CN110888815A - Application program testing method, device, equipment and storage medium - Google Patents
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Abstract
The embodiment of the invention discloses a method, a device, equipment and a storage medium for testing an application program. The method comprises the following steps: calling a to-be-tested time determining function when a test task in an application program to be tested runs, and generating to-be-tested time corresponding to the test task; and continuing to run the test task according to the time to be tested, and completing the test of the test task in the application program. By the technical scheme, the test of the application program related to the time problem is more efficiently completed, and the influence on other application programs on the same equipment is reduced.
Description
Technical Field
The embodiment of the invention relates to computer technology, in particular to a method, a device, equipment and a storage medium for testing an application program.
Background
Many current applications involve timed or time-limited tasks, and testing of these tasks in applications involves time problems.
The test mode of the application program related to the time problem in the prior art is as follows: the system time is modified through a date command, and the purposes of adjusting the time and reducing the test waiting time are achieved.
However, the date command is a system level command, and after the command is executed, the system time of the whole device is modified, so that the corresponding processes of all the application programs running on the device are affected. For example, each process may read the system time at runtime to generate a running log of the application program, and after the date command modifies the system time, the records in the log file may be confused; for another example, when there is a task related to a time problem in other applications, the task may be running in error.
Disclosure of Invention
Embodiments of the present invention provide a method, an apparatus, a device, and a storage medium for testing an application program, so as to implement more efficient testing of the application program related to a time problem, and reduce an influence on other application programs on the same device.
In a first aspect, an embodiment of the present invention provides a method for testing an application program, including:
calling a to-be-tested time determining function when a test task in an application program to be tested runs, and generating to-be-tested time corresponding to the test task;
and continuing to run the test task according to the time to be tested, and completing the test of the test task in the application program.
Optionally, the function of generating the time to be tested corresponding to the test task is implemented by the time to be tested determining function as follows:
determining time offset information according to the current system time and the test task information of the test task;
and adjusting the time of the test task according to the time offset information and the current system time to generate the time to be tested corresponding to the test task.
Further, the determining time offset information according to the current system time and the test task information of the test task includes:
reading the current system time, and determining the test task information according to the test task, wherein the test task information comprises the next test time of the test task;
and determining a time offset direction and a time offset according to the current system time and the next test time.
Further, the determining the test task information according to the test task includes:
and reading the test task information from the configuration file of the test task.
Optionally, the adjusting the time of the test task according to the time offset information and the current system time, and generating the time to be tested corresponding to the test task includes:
and adjusting the current system time according to the time offset direction and the time offset to generate the time to be tested corresponding to the test task.
Optionally, the application program is a game application, and the test task is a time-limited task or a timing task in the game application.
Further, when the test task is the timing task, the time to be tested is task trigger execution time;
and when the test task is the time-limited task, the time to be tested is the task deadline.
In a second aspect, an embodiment of the present invention further provides an apparatus for testing an application, where the apparatus includes:
the system comprises a to-be-tested time generation module, a to-be-tested time determination module and a to-be-tested time determination module, wherein the to-be-tested time generation module is used for calling a to-be-tested time determination function when a test task in an application program to be tested runs, and generating to-be-tested time corresponding to the test task;
and the testing module is used for continuing to run the testing task according to the time to be tested and completing the testing of the testing task in the application program.
Optionally, on the basis of the device, the device further includes a function execution module, which includes a time offset information determination submodule and a time to be tested generation submodule, and is configured to implement the function of generating the time to be tested corresponding to the test task through the time offset information determination submodule and the time to be tested generation submodule; wherein,
the time offset information determining submodule is used for determining time offset information according to the current system time and the test task information of the test task;
and the time to be tested generation submodule is used for adjusting the time of the test task according to the time offset information and the current system time to generate the time to be tested corresponding to the test task.
Further, the time offset information determination submodule is specifically configured to:
reading the current system time, and determining the test task information according to the test task, wherein the test task information comprises the next test time of the test task;
and determining a time offset direction and a time offset according to the current system time and the next test time.
Further, the time offset information determining sub-module is further specifically configured to:
and reading the test task information from the configuration file of the test task.
Optionally, the time generation sub-module to be tested is specifically configured to:
and adjusting the current system time according to the time offset direction and the time offset to generate the time to be tested corresponding to the test task.
Optionally, the application program is a game application, and the test task is a time-limited task or a timing task in the game application.
Optionally, when the test task is the timing task, the time to be tested is task trigger execution time;
and when the test task is the time-limited task, the time to be tested is the task deadline.
In a third aspect, an embodiment of the present invention further provides an electronic device, where the electronic device includes:
one or more processors;
a storage device for storing one or more programs,
when the one or more programs are executed by the one or more processors, the one or more processors are caused to implement the method for testing the application program provided by any embodiment of the present invention.
