the current panel, that is, the current panel has a defect, and the test result data corresponding to the current panel is failed in optical test; and the current panel has no defect, and the test result data corresponding to the current panel is qualified by light test. When the defect condition exists in the current panel, the characteristic position data is a parameter corresponding to the defect on the current panel, namely the characteristic position data is a characteristic parameter of the defect on the current panel, for example, the characteristic position data comprises a coordinate position parameter corresponding to the defect on the current panel; as another example, the feature location data includes an area parameter corresponding to a defect on the current panel; as another example, the feature location data includes defect type parameters corresponding to defects on the current panel. The test result data and the characteristic position data are stored in the database, namely, the test result data and the characteristic position data of the current panel are updated in the database.

In one embodiment, the computer program when executed by the processor further performs the steps of: detecting whether the test data is matched with the preset test data comprises the following steps: detecting whether the test result data is the same as the preset test data; when the test data is not matched with the preset test data, the step of obtaining the corresponding defect characteristic picture according to the test data comprises the following steps: and when the test result data is different from the preset test data, acquiring a corresponding defect characteristic picture according to the characteristic position data. In this embodiment, the preset test data includes a test result corresponding to the standard panel, that is, the preset test data includes preset test result data after the standard panel is detected by the optical detector, that is, whether the detected test result data is the same as the preset test data includes: and detecting whether the test result data is the same as the preset test result data, and determining the test result of the current panel according to the comparison with the preset test result data, so that whether the current panel has defects or not is determined. And when the test result data is different from the preset test data, the fact that the test result data is different from the preset test result data is indicated, and meanwhile, the fact that the surface of the current panel is defective is also indicated, namely, the fact that the surface of the current panel is provided with a defective picture after the current panel passes through the optical detector is indicated, the test data of the current panel comprises characteristic position data, the characteristic position data corresponds to specific parameters of the defect position of the current panel, namely, the characteristic position data shows specific position conditions of the defect position of the current panel, and for example, the characteristic position data comprises position coordinates of the defect of the current panel. In this way, under the condition that the test result data is different from the preset test data, the defect on the current panel is determined, so that the current panel needs to be subjected to a subsequent repeated judging process, in order to facilitate the subsequent accurate repeated judgment of the current panel, a defect characteristic picture of the current panel is generated according to the characteristic position data, the defect characteristic picture shows the specific condition of the defect on the current panel, and the subsequent judgment of whether the current panel meets the repeated judging standard according to the defect characteristic picture is facilitated, thereby facilitating the subsequent judgment of whether the current panel is a qualified panel for repeated judgment according to the specific defect picture, and further facilitating the distinguishing of products which need to be repeated judgment after being detected by the optical detector. In one embodiment, the test result data and the feature position data are respectively stored in the database in a corresponding manner, and the test result data and the feature position data correspond to the identification codes of the corresponding panels, so that the test result data and the feature position data of the panels can be obtained by reading the identification codes of the panels, and a defect feature picture which is subsequently compared with a preset feature picture can be conveniently generated.

In one embodiment, the computer program when executed by the processor further performs the steps of: the defect characteristic picture comprises at least one characteristic detection picture, and each characteristic detection picture is used for being compared with a corresponding preset characteristic picture. In this embodiment, the defect feature frame includes multiple defects, that is, multiple defects exist on the panel at the same time, and the same defect feature is presented in the same feature detection frame, so that the defects of the same type are conveniently compared, the defects of the different types are conveniently compared respectively, and the comparison difficulty of the defect feature frame and the preset feature frame is reduced. In one embodiment, different defect types exist in different areas on the panel, i.e. each area of the panel corresponds to a defect, and each area forms a corresponding feature detection screen.

