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CN111352015A - Test fixture for insulated gate bipolar transistor - Google Patents

Test fixture for insulated gate bipolar transistor Download PDF

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Publication number
CN111352015A
CN111352015A CN202010201638.7A CN202010201638A CN111352015A CN 111352015 A CN111352015 A CN 111352015A CN 202010201638 A CN202010201638 A CN 202010201638A CN 111352015 A CN111352015 A CN 111352015A
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CN
China
Prior art keywords
plate
fixedly connected
rod
insulated gate
gate bipolar
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN202010201638.7A
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Chinese (zh)
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李星辰
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Individual
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Individual
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Priority to CN202010201638.7A priority Critical patent/CN111352015A/en
Publication of CN111352015A publication Critical patent/CN111352015A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention discloses a test fixture for an insulated gate bipolar transistor, which comprises a base, wherein one side of the base is fixedly connected with a supporting plate, the test fixture has a simple structure and is convenient to use, a set rotating shaft can drive a bidirectional screw rod to rotate through a meshed bevel gear set, the bidirectional screw rod can drive two moving plates to slide along a sliding groove when rotating, the moving plates can drive two guide plates to move relatively along the base when sliding, so that the distance between the two guide plates can be adjusted, the device is convenient to clamp the insulated gate bipolar transistors with different sizes and models, and a set servo motor can drive a square push tube through an external thread screw rod to push the insulated gate bipolar transistor to move towards a PCB (printed circuit board), so that probes of the insulated gate bipolar transistor are aligned with probe interfaces on the PCB, and the test of the insulated gate bipolar transistor is convenient, the testing efficiency is greatly improved.

Description

Test fixture for insulated gate bipolar transistor
Technical Field
The invention relates to a test fixture, in particular to a test fixture for an insulated gate bipolar transistor, and belongs to the technical field of insulated gate bipolar transistors.
Background
The insulated gate bipolar transistor integrates the advantages of a power transistor and a power field effect transistor, has good characteristics and is wide in application field; IGBTs are also three-terminal devices: a gate, a collector and an emitter. With the rapid development of the industry, a large number of novel semiconductor devices are applied to industrial equipment, and the insulated gate bipolar transistor module is taken as a novel semiconductor device which is widely applied, and the convenience and accuracy of the test are important factors influencing the production efficiency and the product quality of the insulated gate bipolar transistor module. After the production of the insulated gate bipolar transistor is completed, the insulated gate bipolar transistor needs to be aligned for detection. When the existing test fixture for the insulated gate bipolar transistor is used for testing the insulated gate bipolar transistor, a tester needs to hold the insulated gate bipolar transistor by hands and manually insert the insulated gate bipolar transistor into a test point for testing, and when the insulated gate bipolar transistor is manually inserted, the insertion column of the insulated gate bipolar transistor is not in butt joint with the test point, so that the probe of the insulated gate bipolar transistor is deformed, the insulated gate bipolar transistor is damaged, and the manual test efficiency is low.
Disclosure of Invention
The invention provides a test fixture for an insulated gate bipolar transistor, which effectively solves the problems in the prior art.
