CN110739025B - Power failure test method, device and system for storage equipment - Google Patents
Power failure test method, device and system for storage equipment Download PDFInfo
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Abstract
The invention discloses a power failure test method of storage equipment, which comprises the following steps: a1, writing two different preset characteristic data into at least two different preset storage areas of the storage device to be tested respectively; b1, monitoring the data storage state of a storage device while writing in the characteristic data, cutting off power supply to the storage device when the storage state of the storage device is in a first state, and taking at least one preset storage area as a power failure test area; and C1, after the power supply to the storage device is recovered, comparing the data stored in at least one of the at least two different preset storage areas with the preset characteristic data corresponding to the preset storage area. The testing method can acquire the data processing state of the storage equipment, and further test the corresponding equipment power-down protection strategy according to the power-down strategy executed by the storage equipment, so that the testing coverage is wider.
Description
Technical Field
The invention relates to a storage device testing method, in particular to a storage device power failure testing method, device and system.
Background
For a storage device, ensuring reliable storage and stability of data is an important point in functional attributes of the storage device, and an abnormal power failure test is an important scene for verifying the data storage reliability of the storage device. When abnormal power failure occurs, if the power failure protection strategy of the storage device is not properly designed, a large amount of data is often lost, so that huge economic losses are brought to providers and users of the storage device.
In the existing power-down test scheme for storage test, although the test scheme is various, such as introduction of a test system, random power-down time or function increase and the like, when the power-down test is carried out, the power-down test is carried out on the whole system, and a power-down protection strategy cannot be analyzed and formulated according to different data processing states.
Disclosure of Invention
The invention provides a power-down test method, a device and a system for storage equipment, aiming at solving the problem that in the prior art, a method for the power-down of the whole system is adopted for testing a storage, and a power-down protection strategy cannot be analyzed and formulated according to different data processing states.
The invention provides a power failure test method of storage equipment, which comprises the following steps:
a1, writing two different preset characteristic data into at least two different preset storage areas of the storage device to be tested respectively;
b1, monitoring the data storage state of a storage device while writing in the characteristic data, cutting off power supply to the storage device when the storage state of the storage device is in a first state, and taking at least one preset storage area as a power failure test area;
and C1, after the power supply to the storage device is recovered, comparing the data stored in at least one of the at least two different preset storage areas with the preset characteristic data corresponding to the preset storage area.
Secondly, the invention provides a power failure test method for storage equipment, which comprises the following steps:
a2, establishing a preset mapping relation between data of a storage device to be tested and a storage area, and writing characteristic data into a corresponding storage area in the storage device according to the preset mapping relation, wherein first characteristic data are written into a first preset storage area of the storage device, second characteristic data are written into a second preset storage area of the storage device, and third characteristic data are written into a third preset storage area of the storage device;
b2, monitoring the data storage state of a storage device while writing in the characteristic data, cutting off power supply to the storage device when the storage state of the storage device is in a first state, and taking at least one of a first preset storage area, a second preset storage area and a third preset storage area as a power failure test area;
c2, after the power supply to the storage device is recovered, searching whether data different from the first characteristic data, the second characteristic data and the third characteristic data exist in the storage device; and after checking and power supply is recovered, detecting whether the mapping relation between the data in the storage equipment to be tested and the storage area conforms to the preset mapping relation.
Further, in the method provided by the present invention, before step a2, the method further includes the following steps:
and setting a signal pin on the storage device to be tested.
Further, in the above method proposed by the present invention, when the level of the signal pin changes from high to low, the state of the memory device is the first state.
Further, the method proposed by the present invention may further include cutting off power supply to the storage device in any one or more of the following ways: cut off at a preset time, cut off at a random time, or cut off according to the memory data processing state.
Further, in the method provided by the present invention, the first preset storage area includes the second preset storage area and the third preset storage area; and the second preset storage area is not overlapped with the third preset storage area.