In a fourth aspect, the embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the method for testing the application program provided in any embodiment of the present invention.
The embodiment of the invention calls the to-be-tested time determining function to generate the to-be-tested time corresponding to the test task when the test task in the to-be-tested application program runs; and continuing to run the test task according to the time to be tested, and completing the test of the test task in the application program. The time corresponding to the application program to be tested is independently adjusted through the time determining function to be tested at the program level without modifying the system time, so that the test of the application program related to the time problem is more efficiently completed, and the influence on other application programs on the same equipment is reduced.
Drawings
FIG. 1 is a flowchart of a method for testing an application according to a first embodiment of the present invention;
FIG. 2 is a flowchart illustrating an implementation of a to-be-tested time determination function in a method for testing an application according to a second embodiment of the present invention;
FIG. 3 is a schematic structural diagram of an apparatus for testing an application according to a third embodiment of the present invention;
fig. 4 is a schematic structural diagram of an electronic device in a fourth embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Example one
The method for testing the application program provided by the embodiment can be applied to testing the application program related to the time problem. The method can be executed by a testing device of an application program, the device can be realized by software and/or hardware, and the device can be integrated in an electronic device with a program testing function, such as a notebook computer, a desktop computer or a server. Referring to fig. 1, the method of the present embodiment specifically includes the following steps:
s110, calling a to-be-tested time determining function when a test task in the to-be-tested application program runs, and generating to-be-tested time corresponding to the test task.
The time determination function to be tested is a self-defined interface function for time adjustment, which can read the system time and adjust the system time. The time to be tested is the next testing time when the testing task normally runs.
Specifically, in the testing process of the application program related to the time problem, for the testing task related to the time problem, the testing task is not always waited for to run to the time to be tested, but the time is adjusted to the time to be tested on the basis of the current system time, so that the testing process of the application program is completed quickly. In order to avoid the influence of the test operation on other processes running on an electronic device (referred to as a test device for short) with a program test function in the test process, in the embodiment of the invention, the system time is not modified to determine the time to be tested, but a package interface function (i.e. determination of the time to be tested) is customized on the basis of the system operation of reading the system time, and the time corresponding to the application program is individually adjusted in the function based on the system time, so that the application program to be tested identifies the time to be tested and executes the corresponding test operation related to the time.
In specific implementation, the test equipment detects whether a test task in the application program to be tested starts to run. And when the running of the test task is detected, calling a to-be-tested time determination function, returning a system time adjusted based on the current system time by the function, wherein the adjusted system time is the to-be-tested time corresponding to the test task.
Illustratively, the application is a game application, and the testing task is a time-limited task or a timed task in the game application. Particularly, more test tasks related to time problems are involved in game application, so that the test method of the application program of the embodiment of the invention can be utilized to adjust the time corresponding to each test task more quickly and conveniently, thereby completing the test of the game application more efficiently.
Illustratively, when the test task is a timing task, the time to be tested is task trigger execution time; and when the test task is a time-limited task, the time to be tested is the task deadline. Specifically, the timing task is a task that is triggered to be executed at a fixed time point, so that when the test task is the timing task, the time to be tested is the time corresponding to the fixed time point, which is also referred to as task trigger execution time. The time-limited task is a task which must be executed within a certain time period, so that the time to be tested is the task deadline after the task runs.
And S120, continuing to run the test task according to the time to be tested, and completing the test of the test task in the application program.
Specifically, after the time to be tested is obtained, the test task can be triggered to continue running, so that whether the time trigger design in the test task is correct or not is judged, and the test of the test task in the application program to be tested is completed.
According to the technical scheme of the embodiment, the time to be tested is generated by calling the time to be tested determining function when the test task in the application program to be tested runs; and continuing to run the test task according to the time to be tested, and completing the test of the test task in the application program. The time corresponding to the application program to be tested is independently adjusted through the time determining function to be tested at the program level without modifying the system time, so that the test of the application program related to the time problem is more efficiently completed, and the influence on other application programs on the same equipment is reduced.
Example two
In this embodiment, on the basis of the first embodiment, the implementation process of the "time determination function to be tested" is optimized. The same or corresponding terms as those in the above embodiments are not explained in detail herein. Referring to fig. 2, in the testing method for an application program provided in this embodiment, an implementation process of a to-be-tested time determination function includes:
s210, determining time offset information according to the current system time and the test task information of the test task.
The test task information refers to relevant data describing the test task, and may be, for example, each test time in the test task and test content corresponding to each test time. The time offset information refers to relevant data describing a time offset, and may be, for example, a direction of the time offset (e.g., forward offset or backward offset, etc.) and a size of the time offset (i.e., time offset), etc.
Specifically, in the implementation process of the time determination function to be tested, it is first required to determine the time offset information of the time to be tested with respect to the current system time. In specific implementation, the function first obtains the current system time and the test task information, and then determines the time offset information by comparing the current system time with the test time in the test task information.