In order to solve the technical problems, the invention provides the following technical scheme:
the invention relates to a test fixture for an insulated gate bipolar transistor, which comprises a base, wherein one side of the base is fixedly connected with a supporting plate, a PCB is fixedly connected onto the plate wall on one side of the supporting plate, the plate wall of the PCB, which is far away from one side of the supporting plate, is provided with a probe interface, one side of the PCB, which is far away from the supporting plate, is provided with a square push pipe, the square push pipe is slidably connected onto the top of the base, two ends inside the square push pipe are both slidably connected with extension rods, one ends, which are far away from the square push pipe, of the two extension rods are both provided with guide plates, the guide plates are slidably connected onto the top of the base, the plate walls of the two guide plates are both provided with sliding grooves corresponding to the extension rods, one ends, which are far away from the square push pipe, of the extension rods penetrate through the corresponding sliding grooves and are slidably connected with the corresponding sliding grooves, one, the shaft wall of the output shaft of the servo motor is fixedly connected with an external thread screw rod through a coupler, one end of the external thread screw rod, far away from the servo motor, penetrates through the fixed plate, a pushing plate is sleeved on the rod wall of one end of the fixed plate in a threaded manner and is connected to the top of the base in a sliding manner, two ends of one side of the pushing plate, far away from the fixed plate, are fixedly connected with pushing rods, one end of the pushing rod, far away from the pushing plate, is fixedly connected with a first transmission plate, one side of the first transmission plate, far away from the fixed plate is provided with a second transmission plate, the second transmission plate is fixedly connected to the outer pipe wall of the square push pipe, a second spring is arranged between the first transmission plate and the second transmission plate, two ends of the second spring are fixedly connected with the first transmission plate and the second transmission plate respectively, and a limiting rod is fixedly connected to the plate wall of, one end of the limiting rod, which is far away from the second transmission plate, sequentially penetrates through the second spring and the first transmission plate, the limiting rod is in sliding connection with the second spring and the first transmission plate, one end of the guide plate, which is close to the support plate, is fixedly connected with a sliding block, a sliding groove is formed in the plate wall of the support plate, corresponds to the sliding block, is matched with the sliding block, the sliding block is in sliding connection with the inside of the sliding groove, one end of the sliding block, which is far away from the guide plate, is fixedly connected with a movable plate, a rotating shaft is arranged between the two movable plates, the rotating shaft is in rotating connection with the support plate through a bearing, a first bevel gear is fixedly connected to the shaft wall of the rotating shaft, one side of the support plate, which is far away from the PCB plate, is provided with a bidirectional screw rod, two ends of the bidirectional screw rod, the second bevel gear is meshed with the first bevel gear, the bidirectional screw rod penetrates through the rod wall of the moving plate to be rotatably connected with a supporting seat, and the supporting seat is fixedly connected with the supporting plate.
As a preferable technical scheme of the invention, a supporting rod is arranged between the two extension rods, a groove is formed in one end, close to each other, of each of the two extension rods, corresponding to the supporting rod, the groove is matched with the supporting rod, and two ends of the supporting rod are respectively inserted into the grooves in the two extension rods.
As a preferable technical scheme of the invention, one end of the extension rod penetrating through the sliding chute is fixedly connected with a limiting block, and the diameter of the limiting block is larger than that of the sliding chute.
As a preferred technical scheme of the invention, a first spring is sleeved on the rod wall of the supporting rod in a sliding manner, the first spring is positioned between the two extension rods, and two ends of the first spring are respectively fixedly connected with the two extension rods.
As a preferred technical scheme of the invention, two first limiting slide blocks are symmetrically and fixedly connected to the rod wall of the extension rod positioned inside the sliding groove, a first limiting sliding groove is formed in the inner wall of the sliding groove corresponding to the first limiting slide block, the first limiting sliding groove and the first limiting slide block are arranged in a matching manner, and the first limiting slide block is slidably connected inside the corresponding first limiting sliding groove.
As a preferred technical scheme of the invention, the servo motor is electrically connected with an external power supply through a PLC controller.
As a preferred technical scheme of the invention, the top and the bottom of the sliding block are both fixedly connected with a second limiting sliding block, a second limiting sliding groove is formed on the inner wall of the sliding groove corresponding to the second limiting sliding block, the second limiting sliding groove and the second limiting sliding block are arranged in a matching manner, and the second limiting sliding block is connected inside the corresponding second limiting sliding groove in a sliding manner.
As a preferable technical scheme of the invention, one end of the rotating shaft, which is far away from the bearing, is fixedly connected with a poking block.
The invention has the following beneficial effects: the test fixture for the insulated gate bipolar transistor has a simple structure and is convenient to use, the set rotating shaft can drive the bidirectional screw rod to rotate through the meshed bevel gear set, the bidirectional screw rod can drive the two moving plates to slide along the sliding grooves when rotating, the moving plates can drive the two guide plates to move relatively along the base when sliding, so that the distance between the two guide plates can be adjusted, the device can conveniently clamp the insulated gate bipolar transistors with different sizes and models, the set servo motor can drive the square push tube through the external screw thread screw rod to push the insulated gate bipolar transistor to move towards the PCB, the probe of the insulated gate bipolar transistor is conveniently aligned with the probe interface on the PCB, the test of the insulated gate bipolar transistor is convenient, the test efficiency is greatly improved, and meanwhile, the probe of the pushed insulated gate bipolar transistor can be accurately inserted in alignment with the probe interface, the test effect is better, and the probe of the insulated gate bipolar transistor cannot be damaged.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of the present invention in use;
FIG. 3 is a schematic view of the slider and moving plate of the present invention;
FIG. 4 is a partial enlarged view of portion A of the present invention;
fig. 5 is a partially enlarged view of a portion B in the present invention.