Thirdly, the invention provides a power failure testing device of a storage device applying the method, which comprises:
a storage device to be tested;
a signal pin connected to the memory device to be tested and outputting at least one signal indicating a status of the memory device to be tested;
the controller is connected with the storage equipment to be tested and is used for at least writing preset characteristic data into the storage equipment to be tested, controlling the power supply of the storage equipment to be cut off and restored, reading out data in the storage equipment to be tested, searching whether data different from the first characteristic data, the second characteristic data and the third characteristic data exist in the storage equipment or not after the power supply of the storage equipment is restored, and detecting whether the mapping relation between the data in the storage equipment to be tested and a storage area conforms to the preset mapping relation or not after the power supply is restored.
Fourth, the present invention provides a storage device power-down test system applying the method and including the storage device power-down test apparatus, including:
the server stores a test program comprising the method;
one or more test nodes which are in communication connection with the server and store test programs including the method;
one or more storage devices to be tested, the storage devices being connected to the test node, receiving and running test programs transmitted from the test node;
wherein the test node is a child node of the server; and the storage device to be tested is a child node of the test node.
Further, in the above system provided by the present invention, before the test is started, after at least one test parameter is transmitted to the server, the test degree associated with the at least one test parameter is transmitted to the storage device to be tested and executed.
Finally, the invention proposes a computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method described above.
The beneficial results of the invention are: the processing state of the storage equipment on the data is obtained, and then the corresponding equipment power-down protection strategy is tested according to the execution power-down strategy, so that the test coverage is wider.
Drawings
The invention is further illustrated with reference to the following figures and examples. In the accompanying drawings, like reference numerals refer to like parts throughout.
FIG. 1 is a flow chart illustrating a first embodiment of a method for power down testing of a storage device according to the present invention;
FIG. 2 is a flow chart illustrating a second embodiment of a method for power down testing of a storage device according to the present invention;
FIG. 3 is a flow chart illustrating a third embodiment of a method for power down testing of a storage device according to the present invention;
FIG. 4 is a block diagram illustrating a first embodiment of a power down test apparatus for a storage device according to the present invention;
FIG. 5 is a block diagram illustrating a second embodiment of a power down test apparatus for a storage device according to the present invention;
FIG. 6 is an architecture diagram illustrating one embodiment of a storage device power down test system in accordance with the present invention;
FIG. 7 is a schematic diagram illustrating an operation of a system for power down testing of a storage device according to the present invention.
Detailed Description
The conception, the specific structure and the technical effects of the present invention will be clearly and completely described below in conjunction with the embodiment and the accompanying drawings to fully understand the objects, the schemes and the effects of the present invention. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The same reference numbers will be used throughout the drawings to refer to the same or like parts.
It should be noted that, unless otherwise specified, when a feature is referred to as being "fixed" or "connected" to another feature, it may be directly fixed or connected to the other feature or indirectly fixed or connected to the other feature. Furthermore, the descriptions of upper, lower, left, right, etc. used in this application are only relative to the positional relationship of the various elements of the application with respect to one another in the drawings. As used in this application and the appended claims, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
The exemplary embodiments described herein and depicted in the drawings should not be considered limiting. Various mechanical, compositional, structural, electrical, and operational changes, including equivalents, may be made without departing from the scope of this disclosure and the claims. In some instances, well-known structures and techniques have not been shown or described in detail to avoid obscuring the disclosure. The same reference numbers in two or more drawings identify the same or similar elements. Moreover, elements and their associated features, which are described in detail with reference to one embodiment, may be included in other embodiments, where they are not specifically shown or described, where practicable. For example, if an element is described in detail with reference to one embodiment and not described with reference to the second embodiment, it may also be claimed to be included in the second embodiment.
Furthermore, unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used in the description herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and/or" includes any combination of one or more of the associated listed items.