Illustratively, determining the time offset information according to the current system time and the test task information of the test task includes: reading the current system time, and determining test task information according to the test task, wherein the test task information comprises the next test time of the test task; and determining the time offset direction and the time offset according to the current system time and the next test time. Specifically, the implementation process of S210 may be: and calling a system function for reading the system time to read and obtain the current system time. Meanwhile, the test task information may be determined according to the attribute information of the test task. Then, the current system time is compared with the next test time relative to the latest executed test time in the test task information, and the time for which the current system time needs to be reversed or advanced is determined, the time adjustment direction for reversing or advancing is the time offset direction, and the time for reversing or advancing is the time offset.
Illustratively, determining test task information from the test tasks includes: and reading the test task information from the configuration file of the test task. Specifically, in order to improve the efficiency of obtaining the test task information, the test task information may be stored in a configuration file in advance, and the configuration file may be directly read in the test process to obtain the test task information.
S220, adjusting the time of the test task according to the time offset information and the current system time to generate the time to be tested corresponding to the test task.
Specifically, in the function, the time offset in the time offset information is increased or decreased on the basis of the current system time to obtain a new system time, and the new system time can be used as the time to be tested to perform the function return operation.
Illustratively, adjusting the time of the test task according to the time offset information and the current system time, and generating the to-be-tested time corresponding to the test task includes: and adjusting the current system time according to the time offset direction and the time offset to generate the time to be tested corresponding to the test task. Specifically, after the time offset direction and the time offset in the time offset information are determined in S210, the time offset is adjusted to the current system time according to the time offset direction, and the to-be-tested time corresponding to the test task is generated.
According to the technical scheme of the embodiment, time offset information is determined according to the current system time and the test task information of the test task; and adjusting the time of the test task according to the time offset information and the current system time to generate the time to be tested corresponding to the test task. The function of generating the time to be tested corresponding to the test task by the time to be tested determining function is realized, the time adjustment of the program level of the current system time based on the system command is further realized, and the test convenience of the application program related to the time problem is improved.
EXAMPLE III
The present embodiment provides an apparatus for testing an application, referring to fig. 3, the apparatus specifically includes:
the to-be-tested time generation module 310 is configured to call a to-be-tested time determination function when a test task in the to-be-tested application program runs, and generate to-be-tested time corresponding to the test task;
the testing module 320 is configured to continue to run the testing task according to the time to be tested, and complete testing of the testing task in the application program.
Optionally, on the basis of the device, the device further includes a function execution module, which includes a time offset information determination submodule and a time to be tested generation submodule, and is configured to implement a function of generating time to be tested corresponding to the test task through the time offset information determination submodule and the time to be tested generation submodule; wherein,
the time offset information determining submodule is used for determining time offset information according to the current system time and the test task information of the test task;
and the time to be tested generation submodule is used for adjusting the time of the test task according to the time offset information and the current system time to generate the time to be tested corresponding to the test task.
Further, the time offset information determination submodule is specifically configured to:
reading the current system time, and determining test task information according to the test task, wherein the test task information comprises the next test time of the test task;
and determining the time offset direction and the time offset according to the current system time and the next test time.
Further, the time offset information determining sub-module is further specifically configured to:
and reading the test task information from the configuration file of the test task.
Optionally, the time to be tested generation submodule is specifically configured to:
and adjusting the current system time according to the time offset direction and the time offset to generate the time to be tested corresponding to the test task.
Optionally, the application program is a game application, and the test task is a time-limited task or a timing task in the game application.
Optionally, when the test task is a timing task, the time to be tested is task trigger execution time;
and when the test task is a time-limited task, the time to be tested is the task deadline.
By the application program testing device in the second embodiment of the invention, the time corresponding to the application program to be tested is independently adjusted through the time determining function to be tested at the program level without modifying the system time, so that the testing of the application program related to the time problem is more efficiently completed, and the influence on other application programs on the same equipment is reduced.
The test device for the application program provided by the embodiment of the invention can execute the test method for the application program provided by any embodiment of the invention, and has the corresponding functional modules and beneficial effects of the execution method.
It should be noted that, in the embodiment of the test apparatus for application programs, the included units and modules are only divided according to functional logic, but are not limited to the above division as long as the corresponding functions can be realized; in addition, specific names of the functional units are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present invention.
Example four
Referring to fig. 4, the present embodiment provides an electronic device 400, which includes: one or more processors 420; the storage device 410 is used for storing one or more programs, and when the one or more programs are executed by the one or more processors 420, the one or more processors 420 implement the method for testing the application program provided by the embodiment of the present invention, including:
calling a to-be-tested time determining function when a test task in an application program to be tested runs, and generating to-be-tested time corresponding to the test task;
and continuing to run the test task according to the time to be tested, and completing the test of the test task in the application program.