In one embodiment, the computer program when executed by the processor further performs the steps of: detecting whether the defect characteristic picture is matched with the preset characteristic picture comprises the following steps: sequentially detecting whether each feature detection picture is identical to a corresponding preset feature picture; when the defect characteristic picture is matched with the preset characteristic picture, updating the re-judging state of the panel in the database to be the qualified state comprises the following steps: and when the characteristic detection picture is the same as the corresponding preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state. In this embodiment, the preset feature frames include a plurality of feature frames, each feature frame corresponds to a defective feature frame, that is, the preset feature frame includes a plurality of standard defect frames, each feature detection frame is compared with the corresponding standard defect frame to detect whether the feature detection frame is identical to the corresponding standard defect frame, and the standard defect frame is a standard detection frame for judging the feature detection frame, that is, when the parameter of the defect on the feature detection frame is smaller than or equal to the parameter of the defect on the standard defect frame, the defective feature frame of the current panel is a panel meeting the re-judging standard, that is, when the parameter of the defect on the feature detection frame is within the range of the parameter of the defect on the standard defect frame, the defective feature frame of the current panel is a panel meeting the re-judging standard. In addition, the defects on the preset feature pictures provide a controllable range of parameters of the defects, namely, the defects on the preset feature pictures provide an allowable error range of parameters of the defects, so long as the defects on each feature detection picture of the current panel are within the allowable error range of the defects of the corresponding preset feature pictures, the current panel can be judged to be the panel with qualified re-judgment, namely, the re-judgment state of the current panel is the re-judgment state, and the re-judgment state of the current panel is stored in the database in the form of data, so that a sorting system can conveniently obtain the optical detection and the re-judgment condition of each panel through the database, and the sorting system can conveniently rapidly distinguish and select the panel with qualified re-judgment and the panel with unqualified re-judgment, and the re-judgment difficulty of the panel is reduced. In one embodiment, the faulty panel is transferred to a manual inspection location for manual inspection.

In one embodiment, the computer program when executed by the processor further performs the steps of: after detecting whether each feature detection picture is the same as the corresponding preset feature picture in sequence, the method further comprises the following steps: and when the characteristic detection picture is different from the corresponding preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging failure state. In this embodiment, since the feature detection frames have the same defects as the corresponding preset feature frames, that is, the defect type of each feature detection frame is the same as the defect type of the corresponding preset feature frame, for example, one of the defect of the feature detection frames is a black cluster defect, and the defect liquid level of the corresponding preset feature frame is a black cluster defect, the feature detection frames are compared with the corresponding preset feature frames, that is, the defect of the feature detection frames is compared with the defect of the same type of the corresponding preset feature frames. When the characteristic detection picture is different from the corresponding preset characteristic picture, the defect of the characteristic detection picture is indicated to exceed the error range allowed by the defect of the preset characteristic picture, namely the defect of the characteristic detection picture is indicated to be a defect which does not meet the re-judging standard, namely the defect picture which has an influence on panel display is indicated to ensure that the panel is determined to be a disqualified panel, thereby being convenient for judging that the current panel is a panel with re-judging failure, storing the re-judging failure state of the current panel in a database, namely storing the re-judging failure state in the corresponding position of the identification code of the current panel in the database, and facilitating the sorting system to identify the panel with re-judging failure.

In the embodiments, after the computer readable storage medium adopting the panel re-judging method is applied to the production line, the omission factor of the whole production line is reduced by 21.7%, 6 manual re-judging personnel are saved on each production line, namely, the number of the manual re-judging personnel on each production line is reduced to 2 from 8, so that the manufacturing cost of panel production is reduced.

Those skilled in the art will appreciate that implementing all or part of the above-described methods in accordance with the embodiments may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed may comprise the steps of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in embodiments provided herein may include non-volatile and/or volatile memory. The nonvolatile memory can include Read Only Memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (SYNCHLINK) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), among others.

The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The foregoing examples illustrate only a few embodiments of the invention, which are described in detail and are not to be construed as limiting the scope of the invention. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the invention, which are all within the scope of the invention. Accordingly, the scope of protection of the present invention is to be determined by the appended claims.