It will be understood that, although the terms first, second, third, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element of the same type from another. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without departing from the scope of the present application. The word "if" as used herein may be interpreted as "at … …" or "at … …" depending on the context.
In an embodiment of the invention, the method steps may be performed in another order. The invention is not limited to the order in which the method steps are performed.
Referring to fig. 1, which is a flowchart illustrating a first embodiment of a method for power down testing a storage device according to the present invention, an exemplary embodiment of the method for power down testing a storage device is shown, which includes the following steps: a1, writing two different preset characteristic data into at least two different preset storage areas of the storage device to be tested respectively; b1, monitoring the data storage state of a storage device while writing in the characteristic data, cutting off power supply to the storage device when the storage state of the storage device is in a first state, and taking at least one preset storage area as a power failure test area; and C1, after the power supply to the storage device is recovered, comparing the data stored in at least one of the at least two different preset storage areas with the preset characteristic data corresponding to the preset storage area.
Preferably, in an embodiment of the present invention, before step a1, the following steps are further included: and setting a signal pin on the storage device to be tested.
Preferably, in an embodiment of the present invention, when the level of the signal pin changes from high to low, the state of the memory device is the first state.
Preferably, in an embodiment of the present invention, the first state is a programming state. Further, the first State may also be a Sending-data State (Sending-data State) and a receiving-data State (receiving-data State), etc., depending on the data State of the memory to be tested and the corresponding power-down protection policy, without violating the spirit of the present invention.
Further, in an embodiment of the present invention, the method provided by the present invention can perform corresponding power down according to different processing states of the storage device on the data, and further test a corresponding device power down protection policy according to a power down policy executed by the storage device.
Further, the method proposed by the present invention may further include cutting off power supply to the storage device in any one or more of the following ways: cut off at a preset time, cut off at a random time, or cut off according to the memory data processing state.
Further, referring to the flowchart of a second embodiment of the method for testing the power down of the storage device in accordance with the present invention shown in fig. 2, the preferred embodiment of the method for testing the power down of the storage device is shown in the diagram, which includes the following steps: a2, establishing a preset mapping relation between data of a storage device to be tested and a storage area, and writing characteristic data into a corresponding storage area in the storage device according to the preset mapping relation, wherein first characteristic data are written into a first preset storage area of the storage device, second characteristic data are written into a second preset storage area of the storage device, and third characteristic data are written into a third preset storage area of the storage device; b2, monitoring the data storage state of a storage device while writing in the characteristic data, cutting off power supply to the storage device when the storage state of the storage device is in a first state, and taking at least one of a first preset storage area, a second preset storage area and a third preset storage area as a power failure test area; c2, after the power supply to the storage device is recovered, searching whether data different from the first characteristic data, the second characteristic data and the third characteristic data exist in the storage device; and after checking and power supply is recovered, detecting whether the mapping relation between the data in the storage equipment to be tested and the storage area conforms to the preset mapping relation. It should be understood that the above-mentioned first, second and third terms are merely used for distinction, not for order nor for size.
Preferably, in an embodiment of the present invention, before step a2, the following steps are further included: and setting a signal pin on the storage device to be tested.
Preferably, in an embodiment of the present invention, when the level of the signal pin changes from high to low, the state of the memory device is the first state. Further, it is preferable that the first feature data, the second feature data, and the third feature data are expressed by different data, and the first feature data, the second feature data, and the third feature data may be exchanged with each other or different feature data may be used without departing from the spirit of the present invention, as long as the three feature data are different from each other.
Preferably, in an embodiment of the present invention, the first state is a programming state. Further, the first State may also be a Sending-data State (Sending-data State) and a receiving-data State (receiving-data State), etc., depending on the data State of the memory to be tested and the corresponding power-down protection policy, without violating the spirit of the present invention.
Further, in an embodiment of the present invention, the method provided by the present invention can perform corresponding power down according to different processing states of the storage device on the data, and further test a corresponding device power down protection policy according to a power down policy executed by the storage device.