Of course, those skilled in the art can understand that the processor 420 can also implement the technical solution of the testing method of the application program provided in any embodiment of the present invention.
The electronic device 400 shown in fig. 4 is only an example and should not bring any limitation to the function and the scope of use of the embodiments of the present invention.
As shown in fig. 4, the electronic device 400 includes a processor 420, a storage device 410, an input device 440, and an output device 440; the number of the processors 420 in the electronic device may be one or more, and one processor 420 is taken as an example in fig. 4; the processor 420, the storage device 410, the input device 440, and the output device 440 in the electronic apparatus may be connected by a bus or other means, and are exemplified by being connected by a bus 450 in fig. 4.
The storage device 410 is a computer-readable storage medium, and can be used to store software programs, computer-executable programs, and modules, such as program instructions/modules corresponding to the testing method of the application program in the embodiment of the present invention (for example, a to-be-tested time generation module and a testing module in a testing device of the application program).
The storage device 410 may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function; the storage data area may store data created according to the use of the terminal, and the like. Further, the storage 410 may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device. In some examples, the storage 410 may further include memory located remotely from the processor 420, which may be connected to the electronic device over a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The input device 440 may be used to receive input numeric or character information and generate key signal inputs related to user settings and function controls of the electronic apparatus. The output device 440 may include a display device such as a display screen.
EXAMPLE five
The present embodiments provide a storage medium containing computer-executable instructions which, when executed by a computer processor, perform a method of testing an application program, the method comprising:
calling a to-be-tested time determining function when a test task in an application program to be tested runs, and generating to-be-tested time corresponding to the test task;
and continuing to run the test task according to the time to be tested, and completing the test of the test task in the application program.
Of course, the storage medium provided by the embodiment of the present invention contains computer-executable instructions, and the computer-executable instructions are not limited to the above method operations, and may also perform related operations in the test method of the application program provided by any embodiment of the present invention.
From the above description of the embodiments, it is obvious for those skilled in the art that the present invention can be implemented by software and necessary general hardware, and certainly, can also be implemented by hardware, but the former is a better embodiment in many cases. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, where the computer software product may be stored in a computer-readable storage medium, such as a floppy disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a FLASH Memory (FLASH), a hard disk, or an optical disk of a computer, and includes several instructions to enable an electronic device (which may be a personal computer, a server, or a network device) to execute the method for testing the application program provided in the embodiments of the present invention.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (10)
1. A method for testing an application program, comprising:
calling a to-be-tested time determining function when a test task in an application program to be tested runs, and generating to-be-tested time corresponding to the test task;
and continuing to run the test task according to the time to be tested, and completing the test of the test task in the application program.
2. The method of claim 1, wherein the function of generating the time to be tested corresponding to the test task is implemented by the function of determining the time to be tested according to the following:
determining time offset information according to the current system time and the test task information of the test task;
and adjusting the time of the test task according to the time offset information and the current system time to generate the time to be tested corresponding to the test task.
3. The method of claim 2, wherein determining time offset information based on the current system time and test task information for the test task comprises:
reading the current system time, and determining the test task information according to the test task, wherein the test task information comprises the next test time of the test task;
and determining a time offset direction and a time offset according to the current system time and the next test time.
4. The method of claim 3, wherein said determining the test task information from the test task comprises:
and reading the test task information from the configuration file of the test task.
5. The method of claim 3, wherein the adjusting the time of the test task according to the time offset information and the current system time, and the generating the time to be tested corresponding to the test task comprises:
and adjusting the current system time according to the time offset direction and the time offset to generate the time to be tested corresponding to the test task.
6. The method of claim 1, wherein the application is a game application, and the testing task is a time-limited task or a timed task in the game application.
7. The method of claim 6, wherein when the test task is the timing task, the time to be tested is a task trigger execution time;
and when the test task is the time-limited task, the time to be tested is the task deadline.
8. An apparatus for testing an application, comprising:
the system comprises a to-be-tested time generation module, a to-be-tested time determination module and a to-be-tested time determination module, wherein the to-be-tested time generation module is used for calling a to-be-tested time determination function when a test task in an application program to be tested runs, and generating to-be-tested time corresponding to the test task;
and the testing module is used for continuing to run the testing task according to the time to be tested and completing the testing of the testing task in the application program.
9. An electronic device, characterized in that the electronic device comprises:
one or more processors;
a storage device for storing one or more programs,
when executed by the one or more processors, cause the one or more processors to implement a method of testing an application program as claimed in any one of claims 1 to 7.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out a method for testing an application program according to any one of claims 1 to 7.
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| CN109992515A (en) * | 2019-04-02 | 2019-07-09 | 网易（杭州）网络有限公司 | Test method and device, electronic equipment |
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