In the figure: 1. a base; 2. a support plate; 3. a PCB board; 4. a probe interface; 5. a square push pipe; 6. an extension rod; 7. a groove; 8. a support bar; 9. a first spring; 10. a guide plate; 11. a chute; 12. a limiting block; 13. a first limit slide block; 14. a first limiting chute; 15. a fixing plate; 16. fixing the frame; 17. a servo motor; 18. a coupling; 19. an external thread screw rod; 20. a push plate; 21. a push rod; 22. a first drive plate; 23. a second drive plate; 24. a second spring; 25. a limiting rod; 26. a slider; 27. a sliding groove; 28. a second limit slide block; 29. a second limiting chute; 30. moving the plate; 31. a rotating shaft; 32. a bearing; 33. a first bevel gear; 34. a shifting block; 35. a bidirectional screw rod; 36. a second bevel gear; 37. and (4) supporting the base.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example (b): as shown in fig. 1-5, the test fixture for the igbt according to the present invention includes a base 1, a supporting plate 2 is fixedly connected to one side of the base 1, a PCB 3 is fixedly connected to a wall of one side of the supporting plate 2, a probe interface 4 is disposed on a wall of the PCB 3 away from the supporting plate 2, a square push tube 5 is disposed on one side of the PCB 3 away from the supporting plate 2, the square push tube 5 is slidably connected to a top of the base 1, extending rods 6 are slidably connected to two ends inside the square push tube 5, guide plates 10 are disposed at ends of the extending rods 6 away from the square push tube 5, the guide plates 10 are slidably connected to a top of the base 1, sliding grooves 11 are disposed on walls of the two guide plates 10 corresponding to the extending rods 6, and an end of the extending rod 6 away from the square push tube 5 passes through and is slidably connected to the corresponding sliding grooves 11, the top of the base 1 is fixedly connected with a fixed plate 15 far away from one end of the supporting plate 2, the fixed plate 15 is fixedly connected with a servo motor 17 through a fixed frame 16 on the plate wall far away from one side of the supporting plate 2, an external thread screw rod 19 is fixedly connected with the shaft wall of an output shaft of the servo motor 17 through a coupler 18, one end of the external thread screw rod 19 far away from the servo motor 17 penetrates through the fixed plate 15, a push plate 20 is sleeved on the rod wall of one end of the fixed plate 15 through threads of the external thread screw rod 19, the push plate 20 is connected to the top of the base 1 in a sliding manner, two ends of one side of the push plate 20 far away from the fixed plate 15 are fixedly connected with push rods 21, one ends of the push rods 21 far away from the push plate 20 are fixedly connected with first transmission plates 22, one side of the first transmission plates 22 far away from the fixed plate 15 is provided with second transmission, a second spring 24 is arranged between the first transmission plate 22 and the second transmission plate 23, two ends of the second spring 24 are respectively and fixedly connected with the first transmission plate 22 and the second transmission plate 23, a limiting rod 25 is fixedly connected to the wall of the second transmission plate 23 close to one side of the first transmission plate 22, one end of the limiting rod 25 far away from the second transmission plate 23 sequentially penetrates through the second spring 24 and the first transmission plate 22, the limiting rod 25 is in sliding connection with the second spring 24 and the first transmission plate 22, one end of the guide plate 10 close to the support plate 2 is fixedly connected with a sliding block 26, a sliding groove 27 is formed in the wall of the support plate 2 corresponding to the sliding block 26, the sliding groove 27 is matched with the sliding block 26, the sliding block 26 is in sliding connection with the inside of the sliding groove 27, and one end of the sliding block 26 far away from the guide plate 10 is fixedly connected with a transmission plate 30, a rotating shaft 31 is arranged between the two moving plates 30, the rotating shaft 31 is rotatably connected with the supporting plate 2 through a bearing 32, a first bevel gear 33 is fixedly connected to the shaft wall of the rotating shaft 31, a two-way screw rod 35 is arranged on one side, far away from the PCB 3, of the supporting plate 2, two ends of the two-way screw rod 35 penetrate through the moving plates 30 respectively, the two-way screw rod 35 is in threaded connection with the moving plates 30, a second bevel gear 36 is fixedly connected to the rod wall in the middle of the two-way screw rod 35, the second bevel gear 36 is in meshed connection with the first bevel gear 33, a supporting seat 37 is rotatably connected to the rod wall, penetrating through the moving plates 30, of the two-way screw rod 35.