Further, in one embodiment of the present invention, cutting off power to the storage device includes any one or more of the following cutting-off modes: cut off at a preset time, cut off at a random time, or cut off according to the memory data processing state.
Further, in an embodiment of the present invention, the first preset storage area includes the second preset storage area and the third preset storage area; and the second preset storage area is not overlapped with the third preset storage area.
Preferably, in an embodiment of the present invention, the first preset storage area is an entire storage area of the memory to be tested, and the second preset storage area and the third storage area may be continuous or a plurality of discontinuous random areas, as long as it is ensured that the second preset storage area and the third preset storage area do not overlap, that is, there is no intersection between the two.
Further, the main purpose of performing power failure test on the storage device is to verify the capability of the storage device in data processing and protection when abnormal power failure occurs, so that comparison and verification of data before and after power failure are very important. For accurate data verification, the data processing state of the storage device before power failure can be determined, and for example, when the data is powered down during writing and the data is powered down after writing, the expected storage data is completely different during verification. The conventional complete machine power failure test mode has the problem that the data can not be accurately checked. The present invention solves this problem by adding a data signal pin design on the test board. The following describes an execution process of a test program by powering down in a Programming state (Programming state) during test write data, and describes an execution process of a test program by powering down in a Programming state (Programming state) during test write data, referring to a flowchart of a third embodiment of a method for testing power down of a storage device shown in fig. 3, after the test program runs, first performing a full disk write operation on test equipment by using first feature data as background data, so as to prevent influence of uncertain data in the storage device to be tested on a subsequent data verification process. Then randomly selecting a data area A, writing second characteristic data, wherein the area A can be a plurality of discontinuous random areas, and the areas are marked by a mapping table of a test program. And then selecting the area B (which is not overlapped with the area A) as a power failure test area, and writing third characteristic data. During the writing process, and referring to fig. 5, the signal pin on the test board always detects the data storage status of the memory device under test. When the level of the signal pin changes from high to low, indicating that the tested storage device is in a Programming state (Programming state), the signal processing module informs the PMU module to control the PMU to cut off corresponding power supply according to a power-down strategy set in the test flow module, such as all power-down, only IO power supply loss or only controller power supply loss. And after the power supply is recovered, the test program starts to read the data of the tested storage equipment on the whole disk and checks the data. According to the area mapping relation recorded by the test program, the data of the area A should be the first characteristic data or the second characteristic data, the data of the area B should be the first characteristic data or the third characteristic data, and the data of the rest areas should be the first characteristic data. If new characteristic data are found, it is indicated that the storage device has a vulnerability to the capability of processing and protecting data when abnormal power failure occurs.
It should be understood that the above application Programming State (Programming State) is powered down to illustrate the execution process of the test program, and is not intended to limit the present invention, and as mentioned above, the power down test may also be performed for the Sending-data State (Sending-data State) and the receiving-data State (receiving-data State) of the memory.
Further, referring to a block diagram of a first embodiment of a storage device power down testing apparatus according to the present invention shown in fig. 4, the storage device power down testing apparatus applying the method described above according to an embodiment of the present invention is shown, and the storage device power down testing apparatus includes: a storage device to be tested; a signal pin connected to the memory device to be tested and outputting at least one signal indicating a status of the memory device to be tested; the controller is connected with the storage equipment to be tested and is used for at least writing preset characteristic data into the storage equipment to be tested, controlling the power supply of the storage equipment to be cut off and restored, reading out data in the storage equipment to be tested, searching whether data different from the first characteristic data, the second characteristic data and the third characteristic data exist in the storage equipment or not after the power supply of the storage equipment is restored, and detecting whether the mapping relation between the data in the storage equipment to be tested and a storage area conforms to the preset mapping relation or not after the power supply is restored.