Claims

1. A panel re-judging method is characterized by comprising the following steps:

acquiring test data of a panel, wherein the test data comprises test result data and characteristic position data, the characteristic position data corresponds to the test result data one by one, and the characteristic position data is used for determining the position of the test result data on the panel;

detecting whether the test result data is matched with preset test data or not;

When the test result data is not matched with the preset test data, acquiring characteristic position data corresponding to a part, which is different from the preset test data, in the test result data, and generating a defect characteristic picture of the panel according to the characteristic position data corresponding to the part, which is different from the preset test data, in the test result data, wherein the defect characteristic picture comprises defect characteristics of at least one defect type;

Generating at least one feature detection picture according to the defect features of each defect type; wherein, the defect characteristics of the same defect type are presented in the same characteristic detection picture;

Detecting whether each feature detection picture is matched with a corresponding preset feature picture or not in sequence;

And when each characteristic detection picture is matched with the corresponding preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

2. The panel re-judging method according to claim 1, wherein the acquiring the test data of the panel comprises:

Carrying out optical detection on the panel and obtaining a detection picture of the panel;

and acquiring the test data according to the detection picture.

3. The panel re-judging method according to claim 1, wherein the detecting whether the test result data matches the preset test data comprises:

detecting whether the test result data is identical to the preset test data;

and when the test result data is different from the preset test data, judging that the test result data is not matched with the preset test data.

4. The method of claim 1, wherein sequentially detecting whether each of the feature detection frames matches a predetermined feature frame comprises:

Detecting whether each feature detection picture is identical to a corresponding preset feature picture or not in sequence;

And when the characteristic detection picture is the same as the corresponding preset characteristic picture, judging that the defect characteristic picture is matched with the preset characteristic picture.

5. The method of claim 4, wherein after sequentially detecting whether each of the feature detection frames is identical to the corresponding preset feature frame, further comprising:

And when the characteristic detection picture is different from the corresponding preset characteristic picture, judging that the defect characteristic picture is not matched with the preset characteristic picture.

6. The method of claim 5, wherein after the determining that the defect feature frame does not match the preset feature frame, further comprising:

and when the defect characteristic picture is not matched with the preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging failure state.

7. The panel re-judging method according to any one of claims 1 to 6, wherein the re-judging state corresponds to the panel, and the re-judging state is used for sorting the panel by a sorting device according to the updated re-judging state.

8. The device for rechecking the panel is characterized by comprising:

the device comprises an acquisition module, a display module and a display module, wherein the acquisition module is used for acquiring test data of a panel, the test data comprise test result data and characteristic position data, the characteristic position data corresponds to the test result data one by one, and the characteristic position data is used for determining the position of the test result data on the panel;

The first detection module is used for detecting whether the test result data is matched with preset test data or not; when the test result data is not matched with the preset test data, acquiring characteristic position data corresponding to a part, which is different from the preset test data, in the test result data, and generating a defect characteristic picture of the panel according to the characteristic position data corresponding to the part, which is different from the preset test data, in the test result data, wherein the defect characteristic picture comprises defect characteristics of at least one defect type;

the second detection module is used for sequentially detecting whether each characteristic detection picture is matched with a corresponding preset characteristic picture or not; and when each characteristic detection picture is matched with the corresponding preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

9. The device according to claim 8, wherein the acquiring module is further configured to perform optical detection on the panel and acquire a detection picture of the panel; and acquiring the test data according to the detection picture.

10. A computer device, comprising:

Memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the method according to any one of claims 1 to 7 when the computer program is executed.

11. A server for a server, which comprises a server and a server, characterized by comprising the following steps:

A memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the steps of:

detecting whether the test result data is matched with preset test data or not;

detecting whether each feature detection picture is matched with a corresponding preset feature picture or not in sequence; and when each characteristic detection picture is matched with the corresponding preset characteristic picture, updating the re-judging state corresponding to the panel in the database into a re-judging qualified state.

12. A computer-readable storage medium, characterized in that it has stored thereon a computer program which, when executed by a processor, implements the steps of the method according to any of claims 1 to 7.