Two be provided with bracing piece 8 between the extension rod 6, and two the one end that extension rod 6 is close to each other all corresponds bracing piece 8 and sets up fluted 7, recess 7 and the setting of 8 phase-matchs of bracing piece, just in the recess 7 of pegging graft respectively on two extension rods 6 at the both ends of bracing piece 8, sliding connection can make extension rod 6 more stable when sliding at the inside bracing piece 8 of recess 7.
Extension rod 6 passes the one end fixedly connected with stopper 12 of spout 11, the diameter of stopper 12 is greater than the diameter of spout 11, and stopper 12 that the diameter is greater than spout 11 can ensure that extension rod 6 can not drop with spout 11 separation.
First spring 9 has been cup jointed in the pole wall of bracing piece 8 slip, first spring 9 is located between two extension rod 6, and the both ends of first spring 9 respectively with two extension rod 6 fixed connection, first spring 9 can make two extension rod 6 more stable when extending.
Two first limit slide blocks 13 of symmetry fixedly connected with are located on the pole wall of extension rod 6 inside spout 11, first limit slide 14 has been seted up corresponding first limit slide block 13 on the inner wall of spout 11, first limit slide 14 sets up with first limit slide block 13 phase-match, just first limit slide block 13 sliding connection is in the inside that corresponds first limit slide 14, and extension rod 6 can drive first limit slide block 13 when the inside of spout 11 slides and slide in the inside of first limit slide 14, and first limit slide block 13 can make extension rod 6 more stable when sliding in the inside of first limit slide 14.
The servo motor 17 is electrically connected with an external power supply through a PLC (programmable logic controller), the PLC can control the rotating speed and the steering of the servo motor 17, and the device can be driven normally.
The equal fixedly connected with second limit slide 28 in top and the bottom of sliding block 26, the spacing spout 29 of second has been seted up to corresponding second limit slide 28 on the inner wall of sliding tray 27, the spacing spout 29 of second sets up with the spacing slider 28 phase-match of second, just second limit slide 28 sliding connection is in the inside that corresponds second limit slide 29, and sliding block 26 can drive second limit slide 28 when the inside of sliding tray 27 slides and slide in the inside of the spacing spout 29 of second, and second limit slide 28 can make sliding block 26 more stable when the inside of sliding tray 27 slides when the inside of the spacing spout 29 of second slides.
One end of the rotating shaft 31, which is far away from the bearing 32, is fixedly connected with a toggle block 34, and the toggle block 34 can increase the force arm of the rotating shaft 31 during rotation, so that the rotating shaft 31 can rotate more conveniently and labor-saving.