Further, referring to an architecture diagram of an embodiment of a storage device power-down test system according to the present invention shown in fig. 6, a storage device power-down test system applying the method and including the storage device power-down test apparatus according to an embodiment of the present invention is shown, and includes: the server stores a test program comprising the method; one or more test nodes which are in communication connection with the server and store test programs including the method; one or more storage devices to be tested, the storage devices being connected to the test node, receiving and running test programs transmitted from the test node; wherein the test node is a child node of the server; and the storage device to be tested is a child node of the test node. Further, in the above system provided by the present invention, before the test is started, after at least one test parameter is transmitted to the server, the test degree associated with the at least one test parameter is transmitted to the storage device to be tested and executed.
A preferred working flow of the method, apparatus and system according to the present invention is described below with reference to the above fig. 1 to fig. 6 and with reference to fig. 7, which is a schematic diagram of an operation mode of a storage device power-down test system according to the present invention:
1. on the test system, the deployment architecture is shown in fig. 6. The system consists of a server, a plurality of test nodes and a test board carrying storage equipment. And the tester remotely distributes the power-down test items to each test node through the server. The test nodes download the test programs to the test board and start the test programs, simultaneously monitor the test state in the test, and upload the test information to the server, thereby showing the test conditions to the testers in real time.
2. In the test program downloading mode, the system provides a wired and wireless downloading mode, can better adapt to the limitation of the test environment, and can quickly build a test. The wired downloading mode comprises but is not limited to a serial port and a USB, and the wireless downloading mode comprises but is not limited to WIFI and Bluetooth.
3. In the power failure test method, power failure can be performed according to the processing state of the data by the storage device, and the coverage is wider. The test board used has built-in special signal pins, the main structure of which is shown in fig. 5. When the storage device stores data, the current data processing State of the storage device, such as a Sending-data State (Sending-data State), a receiving-data State (receiving-data State), a Programming State (Programming State), etc., can be detected. And the test program detects the state of the signal pin, and when the storage device is in a data processing state according with triggering power failure, the test program controls the output of the PMU of the test board, so that the power failure of the storage device is realized.
4. In the aspect of power failure control, the test board can be set according to a test program, only part of power supplies of the storage equipment are cut off, if only storage IO or power supply of the controller is cut off, and the test is more accurate, sufficient and complete.
To better explain the technical solutions and advantages of the present invention, the following description will be made with reference to the accompanying drawings and specific examples. In the present invention, the complete power down test process can be as shown in fig. 7, where:
1. and a tester logs in the test management system through the browser to perform power failure test configuration. The power failure test configuration comprises selection of test nodes and test prototypes, setting of test scenes, setting of power failure types and the like, wherein the power failure types comprise fixed time power failure, random time power failure, power failure according to data processing states and the like.
2. After the testing personnel finish the test configuration, the configuration parameters are submitted to the server. And after receiving the test request, the server distributes the task to the test node PC according to the test configuration.
3. After receiving the test task command, the test node first checks whether there is a corresponding test program locally. If not, synchronizing from the server to the local; if yes, the test program is downloaded to the test board and run. During downloading program, the test node will select to use wired download or wireless download according to the connection configuration between the test node and the test board.
4. After the program runs, data read-write operation is carried out on the storage device according to the appointed test scene, and whether the current processing state of the storage device on the data accords with the power failure test setting or not is monitored in real time. And if so, triggering a power down module to power down the storage equipment.
5. In the running process of the test program, the current test information is returned to the test node, such as whether data reading and writing are normal, whether power failure starts or not, whether data verification starts or not, and the like. And after the node forwards the information to the server, the server analyzes and processes the data, and the data is returned to the browser and then displayed to a tester. It should be noted that the whole process of displaying the test data is a real-time process.
Finally, in an embodiment of the invention, a computer-readable storage medium is proposed, on which a computer program is stored, characterized in that the computer program realizes the above-mentioned method steps when executed by a processor.
It should be recognized that embodiments of the present invention can be realized and implemented by computer hardware, a combination of hardware and software, or by computer instructions stored in a non-transitory computer readable memory. The methods may be implemented in a computer program using standard programming techniques, including a non-transitory computer-readable storage medium configured with the computer program, where the storage medium so configured causes a computer to operate in a specific and predefined manner, according to the methods and figures described in the detailed description. Each program may be implemented in a high level procedural or object oriented programming language to communicate with a computer system. However, the program(s) can be implemented in assembly or machine language, if desired. In any case, the language may be a compiled or interpreted language. Furthermore, the program can be run on a programmed application specific integrated circuit for this purpose.
Further, the method may be implemented in any type of computing platform operatively connected to a suitable interface, including but not limited to a personal computer, mini computer, mainframe, workstation, networked or distributed computing environment, separate or integrated computer platform, or in communication with a charged particle tool or other imaging device, and the like. Aspects of the invention may be embodied in machine-readable code stored on a non-transitory storage medium or device, whether removable or integrated into a computing platform, such as a hard disk, optically read and/or write storage medium, RAM, ROM, or the like, such that it may be read by a programmable computer, which when read by the storage medium or device, is operative to configure and operate the computer to perform the procedures described herein. Further, the machine-readable code, or portions thereof, may be transmitted over a wired or wireless network. The invention described herein includes these and other different types of non-transitory computer-readable storage media when such media include instructions or programs that implement the steps described above in conjunction with a microprocessor or other data processor. The invention also includes the computer itself when programmed according to the methods and techniques described herein.
Embodiments of this disclosure are described herein, including the best mode known to the inventors for carrying out the invention. Variations of those described embodiments may become apparent to those of ordinary skill in the art upon reading the foregoing description. The inventors expect skilled artisans to employ such variations as appropriate, and the inventors intend for the embodiments of the disclosure to be practiced otherwise than as specifically described herein. Accordingly, the scope of the present disclosure includes all modifications and equivalents of the subject matter recited in the claims appended hereto as permitted by applicable law. Moreover, the scope of the present disclosure encompasses any combination of the above-described elements in all possible variations thereof unless otherwise indicated herein or otherwise clearly contradicted by context.
While the present invention has been described in considerable detail and with particular reference to a few illustrative embodiments thereof, it is not intended to be limited to any such details or embodiments or any particular embodiments, but it is to be construed as effectively covering the intended scope of the invention by providing a broad, potential interpretation of such claims in view of the prior art with reference to the appended claims. Furthermore, the foregoing describes the invention in terms of embodiments foreseen by the inventor for which an enabling description was available, notwithstanding that insubstantial modifications of the invention, not presently foreseen, may nonetheless represent equivalent modifications thereto.
The specification and drawings are, accordingly, to be regarded in an illustrative sense rather than a restrictive sense. However, it will be apparent that: various modifications and changes may be made thereto without departing from the broader spirit and scope of the application as set forth in the claims.
Other variations are within the spirit of the present application. Accordingly, while the disclosed technology is susceptible to various modifications and alternative constructions, certain embodiments thereof have been shown in the drawings and have been described above in detail. It should be understood, however, that there is no intention to limit the application to the specific form or forms disclosed; on the contrary, the intention is to cover all modifications, alternative constructions, and equivalents falling within the spirit and scope of the application, as defined in the appended claims.