Specifically, when the device is used, the rotating shaft 31 can be driven to rotate through the shifting block 34, the rotating shaft 31 can drive the bidirectional screw rod 35 to rotate through the meshed bevel gear set when rotating, the bidirectional screw rod 35 can drive the two moving plates 30 to slide along the sliding grooves 27 when rotating, the two guide plates 10 can be driven to move relatively along the base 1 when the moving plates 30 slide, so that the distance between the two guide plates 10 can be adjusted, the device can conveniently clamp insulated gate bipolar transistors of different sizes and models, after the clamp is adjusted, one end of the insulated gate bipolar transistor to be tested, which is provided with a probe, is placed close to the PCB 3, the insulated gate bipolar transistor is pressed to the base 1 by hand to be attached, the servo motor 17 is started through the PLC, and the servo motor 17 can drive the square push tube 5 through the external thread screw rod 19 to push the insulated gate bipolar transistor to move towards the PCB 3, the probe of the insulated gate bipolar transistor is conveniently aligned with the probe interface 4 on the PCB 3, the test of the insulated gate bipolar transistor is conveniently carried out, the test efficiency is greatly improved, and meanwhile, the probe of the insulated gate bipolar transistor can be pushed to be accurately inserted in the alignment with the probe interface 4, so that the test effect is better, and the probe of the insulated gate bipolar transistor cannot be damaged.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (8)

1. The test fixture for the insulated gate bipolar transistor is characterized by comprising a base (1), wherein a supporting plate (2) is fixedly connected to one side of the base (1), a PCB (3) is fixedly connected to the plate wall of one side of the supporting plate (2), a probe interface (4) is arranged on the plate wall of one side, away from the supporting plate (2), of the PCB (3), a square push pipe (5) is arranged on one side, away from the supporting plate (2), of the PCB (3), the square push pipe (5) is connected to the top of the base (1) in a sliding mode, extension rods (6) are connected to two ends of the inner portion of the square push pipe (5) in a sliding mode, guide plates (10) are arranged at one ends, away from the square push pipe (5), of the two extension rods (6), the guide plates (10) are connected to the top of the base (1) in a sliding mode, sliding grooves (11) are formed in the plate walls of the two guide plates (10), the one end that square ejector sleeve (5) was kept away from in extension rod (6) passes corresponding spout (11) and rather than sliding connection, the one end fixedly connected with fixed plate (15) of backup pad (2) is kept away from at the top of base (1), through fixing frame (16) fixedly connected with servo motor (17) on the siding of backup pad (2) one side is kept away from in fixed plate (15), through shaft coupling (18) fixedly connected with external screw thread lead screw (19) on the shaft wall of servo motor (17) output shaft, the one end that servo motor (17) was kept away from in external screw thread lead screw (19) passes fixed plate (15), and external screw thread lead screw (19) pass on the pole wall of fixed plate (15) one end on screw sleeve have catch plate (20), catch plate (20) sliding connection is at the top of base (1), both ends that fixed plate (15) one side was kept away from in catch plate (20) are all fixedly connected with catch rod (21), the pushing rod (21) is far away from one end of the pushing plate (20) and is fixedly connected with a first transmission plate (22), one side, far away from the fixing plate (15), of the first transmission plate (22) is provided with a second transmission plate (23), the second transmission plate (23) is fixedly connected to the outer pipe wall of the square pushing pipe (5), a second spring (24) is arranged between the first transmission plate (22) and the second transmission plate (23), two ends of the second spring (24) are respectively and fixedly connected with the first transmission plate (22) and the second transmission plate (23), a limiting rod (25) is fixedly connected to the plate wall, close to one side of the first transmission plate (22), of the second transmission plate (23), one end, far away from the second transmission plate (23), of the limiting rod (25) sequentially penetrates through the second spring (24) and the first transmission plate (22), and the limiting rod (25) is connected with the second spring (24) and the first transmission plate (22) in a sliding mode, one end, close to the support plate (2), of the guide plate (10) is fixedly connected with a sliding block (26), a sliding groove (27) is formed in the plate wall of the support plate (2) corresponding to the sliding block (26), the sliding groove (27) is matched with the sliding block (26), the sliding block (26) is connected to the inside of the sliding groove (27) in a sliding mode, one end, far away from the guide plate (10), of the sliding block (26) is fixedly connected with a movable plate (30), a rotating shaft (31) is arranged between the two movable plates (30), the rotating shaft (31) is rotatably connected with the support plate (2) through a bearing (32), a first bevel gear (33) is fixedly connected to the shaft wall of the rotating shaft (31), a bidirectional screw rod (35) is arranged on one side, far away from the PCB (3), of the support plate (2), and two ends of the bidirectional screw rod (, the bidirectional screw rod (35) is in threaded connection with the moving plate (30), a second bevel gear (36) is fixedly connected to the rod wall in the middle of the bidirectional screw rod (35), the second bevel gear (36) is in meshed connection with the first bevel gear (33), the bidirectional screw rod (35) penetrates through the rod wall of the moving plate (30) and is rotatably connected with a supporting seat (37), and the supporting seat (37) is fixedly connected with the supporting plate (2).