Claims (7)
1. A power failure test method for storage equipment is characterized by comprising the following steps:
a2, establishing a preset mapping relation between data of a storage device to be tested and a storage area, and writing characteristic data into a corresponding storage area in the storage device according to the preset mapping relation, wherein first characteristic data are written into a first preset storage area of the storage device, second characteristic data are written into a second preset storage area of the storage device, and third characteristic data are written into a third preset storage area of the storage device;
b2, monitoring the data storage state of a storage device while writing in the characteristic data, cutting off power supply to the storage device when the storage state of the storage device is in a first state, and taking at least one of a first preset storage area, a second preset storage area and a third preset storage area as a power failure test area;
c2, after the power supply to the storage device is recovered, searching whether data different from the first characteristic data, the second characteristic data and the third characteristic data exist in the storage device; after power supply is recovered, whether the mapping relation between the data in the storage equipment to be tested and the storage area accords with the preset mapping relation is detected;
the first preset storage area comprises the second preset storage area and the third preset storage area; the second preset storage area is not overlapped with the third preset storage area;
the method further comprises the following steps: and setting a signal pin on the storage equipment to be tested, and informing a PMU module to control the PMU to cut off corresponding power supply according to a power-down strategy set in the test flow module by the signal processing module according to the level change of the signal pin, wherein the power-down strategy comprises all power-down, IO power supply only and controller power supply only.
2. The method for power down testing of a memory device according to claim 1, wherein the state of the memory device is the first state when the level of the signal pin changes from high to low.
3. The method for testing the power failure of the storage device according to claim 1, wherein the cutting off of the power supply to the storage device comprises any one or more of the following cutting-off modes: cutting off at a preset time, cutting off at a random time, or cutting off according to the data processing state of the storage device.
4. A storage device power down test apparatus applying the method of any one of claims 1 to 3, comprising:
a storage device to be tested;
a signal pin connected to the memory device to be tested and outputting at least one signal indicating a status of the memory device to be tested; the level conversion signal output by the signal pin is used for controlling the signal processing module to inform the PMU module to control the PMU to cut off corresponding power supply according to a power-down strategy set in the test flow module, wherein the power-down strategy comprises all power-down, only IO power supply and only controller power supply;
the controller is connected with the storage equipment to be tested and is used for at least writing preset characteristic data into the storage equipment to be tested, controlling the power supply of the storage equipment to be cut off and restored, reading out data in the storage equipment to be tested, searching whether data different from the first characteristic data, the second characteristic data and the third characteristic data exist in the storage equipment or not after the power supply of the storage equipment is restored, and detecting whether the mapping relation between the data in the storage equipment to be tested and a storage area conforms to the preset mapping relation or not after the power supply is restored.
5. A storage device power down test system applying the method of any one of claims 1 to 3 and including the storage device power down test apparatus of claim 4, comprising:
a server having stored therein a test program comprising the method of one of claims 1 to 3;
one or more test nodes communicatively connected to the server, the test nodes having stored therein a test program comprising the method of any one of claims 1 to 3;
one or more storage devices to be tested, the storage devices being connected to the test node, receiving and running test programs transmitted from the test node;
wherein the test node is a child node of the server; and the storage device to be tested is a child node of the test node.
6. The system for power-down testing of storage devices according to claim 5, wherein before testing, after transmitting at least one test parameter to the server, a test program associated with the at least one test parameter is transmitted to the storage device to be tested and executed.
7. A computer-readable storage medium, on which a computer program is stored, characterized in that the computer program realizes the steps of the method according to one of claims 1 to 3 when executed by a processor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910945054.8A CN110739025B (en) | 2019-09-30 | 2019-09-30 | Power failure test method, device and system for storage equipment |
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| CN111653307A (en) * | 2020-05-22 | 2020-09-11 | 深圳佰维存储科技股份有限公司 | Method, system, equipment and storage medium for detecting data integrity of solid state disk |
| CN112133357B (en) * | 2020-09-30 | 2023-06-09 | 深圳市宏旺微电子有限公司 | eMMC test method and device |
| CN113960391B (en) * | 2021-09-13 | 2024-08-20 | 珠海亿智电子科技有限公司 | Device and method for testing abnormal power failure of storage medium |
| CN118409921B (en) * | 2024-07-02 | 2024-09-27 | 合肥康芯威存储技术有限公司 | Storage test unit, test method thereof and electronic equipment |
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