2. The test fixture for the insulated gate bipolar transistor according to claim 1, wherein a support rod (8) is disposed between the two extension rods (6), and a groove (7) is formed at one end of each of the two extension rods (6) close to each other corresponding to the support rod (8), the groove (7) and the support rod (8) are disposed in a matching manner, and two ends of the support rod (8) are respectively inserted into the grooves (7) of the two extension rods (6).
3. The test fixture for the insulated gate bipolar transistor according to claim 1, wherein a limit block (12) is fixedly connected to one end of the extension rod (6) penetrating through the sliding groove (11), and the diameter of the limit block (12) is larger than that of the sliding groove (11).
4. The test fixture for the insulated gate bipolar transistor according to claim 2, wherein a first spring (9) is slidably sleeved on the wall of the support rod (8), the first spring (9) is located between the two extension rods (6), and two ends of the first spring (9) are respectively fixedly connected with the two extension rods (6).
5. The test fixture for the insulated gate bipolar transistor according to claim 1, wherein two first limit sliders (13) are symmetrically and fixedly connected to the rod wall of the extension rod (6) located inside the sliding groove (11), a first limit sliding groove (14) is formed in the inner wall of the sliding groove (11) corresponding to the first limit slider (13), the first limit sliding groove (14) is matched with the first limit slider (13), and the first limit slider (13) is slidably connected inside the corresponding first limit sliding groove (14).
6. The test fixture for the insulated gate bipolar transistor according to claim 1, wherein the servo motor (17) is electrically connected with an external power supply through a PLC controller.
7. The test fixture for the insulated gate bipolar transistor according to claim 1, wherein a second limit slider (28) is fixedly connected to the top and the bottom of the sliding block (26), a second limit sliding groove (29) is formed in the inner wall of the sliding groove (27) corresponding to the second limit slider (28), the second limit sliding groove (29) is matched with the second limit slider (28), and the second limit slider (28) is slidably connected inside the corresponding second limit sliding groove (29).
8. The test fixture for the insulated gate bipolar transistor according to claim 1, characterized in that a shifting block (34) is fixedly connected to one end of the rotating shaft (31) far away from the bearing (32).
CN202010201638.7A 2020-03-20 2020-03-20 Test fixture for insulated gate bipolar transistor Withdrawn CN111352015A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010201638.7A CN111352015A (en) 2020-03-20 2020-03-20 Test fixture for insulated gate bipolar transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010201638.7A CN111352015A (en) 2020-03-20 2020-03-20 Test fixture for insulated gate bipolar transistor

Publications (1)

Publication Number Publication Date
CN111352015A true CN111352015A (en) 2020-06-30

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CN202010201638.7A Withdrawn CN111352015A (en) 2020-03-20 2020-03-20 Test fixture for insulated gate bipolar transistor

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113391183A (en) * 2021-08-17 2021-09-14 苏师大半导体材料与设备研究院(邳州)有限公司 Semiconductor device temperature characteristic measuring instrument
CN115397179A (en) * 2022-08-31 2022-11-25 先之科半导体科技(东莞)有限公司 High-efficient mounting structure of withstand voltage's MOSFET pipe
CN117772644A (en) * 2024-02-28 2024-03-29 山东理工大学 Microelectronic component insulation performance testing equipment and testing method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113391183A (en) * 2021-08-17 2021-09-14 苏师大半导体材料与设备研究院(邳州)有限公司 Semiconductor device temperature characteristic measuring instrument
CN113391183B (en) * 2021-08-17 2021-11-19 苏师大半导体材料与设备研究院(邳州)有限公司 Semiconductor device temperature characteristic measuring instrument
CN115397179A (en) * 2022-08-31 2022-11-25 先之科半导体科技(东莞)有限公司 High-efficient mounting structure of withstand voltage's MOSFET pipe
CN117772644A (en) * 2024-02-28 2024-03-29 山东理工大学 Microelectronic component insulation performance testing equipment and testing method
CN117772644B (en) * 2024-02-28 2024-05-10 山东理工大学 Microelectronic component insulation performance testing equipment and testing method

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